Analog Devices AD808 Datasheet

Fiber Optic Receiver with Quantizer and

a

Clock Recovery and Data Retiming

FEATURES
Meets CCITT G.958 Requirements

for STM-4 Regenerator—Type A
Meets Bellcore TR-NWT-000253 Requirements for OC-12
Output Jitter: 2.5 Degrees RMS
622 Mbps Clock Recovery and Data Retiming
Accepts NRZ Data, No Preamble Required
Phase-Locked Loop Type Clock Recovery—

No Crystal Required
Quantizer Sensitivity: 4 mV
Level Detect Range: 10 mV to 40 mV, Programmable
Single Supply Operation: +5 V or –5.2 V
Low Power: 400 mW
10 KH ECL/PECL Compatible Output
Package: 16-Lead Narrow 150 mil SOIC

PRODUCT DESCRIPTION

The AD808 provides the receiver functions of data quantiza­tion, signal level detect, clock recovery and data retiming for
622 Mbps NRZ data. The device, together with a PIN
diode/preamplifier combination, can be used for a highly inte­grated, low cost, low power SONET OC-12 or SDH STM-4
fiber optic receiver.

The receiver front end signal level detect circuit indicates when
the input signal level has fallen below a user adjustable thresh­old. The threshold is set with a single external resistor. The
signal level detect circuit 3 dB optical hysteresis prevents chatter
at the signal level detect output.

The PLL has a factory trimmed VCO center frequency and a
frequency acquisition control loop that combine to guarantee

AD808

frequency acquisition without false lock. This eliminates a reli­ance on external components such as a crystal or a SAW filter,
to aid frequency acquisition.

The AD808 acquires frequency and phase lock on input data
using two control loops that work without requiring external
control. The frequency acquisition control loop initially acquires
the frequency of the input data, acquiring frequency lock on
random or scrambled data without the need for a preamble. At
frequency lock, the frequency error is zero and the frequency
detector has no further effect. The phase acquisition control
loop then works to ensure that the output phase tracks the input
phase. A patented phase detector has virtually eliminated pat­tern jitter throughout the AD808.

The device VCO uses a ring oscillator architecture and patented
low noise design techniques. Jitter is 2.5 degrees rms. This low
jitter results from using a fully differential signal architecture,
Power Supply Rejection Ratio circuitry and a dielectrically
isolated process that provides immunity from extraneous signals
on the IC. The device can withstand hundreds of millivolts of
power supply noise without an effect on jitter performance.

The user sets the jitter peaking and acquisition time of the PLL
by choosing a damping factor capacitor whose value determines
loop damping. CCITT G.958 Type A jitter transfer require­ments can easily be met with a damping factor of 5 or greater.

Device design guarantees that the clock output frequency will
drift by less than 20% in the absence of input data transitions.
Shorting the damping factor capacitor, C
output frequency to the VCO center frequency.

The AD808 consumes 400 mW and operates from a single
power supply at either +5 V or –5.2 V.

, brings the clock

D

FUNCTIONAL BLOCK DIAGRAM

LEVEL

DETECT
BUFFER

QUANTIZER

SIGNAL

LEVEL

DETECTOR

SDOUT

F

DET

F

DET

AD808

PIN

NIN

THRADJ

COMPARATOR/

REV. 0

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.

CF1 CF2

COMPENSATING

ZERO

PHASE-LOCKED LOOP

RETIMING

DEVICE

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] World Wide Web Site: http://www.analog.com
Fax: [phone] © Analog Devices, Inc., 1998

LOOP

S

FILTER

VCO

CLKOUTP
CLKOUTN

DATAOUTP
DATAOUTN

AD808–SPECIFICATIONS

(TA = T

MIN

to T

MAX

, VS = V

MIN

to V

, CD = 0.47 mF, unless otherwise noted)

