Supports external 3.3 V/5 V VCO/VCXO to 2.4 GHz
1 differential or 2 single-ended reference inputs
Accepts CMOS, LVPECL, or LVDS references to 250 MHz
Accepts 16.62 MHz to 33.33 MHz crystal for reference input
Optional reference clock doubler
Reference monitoring capability
Auto and manual reference switchover/holdover modes
with selectable revertive/nonrevertive switching
Glitch-free switchover between references
Automatic recovery from holdover
Digital or analog lock detect, selectable
Optional zero delay operation
Twelve 800 MHz LVDS outputs divided into 4 groups
Each group of 3 has a 1-to-32 divider with phase delay
Additive broadband jitter as low as 242 fs rms
Channel-to-channel skew grouped outputs < 60 ps
Each LVDS output can be configured as 2 CMOS outputs
(for f
≤ 250 MHz)
OUT
Automatic synchronization of all outputs on power-up
Manual synchronization of outputs as needed
SPI- and I²C-compatible serial control port
64-lead LFCSP
Nonvolatile EEPROM stores configuration settings
REF1
REFIN
REFIN
CLK
REF2
AND MUXES
SPI/I2C CONTROL
PORT AND
DIGITAL LOGIC
SWITCHOVER
AND MONITOR
DIVIDER
DIV/Φ
DIV/Φ
DIV/Φ
DIV/Φ
PLL
EEPROM
Figure 1.
The AD9522 serial interface supports both SPI and IC® ports.
STATUS
MONITOR
DELAY
LVDS/
CMOS
AD9522-5
ZERO
OUT0
OUT1
OUT2
OUT3
OUT4
OUT5
OUT6
OUT7
OUT8
OUT9
OUT10
OUT11
An in-package EEPROM can be programmed through the
APPLICATIONS
Low jitter, low phase noise clock distribution
Clock generation and translation for SONET, 10Ge, 10G FC,
and other 10 Gbps protocols
Forward error correction (G.710)
Clocking high speed ADCs, DACs, DDSs, DDCs, DUCs, MxFEs
High performance wireless transceivers
ATE and high performance instrumentation
Broadband infrastructures
GENERAL DESCRIPTION
The AD9522-51 provides a multioutput clock distribution function
with subpicosecond jitter performance, along with an on-chip PLL
that can be used with an external VCO.
serial interface and store user-defined register settings for
power-up and chip reset.
The AD9522 features 12 LVDS outputs in four groups. Any of
the 800 MHz LVDS outputs can be reconfigured as two
250 MHz CMOS outputs.
Each group of outputs has a divider that allows both the divide
ratio (from 1 to 32) and the phase (coarse delay) to be set.
The AD9522 is available in a 64-lead LFCSP and can be operated
from a single 3.3 V supply. The external VCO can have an
operating voltage up to 5.5 V.
The AD9522 is specified for operation over the standard industrial
range of −40°C to +85°C.
The AD9520-5 is an equivalent part to the AD9522-5 featuring
LVPECL/CMOS drivers instead of LVDS/CMOS drivers.
1
The AD9522 is used throughout this data sheet to refer to all the members of the AD9522 family. However, when AD9522-5 is used, it is referring to that specific
member of the AD9522 family.
07240-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Typical (typ) is given for VS = 3.3 V ± 5%; VS ≤ VCP ≤ 5.25 V; TA = 25°C; RSET = 4.12 kΩ; CPRSET = 5.1 kΩ, unless otherwise noted. Minimum
(min) and maximum (max) values are given over full VS and T
POWER SUPPLY REQUIREMENTS
Table 1.
