Analog Devices AD7711 g Datasheet

LC2MOS Signal Conditioning ADC
with RTD Excitation Currents
FEATURES Charge-Balancing ADC
24 Bits, No Missing Codes 0.0015% Nonlinearity
2-Channel Programmable Gain Front End
Gains from 1 to 128 1 Differential Input
1 Single-Ended Input Low-Pass Filter with Programmable Filter Cutoffs Ability to Read/Write Calibration Coefficients RTD Excitation Current Sources Bidirectional Microcontroller Serial Interface Internal/External Reference Option Single- or Dual-Supply Operation Low Power (25 mW typ) with Power-Down Mode
(7 mW typ)
APPLICATIONS RTD Transducers Process Control Smart Transmitters Portable Industrial Instruments

GENERAL DESCRIPTION

The AD7711 is a complete analog front end for low frequency measurement applications. The device accepts low level signals directly from a transducer and outputs a serial digital word. It
employs a
-⌬ conversion technique to realize up to 24 bits of no missing codes performance. The input signal is applied to a proprietary programmable gain front end based around an ana­log modulator. The modulator output is processed by an on-chip digital filter. The first notch of this digital filter can be pro­grammed via the on-chip control register, allowing adjustment of the filter cutoff and settling time.
The part features one differential analog input and one single­ended analog input as well as a differential reference input. Normally, one of the input channels will be used as the main channel with the second channel used as an auxiliary input to periodically measure a second voltage. It can be operated from a single supply (by tying the V
pin to AGND), provided that the
SS
input signals on the analog inputs are more positive than –30 mV. By taking the V down to –V
pin negative, the part can convert signals
SS
on its inputs. The part provides two current
REF
sources that can be used to provide excitation in 3-wire and 4-wire RTD configurations. The AD7711 thus performs all signal conditioning and conversion for a single- or dual-channel system.
*Protected by U.S. Patent No. 5,134,401.
REV. G
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
AD7711
*

FUNCTIONAL BLOCK DIAGRAM

AV
DD
AV
DD
AIN1(+)
AIN1(–)
AIN2
200␮A
RTD1
RTD2
AD7711
AGND DGND MODE SDATA SCLK A0
DV
DD
4.5␮A
200␮A
M U X
AV
V
IN (–)
DD
SS
REF
PGA
A = 1–128
IN (+)
V
BIAS
AUTO-ZEROED
-
MODULATOR
SERIAL INTERFACE
CONTROL REGISTER
2.5V REFERENCE
CONVERTER
CLOCK
GENERATION
OUTPUT
REGISTER
REF OUT
DIGITAL
FILTER
DRDYTFSRFS
SYNC
MCLK IN
MCLK OUT
REF
The AD7711 is ideal for use in smart, microcontroller based systems. Gain settings, signal polarity, input channel selection, and RTD current control can be configured in software using the bidirectional serial port. The AD7711 contains self­calibration, system calibration, and background calibration options, and also allows the user to read and write the on-chip calibration registers.
CMOS construction ensures low power dissipation, and a software programmable power-down mode reduces the standby power consumption to only 7 mW typical. The part is available in a 24-lead, 0.3-inch-wide, plastic and hermetic dual-in-line pack­age (DIP) as well as a 24-lead small outline (SOIC) package.

