Agilent Technologies 01664-97005 User Manual

Service Guide

Publication number 01664-97005
Second edition, January 2000

For Safety information, Warranties, and Regulatory
information, see the pages at the end of the book.

 Copyright Agilent Technologies 1987–2000

All Rights Reserved.

Agilent Technologies 1664A Logic
Analyzer

Agilent Technologies 1664A Logic Analyzer

The Agilent Technologies 1664A is a 50-MHz State/500-MHz Timing Logic Analyzer.

Features

Some of the main features of the 1664A Logic Analyzer is as follows:

• 32 data channels and 2 clock/data channels

• 3.5-inch disk drive

• Centronix (parallel) interface (with GPIB and RS-232C interfaces available as

options)

• Variable setup/hold time

• 4 kbytes deep memory on all channels with 8 kbytes in half channel mode

• Marker measurements

• 12 levels of trigger sequencing for state and 10 levels of sequential triggering for

timing

• 100 MHz time and number-of-states tagging

• Full programmability (with optional interface)

Service Strategy

The service strategy for this instrument is the replacement of defective assemblies.
This service guide contains information for finding a defective assembly by testing
and servicing the 1664A.

This logic analyzer can be returned to Agilent Technologies for all service work,
including troubleshooting. Contact your nearest Agilent Technologies Sales Office for
more details.

ii

The Agilent Technologies 1664A Logic Analyzer

iii

In This Book

This book is the service guide for the 1664A Logic Analyzers and is divided into eight chapters.

Chapter 1 contains information about the logic analyzer and includes accessories,
specifications and characteristics, and equipment required for servicing.

Chapter 2 tells how to prepare the logic analyzer for use.

Chapter 3 gives instructions on how to test the performance of the logic analyzer.

Chapter 4 contains calibration instructions for the logic analyzer.

Chapter 5 contains self-tests and flowcharts for troubleshooting the logic analyzer.

Chapter 6 tells how to replace assemblies of the logic analyzer and how to return them to
Agilent Technologies.

Chapter 7 lists replaceable parts, shows an exploded view, and gives ordering information.

Chapter 8 explains how the logic analyzer works and what the self-tests are checking.

iv

Table of Contents

1 General Information

Accessories 1–2
Specifications 1–3
Characteristics 1–3
Supplemental Characteristics 1–4
Recommended Test Equipment 1–8

2 Preparing for Use

To inspect the logic analyzer 2–2
Ferrites 2–3
To apply power 2–4
To operate the user interface 2–4
To set the line voltage 2–4
To degauss the display 2–5
To clean the logic analyzer 2–5
To test the logic analyzer 2–5

3 Testing Performance

To perform the self-tests 3–3

To make the test connectors 3–6

To test the threshold accuracy 3–8

Set up the equipment 3–8
Set up the logic analyzer 3–9
Connect the logic analyzer 3–9
Test the TTL threshold 3–10
Test the ECL threshold 3–12
Test the − User threshold 3–13
Test the + User threshold 3–14
Test the 0 V User threshold 3–15
Test the next pod 3–16

To test the glitch capture 3–17

Set up the equipment 3–17
Set up the logic analyzer 3–18
Connect the logic analyzer 3–18
Test the glitch capture on the connected channels 3–20
Test the next channels 3–22

To test the single-clock, single-edge, state acquisition 3–23

Set up the equipment 3–23
Set up the logic analyzer 3–24
Connect the logic analyzer 3–26
Verify the test signal 3–27
Check the setup/hold combination 3–29

v

Contents

To test the multiple-clock, multiple-edge, state acquisition 1–34

Set up the equipment 1–34
Set up the logic analyzer 1–35
Connect the logic analyzer 1–37
Verify the test signal 1–38
Check the setup/hold with single clock edges, multiple clocks 1–40

To test the single-clock, multiple-edge, state acquisition 1–45

Set up the equipment 1–45
Set up the logic analyzer 1–46
Connect the logic analyzer 1–48
Verify the test signal 1–49
Check the setup/hold combination 1–51

To test the time interval accuracy 1–54

Set up the equipment 1–54
Set up the logic analyzer 1–55
Connect the logic analyzer 1–57
Acquire the data 1–58