MAX

Parameter Condition Min Typ Max Units

QUANTIZER–DC CHARACTERISTICS

Input Voltage Range @ P
Input Sensitivity, V
Input Overdrive, V

SENSE

OD

PIN–NIN, Figure 1, BER = ≤ 1 × 10
Figure 1, BER = ≤ 1 × 10

IN

or N

IN

–10

2.5 V

–10

10 4.0 mV
5 2.0 mV

S

V

Input Offset Voltage 1.0 mV
Input Current 10 µA
Input RMS Noise BER = ≤ 1 × 10
Input Peak-to-Peak Noise BER = ≤ 1 × 10

–10
–10

100 µV

1.5 mV

QUANTIZER–AC CHARACTERISTICS

Upper –3 dB Bandwidth 600 800 MHz
Input Resistance 10 kΩ
Input Capacitance 2pF
Pulsewidth Distortion 50 ps

LEVEL DETECT

Level Detect Range R

R
R

= 22.1 kΩ 6.5 10 13.5 mV

THRESH

= 6.98 kΩ 13 18 23 mV

THRESH

= 0 Ω 28.5 40 45.5 mV

THRESH

Response Time DC Coupled 0.1 1.5 µs
Hysteresis (Electrical) R

R
R

= 22.1 kΩ (See Figure 8) 5 9.0 dB

THRESH

= 6.98 kΩ 3.0 5.1 9.0 dB

THRESH

= 0 Ω 3.0 7.0 10.0 dB

THRESH

SDOUT Output Logic High Load = +3.2 mA 4.0 4.7 V
SDOUT Output Logic Low Load = –3.2 mA 0.2 0.4 V

PHASE-LOCKED LOOP NOMINAL

CENTER FREQUENCY 622.08 MHz
CAPTURE RANGE 620 624 MHz
TRACKING RANGE 620 624 MHz
STATIC PHASE ERROR (See Figure 7) 27–1 PRN Sequence 22 81 Degrees
SETUP TIME (tSU) Figure 2 550 900 ps
HOLD TIME (tH) Figure 2 700 1050 ps
PHASE DRIFT 240 Bits, No Transitions 50 Degrees
JITTER 27–1 PRN Sequence 2.5 3.6 Degrees rms

223–1 PRN Sequence 2.5 3.6 Degrees rms

JITTER TOLERANCE f = 30 Hz 3000 Unit Intervals

f = 300 Hz 24 300 Unit Intervals
f = 25 kHz 1.7 3.7 Unit Intervals
f = 250 kHz 0.28 0.56 Unit Intervals
f = 5 MHz 0.18 0.45 Unit Intervals

JITTER TRANSFER

Peaking (Figure 14) C

= 0.47 µF 0.04 dB

D

Bandwidth 333 450 kHz

Acquisition Time

= 0.1 µF2

C

D

CD = 0.47 µFV

POWER SUPPLY VOLTAGE V

23

–1 PRN Sequence, TA = +25°C2 × 1063 × 106Bit Periods

= 5 V, VEE = GND 8 × 10612 × 106Bit Periods

CC
MIN

to V

MAX

4.5 5.5 Volts

POWER SUPPLY CURRENT VCC = 5.0 V, VEE = GND,

TA = +25°C 55 80 100 mA

PECL OUTPUT VOLTAGE LEVELS

Output Logic High, V

Output Logic Low, V

OL

OH

TA = +25°C –1.2 –1.0 –0.7 Volts
Referenced to V

CC

–2.2 –2.0 –1.7 Volts

SYMMETRY (Duty Cycle) ρ = 1/2, TA = +25°C,

Recovered Clock Output, Pin 5 VCC = 5 V, VEE = GND 45 55 %
OUTPUT RISE / FALL TIMES

Rise Time (t

) 20%–80% 174 350 500 ps

R

Fall Time (tF) 80%–20% 136 315 500 ps
CLOCK SKEW (t

) Positive Number Indicates Clock

RCS

Leading Data –100 130 250 ps

Specifications subject to change without notice.

REV. 0–2–

AD808

WARNING!

