Agilent 8920A Data Sheet

Agilent Technologies 8920A/B RF Communication Test Set
Agilent Technologies 8921A Cell Site Test Set
Assembly Level Repair
Firmware Version 8920A A.14.07 and above 8920B B.01.07 and above 8921A A.14.07 and above
POWER
OFF ON
MAX POWER 60 W
!
CONTINUOUS
SCREEN CONTROL
DATA FUNCTIONS
USER DATA
REF SET
k1’
INCR
k1
: 10
k2’
LO LIMIT HI LIMIT
k2 k3’
CURSOR CONTROL
k3
ASSIGN
k4
RELEASE
k5
SHIFT
CANCEL
!
ANT IN
MAX POWER 200 mW
DUPLEX OUTRF IN/OUT
Agilent Part No. 08920-90168
May 2000
Rev. F
CONFIGHELPMSSG HOLD PRINT
DUPLEXTXRX PREV TESTS
METER
AVG
INCR
INCR X10
SET
PUSH TO SELECT
INSTRUMENT STATE
ADRS
SAVE
LOCAL
RECALL
789
456 123
+
ON/OFF
0
YES
NO
%
ppm
dBµV
W
AUDIO OUTSQUELCHVOLUMEMIC/ACC
MAX
!
12 v Pk
MEAS
PRESET
RESET
ENTER
dB
GHz dBm
%
MHz
V
s
kHz
_
mV
ms Hz
µV
MEMORY
CARD
AUDIO IN
LOHI
MAX
!
42 v Pk
1
Copyright © 2000 Agilent Technologies
Notice Information contained in this document is subject to change without notice.
All Rights Reserved. Reproducti on, adaptation, or translati on without prior written permission is prohibited, except as allowed under the copyright laws.
This material may be reproduced by or for the U.S. Government pursuant to the Copyright License under the clause at DFARS 52.227-7013 (APR 1988).
Agilent Technologies Learning Products Department 24001 E. Mission Liberty Lake, WA 99019-9599 U.S.A.
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Safety Summary The following general safety precautions must be observed during all phases of
operation of this instrument. Failure to comply with these precautions or with specific warnings elsewhere in this manual violates safety standards of design, manufacture, and intended use of the instrument. Agilent Technologies Inc. assumes no liability for the custome r’s failure to comply with thes e requireme nts.
GENERAL
This product is a Safety Class 1 instrument (provided with a protective earth terminal). The protectiv e features of this product may be impaired if it is used in a manner not specified in the operat ion instru ctions.
All Light Emitting Diodes (L EDs) used in this product are Class 1 LEDs as per IEC 60825-1.
This product has been designed and tested in accordance with IEC Publication 1010, "Safety Requirements for Electronic Measuring Apparatus," and has been supplied in a s afe c ondi tion. This instruction documentation cont ai ns information and warnings which must be followed by the user to ensure safe operation and to maintain the product in a safe condition.
ENVIRONMENTAL CONDITIONS
This instrument is intended for indoor use in an installation category II, pollution degree 2 environment. It i s designed to opera te at a maximum relati ve humidity of 95% and at altitudes of up to 2000 meters. Re fer to the s pecificati ons tables f or the ac mains voltage requirements and ambient operating temperature range.
V entilation Requirements: When installing the product in a cabinet, the convection into and out of the product must not be restricted. The ambient temperature (outside the cabin et) must be les s than t he maximum oper atin g temper atu re of t he product by 4° C for every 100 watts dissipated in the cabinet. If the total power dissipated in th e cabi net is great er th an 8 00 watts , then force d con vecti on must b e used.
BEFORE APPLYING POWER
Verify that the product is set to match the available line voltage, the correct fuse is installed, and all safety precautions are taken . Note the instrument's external markings described under Safety Symbols.
3
GROUND THE INSTRUMENT
T o mi nimize s hock hazard , the inst rument chas sis and c over must be connec ted to an electrical protective earth ground. The instrument must be connected to the ac power mains through a grounded power cable, with the ground wire firmly connected to an electrical ground (safety ground) at the power outlet. Any interruption of the protective (grounding) conductor or disconnection of the protective earth terminal will caus e a potential shock haza rd that could result in personal injury.
FUSES
Only fuses with the required rate d current, voltage, and specified type (normal blow , time de lay, etc.) should be use d. Do not use re paired fus es or short -circuit ed fuse holders. To do so could cause a shock or fire hazard.
DO NOT OPERATE IN AN EXPLOSIVE ATMOSPHERE
Do not operate the instrument in the presence of flammable gases or fumes.
DO NOT REMOVE THE INSTRUMENT COVER
Operating personnel mus t not remove in strument cover s. Component repl acement and internal adjustments must be made only by qualified service personnel.
Instruments that appear damaged or defective should be made inoperative and secured against unintended operation until they can be repaired by qualified service personnel.
WARNING: The WARNING sign denotes a hazard. I t calls at tention to a procedure, practice, o r
the like, which, if not correctly performed or adhered to, could result in personal injury. Do not proceed beyond a WARNING sign until the in dicated conditions are fully understood and met.
CAUTION: The CAUTION sign denotes a hazard. It calls attention to an operating procedure, or the
like, which, if not correctly performed or adhered to, could result in damage to or destruction of part or all of the product. Do not proceed beyond a CAUTION sign until the indicated conditions are fully understood and met.
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Safety Symbols
Caution, refer to accompanying documents
Warning, risk of electric shock
Earth (ground) terminal
Alternating current
Frame or chassis terminal
Standby (suppl y). Units with this symbol ar e not completel y disconnect ed from ac mains when this switch is off.
T o completely disconnect the unit from ac mains, either disconnec t the power cord, or have a qualified electrician install an external switch.
Product Markings CE - the CE mark is a registered trademark of the European Community. A CE
mark accompanied by a year indicated the year the design was proven. CSA - the CSA mark is a re gistered trademark of the Canadian Standards
Association.
CERTIFICATION Agilent Tech nol ogi es certifies that this product met it s publ is hed sp ec if ic ations at
the time of shipment fr om the fac tory . Agilent Technologies further cer tifies that it s calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members
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Agilent Technologies 08920 RF Communications Test Set
Duration of Warranty: 1 year
1. Agilent Technologies warrants Agilent Technologies hardware, accessories and
supplies against defects in materials and workmanship for the period specified above. If Agilent Technologies receives notice of such defects during the warranty period, Agilent Technologies will, at its option, either repair or replace products which prove to be defective. Replacement products may be either new or like-new.