Performance Test Record 3–59

4 Calibrating and Adjusting

Logic analyzer calibration 4–2
Set up the equipment 4–2

To adjust the CRT monitor alignment 4–3

To adjust the CRT intensity 4–5

5 Troubleshooting

To use the flowcharts 5–2
To check the power-up tests 5–15
To run the self-tests 5–16
To test the power supply voltages 5–21
To test the CRT monitor signals 5–23
To test the keyboard signals 5–24
To test the disk drive voltages 5–25
To perform the BNC test 5–27
To test the logic analyzer probe cables 5–28
To test the auxiliary power 5–32

6 Replacing Assemblies

To remove and replace the handle 6–5
To remove and replace the feet and tilt stand 6–5
To remove and replace the cover 6–5
To remove and replace the disk drive 6–6
To remove and replace the power supply 6–7

vi

To remove and replace the Main Circuit board 6–7
To remove and replace the switch actuator assembly 6–8
To remove and replace the rear panel assembly 6–9
To remove and replace the front panel and keyboard 6–10
To remove and replace the intensity adjustment 6–10
To remove and replace the monitor 6–11
To remove and replace the handle plate 6–11
To remove and replace the fan 6–12
To remove and replace the line filter 6–12
To remove and replace the optional GPIB and RS-232C cables 6–13
To return assemblies 6–14

7 Replaceable Parts

Replaceable Parts Ordering 7–2
Exploded View 7–3
Replaceable Parts List 7–4
Power Cables and Plug Configurations 7–8

Contents

8 Theory of Operation

Block-Level Theory 8–3

The 1664A Logic Analyzer 8–3
The Logic Acquisition Circuitry 8–6

Self-Tests Description 8–9

Power-up Self-Tests 8–9
System Tests (System PV) 8–10
Analyzer Tests (Analy PV) 8–13

GPIB (Optional) 8–15

RS-232C(Optional) 8–16

Centronix 8–17

vii

Contents

viii

1

Accessories 1-2
Specifications 1-3
Characteristics 1-3
Supplemental Characteristics 1-4
Recommended Test Equipment 1-8

General Information

General Information

This chapter lists the accessories, the specifications and characteristics, and the
recommended test equipment.

Accessories

The following accessories are supplied with the 1664A Logic Analyzers.

Accessories Supplied Part Number Qty

Probe tip assemblies 01650-61608 2

Probe cables 16550-61601 1

Grabbers (20 per pack) 5090-4356 2

Probe ground (5 per pack) 5959-9334 2

User’s Reference 01660-90904 1

Accessories Pouch 01660-84501 1

HIL Mouse A2838A 1

Accessories Available

Other accessories available for the 1664A Logic Analyzer are listed in the Accessories for
Agilent Logic Analyzers brochure. The table below lists additional documentation that is

available from your nearest Agilent Technologies sales office for use with your logic analyzer.

Accessories Available Part Number

Demo Training Kit E2433-60007

Programming Reference 01660-90933

Service Guide 01664-97005

1–2

General Information

Specifications

Specifications

The specifications are the performance standards against which the product is tested.

Maximum State Speed 50 MHz

Minimum State Clock Pulse Width

*

Minimum Master to Master Clock Time

Minimum Glitch Width* 3.5 ns
Threshold Accuracy ± (100 mV + 3% of

Setup/Hold Time:

*

Single Clock, Single Edge 0.0/3.5 ns through 3.5/0.0 ns,

Single Clock, Multiple Edges 0.0/4.0 ns through 4.0/0.0 ns,

Multiple Clocks, Multiple Edges 0.0/4.5 ns through 4.5/0.0 ns,

3.5 ns

*

20.0 ns

threshold setting)

adjustable in 500-ps increments

adjustable in 500-ps increments

adjustable in 500-ps increments

* Specified for an input signal VH = -0.9 V, VL = -1.7 V, slew rate = 1 V/ns, and threshold = -1.3 V.

Characteristics

These characteristics are not specifications, but are included as additional information.