Parameter Min Typ Max Unit Test Conditions/Comments
VS 3.135 3.3 3.465 V 3.3 V ± 5%
VCP VS 5.25 V This is nominally 3.3 V to 5.0 V ± 5%
RSET Pin Resistor 4.12 kΩ Sets internal biasing currents; connect to ground
CPRSET Pin Resistor 5.1 kΩ
PLL CHARACTERISTICS
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
REFERENCE INPUTS
Differential Mode (REFIN, REFIN)
Input Frequency 0 250 MHz
Input Sensitivity 280 mV p-p
Self-Bias Voltage, REFIN 1.35 1.60 1.75 V Self-bias voltage of REFIN1
Self-Bias Voltage, REFIN
Input Resistance, REFIN 4.0 4.8 5.9 kΩ Self-biased1
Input Resistance, REFIN
Dual Single-Ended Mode (REF1, REF2) Two single-ended CMOS-compatible inputs
1890 2348 3026 ps When N delay and R delay are bypassed
REF refers to REFIN (REF1)/REFIN
Pins) in Zero Delay Mode
Phase Offset (REF-to-LVDS Clock Output
900 1217 1695 ps When N delay = Setting 111 and R delay is bypassed
Pins) in Zero Delay Mode
is possible by changing
CP
is possible by changing
CP
(REF2)
Rev. 0 | Page 5 of 76
AD9522-5
Parameter Min Typ Max Unit Test Conditions/Comments
NOISE CHARACTERISTICS
In-Band Phase Noise of the Charge Pump/
Phase Frequency Detector (In-Band
Means Within the LBW of the PLL)
@ 500 kHz PFD Frequency −165 dBc/Hz
@ 1 MHz PFD Frequency −162 dBc/Hz
@ 10 MHz PFD Frequency −152 dBc/Hz
@ 50 MHz PFD Frequency −144 dBc/Hz
PLL Figure of Merit (FOM) −222 dBc/Hz
PLL DIGITAL LOCK DETECT WINDOW2
Lock Threshold (Coincidence of Edges)
Low Range (ABP 1.3 ns, 2.9 ns) 3.5 ns 0x017[1:0] = 00b, 01b, 11b; 0x018[4] = 1b
High Range (ABP 1.3 ns, 2.9 ns) 7.5 ns 0x017[1:0] = 00b, 01b, 11b; 0x018[4] = 0b
High Range (ABP 6.0 ns) 3.5 ns 0x017[1:0] = 10b; 0x018[4] = 0b
Unlock Threshold (Hysteresis)2
Low Range (ABP 1.3 ns, 2.9 ns) 7 ns 0x017[1:0] = 00b, 01b, 11b; 0x018[4] = 1b
High Range (ABP 1.3 ns, 2.9 ns) 15 ns 0x017[1:0] = 00b, 01b, 11b; 0x018[4] = 0b
High Range (ABP 6.0 ns) 11 ns 0x017[1:0] = 10b; 0x018[4] = 0b
1
The REFIN and
2
For reliable operation of the digital lock detect, the period of the PFD frequency must be greater than the unlock-after-lock time.
REFIN
self-bias points are offset slightly to avoid chatter on an open input condition.
The PLL in-band phase noise floor is estimated by
measuring the in-band phase noise at the output of
the VCO and subtracting 20 log(N) (where N is the value
of the N divider)
Reference slew rate > 0.5 V/ns; FOM + 10 log(f
PFD
) is an
approximation of the PFD/CP in-band phase noise (in
the flat region) inside the PLL loop bandwidth; when
running closed-loop, the phase noise, as observed at
the VCO output, is increased by 20 log(N); PLL figure of
merit decreases with decreasing slew rate; see Figure 11
Signal available at the LD, STATUS, and REFMON pins
when selected by appropriate register settings; lock
detect window settings can be varied by changing the
CPRSET resistor
Selected by 0x017[1:0] and 0x018[4] (this is the threshold
to go from unlock to lock)
Selected by 0x017[1:0] and 0x018[4] (this is the threshold
to go from lock to unlock)
Rev. 0 | Page 6 of 76
AD9522-5
CLOCK INPUTS
Table 3.
Parameter Min Typ Max Unit Test Conditions/Comments
CLOCK INPUTS (CLK, CLK)
Input Frequency 01 2.4 GHz High frequency distribution (VCO divider)
0
Input Sensitivity, Differential 150 mV p-p
Input Level, Differential 2 V p-p
Input Common-Mode Voltage, VCM 1.3 1.57 1.8 V Self-biased; enables ac coupling
Input Common-Mode Range, V
Output Frequency 250 MHz See Figure 18
Output Voltage High, VOH VS − 0.1 V @ 1 mA load
Output Voltage Low, VOL 0.1 V @ 1 mA load
Output Voltage High, VOH 2.7 V @ 10 mA load
Output Voltage Low, VOL 0.5 V @ 10 mA load
Differential input
1
1.6 GHz
Distribution only (VCO divider bypassed); this is the
frequency range supported by the channel divider
Measured at 2.4 GHz; jitter performance is improved with
slew rates > 1 V/ns
Larger voltage swings can turn on the protection diodes
and can degrade jitter performance
1.3 1.8 V With 200 mV p-p signal applied; dc-coupled
CLK ac-coupled; CLK
Differential (OUT, OUT
ac-bypassed to RF ground
)
The AD9522 outputs toggle at higher frequencies,
but the output amplitude may not meet the V
specification
− VOL measurement across a differential pair
V
OH
at the default amplitude setting with output
driver not toggling; see Figure 17 for variation
over frequency
This is the absolute value of the difference
between VOD when the normal output is high vs.
when the complementary output is high
+ VOL)/2 across a differential pair at the default
(V
OH
amplitude setting with output driver not toggling
This is the absolute value of the difference
between VOS when the normal output is high vs.
when the complementary output is high
Single-ended; termination = 10 pF
Rev. 0 | Page 7 of 76
OD
AD9522-5
K
TIMING CHARACTERISTICS
Table 5.