2 Agilent Technologies warrants that Agilent Technologies software will not fail to exe-
cute its programming instructions, for the period specified above, due to defects in ma­terial and workmanship when properly installed and used. If Agilent Technologies receives notice of such defects during the warranty period, Agilent Technologies will replace software media which does not execute its programming instructions due to such defects.
3. Agilent Technologies does not warrant that the operation of Agilent Technologies
products will be uninterrupted or error free. If Agilent Technologies is unable, within a reasonable time, to repair or replace any product to a condition as warranted, customer will be entitled to a refund of the purchase price upon prompt return of the product.
4 Agilent Technologies products may contain remanufactured par ts equivalent to new in
performance or may have been subject to incidental use.
5. The warranty period begins on the date of delivery or on the date of installation if
installed by Agilent Technologies. If customer schedules or delays Agilent Technologies installation more than 30 days after delivery, warranty begins on the 31st day from delivery.
6 Warranty does not apply to defects resulting from (a) improper or in adequate mainte-
nance or calibration, (b) software, interfacing, parts or supplies not supplied by Agilent Technologies, (c) unauthorized modification or misuse, (d) operation outside of the published environmental specifications for the product, or (e) improper site preparation or maintenance.
7 TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE WARRANTIES
ARE EXCLUSIVE AND NO OTHER WARRANTYOR CONDITION, WHETHER WRITTEN OR ORAL IS EXPRESSED OR IMPLIED AND AGILENT TECHNOL­OGIES SPECIFICALLY DISCLAIMS ANY IMPLIED WARRANTIES OR CONDI­TIONS OR MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS FOR A PARTICULAR PURPOSE.
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8. Agilent Technologies will be liable for damage to tangible property per incident up to
the greater of $300,000 or the actual amount paid for the product that is the subject of the claim, and for damages for bodily injury or death, to the extent that all such dam­ages are determined by a court of competent jurisdiction to have been directly caused by a defective Agilent Technologies product.
9. TO THE EXTENT ALLOWED BY LOCAL LAW, THE REMEDIES IN THIS
WARRANTY STATEMENT ARE CUSTOMERS SOLE AND EXCLUSIVE REMEDIES. EXCEPT AS INDICATED ABOVE, IN NO EVENT WILL AGILENT TECHNOLOGIES OR ITS SUPPLIERS BE LIABLE FOR LOSS OF DATA OR FOR DIRECT, SPECIAL, INCIDENTAL, CONSEQUENTIAL (INCLUDING LOST PROFIT OR DATA), OR OTHER DAMAGE, WHETHER BASED IN CONTRACT, TORT, OR OTHERWISE.
FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW ZEALAND: THE WARRANTY TERMS CONTAINED IN THIS STATEMENT, EXCEPT TO THE EXTENT LAWFULLY PERMITTED, DO NOT EXCLUDE RESTRICT OR MODIFY AND ARE IN ADDITION TO THE MANDATORY STATUTORY RIGHTS APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU.
ASSISTANCE Product maintenance agreements and other customer assistance agreements are
available for Agilent Technologies products. For any assistance, contact your nearest Agilent Technologies Sales and Service Office.
7
DECLARA TION OF CONFORMITY
according to ISO/IEC Guide 22 and EN 45014
Manufacturer’s Name:
Agilent Technologies
Manufacturers Address:
24001 E. Mission Avenue Liberty Lake, Washington 99019-9599 USA
declares that the product
Product Name: Model Number: Product Options:
CDMA Mobile Station Test Set Agilent Technologies 8920 This declaration covers all options of the above
product.
conforms to the following Product specifications:
Safety: IEC 1010-1:1990+A1+A2/EN 6101 0-1:1 993 EMC: CISPR 11:1990 / EN 55011:1991 Group 1, Class A
EN 500 8 2 - 1 : 199 2 IEC 801-2:1991 - 4 kV CD, 8 kV AD IEC 801-3:1984 - 3V/m IEC 801-4:1988 - 0.5 kV Sig. Lines, 1 kV Power Lines
Supplementary Information:
This is a class A product. In a domestic environment this product may cause radio interference in which case the user may be required to take adequate measures.
This product herewith complies with the requirements of the Low Voltage Directive 73/23/EEC and the EMC Directive 89/336/EEC and carries the CD-marking accordingly
Spokane, Washington USA November 20, 1995 Vince Roland/Quality Manager
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.
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Table 1 Regional Sales Offices
United States of America: Agilent Technologies Test and Measurement Call Center P.O. Box 4026
Englewood, CO 80155-4026
(tel) 1 800 452 4844
Japan:
Agilent T echnologies Japan Ltd. Measurement Assistance Center 9-1 Takakura-Cho, Hachioji-Shi, Tokyo 192-8510, Japan
(tel) (81) 456-56-7832 (fax) (81) 426-56-7840
Asia Pacific:
Agilent Technologies 24/F, Cityplaza One, 111 Kings Road, Taikoo Shing, Hong Kong
Canada: Agilent Technologies Canada Inc. 5150 Spectrum Way Mississauga, Ontario L4W 5G1
(tel) 1 877 894 4414
Latin America:
Agilent Technologies Latin America Region Headquarters 5200 Blue Lagoon Drive, Suite #950 Miami, Florida 33126 U.S. A.
(tel) (305) 267 4245 (fax) (305) 267 4286
Europe: Agilent Technologies European Marketing Organization P.O. Box 999 1180 AZ Amstelveen The Netherlands
(tel) (3120) 547 9999 Australia/New Zealand:
Agilent Technologies Australia Pty Ltd. 347 Burwood Highway Forest Hill, Victoria 3131
Australia (tel) 1 800 629 485 (fax) (61 3) 9272 0749
New Zealand (tel) 0 800 738 378 (fax) (64 4) 802 6881
(tel) (852) 3197 7777 (fax) (852) 2506 9233
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Service and Support
Table 2
Any adjustment, maintenance, or repair of this product must be performed by qualified personnel. Contact your customer engineer through your local Agilent Technologies Service Center. Y ou can find a list of local service representatives on the Web at:
http://www.agilent-tech.com/services/English/index.html If you do not have access to the Internet, one of these cent ers can direct y ou to your
nearest representative:
United States Test and Measurement Call Center (To ll free in US)
Europe
Canada
Japan Measurement Assistance Center
Latin America
Australia/New Zealand
Asia-Pacific
(800) 452-4844
(31 20) 547 9 900
(905) 206-4725
(81) 426 56 7832 |(81) 426 56 7840 (FAX)
(305) 267 4288 (FAX)
1 800 629 485 (Australia) 0800 738 378 (New Zealand)
(852) 2599 7777 (852) 2506 9285 (FAX)
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Manufacturer’s Declaration
This statement is pr ovided t o comply wi th the req uiremen ts of the Ger man Sound Emission Directive, from 18 January 1991.
