3-wire serial
SPI®, QSPI™, MICROWIRE™, and DSP compatible
Schmitt trigger on SCLK
APPLICATIONS
Smart transmitters
Battery applications
Portable instrumentation
Sensor measurement
Temperature measurement
Pressure measurement
Weigh scales
4 to 20 mA loops
Sigma-Delta ADC
AD7791
FUNCTIONAL BLOCK DIAGRAM
V
GNDREFIN(+) REFIN(–)
DD
V
DD
AIN(+)
AIN(–)
GND
BUF
AD7791
Σ-∆
ADC
Figure 1.
GENERAL DESCRIPTION
The AD7791 is a low power, complete analog front end for
low frequency measurement applications. It contains a low
noise 24-bit ∑-∆ ADC with one differential input that can be
buffered or unbuffered.
The device operates from an internal clock. Therefore, the user
does not have to supply a clock source to the device. The output
data rate from the part is software programmable and can be
varied from 9.5 Hz to 120 Hz, with the rms noise equal to
1.1 µV at the lower update rate. The internal clock frequency
can be divided by a factor of 2, 4, or 8, which leads to a reduction in the current consumption. The update rate, cutoff
frequency, and settling time will scale with the clock frequency.
The part operates with a power supply from 2.5 V to 5.25 V.
When operating from a 3 V supply, the power dissipation for
the part is 225 µW maximum. It is housed in a 10-lead MSOP.
CLOCK
SERIAL
INTERFACE
04227-0-001
DOUT/RDY
DIN
SCLK
CS
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
Table 1. (VDD = 2.5 V to 5.25 V; REFIN(+) = 2.5 V; REFIN(–) = GND; GND = 0 V; CDIV1 = CDIV0 = 0;
all specifications T
MIN
to T
Parameter AD7791B Unit Test Conditions/Comments
ADC CHANNEL SPECIFICATION
Output Update Rate 9.5 Hz min nom 120 Hz max nom
ADC CHANNEL
No Missing Codes2 24 Bits min
Resolution 19.5 Bits p-p 9.5 Hz Update Rate
Output Noise 1.1 µV rms typ
Integral Nonlinearity ±15 ppm of FSR max 3.5 ppm typ
Offset Error ±3 µV typ
Offset Error Drift vs. Temperature ±10 nV/°C typ
Full-Scale Error3 ±10 µV typ
Gain Drift vs. Temperature ±0.5 ppm/°C typ
Power Supply Rejection 90 dB min 100 dB typ, AIN = 1 V
ANALOG INPUTS
Differential Input Voltage Ranges ±REFIN V nom REFIN = REFIN(+) – REFIN(–);
Absolute AIN Voltage Limits2 GND + 100 mV V min Buffered Mode of Operation
V
Analog Input Current Buffered Mode of Operation
Average Input Current2 ±1 nA max
Average Input Current Drift ±5 pA/°C typ
Absolute AIN Voltage Limits2 GND – 30 mV V min Unbuffered Mode of Operation
V
Analog Input Current
Average Input Current ±400 nA/V typ
Average Input Current Drift ±50 pA/V/°C typ
Normal Mode Rejection2
@ 50 Hz, 60 Hz 65 dB min 73 dB typ, 50 ± 1 Hz, 60 ± 1 Hz, FS[2:0] = 1004
@ 50 Hz 80 dB min 90 dB typ, 50 ± 1 Hz, FS[2:0] = 1014
@ 60 Hz 80 dB min 90 dB typ, 60 ± 1 Hz, FS[2:0] = 0114
Common Mode Rejection AIN = 1 V
@DC 90 dB min 100 dB typ, FS[2:0] = 1004
@ 50 Hz, 60 Hz2 100 dB min 50 ± 1 Hz (FS[2:0] = 1014), 60 ± 1 Hz (FS[2:0] = 0114)
REFERENCE INPUT
REFIN Voltage 2.5 V nom REFIN = REFIN(+) – REFIN(–)
Reference Voltage Range2 0.1 V min
V
Absolute REFIN Voltage Limits2 GND – 30 mV V min
V
Average Reference Input Current 0.5 µA/V typ
Average Reference Input Current Drift ±0.03 nA/V/°C typ
1
Temperature Range –40°C to +105°C.
2
Specification is not production tested but is supported by characterization data at initial product release.
3
Full-scale error applies to both positive and negative full-scale and applies at the factory calibration conditions (VDD = 4 V).
4
FS[2:0] are the three bits used in the filter register to select the output word rate.
, unless otherwise noted.)
MAX
DD
DD
DD
DD
Update Rate ≤ 20 Hz
– 100 mV V max
+ 30 mV V max
Unbuffered Mode of Operation
Input current varies with input voltage.