Full Channel Half Channel

Maximum State Clock Rate 50 MHz 50 MHz

Maximum Conventional Timing Rate 250 MHz 500 MHz

Maximum Transitional Timing Rate 125 MHz 250 MHz

Maximum Timing with Glitch Rate N/A 125 MHz

Memory Depth 4K 8K

Channel Count: 34 17

* For all modes except glitch.

*

1–3

General Information

Supplemental Characteristics

Supplemental Characteristics

Probes

Input Resistance 100 kΩ, ± 2%

Input Capacitance ~ 8 pF

Minimum Voltage Swing 500 mV, peak-to-peak
Threshold Range ± 6.0 V, adjustable in 50-mV increments

State Analysis

State/Clock Qualifiers 6

Time Tag Resolution

Maximum Time Count
Between States 34 seconds

Maximum State Tag Count

Timing Analysis

Sample Period Accuracy 0.01 % of sample period

Channel-to-Channel Skew 2 ns, typical
Time Interval Accuracy ± [sample period + channel-to-channel skew

*

8 ns or 0.1%, whichever is greater

*

4.29 x 10

9

+(0.01%)(time reading)]

Triggering

Sequencer Speed 125 MHz, maximum

State Sequence Levels 12

Timing Sequence Levels 10

Maximum Occurrence Counter
Value 1,048,575

Pattern Recognizers 10

Maximum Pattern Width 34 channels

Range Recognizers 2

Range Width 32 bits each

Timers 2

Timer Value Range 400 ns to 500 seconds

Glitch/Edge Recognizers 2 (timing only)

Maximum Glitch/Edge Width 34 channels

*Maximum state clock rate with time or state tags on is 50 MHz. When all pods are assigned to a state or timing

machine, time or state tags halve the memory depth.

1–4

General Information

Supplemental Characteristics

Measurement and Display Functions

Displayed Waveforms 24 lines maximum, with scrolling across 96 waveforms.

Measurement Functions

Run/Stop Functions Run starts acquisition of data in specified trace mode.

Stop In single trace mode or the first run of a repetitive acquisition, Stop halts

acquisition and displays the current acquisition data. For subsequent runs in repetitive
mode, Stop halts acquisition of data and does not change the current display.

Trace Mode Single mode acquires data once per trace specification. Repetitive mode
repeats single mode acquisitions until Stop is pressed or until the time interval between
two specified patterns is less than or greater than a specified value, or within or not within
a specified range.

Indicators

Activity Indicators Provided in the Configuration and Format menus for identifying

high, low, or changing states on the inputs.

Markers Two markers (X and O) are shown as vertical dashed lines on the display.

Trigger Displayed as a vertical dashed line in the Timing Waveform display and as line 0

in the State Listing display.

Data Entry/Display

Labels Channels may be grouped together and given a 6-character name. Up to

126 labels in each analyzer may be assigned with up to 32 channels per label.

Display Modes State listing, State Waveforms, Chart, Compare Listing, Compare
Difference Listing, Timing Waveforms, and Timing Listings. State Listing and Timing
Waveforms can be time-correlated on the same displays.

Timing Waveform Pattern readout of timing waveforms at X or O marker.

Bases Binary, Octal, Decimal, Hexadecimal, ASCII (display only), Two’s Complement,

and User-defined symbols.

Symbols 1,000 maximum. Symbols can be downloaded over RS-232 or GPIB.

1–5

General Information

Supplemental Characteristics

Marker Functions

Time Interval The X and O markers measure the time interval between a point on a

timing waveform and the trigger, two points on the same timing waveform, two points on
different waveforms, or two states (time tagging on).

Delta States (state analyzer only) The X and O markers measure the number of
tagged states between one state and trigger or between two states.

Patterns The X and O markers can be used to locate the nth occurrence of a specified
pattern from trigger, or from the beginning of data. The O marker can also find the nth
occurrence of a pattern from the X marker.

Statistics X and O marker statistics are calculated for repetitive acquisitions. Patterns
must be specified for both markers, and statistics are kept only when both patterns can be
found in an acquisition. Statistics are minimum X to O time, maximum X to O time,
average X to O time, and ratio of valid runs to total runs.