Parameter Min Typ Max Unit Test Conditions/Comments
LVDS OUTPUT RISE/FALL TIMES Termination = 100 Ω across differential pair
Output Rise Time, tRP 150 350 ps 20% to 80%, measured differentially
Output Fall Time, tFP 150 350 ps 80% to 20%, measured differentially
PROPAGATION DELAY, t
For All Divide Values 1866 2313 2812 ps High frequency clock distribution configuration
1808 2245 2740 ps Clock distribution configuration
Variation with Temperature 1 ps/°C
LVDS Outputs That Share the Same Divider 7 60 ps
LVDS Outputs on Different Dividers 19 162 ps
All LVDS Outputs Across Multiple Parts 432 ps
CMOS OUTPUT RISE/FALL TIMES Termination = open
Output Rise Time, tRC 625 835 ps 20% to 80%; C
Output Fall Time, tFC 625 800 ps 80% to 20%; C
PROPAGATION DELAY, t
For All Divide Values 1913 2400 2950 ps
Variation with Temperature 2 ps/°C
OUTPUT SKEW, CMOS OUTPUTS1
CMOS Outputs That Share the Same Divider 10 55 ps
All CMOS Outputs on Different Dividers 27 230 ps
All CMOS Outputs Across Multiple Parts 500 ps
OUTPUT SKEW, LVDS-TO-CMOS OUTPUT1 All settings identical; different logic type
Outputs That Share the Same Divider −31 +152 +495 ps LVDS to CMOS on the same part
Outputs That Are on Different Dividers −193 +160 +495 ps LVDS to CMOS on the same part
1
The output skew is the difference between any two similar delay paths while operating at the same voltage and temperature.
Timing Diagrams
CL
, CLK-TO-LVDS OUTPUT
LVDS
= 10 pF
LOAD
= 10 pF
LOAD
, CLK-TO-CMOS OUTPUT Clock distribution configuration
CLK = 100 MHz 263 fs rms Calculated from SNR of ADC method
Any LVDS Output = 100 MHz Broadband jitter
Divide Ratio = 1
CLK = 500 MHz 242 fs rms Calculated from SNR of ADC method
Any LVDS Output = 100 MHz Broadband jitter
Divide Ratio = 5
CMOS OUTPUT ADDITIVE TIME JITTER Distribution section only; does not include PLL and VCO
CLK = 200 MHz 289 fs rms Calculated from SNR of ADC method
Any CMOS Output Pair = 100 MHz Broadband jitter
Divide Ratio = 2
Application example based on a typical setup using an
external 245.76 MHz VCXO (Toyocom TCO-2112);
reference = 15.36 MHz; R DIV = 1
Distribution section only; does not include PLL and
VCO; measured at rising edge of clock signal
Rev. 0 | Page 10 of 76
AD9522-5
CLOCK OUTPUT ADDITIVE TIME JITTER (VCO DIVIDER USED)
Table 9.
Parameter Min Typ Max Unit Test Conditions/Comments
LVDS OUTPUT ADDITIVE TIME JITTER
CLK = 500 MHz; VCO DIV = 5; LVDS = 100 MHz;
248 fs rms
Bypass Channel Divider; Duty-Cycle Correction = On
CMOS OUTPUT ADDITIVE TIME JITTER
CLK = 200 MHz; VCO DIV = 2; CMOS = 100 MHz;
290 fs rms
Bypass Channel Divider; Duty-Cycle Correction = Off
CLK = 200 MHz; VCO DIV = 1; CMOS = 100 MHz;
288 fs rms
Bypass Channel Divider; Duty-Cycle Correction = Off
SERIAL CONTROL PORT—SPI MODE
Table 10.
