1.8 V supply operation
Low power: 115 mW per channel at 125 MSPS with scalable
power options
SNR = 71 dBFS (to Nyquist)
SFDR = 93 dBc at 70 MHz
DNL = −0.1 LSB to +0.2 LSB (typical); INL = ±0.4 LSB (typical)
Serial LVDS (ANSI-644, default) and low power, reduced
range option (similar to IEEE 1596.3)
650 MHz full power analog bandwidth
2 V p-p input voltage range
Serial port control
Full chip and individual channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Clock divider
Programmable output clock and data alignment
Programmable output resolution
Standby mode
APPLICATIONS
Communications
Diversity radio systems
Multimode digital receivers
GSM, EDGE, W-CDMA, LTE,
CDMA2000, WiMAX, TD-SCDMA
I/Q demodulation systems
Smart antenna systems
Broadband data applications
Battery-powered instruments
Handheld scope meters
Portable medical imaging and ultrasound
Radar/LIDAR
GENERAL DESCRIPTION
The AD9635 is a dual, 12-bit, 80 MSPS/125 MSPS analog-todigital converter (ADC) with an on-chip sample-and-hold circuit
designed for low cost, low power, small size, and ease of use.
The product operates at a conversion rate of up to 125 MSPS
and is optimized for outstanding dynamic performance and low
power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/
CMOS-/LVDS-compatible sample rate clock for full performance
operation. No external reference or driver components are
required for many applications.
Rev. 0
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Trademarks and registered trademarks are the property of their respective owners.
1.8 V Analog-to-Digital Converter
AD9635
FUNCTIONAL BLOCK DIAGRAM
AVDDDRVDD
AD9635
VINA+
VINA–
VCM
VINB+
VINB–
12-BIT PIPELINE
12-BIT PIPELINE
REFERENCE
SERIAL PORT
INTERFACE
SCLK/
DFS
The ADC automatically multiplies the sample rate clock for the
appropriate LVDS serial data rate. A data clock output (DCO) for
capturing data on the output and a frame clock output (FCO) for
signaling a new output byte are provided. Individual channel
power-down is supported; the AD9635 typically consumes less
than 2 mW in the full power-down state. The ADC provides
several features designed to maximize flexibility and minimize
system cost, such as programmable output clock and data alignment and digital test pattern generation. The available digital
test patterns include built-in deterministic and pseudorandom
patterns, along with custom user-defined test patterns entered via
the serial port interface (SPI).
The AD9635 is available in a RoHS-compliant, 32-lead LFCSP.
It is specified over the industrial temperature range of −40°C
to +85°C. This product is protected by a U.S. patent.
PRODUCT HIGHLIGHTS
1. Small Footprint. Two ADCs are contained in a small, space-
saving package.
2. Low Power. The AD9635 uses 115 mW/channel at 125 MSPS
with scalable power options.
3. Pin Compatibility with the AD9645, a 14-Bit Dual ADC.
4. Ease of Use. A data clock output (DCO) operates at
frequencies of up to 500 MHz and supports double data
rate (DDR) operation.