ESD SENSITIVE DEVICE

ABSOLUTE MAXIMUM RATINGS

1

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8 V

Input Voltage (Pin 12 or Pin 13) . . . . . . . . . . . . . .V

+ 0.6 V

CC

Maximum Junction Temperature . . . . . . . . . . . . . . . . +165°C

Storage Temperature Range . . . . . . . . . . . . .–65°C to +150°C

Lead Temperature Range (Soldering 10sec) . . . . . . . . +300°C

ESD Rating (Human Body Model) . . . . . . . . . . . . . . . .1500 V

NOTES

1

Stresses above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Thermal Characteristics:
16-Lead Narrow Body SOIC Package: θJA = 110°C/Watt.

OUTPUT

NOISE

1

0

OFFSET

OVERDRIVE

SENSITIVITY

INPUT (V)

Figure 1. Input Sensitivity, Input Overdrive

PIN FUNCTION DESCRIPTIONS

Pin
No. Mnemonic Description

1 DATAOUTN Differential Retimed Data Output
2 DATAOUTP Differential Retimed Data Output
3V

CC2

Digital VCC for ECL Outputs
4 CLKOUTN Differential Recovered Clock Output
5 CLKOUTP Differential Recovered Clock Output
6V

CC1

Digital VCC for Internal Logic
7 CF1 Loop Damping Capacitor
8 CF2 Loop Damping Capacitor
9AV

EE

Analog V

EE

10 THRADJ Level Detect Threshold Adjust
11 AV

CC1

Analog VCC for PLL
12 NIN Quantizer Differential Input
13 PIN Quantizer Differential Input
14 AV

CC2

Analog VCC for Quantizer
15 SDOUT Signal Detect Output
16 V

EE

Digital VEE for Internal Logic

DATAOUT 50%

(PIN 2)

CLKOUT 50%

(PIN 5)

HOLD TIME

t

H

t

RCS

RECOVERED

CLOCK SKEW

SETUP TIME

t

SU

Figure 2. Setup and Hold Time

DATAOUTN
DATAOUTP

V

CC2

CLKOUTN
CLKOUTP

V

CC1

CF1
CF2

1

2

3

4

TOP VIEW

5

(Not to Scale)

6

7

8

ORDERING GUIDE

Model Temperature Range Package Description Package Option

AD808-622BR –40°C to +85°C 16-Pin Narrowbody SOIC R-16A
AD808-622BRRL7 –40°C to +85°C 750 Pieces, 7" Reel R-16A
AD808-622BRRL –40°C to +85°C 2500 Pieces, 13" Reel R-16A

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD808 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.

PIN CONFIGURATION

AD808

16

15

14

13

12

11

10

9

V

EE

SDOUT
AV

CC2

PIN
NIN
AV

CC1

THRADJ
AV

EE

REV. 0 –3–

AD808

DEFINITION OF TERMS
Maximum, Minimum and Typical Specifications

Specifications for every parameter are derived from statistical
analyses of data taken on multiple devices from multiple wafer
lots. Typical specifications are the mean of the distribution of
the data for that parameter. If a parameter has a maximum (or a
minimum), that value is calculated by adding to (or subtracting
from) the mean six times the standard deviation of the distribu­tion. This procedure is intended to tolerate production varia­tions: if the mean shifts by 1.5 standard deviations, the remaining

4.5 standard deviations still provide a failure rate of only 3.4 parts
per million. For all tested parameters, the test limits are guard­banded to account for tester variation to thus guarantee that no
device is shipped outside of data sheet specifications.

Input Sensitivity and Input Overdrive

Sensitivity and Overdrive specifications for the Quantizer in­volve offset voltage, gain and noise. The relationship between
the logic output of the quantizer and the analog voltage input is
shown in Figure 1.

For sufficiently large positive input voltage the output is always
Logic 1 and similarly, for negative inputs, the output is always
Logic 0. However, the transitions between output Logic Levels
1 and 0 are not at precisely defined input voltage levels, but
occur over a range of input voltages. Within this Zone of Confu­sion, the output may be either 1 or 0, or it may even fail to attain
a valid logic state. The width of this zone is determined by the
input voltage noise of the quantizer (1.5 mV at the 1 × 10

–10

confidence level). The center of the Zone of Confusion is the
quantizer input offset voltage (1 mV typ). Input Overdrive is the
magnitude of signal required to guarantee correct logic level
with 1 × 10

–10

confidence level.