Parameter Min Typ Max Unit Test Conditions/Comments
CS (INPUT)
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 3 μA
Input Logic 0 Current −110 μA
Input Capacitance 2 pF
SCLK (INPUT) IN SPI MODE
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 110 μA
Input Logic 0 Current 1 μA
Input Capacitance 2 pF
SDIO (WHEN AN INPUT IN BIDIRECTIONAL MODE)
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 1 μA
Input Logic 0 Current 1 μA
Input Capacitance 2 pF
SDIO, SDO (OUTPUTS)
Output Logic 1 Voltage 2.7 V
Output Logic 0 Voltage 0.4 V
TIMING
Clock Rate (SCLK, 1/t
Pulse Width High, t
Pulse Width Low, t
) 25 MHz
SCLK
16 ns
HIGH
16 ns
LOW
SDIO to SCLK Setup, tDS 4 ns
SCLK to SDIO Hold, tDH 0 ns
SCLK to Valid SDIO and SDO, tDV 11 ns
CS to SCLK Setup and Hold, tS, tC
CS Minimum Pulse Width High, t
PWH
CS has an internal 30 kΩ pull-up resistor
The minus sign indicates that current is flowing out of
the AD9522, which is due to the internal pull-up resistor
SCLK has an internal 30 kΩ pull-down resistor in SPI
mode, but not in I
2 ns
3 ns
Distribution section only; does not include
PLL and VCO; uses rising edge of clock signal
Calculated from SNR of ADC method
(broadband jitter)
Distribution section only; does not include
PLL and VCO; uses rising edge of clock signal
Calculated from SNR of ADC method
(broadband jitter)
Calculated from SNR of ADC method
(broadband jitter)
2
C mode
Rev. 0 | Page 11 of 76
AD9522-5
SERIAL CONTROL PORT—I²C MODE
Table 11.
Parameter Min Typ Max Unit Test Conditions/Comments
SDA, SCL (WHEN INPUTTING DATA)
Input Logic 1 Voltage 0.7 × VS V
Input Logic 0 Voltage 0.3 × VS V
Input Current with an Input Voltage Between
0.1 × VS and 0.9 × VS
Hysteresis of Schmitt Trigger Inputs 0.015 × VS V
Pulse Width of Spikes That Must Be Suppressed by
the Input Filter, t
SPIKE
SDA (WHEN OUTPUTTING DATA)
Output Logic 0 Voltage at 3 mA Sink Current 0.4 V
Output Fall Time from VIH
MIN
to VIL
with a Bus
MAX
Capacitance from 10 pF to 400 pF
TIMING
Clock Rate (SCL, f
Bus Free Time Between a Stop and Start Condition, t
Setup Time for a Repeated Start Condition, t
) 400 kHz
I2C
IDLE
0.6 μs
SET; STR
Hold Time (Repeated) Start Condition (After This Period,
the First Clock Pulse Is Generated), t
Setup Time for Stop Condition, t
Low Period of the SCL Clock, t
High Period of the SCL Clock, t
SCL, SDA Rise Time, t
SCL, SDA Fall Time, t
Data Setup Time, t
Data Hold Time, t
RISE
FAL L
SET; DAT
HLD; DAT
LOW
HIGH
20 + 0.1 Cb 300 ns Cb = capacitance of one bus line in pF
20 + 0.1 Cb 300 ns Cb = capacitance of one bus line in pF
120 ns
140 880 ns
SET; STP
1.3 μs
0.6 μs
HLD; STR
0.6 μs
Capacitive Load for Each Bus Line, Cb 400 pF
1
According to the original I2C specification, an I2C master must also provide a minimum hold time of 300 ns for the SDA signal to bridge the undefined region of the SCL
falling edge.
−10 +10 μA
50 ns
20 + 0.1 C
250 ns Cb = capacitance of one bus line in pF
b
Note that all I
to VIH
(0.7 × VS)
1.3 μs
0.6 μs
This is a minor deviation from the
original I²C specification of 100 ns
minimum
This is a minor deviation from the
original I²C specification of 0 ns
minimum
2
C timing values refer
(0.3 × VS) and VIL
MIN
1
MAX
levels
Rev. 0 | Page 12 of 76
AD9522-5
PD, SYNC, AND RESET PINS
Table 12.
Parameter Min Typ Max Unit Test Conditions/Comments
INPUT CHARACTERISTICS Each of these pins has an internal 30 kΩ pull-up resistor
Logic 1 Voltage 2.0 V
Logic 0 Voltage 0.8 V
Logic 1 Current 1 μA
Logic 0 Current −110 μA
Capacitance 2 pF
RESET TIMING
Pulse Width Low 50 ns
RESET Inactive to Start of Register Programming
SYNC TIMING
Pulse Width Low 1.3 ns High speed clock is CLK input signal
100 ns
SERIAL PORT SETUP PINS: SP1, SP0
Table 13.
Parameter Min Typ Max Unit Test Conditions/Comments
SP1, SP0 These pins do not have internal pull-up/pull-down resistors
Logic Level 0 0.25 × VS V VS is the voltage on the VS pin
Logic Level ½ 0.4 × VS 0.65 × VS V
Logic Level 1 0.8 × VS V
User can float these pins to obtain Logic Level ½; if floating these pins, user
should connect a capacitor to ground
The minus sign indicates that current is flowing out of
the AD9522, which is due to the internal pull-up resistor
LD, STATUS, AND REFMON PINS
Table 14.