PRODUCT HIGHLIGHTS

1. The programmable gain front end allows the AD7711 to accept input signals directly from an RTD transducer, removing a considerable amount of signal conditioning. On-chip current sources provide excitation for 3-wire and 4-wire RTD configurations.
2. No missing codes ensure true, usable, 23-bit dynamic range coupled with excellent ± 0.0015% accuracy. The effects of temperature drift are eliminated by on-chip self-calibration, which removes zero-scale and full-scale errors.
3. The AD7711 is ideal for microcontroller or DSP processor applications with an on-chip control register that allows control over filter cutoff, input gain, channel selection, signal polarity, RTD current control, and calibration modes.
4. The AD7711 allows the user to read and to write the on-chip calibration registers. This means that the microcontroller has much greater control over the calibration procedure.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © 2004 Analog Devices, Inc. All rights reserved.
AD7711–SPECIFICATIONS
(AVDD = +5 V ⴞ 5%; DVDD = +5 V 5%; VSS = 0 V or –5 V 5%; REF IN(+) =
+2.5 V; REF IN(–) = AGND; MCLK IN = 10 MHz unless otherwise stated. All specifications T
MIN
to T
, unless otherwise noted.)
MAX
Parameter A, S Versions
1
Unit Conditions/Comments
STATIC PERFORMANCE
No Missing Codes 24 Bits min Guaranteed by Design. For Filter Notches £ 60 Hz
22 Bits min For Filter Notch = 100 Hz 18 Bits min For Filter Notch = 250 Hz 15 Bits min For Filter Notch = 500 Hz 12 Bits min For Filter Notch = 1 kHz
Output Noise See Tables I and II Depends on Filter Cutoffs and Selected Gain Integral Nonlinearity @ 25∞C ± 0.0015 % FSR max Filter Notches £ 60 Hz
T
to T
MIN
Positive Full-Scale Error Full-Scale Drift
Unipolar Offset Error Unipolar Offset Drift
Bipolar Zero Error Bipolar Zero Drift
MAX
5
2
5
2
5
2, 3
± 0.003 % FSR max Typically ± 0.0003% See Note 4 Excluding Reference 1 mV/C typ Excluding Reference. For Gains of 1, 2
0.3 mV/C typ Excluding Reference. For Gains of 4, 8, 16, 32, 64, 128 See Note 4
0.5 mV/C typ For Gains of 1, 2
0.25 mV/C typ For Gains of 4, 8, 16, 32, 64, 128 See Note 4
0.5 mV/C typ For Gains of 1, 2
0.25 mV/C typ For Gains of 4, 8, 16, 32, 64, 128
Gain Drift 2 ppm/C typ Bipolar Negative Full-Scale Error2 @ 25∞C ± 0.003 % FSR max Excluding Reference
T
to T
MIN
Bipolar Negative Full-Scale Drift
MAX
5
± 0.006 % FSR max Typically ± 0.0006% 1 mV/C typ Excluding Reference. For Gains of 1, 2
0.3 mV/C typ Excluding Reference. For Gains of 4, 8, 16, 32, 64, 128
ANALOG INPUTS/REFERENCE INPUTS
Normal Mode 50 Hz Rejection Normal Mode 60 Hz Rejection DC Input Leakage Current @ 25∞C
T
to T
MIN
Sampling Capacitance
MAX
6
6
6
6
100 dB min For Filter Notches of 10 Hz, 25 Hz, 50 Hz, ±0.02 ¥ f 100 dB min For Filter Notches of 10 Hz, 30 Hz, 60 Hz, ±0.02 ¥ f 10 pA max 1 nA max 20 pF max
NOTCH
NOTCH
AIN1/REF IN
Common-Mode Rejection (CMR) 100 dB min At DC and AVDD = 5 V Common-Mode Rejection (CMR) 90 dB min At DC and AVDD = 10 V Common-Mode 50 Hz Rejection Common-Mode 60 Hz Rejection Common-Mode Voltage Range
Analog Inputs
Input Voltage Range
Input Sampling Rate, f AIN2 Offset Error 2.5 mV max Removed by System Calibrations but not by Self-Calibration
8
9
S
6
6
7
150 dB min For Filter Notches of 10 Hz, 25 Hz, 50 Hz, ± 0.02 ¥ f 150 dB min For Filter Notches of 10 Hz, 30 Hz, 60 Hz, ± 0.02 ¥ f VSS to AV
0 to +V ± V See Table III
REF
REF
DD
10
V min to V max
For Normal Operation. Depends on Gain Selected max Unipolar Input Range (B/U Bit of Control Register = 1) max Bipolar Input Range (B/U Bit of Control Register = 0)
NOTCH
NOTCH
AIN2 Offset Drift 1.5 mV/C typ
Reference Inputs
REF IN(+) – REF IN(–) Voltage
Input Sampling Rate, f
S
11
+2.5 to +5 V min to V max For Specified Performance. Part Is Functional with
f
CLK IN
/256
Lower V
Voltages
REF
REFERENCE OUTPUT
