AMETEK MX CTSL User Manual
Revision J
May 2007
Copyright ♥ 1997-2014
By California
Instruments. All
rights reserved.
P/N 7003-973
CTSL
Compliance Test System
User Manual
TEL: +1 (858) 450-0085
FAX: +1 (858) 458-0267
Email:
sales.ppd@ametek.com
Web Site:
http://www.programablepower.com
User
Manual
MX-
CTSL
Compliance
Test System
California
Instruments
SAFETY SUMMARY
These power system components contain high voltage and current circuits that are potentially lethal. The
following safety guidelines must be followed when operating or servicing this equipment. These
guidelines are not a substitute for vigilance and common sense. California Instruments assumes no
liability for the customer's failure to comply with these requirements.
APPLYING POWER AND GROUNDING
Verify the correct voltage is applied to the equipment.
Verify that the input power cord to the PACS-X unit is plugged into a properly grounded utility outlet.
Verify that the input power line to the AC power source used is connected to a properly grounded utility
outlet.
FUSES
Use only fuses of the specified current, voltage, and protection speed.
Do not short out the fuse holder or use a repaired fuse.
The PACS-3-75 unit uses a North-American ferrule type input fuse rated at 0.5A and 250Volts. (Fast Acting)
DO NOT OPERATE IN A VOLATILE ATMOSPHERE
Do not operate the system in the presence of flammable gases or fumes.
DO NOT TOUCH ENERGIZED CIRCUITS
Disconnect power cables before servicing this equipment. Even with the power cable disconnected, high voltage
can still exist on some circuits. Discharge these voltages before servicing. Only qualified service personnel may
remove covers, replace components or make adjustments.
DO NOT SERVICE ALONE
Do not remove covers, replace components, or make adjustments unless another person, who can administer first
aid, is present.
DO NOT EXCEED INPUT RATINGS
Do not exceed the rated input voltage or frequency. Additional hazards may be introduced because of component
failure or improper operation.
DO NOT MODIFY INSTRUMENT OR SUBSTITUTE PARTS
Do not modify these instruments or substitute parts. Additional hazards may be introduced because of component
failure or improper operation.
MOVING THE POWER SOURCE
When moving the power source, observe the following:
1. Remove all AC power to system components.
2. Use two people to prevent injury.
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CTSMXL Software License
Your MX Series CTSL Test System was shipped with one copy of the CTSMXL Software. This software model number CIC 652 - is owned by California Instruments and is protected by United States copyright
laws and international treaty provisions. Therefore, you must treat the software like any other copyrighted
material.
Software Revisions
Revision codes in the Help About screen of the CTSMXL Software indicate the current revision. Minor
changes to the software such as bug fixes usually do not require a change to the manual. Therefore, the
revision number of the software you received with the CTS system may be higher than the software
revision number shown below. In this case, the information in the manual still applies.
Software changes that require a manual change will be accompanied either by a new edition of the manual
or an errata sheet documenting the changes.
This manual applies to software revision 1.3.0.0 (revision 1.3.0.0 includes the higher speed A/D card from
Exacq Technologies). If you are using a software revision less than 1.3.0.0, contact ci.ppd@ametek.com
for upgrade information. The CTS software revisions can be shown by selecting the Help, About screen.
CTSMXL software revision 1.4.0.2 higher supports the new National Instruments M Series cards (PCI6220, PCI-6250).
Printing History
The manual printing date indicates the current edition. The printing date changes with each new edition or
update. Update packets or change sheets may be issued between editions to correct or add information.
Minor corrections incorporated at reprint do not cause a new edition.
December 2014 Revision I
Trademarks
Windows 7™, Windows Vista™, Windows 2000™, Windows XP™ and MS Excel™ are registered
trademarks of Microsoft Corporation.
Contacting California Instruments
To contact California Instruments, use any of the communication channels listed here:
Mail:
Ametek PPD 9250
Brown Deer Road
San Diego, CA 92121
USA
Phone: 858 450 0085 7:00 AM - 4:00 PM Pacific Standard Time
Voice Mail 24 hours
Fax: 858 458-0267
Email:
Web site: www.calinst.com
ci.ppd@ametek.com
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WARRANTY INFORMATION
CALIFORNIA INSTRUMENTS CORPORATION warrants each instrument manufactured by them to be free
from defects in material and workmanship for a period of one year from the date of shipment to the original
purchaser. Excepted from this warranty are fuses and batteries that carry the warranty of their original
manufacturer where applicable. CALIFORNIA INSTRUMENTS will service, replace, or adjust any defective
part or parts, free of charge, when the instrument is returned freight prepaid, and when examination reveals
that the fault has not occurred because of misuse, abnormal conditions of operation, user modification, or
attempted user repair. Equipment repaired beyond the effective date of warranty or when abnormal usage
has occurred will be charged at applicable rates. CALIFORNIA INSTRUMENTS will submit an estimate for
such charges before commencing repair, if so requested.
SERVICE PROCEDURE
If a fault develops, notify CALIFORNIA INSTRUMENTS at repair.ppd@ametek.com or its local
representative, giving full details of the difficulty, including the model number and serial number. On receipt
of this information, service information or a Return Material Authorization (RMA) number will be given. Add
the RMA number furnished to the shipping label. Pack the instrument carefully to prevent transportation
damage, affix label to shipping container, and ship freight prepaid to the factory. CALIFORNIA
INSTRUMENTS shall not be responsible for repair of damage due to improper handling or packing.
Instruments returned without RMA No. or freight collect may be refused at California Instruments discretion.
Instruments repaired under Warranty will be returned either via prepaid surface freight or low cost airfreight
at California Instruments discretion. Instruments repaired outside the Warranty period will be returned
freight collect,
Ex Works CALIFORNIA INSTRUMENTS
San Diego, CA 92121
repairs not covered by the Warranty.
. If requested, an estimate of repair charges will be made before work begins on
9250 Brown Deer Road
DAMAGE IN TRANSIT
The instrument should be tested when it is received. If it fails to operate properly, or is damaged in any
way, a claim should be filed immediately with the carrier. The claim agent should obtain a full report of the
damage, and a copy of this report should be forwarded to us by fax or email (Fax: 858 677 0940, Email:
repair.ppd@ametek.com). CALIFORNIA INSTRUMENTS will prepare an estimate of repair cost and repair
the instrument when authorized by the claim agent. Please include model number and serial number when
referring to the instrument.
SPARE PARTS
To order spare parts, user manuals, or determine the correct replacement part for your California
Instruments products, please contact the Customer Service department by phone at + 1 858 450 0085,
press 2 or by email repair.ppd@ametek.com.
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LIMITATION OF WARRANTY
California Instruments believes the information contained in this manual is accurate. This document has been
carefully reviewed for technical accuracy. In the event that technical or typographical errors exist, California
Instruments reserves the right to make changes to subsequent editions of this document without prior notice to
holders of this edition. The reader should consult California Instruments if errors are suspected. In no event shall
California Instruments be liable for any damages arising out of or related to this document or the information
contained in it.
CALIFORNIA INSTRUMENTS PROVIDES NO WARRANTIES, EXPRESS OR IMPLIED, AND SPECIFICALLY
DISCLAIMS ANY WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE OF THIS
SOFTWARE AND DOCUMENTATION. CALIFORNIA INSTRUMENTS WILL NOT BE LIABLE FOR DAMAGES
RESULTING FROM LOSS OF DATA, PROFITS, USE OF PRODUCTS, OR INCIDENTAL OR CONSEQUENTIAL
DAMAGES, EVEN IF ADVISED OF THE POSSIBILITY THEREOF.
This limitation of liability of California Instruments will apply regardless of the form of action, whether in contract or
tort, including negligence. The warranty provided herein does not cover damages, defects, malfunctions, or service
failures caused by owner’s failure to follow California Instruments’ installation, operation, or maintenance
instructions; owner’s modification of the product; owner’s abuse, misuse, or negligent acts; and power failures,
surges, fire, flood, accident, actions of third parties, or other events outside reasonable control.
SOME STATES DO NOT ALLOW LIMITATIONS ON THE LENGTH OF AN IMPLIED WARRANTY OR THE
EXCLUSION OR LIMITATION OF INCIDENTAL OR CONSEQUENTIAL DAMAGES, SO THE ABOVE LIMITATION
OR EXCLUSIONS MAY NOT APPLY TO YOU. THIS WARRANTY GIVES YOU SPECIFIC LEGAL RIGHTS, AND
YOU MAY ALSO HAVE OTHER RIGHTS WHICH VARY FROM STATE TO STATE.