5. User Flexibility. SPI control offers a wide range of flexible
features to meet specific system requirements.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 www.analog.com
Gain Error Full −4.0 −0.8 +2.1 −4.7 −0.4 +4.8 % FSR
Gain Matching Full 0.5 2.4 0.6 2.9 % FSR
Differential Nonlinearity (DNL) Full −0.2
25°C −0.1 to +0.2
Integral Nonlinearity (INL) Full −0.7
25°C ±0.3
TEMPERATURE DRIFT
Offset Error Full 2.9 3.7 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1 V Mode) Full 0.98 1.0 1.02 0.98 1.0 1.02 V
Load Regulation at 1.0 mA (V
= 1 V ) 25°C 2 2 mV
Input Resistance 25°C 7.5 7.5 kΩ
INPUT-REFERRED NOISE
V
= 1.0 V 25°C 0.41 0.42 LSB rms
ANALOG INPUTS
Differential Input Voltage ( V
= 1 V ) Full 2 2 V p-p
Common-Mode Voltage Full 0.9 0.9 V
Common-Mode Range 25°C 0.5 1.3 0.5 1.3 V
Differential Input Resistance 25°C 5.2 5.2 kΩ
Differential Input Capacitance 25°C 3.5 3.5 pF
POWER SUPPLY
Min Typ Max Min Typ Max Unit
+0.4 −0.3
−0.1 to +0.2
+0.7 −1.1
±0.4
+0.6 LSB
LSB
+1.1 LSB
LSB
DRVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
I
Full 57 61 75 81 mA
I
(ANSI-644 Mode)2 Full 45 47 52 55 mA
I
(Reduced Range Mode)2 25°C 36
43
TOTAL POWER CONSUMPTION
DC Input Full 174 186 215 232 mW
Sine Wave Input (Two Channels; Includes Output Drivers
Full 184 194 229 245 mW
in ANSI-644 Mode)
Sine Wave Input (Two Channels; Includes Output Drivers
25°C 167 212 mW
in Reduced Range Mode)
Power-Down 25°C 2 2 mW
Standby3 Full 91 99 114 124 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured with a low input frequency, full-scale sine wave on both channels.
3
Can be controlled via the SPI.
Rev. 0 | Page 3 of 36
mA
AD9635 Data Sheet
fIN = 30.5 MHz
25°C 90
93 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 70 MHz
Full −94
−82 −94
−82
dBc
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 2.
AD9635-80 AD9635-125
Parameter1 Temp
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 71.8 71.5 dBFS
fIN = 30.5 MHz 25°C 71.7 71.5 dBFS
fIN = 70 MHz Full 70.6 71.2 70.1 71.1 dBFS
fIN = 139.5 MHz 25°C 69.9 70.2 dBFS
fIN = 200.5 MHz 25°C 68.4 68.9 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 71.8 71.5 dBFS
fIN = 30.5 MHz 25°C 71.6 71.5 dBFS
fIN = 70 MHz Full 70.5 71.2 69.7 71.1 dBFS
fIN = 139.5 MHz 25°C 69.6 70.2 dBFS
fIN = 200.5 MHz 25°C 68.2 68.7 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 11.6 11.6 Bits
fIN = 30.5 MHz 25°C 11.6 11.6 Bits
fIN = 70 MHz Full 11.4 11.5 11.3 11.5 Bits
fIN = 139.5 MHz 25°C 11.3 11.4 Bits
fIN = 200.5 MHz 25°C 11.0 11.1 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 93 92 dBc
Unit Min Typ Max Min Typ Max
fIN = 70 MHz Full 82 94 82 93 dBc
fIN = 139.5 MHz 25°C 81 92 dBc
fIN = 200.5 MHz 25°C 82 83 dBc
fIN = 9.7 MHz 25°C −93 −92 dBc
fIN = 30.5 MHz 25°C −90 −93 dBc
fIN = 70 MHz Full −94 −85 −93 −82 dBc
fIN = 139.5 MHz 25°C −81 −92 dBc
fIN = 200.5 MHz 25°C −82 −83 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 9.7 MHz 25°C −96 −95 dBc
fIN = 30.5 MHz 25°C −95
−95 dBc
fIN = 139.5 MHz 25°C −95 −93 dBc
fIN = 200.5 MHz 25°C −92 −89 dBc
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1 AND
AIN2 = −7.0 dBFS
f
= 70.5 MHz, f
IN1
= 72.5 MHz 25°C −92 −92 dBc
IN2
CROSSTALK2 25°C −97 −97 dB
CROSSTALK (OVERRANGE CONDITION)3 25°C −97 −97 dB
POWER SUPPLY REJECTION RATIO (PSRR)4
AVDD 25°C 44 43 dB
DRVDD 25°C 59 66 dB
ANALOG INPUT BANDWIDTH, FULL POWER 25°C 650 650 MHz
1
See the AN-835 Application Note, Understanding High Speed ADC Te sting and Evaluat ion, for definitions and for details on how these tests were completed.
2
Crosstalk is measured at 70 MHz with −1.0 dBFS analog input on one channel and no input on the adjacent channel.
3
Overrange condition is specified with 3 dB of the full-scale input range.