Parameter Min Typ Max Unit Test Conditions/Comments
OUTPUT CHARACTERISTICS
Output Voltage High, VOH 2.7 V
Output Voltage Low, VOL 0.4 V
MAXIMUM TOGGLE RATE 100 MHz
ANALOG LOCK DETECT
Capacitance 3 pF
REF1, REF2, AND CLK FREQUENCY STATUS MONITOR
Normal Range 1.02 MHz
Extended Range 8 kHz
LD PIN COMPARATOR
Trip Point 1.6 V
Hysteresis 260 mV
When selected as a digital output (CMOS); there are other
modes in which these pins are not CMOS digital outputs;
see Table 47, 0x017, 0x01A, and 0x01B
Applies when mux is set to any divider or counter output,
or PFD up/down pulse; also applies in analog lock detect
mode; usually debug mode only; note that spurs can
couple to output when any of these pins are toggling
On-chip capacitance; used to calculate RC time constant
for analog lock detect readback; use a pull-up resistor
Frequency above which the monitor indicates the
presence of the reference
Frequency above which the monitor indicates the
presence of the reference
Rev. 0 | Page 13 of 76
AD9522-5
POWER DISSIPATION
Table 15.
Parameter Min Typ Max Unit Test Conditions/Comments
POWER DISSIPATION, CHIP
Power-On Default 0.88 1.0 W No clock; no programming; default register values
Distribution Only Mode; VCO Divider On;
POWER DELTAS, INDIVIDUAL FUNCTIONS Power delta when a function is enabled/disabled
VCO Divider On/Off 33 43 mW VCO divider not used
REFIN (Differential) Off 25 31 mW
REF1, REF2 (Single-Ended) On/Off 16 22 mW
PLL Dividers and Phase Detector On/Off 54 67 mW PLL off to PLL on, normal operation; no reference enabled
LVDS Channel 118 146 mW No LVDS output on to one LVDS output on; channel divider set to 1
LVDS Driver 11 15 mW Second LVDS output turned on, same channel
CMOS Channel 120 154 mW
CMOS Driver On/Off 16 30 mW Additional CMOS outputs within the same channel turned on
Channel Divider Enabled 33 40 mW
Zero Delay Block On/Off 30 35 mW
Does not include power dissipated in external resistors; all LVDS
outputs terminated with 100 Ω across differential pair; all CMOS
outputs have 10 pF capacitive loading
= 2.4 GHz; f
f
CLK
= 200 MHz; VCO divider = 2; one LVDS output
OUT
and output divider enabled; zero delay off
= 2.4 GHz; f
f
CLK
= 200 MHz; VCO divider bypassed; one LVDS
OUT
output and output divider enabled; zero delay off
PLL on; VCO divider = 3; all channel dividers on; 12 LVDS
outputs @ 125 MHz; zero delay on
PD pin pulled low; does not include power dissipated in
SYNC, RESET, PD
REFMON, STATUS, LD GND −0.3 V to VS + 0.3 V
SP0, SP1, EEPROM GND −0.3 V to VS + 0.3 V
Junction Temperature1 150°C
Storage Temperature Range −65°C to +150°C
Lead Temperature (10 sec) 300°C
1
See Table 17 for θJA.
, OUT3, OUT3,
, OUT5, OUT5,
Respect to Rating
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
CLK
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
−1.2 V to +1.2 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Thermal impedance measurements were taken on a JEDEC
JESD51-5 2S2P test board in still air in accordance with JEDEC
JESD51-2. See the Thermal Performance section for more details.
Table 17.
Package Type θJA Unit
64-Lead LFCSP (CP-64-4) 22 °C/W
ESD CAUTION
Rev. 0 | Page 15 of 76
AD9522-5
S
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
REFIN (REF 1)
REFIN (REF 2)
CPRSETVSVS
GND
RSETVSOUT0 (OUT0A)
OUT0 (OUT0B)VSOUT1 (OUT1A)
OUT1 (OUT1B)
OUT2 (OUT2A)
OUT2 (OUT2B)
646362616059585756555453525150
VS
49
32
VS
48
OUT3 (OUT3A)
47
OUT3 (OUT3B)
46
VS
45
OUT4 (OUT4A)
44
OUT4 (OUT4B)
43
OUT5 (OUT5A)
42
OUT5 (OUT5B)
41
VS
40
VS
39
OUT8 (OUT8B)
38
OUT8 (OUT8A)
37
OUT7 (OUT7B)
36
OUT7 (OUT7A)
35
VS
34
OUT6 (OUT6B)
33
OUT6 (OUT6A)