This product has a sound pressure emission (at the operator position) < 70 dB(A).
Sound Pressure Lp < 70 dB(A).
At Operator Position.
Normal Operation.
According to ISO 7779:1988/EN 27779:1991 (Type Test).
Herstellerbescheinigung
Diese Information steht im Zusammenhang mit den Anforderungen der Maschinenlärminformationsverordnung vom 18 Januar 1991.
Schalldruckpegel Lp < 70 dB(A).
Am Arbeitsplatz.
Normaler Betrieb.
Nach ISO 7779:1988/EN 27779:1991 (Typprüfung).
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Power Cables
Power Cables
Plug Type
Used in the following locations
Peru
Plug Type
Used in the following locations
Switzerland
Plug Descriptions
male/female
Straight/Straight 8120-0698 90 inches, black
Plug Descriptions
male/female
Straight/Straight Straight/90°
Part #
(cable & plug)
Part #
(cable & p lug)
8120-2104 8120-2296
Cable Descriptions
Cable Descriptions
79 inches, gray 79 inches, gray
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Power Cables
Power Cables
Plug Type
Used in the following locations
Afghanistan, Albania, Algeria, Angola, Armenia,Austria, Azerbaijan, Azores Bangladesh, Belgium, Benin, Bolivia,Boznia-Herzegovina, Bulgaria, Burkina Faso, Burma, Burundi,Bye lar us Cameroon, Canary Islands, Central AfricanRepublic, Chad, Chile, Comoros, Congo, Croatia, Czech Republic,Czechoslovakia Denmark, Djibouti East Germany, Egypt, Estonia, Ethiopia Finland, France, French Guiana, French IndianOcean Areas Gabon, Gaza Strip, Georgia, Germany, Gozo, Greece Hungary Iceland, Indonesia, Iran, Iraq, Israel, Italy,Ivory Coast Jordan Kazakhstan, Korea, Kyrgystan Latvia, Lebanon, Libya, Lithuania, Luxembourg Macedonia, Madeira Islands, Malagasy Republic,Mali, Malta, Mauritania, Miquelon, Moldova, Mongolia, Morocco,Mozambique Nepal, Netherlands, Netherlands Antilles, Niger,Norway Oman Pakistan, Pa ra guay , Po l a nd, Portugal Rep. South Africa, Romania, Russia, Rwanda Saudi Arabia (220V), Senegal, Slovak Republic,Slovenia, Somalia, Spain, Spanish Africa, Sri Lanka, St. Pierre Islands Sweden, Syria Tajikistan, Thailand, Togo, Tunisia, Turkey,Turkmenistan USSR, Ukraine, Uzbekistan Western Africa, Western Sahara Yugoslavia Zaire
Plug Descriptions
male/female
Straight/Straight Straight/90°
Part #
(cable & plug)
8120-1689 8120-1692
Cable Descriptions
79 inches, mint gray 79 inches, mint gray
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Power Cables
Plug Type
Used in the following locations
Peru
Plug Type
Used in the following locations
Switzerland
Plug Descriptions
male/female
Straight/Straight 8120-0698 90 inches, black
Plug Descriptions
male/female
Straight/Straight Straight/90°
Part #
(cable & plug)
Part #
(cable & p lug)
8120-2104 8120-2296
Cable Descriptions
Cable Descriptions
79 inches, gray 79 inches, gray
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Power Cables
125V
Plug Type
Plug Descriptions
male/female
Straight/Straight Straight/90° Straight/Straight
Part #
(cable & plug)
8120-1378 8120-1521 8120-1751
Used in the following locations
American Samoa Bahamas, Barbados, Belize, Bermuda, Brazil, Caicos, Cambodia, Canada, Cayman Islands,Columbia, Costa Rica, Cuba Dominican Republic Ecuador, El Salvador French West Indies Guam, Guatemala, Guyana Haiti, Honduras Jamaica Korea Laos, Leeward and Windward Is., Liberia Mexico, Midway Islands Nicaragua Other Pacific Islands Panama, Philippines, Puerto Rico Saudi Arabia (115V,127V), Suriname Taiwan, Tobago, Trinidad, Trust Territories ofPacific Islands Turks Island United States Venezuela, Vietnam, Virgin Islands of the US Wake Island
Cable Descriptions
90 inches, jade gray 90 inches, jade gray 90 inches, jade gray
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Power Cables
JIS C 8303, 100 V
Plug Type
Used in the following locations
Japan
Plug Type
Used in the following locations
Denmark Greenland
Plug Descriptions
male/female
Straight/Straight Straight/90°
Plug
Descriptions
male/female
90°/Straight 90°/90° Straight/Straight
Part #
(cable & plug)
8120-4753 8120-4754
Part #
(cable & plug)
8120-2956 8120-2957 8120-3997
Cable Descriptions
90 inches, dark gray 90 inches, dark gray
Cable Descriptions
79 inches, gray 79 inches, gray 79 inches, gray
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Power Cables
Plug Type
Plug Descriptions
male/female
Straig ht /Straight Straight/90°
Used in the following locations
Botswana India Lesotho Malawi South-West Africa (Namibia), Swaziland Zambia, Zimbabwe
Plug Type
Plug Descriptions
male/female
Straight/Straight Straight/Straight Straight/90° Straight/90°
Part #
(cable & plug)
8120-4211 8120-4600
Part #
(cable & plug)
8120-1860 8120-1575 8120-2191 8120-4379
Cable Descriptions
79 inches, mint gray 79 inches, mint gray
Cable Descriptions
60 inches, jade gray 30 inches, jade gray 60 inches, jade gray
15.5 inches, jade gray
Used in the following locations
System Cabinets
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Power Cables
Plug
Plug Type (Male)
Used in the following locations
Bahrain, British Indian Ocean Terr., Brunei Canton, Cyprus Enderbury Island, Equatorial Guinea Falkland Islands, French Pacific Islands Gambia, Ghana, Gibraltar, Guinea Hong Kong Ireland Kenya, Kuwait Macao, Malaysia, Mauritius Nigeria Qatar Seychelles, Sierra Leone, Singapore, SouthernAsia, Southern Pacific Islands, St. Helena, Sudan Tanzania Uganda, United Arab Emirates, United Kingdom Yeman (Aden & Sana)
Descriptions
male/female
90°/Straight 90°/90°
Part # (cable&
plug)
8120-1351 8120-1703
Cable Descriptions
90 inches, mint gray 90 inches, mint gray
Plug Type
Used in the following locations
Argentina, Australia China (Peoples Republic) New Zealand Papua New Guinea Uruguay Western Samoa
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Plug Descriptions
male/female
Straight/Straight Straight/90°
Part #
(cable & p lug)
8120-1369 8120-0696
Cable Descriptions
79 inches, gray 80 inches, gray
Power Cables
This instrument was constructed in as ESD (electro-static discharge) protected environment. This is because most of the semi-conductor devices used in this instrument are susceptible to damage by static discharge.