V max
+ 30 mV V max
Rev. 0 | Page 3 of 20
AD7791
SPECIFICATIONS (continued)
Parameter AD7791B Unit Test Conditions/Comments
REFERENCE INPUT (continued)
Normal Mode Rejection2
@ 50 Hz, 60 Hz 65 dB min 73 dB typ, 50 ± 1 Hz, 60 ± 1 Hz, FS[2:0] = 1004
@ 50 Hz 80 dB min 90 dB typ, 50 ± 1 Hz, FS[2:0] = 1014
@ 60 Hz 80 dB min 90 dB typ, 60 ± 1 Hz, FS[2:0] = 0114
Common Mode Rejection AIN = 1 V
@ DC 100 dB typ FS[2:0] = 1004
@ 50 Hz, 60 Hz 110 dB typ 50 ± 1 Hz (FS[2:0] = 1014), 60 ± 1 Hz (FS[2:0] = 0114)
LOGIC INPUTS
All Inputs Except SCLK2
V
, Input Low Voltage 0.8 V max VDD = 5 V
INL
0.4 V max VDD = 3 V
V
, Input High Voltage 2.0 V min VDD = 3 V or 5 V
INH
SCLK Only (Schmitt-Triggered Input)2
VT(+) 1.4/2 V min/V max VDD = 5 V
VT(–) 0.8/1.4 V min/V max VDD = 5 V
VT(+) – VT(–) 0.3/0.85 V min/V max VDD = 5 V
VT(+) 0.9/2 V min/V max VDD = 3 V
VT(–) 0.4/1.1 V min/V max VDD = 3 V
VT(+) - VT(–) 0.3/0.85 V min/V max VDD = 3 V
Input Currents ±1 µA max VIN = VDD or GND
Input Capacitance 10 pF typ All Digital Inputs
LOGIC OUTPUTS
VOH, Output High Voltage2 V
VOL, Output Low Voltage2 0.4 V max VDD = 3 V, I
VOH, Output High Voltage2 4 V min VDD = 5 V, I
VOL, Output Low Voltage2 0.4 V max VDD = 5 V, I
Floating-State Leakage Current ±1 µA max
Floating-State Output Capacitance 10 pF typ
Data Output Coding Offset Binary
t3 100 ns min SCLK High Pulsewidth
t4 100 ns min SCLK Low Pulsewidth
Read Operation
t1 0 ns min
60 ns max VDD = 4.75 V to 5.25 V
80 ns max VDD = 2.5 V to 3.6 V
3
t
0 ns min SCLK Active Edge to Data Valid Delay4
2
60 ns max VDD = 4.75 V to 5.25 V
80 ns max VDD = 2.5 V to 3.6 V
5, 6
t
10 ns min
5
80 ns max
t6 100 ns max
t7 10 ns min
Write Operation
t8 0 ns min
t9 30 ns min Data Valid to SCLK Edge Setup Time
t10 25 ns min Data Valid to SCLK Edge Hold Time
t11 0 ns min
, unless otherwise noted.)
DD
Limit at T
(B Version)
1
Sample tested during initial release to ensure compliance. All input signals are specified with tR = tF = 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V.
2
See Figure 3 and Figure 4.
3
These numbers are measured with the load circuit of Figure 2 and defined as the time required for the output to cross the VOL or VOH limits.
4
SCLK active edge is falling edge of SCLK.
5
These numbers are derived from the measured time taken by the data output to change 0.5 V when loaded with the circuit of Figure 2. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and, as such, are independent of external bus loading capacitances.
6
RDY
returns high after a read of the ADC. In single conversion mode and continuous conversion mode, the same data can be read again, if required, while
although care should be taken to ensure that subsequent reads do not occur close to the next output update. In continuous read mode, the digital word can be read
only once.
RDY
is high,
Rev. 0 | Page 5 of 20
AD7791
I
(1.6mA WITH VDD = 5V,
SINK
TO OUTPUT
PIN
50pF
100µA WITH V
I
SOURCE
100µA WITH V
= 3V)
DD
1.6V
(200µA WITH VDD = 5V,
= 3V)
DD
04227-0-002
Figure 2. Load Circuit for Timing Characterization
CS (I)
t
6
t
5
7
04227-0-003
DOUT/RDY (O)
SCLK (I)
t
1
MSBLSB
t
2
I = INPUT, O = OUTPUT
t
t
3
t
4
Figure 3. Read Cycle Timing Diagram
CS (I)
t
11
04227-0-004
SCLK (I)
DIN (I)
I = INPUT, O = OUTPUT
t
8
t
9
t
10
MSBLSB
Figure 4. Write Cycle Timing Diagram
Rev. 0 | Page 6 of 20
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