Auxiliary Power

Power Through Cables 1/3 amp at 5 V maximum per cable

Operating Environment

Temperature Instrument, 0 °C to 55 °C (+32 °F to 131 °F).

Probe lead sets and cables,
0 °C to 65 °C (+32 °F to 149 °F).

Humidity Instrument, probe lead sets, and cables, up to

95% relative humidity at +40 °C (+122 °F).

Altitude To 4600 m (15,000 ft).

Vibration Operating: Random vibration 5 to 500 Hz,

10 minutes per axis, ≈0.3 g (rms).

Non-operating: Random vibration 5 to 500 Hz,
10 minutes per axis, ≈ 2.41 g (rms);
and swept sine resonant search, 5 to 500 Hz,

0.75 g (0-peak), 5 minute resonant dwell
at 4 resonances per axis.

Dimensions

1–6

General Information

Supplemental Characteristics

Product Regulations

Safety IEC 348

UL 1244
CSA Standard C22.2 No.231 (Series M-89)

EMC This product meets the requirement of the European

Communities (EC) EMC Directive 89/336/EEC.

Emissions EN55011/CSIPR 11 (ISM, Group1,Class A equipment)

SABS RAA Act No. 24(1990)

1

Immunity EN50082-1 Code

Notes
IEC 801-2 (ESD)4kV CD, 8kV AD 2
IEC 801-3 (Rad.) 3V/m 1

2

1

Performance Codes:

IEC 801-4 (EFT) 1kV

1 PASS - Normal operations, no effect.
2 PASS - Temporary degradation, self recoverable.
3 PASS - Temporary degradation, operator intervention required.

4 FAIL - Not recoverable, component damage.

2

Notes: (None)

2

1–7

General Information

Recommended Test Equipment

Recommended Test Equipment

Equipment Required

Equipment Critical Specifications Recommended

Use

Model/Part

Pulse Generator 100 MHz, 3.5 ns pulse width,

Agilent 8131A Option 020 P,T

< 600 ps rise time

Digitizing Oscilloscope
Function Generator

≥ 6 GHz bandwidth, < 58 ps rise time

−6

Accuracy ≤ (5)(10

) × frequency,

Agilent 54121T P
Agilent 3325B Option 002 P

DC offset voltage ±6.3 V
Digital Multimeter 0.1 mV resolution, 0.005% accuracy Agilent 3458A P
BNC-Banana Cable Agilent 11001-60001 P
BNC Tee BNC (m)(f)(f) Agilent 1250-0781 P
Cable BNC (m)(m) 48 inch > 2GHz bandwidth Agilent 8120-1840 P,T
SMA Coax Cable (Qty 3) 18 GHz bandwidth Agilent 8120-4948 P
Adapter (Qty 4) SMA(m)-BNC(f) Agilent 1250-1200 P, T
Adapter SMA(f)-BNC(m) Agilent 1250-2015 P
Coupler (Qty 4) BNC (m)(m) Agilent 1250-0216 P, T
20:1 Probes (Qty 2) Agilent 54006A P
BNC Test Connector, 17x2

**

(Qty 1)
BNC Test Connector, 6x2

**

(Qty 4)

P

P,T

Digitizing Oscilloscope > 100 MHz Bandwidth Agilent 54600A T
BNC Shorting Cap Agilent 1250-0074 T
BNC-Banana Adapter Agilent 1251-2277 T
Light Power Meter United Detector 351 A
Alignment Tool 8710-1300 A

*

*A = Adjustment P = Performance Tests T = Troubleshooting

**Instructions for making these test connectors are in chapter 3, "Testing Performance."

1–8

2

To inspect the logic analyzer 2-2
Ferrites 2-3
To apply power 2-4
To operate the user interface 2-4

To set the line voltage 2-4
To degauss the display 2-5
To clean the logic analyzer 2-5
To test the logic analyzer 2-5

Preparing for Use

Preparing For Use

This chapter gives you instructions for preparing the logic analyzer for use.

Power Requirements

The logic analyzer requires a power source of either 115 Vac or 230 Vac, –22 % to
+10 %, single phase, 48 to 66 Hz, 200 Watts maximum power.