Output Voltage 2.5 V nom Initial Tolerance @ 25∞C ± 1% max Drift 20 ppm/C typ Output Noise 30 mV typ Peak-to-Peak Noise. 0.1 Hz to 10 Hz Bandwidth Line Regulation (AVDD)1 mV/V max Load Regulation 1.5 mV/mA max Maximum Load Current 1 mA External Current 1 mA max
NOTES
1
Temperature range is as follows: A Version = – 40C to +85C; S Version = –55C to +125C. See also Note 16.
2
Applies after calibration at the temperature of interest.
3
Positive full-scale error applies to both unipolar and bipolar input ranges.
4
These errors will be of the order of the output noise of the part, as shown in Table I, after system calibration. These errors will be 20 mV typical after self-calibration or background calibration.
5
Recalibration at any temperature or use of the background calibration mode will remove these drift errors.
6
These numbers are guaranteed by design and/or characterization.
7
This common-mode voltage range is allowed, provided the input voltage on AIN(+) and AIN(–) does not exceed AVDD + 30 mV and VSS – 30 mV.
8
The analog inputs present a very high impedance dynamic load that varies with clock frequency and input sample rate. The maximum recommended source resis­tance depends on the selected gain (see Tables IV and V).
9
The analog input voltage range on the AIN1(+) input is given here with respect to the voltage on the AIN1(–) input. The input voltage range on the AIN2 input is with respect to AGND. The absolute voltage on the analog inputs should not go more positive than AVDD + 30 mV, or more negative than VSS – 30 mV.
10
V
= REF IN(+) – REF IN(–).
REF
11
The reference input voltage range may be restricted by the input voltage range requirement on the V
BIAS
input.
–2–
REV. G
AD7711
Parameter A, S Versions
INPUT
12
V
BIAS
Input Voltage Range AVDD – 0.85 ¥ V
or AVDD – 3.5 V max Whichever Is Smaller; +5 V/–5 V or +10 V/0 V
or AVDD – 2.1 V max Whichever Is Smaller; +5 V/0 V Nominal AVDD/V VSS + 0.85 ¥ V or VSS + 3 V min Whichever Is Greater; +5 V/–5 V or +10 V/0 V
or VSS + 2.1 V min Whichever Is Greater; +5 V/0 V Nominal AVDD/V
V
Rejection 65 to 85 dB typ Increasing with Gain
BIAS
1
REF
Unit Conditions/Comments
REF
See V
BIAS
Nominal AV
See V
BIAS
Nominal AVDD/V
Input Section
DD/VSS
SS
Input Section
SS
SS
LOGIC INPUTS
Input Current ± 10 mA max All Inputs except MCLK IN
V
, Input Low Voltage 0.8 V max
INL
V
, Input High Voltage 2.0 V min
INH
MCLK IN Only
V
, Input Low Voltage 0.8 V max
INL
V
, Input High Voltage 3.5 V min
INH
LOGIC OUTPUTS
, Output Low Voltage 0.4 V max I
V
OL
V
, Output High Voltage 4.0 V min I
OH
Floating State Leakage Current ± 10 mA max Floating State Output Capacitance
13
9 pF typ
= 1.6 mA
SINK
SOURCE
= 100 mA
TRANSDUCER BURNOUT
Current 4.5 mA nom Initial Tolerance @ 25∞C ± 10 % typ Drift 0.1 %/C typ
RTD EXCITATION CURRENTS (RTD1, RTD2)
Output Current 200 mA nom Initial Tolerance @ 25∞C ± 20 % max Drift 20 ppm/C typ Initial Matching @ 25∞C ± 1% max Matching between RTD1 and RTD2 Currents Drift Matching 3 ppm/C typ Matching between RTD1 and RTD2 Current Drift Line Regulation (AVDD) 200 nA/V max AVDD = 5 V Load Regulation 200 nA/V max Output Compliance AVDD – 2 V max
SYSTEM CALIBRATION
Positive Full-Scale Calibration Limit Negative Full-Scale Calibration Limit Offset Calibration Limit Input Span
NOTES
12
The AD7711 is tested with the following V with AVDD = 5 V and VSS = –5 V, V
13
Guaranteed by design, not production tested.
14
After calibration, if the analog input exceeds positive full scale, the converter outputs all 1s. If the analog input is less than negative full scale, the device outputs all 0s.
15
These calibration and span limits apply, provided the absolute voltage on the analog inputs does not exceed AVDD + 30 mV or go more negative than VSS – 30 mV.
15
15
BIAS
14
14
voltages. With AVDD = 5 V and VSS = 0 V, V
BIAS
= 0 V.
(1.05 ¥ V –(1.05 ¥ V –(1.05 ¥ V
0.8 ¥ V
REF
(2.1 ¥ V
REF
)/GAIN V max GAIN Is the Selected PGA Gain (between 1 and 128)
REF
)/GAIN V max GAIN Is the Selected PGA Gain (between 1 and 128)
REF