07240-003
VS
1
PIN 1
REFMON
LD
VCP
CP
STATUS
REF_SEL
SYNC
NC
NC
10
VS
11
VS
12
CLK
13
CLK
14
CS
15
16
CLK/SCL
NOTES
1. EXPOSED DIE PAD MUST BE CO NNECTED TO GND.
INDICATO R
2
3
4
5
6
7
8
9
171819202122232425262728293031
SDIO/SDA
SDO
SP1
SP0
GND
AD9522-5
TOP VIEW
(Not to Scale)
PD
RESET
EEPROM
T9 (OUT9A)
OU
T9 (OUT9B)
OU
VS
OUT10A)
OUT10 (
OUT10B)
OUT10 (
OUT11A)
OUT11 (
OUT11B)
OUT11 (
Figure 5. Pin Configuration
Table 18. Pin Function Descriptions
Pin No.
1, 11, 12, 27,
Input/
Output
I Power VS 3.3 V Power Pins.
Pin
Type Mnemonic Description
32, 35, 40,
41, 46, 49,
54, 57, 60, 61
2 O 3.3 V CMOS REFMON Reference Monitor (Output). This pin has multiple selectable outputs.
3 O 3.3 V CMOS LD
4 I Power VCP
Lock Detect (Output). This pin has multiple selectable outputs.
Power Supply for Charge Pump (CP); VS ≤ VCP ≤ 5.25 V. VCP must still be connected
to 3.3 V if the PLL is not used.
5 O Loop filter CP
Charge Pump (Output). This pin connects to an external loop filter. This pin can
be left unconnected if the PLL is not used.
6 O 3.3 V CMOS STATUS
7 I 3.3 V CMOS REF_SEL
Programmable Status Output.
Reference Select. It selects REF1 (low) or REF2 (high). This pin has an internal
30 kΩ pull-down resistor.
8 I 3.3 V CMOS
SYNC
Manual Synchronizations and Manual Holdover. This pin initiates a manual
synchronization and is used for manual holdover. Active low. This pin has an
internal 30 kΩ pull-up resistor.
9, 10 NC
13 I
Differential
CLK
No Connect. These pins can be left floating.
Along with CLK, this pin is the differential input for the clock distribution section.
clock input
14 I
Differential
clock input
Along with CLK, this pin is the differential input for the clock distribution section. If a
CLK
single-ended input is connected to the CLK pin, connect a 0.1 μF bypass capacitor
from this pin to ground.
Rev. 0 | Page 16 of 76
AD9522-5
Input/
Pin No.
15 I 3.3 V CMOS
16 I 3.3 V CMOS SCLK/SCL
17 I/O 3.3 V CMOS SDIO/SDA Serial Control Port Bidirectional Serial Data In/Out.
18 O 3.3 V CMOS SDO Serial Control Port Unidirectional Serial Data Out.
19, 59 I GND GND Ground Pins.
20 I
21 I
22 I 3.3 V CMOS EEPROM
23 I 3.3 V CMOS
24 I 3.3 V CMOS
25 O
26 O
28 O
29 O
30 O
31 O
33 O
34 O
36 O
37 O
38 O
39 O
42 O
43 O
44 O
45 O
Output
Pin
Type Mnemonic Description
Serial Control Port Chip Select; Active Low. This pin has an internal 30 kΩ
CS
pull-up resistor.
Serial Control Port Clock Signal. This pin has an internal 30 kΩ pull-down resistor
in SPI mode but is high impedance in I²C mode.
Three-level
logic
Three-level
logic
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
SP1
SP0
RESET
PD
OUT9 (OUT9A)
(OUT9B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT9
OUT10 (OUT10A)
(OUT10B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT10
OUT11 (OUT11A)
(OUT11B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT11
OUT6 (OUT6A)
(OUT6B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT6
OUT7 (OUT7A)
(OUT7B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT7
OUT8 (OUT8A)
(OUT8B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT8
(OUT5B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT5
OUT5 (OUT5A)
(OUT4B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT4
OUT4 (OUT4A)
Select SPI or I²C as the serial interface port and select the I²C slave address in I²C
mode. Three-level logic. This pin is internally biased for the open logic level.
Select SPI or I²C as the serial interface port and select the I²C slave address in I²C
mode. Three-level logic. This pin is internally biased for the open logic level.
Setting this pin high selects the register values stored in the internal EEPROM to
be loaded at reset and/or power-up. Setting this pin low causes the AD9522 to
load the hard-coded default register values at power-up/reset. This pin has an
internal 30 kΩ pull-down resistor.