ATTENTION
Static Sensitive
Devices
Depending on the magnitude of the charge, device substrates can punctured or destroyed by contact or mere proximity of a static charge. The result can caused degradation of device performance, ea rl y failure, or immediate destruction.
These charges are generated in numerous ways such as simple contact, separation of materials, and normal motions of persons working with static sensitive devices.
When handling or servicing equip ment containin g static sen sitive devices, adequate pr ecauti ons must be taken to prevent device damage or destruction.
Only those who are thoroughly familiar with industry accepted techniques for handling static sensitive devices should attempt to service circuitry with these devices.
In all instances, measures must be taken to prevent static charge build-up on work surfaces and persons handling the devices.
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Contents
1. Introduction
Conventions Used 34 Test Set Description 36 Troubleshooting 38 Repair Process 39 Calibration 40 Service Tools, Equipment and Documentation 41 Self-Support Information 42 Support Contacts 43 Hardware and Firmware Enhancements 44
2. Troubleshooting
Four Basic Steps In Troubleshooting the Test Set 47 More About Step 2 - Run the Self-Test Diagnostic 53 More About Step 3 - Run the Functional Diagnostics 55
3. Repair
Introduction 68 Downloading Calibration Data 69 Troubleshooting Aids for Assemblies 70 Disassembly and Replacement Procedures 74 A23 RF Input Assembly 77 A1 Front Panel (includes keyboard) 79 A11 Receiver Mixer 81 A10 Power Supply Regulator 83 A9 Power Supply 85 A25 Motherboard 87 Fan 89 High-Power Attenuator 91 A20 Display (CRT) 93 A7 Controller 94 A8 Memory Assembly 95
4. P reventative Maintenance
Hardware Maintenance 98 Firmware and Memory Assembly Maintenance 102
5. Calibration
Introduction 104 Performance Tests 116 RF Gen AM Distortion Performance Test 1 121
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Contents
RF Gen AM Accuracy Performance Test 2 123 RF Gen AM Flatness Performance Test 3 125 RF Gen FM Distortion Performance Test 4 127 RF Gen FM Accuracy Performance Test 5 129 RF Gen FM Flatness Performance Test 6 131 RF Gen Residual FM Performance Test 7 133 RF Gen Duplex Output High Level Accuracy Performance Test 8 136 RF Gen Duplex Output Low Level Accuracy Performance Test 9 138 RF Gen RF IN/OUT Level Accuracy Performance Test 10 141 RF Gen Harmonics Spectral Purity Performance Test 11 143 RF Gen Spurious Spectral Purity Performance Test 12 145 AF Gen AC Level Accuracy Performance Test 13 147 AF Gen DC Level Accuracy Performance Test 14 149 AF Gen Residual Distortion Performance Test 15 151 AF Gen Frequency Accuracy Performance Test 16 153 AF Analyzer AC Voltage Accuracy Performance Test 17 155 AF Analyzer Residual Noise Performance Test 18 157 AF Analyzer Distortion and SINAD Accuracy Performance Test 19 159 AF Analyzer DC Level Accuracy Performance Test 20 161 AF Analyzer Frequency Accuracy to 100 kHz Performance Test 21 163 AF Analyzer Frequency Accuracy at 400 kHz Performance Test 22 165
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Contents
Oscilloscope Performance Test 23 167 RF Analyzer Level Accuracy Performance Test 24 169 RF Analyzer AM Accuracy Performance Test 25 174 RF Analyzer AM Distortion Performance Test 26 177 RF Analyzer Residual AM Performance Test 27 181 RF Analyzer FM Accuracy Performance Test 28 183 RF Analyzer FM Distortion Performance Test 29 186 RF Analyzer FM Bandwidth Performance Test 30 190 RF Analyzer Residual FM Performance Test 31 194 RF Analyzer SSB Demodulation Performance Test 32 196 Spectrum Analyzer Image Rejection Performance Test 33 201
6. Performance Test Records
8920A Performance Test Record 206 8920A RF Gen AM Distortion Performance Test 1 207 8920A RF Gen AM Accuracy Performance Test 2 209 8920A RF Gen AM Flatness Performance Test 3 211 8920A RF Gen FM Distortion Performance Test 4 212 8920A RF Gen FM Accuracy Performance Test 5 214 8920A RF Gen FM Flatness
23
Contents
Performance Test 6 216 8920A RF Gen Residual FM Performance Test 7 217 8920A RF Gen Duplex Output High Level Accuracy Performance Test 8 219 8920A RF Gen Duplex Output Low Level Accuracy Performance Test 9 221 8920A RF Gen RF IN/OUT Level Accuracy Performance Test 10 227 8920A RF Gen Harmonics Spectral Purity Performance Test 11 230 8920A RF Gen Spurious Spectral Purity Performance Test 12 234 8920A AF Gen AC Level Accuracy Performance Test 13 236 8920A AF Gen DC Level Accuracy Performance Test 14 238 8920A AF Gen Residual Distortion Performance Test 15 239 8920A AF Gen Frequency Accuracy Performance Test 16 241 8920A AF Analyzer AC Voltage Accuracy Performance Test 17 242 8920A AF Analyzer Residual Noise Performance Test 18 243 8920A AF Analyzer Distortion and SINAD Accuracy Performance Test 19 244 8920A AF Analyzer DC Level Accuracy
24
Contents
Performance Test 20 245 8920A AF Analyzer Frequency Accuracy to 100 kHz Performance Test 21 246 8920A AF Analyzer Frequency Accuracy at 400 kHz Performance Test 22 247 8920A Oscilloscope Performance Test 23 248 8920A RF Analyzer Level Accuracy Performance Test 24 249 8920A RF Analyzer AM Accuracy Performance Test 25 250 8920A RF Analyzer AM Distortion Performance Test 26 252 8920A RF Analyzer Residual AM Performance Test 27 253 8920A RF Analyzer FM Accuracy Performance Test 28 254 8920A RF Analyzer FM Distortion Performance Test 29 255 8920A RF Analyzer FM Bandwidth Performance Test 30 256 8920A RF Analyzer Residual FM Performance Test 31 257 8920A RF Analyzer SSB Demodulation Performance Test 32 258 8920A Spectrum Analyzer Image Rejection Performance Test 33 259 8920B Performance Test Record 261 8920B