If any part of this Agreement shall be determined by a court to be invalid, illegal or unenforceable, the remaining
provisions shall in no way be affected or impaired thereby.
GOVERNING LAW. This Agreement and Limited Warranty are governed by the laws of the state of California
without regard to conflict of law provisions.
INSTALLATION AND / OR USE OF THIS PROGRAM CONSTITUTES ACCEPTANCE OF THESE TERMS AND
RESTRICTIONS BY THE USER.
© 1997 - 2014 COPYRIGHT
Under the copyright laws, this publication may not be reproduced or transmitted in any form, electronic or
mechanical, including photocopying, recording, storing in an information retrieval system, or translating, in whole or
in part, without the prior written consent of California Instruments Corporation.
California Instruments Corporation, © 1997 - 2014
Warning regarding Medical and Clinical use of California
Instruments products.
California Instruments products are not designed with components and testing intended to ensure a level of
reliability suitable for use in the treatment and diagnosis of human beings. California Instruments products are NOT
intended to be used to monitor or safeguard human health and safety in medical or clinical treatment and California
Instruments assumes no responsibility for this type of use of its products or software.
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Table of Contents
1. Introduction .................................................................................................................................. 11
1.1 Manual Organization ................................................................................................................................ 11
1.2 Compliance Test System Description ....................................................................................................... 12
2. IEC Testing .................................................................................................................................. 15
2.1 About This Chapter .................................................................................................................................. 15
2.2 The EMC Directive ................................................................................................................................... 15
2.3 The EN 61000-3-2:2000 Standard ........................................................................................................... 16
2.4 The EN 61000-3-2:1998 Standard ........................................................................................................... 19
2.5 EN 61000-3-3 Flicker ............................................................................................................................... 21
2.6 EN 61000-4-11p Voltage Dips and Variations .......................................................................................... 22
2.7 EN 61000-4-13 Interharmonics and Harmonics Immunity Test ................................................................ 23
2.8 EN 61000-4-14 Voltage Fluctuations ........................................................................................................ 24
2.9 EN 61000-4-17 DC Ripple ........................................................................................................................ 24
2.10 EN 61000-4-27p Three Phase Voltage Unbalance ................................................................................... 25
2.11 EN 61000-4-28 Voltage Frequency Variations ......................................................................................... 25
2.12 EN 61000-4-29p DC Voltage Dips, Interruptions and Variations............................................................... 25
2.13 References ............................................................................................................................................... 26
3. System Installation ....................................................................................................................... 27
3.1 About This Chapter .................................................................................................................................. 27
3.2 Hardware Installation ................................................................................................................................ 27
3.3 PC Requirements ..................................................................................................................................... 28
3.4 OMNI-3-37MX Unit ................................................................................................................................... 29
3.5 OMNI-3-37MX Unit ................................................................................................................................... 32
3.6 PACS-3-75 Unit ........................................................................................................................................ 41
3.7 Functional Test ........................................................................................................................................ 46
3.8 Data Acquisition Card Installation - PCI Card Version .............................................................................. 47
3.9 CTSMXL Software Installation .................................................................................................................. 56
3.10 AC Source Control Software Installation ................................................................................................... 58
4. Program Menus ........................................................................................................................... 59
4.1 About this Chapter ................................................................................................................................... 59
4.2 Main Menus ............................................................................................................................................. 59
4.3 File Menu ................................................................................................................................................. 59
4.4 Edit Menu ................................................................................................................................................. 60
4.5 View Menu ............................................................................................................................................... 61
4.6 Options Menu ........................................................................................................................................... 61
4.7 Test Menu ................................................................................................................................................ 62
5. Harmonics Testing ....................................................................................................................... 63
5.1 About This Chapter .................................................................................................................................. 63
5.2 Test Standard Selection ........................................................................................................................... 63
5.3 Device Classes ........................................................................................................................................ 63
5.4 Stationary or Transitory Harmonics Test .................................................................................................. 66
5.5 Running a Harmonics Test ....................................................................................................................... 67
5.6 Additional Setup Parameters for Harmonics ............................................................................................. 69
5.7 Main Harmonics Test Window Operation ................................................................................................. 71
5.8 Running the Harmonics Test .................................................................................................................... 74
5.9 Printing Results ........................................................................................................................................ 76
5.10 Harmonics Test Data Files ....................................................................................................................... 77
5.11 Three Phase Testing. ............................................................................................................................... 77
5.12 Replay Mode ............................................................................................................................................ 77
6. Flicker Testing ............................................................................................................................. 80
6.1 About This Chapter .................................................................................................................................. 80
6.2 Principle of Operation ............................................................................................................................... 80
6.3 Running a Flicker Test ............................................................................................................................. 80
6.4 Printing Test Reports................................................................................................................................ 84
6.5 Flicker Replay Mode................................................................................................................................. 85
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7. EN 61000-4-11p Voltage Dips and Variations (Pre-compliance) ................................................... 88
7.1 About This Chapter ................................................................................................................................... 88
7.2 Standard Revisions and EUT Classes ...................................................................................................... 88
7.3 Compliance Statement ............................................................................................................................. 89
7.4 Specifying test sequences for Dips and Variations .................................................................................... 90
7.5 Test Setup ................................................................................................................................................ 91
7.6 Test Options ............................................................................................................................................. 92
7.7 Test Results ............................................................................................................................................. 92
7.8 Report Format- 411 Test Files .................................................................................................................. 92
8. EN 61000-4-13 Harmonics and Inter harmonics Immunity Test .................................................... 93
8.1 About this Chapter. ................................................................................................................................... 93
8.2 Tab Controls ............................................................................................................................................. 94
8.3 Test Setup ................................................................................................................................................ 95
8.4 Test Sequence ......................................................................................................................................... 95
8.5 Test Results ............................................................................................................................................. 99
8.6 Measurements ........................................................................................................................................ 100
8.7 EN 61000-4-13 Test Reports .................................................................................................................. 100
9. EN 61000-4-14 Voltage Fluctuations Immunity Testing .............................................................. 101
9.1 About This Chapter ................................................................................................................................. 101
9.2 Test Setup .............................................................................................................................................. 102
9.3 Test Sequence ....................................................................................................................................... 103
9.4 Test Levels ............................................................................................................................................. 104
9.5 Voltage Fluctuation. ................................................................................................................................ 105
9.6 Test Execution ........................................................................................................................................ 106
9.7 Test Parameter File Creation and Limits ................................................................................................. 106
9.8 Test Results ........................................................................................................................................... 106
9.9 Report Format- 414 Test Files ................................................................................................................ 106
10. EN 61000-4-17 DC Ripple Immunity Testing .............................................................................. 108
10.1 About This Chapter ................................................................................................................................. 108
10.2 Test Setup .............................................................................................................................................. 109
10.3 Test Sequence ....................................................................................................................................... 109
10.4 Waveform Display .................................................................................................................................. 110
10.5 Test Results ........................................................................................................................................... 110
10.6 User Observations. ................................................................................................................................. 111
10.7 Report Format- 417 Test Files ................................................................................................................ 111
10.8 Saving and Loading Test Setups. ........................................................................................................... 111
11. EN 61000-4-27p Voltage Unbalance Immunity Testing .............................................................. 112
11.1 About This Chapter ................................................................................................................................. 112
11.2 Test Setup .............................................................................................................................................. 113
11.3 Equipment Classifications ....................................................................................................................... 114
11.4 Test Levels ............................................................................................................................................. 114
11.5 Waveform Display Tab ........................................................................................................................... 115
11.6 Operator Observations Tab .................................................................................................................... 115
11.7 Source Regulation .................................................................................................................................. 115
11.8 Test execution ........................................................................................................................................ 115
