Analog Devices AD8111, AD8110 Datasheet

REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
a
AD8110/AD8111*
260 MHz, 16 3 8 Buffered
Video Crosspoint Switches
FUNCTIONAL BLOCK DIAGRAM
AD8110/AD8111
SWITCH MATRIX
OUTPUT BUFFER
G = +1,
G = +2
40
40
128
40-BIT SHIFT REGISTER
WITH 5-BIT
PARALLEL LOADING
PARALLEL LATCH
DECODE
8 3 5:16 DECODERS
8
CLK
DATA IN
UPDATE
CE
RESET
16 INPUTS
A0
DATA OUT
8 OUTPUTS
SET INDIVIDUAL OR
RESET ALL OUTPUTS
TO "OFF"
A1 A2
SER/PAR
D0 D1 D2D3
ENABLE/DISABLE
D4
FEATURES 16 3 8 High Speed Nonblocking Switch Arrays
AD8110: G = +1
AD8111: G = +2 Serial or Parallel Switch Array Control Serial Data Out Allows “Daisy Chaining” of Multiple
Crosspoints to Create Larger Switch Arrays Pin Compatible with AD8108/AD8109 8 3 8 Switch
Arrays For a 16 3 16 Array See AD8116 Complete Solution
Buffered Inputs
Eight Output Amplifiers, AD8110 (G = +1),
AD8111 (G = +2)
Drives 150 V Loads Excellent Video Performance
60 MHz 0.1 dB Gain Flatness
0.02% Differential Gain Error (R
L
= 150 V)
0.028 Differential Phase Error (R
L
= 150 V)
Excellent AC Performance
260 MHz –3 dB Bandwidth
500 V/ms Slew Rate Low Power of 50 mA Low All Hostile Crosstalk of –78 dB @ 5 MHz Output Disable Allows Direct Connection of Multiple
Device Outputs Reset Pin Allows Disabling of All Outputs (Connected
Through a Capacitor to Ground Provides “Power-
On” Reset Capability)
Excellent ESD Rating: Exceeds 4000 V Human Body
Model 80-Lead TQFP Package (12 mm 3 12 mm)
APPLICATIONS Routing of High Speed Signals Including:
Composite Video (NTSC, PAL, S, SECAM)
Component Video (YUV, RGB)
Compressed Video (MPEG, Wavelet)
3-Level Digital Video (HDB3)
PRODUCT DESCRIPTION
The AD8110 and AD8111 are high speed 16 × 8 video cross­point switch matrices. They offer a –3 dB signal bandwidth greater than 260 MHz, and channel switch times of less than 25 ns with 1% settling. With –78 dB of crosstalk and –97 dB isolation (@ 5 MHz), the AD8110/AD8111 are useful in many high speed applications. The differential gain and differential
phase of better than 0.02% and 0.02° respectively, along with
0.1 dB flatness out to 60 MHz, make the AD8110/AD8111 ideal for video signal switching.
The AD8110 and AD8111 include eight independent output buffers that can be placed into a high impedance state for paral­leling crosspoint outputs so that off channels do not load the output bus. The AD8110 has a gain of +1, while the AD8111 offers a gain of +2. They operate on voltage supplies of ±5 V while consuming only 50 mA of idle current. The channel switching is performed via a serial digital control (which can accommodate “daisy chaining” of several devices) or via a paral­lel control, allowing updating of an individual output without re­programing the entire array.
The AD8110/AD8111 is packaged in an 80-lead TQFP package and is available over the extended industrial temperature range of –40°C to +85°C.
*Patent Pending.
–2– REV. 0
AD8110/AD8111–SPECIFICA TIONS
(VS = 65 V, TA = +258C, RL = 1 kV unless otherwise noted)
AD8110/AD8111 Reference
Parameter Conditions Min Typ Max Units Figure No.
DYNAMIC PERFORMANCE
–3 dB Bandwidth 200 mV p-p, R
L
= 150 300/190 390/260 MHz 6, 12
2 V p-p, R
L
= 150 150 MHz 6, 12
Propagation Delay 2 V p-p, R
L
= 150 5ns
Slew Rate 2 V Step, R
L
= 150 500 V/µs
Settling Time 0.1%, 2 V Step, R
L
= 150 40 ns 11, 17
Gain Flatness 0.05 dB, 200 mV p-p, R
L
= 150 60/40 MHz 6, 12
0.05 dB, 2 V p-p, R
L
= 150 65/40 MHz 6, 12
0.1 dB, 200 mV p-p, R
L
= 150 80/57 MHz 6, 12
0.1 dB, 2 V p-p, RL = 150 70/57 MHz 6, 12
NOISE/DISTORTION PERFORMANCE
Differential Gain Error NTSC or PAL, RL = 1 k 0.01 %
NTSC or PAL, R
L
=150 0.02 %
Differential Phase Error NTSC or PAL, R
L
= 1 k 0.01 Degrees
NTSC or PAL, R
L
= 150 0.02 Degrees
Crosstalk, All Hostile f = 5 MHz 78/85 dB 7, 13
f = 10 MHz 70/80 dB 7, 13
Off Isolation, Input-Output f = 10 MHz, R
L
=150 , One Channel 93/99 dB 22, 28
Input Voltage Noise 0.01 MHz to 50 MHz 15 nV/√Hz 19, 25
DC PERFORMANCE
Gain Error RL = 1 k 0.04/0.1 0.07/0.5 %
R
L
= 150 0.15/0.25 %
Gain Matching No Load, Channel-Channel 0.02/1.0 %
R
L
= 1 k, Channel-Channel 0.09/1.0 %
Gain Temperature Coefficient 0.5/8 ppm/°C
OUTPUT CHARACTERISTICS
Output Impedance DC, Enabled 0.2 23, 29
Disabled 10/0.001 M 20, 26 Output Disable Capacitance Disabled 2 pF Output Leakage Current Disabled, AD8110 Only 1/NA µA Output Voltage Range No Load ±2.5 ±3V Output Current 20 40 mA Short Circuit Current 65 mA
INPUT CHARACTERISTICS
Input Offset Voltage Worse Case (All Configurations) 5 20 mV 34, 40
Temperature Coefficient 12 µV/°C 35, 41 Input Voltage Range ±2.5/±1.25 ±3/±1.5 V Input Capacitance Any Switch Configuration 2.5 pF Input Resistance 1 10 M Input Bias Current Per Output Selected 2 5 µA
SWITCHING CHARACTERISTICS
Enable On Time 60 ns Switching Time, 2 V Step 50% UPDATE to 1% Settling 25 ns Switching Transient (Glitch) Measured at Output 20/30 mV p-p 21, 27
POWER SUPPLIES
Supply Current AVCC, Outputs Enabled, No Load 38 mA
AVCC, Outputs Disabled 15 mA
AVEE, Outputs Enabled, No Load 38 mA
AVEE, Outputs Disabled 15 mA
DVCC 11 mA Supply Voltage Range ±4.5 to ± 5.5 V PSRR f = 100 kHz 75/78 dB 18, 24
f = 1 MHz –55/–58 dB
OPERATING TEMPERATURE RANGE
Temperature Range Operating (Still Air) –40 to +85 °C
θ
JA
Operating (Still Air) 48 °C/W
Specifications subject to change without notice.