25
Contents
RF Gen AM Distortion Performance Test 1 262 8920B RF Gen AM Accuracy Performance Test 2 264 8920B RF Gen AM Flatness Performance Test 3 266 8920B RF Gen FM Distortion Performance Test 4 267 8920B RF Gen FM Accuracy Performance Test 5 269 8920B RF Gen FM Flatness Performance Test 6 271 8920B RF Gen Residual FM Performance Test 7 272 8920B RF Gen Duplex Output High Level Accuracy Performance Test 8 274 8920B RF Gen Duplex Output Low Level Accuracy Performance Test 9 276 8920B RF Gen RF IN/OUT Level Accuracy Performance Test 10 281 8920B RF Gen Harmonics Spectral Purity Performance Test 11 283 8920B RF Gen Spurious Spectral Purity Performance Test 12 286 8920B AF Gen AC Level Accuracy Performance Test 13 288 8920B AF Gen DC Level Accuracy Performance Test 14 290 8920B
26
Contents
AF Gen Residual Distortion Performance Test 15 291 8920B AF Gen Frequency Accuracy Performance Test 16 293 8920B AF Analyzer AC Voltage Accuracy Performance Test 17 294 8920B AF Analyzer Residual Noise Performance Test 18 295 8920B AF Analyzer Distortion and SINAD Accuracy Performance Test 19 296 8920B AF Analyzer DC Level Accuracy Performance Test 20 297 8920B AF Analyzer Frequency Accuracy to 100 kHz Performance Test 21 298 8920B AF Analyzer Frequency Accuracy at 400 kHz Performance Test 22 299 8920B Oscilloscope Performance Test 23 300 8920B RF Analyzer Level Accuracy Performance Test 24 301 8920B RF Analyzer AM Accuracy Performance Test 25 302 8920B RF Analyzer AM Distortion Performance Test 26 304 8920B RF Analyzer Residual AM Performance Test 27 305 8920B RF Analyzer FM Accuracy Performance Test 28 306 8920B
27
Contents
RF Analyzer FM Distortion Performance Test 29 307 8920B RF Analyzer FM Bandwidth Performance Test 30 308 8920B RF Analyzer Residual FM Performance Test 31 309 8920B RF Analyzer SSB Demodulation Performance Test 32 310 8920B Spectrum Analyzer Image Rejection Performance Test 33 311 8921A Performance Test Record 312 8921A RF Gen FM Distortion Performance Test 4 313 8921A RF Gen FM Accuracy Performance Test 5 315 8921A RF Gen FM Flatness Performance Test 6 317 8921A RF Gen Residual FM Performance Test 7 318 8921A RF Gen Duplex Output High Level Accuracy Performance Test 8 320 8921A RF Gen Duplex Output Low Level Accuracy Performance Test 9 322 8921A RF Gen RF IN/OUT Level Accuracy Performance Test 10 328 8921A RF Gen Harmonics Spectral Purity Performance Test 11 331 8921A RF Gen Spurious Spectral Purity Performance Test 12 335
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Contents
8921A AF Gen AC Level Accuracy Performance Test 13 337 8921A AF Gen DC Level Accuracy Performance Test 14 339 8921A AF Gen Residual Distortion Performance Test 15 340 8921A AF Gen Frequency Accuracy Performance Test 16 342 8921A AF Analyzer AC Voltage Accuracy Performance Test 17 343 8921A AF Analyzer Residual Noise Performance Test 18 344 8921A AF Analyzer Distortion and SINAD Accuracy Performance Test 19 345 8921A AF Analyzer DC Level Accuracy Performance Test 20 346 8921A AF Analyzer Frequency Accuracy to 100 kHz Performance Test 21 347 8921A AF Analyzer Frequency Accuracy at 400 kHz Performance Test 22 348 8921A Oscilloscope Performance Test 23 349 8921A RF Analyzer Level Accuracy Performance Test 24 350 8921A RF Analyzer FM Accuracy Performance Test 28 351 8921A RF Analyzer FM Distortion Performance Test 29 352
29
Contents
8921A RF Analyzer FM Bandwidth Performance Test 30 353 8921A RF Analyzer Residual FM Performance Test 31 354 8921A RF Analyzer SSB Demodulation Performance Test 32 355 8921A Spectrum Analyzer Image Rejection Performance Test 33 356
7. Specifications
8920A 361 Signal Generator Specifications 362 Audio Source Specifications 367 RF Analyzer Specifications 368 AF Analyzer Specifications 372 Oscilloscope Specifications 375 Spectrum Analyzer Specifications (Option 102) 376 Signaling (Option 004) 379 DC Current Meter (Option 103) 380 Remote Programming (Option 103) 381 Reference Oscillator Specifications 382 Save/Recall Registers 383 General Specifications 384 8920B 385 8920B Specifications 386 8921A 427 Signal Generator Specifications 428 Audio Source Specifications 431 RF Analyzer Specifications 432 AF Analyzer Specifications 434 Oscilloscope Specifications 436 Spectrum Analyzer Specifications 437 Signaling 440 DC Current Meter 441 Remote Programming 442 Save/Recall Registers 443 General Specifications 444
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Contents
8. Service Screen
Introduction 446
9. Block Diagrams
Introduction 452
10. Replaceable Parts
Introduction 522 Self-Support Program 523 8920A Replaceable Parts List 525 8920B Replaceable Parts List 546 8921A Replaceable Parts List 567
11. Diagnostics Descriptions
Description Of Self-Test Diagnostic 588 Description Of Audio Diagnostics (AF_DIAGS) 596 Description Of RF Diagnostics (RF_DIAGS) 631 Description Of Miscellaneous Diagnostics (MS_DIAGS) 654
31
Contents
32
1

Introduction

This manual tells how to service the Agilent Technologies 8920A and 8920B RF Communications Test Sets and the 8921A Cell Site Test Set.