4
PSRR is measured by injecting a sinusoidal signal at 10 MHz to the power supply pin and measuring the output spur on the FFT. PSRR is calculated as the ratio of the
amplitude of the spur voltage over the amplitude of the pin voltage, expressed in decibels (dB).
Rev. 0 | Page 4 of 36
Data Sheet AD9635
Logic 1 Voltage
Full
1.2 AVDD + 0.2
V
Logic 0 Voltage
Full 0
0.8
V
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 3.
Parameter1 Temp Min Typ Max Unit
CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL
Differential Input Voltage2 Full 0.2 3.6 V p-p
Input Voltage Range Full AGND − 0.2 AVDD + 0.2 V
Input Common-Mode Voltage Full 0.9 V
Input Resistance (Differential) 25°C 15 kΩ
Input Capacitance 25°C 4 pF
LOGIC INPUT (SCLK/DFS)
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 30 kΩ
Input Capacitance 25°C 2 pF
LOGIC INPUT (CSB)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 26 kΩ
Input Capacitance 25°C 2 pF
Logic 1 Voltage (IOH = 800 μA) Full 1.79 V
Logic 0 Voltage (IOL = 50 μA) Full 0.05 V
DIGITAL OUTPUTS (D0x±, D1x±), ANSI-644
Logic Compliance LVDS
Differential Output Voltage Magnitude (VOD) Full 290 345 400 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
DIGITAL OUTPUTS (D0x±, D1x±), LOW POWER,
REDUCED SIGNAL OPTION
Logic Compliance LVDS
Differential Output Voltage Magnitude (VOD) Full 160 200 230 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Specified for LVDS and LVPECL only.
3
Specified for 13 SDIO/PDWN pins sharing the same connection.
Rev. 0 | Page 5 of 36
AD9635 Data Sheet
1, 2
Fall Time (tF) (20% to 80%)
Full 300 ps
FCO
CPD
FCO
SAMPLE
DAT A
SAMPLE
SAMPLE
SAMPLE
FRAME
SAMPLE
SAMPLE
SAMPLE
DATA -MAX
DATA -MIN
CLK
HIGH
LOW
Time required for the SDIO pin to switch from an input to an output relative
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 4.
Parameter
CLOCK3
Input Clock Rate Full 10 1000 MHz
Conversion Rate Full 10 80/125 MSPS
Clock Pulse Width High (tEH) Full 6.25/4.00 ns
Clock Pulse Width Low (tEL) Full 6.25/4.00 ns
OUTPUT PARAMETERS3
Propagation Delay (tPD) Full 2.3 ns
Rise Time (tR) (20% to 80%) Full 300 ps
Temp Min Typ Max Unit
FCO Propagation Delay (t
DCO Propagation Delay (t
DCO to Data Delay (t
DCO to FCO Delay (t
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured on standard FR-4 material.
3
Can be adjusted via the SPI. The conversion rate is the clock rate after the divider.
4
t
/16 is based on the number of bits in two LVDS data lanes. t
SAMPLE
5
Wake-up time is defined as the time required to return to normal operation from power-down mode.
SAMPLE
= 1/fS.
Clock
cycles
TIMING SPECIFICATIONS
Table 5.