AD8110/AD8111
–3–REV. 0
TIMING CHARACTERISTICS (Serial)
Limit
Parameter Symbol Min Typ Max Units
Serial Data Setup Time t
1
20 ns
CLK Pulsewidth t
2
100 ns
Serial Data Hold Time t
3
20 ns
CLK Pulse Separation, Serial Mode t
4
100 ns
CLK to
UPDATE Delay t
5
0ns
UPDATE Pulsewidth t
6
50 ns
CLK to DATA OUT Valid, Serial Mode t
7
180 ns Propagation Delay, UPDATE to Switch On or Off 8 ns Data Load Time, CLK = 5 MHz, Serial Mode 8 µs CLK, UPDATE Rise and Fall Times 100 ns RESET Time 200 ns
1
0
1
0
1 = LATCHED
0 = TRANSPARENT
DATA OUT
CLK
DATA IN
OUT7 (D4) OUT7 (D3) OUT00 (D0)
LOAD DATA INTO SERIAL REGISTER ON FALLING EDGE
TRANSFER DATA FROM SERIAL
REGISTER TO PARALLEL
LATCHES DURING LOW LEVEL
t
2
t
4
t1t
3
t
7
t
5
t
6
UPDATE
Figure 1. Timing Diagram, Serial Mode
Table I. Logic Levels
V
IH
V
IL
V
OH
V
OL
I
IH
I
IL
I
OH
I
OL
RESET, SER/PAR RESET, SER/PAR RESET, SER/PAR RESET, SER/PAR CLK, DATA IN, CLK, DATA IN, CLK, DATA IN, CLK, DATA IN, CE, UPDATE CE, UPDATE DATA OUT DATA OUT CE, UPDATE CE, UPDATE DATA OUT DATA OUT
2.0 V min 0.8 V max 2.7 V min 0.5 V max 20 µA max –400 µA min –400 µA max 3.0 mA min
AD8110/AD8111
–4– REV. 0
TIMING CHARACTERISTICS (Parallel)
Limit
Parameter Symbol Min Max Units
Data Setup Time t
1
20 ns
CLK Pulsewidth t
2
100 ns
Data Hold Time t
3
20 ns
CLK Pulse Separation t
4
100 ns
CLK to
UPDATE Delay t
5
0ns
UPDATE Pulsewidth t
6
50 ns Propagation Delay, UPDATE to Switch On or Off 8 ns CLK, UPDATE Rise and Fall Times 100 ns RESET Time 200 ns
t
5
t
6
t
4
t
2
t
1
t
3
1
0
1
0
1 = LATCHED
CLK
D0–D4 A0–A2
0 = TRANSPARENT
UPDATE
Figure 2. Timing Diagram, Parallel Mode
Table II. Logic Levels
V
IH
V
IL
V
OH
V
OL
I
IH
I
IL
I
OH
I
OL
RESET, SER/PAR RESET, SER/PAR RESET, SER/PAR RESET, SER/PAR CLK, D0, D1, D2, CLK, D0, D1, D2, CLK, D0, D1, D2, CLK, D0, D1, D2, D3, D4, A0, A1, A2 D3, D4, A0, A1, A2 D3, D4, A0, A1, A2 D3, D4, A0, A1, A2 CE, UPDATE CE, UPDATE DATA OUT DATA OUT CE, UPDATE CE, UPDATE DATA OUT DATA OUT
2.0 V min 0.8 V max 2.7 V min 0.5 V max 20 µA max –400 µA min –400 µA max 3.0 mA min
AD8110/AD8111
–5–REV. 0
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD8110/AD8111 features proprietary ESD protection circuitry, permanent dam­age may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
MAXIMUM POWER DISSIPATION
The maximum power that can be safely dissipated by the AD8110/AD8111 is limited by the associated rise in junction temperature. The maximum safe junction temperature for plas­tic encapsulated devices is determined by the glass transition temperature of the plastic, approximately +150°C. Temporarily exceeding this limit may cause a shift in parametric performance due to a change in the stresses exerted on the die by the pack­age. Exceeding a junction temperature of +175°C for an ex­tended period can result in device failure.
While the AD8110/AD8111 is internally short circuit protected, this may not be sufficient to guarantee that the maximum junc­tion temperature (+150°C) is not exceeded under all condi­tions. To ensure proper operation, it is necessary to observe the maximum power derating curves shown in Figure 3.
AMBIENT TEMPERATURE – 8C
5.0
MAXIMUM POWER DISSIPATION – Watts
4.0
0
–50 80–40 –30 –20 –10 0 10 20 30 40 50 60 70
3.0
2.0
1.0
TJ = 1508C
90
Figure 3. Maximum Power Dissipation vs. Temperature
ABSOLUTE MAXIMUM RATINGS
1
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12.0 V
Internal Power Dissipation
2
AD8110/AD8111 80-Lead Plastic TQFP (ST) . . . . . 2.6 W
Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .±V
S
Output Short Circuit Duration
. . . . . . . . . . . . . . . . . . . . . .Observe Power Derating Curves
Storage Temperature Range . . . . . . . . . . . . –65°C to +125°C
Lead Temperature Range (Soldering 10 sec) . . . . . . . .+300°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Specification is for device in free air (TA = +25°C):
80-lead plastic TQFP (ST): θJA = 48°C/W.
ORDERING GUIDE
Temperature Package Package
Model Range Description Option
AD8110AST –40°C to +85°C 80-Lead Plastic TQFP (12 mm × 12 mm) ST-80A AD8111AST –40°C to +85°C 80-Lead Plastic TQFP (12 mm × 12 mm) ST-80A AD8110-EB Evaluation Board AD8111-EB Evaluation Board
WARNING!
ESD SENSITIVE DEVICE
AD8110/AD8111
–6– REV. 0
Table III. Operation Truth Table
SER/
CE UPDATE CLK DATA IN DATA OUT RESET PAR Operation/Comment
1 X X X X X X No change in logic. 01 f Data
i
Data
i-40
1 0 The data on the serial DATA IN line is loaded
into serial register. The first bit clocked into the serial register appears at DATA OUT 40 clocks later.
01 f D0. . . D4, NA in Parallel 1 1 The data on the parallel data lines, D0–D4, are
A0...A2 Mode loaded into the 40-bit serial shift register loca-
tion addressed by A0–A2.
0 0 X X X 1 X Data in the 40-bit shift register transfers into the
parallel latches that control the switch array. Latches are transparent.
X X X X X 0 X Asynchronous operation. All outputs are disabled.
Remainder of logic is unchanged.
D
CLK
Q
3 TO 8 DECODER
A0 A1 A2
CLK
CE
UPDATE
8
128
DATA IN
(SERIAL)
(OUTPUT
ENABLE)
SER/PAR
RESET
(OUTPUT ENABLE)
OUT0 EN
DATA OUT
PARALLEL
DATA
DQ CLK
DQ
CLK
DQ CLK
DQ CLK
D1 D2 D3
DQ CLK
DQ CLK
DQ CLK
DQ CLK
D
Q
CLK
OUT1 EN
OUT2 EN
OUT3 EN
OUT4 EN
OUT5 EN
OUT6 EN
OUT7 EN
D
LE
QCLR
OUT7
EN
OUTPUT ENABLESWITCH MATRIX
S
D1
Q
D0
D0
S
D1
Q
D0
S
D1
Q
D0
S
D1
Q
D0
S
D1
Q
D0
S
D1
Q
D0
S
D1
Q
D0
S
D1
Q
D0
DQ CLK
S
D1
Q
D0
D4
DECODE
D
LE
QCLR
OUT0
EN
D
LE
OUT0
B0
Q
D
LE
Q
OUT0
B1
D
LE
Q
OUT0
B2
D
LE
Q
OUT0
B3
D
LE OUT1
B0
Q
D
LE
QCLR
OUT6
EN
D
LE OUT7
B0
Q
D
LE
OUT7
B1
Q
D
LE OUT7
B2
Q
DQ CLK
S
D1
Q
D0
S
D1
Q
D0
D
LE OUT7
B3
Q
S
D1
Q
D0
Figure 4. Logic Diagram
AD8110/AD8111
–7–REV. 0
PIN FUNCTION DESCRIPTIONS
Pin Name Pin Numbers Pin Description
INxx 66, 68, 70, 72, 74, 76, 78, Analog Inputs; xx = Channel Numbers 00 Through 15.