11.9 Test Implementation and Test Sequence ............................................................................................... 116
11.10 Test Reports ........................................................................................................................................... 116
12. EN 61000-4-28 Frequency Variations Immunity Testing............................................................. 117
12.1 About This Chapter ................................................................................................................................. 117
12.2 Test Setup .............................................................................................................................................. 118
12.3 Test Sequence ....................................................................................................................................... 119
12.4 Test Levels ............................................................................................................................................. 120
12.5 Test Options ........................................................................................................................................... 120
12.6 Test Results ........................................................................................................................................... 121
12.7 Test Reports ........................................................................................................................................... 121
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13. EN 61000-4-29p DC Dips and Interruptions Immunity Test (Pre-compliance) .............................. 122
13.1 Test Setup ............................................................................................................................................. 123
13.2 Setting nominal values ........................................................................................................................... 124
13.3 Test sequence ....................................................................................................................................... 124
13.4 Test Options ........................................................................................................................................... 125
13.5 Test Execution ....................................................................................................................................... 125
13.6 Test Results ........................................................................................................................................... 125
13.7 EN 61000-4-29 Test Reports ................................................................................................................. 126
13.8 Source Requirements............................................................................................................................. 127
14. Customizing EN 61000-4-13 Test Parameters ........................................................................... 128
14.1 About This Chapter ................................................................................................................................ 128
14.2 Sample File IEC413.413 ........................................................................................................................ 129
15. Specifications ............................................................................................................................ 131
15.1 About This Chapter ................................................................................................................................ 131
15.2 PACS-3-75 Measurement Specifications ............................................................................................... 131
15.3 PACS-3-75 General Specifications......................................................................................................... 133
15.4 PACS-3-75 Environmental ..................................................................................................................... 134
15.5 PACS-3-75 Regulatory ........................................................................................................................... 134
15.6 Flicker Reference Impedances ............................................................................................................... 135
15.7 OMNI-3-37MX Specifications ................................................................................................................. 135
15.8 OMNI-3-37MX Environmental ................................................................................................................ 136
15.9 OMNI-3-37MX Regulatory ...................................................................................................................... 136
16. Configuration Options ................................................................................................................ 137
16.1 About this Chapter ................................................................................................................................. 137
16.2 Accessing the Calibration and Configuration Database .......................................................................... 137
17. Calibration ................................................................................................................................. 140
17.1 About This Chapter ................................................................................................................................ 140
17.2 Calibration .............................................................................................................................................. 140
17.3 Install A/D Card in PC ............................................................................................................................ 141
17.4 PACS-3-75 Calibration Setup ................................................................................................................. 141
17.5 Configuration Procedure ........................................................................................................................ 141
17.6 Installing New CTSMXL Calibration Data ............................................................................................... 144
18. Principle Of Operation ................................................................................................................ 145
18.1 General .................................................................................................................................................. 145
18.2 AC Power ............................................................................................................................................... 145
18.3 PACS-3-75 Measurement Unit ............................................................................................................... 145
18.4 OMNI-3-37MX Impedance ..................................................................................................................... 145
18.5 CTSMXL Software ................................................................................................................................. 145
19. Service ...................................................................................................................................... 147
19.1 Cleaning ................................................................................................................................................. 147
19.2 General .................................................................................................................................................. 147
19.3 Basic Operation ...................................................................................................................................... 147
19.4 Advanced Troubleshooting ..................................................................................................................... 150
Index .................................................................................................................................................... 152
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List of Figures
Figure 3-1: MX30-3Pi-CTSH and MX45-3Pi-CTSH with OMNI-3-75 Wiring Diagram – Version 2 ................... 33
Figure 3-2: MX60-3Pi-CTSH and MX90-3Pi-CTSH with OMNI-3-75 Wiring Diagram – Version 2 ................... 34
Figure 3-3: MX30-3Pi-CTSL and MX45-3Pi-CTSL with OMNI-3-37MX Wiring Diagram. ................................. 35
Figure 3-4: MX60-3Pi-CTSL and MX90-3Pi-CTSL with OMNI-3-37MX Wiring Diagram. ................................. 36
Figure 3-5: MX30-3Pi-CTSHL and MX45-3Pi-CTSHL with dual OMNI's Wiring Diagram – Version 2. ............ 37
Figure 3-6: MX60-3Pi-CTSHL and MX90-3Pi-CTSHL with dual OMNI's Wiring Diagram. ............................... 38
Figure 3-7: MX30-3Pi-CTSH and MX45-3Pi-CTSH with OMNI-3-75 Wiring Diagram - version 1 .................... 39
Figure 3-8: MX30-3Pi-CTSHL and MX45-3Pi-CTSHL with dual OMNI's Wiring diagram – version 1 .............. 40
Figure 3-9: EUT Connection distance and wire gauge .................................................................................... 42
Figure 3-10: Power Connections for PACS-3-75 ............................................................................................. 44
Figure 3-11: Front and Rear Panel Views of the PACS-3-75 Module. ............................................................. 45
Figure 3-12: Exacq Control Center Screen. .................................................................................................... 51
Figure 3-13: Exacq Card Device Number ........................................................................................................ 52
Figure 3-14: Exacq Test Panel ........................................................................................................................ 53
Figure 3-15: Exacq DMM Screen. ................................................................................................................... 54
Figure 3-16: Exacq Scope Test Panel ............................................................................................................. 55
Figure 5-1: Class D Current Wave Shape Template ....................................................................................... 64
Figure 5-2: EUT Class Determination Flowchart .................................................................................................. 65
Figure 5-3: Typical Class A test setup ............................................................................................................. 67
Figure 5-4: Additonal Settings for Harmonics Test .......................................................................................... 69
Figure 5-5: Harmonics Test Window. .............................................................................................................. 71
Figure 6-1: Flicker Test Window ..................................................................................................................... 81
Figure 7-1: EN 61000-4-11 Test Window ........................................................................................................ 88
Figure 7-2: EN 61000-4-11 Voltage Variation specification ............................................................................. 90
Figure 7-3: EN 61000-4-11 Voltage Variation specification – Edition 2.0. ....................................................... 90
Figure 8-1: EN 61000-4-13 Test Window ........................................................................................................ 93
Figure 8-2: EN 61000-4-13 Flow Chart, Class 1 and 2 EUT’s. ........................................................................ 96
Figure 8-3: EN 61000-4-13 Flow Chart, Class 3 EUT ...................................................................................... 97
Figure 9-1: EN 61000-4-14 Test Window ...................................................................................................... 101
Figure 9-2: EN 61000-4-14 Test Sequence ................................................................................................... 103
Figure 10-1: EN 61000-4-17 Test Window .................................................................................................... 108
Figure 10-2: EN 61000-4-17 Waveform Acquisition Window ......................................................................... 110
Figure 10-3: EN 61000-4-17 User Observation Data Entry Window .............................................................. 111
Figure 11-1: EN 61000-4-27 Test Window .................................................................................................... 112
Figure 12-1: EN 61000-4-28 Test Window .................................................................................................... 117
Figure 12-2: EN 61000-4-28 Test Sequence ................................................................................................. 119
Figure 13-1: EN 61000-4-29 Test Window .................................................................................................... 122
Figure 17-1 : CTSMXL Calibration Program Main Screen ............................................................................. 141
Figure 17-2: Three Phase Calibration Setup ................................................................................................. 143
Figure 19-1: Location of AC Sensor Assy. 5004-700 in PACS-3-75 .............................................................. 149
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List of Tables
Table 2-1: EN 61000-3-2 Class Limits ............................................................................................................ 17
Table 2-2: Harmonics Amendment 14 Test Times .......................................................................................... 18
Table 2-3: EN 61000-3-2 Class Descriptions .................................................................................................. 20
Table 2-4: Average public utility disturbances per annum in Europe ............................................................... 23
Table 3-1: PC Pentium/Athlon Processor Clock Speed Requirement ............................................................. 28
Table 5-1: IEC Harmonics Setup Parameters ................................................................................................. 68
Table 5-2: IEC Harmonics Advanced Setup Parameters ................................................................................ 70
Table 5-3: IEC Harmonics Replay Settings ..................................................................................................... 79
Table 6-1: IEC Flicker Replay Settings ........................................................................................................... 87
Table 17-1: Required Calibration Equipment ................................................................................................ 140
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1. Introduction
1.1
Manual Organization
This manual describes the operation of the California Instruments Compliance Test System Software when
used in conjunction with the CTS hardware. Its primary function is as a reference manual. If you have a
question about a specific screen or how to perform a certain task, turn to the appropriate section of the
manual. The manual is organized in accordance with the normal test procedure you would follow when
testing for IEC compliance.
Some assumptions were made when producing this documentation. Specifically, it is assumed that you are
familiar with the EN 61000-3-2 and EN 61000-3-3 standards and their requirements. Some background
information on the IEC standards covered by the CTS system is included in chapter 2. This information is
subject to change however as standards do change. We recommend you stay current with evolving test
standards and regulations. Furthermore, it is also assumed that you are familiar with operating a personal
computer under the Microsoft Windows™ environment.
The manual is organized as follows:
Chapter 1 describes the organization of the user manual and provides a brief overview of the
Chapter 2 provides an overview of the relevant IEC regulations and how compliance testing to
Chapter 3 covers installation of the hardware and software components required to operate the
Chapter 4 Overview of the program's menu structure
CTS system components.
these regulations is implemented in the CTSMXL Software.