)/GAIN V max GAIN Is the Selected PGA Gain (between 1 and 128)
REF
/GAIN V min GAIN Is the Selected PGA Gain (between 1 and 128)
)/GAIN V max GAIN Is the Selected PGA Gain (between 1 and 128)
= 2.5 V; with AVDD = 10 V and VSS = 0 V, V
BIAS
= 5 V, and
BIAS
The offset calibration limit applies to both the unipolar zero point and the bipolar zero point.
–3–REV. G
AD7711–SPECIFICATIONS
Parameter A, S Versions
POWER REQUIREMENTS
Power Supply Voltages
AVDD Voltage DV
DD
AV
DD
Power Supply Currents
AV
DD
DV
DD
VSS Current 1.5 mA max VSS = –5 V
Power Supply Rejection
Positive Supply (AV Negative Supply (VSS)90 dB typ
Power Dissipation
Normal Mode 45 mW max AVDD = DVDD = +5 V, VSS = 0 V; Typically 25 mW
Standby (Power-Down) Dissipation 15 mW max AV
NOTES
16
The AD7711 is specified with a 10 MHz clock for AVDD voltages of 5 V ± 5%. It is specified with an 8 MHz clock for AVDD voltages greater than 5.25 V and less
than 10.5 V. Operating with AVDD voltages in the range 5.25 V to 10.5 V is only guaranteed over the 0C to 70C temperature range.
17
The ± 5% tolerance on the DVDD input is allowed provided DVDD does not exceed AVDD by more than 0.3 V.
18
Measured at dc and applies in the selected pass band. PSRR at 50 Hz will exceed 120 dB with filter notches of 10 Hz, 25 Hz, or 50 Hz. PSRR at 60 Hz will exceed
120 dB with filter notches of 10 Hz, 30 Hz, or 60 Hz.
19
PSRR depends on gain: Gain of 1 = 70 dB typ; Gain of 2: 75 dB typ; Gain of 4 = 80 dB typ; Gains of 8 to 128 = 85 dB typ. These numbers can be improved (to
95 dB typ) by deriving the V
Specifications subject to change without notice.
16
17
Voltage – V
Voltage 10.5 V max For Specified Performance
SS
Current 4 mA max
Current 4.5 mA max
18
and DVDD) See Note 19 dB typ
DD
voltage (via Zener diode or reference) from the AVDD supply.
BIAS
5 to 10 V nom ± 5% for Specified Performance 5V nom ±5% for Specified Performance
52.5 mW max AV
ABSOLUTE MAXIMUM RATINGS*
(TA = 25C, unless otherwise noted.)
AVDD to DVDD . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +12 V
AV
to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +12 V
DD
AV
to AGND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +12 V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +12 V
AV
DD
DV
to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
DD
DV
to DGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
V
SS
V
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –6 V
SS
Analog Input Voltage to AGND
. . . . . . . . . . . . . . . . . . . . . . . . . V
– 0.3 V to AVDD + 0.3 V
SS
Reference Input Voltage to AGND
. . . . . . . . . . . . . . . . . . . . . . . . . V
– 0.3 V to AVDD + 0.3 V
SS
1
Unit Conditions/Comments
Rejection w.r.t. AGND; Assumes V
= DV
DD
DD
= +5 V, VSS = –5 V; Typically 30 mW
DD
= DV
= +5 V, VSS = 0 V or –5 V; Typically 7 mW
DD
Is Fixed
BIAS
REF OUT to AGND . . . . . . . . . . . . . . . . . . . . –0.3 V to AV
Digital Input Voltage to DGND . . . . . –0.3 V to AVDD + 0.3 V
Digital Output Voltage to DGND . . . –0.3 V to DV
+ 0.3 V
DD
Operating Temperature Range
Commercial (A Version) . . . . . . . . . . . . . . . . –40C to +85∞C
Extended (S Version) . . . . . . . . . . . . . . . . . –55C to +125∞C
Storage Temperature Range . . . . . . . . . . . . . –65C to +150∞C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . . . 300∞C
Power Dissipation (Any Package) to 75∞C . . . . . . . . . . 450 mW
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
DD
ORDERING GUIDE
Model Temperature Range Package Option*
AD7711AN –40C to +85∞C N-24 AD7711AR –40C to +85∞C R-24 AD7711AR-REEL –40C to +85∞C R-24 AD7711AR-REEL7 –40C to +85∞C R-24 AD7711AQ –40C to +85CQ-24 AD7711SQ –55C to +125CQ-24 EVAL-AD7711EB Evaluation Board
*N = Plastic DIP, Q = CERDIP, R = SOIC.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7711 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
–4–
REV. G
AD7711
(DVDD = +5 V 5%; AVDD = +5 V or +10 V3 5%; VSS = 0 V or –5 V 10%; AGND = DGND =