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Chapter 1, Introduction

Conventions Used

Conventions Used
Throughout this manual the 8920A, 8920B and 8921A will be referred to as the T est Set u nle ss ref erence t o a spe cifi c model number i s requi red. Al so, thr oughout this manual a Test Set with a Digital Cellular Adapter (such as an 83204A, 83205A or 83206A) attached to it will be ref er re d to as t he Test System.
34
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Manual Contents
Chapter 1, Introduction
Conventions Used
This manual includes:
Procedures
Troubleshooting
Repair
Preventative Maintenance
Calibration
Performance Tests
Reference
Specifications
Service Screen
Block Diagrams
Replaceable Parts
Diagnostic s De scriptions
Error Messages
The Repair section inc lu des cal ibration downloading and disassembly procedure s. Calibration includes periodic calibration and performance tests. The Block Diagram section includes block diagrams, theory of operation, I/O signal descriptions, and power supply voltage distribution information.
35
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Chapter 1, Introduction
Test Set Description
Test Set Description
The Test Set integrates twenty-two complete instruments in one box. It is designed to meet the communication t est nee ds of bot h servi ce and man ufa cturi ng, of fe ring the functionality needed to test analog and digital (when used with a Cellular Adapter) communications systems such as land mobile radios and dual-mode cellular phones. Some of the instruments in the Test Set (some may be optional) include:
Synthesized AM and FM signal generator
AM and FM Modulation analyzer
Duplex offset ge nerator
SSB demodulator
RF power meter
Audio and RF frequency counter and RF frequency error meter
AC and DC voltmeter
Distortion, SINAD, and signal-to-noise- rat i o meters
Two variable audio sources
Oscilloscope
Spectrum analyzer and tracking generator (optional in some Test Sets)
Signaling encoder and decoder (optional in some Test Sets)
DC current meter (optional in so me Test Sets)
36
The Test Set contains approximately twenty-five replaceable assemblies. Most assemblies are plug-in printed-circuit boards. Several of the internal instruments are implemented all or in part by digital techniques.
All instrument functions are internally controlled by a microprocessor, which also interfaces with external inputs. The Test Set can be part of an externally­controlled system or the Test Set itself can function as the controller for a system. IBASIC is built into the Test Set.
When a Cellular Adapter is attached to the top of the Test Set to form a Test System, the Test Set acts as an RF source and analyzer for the Cellular Adapter which modulates and demodulates the signal according to the format of the cellular system it simulates. The d i agnostics for testing the Cellular Adapter (th e top box) reside in the Test Set (the bottom box, the host controller); therefore, the Test Set must have firmware compatible with the Cellular Adapter.
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Chapter 1, Introduction
Test Set Description
Digital Cellular Adapter
Digital Control Assemblies
s1
,+,V
Measurement
Control I/O
Knob and Keystrokes
T est Set
Controller
DUPLEX
TX TEST
Displays
Controls
RX TEST
Screens
Sig Gen Synthesizer
Receiver
Mod Distribution
Audio Analyzer 1
Figure 1 Test Set Description
37
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RF Assemblies AF Assemblies
Measurements
Chapter 1, Introduction
Troubleshooting
Troubleshooting
You can repair the Test Set yourself or send it to your local Agilent Technologies sales and service of fi ce. Before starting a repair, you should become familiar with basic Test Set (or Test System) operation. Refer to the applicable Users Guide.
The troubleshooting documented in this manual is centered around built-in diagnostics. Because the diagnostic results may be ambiguous, further interpretation and testing may be required. There are three categories of diagnostics built into the Test Set:
Power-up self-test diagnostics to test contr oller functioning
Internal RF (Radio Frequency) and AF (Audio Frequency) circuits diagnostics
Diagnostics for the Cellular Adapter (i f appro priate)
Troubleshooting hints in this manual include:
Instructions on how to begin troubleshooting (see chapter 2, "Troubleshooting")
Block diagrams and theory of operation (see chapter 9, "Block Diagrams")
Detailed information about the built-in diagnostics (see chapter 11, "Diagnostics
Descriptions")
Error message explanations (see "General Information About Error Messages" on
page 660)
Instructions for troubleshooting Cellular Adapters are found in the Cellular Adapters Assembly Level Repair manual.
38
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Repair Process
Chapter 1, Introduction
Repair Process
Repairing the Test Set consists of:
Identifying the faulty instrument in the case of a Test System, (see chapter 2,
"Troubleshooting" )
Identifying the faulty assembly if the fault is in the Test Set, (see chapter 2,
"Troubleshooting")
Ordering a replacement assembly (see chapter 10, "Replaceable Parts")
Replacing the faulty assembly (see chapter 3, "Repair")
Downloading calibration data (see chapter 3, "Repair")
Perfor ming periodic calibration (see chapter 5, "Calibration")
Verifying Test Set performance (see chapter 5, "Calibration")
39
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Chapter 1, Introduction
Calibration
Calibration
The Test Set periodicall y requires some maintenance to assure that it me ets its published specifications. Periodic calibration consists of running several built-in calibration programs. An external frequency standard and dc voltmeter are required. There are no screwdriver-type adjustments in the Test Set.
Run the Performance Tests at least once every two years. Run the Periodic Calibration procedures at least every two years (
see chapter 5, "Calibration").
Cellular Adapters may also require periodic calibration. See the Cellular Adapters Assembly Level Repair manual for details.
Several assemblies, when replaced, require running specific periodic calibration procedures to create calibration factors for that assembly. In other cases, the calibration data will be included with the replacement assembly on a memory card. Instructions that come with the replacement assembly explain how to download the calibr ation data. ( This is not cons idered part of periodic cali bration. )
NOTE: When troubleshooting the Test Set, it is sometimes desirable to swap a known-good assembly
(from another Test Set) for a suspected-faulty assembly. If the swapped assembly requires calibration data, most assemblies will operate well enough with the original assembly’s calibration data to troubleshoot and run the diagnostics. However, do not expect the Test Set to meet its specifications and note that some assemblies may appear to fail becaus e of incorrect calibration data. For more details see "Step 4 - Verify Test Set Functioning," in chapter 2,
on page 52.
40
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Service Tools, Equipment and Documentation

Service Tools, Equipment and Documentation
Chapter 1, Introduction
41
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Chapter 1, Introduction
Service Tools, Equipment and Documentation
Tools
One or more of the foll owin g to ols may be required to acce ss a nd r emove various internal as semblies wi thin the Test Set.
TX-10 Torx screwdriver
TX-15 Torx screwdriver
Flat blade screwdriver
4-mm allen wrench
7-mm socket wrench
1/16-inch allen wrench
3/16-inch socket wrench
5/16-inch open -end wrenc h
42
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Equipment
Chapter 1, Introduction
Service Tools, Equipment and Documentation
One or more of the following pieces of test equipment may be required to service various internal assemblies within the Test Set.