With a single-ended PIN-TIA (Figure 3), ac coupling is used
and the inputs to the Quantizer are dc biased at some common­mode potential. Observing the Quantizer input with an oscillo­scope probe at the point indicated shows a binary signal with
average value equal to the common-mode potential and instan­taneous values both above and below the average value. It is
convenient to measure the peak-to-peak amplitude of this signal
and call the minimum required value the Quantizer Sensitivity.
Referring to Figure 1, since both positive and negative offsets
need to be accommodated, the Sensitivity is twice the Over­drive. The AD808 Quantizer has 4 mV Sensitivity typical.

With a differential TIA (Figure 3), Sensitivity seems to improve
from observing the Quantizer input with an oscilloscope probe.
This is an illusion caused by the use of a single-ended probe. A
2 mV peak-to-peak signal appears to drive the AD808 Quan­tizer. However, the single-ended probe measures only half the
signal. The true Quantizer input signal is twice this value since
the other Quantizer input is a complementary signal to the sig­nal being observed.

Response Time

Response time is the delay between removal of the input signal
and indication of Loss of Signal (LOS) at SDOUT. The re­sponse time of the AD808 (1.5 µs maximum) is much faster

≤

than the SONET/SDH requirement (3 µs

response time ≤
100 µs). In practice, the time constant of the ac coupling at the
Quantizer input determines the LOS response time.

Nominal Center Frequency

This is the frequency at which the VCO will oscillate with the
loop damping capacitor, C

, shorted.

D

Tracking Range

This is the range of input data rates over which the AD808 will
remain in lock.

Capture Range

This is the range of input data rates over which the AD808 will
acquire lock.

Static Phase Error

This is the steady-state phase difference, in degrees, between the
recovered clock sampling edge and the optimum sampling in­stant, which is assumed to be halfway between the rising and
falling edges of a data bit. Gate delays between the signals that
define static phase error, and IC input and output signals pro­hibit direct measurement of static phase error.

Data Transition Density, ρ

This is a measure of the number of data transitions, from “0” to
“1” and from “1” to “0,” over many clock periods. ρ is the ratio
(0 ≤ ρ ≤ 1) of data transitions to bit periods.

Jitter

This is the dynamic displacement of digital signal edges from
their long term average positions, measured in degrees rms or
Unit Intervals (UI). Jitter on the input data can cause dynamic
phase errors on the recovered clock sampling edge. Jitter on the
recovered clock causes jitter on the retimed data.

Output Jitter

This is the jitter on the retimed data, in degrees rms, due to a
specific pattern or some pseudorandom input data sequence
(PRN Sequence).

Jitter Tolerance

Jitter Tolerance is a measure of the AD808’s ability to track a
jittery input data signal. Jitter on the input data is best thought
of as phase modulation, and is usually specified in unit intervals.

The PLL must provide a clock signal that tracks the phase
modulation in order to accurately retime jittered data. In order
for the VCO output to have a phase modulation that tracks the
input jitter, some modulation signal must be generated at the
output of the phase detector. The modulation output from the
phase detector can only be produced by a phase error between
its data input and its clock input. Hence, the PLL can never
perfectly track jittered data. However, the magnitude of the
phase error depends on the gain around the loop. At low fre­quencies, the integrator of the AD808 PLL provides very high
gain, and thus very large jitter can be tracked with small phase
errors between input data and recovered clock. At frequencies
closer to the loop bandwidth, the gain of the integrator is much
smaller, and thus less input jitter can be tolerated. The AD808
output will have a bit error rate less than 1 × 10

–10

when in lock
and retiming input data that has the CCITT G.958 specified
jitter applied to it.

Jitter Transfer (Refer to Figure 14)

The AD808 exhibits a low-pass filter response to jitter applied
to its input data.

Bandwidth

This describes the frequency at which the AD808 attenuates
sinusoidal input jitter by 3 dB.

Peaking

This describes the maximum jitter gain of the AD808 in dB.

REV. 0–4–