TIMING CHARACTERISTICS

Limit at T
Parameter (A, S Versions) Unit Conditions/Comments
4, 5
f
CLK IN
t
CLK IN LO
t
CLK IN HI
6
t
r
6
t
f
t
1
Self-Clocking Mode
t
2
t
3
t
4
t
5
t
6
7
t
7
7
t
8
t
9
t
10
t
14
t
15
t
16
t
17
t
18
t
19
NOTES
1
Guaranteed by design, not production tested. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
See Figures 10 to 13.
3
The AD7711 is specified with a 10 MHz clock for AVDD voltages of 5 V ± 5%. It is specified with an 8 MHz clock for AVDD voltages greater than 5.25 V and less than 10.5 V.
4
CLK IN duty cycle range is 45% to 55%. CLK IN must be supplied whenever the AD7711 is not in STANDBY mode. If no clock is present in this case, the device can draw higher current than specified and possibly become uncalibrated.
5
The AD7711 is production tested with f
6
Specified using 10% and 90% points on waveform of interest.
7
These numbers are measured with the load circuit of Figure 1 and defined as the time required for the output to cross 0.8 V or 2.4 V.
400 kHz min Master Clock Frequency: Crystal Oscillator or Externally
10 MHz max
0.4 × t
0.4 × t 50 ns max Digital Output Rise Time. Typically 20 ns 50 ns max Digital Output Fall Time. Typically 20 ns 1000 ns min SYNC Pulse Width
0 ns min DRDY to RFS Setup Time 0 ns min DRDY to RFS Hold Time 2 × t
CLK IN
0 ns min A0 to RFS Hold Time 4 × t
CLK IN
4 × t
CLK IN
t
CLK IN
t
CLK IN/2
t
CLK IN
3 × t
CLK IN
50 ns min A0 to TFS Setup Time 0 ns min A0 to TFS Hold Time 4 × t
CLK IN
4 × t
CLK IN
0 ns min Data Valid to SCLK Setup Time 10 ns min Data Valid to SCLK Hold Time
1, 2
0 V; f
, T
MIN
MAX
CLK IN
CLK IN
+ 20 ns max RFS Low to SCLK Falling Edge + 20 ns max Data Access Time (RFS Low to Data Valid)
/2 ns min SCLK Falling Edge to Data Valid Delay
+ 30 ns max
/2 ns nom SCLK High Pulse Width
/2 ns nom SCLK Low Pulse Width
+ 20 ns max TFS to SCLK Falling Edge Delay Time
at 10 MHz (8 MHz for AVDD > 5.25 V). It is guaranteed by characterization to operate at 400 kHz.
CLK IN
= 10 MHz; Input Logic 0 = 0 V, Logic 1 = DVDD, unless otherwise noted.)
CLK IN
Supplied for Specified Performance
ns min Master Clock Input Low Time; t
CLK IN
ns min Master Clock Input High Time
ns min A0 to RFS Setup Time
ns min TFS to SCLK Falling Edge Hold Time
= 1/f
CLK IN
2
REV.G
–5–
AD7711
TIMING CHARACTERISTICS
Limit at T
Parameter (A, S Versions) Unit Conditions/Comments
External Clocking Mode
f
f
SCLK
t
20
t
21
t
22
t
23
7
t
24
7
t
25
t
26
t
27
t
28
8
t
29
t
30
8
t
31
t
32
t
33
t
34
t
35
t
36
NOTES
8
These numbers are derived from the measured time taken by the data output to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then extrapolated back to remove effects of charging or discharging the 100 pF capacitor. This means that the times quoted in the Timing Characteristics are the true bus relinquish times of the part and, as such, are independent of external bus loading capacitances.
Specifications subject to change without notice.
/5 MHz max Serial Clock Input Frequency
CLK IN
0 ns min DRDY to RFS Setup Time 0 ns min DRDY to RFS Hold Time 2 ¥ t
CLK IN
0 ns min A0 to RFS Hold Time 4 ¥ t
CLK IN
10 ns min SCLK Falling Edge to Data Valid Delay 2 ¥ t
CLK IN
2 ¥ t
CLK IN
2 ¥ t
CLK IN
t
+ 10 ns max SCLK Falling Edge to DRDY High
CLK IN
10 ns min SCLK to Data Valid Hold Time
+ 10 ns max
t
CLK IN
10 ns min RFS/TFS to SCLK Falling Edge Hold Time 5 ¥ t
CLK IN
0 ns min A0 to TFS Setup Time 0 ns min A0 to TFS Hold Time 4 ¥ t
CLK IN
2 ¥ t
CLK IN
30 ns min Data Valid to SCLK Hold Time
, T
MIN
MAX
ns min A0 to RFS Setup Time
ns max Data Access Time (RFS Low to Data Valid)
+ 20 ns max
ns min SCLK High Pulse Width ns min SCLK Low Pulse Width
/2 + 50 ns max RFS to Data Valid Hold Time
ns min SCLK Falling Edge to TFS Hold Time
– SCLK High ns min Data Valid to SCLK Setup Time
1.6mA
TO OUTPUT
PIN
100pF
200␮A
+2.1V
Figure 1. Load Circuit for Access Time and Bus Relinquish Time
PIN CONFIGURATION
DIP AND SOIC
1
SCLK
SYNC
MODE
AIN1(+)
AIN1(–)
RTD1
RTD2
V
AV
A0
SS
DD
2
3
4
5
AD7711
6
TOP VIEW
(Not to Scale)
7
8
9
10
11
12
MCLK IN
MCLK OUT
24
23
22
21
20
19
18
17
16
15
14
13
DGND
DV
DD
SDATA
DRDY
RFS
TFS
AGND
AIN2
REF OUT
REF IN(+)
REF IN(–)
V
BIAS
–6–
REV. G
AD7711