1, 3, 5, 7, 9, 11, 13, 15, 64 DATA IN 57 Serial Data Input, TTL Compatible. CLK 58 Clock, TTL Compatible. Falling Edge Triggered. DATA OUT 59 Serial Data Out, TTL Compatible. UPDATE 56 Enable (Transparent) “Low.” Allows serial register to connect directly to switch
matrix. Data latched when “High.”
RESET 61 Disable Outputs, Active “Low.” CE 60 Chip Enable, Enable “Low.” Must be “low” to clock in and latch data.
SER/PAR 55 Selects Serial Data Mode, “Low” or Parallel Data Mode, “High.” Must be connected. OUTyy 41, 38, 35, 32, 29, 26, 23, 20 Analog Outputs yy = Channel Numbers 00 Through 07. AGND 2, 4, 6, 8, 10, 12, 14, 16, 46 Analog Ground for Inputs and Switch Matrix.
65, 67, 69, 71, 73, 75, 77 DVCC 63, 79 +5 V for Digital Circuitry. DGND 62, 80 Ground for Digital Circuitry. AVEE 17, 45 –5 V for Inputs and Switch Matrix. AVCC 18, 44 +5 V for Inputs and Switch Matrix. AGNDxx 42, 39, 36, 33, 30, 27, 24, 21 Ground for Output Amp, xx = Output Channel Numbers 00 Through 07. Must be connected. AVCCxx/yy 43, 37, 31, 25, 22, 19 +5 V for Output Amplifier that is shared by Channel Numbers xx and yy. Must be connected. AVEExx/yy 40, 34, 28, 22 –5 V for Output Amplifier that is shared by Channel Numbers xx and yy. Must be connected. A0 54 Parallel Data Input, TTL Compatible (Output Select LSB). A1 53 Parallel Data Input, TTL Compatible (Output Select). A2 52 Parallel Data Input, TTL Compatible (Output Select MSB). D0 51 Parallel Data Input, TTL Compatible (Input Select LSB). D1 50 Parallel Data Input, TTL Compatible (Input Select). D2 49 Parallel Data Input, TTL Compatible (Input Select). D3 48 Parallel Data Input, TTL Compatible (Input Select MSB). D4 47 Parallel Data Input, TTL Compatible (Output Enable).
ESD
ESD
INPUT
V
CC
AV
EE
ESD
ESD
OUTPUT
V
CC
AV
EE
1kV (AD8111 ONLY)
ESD
ESD
RESET
V
CC
20kV
DGND
ESD
ESD
INPUT
V
CC
DGND
ESD
ESD
OUTPUT
V
CC
2kV
DGND
d. Logic Input e. Logic Output
Figure 5. I/O Schematics
a. Analog Input c. Reset Input
b. Analog Output
AD8110/AD8111
–8– REV. 0
PIN CONFIGURATION
80
79787776757473727170696867
66
656463
62
61
56
57
58
59
54
55
52
53
50
51
60
45
46
47
48
43
44
42
49
41
5
4
3
2
7
6
9
8
1
11
10
16
15
14
13
18
17
20
19
12
PIN 1 IDENTIFIER
TOP VIEW
(PINS DOWN)
0.5mm LEAD PITCH
AD8110/AD8111
16 3 8
80L TQFP
(12mm 3 12mm)
40
39
38
37
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
36
DGND
DVCC
IN07
AGND
IN06
AGND
IN05
AGND
IN04
AGND
IN03
AGND
IN02
AGND
IN01
AGND
IN00
DVCC
DGND
RESET
AGND07
AVEE06/07
OUT06
AGND06
AVCC05/06
OUT05
AGND05
AVEE04/05
OUT04
AGND04
AVCC03/04
OUT03
AGND03
AVEE02/03
OUT02
AGND02
AVCC01/02
OUT01
AGND01
CE
DATA OUT CLK DATA IN
UPDATE SER/PAR
A0 A1 A2 D0 D1 D2 D3 D4 AGND AVEE AVCC AVCC00 AGND00 OUT00
IN08
AGND
IN09
AGND
IN10
AGND
IN11
AGND
IN12
AGND
IN13
AGND
IN14
AGND
IN15
AGND
AVEE
AVCC
AVCC07
OUT07
AVEE00/01
AD8110/AD8111
–9–REV. 0
Typical Characteristics–
FREQUENCY – Hz
GAIN – dB
–2
1
0
–1
–3
100k 1M 1G10M 100M
FLATNESS – dB
0.2
0.1
0
–0.1
–0.2
–0.3
GAIN
FLATNESS
2
3
0.3
4
5
200mV p-p
2V p-p
RL = 150V
Figure 6. AD8110 Frequency Response
FREQUENCY – MHz
CROSSTALK – dB
–30
–40
–100
0.3 1 20010 100
–50
–60
–70
–80
–90
ADJACENT
ALL HOSTILE
RL = 1kV
Figure 7. AD8110 Crosstalk vs. Frequency
FREQUENCY – Hz
DISTORTION – dB
100k
1M 100M10M
–100
–40
–50
–60
–70
–80
–90
2ND HARMONIC
3RD HARMONIC
RL = 150V V
OUT
= 2V p-p
Figure 8. AD8110 Distortion vs. Frequency
50 25
0
225 250
25ns/DIV
25mV/DIV
RL = 150V
Figure 9. AD8110 Step Response, 100 mV Step
1
0.5
0
20.5 21
25ns/DIV
0.5V/DIV
RL = 150V
Figure 10. AD8110 Step Response, 2 V Step
2V STEP RL = 150V
01020304050607080
10ns/DIV
0.1%/DIV
Figure 11. AD8110 Settling Time
AD8110/AD8111
–10– REV. 0
FREQUENCY – Hz
GAIN – dB
–2
1
0
–1
–3
100k 1M 1G10M 100M
FLATNESS – dB
0.4
0.2
0
–0.2
–0.4
2
3
0.6
GAIN
FLATNESS
–0.6
0.8
200mV p-p
2V p-p
Figure 12. AD8111 Frequency Response
FREQUENCY – MHz
CROSSTALK – dB
–20
–30
–90
0.3 1 20010 100
–40
–50
–60
–70
–80
–100
–110
RL = 1kV
ADJACENT
ALL HOSTILE
Figure 13. AD8111 Crosstalk vs. Frequency
FREQUENCY 2 Hz
DISTORTION 2 dB
230
240
2100
100k 1M 100M10M
250
260
270
280
290
2ND HARMONIC
3RD HARMONIC
RL = 150V V
OUT
= 2V p-p
Figure 14. AD8111 Distortion vs. Frequency
50 25
0
225 250
25ns/DIV
25mV/DIV
Figure 15. AD8111 Step Response, 100 mV Step
1
0.5 0
20.5 21
25ns/DIV
500mV/DIV
Figure 16. AD8111 Step Response, 2 V Step
2V STEP RTO RL = 150V
01020304050607080
10ns/DIV
0.1%/DIV
Figure 17. AD8111 Settling Time
–Typical Characteristics
AD8110/AD8111
–11–REV. 0
FREQUENCY 2 Hz
POWER SUPPLY REJECTION 2 dB
230
240
10k 100k 10M1M
250
260
270
280
290
RL = 150V
Figure 18. AD8110 PSRR vs. Frequency
FREQUENCY 2 Hz
100
56.3
10 1k 10M
100k
31.6
17.8
10
5.63
3.16 100 10k 1M
nV Hz
Figure 19. AD8110 Voltage Noise vs. Frequency
FREQUENCY 2 MHz
OUTPUT IMPEDANCE 2 V
1M
0.1 1 50010
100k
10k
1k
100
100
Figure 20. AD8110 Output Impedance, Disabled
UPDATE INPUT
TYPICAL VIDEO OUT (RTO)
5 4 3 2 1 0
10
–10
0
50ns/DIV
10mV/DIV
1V/DIV
SWITCHING BETWEEN
TWO INPUTS
Figure 21. AD8110 Switching Transient (Glitch)
FREQUENCY – Hz
OFF ISOLATION – dB
100k 1M 500M10M 100M
VIN = 2V p-p RL = 150V
–50
–60
–70
–80
–90
–100
–110
–120
–130
Figure 22. AD8110 Off Isolation, Input-Output
10,000
1000
100
10
1
0.1
FREQUENCY – Hz
OUTPUT IMPEDANCE – V
100k 1M 500M10M 100M
Figure 23. AD8110 Output Impedance, Enabled
AD8110/AD8111
–12– REV. 0
FREQUENCY – Hz
POWER SUPPLY REJECTION – dB RTI
10k 100k 1M 10M
–30
–40
–50
–60
–70
–80
RL = 150V
Figure 24. AD8111 PSRR vs. Frequency
FREQUENCY 2 Hz
100
56.3
10 1k 10M
100k
31.6
17.8
10
5.63
3.16 100 10k 1M
nV Hz
Figure 25. AD8111 Voltage Noise vs. Frequency
FREQUENCY 2 MHz
OUTPUT IMPEDANCE 2 V
100k
0.1 1 50010
10k
1k
100
10
100
Figure 26. AD8111 Output Impedance, Disabled.