CTS system. Proper installation of both hardware and software is essential. This
chapter walks the user through the hardware setup and the software installation,
process one step at a time.
Chapter 5 covers EN 61000-3-2 harmonics testing. This chapter provides step by step
instructions on how to set up the correct test mode and perform the necessary steps
to perform a quasi-stationary or transitory Harmonics test on the EUT.
Chapter 6 covers EN 61000-3-3 Voltage fluctuations testing. This chapter provides step by step
instructions on running a voltage fluctuation or flicker test.
Chapter 7 covers EN 61000-4-11p Voltage Dips and Variations immunity testing.
Chapter 8 covers EN 61000-4-13 standard Voltage Fluctuations immunity testing. [Draft version]
Chapter 9 covers EN 61000-4-14 standard Voltage Fluctuations immunity testing.
Chapter 10 covers EN 61000-4-17 standard DC Ripple immunity testing.
Chapter 11 covers EN 61000-4-27p standard Voltage Unbalance immunity testing.
Chapter 12 covers EN 61000-4-28 standard Frequency Variations immunity testing.
Chapter 13 covers EN 61000-4-29p DC Voltage dips and Variations immunity testing.
Chapter 14 covers EN 61000-4 customization to allow for future revisions of these standards and
to accommodate different product categories.
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1.2
Chapter 15 provides the technical specifications for the Power Analysis and Conditioning System
(PACS) unit, which is a key component of the CTS system. For technical
specifications on the AC source supplied with the CTS system, refer to the AC source
manual provided.
Chapter 16 overview of available configuration options.
Chapter 17 overview of calibration procedures
Chapter 18 provides theory of operation information.
Chapter 19 provides service and troubleshooting procedures.
Compliance Test System Description
The California Instruments Compliance Test System is a complete IEC AC power test system that covers
many of the IEC regulatory test standards involving AC and/or DC powered equipment.
To ensure maximum flexibility of both the hardware and the software required to create a turn-key system,
the CTS system uses a modular structure consisting of the following components:
• Programmable MX Series AC power source. The AC source provides AC power at the user specified
frequency and voltage. The MX Series AC source also offers over current protection to avoid damaging
a load that exhibits a failure. The MX power source is a three-phase unit.
The following power source configurations are currently supported on MX-CTSH systems:
• MX30-3Pi-CTSL
• MX45-3Pi-CTSL
• MX60-3Pi/2-CTSL Two cabinet MX master/auxiliary power source.
• MX90-3Pi/2-CTSL Two cabinet MX master/auxiliary power source.
• RS90-3Pi-CTSL
This user manual generally refers to the power source as a MX45-3Pi model as it is most common.
Where relevant, the other power source system configurations will be covered specifically. In general,
operation of the MXCTSL system is the same for any of these four configurations.
• Power Analysis and Conditioning System unit. The PACS-3-75 unit creates the electrical and
mechanical interface between the AC source, the Equipment Under Test (EUT) and the PC based data
acquisition system. It provides the necessary signal conditioning and isolation for the acquisition
system.
• PC Based data acquisition system. The data acquisition system uses a fast Analog to Digital
conversion card that plugs into an available card slot in the user’s PC. The CTSMXL Software controls
all aspects of the A/D card and processes the data for IEC test purposes.
• CTSMXL Software. The CTSMXL Software implements the harmonics and flicker IEC tests. In addition
to the CTSMXL Software, the California Instruments MXGUI program is used to control the AC and DC
source used and to implement those IEC tests that run on the AC source, specifically the EN 61000-4
immunity tests.
The AC source output is connected to AC input terminal at the rear of the PACS-3-75 unit. The PACS-3-75
AC output rear terminals are used to connect the EUT. All user interactions with the CTS system are
accomplished through the CTSMXL and MXGUI software. There are virtually no front panel controls
required to operate the CTS system.
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1.2.1 AC Source Models
The MXCTS system is supplied with one the following MX Series programmable AC power sources:
• MX30-3Pi-CTSL
• MX45-3Pi-CTSL
• MX60-3Pi/2-CTSL Two cabinet MX master/auxiliary power source.
• MX90-3Pi/2-CTSL Two cabinet MX master/auxiliary power source.
• RS90-3Pi- CTSL
No other MX Series power source models are supported by the CTSMXL Software. This user manual
generally refers to the power source as a MX45-3Pi model as it is most common. Where relevant, the
other power source system configurations will be covered specifically. In general, operation of the
MXCTSH system is the same for any of these four configurations.
Note: The MXCTS systems are rated for a maximum current of 75 amps rms per phase. Damage to the
standard PACS-3-75 units can occur if higher currents are present. Care must be taken to not
exceed this rating when using the system directly with the utility line or with the higher power
sources.
1.2.2 PACS-3-75 Unit
The Power Analysis and Conditioning System provides the required electrical and mechanical interface
between the AC source, the user’s equipment under test and the data acquisition PC system. This allows
all signal connections to be made easily and conveniently.
The PACS-3-75 unit has several AC power input and output connections as well as an interface connector
to the PC based data acquisition system.
1.2.3 PC Based Data Acquisition System (updated for new PCI data acquisition)
All measurements required for IEC testing are performed by the data acquisition system that resides on the
user’s PC. The measurement card needs to be installed in an available slot and the software needs to be
installed. All signal connections between the PC and the PACS-3-75 unit are made with a single 37 pin to
68 pin cable supplied with the system.
The following data acquisition cards are supported by the CTSMXL software:
CI400PCI PCI card NI 6032/4E. No longer provided on new system shipments but still
supported by CTS30 software revision 1.3.X
CI401PCI PCI card Exacq Technologies CM2110 PCI A/D card, 250 Ks/sec for single phase
systems (P/N 250803)
CI403PCI PCI card Exacq Technologies CM2210 PCI A/D card, 1 Ms/sec for three phase
systems (P/N 250797)
CI401PCI PCI card National Instruments M Series PCI-6220 A/D card, 250 Ks/sec for single
phase systems (P/N 250821) for software version 2.0.x or later
CI403PCI PCI card National Instruments M Series PCI-6250 A/D card, 1 Ms/sec for three
phase systems (P/N 250822) for software version 2.0.x or later
The data acquisition system samples all voltage and current channels at a high sampling rate and provides
the data to the CTSMXL Software for further processing. The PACS-3-75 provides a single voltage input
channel and three current input channels for each phase, to the PC. This allows for current range changing
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on the fly. There is no need for the user to select a current range as the software automatically uses the
most suitable range available for the current signal.
1.2.4 CTSMXL Software Functions
The CTSMXL software application supports EN 61000-3-2 and EN 61000-3-3 compliance testing
requirements using an intuitive graphical user-interface from which you can:
• Set up and run compliance-level tests. The setting up of many IEC details is facilitated through the use
of embedded standards expertise.
• Collect real-time test data from the MX-CTSL System.
• Display and monitor real-time test results.
• Save test results to disk for analysis using other programs.
• Replay previously recorded test data and single step through the data frame by frame.
• Print reports and graphs in MS Word™ formats.
1.2.5 MXGUI Source GUI Functions
The CTS system also includes an AC source control software package. This Graphical User Interface
program can be used to control the AC source from the same PC using either the RS232C or IEEE-488
interface. An IEEE-488 interface is not included with the CTS system. The PC must have an available
RS232C port to use the RS232C control interface to the source.
In the absence of a suitable interface, the user can operate the AC source from the front panel. This does
not affect the ability to run harmonics and flicker tests. It does however preclude the use of the EN 61000-4
immunity tests, which are only available through the MXGUI1 AC source control program.
Note on Interface conflicts:
If the MXGUI program is set up to use the same serial or IEEE-488 port (any address) to communicate with
the AC source as the CTSMXL Software, it is not possible to have both the CTSMXL Software and the
MXGUI software running at the same time. This is due to the fact that both programs would attempt to use
the same interface to control the AC source. If this is the case, close one program before opening the
other.
If IEEE-488 is used to control the AC source with the MXGUI and RS232C is selected on the MXCTSL or
vice versa, both programs can be open at the same time but care should be taken not to control the source
from both programs at the same time. This setup is not recommended however.
Use either program in turn depending on the task at hand (MXCTSL for EN 61000-3 and MXGUI for EN
61000-4)
1
Some EN 61000-4 tests are pre-compliance only
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2. IEC Testing
2.1
About This Chapter
This chapter provides some background information on the various IEC test standards that apply to AC
powered products. It also reviews some of the test equipment requirements that are important when testing
for IEC compliance. Note that this information is subject to change as IEC standards change over time.