Chip Reset, Active Low. This pin has an internal 30 kΩ pull-up resistor.
Chip Power-Down, Active Low. This pin has an internal 30 kΩ pull-up resistor.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
Rev. 0 | Page 17 of 76
AD9522-5
Input/
Pin No.
47 O
48 O
50 O
51 O
52 O
53 O
55 O
56 O
58 O
62 O
63 I
64 I
EPAD GND GND The exposed die pad must be connected to GND.
Output
Pin
Type Mnemonic Description
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
LVDS or
CMOS
Current set
resistor
Current set
resistor
Reference
input
Reference
input
(OUT3B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT3
or as a single-ended CMOS output.
OUT3 (OUT3A)
(OUT2B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT2
OUT2 (OUT2A)
(OUT1B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT1
OUT1 (OUT1A)
(OUT0B) Clock Output. This pin can be configured as one side of a differential LVDS output
OUT0
OUT0 (OUT0A)
RSET
CPRSET
(REF2) Along with REFIN, this is the differential input for the PLL reference. Alternatively,
REFIN
REFIN (REF1)
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
or as a single-ended CMOS output.
Clock Output. This pin can be configured as one side of a differential LVDS output
or as a single-ended CMOS output.
Clock Distribution Current Set Resistor. Connect a 4.12 kΩ resistor from this pin
to GND.
Charge Pump Current Set Resistor. Connect a 5.1 kΩ resistor from this pin to GND.
This resistor can be omitted if the PLL is not used.
this pin is a single-ended input for REF2.
Along with REFIN
this pin is a single-ended input for REF1.
, this is the differential input for the PLL reference. Alternatively,
Rev. 0 | Page 18 of 76
AD9522-5
–
–
TYPICAL PERFORMANCE CHARACTERISTICS
275
250
225
200
175
150
CURRENT (mA)
125
100
3 CHANNELS—6 LVDS
3 CHANNELS—3 LVDS
2 CHANNELS—2 LVDS
1 CHANNEL—1 LVDS
5
4
PUMP DOWNPUMP UP
3
2
CURRENT FROM CP P IN (mA)
1
75
02004006008001000
FREQUENCY (MHz )
07240-108
Figure 6. Total Current vs. Frequency, CLK-to-Output (PLL Off), Channel and
VCO Divide r Bypa ssed, LVDS Outputs Terminated 100 Ω A cross Differential Pair
240
220
200
180
160
140
CURRENT (mA)
120
100
80
050100150200250
2 CHANNELS—8 CMOS
2 CHANNELS—2 CMOS
1 CHANNEL—2 CMOS
1 CHANNEL—1 CMOS
FREQUENCY (MHz)
07240-109
Figure 7. Total Current vs. Frequency, CLK-to-Output (PLL Off), Channel and
VCO Divider Bypassed, CMOS Outputs with 10 pF Load
5
4
PUMP UPPUMP DOWN
3
2
CURRENT FROM CP P IN (mA)
1
0
033.02.52.01.51.00.5
VOLTAGE ON CP PIN (V)
.5
07240-111
Figure 8. Charge Pump Characteristics @ VCP = 3.3 V
0
054.03.04.53.52.52.01.51.00.5
VOLTAGE ON CP PIN (V)
.0
Figure 9. Charge Pump Characteristics @ VCP = 5.0 V
140
–145
–150
–155
(dBc/Hz)
–160
–165
PFD PHASE NOI SE REFERRED TO PFD INPUT
–170
0.1110010
PFD FREQUENCY (MHz)
Figure 10. PFD Phase Noise Referred to PFD Input vs. PFD Frequency
208
–210
–212
–214
–216
–218
–220
PLL FIGURE OF MERIT (dBc/ Hz)
–222
–224
Figure 11. PLL Figure of Merit (FOM) vs. Slew Rate at REFIN/
DIFFERENTIAL INPUT
SINGLE- ENDED INPUT
00.40.81.20.20.61.01.4
INPUT SLEW RATE (V/ns)
REFIN
07240-112
07240-013
07240-114
Rev. 0 | Page 19 of 76
AD9522-5
3.5
3.0
VS_DRV = 3.135V
2.5
VS_DRV = 2.35V
2.0
(V)
OH
V
1.5
1.0
0.5
0
10k1k100
RESISTIVE LOAD (Ω)
Figure 12. CMOS Output VOH (Static) vs. R
VS_DRV = 3.3V
VS_DRV = 2.5V
LOAD
(to Ground)
0.4
0.3
0.2
0.1
0
–0.1
–0.2
DIFFERENTIAL OUTPUT (V)
–0.3
–0.4
011413121110987654321
TIME (ns)
Figure 13. LVDS Output (Differential) @ 100 MHz,
Output Terminated 100 Ω Across Differential Pair
0.4
0.3
0.2
0.1
0
–0.1
–0.2
DIFFERENTIAL SWING (V p-p)
–0.3
–0.4
032.52.01.51.00.5
TIME (ns)
Figure 14. LVDS Differential Voltage Swing @ 800 MHz,
Output Terminated 100 Ω Across Differential Pair
07240-118
5
07240-014
.0
07240-015
3.2
2.8
2.4
2.0
1.6
AMPLITUDE ( V)
1.2
0.8
0.4
0
086010040207050903010
TIME (ns)
0
Figure 15. CMOS Output with 10 pF Load @ 25 MHz
3.2
2.8
2.4
2.0
1.6
AMPLITUDE (V)
1.2
0.8
0.4
0
01987654321
2pF LOAD
TIME (ns)
10pF
LOAD
Figure 16. CMOS Output with 2 pF and 10 pF Load @ 250 MHz
1600
1400
1200
1000