1V/DIV
UPDATE INPUT
TYPICAL VIDEO OUT (RTO)
10mV/DIV
5 4 3 2 1 0
10
0
–10
50ns/DIV
SWITCHING BETWEEN
TWO INPUTS
Figure 27. AD8111 Switching Transient (Glitch)
FREQUENCY – Hz
OFF ISOLATION – dB
100k 1M 500M10M 100M
–60
–80
–100
–120
–130
–110
–90
–70
–50
V
OUT
= 2V p-p
R
L
= 150V
–40
Figure 28. AD8111 Off Isolation, Input-Output
FREQUENCY 2 Hz
OUTPUT IMPEDANCE 2 V
1k
100k 1M 500M10M
100
10
1
0.1 100M
Figure 29. AD8111 Output Impedance, Enabled
AD8110/AD8111
–13–REV. 0
INPUT IMPEDANCE – V
1M
100k
10k
1k
100
10M
30k
100k 1M 10M 100M 500M
FREQUENCY – Hz
Figure 30. AD8110 Input Impedance vs. Frequency
FREQUENCY – Hz
GAIN – dB
14
12
–4
0.1M 1M
10M 100M 1G
10
8
0
6
4
2
–2
18pF = 7.7dB
12pF = 4.5dB
3G
V
IN
= 200mV p-p
R
L
= 150V
Figure 31. AD8110 Frequency Response vs. Capacitive Load
FREQUENCY – Hz
FLATNESS – dB
0.7
0.6
–0.2
0.1M 1M 10M 100M 1G
0.5
0.4
0
0.3
0.2
0.1
–0.1
VIN = 200mV p-p R
L
= 150V
CL = 18pF
CL = 12pF
3G
Figure 32. AD8110 Flatness vs. Capacitive Load
V
OUT
UPDATE
INPUT 1 AT +1V
INPUT 0 AT –1V
1 0
–1
5
0
50ns/DIV
2V/DIV 1V/DIV
Figure 33. AD8110 Switching Time
OFFSET VOLTAGE – Volts
FREQUENCY
260
60
–0.020 –0.010 0.000 0.010
240
180 160
120
80
220 200
140
100
40 20
0
0.020
Figure 34. AD8110 Offset Voltage Distribution
TEMPERATURE – 8C
V
OS
– mV
2.0
–2.0
–60 –40 100–20 0 20 40 60 80
1.5
0
–0.5
–1.0
–1.5
1.0
0.5
Figure 35. AD8110 Offset Voltage vs. Temperature (Normalized at +25
°
C)
AD8110/AD8111
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FREQUENCY – Hz
INPUT IMPEDANCE – V
30k 1M 500M10M 100M
1M
100k
10k
1k
100
100k
10M
Figure 36. AD8111 Input Impedance vs. Frequency
GAIN – dB
12
10
–6
8
6
–2
4
2
0
–4
FREQUENCY – Hz
0.1M 1M 10M 100M 1G
3G
18pF
12pF
Figure 37. AD8111 Frequency Response vs. Capacitive Load
GAIN – dB
0.7
0.6
–0.1
0.5
0.4
0
0.3
0.2
0.1
–0.2 –0.3
FREQUENCY – Hz
0.1M 1M 10M 100M 1G
3G
12pF
18pF
VIN = 100mV R
L
= 150V
Figure 38. AD8111 Flatness vs. Capacitive Load
V
OUT
UPDATE
INPUT 1 AT +1V
INPUT 0 AT –1V
1 0
–1
5
0
50ns/DIV
2V/DIV 1V/DIV
Figure 39. AD8111 Switching Time
OFFSET VOLTAGE – Volts
FREQUENCY
120
480
360 320
240
160
440 400
280
200
80 40
0
–0.020 0.020–0.010 0.000 0.010
Figure 40. AD8111 Offset Voltage Distribution (RTI)
TEMPERATURE – 8C
V
OS
– mV
2.0
–2.0
–60 –40 100–20 0 20 40 60 80
1.5
0
–0.5
–1.0
–1.5
1.0
0.5
Figure 41. AD8111 Offset Voltage Drift vs. Temperature (Normalized at +25
°
C)
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THEORY OF OPERATION:
The AD8110 (G = +1) and AD8111 (G = +2) share a common core architecture consisting of an array of 128 transconductance (gm) input stages organized as eight 16:1 multiplexers with a common, 16-line analog input bus. Each multiplexer is basically a folded-cascode high speed voltage feedback amplifier with 16 input stages. The input stages are NPN differential pairs whose differential current outputs are combined at the output stage, which contains the high impedance node, compensation and a complementary emitter follower output buffer. In the AD8110, the output of each multiplexer is fed directly back to the invert­ing inputs of its 16 gm stages. In the AD8111, the feedback network is a voltage divider consisting of two equal resistors.
This switched-gm architecture results in a low power crosspoint switch that is able to directly drive a back terminated video load (150 ) with low distortion (differential gain and differential phase errors are better than 0.02% and 0.02°, respectively). This design also achieves high input resistance and low input capacitance without the signal degradation and power dissipa­tion of additional input buffers. However, the small input bias current at any input will increase almost linearly with the num­ber of outputs programmed to that input.
The output disable feature of these crosspoints allows larger switch matrices to be built simply by busing together the out­puts of multiple 16 × 8 ICs. However, while the disabled output impedance of the AD8110 is very high (10 M), that of the AD8111 is limited by the resistive feedback network (which has a nominal total resistance of 1 k) that appears in parallel with the disabled output. If the outputs of multiple AD8111s are connected through separate back termination resistors, the loading due to these finite output impedances will lower the effective back termination impedance of the overall matrix. This problem is eliminated if the outputs of multiple AD8111s are connected directly and share a single back termination resistor for each output of the overall matrix. This configuration in­creases the capacitive loading of the disabled AD8111 on the output of the enabled AD8111.
APPLICATIONS
The AD8110/AD8111 have two options for changing the pro­gramming of the crosspoint matrix. In the first option a serial word of 40 bits can be provided that will update the entire ma­trix each time. The second option allows for changing a single output’s programming via a parallel interface. The serial option requires fewer signals, but requires more time (clock cycles) for changing the programming, while the parallel programming tech­nique requires more signals, but can change a single output at a time and requires fewer clock cycles to complete programming.
Serial Programming
The serial programming mode uses the device pins CE, CLK, DATA IN, UPDATE, and SER/PAR. The first step is to assert a LOW on SER/PAR in order to enable the serial program­ming mode. CE for the chip must be LOW to allow data to be
clocked into the device. The CE signal can be used to address an individual device when devices are connected in parallel.