PIN FUNCTION DESCRIPTIONS

Pin Mnemonic Function
1 SCLK Serial Clock. Logic input/output, depending on the status of the MODE pin. When MODE is high, the
device is in its self-clocking mode, and the SCLK pin provides a serial clock output. This SCLK becomes active when RFS or TFS goes low, and goes high impedance when either RFS or TFS returns high or when the device has completed transmission of an output word. When MODE is low, the device is in its external clocking mode and the SCLK pin acts as an input. This input serial clock can be a continuous clock with all data transmitted in a continuous train of pulses. Alternatively, it can be a noncontinuous clock with the information being transmitted to the AD7711 in smaller batches of data.
2 MCLK IN Master Clock Signal for the Device. This can be provided in the form of a crystal or external clock. A crystal can
be tied across the MCLK IN and MCLK OUT pins. Alternatively, the MCLK IN pin can be driven with a CMOS-compatible clock and MCLK OUT left unconnected. The clock input frequency is nominally 10 MHz.
3 MCLK OUT When the master clock for the device is a crystal, the crystal is connected between MCLK IN and MCLK OUT.
4A0Address Input. With this input low, reading and writing to the device is to the control register. With this input
high, access is to either the data register or the calibration registers.
5 SYNC Logic Input. Allows for synchronization of the digital filters when using a number of AD7711s. It resets
the nodes of the digital filter.
6 MODE Logic Input. When this pin is high, the device is in its self-clocking mode; with this pin low, the device is in its
external clocking mode.
7 AIN1(+) Analog Input Channel 1. Positive input of the programmable gain differential analog input. The AIN1(+) input
is connected to an output current source that can be used to check that an external transducer has burned out or gone open circuit. This output current source can be turned on/off via the control register.
8 AIN1(–) Analog Input Channel 1. Negative input of the programmable gain differential analog input. 9 RTD1 Constant Current Output. A nominal 200 mA constant current is provided at this pin; this current can be
used as the excitation current for RTDs. This current can be turned on or off via the control register.
10 RTD2 Constant Current Output. A nominal 200 mA constant current is provided at this pin; this current can be
used as the excitation current for RTDs. This current can be turned on or off via the control register, and can be used to eliminate lead resistance errors in 3-wire RTD configurations.
11 V
12 AV
13 V
SS
DD
BIAS
14 REF IN(–) Reference Input. The REF IN(–) can lie anywhere between AV
15 REF IN(+) Reference Input. The reference input is differential provided REF IN(+) is greater than REF IN(–).
16 REF OUT Reference Output. The internal 2.5 V reference is provided at this pin. This is a single-ended output
17 AIN2 Analog Input Channel 2. Single-ended programmable gain analog input.
18 AGND Ground Reference Point for Analog Circuitry. 19 TFS Transmit Frame Synchronization. Active low logic input used to write serial data to the device with serial
Analog Negative Supply, 0 V to –5 V. Tied to AGND for single-supply operation. The input voltage on AIN1 or AIN2 should not go > 30 mV negative w.r.t. V
for correct operation of the device.
SS
Analog Positive Supply Voltage, 5 V to 10 V.
Input Bias Voltage. This input voltage should be set such that V ¥ V
> VSS where V
REF
and VSS. Thus with AV
= –5 V, it can be tied to AGND; with AVDD = 10 V, it can be tied to 5 V.
V
SS
is REF IN(+) – REF IN(–). Ideally, this should be tied halfway between AV
REF
= 5 V and VSS = 0 V, it can be tied to REF OUT; with AVDD = +5 V and
DD
+ 0.85 ¥ V
BIAS
and VSS provided REF IN(+) is greater
DD
< AVDD and V
REF
BIAS
– 0.85
DD
than REF IN(–).
REF IN(+) can lie anywhere between AV
and VSS.
DD
that is referred to AGND. It is a buffered output capable of providing 1 mA to an external load.
data expected after the falling edge of this pulse. In the self-clocking mode, the serial clock becomes active after TFS goes low. During a write operation to the AD7711, the SDATA line should not return to high impedance until after TFS returns high.
2
REV.G
–7–
AD7711
Pin Mnemonic Function
20 RFS Receive Frame Synchronization. Active low logic input used to access serial data from the device. In the
self-clocking mode, the SCLK and SDATA lines both become active after RFS goes low. In the external clocking mode, the SDATA line becomes active after RFS goes low.
21 DRDY Logic Output. A falling edge indicates that a new output word is available for transmission. The DRDY pin
will return high upon completion of transmission of a full output word. DRDY is also used to indicate when the AD7711 has completed its on-chip calibration sequence.
22 SDATA Serial Data. Input/output with serial data being written to either the control register or the calibration
registers and serial data being accessed from the control register, calibration registers, or the data register. During an output data read operation, serial data becomes active after RFS goes low (provided DRDY is low). During a write operation, valid serial data is expected on the rising edges of SCLK when TFS is low. The output data coding is natural binary for unipolar inputs and offset binary for bipolar inputs.
23 DV
DD
24 DGND Ground Reference Point for Digital Circuitry.
Digital Supply Voltage, 5 V. DVDD should not exceed AVDD by more than 0.3 V in normal operation.