800
600
400
DIFFERENTIAL SWING (mV p-p)
200
0
01000600800400200
7mA SETTING
DEFAULT 3.5mA SETTING
FREQUENCY (GHz)
Figure 17. LVDS Differential Voltage Swing vs. Frequency,
Output Terminated 100 Ω Across Differential Pair
07240-018
0
07240-019
07240-123
Rev. 0 | Page 20 of 76
AD9522-5
–
–
–
–
–
4.0
3.5
3.0
2.5
2.0
1.5
AMPLITUDE (V)
1.0
0.5
2pF
10pF
20pF
100
–110
–120
–130
PHASE NOISE (dBc/Hz)
–140
0
07
FREQUENCY (MHz )
600500400300200100
00
07240-124
Figure 18. CMOS Output Swing vs. Frequency and Capacitive Load
An ideal sine wave has a continuous and even progression of
phase with time from 0° to 360° for each cycle. Actual signals,
however, have a variation from the ideal phase progression over
time. This variation is called phase jitter. Although many causes
can contribute to phase jitter, one major cause is random noise,
which is characterized statistically as a Gaussian (normal)
distribution.
This phase jitter leads to a spreading out of the energy of the
sine wave in the frequency domain, producing a continuous
power spectrum. This power spectrum is usually reported as a
series of values whose units are dBc/Hz at a given offset in
frequency from the sine wave (carrier). The value is a ratio
(expressed in decibels) of the power contained within a 1 Hz
bandwidth with respect to the power at the carrier frequency.
For each measurement, the offset from the carrier frequency is
also given.
It is meaningful to integrate the total power contained within
some interval of offset frequencies (for example, 10 kHz to
10 MHz). This is called the integrated phase noise over that
frequency offset interval and can be readily related to the time
jitter due to the phase noise within that offset frequency interval.
Phase noise has a detrimental effect on the performance of ADCs,
DACs, and RF mixers. It lowers the achievable dynamic range of
the converters and mixers, although they are affected in somewhat
different ways.
Time Jitter
Phase noise is a frequency domain phenomenon. In the time
domain, the same effect is exhibited as time jitter. When observing
a sine wave, the time of successive zero crossings varies. In a square
wave, the time jitter is a displacement of the edges from their
ideal (regular) times of occurrence. In both cases, the variations in
timing from the ideal are the time jitter. Because these variations
are random in nature, the time jitter is specified in seconds root
mean square (rms) or 1 sigma of the Gaussian distribution.
Time jitter that occurs on a sampling clock for a DAC or an
ADC decreases the signal-to-noise ratio (SNR) and dynamic
range of the converter. A sampling clock with the lowest possible
jitter provides the highest performance from a given converter.
Additive Phase Noise
Additive phase noise is the amount of phase noise that is
attributable to the device or subsystem being measured.
The phase noise of any external oscillators or clock sources is
subtracted. This makes it possible to predict the degree to which
the device impacts the total system phase noise when used in
conjunction with the various oscillators and clock sources, each
of which contributes its own phase noise to the total. In many
cases, the phase noise of one element dominates the system
phase noise. When there are multiple contributors to phase
noise, the total is the square root of the sum of squares of the
individual contributors.
Additive Time Jitter
Additive time jitter is the amount of time jitter that is attributable to
the device or subsystem being measured. The time jitter of any
external oscillators or clock sources is subtracted. This makes it
possible to predict the degree to which the device impacts the
total system time jitter when used in conjunction with the various
oscillators and clock sources, each of which contributes its own
time jitter to the total. In many cases, the time jitter of the external
oscillators and clock sources dominates the system time jitter.
Rev. 0 | Page 23 of 76
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