Frequency Standard or Electronic Counter (see chapter 5, "Calibration")
DC Voltmeter (see chapter 5, "Calibration")
RF Assembly Extender Board: P/N 08920-60137 (see chapter 5, "Calibration")
43
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Chapter 1, Introduction
Service Tools, Equipment and Documentation
Documentation
This manual is part of a set consisting of the following manuals:
Users Guide
Programmers Guide
IBASIC Reference
Assembly Level Repair
44
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Self-Support Information

For U.S. customers that wish to repair their own Test Sets, a special toll-fre e number (1 800 827 3848) is available for hardware troubleshooting assistance. This is a special service specifically designed for customers that repair their own Test Sets. For a Test Set under warranty, there is no charge for troubleshooting assistance, and repair parts covered under warranty will be sent directly to the customer. If the Test Set is out of warranty, there will be a charge for parts.
The documentation suppli ed wi th yo ur t est set is an excellent source of reference, applications, and service information. Please use these manuals if you are experiencing technical problems.
If you have used the manuals and still have application questions, contact your local Agilent Technologies Sales Representative.
Chapter 1, Introduction
Self-Support Information
Repair assistance is available from the factory by phone and e-mail. Parts information is also avai lable from A gilent Technologies.
When calling for repair assistance, please have the following information ready:
Instrument model number (892nX).
Instrument Serial Number (tag located on the rear panel).
Installed options - if any (tag located on the rear panel).
Instrument firmware revision (displayed at the top of the screen when the Test Set is
powered up, and is also displayed on the CONFIGURE screen).
45
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Chapter 1, Introduction
Support Contacts
Support Contacts
Troubleshooting and application assistance is available for the Test Set from the factory by phone and e-mail. Internal Agilent Technologies users can contact the factory through Desk. Parts information is also available from Agilent Technologies.
Telephone 1 800 827 3848 (RF Comms Service Assistance, U.S. only)
1 509 921 3848 (RF Comms Service Assistance, International) 1 800 922 8920 (RF Comms Applications Assistance, U.S. only) 1 800 227 8164 (Direct Parts Ordering, U.S. only) 1 800 403 0801 (Agilent Instrument Support Center, U.S. only) 1 916 783 0804 (Service Parts Identification, U.S. & Intl.)
Electronic mail (Internet): spokane_service@agilent.com
46
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Hardware and Firmware Enhancements
The hardware and firmwar e of thes e Test Sets are being enha nce d on a cont inuous basis. Some hardware for these products can be upgraded by ordering specific retrofit kits (r efer to t he speci fic User’s Guide for your Test Set). The firmware for these T e st Sets ha s gone throu gh several revisio ns to improve performanc e and fix problems. It is recommended that the firmware be upgraded to the latest revision whenever a Test Set is repaired or a performance problem is found. This is important if an assembly-level repair is performed because exchange assemblies, which may be of a later revision than the one being replaced, may require a later revision of the firmwar e to function correctly.
Chapter 1, Introduction
Hardware and Firmware Enhancements
47
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Chapter 1, Introduction
Hardware and Firmware Enhancements
48
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2

Troubleshooting

This chapter tells how to troubleshoot the Test Set to isolate a problem to the defective assembly.
45
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Chapter 2, Troubleshooting
The troubleshooting is centered around the built-in diagnostics. Because the built­in diagnost ics may be unable to pin point the assembly causing the failure, this manual contains supplementary information in the form of detailed diagnostics descriptions ( suggestions for further manual troubleshooting.
The Test Set may be part of a Test System, that is, it may have a Cellular Adapter attached to it. You should disable the Cellular Adapter before troubleshooting the Test Set. If you suspect that the Cellular Adapter is faulty, it is recommended that you still verify the operation of the Test Set and then troubleshoot the Cellular Adapter using its own documentation.
see chapter 11, "Diagnostics Descriptions") procedures, and
46
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Four Basic Steps In Troubleshooting the Test Set

Four Basic Steps In Troubleshooting the Test Set
The following steps are rec ommende d as an ef fi cient way to troub leshoo t th e Test Set. It is advisable to document the outcome of each of these steps before contacting Agilent Technologies for service assistance. The four steps are summarized as follows:
Step 1 - Disable the Cellular Adapter T o troubleshoot the Test Set (bottom box), it is essential to isolate it from any Cellular
Adapter (top box) that may be attached. Step 2 - Run the Self-Test Diagnostic On power-up, the Test Set runs a Self-Test Diagnostic. Most of the Test Set’s digital
control functions are tested. The outco me o f th e test ap pears o n the C RT (if operating) and on four LEDs under the top cover.
Chapter 2, Troubleshooting
Step 3 - Run the Functional D i agnostics Running the Functional Diagnostics is a quick and convenient way to accu mulate a lot
of information about the operation of the Test Set. Step 4 - Verify Test Set Functionality Suggestions of things to try include: running the Performance Tests, running certain
periodic calibration procedures, emulating the application where the Test Set fails, swapping assemblies, etc.
The four steps are illustrated in figure 2, "The Four Steps of Troubleshooting the
Test Set," on page 48
. Instructions for performing these steps are given in this chapter. Explanation of the results is cross-referenced to other chapters in this manual.
47
Chapter 2, Troubleshooting
Four Basic Steps In Troubleshooting the Test Set
Test Set comes in
for repair.
Step 1
Step 2
Step 3
Is a
Cellular Adapter
attached?
No
Run the Self-Test Diagnostic with cover on.
Do all
self tests
pass?
Yes
Run the Functional Diagnostics.
Do all
Functional
Diagnostics
pass?
Yes
No
Rerun the Self­T e st Diagnostic with the cover off.
No
Disable the Cellular Adapter.
Is the
failure clear
cut?
Is the
failure clear
cut?
No
Yes
Yes
Replace the faulty assembly.
Replace the faulty assembly.
Yes
Step 4
Figure 2 The Four Steps of Troubleshooting the Test Set
48
1.Run the performance tests (chap 4).
2.Run the periodic calibration (chap 4).
3.If an instrument fault is suspected, run the AF and RF functional diag­nostics in a loop.
No
1.Read the block diagram theory (chap 7) and the diagnostic descriptions (chap 9) that pertain.
2.Test inputs and outputs of suspected assemblies (chap 2 and 7).
3.If possible, swap suspected assem blies with known good ones (chap 2).