This overview is by no means comprehensive and is only provided for reference. If the reader is not familiar
with IEC test requirements for AC powered products, we strongly recommend consulting information on this
subject that is available through other sources. References are provided at the end of this chapter.
The standards covered in this chapter include those, which the CTS system is capable of testing,
specifically:
• EN 61000-3-2 Quasi Static and Transitory Harmonics
• EN 61000-3-3 Flicker
• EN 61000-4-11p Voltage Dips and Variations (pre-compliance, requires option -411 on MX)
• EN 61000-4-13 Interharmonics and Harmonics Immunity Test (requires option –413 on MX)
• EN 61000-4-14 Voltage Fluctuations
2.2
• EN 61000-4-17 DC Ripple
• EN 61000-4-27p AC Voltage Unbalance (pre-compliance)
• EN 61000-4-28 Frequency Variations
• EN 61000-4-29p DC Voltage Dips and Variations (pre-compliance)
The EMC Directive
As the world population grows and the overall energy consumption increases, industrialized nations have
become increasingly concerned with the future availability of energy. Reducing energy consumption by
using more energy efficient lighting and motor drive systems is one approach being taken by European, US
and Japanese governments. The need of more efficient electrical systems however typically requires the
use of sophisticated semi-conductor based electronic circuits that produce current harmonics. This in turn
effects power quality which is an increasing problem on public utility networks. As lighting systems with
electronic ballasts and equipment with switching power supplies such as computers, TV’s, fax machines
and printers proliferate, power quality deteriorates. The same is true for PWM controller motor drives. The
International Electrical Committee (IEC) has released standards dealing with the low frequency public
supply system. Initial standards were 555.2 (Harmonics) and 555.3 (Flicker) which have since been refined
and are now available as EN 61000-3-2 and EN 61000-3-3 respectively. Effective January 1, 1996, most
electrical devices sold within the member countries of the European Union (EU) must meet these standards
as governed by the EMC directive.
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2.2.1
2.3
Why do you have to test?
In general, these IEC directives do not have the legal force of law. However, the European Union (EU) has
issued Euro Norms in the context of these IEC directives that are legally binding and are enforced by the
EMC Police. The relevant enforceable standards are EN61000-3-2 and EN61000-3-3, which supersede
EN60555.2 and EN60555.3 respectively. These standards are also known under the IEC designator EN
61000-3-2 and EN 61000-3-3. Recently, the universal EN 61000 convention has been adopted for all IEC
standards.
Individual member countries have issued identical national norms, either in their native language or in
English, which carry the same legal enforceability. Other countries such as Japan and the USA are in the
process of adopting similar standards. Penalties for violating these norms range from hefty fines to jail time.
In cases where the manufacturer is not located in the EU, his distributor or authorized agent will be held
liable. Local customs agencies can stop equipment that does not meet these IEC norms at the border.
Compliance testing of equipment is performed by accredited laboratories run by European government
agencies assigned with enforcing these norms. Also, competing vendors have been known to submit
failing test results on competitors' products to local governments to force prosecution and gain a
competitive advantage in the market place.
Conformance to the EMC low voltage directive is indicated by the CE mark. Note however, that the CE
mark includes more than just EN 61000-3-2 and EN 61000-3-3.
The EN 61000-3-2:2000 Standard
This standard is often referred to as Amendment 14. It is less stringent for class C and D products
compared to the 1998 standard. Effective January 2001, products may be evaluated against this standard.
2.3.1 Test Classes
CENELEC-A14 changes the definition of Class-D products. Per the amendment, only TV’s, PC’s and PC
monitors are to be tested per Class-D limits. This means that many products migrate to Class-A. Note that
there is no change in classification for Class-A, B, and C products, but the harmonic analysis method for
products with fluctuating power is affected by A-14 for these products as well.
The limits for Class-C & D are proportional. Whereas this doesn’t cause any difficulties for products with a
constant current/power level, the situation was less clear for products with fluctuating load levels. Most test
systems implemented so-called dynamic limits, with the limits constantly being adjusted per the measured
power (or the fundamental current for Class-C) while others used some average power level to set the
limits. The latter systems determine this average power/current using some arbitrary method, and pre-test
period. Thus different test systems implement different limits for the same (fluctuating power) products,
which can result in one system PASSING a product while the other REJECTS it.
A second issue for fluctuating loads is the way the existing standard (1998 edition) defines criteria for
passing and failing the harmonics test. The existing standard permits the unit under test to occasionally
exceed the 100 % limit, provided the harmonics never exceed 150 % of the limit. In fact, the unit under test
is allowed to exceed the 100 % level for 10 % of the test time. The test time for fluctuating loads is to be at
least 2.5 minutes, i.e. the harmonics can exceed the 100 % limit for 15 seconds in every 150-second (2.5
min) period. For longer test times, one can perform this test in 2.5 minutes “time blocks” but another
interpretation is to just take 10 % of the overall test time. Thus, the testing method for fluctuating loads was
somewhat subject to interpretation by the test equipment manufacturer.
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Pass/Fail criteria under the new standard are as follows:
The average value for the individual harmonic currents, taken over the entire test observation period shall be
less than or equal to the applicable limits.
For each harmonic order, all 1,5 s smoothed r.m.s. harmonic current values shall be less than or equal to
150% of the applicable limits.
Harmonic currents less than 0,6% of the input current measured under the test conditions, or less than 5 mA,
whichever is greater, are disregarded.
For the 21st and higher odd order harmonics, the average values obtained for each individual odd harmonic
over the full observation period, calculated from the 1,5 s smoothed values may exceed the applicable limits by
50% provided that the following conditions are met:
• The measured partial odd harmonic current does not exceed the partial odd harmonic current, which
can be calculated from the applicable limits.
• All 1,5 s smoothed individual harmonic current values shall be less than or equal to 150% of the
applicable limits.
2.3.2 EN 61000-3-2 Test Limits
The following table summarizes the current harmonic limits for each device class that are presently in
effect. The limits are generally built into IEC test software programs such as California Instruments’
CTSMXL Test System software. If the power level of a class D device drops below 75 W (configurable see System Administrator Manual P/N 7003-794), no harmonic current limits are applied and the result will
always show a pass.
Harmonic no. (n) Class A Class B Class C Class D IEC 555-2
2 1.080 1.620 2 - 0.300
3 2.300 3.450 30 x PF 3.400 0.800
4 0.430 0.645 - - 0.150
5 1.140 1.710 10 1.900 0.600
6 0.300 0.450 - - 7 0.770 1.155 7 1.000 0.450
8 0.230 0.345 - - -
9 0.400 0.600 5 0.500 0.300
10 0.184 0.276 - - 11 0.330 0.495 3 0.350 0.170
12 0.153 0.230 - - 13 0.210 0.315 3 0.296 0.120
Even 14-40 1.84 / n 2.760 / n - -
Odd 15-39 2.25 / n 3.338 / n 3 3.850 / n
A RMS A RMS % of
fundamental
RMS current
Table 2-1: EN 61000-3-2 Class Limits
mA/Watt of
input power
(75 - 600 W)
A RMS
TV Receivers
> 165 W
-
1.500 / n
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Type
of
equipment
Observation
period
The actual class limits for all classes have not changed with amendment 14. The power levels for Class D
on which these limits are calculated however and the fundament current and power factor for class C have
been changed however.
First of all, the manufacturer is required to declare the rated power (the fundamental current and Power
Factor for Class-C) for the product. This “rated power” (current & PF) will be used as the basis for the limit
calculation of Class-D (Class-C). Thus, a “rated power” of 150 Watt for example, will yield a third harmonic
limit of 150 x 3.4 = 510 mA. Similarly, a rated fundamental current of 0.4 Amp, and a rated PF of 0.98 for an
electronic ballast will result in a third harmonic limit of 0.4 x 0.3 x 0.98 = 117.6 mA. Thus, the amendment
requires that an automated compliance test system must allow the user to enter this rated power or rated
current. Also, the test system must verify the power (fundamental current and PF) because these “rated
vales” as declared by the manufacturer must be within +/- 10 % of the actual values. If not, the actually
measured values are to be used for the limit calculation. The method to measure these actual power,
fundamental current and PF differ from the “average method” used in existing test systems, and of course
differ also from the “dynamic limit method”.