The UPDATE signal should be HIGH during the time that data is shifted into the device’s serial port. Although the data will still shift in when UPDATE is LOW, the transparent, asynchronous latches will allow the shifting data to reach the matrix. This will cause the matrix to try to update to every intermediate state as defined by the shifting data.
The data at DATA IN is clocked in at every down edge of CLK. A total of 40 data bits must be shifted in to complete the pro­gramming. For each of the eight outputs, there are four bits (D0–D3) that determine the source of its input followed, by one bit (D4) that determines the enabled state of the output. If D4 is LOW (output disabled) the four associated bits (D0–D3) do not matter, because no input will be switched to that output.
The most-significant-output-address data is shifted in first, then following in sequence until the least-significant-output-address data is shifted in. At this point UPDATE can be taken LOW, which will cause the programming of the device according to the data that was just shifted in. The UPDATE registers are asyn­chronous and when UPDATE is LOW (and CE is LOW), they are transparent.
If more than one AD8110/AD8111 device is to be serially pro­grammed in a system, the DATA OUT signal from one device can be connected to the DATA IN of the next device to form a serial chain. All of the CLK, CE, UPDATE and SER/PAR pins should be connected in parallel and operated as described above. The serial data is input to the DATA IN pin of the first device of the chain, and it will ripple on through to the last. Therefore, the data for the last device in the chain should come at the be­ginning of the programming sequence. The length of the pro­gramming sequence will be 40 times the number of devices in the chain.
Parallel Programming
When using the parallel programming mode, it is not necessary to reprogram the entire device when making changes to the matrix. In fact, parallel programming allows the modification of a single output at a time. Since this takes only one CLK/ UPDATE cycle, significant time savings can be realized by using parallel programming.
One important consideration in using parallel programming is that the RESET signal DOES NOT RESET ALL REGISTERS in the AD8110/AD8111. When taken low, the RESET signal will only set each output to the disabled state. This is helpful during power-up to ensure that two parallel outputs will not be active at the same time.
After initial power-up, the internal registers in the device will generally have random data, even though the RESET signal was asserted. If parallel programming is used to program one output, that output will be properly programmed, but the rest of the device will have a random program state depending on the inter­nal register content at power-up. Therefore, when using parallel programming, it is essential that ALL OUTPUTS BE PRO­GRAMMED TO A DESIRED STATE AFTER POWER-UP.
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This will ensure that the programming matrix is always in a known state. From then on, parallel programming can be used to modify a single output or more at a time.
In a similar fashion, if both CE and UPDATE are taken LOW after initial power-up, the random power-up data in the shift register will be programmed into the matrix. Therefore, in order to prevent the crosspoint from being programmed into an un­known state DO NOT APPLY LOW LOGIC LEVELS TO BOTH CE AND UPDATE AFTER POWER IS INITIALLY APPLIED. Programming the full shift register one time to a desired state by either serial or parallel programming after initial power-up will eliminate the possibility of programming the matrix to an unknown state.
To change an output’s programming via parallel programming, SER/PAR and UPDATE should be taken HIGH and CE should be taken LOW. The CLK signal should be in the HIGH state. The address of the output that is to be programmed should be put on A0–A2. The first four data bits (D0–D3) should contain the information that identifies the input that is programmed to the output that is addressed. The fourth data bit (D4) will de­termine the enabled state of the output. If D4 is LOW (output disabled), the data on D0–D3 does not matter.
After the desired address and data signals have been established, they can be latched into the shift register by a HIGH-to-LOW transition of the CLK signal. The matrix will not be programmed, however, until the UPDATE signal is taken low. Thus, it is possible to latch in new data for several or all of the outputs first via successive negative transitions of CLK while UPDATE is held high, and then have all the new data take effect when UP- DATE goes LOW. This technique should be used when pro­gramming the device for the first time after power-up when using parallel programming.
POWER-ON RESET
When powering up the AD8110/AD8111 it is usually desirable to have the outputs come up in the disabled state. The RESET pin, when taken LOW will cause all outputs to be in the dis­abled state. However, the RESET signal DOES NOT RESET ALL REGISTERS in the AD8110/AD8111 This is important when operating in the parallel programming mode. Please refer to that section for information about programming internal registers after power-up. Serial programming will program the entire matrix each time, so no special considerations apply.
Since the data in the shift register is random after power-up, it should not be used to program the matrix or else the matrix can enter unknown states. To prevent this, DO NOT APPLY LOGIC LOW SIGNALS TO BOTH CE AND UPDATE INITIALLY AFTER POWER-UP. The shift register should first be loaded with the desired data, and then UPDATE can be taken LOW to program the device.
The RESET pin has a 20 k pull-up resistor to DVDD that can be used to create a simple power-up reset circuit. A capacitor from RESET to ground will hold RESET LOW for some time while the rest of the device stabilizes. The LOW condition will
cause all the outputs to be disabled. The capacitor will then charge through the pull-up resistor to the HIGH state; thus allowing full programming capability of the device.
GAIN SELECTION
The 16 × 8 crosspoints come in two versions depending on the desired gain of the analog circuit paths. The AD8110 device is unity gain and can be used for analog logic switching and other applications where unity gain is desired. The AD8110 can also be used for the input and interior sections of larger crosspoint arrays where termination of output signals is not usually used. The AD8110 outputs have a very high impedance when their outputs are disabled.
For devices that will be used to drive a terminated cable with its outputs, the AD8111 can be used. This device has a built-in gain of two that eliminates the need for a gain-of-two buffer to drive a video line. Because of the presence of the feedback net­work in these devices, the disabled output impedance is about 1 k.
If external amplifiers are used to provide a gain = +2, our AD8079 provides a fixed G = +2 function.
CREATING LARGER CROSSPOINT ARRAYS
The AD8110/AD8111 are high density building blocks for cre­ating crosspoint arrays of dimensions larger than 16 × 8. Various features such as output disable, chip enable, and gain-of-one­and-two options are useful for creating larger arrays. For very large arrays, they can be used along with the AD8116, a 16 × 16 video crosspoint device. In addition, when required for custom­izing a crosspoint array size, they can be used with the AD8108 and AD8109 a pair (unity gain and gain-of-two) of 8 × 8 video crosspoint switches.
The first consideration in constructing a larger crosspoint is to determine the minimum number of devices that are required. The 16 × 8 architecture of the AD8110/AD8111 contains 128 “points,” which is a factor of 32 greater than a 4 × 1 crosspoint. The PC board area and power consumption savings are readily apparent when compared to using these smaller devices.
For a nonblocking crosspoint, the number of points required is the product of the number of inputs multiplied by the number of outputs. Nonblocking requires that the programming of a given input to one or more outputs does not restrict the avail­ability of that input to be a source for any other outputs.
Some nonblocking crosspoint architectures will require more than this minimum as calculated above. Also, there are blocking architectures that can be constructed with fewer devices than this minimum. These systems have connectivity available on a statistical basis that is determined when designing the overall system.
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The basic concept in constructing larger crosspoint arrays is to connect inputs in parallel in a horizontal direction and to “wire­OR” the outputs together in the vertical direction. The meaning of horizontal and vertical can best be understood by looking at a diagram. Figure 42 illustrates this concept for a 32 × 8 cross­point array.
AD8110
OR
AD8111
16
16
R
TERM
IN 00–15
AD8110
OR
AD8111
16
16
R
TERM
IN 16–31
8
8
Figure 42. A 32 × 8 Crosspoint Array Using Two AD8110s or Two AD8111s
The inputs are each uniquely assigned to each of the 32 inputs of the two devices and terminated appropriately. The outputs are wire-ORed together in pairs. The output from only one of a wired OR pair should be enabled at any given time. The device programming software must be properly written to cause this to happen.