TERMINOLOGY

Intergral Nonlinearity

This is the maximum deviation of any code from a straight line passing through the endpoints of the transfer function. The end­points of the transfer function are zero-scale (not to be confused with bipolar zero), a point 0.5 LSB below the first code transi­tion (000 . . . 000 to 000 . . . 001) and full scale, a point 0.5 LSB above the last code transition (111 . . . 110 to 111 . . . 111). The error is expressed as a percentage of full scale.

Positive Full-Scale Error

Positive full-scale error is the deviation of the last code transi­tion (111 . . . 110 to 111 . . . 111) from the ideal input full-scale voltage. For AIN1(+), the ideal full-scale input voltage is (AIN1(–) + V scale input voltage is V
/GAIN – 3/2 LSBs); for AIN2, the ideal full-
REF
/GAIN – 3/2 LSBs. It applies to both
REF
unipolar and bipolar analog input ranges.

Unipolar Offset Error

Unipolar offset error is the deviation of the first code transition from the ideal voltage. For AIN1(+), the ideal input voltage is (AIN1(–) + 0.5 LSB); for AIN2, the ideal input is 0.5 LSB when operating in the unipolar mode.

Bipolar Zero Error

This is the deviation of the midscale transition (0111 . . . 111 to 1000 . . . 000) from the ideal input voltage. For AIN1(+), the ideal input voltage is (AIN1(–) – 0.5 LSB); for AIN2, the ideal input is – 0.5 LSB when operating in the bipolar mode.

Bipolar Negative Full-Scale Error

This is the deviation of the first code transition from the ideal input voltage. For (AIN1(+), the ideal input voltage is (AIN1(–) – V
/GAIN + 0.5 LSB); for AIN2 the ideal input is – V
REF
REF
/GAIN
+ 0.5 LSB when operating in the bipolar mode.

Positive Full-Scale Overrange

Positive full-scale overrange is the amount of overhead avail­able to handle input voltages on the AIN1(+) input greater than AIN1(–) + V than + V
/GAIN (for example, noise peaks or excess
REF
/GAIN or on the AIN2 input greater
REF
voltages due to system gain errors in system calibration rou­tines) without introducing errors due to overloading the analog modulator or to overflowing the digital filter.