The Pass/Fail criterion is given above. The “10 % of the time over 100 % of the limits” no longer exists. The
average harmonic level during the whole test must simply be below the limit, and individual values in each
acquisition window (after 1.5 sec filtering) must be below 150 % of the limit. There is also an extra
allowance for the higher harmonics from H
21
- H
39
.
The CTS fully supports and implements Amendment 14.
2.3.3
EN 61000-3-2:2000 Test Time
Under the new test standard, four test times (observation periods) are allowed depending on the nature of
the EUT. All are aimed at ensuring repeatability of test results when tests are performed under the same
conditions and on the same test system. Repeatability for this purpose is defined as results that are within
5 %. Available observation periods are shown in the table below.
behavior
Quasi-stationary
Short cycles (Tcycle < 2.5
min)
Random
Long cyclic (Tcycle > 2.5
min)
T
of sufficient duration to meet the requirements for repeatability.
obs
T
> 10 cycles (reference method) or Tobs of sufficient duration
obs
or synchronization to meet the requirements for repeatability.
'Synchronization' means that the total observation period is
sufficiently close to including an exact integral number of
equipment cycles such that the requirements for repeatability are
met.
T
of sufficient duration to meet the requirements for repeatability.
obs
Full equipment program cycle (reference method) or a
representative 2.5-min period considered by the manufacturer as
the operating period with the highest total harmonic content.
Table 2-2: Harmonics Amendment 14 Test Times
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2.4
The EN 61000-3-2:1998 Standard
This section covers the 1998 standard including amendments 1 and 2. This standard may be used to test
products until January 2004. After this date, only the 2000 revision of the standard including Amendment
14 should be used.
The purpose of enforcing the EN 61000-3-2 standard is to limit the amount of current harmonics produced
by electronic loads. Since harmonic currents caused by a load in turn produce voltage harmonics across
the public utilities impedance, they affect other equipment connected to the same circuit. In fact, most
public utilities exhibit voltage distortion caused by non-linear loads. Because harmonics can have serious
effects on many electrical devices, efforts to set standards to limit their presence date back to the 1930’s.
This resulted in the IEC’s Technical Committee (TC) setting standards dealing with current harmonics as
far back as 1977. These standards became the basis for IEC standards 1000-3-2 and 1000-3-3 adopted in
1993. Because of their long history, many people still refer to these standards as 555.2 and 555.3 although
there are some differences between the older and newer versions and tests performed today should be
done according to the new standards, not the old ones.
Another confusing issue that is rooted in history is the nature of the products that fall under these IEC
norms. While the original 555 specifications focused primarily on consumer products and excluded many
professional and industrial products, the new IEC 1000-3 norms expanded coverage to include all electrical
products with a rated input current up to 16 A rms per phase. Presently, only products with a line input
voltage of 220 V and above are included. Japan and the US are working towards similar requirements that
would cover products that require 100 Volts and up. Due to the original scope of the IEC 555 norms, many
manufacturers are still under the impression that their products are exempt since they are not considered
consumer products. Especially manufacturers of switching power supplies - some of the worst “offenders”
when it comes to generating harmonics currents - have been caught off guard.
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2.4.1 Test Classes
The standard divides products to be tested in to four classes, A, B, C and D. Each class has its own
harmonic current limits. Class A is the default class, meaning if a product does not fall into the categories
for class B, C or D, it is by default class A. The product classes are defined as follows:
Test limits are most stringent for Class-C and Class-D equipment. These classes were established to cover
Class Description
A All motor driven equipment, most “domestic” appliances and
virtually all 3 phase equipment (<16 A rms per phase)
B All portable electric tools
C All lighting products, including dimmers, with an active input
power above 25 Watts.
D Products having a power range from 75 to 600 Watts AND a
current waveform that has a special wave shape.
Table 2-3: EN 61000-3-2 Class Descriptions
the wide range of products that uses “cheap” switching power supplies with a rectifier capacitor input.
These units typically exhibit relatively high odd harmonics. Since this type of supply is so commonly used,
the effect of a large quantity of products like this can add up to significant problems. To limit this effect, the
current harmonic limits for class-D equipment are specified in mA/W instead of an absolute current value
as is done for class A and B. Many consumer and professional devices such as TV’s, VCR’s, stereos,
PC’s, fax machines, printers etc. may fall into the more stringent class D category.
Class-C limits are not specified in absolute values either but rather as a percentage of the fundamental
current. The third harmonic limit is also a function of the power factor so is harder to meet as the power
factor decreases. Neither class C nor D devices have to meet even current harmonics limits.
Since class C and D limits are load dependent, the power level and power factor have to be determined for
each test. In case of fluctuating power levels, it may be necessary to measure the power level during the
test and adjust the limits used to pass or fail the unit under test dynamically.
This dynamic nature of the class C and D limits has resulting in some confusion and a possible problem of
inconsistent test results when using IEC test systems for different vendors. The Standards body working
group for harmonics is in the process of clarifying some of the class and limit issues and these efforts are
likely to result in a revision of classes and limit calculations sometime in the year 2001. Until a new
standard is established, the CTSMXL software maintains a database of test limit values than can be
updated over time if needed without changing the core program.
CTSMXL software makes dynamic classification for Classes A and D. The classification follows the
following principle. If during either a Class A or D test the EUT becomes a Class A device, the EUT will be
considered a Class A device. If the EUT is a Class D device through out the test, then the device is a
Class D device. In other words, Class A is a latching classification. Please note that even though the
classification may change during a test, a Class A (or D) test will still be performed according to Class A (or
D) specification.
2.4.2 Steady State versus Transitory Harmonics
Two types of harmonics testing are called for in the EN 61000-3-2:1998 standard, a quasi steady state and
a transitory one. The transitory harmonics tests allow for equipment that has power demands that vary over
time to temporarily exceed the harmonic current limits by as much as 50 %, as long as such elevated levels
do not occur for more than 10 % of the test period. Since the minimum test time required is 2.5 minutes or
150 seconds, this means the current harmonics can be as high as 150% of the standard limits for no more
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than 15 seconds in any 150 second period. This requirement imposes more demands on the power
analyzer being used than it does on the AC power source.
Steady state harmonics are those exhibited by equipment that has a constant current draw such as a
fluorescent lighting fixture. Many pieces of equipment, such as Laser printers that have a heating element
that kicks in any time a page is printed, have fluctuating power demands and may require transitory
harmonics testing.
Note that Amendment 14 does away with the distinction between stationary and transitory harmonics.
2.4.3 IEC 61000-4-7 Inter Harmonics Evaluation.
IEC61000-3-2 Edition 2.1 (2001-10) references measurement methods per IEC61000-4-7 and Edition 2.0
of this measurement standard specifies the inclusion of inter harmonics. For the assessment of harmonics,
the harmonic and inter-harmonic current levels are grouped to be the sum of squared intermediate lines
between two adjacent harmonics according to the equation below, as visualized also in the accompanying
figure. The resulting harmonic group component of order n (corresponding to the center line in the hatched
area) has the magnitude C (rms value).
2.5
In these equations, “c” is the modulus of the spectral component corresponding to an output bin of the
Fourier Transform of the data obtained from the 200 ms acquisition period , and “C” is the resulting
modulus of the harmonic which is to be compared against the limits in IEC61000-3-2 for the selected test
class.
This inter harmonics measurement is not mandatory as of this writing, as the use of equipment meeting the
previous version of IEC61000-4-7 (the older Edition 1) is permitted for a short period (until the existing
IEC61000-4-7 Edition 2 has gone through its maintenance cycle). Therefore the user has the option to
either disregard inter harmonics, or to group them into the assessment by selecting the appropriate field in
the “Test Category” settings.
It should be noted that selecting this “inter harmonics grouping” has little impact on the measurement
results for the vast majority of products. Only products with active power factor correction AND highly
fluctuating power consumption will produce inter harmonic levels that would add to the level of “C” as given
above. Most products do not produce inter harmonics, and therefore the measured harmonic currents will
be the same either way.
EN 61000-3-3 Flicker
Flicker standards are imposed to limit voltage variations caused by loads connected to the low voltage
supply network that would cause lights connected to the same circuit to flicker. A complex measurement
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approach outlined in IEC 868, was devised to correlate voltage fluctuations to a human perceptibility factor
(P). The EN 61000-3-3 standard sets limits for voltage fluctuations caused by electrical apparatus with a
current level up to 16 Amps per phase. The standard describes a human flicker perceptibility curve that
defines the upper limit for acceptable flicker. This curve plots the percentage of voltage fluctuation against
the amount of voltage fluctuations per minute.