16
R
TERM
IN 00–15
4 4
IN 16–31
IN 32–47
IN 48–63
IN 64–79
IN 80–95
IN 96–111
IN 112–127
4
4
4
4
RANK 2
16:8 NONBLOCKING
(16:16 BLOCKING)
RANK 1
(8 x AD8110)
128:16
16
R
TERM
4 4
16
R
TERM
4 4
16
R
TERM
4 4
16
R
TERM
4 4
16
R
TERM
4 4
16
R
TERM
4 4
16
R
TERM
4 4
AD8111
AD8110
AD8110
AD8110
AD8110
AD8110
AD8110
AD8110
AD8110
4 1kV
4 1kV
4 1kV
4 1kV
AD8111
OUT 00 – 07 NONBLOCKING
ADDITIONAL 8 OUTPUTS (SUBJECT TO BLOCKING)
Figure 43. A Gain-of-Two 128 × 8 Nonblocking Crosspoint Array (128 × 16 Blocking)
At some point, the number of outputs that are wire-ORed be­comes too great to maintain system performance. This will vary according to which system specifications are most important. It will also depend on whether the matrix consists of AD8110s or AD8111s. The output disabled impedance of the AD8110 is much higher than that of the AD8111, so its disabled parasitics will have a smaller effect on the one output that is enabled. For example, a 128 × 8 crosspoint can be created with eight AD8110/ AD8111s. This design will have 128 separate inputs and have the corresponding outputs of each device wire-ORed together in groups of eight.
Using additional crosspoint devices in the design can lower the number of outputs that have to be wire-ORed together. Figure 43 shows a block diagram of a system using eight AD8110s and two AD8111s to create a nonblocking, gain-of-two, 128 × 8 crosspoint that restricts the wire-ORing at the output to only four outputs. These devices are the AD8110, which has a higher disabled output impedance than the AD8111.
Additionally, by using the lower four outputs from each of the two Rank 2 AD8111s, a blocking 128 × 16 crosspoint array can be realized. There are, however, some drawbacks to this tech­nique. The offset voltages of the various cascaded devices will accumulate and the bandwidth limitations of the devices will compound. In addition, the extra devices will consume more current and take up more board space. Once again, the overall system design specifications will determine how to make the various tradeoffs.
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Multichannel Video
The excellent video specifications of the AD8110/AD8111 make them ideal candidates for creating composite video cross­point switches. These can be made quite dense by taking advan­tage of the AD8110/AD8111’s high level of integration and the fact that composite video requires only one crosspoint channel per system video channel. There are, however, other video formats that can be routed with the AD8110/AD8111 requiring more than one crosspoint channel per video channel.
Some systems use twisted-pair wiring to carry video signals. These systems utilize differential signals and can lower costs because they use lower cost cables, connectors and termination methods. They also have the ability to lower crosstalk and reject common-mode signals, which can be important for equipment that operates in noisy environments or where common-mode voltages are present between transmitting and receiving equipment.
In such systems, the video signals are differential; there is a positive and negative (or inverted) version of the signals. These complementary signals are transmitted onto each of the two wires of the twisted pair, yielding a first order zero common­mode signal. At the receive end, the signals are differentially received and converted back into a single-ended signal.
When switching these differential signals, two channels are required in the switching element to handle the two differential signals that make up the video channel. Thus, one differential video channel is assigned to a pair of crosspoint channels, both input and output. For a single AD8110/AD8111, eight differen­tial video channels can be assigned to the 16 inputs and four to the outputs. This will effectively form an 8 × 4 differential cross­point switch.
Programming such a device will require that inputs and outputs be programmed in pairs. This information can be deduced by inspection of the programming format of the AD8110/AD8111 and the requirements of the system.
There are other analog video formats requiring more than one analog circuit per video channel. One two-circuit format that is commonly being used in systems such as satellite TV, digital cable boxes and higher quality VCRs, is called S-video or Y/C video. This format carries the brightness (luminance or Y) portion of the video signal on one channel and the color (chrominance, chroma or C) on a second channel.
Since S-video also uses two separate circuits for one video chan­nel, creating a crosspoint system requires assigning one video channel to two crosspoint channels as in the case of a differen­tial video system. Aside from the nature of the video format, other aspects of these two systems will be the same.
There are yet other video formats using three channels to carry the video information. Video cameras produce RGB (red, green, blue) directly from the image sensors. RGB is also the usual format used by computers internally for graphics. RGB can also be converted to Y, R-Y, B-Y format, sometimes called YUV format. These three-circuit, video standards are referred to as component analog video.
The component video standards require three crosspoint chan­nels per video channel to handle the switching function. In a fashion similar to the two-circuit video formats, the inputs and outputs are assigned in groups of three and the appropriate logic programming is performed to route the video signals.
CROSSTALK
Many systems, such as broadcast video, that handle numerous analog signal channels have strict requirements for keeping the various signals from influencing any of the others in the system. Crosstalk is the term used to describe the coupling of the signals of other nearby channels to a given channel.
When there are many signals in close proximity in a system, as will undoubtedly be the case in a system that uses the AD8110/ AD8111, the crosstalk issues can be quite complex. A good understanding of the nature of crosstalk and some definition of terms is required in order to specify a system that uses one or more AD8110/AD8111s.
Types of Crosstalk
Crosstalk can be propagated by means of any of three methods. These fall into the categories of electric field, magnetic field and sharing of common impedances. This section will explain these effects.
Every conductor can be both a radiator of electric fields and a receiver of electric fields. The electric field crosstalk mechanism occurs when the electric field created by the transmitter propa­gates across a stray capacitance (e.g., free space) and couples with the receiver and induces a voltage. This voltage is an un­wanted crosstalk signal in any channel that receives it.
Currents flowing in conductors create magnetic fields that circu­late around the currents. These magnetic fields will then gener­ate voltages in any other conductors whose paths they link. The undesired induced voltages in these other channels are crosstalk signals. The channels that crosstalk can be said to have a mutual inductance that couples signals from one channel to another.
The power supplies, grounds and other signal return paths of a multichannel system are generally shared by the various chan­nels. When a current from one channel flows in one of these paths, a voltage that is developed across the impedance becomes an input crosstalk signal for other channels that share the com­mon impedance.
All these sources of crosstalk are vector quantities, so the magni­tudes cannot be simply added together to obtain the total crosstalk. In fact, there are conditions where driving additional circuits in parallel in a given configuration can actually reduce the crosstalk.
Areas of Crosstalk
For a practical AD8110/AD8111 circuit, it is required that it be mounted to some sort of circuit board in order to connect it to power supplies and measurement equipment. Great care has been taken to create a characterization board (also available as an evaluation board) that adds minimum crosstalk to the intrin­sic device. This, however, raises the issue that a system’s crosstalk is a combination of the intrinsic crosstalk of the devices in addition to the circuit board to which they are mounted. It is important to try to separate these two areas of crosstalk when attempting to minimize its effect.
In addition, crosstalk can occur among the inputs to a cross­point and among the outputs. It can also occur from input to output. Techniques will be discussed for diagnosing which part of a system is contributing to crosstalk.
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Measuring Crosstalk
Crosstalk is measured by applying a signal to one or more chan­nels and measuring the relative strength of that signal on a de­sired selected channel. The measurement is usually expressed as dB down from the magnitude of the test signal. The crosstalk is expressed by:
|XT| = 20 log
10
(Asel(s)/Atest(s))
where s = jω is the Laplace transform variable, Asel(s) is the amplitude of the crosstalk-induced signal in the selected channel and Atest(s) is the amplitude of the test signal. It can be seen that crosstalk is a function of frequency, but not a function of the magnitude of the test signal (to first order). In addition, the crosstalk signal will have a phase relative to the test signal asso­ciated with it.
A network analyzer is most commonly used to measure crosstalk over a frequency range of interest. It can provide both magni­tude and phase information about the crosstalk signal.