Operating Environment

The operating environment is listed in chapter 1. Note the noncondensing humidity
limitation. Condensation within the instrument can cause poor operation or
malfunction. Provide protection against internal condensation.

The logic analyzer will operate at all specifications within the temperature and
humidity range given in chapter 1. However, reliability is enhanced when operating
the logic analyzer within the following ranges:

• Temperature: +20 °C to +35 °C (+68 °F to +95 °F)

• Humidity: 20% to 80% noncondensing

Storage

Store or ship the logic analyzer in environments within the following limits:

• Temperature: -40 °C to + 75 °C

• Humidity: Up to 90% at 65 °C

• Altitude: Up to 15,300 meters (50,000 feet)

Protect the logic analyzer from temperature extremes which cause condensation on
the instrument.

To inspect the logic analyzer

1 Inspect the shipping container for damage.

If the shipping container or cushioning material is damaged, keep them until you have
checked the contents of the shipment and checked the instrument mechanically and
electrically.

Check the supplied accessories.

2

Accessories supplied with the logic analyzer are listed in "Accessories" in chapter 1.

3 Inspect the product for physical damage.

Check the logic analyzer and the supplied accessories for obvious physical or mechanical
defects. If you find any defects, contact your nearest Agilent Technologies Sales Office.
Arrangements for repair or replacement are made, at Agilent Technologies’ option, without
waiting for a claim settlement.

2–2

Preparing for Use

Ferrites

Ferrites are included in the 1664A accessory pouch for the logic analyzer cable. When
properly installed, the ferrites reduce RFI emissions from the logic analyzer.

In order to ensure compliance of the 1664A Logic Analyzer to the CISPR11 Class A radio
frequency interference (RFI) limits, you must install the ferrite to absorb radio frequency
energy.

Note: Adding or removing the ferrite will not affect the normal operation of the analyzer.

Ferrite Installation Instructions

Use the following steps to install the ferrite on the logic analyzer cable.

Place the ferrite halves and spacer on the logic analyzer cable like a clamshell

1

around the whole cable. The ferrite should be 10 cm (about 4 in) from the the end of
the cable shell as shown.

Ferrites

2 Insert the clamps onto the ends of the ferrites. The locking tab should fit cleanly in

the ferrite grooves.

When properly installed, the ferrite should appear on the logic analyzer cable as shown.

2–3

Preparing for Use

To apply power

To apply power

CAUTION

Electrostatic discharge can damage electronic components. Use grounded wriststraps and
mats when performing any service to the logic analyzer.

1

Check that the line voltage selector, located on the rear panel, is on the correct
setting and the correct fuse is installed.

See also, "To set the line voltage" on this page.

2 Connect the power cord to the instrument and to the power source.

This instrument is equipped with a three-wire power cable. When connected to an
appropriate ac power outlet, this cable grounds the instrument cabinet. The type of power
cable plug shipped with the instrument depends on the country of destination. Refer to
chapter 7, "Replaceable Parts," for option numbers of available power cables and plug
configurations.

Turn on the instrument power switch located on the front panel.

3

To operate the user interface

To select a field on the logic analyzer screen, use the arrow keys to highlight the
field, then press the Select key. For more information about the logic analyzer
interface, refer to the Agilent Technologies 1660 Series Logic Analyzer User’s
Reference.

To set the GPIB address or to configure for RS-232C, refer to the Agilent
Technologies 1660 Series Logic Analyzer User’s Reference.

To set the line voltage

When shipped from the factory, the line voltage selector is set and an appropriate fuse is
installed for operating the instrument in the country of destination. To operate the
instrument from a power source other than the one set, perform the following steps.

2–4

Preparing for Use

To degauss the display

1 Turn the power switch to the Off position, then remove the power cord from the

instrument.

2 Remove the fuse module by carefully prying at the top center of the fuse module

until you can grasp it and pull it out by hand.

3 Reinsert the fuse module with the arrow for the appropriate line voltage aligned

with the arrow on the line filter assembly switch.

4 Reconnect the power cord. Turn on the instrument by setting the power switch to

the On position.