As is the case for the Harmonics standards, the Flicker standard dates back several years and was rooted
in the IEC 555.3 specification. Today however, the EN 61000-3-3 standard should be used to evaluate
equipment. Note that low power equipment generally does not cause Flicker and therefore often can be
exempted from this requirement. The standard permits the equipment manufacturer to prove via analysis
that their products are unlikely to cause voltage fluctuations. This analysis becomes part of a Technical
Construction File (TCF) which in turn may be used to obtain product certification.
2.5.1 EN 61000-3-3 Flicker Test AC Source Requirements
As is the case with Harmonics testing, the IEC 61000-3-3 standard imposes requirements on the AC source
that is used. Some of these requirements are similar and less severe than those imposed under IEC
61000-3-2. For example, total harmonic distortion of the voltage can be 3 % for Flicker testing as opposed
to only 1.25% for harmonics testing. The voltage regulation needs to be better than 2 % which is not
a problem for most AC sources. In rare cases, the line voltage may even be used for this purpose. More
often than not, however, the use of an AC source with well-defined specifications is recommended to obtain
repetitive test data and eliminate the possibility of flicker caused by line fluctuations, not load current
fluctuations. The CTS system uses the MX Series and RS Series power sources, which meets these
requirements.
To simulate the resistance and inductance of the low voltage distribution systems, the IEC 61000-3-3
requires a specific AC source output impedance to be used. This reference impedance, as specified in IEC725, is defined in such a way that it approximates a typical distribution network impedance. Individual
countries may require the use of a different reference impedance that more closely resembles the actual
impedance of that countries’ specific distribution network. Most European countries use the specified
reference impedance value however.
The CTS uses a test impedance with a the impedance values specified in IEC 725. The test impedance is
provided by the OMNI-3-37MX unit, which is connected between the output of the MX/RS power source
and the PACS-3-75 measurement system. Note that this impedance is restricted to 37 A RMS per phase
while the MX power source can deliver more current than that. High power EUT’s should be tested to IEC
61000-3-11 using the OMNI-3-75 instead.
Note that the OMNI-3-37MX test impedance for the CTS system is matched to the California
Instruments’ MX/RS power source output impedance. Do not use third party reference impedance
networks with the CTS system as the combined AC source and network impedance may not match the
IEC 61000-3-3 requirement.
2.5.2 When to Test for EN 61000-3-3
As mentioned, it may not be necessary to test every product for EN 61000-3-3. If it can be shown that
maximum power consumption of the unit under test is low, and the surge current level at turn-on is limited,
it can be shown that the product causes insignificant Flicker levels across the reference impedance. For
loads having an rms current draw of more than 5 Amps, it is generally recommended to verify conformance
to EN 61000-3-3 however.
2.6
EN 61000-4-11p Voltage Dips and Variations
The EN 61000-4-11 is an immunity test for low voltage equipment to ensure reliable operation when
connected to the public distribution system. This test requires an AC source that is capable of generating
specific voltage variations and voltage dips. The unit under test must not sustain any damage from such
occurrences nor cause unsafe conditions.
DEPTH DURATION
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DEPTH DURATION
(Voltage drop in % of
nominal Ut)
10 %o < 30 % 61 66 12 6
30 % < 60 % 8 36 4 1
60 % < 100 % 2 17 3 2
100 % 0 12 24 5
The need to test for immunity of products against voltage dips and interruptions was prompted by studies of
electric utility availability. The results shown in Table 2-4 were found in this study (UNIPEDE study 91 en
50.02). From this data it is clear that most disruptions are short in nature (about 5 to 10 periods) and no
more than 60 % below nominal. Occasionally however, extended periods of complete power loss occur. It is
suggested that this test data also be used as a guide in selecting appropriate test levels.
2.6.1 Why Do You Have to Test?
The EN 61000-4-11 affects a large set of products, specifically; "Electrical and electronic equipment having
a rated input current not exceeding 16 A per phase." Thus, most single and three phase AC powered
equipment used in domestic and light industrial settings fall in this category. In fact, around 95 % of all
electrical equipment in household and light industrial applications, require no more than 16 A per phase. In
Europe, this implies real apparent levels of 230 V * 16 A = 3680 VA, with real power either at the same or a
lower level. Specifically excluded are all DC powered products (battery operated devices) and 400 Hz AC
equipment. (Avionics) These products will be covered in future IEC standards. At this time meeting the EN
61000-4-11 standard is required for most products to obtain the CE Mark, required to market products in
the European Union.
California Instruments’ MXCTS system supports pre-compliance EN 61000-4-11 testing using the MX
series AC power source with the addition of the -411 firmware option. The test sequencer and report
generation for EN 61000-4-11 is provided through the MXGUI Windows→ software. To
accommodate changes in the specification, test levels and duration can be set by the operator or
2.7
loaded from disk if
needed.
EN 61000-4-13 Interharmonics and Harmonics Immunity Test
Table 2-4: Average public utility disturbances per annum in Europe
10 to < 100 ms 100 to < 500
ms
Number of disturbances per year
500 ms to 1
sec
1 sec to > 3
sec
The EN 61000-4-13 is presently only in draft form and the implementation used in the CTS system uses
applies to the first draft of the immunity test specification. The purpose of this test is to verify a EUT’s
immunity to signaling frequencies that may be present on the AC line. These signaling frequencies are not
always harmonically related to the fundamental frequency. As such, this test applies both harmonics and
interharmonic frequencies in addition to the fundamental AC voltage.
The generation of interharmonics requires the addition of an independent signal generator in the MX power
source. (Option -413) If this optional -413 interharmonics generator hardware option is present in the MX,
the EN 61000-4-13 test window will be available from the MXGUI program.
The EN 61000-4-13 draft specification calls out test levels for three product classes, class 2, 3 and X. Class
X involved user defined test levels. Test levels for class 2 and 3 are implemented in the MXGUI while test
levels for class X may be set by the user in the IEC413.413 file.
Note that EN 61000-4-13 is presently only in draft form and as such, hardware and/ or software changes to
this test option may be required at a future date.
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2.8
EN 61000-4-14 Voltage Fluctuations
The EN 61000-4-14 is aimed at testing a product for immunity against voltage fluctuations that can occur
on the public utility. The nature of the voltage fluctuations is different from those tested under EN 61000-411 however. The fluctuations covered in this standard are less severe and involve typical high and low line
conditions.
2.9
California Instruments’ CTS system supports full compliance EN 61000-4-14 testing. The EN 61000-4-14
test is implemented in the MXGUI Windows→ software. To accommodate changes in the specification,
test levels and duration can be changed by the operator or loaded from disk if needed.
EN 61000-4-17 DC Ripple
The EN 61000-4-17 is aimed at testing a DC powered product for immunity against voltage ripple. Ripple is
often caused by feed-through from the AC input section of a DC supply and exhibits itself as a small AC
signal riding on the DC output. The EN 61000-4-17 standards covers test levels and frequencies for testing
the immunity of DC products against such phenomena.
The CTS system supports full compliance EN 61000-4-17 testing The EN 61000-4-17 test is implemented
in the MXGUI Windows→ software. To accommodate changes in the specification, test levels and
duration can be changed by the operator or loaded from disk if needed.
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2.10
EN 61000-4-27p Three Phase Voltage Unbalance
2.11
2.12
Three phase CTS systems support pre-compliance EN 61000-4-27 testing. The EN 61000-4-27 test is
implemented in the MXGUI Windows→ software. To accommodate changes in the specification, test
levels and duration can be changed by the operator or loaded from disk if needed.
EN 61000-4-28 Voltage Frequency Variations
The MXCTS system supports full compliance EN 61000-4-28 testing. The EN 61000-4-28 test is
implemented in the MXGUI Windows→ software. To accommodate changes in the specification, test
levels and duration can be changed by the operator or loaded from disk if needed.
EN 61000-4-29p DC Voltage Dips, Interruptions and Variations
The MXCTS system supports pre-compliance EN 61000-4-29 testing. The EN 61000-4-29 test is
implemented in the MXGUI Windows→ software. To accommodate changes in the specification, test
levels and duration can be changed by the operator or loaded from disk if needed.
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2.13
References
Additional information on IEC norms and requirements may be obtained from the following sources. You
may also check for the latest IEC related information on California Instruments' web site at
www.calinst.com.
Document Number Date of
Publ.
IEC 725 (1981) “Considerations on reference impedances for use in
IEC 868 (1986) “Flicker meter, Functional and design specifications.”
IEC 868 Amendment 1 (1990) “Flicker meter, Functional and design specifications.”