As a crosspoint system or device grows larger, the number of theoretical crosstalk combinations and permutations can be­come extremely large. For example, in the case of the 16 × 8 matrix of the AD8110/AD8111, we can examine the number of crosstalk terms that can be considered for a single channel, say IN00 input. IN00 is programmed to connect to one of the AD8110/AD8111 outputs where the measurement can be made.
We can first measure the crosstalk terms associated with driving a test signal into each of the other 15 inputs one at a time. We can then measure the crosstalk terms associated with driving a parallel test signal into all 15 other inputs taken two at a time in all possible combinations; and then three at a time, etc., until, finally, there is only one way to drive a test signal into all 15 other inputs.
Each of these cases is legitimately different from the others and might yield a unique value depending on the resolution of the measurement system, but it is hardly practical to measure all these terms and then to specify them. In addition, this describes the crosstalk matrix for just one input channel. A similar crosstalk matrix can be proposed for every other input. In addition, if the possible combinations and permutations for connecting inputs to the other (not used for measurement) outputs are taken into consideration, the numbers rather quickly grow to astronomical proportions. If a larger crosspoint array of multiple AD8110/ AD8111s is constructed, the numbers grow larger still.
Obviously, some subset of all these cases must be selected to be used as a guide for a practical measure of crosstalk. One com­mon method is to measure “all hostile” crosstalk. This term means that the crosstalk to the selected channel is measured, while all other system channels are driven in parallel. In general, this will yield the worst crosstalk number, but this is not always the case due to the vector nature of the crosstalk signal.
Other useful crosstalk measurements are those created by one nearest neighbor or by the two nearest neighbors on either side. These crosstalk measurements will generally be higher than those of more distant channels, so they can serve as a worst case measure for any other one-channel or two-channel crosstalk measurements.
Input and Output Crosstalk
The flexible programming capability of the AD8110/AD8111 can be used to diagnose whether crosstalk is occurring more on the input side or the output side. Some examples are illustra­tive. A given input channel (IN07 in the middle for this ex­ample) can be programmed to drive OUT03. The input to IN07 is just terminated to ground (via 50 or 75 ) and no signal is applied.
All the other inputs are driven in parallel with the same test signal (practically provided by a distribution amplifier), with all other outputs except OUT03 disabled. Since grounded IN07 is programmed to drive OUT03, there should be no signal present. Any signal that is present can be attributed to the other 15 hos­tile input signals, because no other outputs are driven (they are all disabled). Thus, this method measures the all-hostile input contribution to crosstalk into IN07. Of course, the method can be used for other input channels and combinations of hostile inputs.
For output crosstalk measurement, a single input channel (IN00 for example) is driven and all outputs other than a given output (IN03 in the middle) are programmed to connect to IN00. OUT03 is programmed to connect to IN15 (far away from IN00), which is terminated to ground. Thus OUT03 should not have a signal present since it is listening to a quiet input. Any signal measured at the OUT03 can be attrib­uted to the output crosstalk of the other seven hostile outputs. Again, this method can be modified to measure other channels and other crosspoint matrix combinations.
Effect of Impedances on Crosstalk
The input side crosstalk can be influenced by the output imped­ance of the sources that drive the inputs. The lower the im­pedance of the drive source, the lower the magnitude of the crosstalk. The dominant crosstalk mechanism on the input side is capacitive coupling. The high impedance inputs do not have significant current flow to create magnetically induced crosstalk. However, significant current can flow through the input termi­nation resistors and the loops that drive them. Thus, the PC board on the input side can contribute to magnetically coupled crosstalk.
From a circuit standpoint, the input crosstalk mechanism looks like a capacitor coupling to a resistive load. For low frequencies the magnitude of the crosstalk will be given by:
|XT| = 20 log
10
[(RS CM) × s]
where R
S
is the source resistance, CM is the mutual capacitance between the test signal circuit and the selected circuit, and s is the Laplace transform variable.
From the equation it can be observed that this crosstalk mecha­nism has a high pass nature; it can also be minimized by reduc­ing the coupling capacitance of the input circuits and lowering the output impedance of the drivers. If the input is driven from a 75 terminated cable, the input crosstalk can be reduced by buffering this signal with a low output impedance buffer.
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On the output side, the crosstalk can be reduced by driving a lighter load. Although the AD8110/AD8111 is specified with excellent differential gain and phase when driving a standard 150 video load, the crosstalk will be higher than the minimum obtainable due to the high output currents. These currents will induce crosstalk via the mutual inductance of the output pins and bond wires of the AD8110/AD8111.
From a circuit standpoint, this output crosstalk mechanism looks like a transformer with a mutual inductance between the windings that drives a load resistor. For low frequencies, the magnitude of the crosstalk is given by:
|XT| = 20 log
10
(Mxy × s/RL)
where Mxy is the mutual inductance of output x to output y, and R
L
is the load resistance on the measured output. This crosstalk mechanism can be minimized by keeping the mutual inductance low and increasing R
L
. The mutual inductance can be kept low by increasing the spacing of the conductors and minimizing their parallel length.
PCB Layout
Extreme care must be exercised to minimize additional crosstalk generated by the system circuit board(s). The areas that must be carefully detailed are grounding, shielding, signal routing and supply bypassing.
The packaging of the AD8110/AD8111 is designed to help keep the crosstalk to a minimum. Each input is separated from each other input by an analog ground pin. All of these AGNDs should be directly connected to the ground plane of the circuit board. These ground pins provide shielding, low impedance return paths and physical separation for the inputs. All of these help to reduce crosstalk.
Each output is separated from its two neighboring outputs by an analog ground pin in addition to an analog supply pin of one polarity or the other. Each of these analog supply pins provides power to the output stages of only the two nearest outputs. These supply pins and analog grounds provide shielding, physi­cal separation and a low impedance supply for the outputs. Individual bypassing of each of these supply pins with a 0.01 µF chip capacitor directly to the ground plane minimizes high fre­quency output crosstalk via the mechanism of sharing common impedances.
Each output also has an on-chip compensation capacitor that is i ndividually tied to the nearby analog ground pins AGND00 through AGND07. This technique reduces crosstalk by prevent­ing the currents that flow in these paths from sharing a common impedance on the IC and in the package pins. These AGNDxx signals should all be directly connected to the ground plane.
The input and output signals will have minimum crosstalk if they are located between ground planes on layers above and below, and separated by ground in between. Vias should be located as close to the IC as possible to carry the inputs and outputs to the inner layer. The only place the input and output signals surface is at the input termination resistors and the out­put series back termination resistors. These signals should also be separated, to the extent possible, as soon as they emerge from the IC package.
Evaluation Board
A four-layer evaluation board is available for the AD8110/AD8111. The exact same board and external components are used for each device. The only difference is the device itself, which offers a selection of a gain of unity or gain of two through the analog channels. This board has been carefully laid out and tested to demonstrate the specified high speed performance of the device. Figure 44 shows the schematic of the evaluation board. Figure 45 shows the component side silk-screen. The layouts of the board’s four layers are given in:
Component Layer—Figure 46 Signal Routing Layer—Figure 47 Power Layer—Figure 48 Bottom Layer—Figure 49
The evaluation board package includes the following:
• Fully populated board with BNC-type connectors.
• Windows™ based software for controlling the board from a PC via the printer port.
• Custom cable to connect evaluation board to PC.
• Disk containing Gerber files of board layout.
Optimized for video applications, all signal inputs and outputs are terminated with 75 resistors. Stripline techniques are used to achieve a characteristic impedance on the signal input and output lines also of 75 . Figure 50 shows a cross-section of one of the input or output tracks along with the arrangement of the PCB layers. It should be noted that unused regions of the four layers are filled up with ground planes. As a result, the input and output traces, in addition to having controlled imped­ances, are well shielded.
All trademarks are properties of their respective holders.