To degauss the display

If the logic analyzer has been subjected to strong magnetic fields, the CRT might
become magnetized and display data might become distorted. To correct this
condition, degauss the CRT with a conventional external television type degaussing
coil.

To clean the logic analyzer

With the instrument turned off and unplugged, use mild soap and water to clean the
front and cabinet of the logic analyzer. Harsh soap might damage the water-base
paint.

To test the logic analyzer

• If you require a test to verify the specifications, start at the beginning of chapter 3,

"Testing Performance."

• If you require a test to initially accept the operation, perform the self-tests in

chapter 3.

• If the logic analyzer does not operate correctly, go to the beginning of chapter 5,

"Troubleshooting."

2–5

2–6

3

To perform the self-tests 3-3
To make the test connectors 3-6
To test the threshold accuracy 3-8
To test the glitch capture 3-17
To test the single-clock, single-edge, state acquisition 3-23
To test the multiple-clock, multiple-edge, state acquisition 3-34
To test the single-clock, multiple-edge, state acquisition 3-45
To test the time interval accuracy 3-54
Performance Test Record 3-59

Testing Performance

Testing Performance

This chapter tells you how to test the performance of the logic analyzer against the
specifications listed in chapter 1. To ensure the logic analyzer is operating as
specified, you perform software tests (self-tests) and manual performance tests on
the analyzer. The logic analyzer is considered performance-verified if all of the
software tests and manual performance tests have passed. The procedures in this
chapter indicate what constitutes a "Pass" status for each of the tests.

The Logic Analyzer Interface

To select a field on the logic analyzer screen, use the arrow keys to highlight the field,
then press the Select key. For more information about the logic analyzer interface,
refer to the Agilent Technologies 1660 Series Logic Analyzer User’s Reference.

Test Strategy

For a complete test, start at the beginning with the software tests and continue
through to the end of the chapter. For an individual test, follow the procedure in the
test. The examples in this chapter were performed using an 1664A.

The performance verification procedures starting on page 3–8 are each shown from
power-up. To exactly duplicate the set-ups in the tests, save the power-up
configuration to a file on a disk, then load that file at the start of each test.

If a test fails, check the test equipment set-up, check the connections, and verify
adequate grounding. If a test still fails, the most probable cause of failure would be
the main circuit board.

Test Interval

Test the performance of the logic analyzer against specifications at two-year intervals
or if it is replaced or repaired.

Performance Test Record

A performance test record for recording the results of each procedure is located at
the end of this chapter. Use the performance test record to gauge the performance
of the logic analyzer over time.

Test Equipment

Each procedure lists the recommended test equipment. You can use equipment that
satisfies the specifications given. However, the procedures are based on using the
recommended model or part number. Before testing the performance of the logic
analyzer, warm-up the instrument and the test equipment for 30 minutes.

3–2

To perform the self-tests

The self-tests verify the correct operation of the logic analyzer. Self-tests can be
performed all at once or one at a time. While testing the performance of the logic
analyzer, run the self-tests all at once.

1 Disconnect all inputs, insert the boot disk, then turn on the power switch. Wait until

the power-up tests are complete.

2 Press the System key. Select the field next to System, then select Test in the pop-up

menu then press the Select key.

3 Select the box labeled Load Test System then press the Select key. Load the disk

containing the performance verification (self-tests) into the disk drive (normally the
same as the boot disk).

4 Select the box labeled Continue and press the Select key.
5 After the test files have been loaded, the Analy PV menu is displayed. Select All

Analyzer Tests.

You can run all tests at one time, except for the Data Input Inspection, by running All
Analyzer Tests. To see more details about each test when troubleshooting failures, you can
run each test individually. This example shows how to run all tests at once.

When the tests finish, the status for each test shows Passed or Failed, and the status
for the All Analyzer Tests changes from Untested to Tested.

6 Select Analy PV, then select Sys PV in the pop-up menu.

3–3

Testing Performance

To perform the self-tests

7 Select the Printer/Controller field next to Sys PV, then select System Test in the

pop-up menu then press the Select key.

8 Install a formatted disk that is not write protected into the disk drive. If the 1664A

has the RS-232C option (020), connect an RS-232C loopback connector onto the
RS-232C port.