IEC 868-0 (1991) “Part 0: Evaluation of flicker severity.”
EN 61000-3-2 (1995) “Part 3: Limits - Section 2: Limits for harmonic current
Title
determining the disturbance characteristics of household
appliances and similar electrical equipment.”
emissions (equipment input current < 16 A per phase.)”
EN 61000-3-3 (1994) “Part 3: Limits - Section 3: Limitation of voltage fluctuations
and flicker in low-voltage supply systems for equipment
with rated current < 16 A.”
IEC 61000-3-11 2002 “Part 11: Limits - Section 3: Limitation of voltage
fluctuations and flicker in low-voltage supply systems for
equipment with rated current < 75 A.”
IEC 61000-3-12 2005 “Part 12: Limits - Section 2: Limits for harmonic current
emissions (equipment input current < 75 A per phase.)”
EN 61000-4-7 1996 “General guide on harmonics & inter-harmonics” New
version expect early 2002.
Copies of complete IEC standards
may be obtained from at:
International Electrotechnical Commission (IEC)
P.O. Box 131
1211 Geneva 20
Switzerland
Phone: +41 22 919 0300
Fax: +41 22 919 0228
Web: www.iec.ch
or in the USA:
American National Standards Institute (ANSI)
Sales Department
11 West 42nd Street
New York, NY 10036
Phone: +212 642 4900 Fax: +212 302 1286
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3. System Installation
3.1
About This Chapter
This chapter provides information on system installation and covers both the hardware connections that
need to be made between the various components and the software setup. Proper installation of all
hardware components and software modules is required to successfully use the MXCTS system. Some
experience with AC power systems and PC’s running Windows is assumed.
3.2
Hardware Installation
3.2.1 Unpacking
Inspect the unit for any possible shipping damage immediately upon receipt. If damage is evident, notify
the carrier. DO NOT return an instrument to the factory without prior approval. Do not destroy the packing
container until the unit has been inspected for damage in shipment.
3.2.2 AC Source
Refer to the MX Series and RS Series User Manual provided with the AC Source.
The main power requirements for the MXCTS are dictated by the AC power sources used and the power
levels that the Equipment Under Test will demand. Consult the MX Series Power source user manual for
input current and input wiring requirements.
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3.3
PC Requirements
The CTS system requires a PC to operate. The included CTSMXL Software must be installed on a PC
capable or acquiring and processing data in real-time to ensure no-gap acquisition as required by both the
harmonics and flicker test standards.
NOTE: It is recommended to purchase the required PC from California Instruments using the CIC-PC-PCX
option. This ensures a suitable PC with the software pre-installed and tested will be furnished with the
system for turnkey operation. This option also includes a monitor and printer. If this option is not
ordered, the PC to be used with the system should be shipped to California Instruments prior to
delivery for integration and test. In this case, it is the customer’s responsibility to ensure the provided
PC meets the performance criteria outlined below.
The PC requirements will depend to some extend on the following factors:
• The phase mode. Three phase systems require more CPU power than single-phase systems.
• The type of A/D card used. A PCI slot is required.
• The Windows operating system used. Windows NT/2000 and Window XP imposes more overhead
on data transfer than Windows 98SE operating systems. Windows ME is not supported.
From time to time, a newer version of the MXCTSL software may be released. New versions are
tested only with contemporary operating systems. As such, it may be required to upgrade to a
newer operating system to support the latest version of the MXCTSL software. Presently, MXCTSL
1.3.0.0 has been tested only on Windows XP platforms.
• For report generation, a copy of MS Word is required. The MS Word version supported is Word 9.0
(Word 2000). Older versions of MS Word may no longer work when upgrading to the latest
MXCTSL software version. In that case, a newer version of MS Word may have to be installed.
The matrix below shows the required minimum process clock rate. These clock rates apply to either
Celeron, Pentium III, Pentium 4, AMD Athlon and Klamath based PC's. The values shown are minimum
values, not recommended values. To allow future expansion, it may be advisable to plan on using a faster
PC.
Other minimum PC requirements are:
• Windows XP, Windows 2000. Other versions of Windows operating systems are no longer
supported.
• RAM size 512 Mbytes minimum.
• SVGA (800 x 600 resolution, 16 or more colors).
• IDE or SCSI hard disk drive of 20 GByte size or more.
PC Processor speed matrix shown minimum clock speeds, not recommended clock speeds for the PC. A
faster PC can be used. This assumes other applications and/or screen savers that take up processor time
are generally closed.
Table 3-1: PC Pentium/Athlon Processor Clock Speed Requirement
Mode A/D Card Win XP / 2000
Single phase PCI 2.6 GHz
Three phase PCI 3.2 GHz
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3.4
OMNI-3-37MX Unit
The OMNI-3-37MX Zref impedance provides 0.24 + 0.15j Ohms for each phase and 0.16 + 0.10j Ohm for
the neutral. This Zref is required for IEC 61000-3-3 flicker test.
If only an OMNI-3-75 is present, the MX30-3Pi or MX45-3Pi programmable impedance must be used to
increase the required resistive portion of the flicker reference impedance for IEC 61000-3-3 testing. In this
case, either the OMNI-3-75 must be manually controlled or the programmable impedance must be
manually set as the CTSMXL software can only control one impedance type at a time. If the CTSMXL
software is configured to use the OMNI-3-75 control through the MX system interface, the MX30 or MX45
programmable impedance can be set manually while in flicker mode after selecting the test setup but
before clicking on the START button as the front panel will be unlocked at this time. It is important to only
set the Resistive portion of the programmable impedance as the inductive values of the OMNI-3-75 and
OMNI-3-37MX are the same. See 15.6 for differences in impedance values of both OMNI's.
If both OMNI's are present (MXCTSH configurations with optional CTSMXL software added), only one
OMNI can be connected at a time to prevent impedance build-up. A quick disconnect scheme is provided
in this case to allow switching between OMNI units. Refer to Figure 3-8.
Only manual control of the flicker or BYPASS state on the OMNI-3-37MX is supported through the front
panel push button.
3.4.1 Mechanical Installation
The OMNI-3-37MX is contained in a separate 19" wide cabinet with a 5.25" height (3U). This cabinet
should be placed as near the MX-45-3Pi as possible.
The OMNI-3-37MX has its own IEC320 AC power input for bias power. Check the input rating set at the
back of the OMNI-3-37MX chassis. It can be set for either 115V or 230V AC. DO NOT CONNECT if the
input rating is set incorrectly. The setting can be changed by pulling out the fuse holder. The set line input
voltage is shown through the small window on the IEC320 connector.
If the OMNI-3-37MX is installed in an OMNI-3-75 cabinet as part of a CTSHL system, you must first turn on
the power to the OMNI-3-37 using the front panel On/Off rocker switch located at the bottom of the cabinet.
This ensures the OMNI-3-75 is engaged connected the MX output power. Then use the OMNI-3- 37MX
On/Off switch to turn the OMNI-3-37MX on or off. Note that if the OMNI-3-37MX is turned off, it disconnects
the output. For both harmonics and flicker testing, the OMNI-3-37MX must be turned on and placed in
either Bypass (for Harmonics) or Flicker mode using the front panel MODE button.
The OMNI-3-37MX can operate in one of two modes:
Bypass mode This mode is used during harmonics test
Flicker mode This mode is used during flicker test
Note: The OMNI-3-37MX mode is not controlled by the CTSMXL Software. Instead, the OMNI-37MX front
panel control button is enabled to allow manual switching between modes.
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3.4.2 Front Panel Controls
OMNI On/Off
Switch
OMNI-3-75
Manual Mode
Control.
The front panel contains the AC power On/Off switch, the BYPASS or ENGAGE status lights and a manual
MODE switch button. The mode switch button is normally enabled and the OMNI-3-37MX state is
controlled through the use of this button. The “ON “ LED indicates the OMNI-3-37MX module is powered
up.
OMNI-3-75
Connect
Breaker.
OMNI-3-37MX
Connect
Breaker.
The front panel power switch is located on the left hand side of the OMNI-3-37MX cabinet front. There is a
built in delay for engaging or disengaging the contactors when turning the OMNI-3-37MX on and off.
If the OMNI-3-75MX is part of a MXCTSHL system, it will be mounted in the OMNI-3-75 cabinet. In that
case, two circuit breakers will be present. (See illustration above). These are used to connect either OMNI
to the PACS-3-75 input. Close only one breaker at a time. Refer to user manual P/N 7003-972 on
MXCTSHL configuration details.
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