AD8110/AD8111
–21–REV. 0
65
64
75V
INPUT 00 INPUT 00
AGND
75V
AVEE
41
40
0.01mF
39
67
66
75V
INPUT 01 INPUT 01
AGND
69
68
75V
INPUT 02 INPUT 02
AGND
71
70
75V
INPUT 03 INPUT 03
AGND
73
72
75V
INPUT 04 INPUT 04
AGND
75
74
75V
INPUT 05 INPUT 05
AGND
77
76
75V
INPUT 06 INPUT 06
AGND
78
75V
INPUT 07 INPUT 07
2
1
75V
INPUT 08 INPUT 08
AGND
4
3
75V
INPUT 09 INPUT 09
AGND
6
5
75V
INPUT 10 INPUT 10
AGND
8
7
75V
INPUT 11 INPUT 11
AGND
10
9
75V
INPUT 12 INPUT 12
AGND
12
11
75V
INPUT 13 INPUT 13
AGND
14
13
75V
INPUT 14 INPUT 14
AGND
16
15
75V
INPUT 15 INPUT 15
AGND
59
DATA OUT
59
DATA IN
80
DGND
P2-5 P2-4 P2-2 P2-3 P2-1 P2-6
RESET
DGNDCECLK
UPDATE
SER/PARA0A1A2D0D1D2D3D4
P2-5
P2-4
P2-2
P2-3
P2-1
P2-6
P2-5
P2-4
P2-2
P2-3
P2-1
P2-6
P2-5
P2-4
62 61 60 58 56 55 54 53 52 51 50 49 48 47
SERIAL MODE JUMP
R25
20kV
DVCC
46 42
75V
AVCC
38
37
0.01mF
36
75V
AVEE
35
34
0.01mF
33
75V
AVCC
32
31
0.01mF
30
75V
AVEE
29
28
0.01mF
27
75V
AVCC
26
25
0.01mF
24
75V
AVEE
23
22
0.01mF
21
75V
20
AGND AGND
OUTPUT 00
AVEE
AGND
OUTPUT 01
AVCC AGND
OUTPUT 02
AVEE
AGND
OUTPUT 03
AVCC AGND
OUTPUT 04
AVEE
AGND
OUTPUT 05
AVCC AGND
OUTPUT 06
AVEE
AGND
OUTPUT 07
AVCC
19
0.01mF
AVCC
AVCC
18
0.01mF
AVCC
AVEE
17
0.01mF
AVEE
0.01mF
45
AVEE
AVEE
0.01mF
44
AVCC
AVCC
0.01mF
43
AVCC
AVCC
0.01mF
63
DVCC
0.01mF
79
DVCC
AD8110 AD8111
DVCC DGND NCAVEE AGND AVCCNC
P1-1
CR1 CR2
+
+
+
P1-2
P1-3
P1-4
P1-5
P1-6
P1-7
0.1mF10mF
0.1mF10mF
0.1mF10mF
Figure 44. Evaluation Board Schematic
AD8110/AD8111
–22– REV. 0
Figure 45. Component Side Silkscreen
Figure 46. Board Layout (Component Side)
AD8110/AD8111
–23–REV. 0
Figure 47. Board Layout (Signal Layer)
Figure 48. Board Layout (Power Plane)
AD8110/AD8111
–24– REV. 0
Figure 49. Board Layout (Bottom Layer)
AD8110/AD8111
–25–REV. 0
w = 0.008"
(0.2mm)
a = 0.008"
(0.2mm)
b = 0.024"
(0.6mm)
h = 0.011325"
(0.288mm)
t = 0.00135" (0.0343mm)
TOP LAYER
SIGNAL LAYER
POWER LAYER
BOTTOM LAYER
Figure 50. Cross Section of Input and Output Traces
The board has 24 BNC type connectors: 16 inputs and 8 out­puts. The connectors are arranged in a crescent around the device. As can be seen from Figure 47, this results in all 16 input signal traces and all eight signal output traces having the same length. This is useful in tests such as All-Hostile Crosstalk where the phase relationship and delay between signals needs to be maintained from input to output.
The three power supply pins AVCC, DVCC and AVEE should be connected to good quality, low noise, ±5 V supplies. Where the same ±5 V power supplies are used for analog and digital, separate cables should be run for the power supply to the evalu­ation board’s analog and digital power supply pins.
As a general rule, each power supply pin (or group of adja­cent power supply pins) should be locally decoupled with a
0.01 µF capacitor. If there is a space constraint, it is more important to decouple analog power supply pins before digital power supply pins. A 0.1 µF capacitor, located rea- sonably close to the pins, can be used to decouple a number of power supply pins. Finally a 10 µF capacitor should be used to decouple power supplies as they come on to the board.
Controlling the Evaluation Board from a PC
The evaluation board include Windows-based control soft­ware and a custom cable that connects the board’s digital interface to the printer port of the PC. The wiring of this cable is shown in Figure 51. The software requires Win­dows 3.1 or later to operate. To install the software, insert the disk labeled “Disk #1 of 2” in the PC and run the file called SETUP.EXE. Additional installation instructions will be given on-screen. Before beginning installation, it is important to terminate any other Windows applications that are running.
When you launch the crosspoint control software, you will be asked to select the printer port you are using. Most modern PCs have only one printer port, usually called LPT1. However some laptop computers use the PRN port.
RESET
CLK
DATA IN
DGND
CE
UPDATE
MOLEX 0.100" CENTER
CRIMP TERMINAL HOUSING
1
6
D-SUB 25 PIN (MALE)
14
1
25
13
EVALUATION BOARD PC
2 3 4 5 6 25
3 1 4 5 2 6
SIGNAL
CE RESET UPDATE
DATA IN CLK DGND
MOLEX
TERMINAL HOUSING
D-SUB-25
Figure 51. Evaluation Board-PC Connection Cable
AD8110/AD8111
–26– REV. 0
Figure 52 shows the main screen of the control software in its initial reset state (all outputs off). Using the mouse, any input can be connected with one or more outputs by simply clicking on the appropriate radio buttons in the 16 × 8 on-screen array. Each time a button is clicked on, the software automatically sends and latches the required 40-bit data stream to the evalua­tion board. An output can be turned off by clicking the appro­priate button in the Off column. To turn off all outputs, click on RESET.
The software offers volatile and nonvolatile storage of configu­rations. For volatile storage, up to two configurations can be stored and recalled using the Memory 1 and Memory 2 Buffers. These function in an identical fashion to the memory on a pocket calculator. For nonvolatile storage of a configuration, the Save Setup and Load Setup functions can be used. This stores the configuration as a data file on disk.
Overshoot on PC Printer Ports’ Data Lines
The data lines on some printer ports have excessive overshoot. Overshoot on the pin that is used as the serial clock (Pin 6 on the D-Sub-25 connector) can cause communication problems. This overshoot can be eliminated by connecting a capacitor from the CLK line on the evaluation board to ground. A pad has been provided on the solder-side of the evaluation board to allow this capacitor to be soldered into place. Depending upon the overshoot from the printer port, this capacitor may need to be as large as 0.01 µF.
Figure 52. Evaluation Board Control Panel
AD8110/AD8111
–27–REV. 0
80-Lead Plastic TQFP
(ST-80A)
SEATING
PLANE
0.063 (1.60) MAX
0.030 (0.75)
0.020 (0.50)
0.003 (0.08) MAX
0.057 (1.45)
0.053 (1.35)
0.006 (0.15)
0.002 (0.05)
0.011 (0.27)
0.007 (0.17)
0.559 (14.20
)
0.543 (13.80)
0.476 (12.10)
0.469 (11.90)
0.476 (12.10)
0.469 (11.90)
0.559 (14.20)
0.543 (13.80)
TOP VIEW
(PINS DOWN)
1
20
21
41
40
60
6180
0.020 (0.50) BSC
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
–28–
C3221–8–10/97
PRINTED IN U.S.A.
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