9 Select All System Tests.

You can run all tests at one time, except for the Front Panel Test and Display Test, by running
All System Tests. To see more details about each test when troubleshooting failures, you can
run each test individually. This example shows how to run all tests at once.

When the tests finish, the status for each test shows Passed or Failed, and the status for the
All System Tests changes from Untested to Tested. Note that the Front Panel Test and
Display Test remain Untested, and the RS-232C Test will display FAILED if option 020 is not
installed.

Select the Front Panel Test.

10

A screen duplicating the front panel appears on the screen.

a Press each key on the front panel. The corresponding key on the screen will change

from a light to a dark color. Test the knob by turning it in both directions.

b Note any failures, then press the Done key a second time to exit the Front Panel Test.

The status of the test changes from Untested to Tested.

3–4

Testing Performance

To perform the self-tests

11 Select the Display Test.

A white grid pattern is displayed. These display screens are not normally used, but can be
used to adjust the display. Refer to chapter 4, "Calibrating and Adjusting" for display
adjustments.

a Select Continue and the screen changes to full bright.

b Select Continue and the screen changes to half bright.

c Select Continue and the test screen shows the Display Test status changed to Tested.

Record the results of the tests on the performance test record at the end of this

12

chapter.

13 To exit the test system, press the System key, then select Exit Test in the pop-up

menu and press the Select key. Reinstall the disk containing the operating system,
then select Exit Test System and press the Select key.

3–5

To make the test connectors

The test connectors connect the logic analyzer to the test equipment.

Materials Required

Description Recommended Part Qty

BNC (f) Connector Agilent 1250-1032 5
100 Ω 1% resistor

Berg Strip, 17-by-2 1
Berg Strip, 6-by-2 4
20:1 Probe Agilent 54006A 2
Jumper wire

1 Build four test connectors using BNC connectors and 6-by-2 sections of Berg strip.

a Solder a jumper wire to all pins on one side of the Berg strip.

b Solder a jumper wire to all pins on the other side of the Berg strip.

c Solder two resistors to the Berg strip, one at each end between the end pins.

d Solder the center of the BNC connector to the center pin of one row on the Berg strip.

e Solder the ground tab of the BNC connector to the center pin of the other row on the

Berg strip.

f On two of the test connectors, solder a 20:1 probe. The probe ground goes to the

same row of pins on the test connector as the BNC ground tab.

Agilent 0698-7212 8

3–6

Testing Performance

To make the test connectors

2 Build one test connector using a BNC connector and a 17-by-2 section of Berg strip.

a Solder a jumper wire to all pins on one side of the Berg strip.

b Solder a jumper wire to all pins on the other side of the Berg strip.

c Solder the center of the BNC connector to the center pin of one row on the Berg strip.

d Solder the ground tab of the BNC connector to the center pin of the other row on the

Berg strip.

3–7

To test the threshold accuracy

Testing the threshold accuracy verifies the performance of the following specification:

• Clock and data channel threshold accuracy.

These instructions include detailed steps for testing the threshold settings of pod 1.
After testing pod 1, connect and test pod 2. To test pod 2, follow the detailed steps
for pod 1, substituting the pod 2 for pod 1 in the instructions.

Each threshold test tells you to record the voltage reading in the performance test
record located at the end of this chapter. To check if each test passed, verify that the
voltage reading you record is within the limits listed on the performance test record.

Equipment Required

Equipment Critical Specifications Recommended Model/Part

Digital Multimeter 0.1 mV resolution, 0.005% accuracy Agilent 3458A
Function Generator

BNC-Banana Cable Agilent 11001-60001
BNC Tee Agilent 1250-0781
BNC Cable Agilent 8120-1840
BNC Test Connector, 17x2

DC offset voltage ±6.3 V

Agilent 3325B Option 002

Set up the equipment

1 Turn on the equipment required and the logic analyzer. Let them warm up for

30 minutes before beginning the test.

2 Set up the function generator.

a Set up the function generator to provide a DC offset voltage at the Main Signal output.

b Disable any AC voltage to the function generator output, and enable the high voltage

output.

c Monitor the function generator DC output voltage with the multimeter.

3–8