Parameter Description Limit
SPI TIMING REQUIREMENTS See Figure 68
tDS Setup time between the data and the rising edge of SCLK 2 ns min
tDH Hold time between the data and the rising edge of SCLK 2 ns min
t
Period of the SCLK 40 ns min
tS Setup time between CSB and SCLK 2 ns min
tH Hold time between CSB and SCLK 2 ns min
t
SCLK pulse width high 10 ns min
t
SCLK pulse width low 10 ns min
t
EN_SDIO
10 ns min
to the SCLK falling edge (not shown in Figure 68)
t
Time required for the SDIO pin to switch from an output to an input relative
DIS_SDIO
10 ns min
to the SCLK rising edge (not shown in Figure 68)
Unit
Rev. 0 | Page 6 of 36
Data Sheet AD9635
D0A–
D0A+
D1A–
D1A+
FCO–
BYTEWISE
MODE
FCO+
D0A–
D0A+
D1A–
D1A+
FCO–
DCO+
CLK+
CLK–
DCO–
DCO+
DCO–
FCO+
BITWISE
MODE
SDR
DDR
10577-002
D10
N – 16
D08
N – 16
D06
N – 16
D04
N – 16
D02
N – 16
LSB
N – 16
D10
N – 17
D08
N – 17
D06
N – 17
D04
N – 17
D02
N – 17
LSB
N – 17
MSB
N – 16
D09
N – 16
D07
N – 16
D05
N – 16
D03
N – 16
D01
N – 16
MSB
N – 17
D09
N – 17
D07
N – 17
D05
N – 17
D03
N – 17
D01
N – 17
D05
N – 16
D04
N – 16
D03
N – 16
D02
N – 16
D01
N – 16
LSB
N – 16
D05
N – 17
D04
N – 17
D03
N – 17
D02
N – 17
D01
N – 17
LSB
N – 17
MSB
N – 16
D10
N – 16
D09
N – 16
D08
N – 16
D07
N – 16
D06
N – 16
MSB
N – 17
D10
N – 17
D09
N – 17
D08
N – 17
D07
N – 17
D06
N – 17
t
EH
t
CPD
t
FRAME
t
FCO
t
PD
t
DATA
t
LD
t
EL
VINx±
t
A
N – 1
N
N + 1
D0A–
D0A+
D1A–
D1A+
FCO–
BYTEWISE
MODE
FCO+
D0A–
D0A+
D1A–
D1A+
FCO–
DCO+
CLK+
CLK–
DCO–
FCO+
BITWISE
MODE
SDR
DDR
DCO+
DCO–
10577-003
D08
N – 17
D06
N – 17
D04
N – 17
D02
N – 17
LSB
N – 17
D07
N – 16
D05
N – 16
D03
N – 16
D01
N – 16
MSB
N – 17
D07
N – 17
D05
N – 17
D03
N – 17
D04
N – 16
D03
N – 16
D02
N – 16
D01
N – 16
LSB
N – 16
D04
N – 17
D03
N – 17
D02
N – 17
D01
N – 17
LSB
N – 17
MSB
N – 17
D08
N – 17
D07
N – 17
D06
N – 17
D05
N – 17
t
EH
t
CPD
t
FRAME
t
FCO
t
PD
t
DATA
t
LD
t
EL
VINx±
t
A
N – 1
N
N + 1
D08
N – 16
D06
N – 16
D04
N – 16
D02
N – 16
D08
N – 15
D06
N – 15
D04
N – 15
D02
N – 15
LSB
N – 16
MSB
N – 16
D07
N – 15
D05
N – 15
D03
N – 15
MSB
N – 15
D01
N – 17
D04
N – 16
D03
N – 15
D02
N – 15
D01
N – 15
D04
N – 15
MSB
N – 16
D08
N – 16
D07
N – 16
D06
N – 16
MSB
N – 15
D08
N – 15
D07
N – 15
D06
N – 15
D05
N – 16
Timing Diagrams
Refer to the Memory Map Register Descriptions section and Tabl e 20 for SPI register settings.
DRVDD to AGND −0.3 V to +2.0 V
Digital Outputs to AGND
(D0x±, D1x±, DCO+, DCO−,
FCO+, FCO−)
VINx+, VINx− to AGND −0.3 V to +2.0 V
SCLK/DFS, SDIO/PDWN, CSB to AGND −0.3 V to +2.0 V
RBIAS to AGND −0.3 V to +2.0 V
VREF to AGND −0.3 V to +2.0 V
VCM to AGND −0.3 V to +2.0 V
Environmental
Operating Temperature Range (Ambient) −40°C to +85°C
Maximum Junction Temperature 150°C
Lead Temperature (Soldering, 10 sec) 300°C
Storage Temperature Range (Ambient) −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
−0.3 V to +2.0 V
THERMAL RESISTANCE
The exposed paddle is the only ground connection on the chip.
The exposed paddle must be soldered to the AGND plane of the
user’s circuit board. Soldering the exposed paddle to the user’s
board also increases the reliability of the solder joints and
maximizes the thermal capability of the package.