Negative Full-Scale Overrange

This is the amount of overhead available to handle voltages on AIN1(+) below AIN1(–) – V –V
/GAIN without overloading the analog modulator or over-
REF
/GAIN or on AIN2 below
REF
flowing the digital filter. Note that the analog input will accept negative voltage peaks on AIN1(+) even in the unipolar mode provided that AIN1(+) is greater than AIN1(–) and greater than
– 30 mV.
V
SS

Offset Calibration Range

In the system calibration modes, the AD7711 calibrates its offset with respect to the analog input. The offset calibration range specification defines the range of voltages that the AD7711 can accept and still calibrate offset accurately.

Full-Scale Calibration Range

This is the range of voltages that the AD7711 can accept in the system calibration mode and still calibrate full-scale correctly.

Input Span

In system calibration schemes, two voltages applied in sequence to the AD7711’s analog input define the analog input range. The input span specification defines the minimum and maxi­mum input voltages from zero- to full-scale that the AD7711 can accept and still calibrate gain accurately.
–8–
REV. G
AD7711

CONTROL REGISTER (24 BITS)

A write to the device with the A0 input low writes data to the control register. A read to the device with the A0 input low accesses the contents of the control register. The control register is 24 bits wide; 24 bits of data must be written to the registers or the data will not be loaded. In other words, it is not possible to write just the first 12-bits of data into the control register. If more than 24 clock pulses are provided before TFS returns high, then all clock pulses after the 24th clock pulse are ignored. Similarly, a read operation from the control register should access 24 bits of data.
MSB
MD2 MD1 MD0 G2 G1 G0 CH PD WL RO BO B/U
FS11 FS10 FS9 FS8 FS7 FS6 FS5 FS4 FS3 FS2 FS1 FS0
LSB
Operating Mode
MD2 MD1 MD0 Operating Mode
00 0Normal Mode. This is the normal mode of operation where a read to the device with A0 high accesses
data from the data register. This is the default condition of these bits after the internal power-on reset.
00 1Activate Self-Calibration. This activates self-calibration on the channel selected by CH. This is a one-step
calibration sequence, and when complete, the part returns to normal mode (with MD2, MD1, MD0 of the control register returning to 0, 0, 0). The DRDY output indicates when this self-calibration is complete. For this calibration type, the zero-scale calibration is done internally on shorted (zeroed) inputs, and the full-scale calibration is done internally on V
01 0Activate System Calibration. This activates system calibration on the channel selected by CH. This is a
two-step calibration sequence, with the zero-scale calibration done first on the selected input channel and DRDY indicating when this zero-scale calibration is complete. The part returns to normal mode at the end of this first step in the two-step sequence.
01 1Activate System Calibration. This is the second step of the system calibration sequence with full-scale
calibration being performed on the selected input channel. Once again, DRDY indicates when the full­scale calibration is complete. When this calibration is complete, the part returns to normal mode.
10 0Activate System Offset Calibration. This activates system offset calibration on the channel selected by
CH. This is a one-step calibration sequence and, when complete, the part returns to normal mode with DRDY indicating when this system offset calibration is complete. For this calibration type, the zero-scale calibration is done on the selected input channel, and the full-scale calibration is done internally on V
10 1Activate Background Calibration. This activates background calibration on the channel selected by CH. If
the background calibration mode is on, the AD7711 provides continuous self-calibration of the reference and shorted (zeroed) inputs. This calibration takes place as part of the conversion sequence, extending the conversion time and reducing the word rate by a factor of 6. The major advantage is that the user does not have to recalibrate the device when there is a change in the ambient temperature. In this mode, the shorted (zeroed) inputs and V tored and the calibration registers of the device are automatically updated.
11 0Read/Write Zero-Scale Calibration Coefficients. A read to the device with A0 high accesses the contents
of the zero-scale calibration coefficients of the channel selected by CH. A write to the device with A0 high writes data to the zero-scale calibration coefficients of the channel selected by CH. The word length for reading and writing these coefficients is 24 bits, regardless of the status of the WL bit of the control register. Therefore, 24 bits of data must be written to the calibration register or the new data will not be transferred to the calibration register.
11 1Read/Write Full-Scale Calibration Coefficients. A read to the device with A0 high accesses the contents of
the full-scale calibration coefficients of the channel selected by CH. A write to the device with A0 high writes data to the full-scale calibration coefficients of the channel selected by CH. The word length for reading and writing these coefficients is 24 bits, regardless of the status of the WL bit of the control register. Therefore, 24 bits of data must be written to the calibration register, or the new data will not be transferred to the calibration register.
.
REF
, as well as the analog input voltage, are continuously moni-
REF
REF
2
.
REV.G
–9–
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