Table 7. Thermal Resistance
Airflow
Package Type
32-Lead LFCSP,
5 mm × 5 mm
1
Per JEDEC JESD51-7, plus JEDEC JESD51-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-STD 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
Velocity
(m/sec)
0 37.1 3.1 20.7 0.3 °C/W
1.0 32.4 0.5 °C/W
2.5 29.1 0.8 °C/W
1, 2
1, 3
θ
θ
JA
JC
1, 4
θ
JB
1, 2
Unit
JT
Typ i c a l θJA is specified for a 4-layer PCB with a solid ground
plane. As shown in Table 7, airflow improves heat dissipation,
which reduces θ
. In addition, metal in direct contact with the
JA
package leads from metal traces, through holes, ground, and
power planes reduces the θ
.
JA
ESD CAUTION
Rev. 0 | Page 10 of 36
Data Sheet AD9635
24
AVDD
23
RBIAS
22
VCM
21
VREF
20
CSB
19
DRVDD
18
D0A+
17
D0A–
1
2
3
4
5
6
7
8
AVDD
CLK+
CLK–
S
DIO/PDWN
SCLK/DFS
DRVDD
D1B–
D1B+
9
10111213141516
D0B–
D0B+
DCO–
DCO+
FCO–
FCO+
D1A–
D1A+
32313029282726
25
AVDD
VINB–
VINB+
AVDD
AVDD
VINA+
VINA–
AVDD
AD9635
TOP VIEW
(Not to Scale)
NOTES
1. THE EXPOSED PADDLE IS THE ONLY GROUND CO NNE CTION
ON THE CHIP. IT MUST BE SOLDERED TO THE ANALOG GROUND
OF THE PCB TO ENSURE PROPER FUNCTIONALITY AND HEAT
DISSIPAT ION, NOISE, AND MECHANICAL STRENGTH BENEFITS.
10577-008
4
SDIO/PDWN
Data Input/Output in SPI Mode (SDIO). Bidirectional SPI data I/O with 30 kΩ internal pull-down.
pull-down. DFS high = twos complement output; DFS low = offset binary output.
6, 19
DRVDD
1.8 V Supply Pins for Output Driver Domain.
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 8. Pin Configuration, Top View
Table 8. Pin Function Descriptions
Pin No. Mnemonic Description
0 AGND,
Exposed Pad
The exposed paddle is the only ground connection on the chip. It must be soldered to the analog
ground of the PCB to ensure proper functionality and heat dissipation, noise, and mechanical strength
benefits.
1, 24, 25, 28 29, 32 AVDD 1.8 V Supply Pins for ADC Analog Core Domain.
2, 3 CLK+, CLK− Differential Encode Clock for LVPECL, LVDS, or 1.8 V CMOS Inputs.
Power-Down in Non-SPI Mode (PDWN). Static control of chip power-down with 30 kΩ internal pull-down.
5 SCLK/DFS SPI Clock Input in SPI Mode (SCLK). 30 kΩ internal pull-down.
Data Format Select in Non-SPI Mode (DFS). Static control of data output format, with 30 kΩ internal
7, 8 D1B−, D1B+ Channel B Digital Outputs.
9, 10 D0B−, D0B+ Channel B Digital Outputs.
11, 12 DCO−, DCO+ Data Clock Outputs.
13, 14 FCO−, FCO+ Frame Clock Outputs.
15, 16 D1A−, D1A+ Channel A Digital Outputs.
17, 18 D0A−, D0A+ Channel A Digital Outputs.
20 CSB SPI Chip Select. Active low enable with 15 kΩ internal pull-up.
21 VREF 1.0 V Voltage Reference Input/Output.
22 VCM Analog Output Voltage at Mid AVDD Supply. Sets the common-mode voltage of the analog inputs.
23 RBIAS Sets the analog current bias. Connect this pin to a 10 kΩ (1% tolerance) resistor to ground.
26, 27 VINA−, VINA+ Channel A ADC Analog Inputs.
30, 31 VINB+, VINB− Channel B ADC Analog Inputs.
Rev. 0 | Page 11 of 36
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