S:\agilent\8920\ALR\MANUAL\trouble.fb
Step 1 - Disable the Cellular Adapter.
If the Test Set has a Cellular Adapter attached, disable it as follows:
Disconnect all of the rear-panel cables that connect the Test Set to the Cellular Adapter.
Unplug the Cellular Adapters power cord.
On the Test Sets rear panel, connect a coaxial cable between the IQ RF IN and CW RF
OUT connectors.
Step 2 - Run the Self-Test Diagnostic.
If the Test Set has no Cellu lar Adapter or if the Cellular Adap ter has been disabled, begin troubleshooting the Test Set by following these steps:
Initiate the Self-Test Diagnostic by turning the Test Set on.
After power-up, the top line of the Test Sets display should show: (1) the copyright
date, (2) Agilent Technologies, and (3) the firmware revision code.
Chapter 2, Troubleshooting
Four Basic Steps In Troubleshooting the Test Set
After power-up, the second line of the Test Sets display should show:
tests passed
The Test Set should power-up to the RX TEST screen. (RX TEST is the default screen;
however, the Test Set can be altered to power-up to some other screen.)
.
All self
If the Test Set powers up with the message All self tests passed.: Run the Functional Diagnostics as described in step 3 below. Also
Step 3 - Run th e Functional Diagnostics" on page 55
If the Test Set powers up with an error condit ion:
the Self-Test Diagnostic" on page 53
, later in this chapter.
, later in this chapter.
see "More About Step 2 - Run
see "More About
49
Chapter 2, Troubleshooting
Four Basic Steps In Troubleshooting the Test Set
Step 3 - Run the Functional Diagnostics.
The Functional Diagnost ics make a series of interna l measurement s which test the integrity of many of the c ircuits within the Test Set. There are three Func tional Diagnostics. The fi rst t wo (Audi o an d RF Diagnos tics ) can b e run co ntinuo usly i n a loop after an initial setup. This is useful for trapping intermittent fa ilures. The third diagnostic (Miscellaneous Diagnostics) requires a different setup for each test.
The Functional Diagnostics should be able to pinpoint faults in the audio and RF circuits to the faulty assembly. When a measurement is out of limits, the diagnostics post a message on the screen that suggests which assembly to replace and what the certainty is of that suggestion (low, medium, or high). Before ordering replacement parts (especially when the probability is medium or low) or if you have difficulty in understanding or running the Functional Diagnostics,
"More About Step 3 - Run the Functional Diagnostics" on page 55
chapter. For a cro ss reference betwee n Functional Diagnost ic and assembly tested
see chapter 3, "Repair".
see
, later in this
NOTE: The measurement limits of the Functional Diagnos tic tests are valid o nly at room temperature;
that is, 20 to 25°C or 65 to 75°F.
To run the Functional Diagnostics.
Press the PRESET key.
Press the TESTS key.
Set the
Set the
Set
Select Procedure Location: field to ROM.
Select Procedure Filename: field to:
AFDIAGS2 or AF_DIAGS (to run the Audio Diagnostics),
RFDIAGS2 or RF_DIAGS (to run the RF Diagnostics), or
MSDIAGS2 or MS_DIAGS (to run the Miscellaneous Diagnostics). SET UP TEST SET: field to Exec, then press the cursor control knob.
50
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Four Basic Steps In Troubleshooting the Test Set
Set Output Results To:
Crt to send the measurement information to the display only.
Printer to send the measurement information to both the display and to a printer.
(The Test Set and the printer must both be configured correctly.)
Set test execution conditions:
On
If Unit-Under-Test-Fails: (this can be altered as the test runs)
Continue to keep running when a failure occurs.
Stop to pause when a failure occurs.
On
Test Procedure Run Mode (this can be altered as the test runs)
Continuous to run the tests continuously.
Single Step to pause after each measurement.
Chapter 2, Troubleshooting
Select the
Choose the test or tests you want to run by selecting
then choosing
RF Tests
Follow the instructions on the scr een.
As the tests run, you can alter test execution conditions by selecting:
If all Functional Diagnostics pass:
Run Test field.
Up or Down to move the pointer
Select. (It is recommended to select All Audio Tests and All
when running the Audio and RF Diagnostics for the first time.)
Loop to rerun the test continuously. Pause to pause the running of the tests. Stp Fail, that is, stop-on-failure to pause the tests when a failure is detected. Sgl Step, that is, single-step to pause the test after each measurement.
Verify the Test Set’s functioning as described in step 4.
If any Functional Diag nostic fails: see "Step 3 - Run the Functional Diagnostics."
on page 50
.
51
Chapter 2, Troubleshooting
Four Basic Steps In Troubleshooting the Test Set
Step 4 - Verify Test Set Functioning
Suggestions:
1. Run all or a selected group of the Performance Tests. See chapter 5, "Calibration"
2. Run selected Periodic Calibration procedures. See chapter 5, "Calibration".
3. If the problem occurs on a few specific screen or screen combinations, check table 3,
"The Relationship Between Screens and Hardware" on page 61.
4. Swap suspected assemblies with known-good ones. See "Swapping Known-Good
Assemblies" on page 63 .
52
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More About Step 2 - Run the Self-Test Diagnostic

More About Step 2 - Run the Self-Test Diagnostic
If the Test Set powers up with the message:
”All self tests passed.”, it is still possible to have the following digital
problems:
Intermittent failure in any digital assembly.
A22 CRT Drive failure.
Input or output failure on any I/O port of the A21 assembly (optio nal on some Test
Sets).
Key failure (other than stuck keys) on the A1 Keyboard.
If all Self-Test Diagnostic passes and the fr ont-panel keys and kn ob work, you ca n assume that the digital control as semblies wo rk.
Chapter 2, Troubleshooting
If the Test Set powers up with the message:
One or more self-tests failed. Error code:<hexadecimal error code>
"Diagnostics Des criptions "
: See "Description Of Self-Test Diagnostic" in chapter 11,
Diagnostic. If the error code is 1000 and a Cellular Adapter is present and enabled, the
Cellular Adapter may be at fault. Disable the Cell ular Adapte r and run the S elf­Test Diagnostic again.
If the Test Set fails to power-up at all:
If there is no image on the CRT, troubleshoot using figure 3, "Troubleshooting the
CRT Flowch art," on page 54.
If there is no image on the CRT or the Test Set appears to be locked up, the Test Set may be set to power-up to a custom procedur e (rather than th e default RX Tes t screen) and that procedure may have errors. (This is the Autostart feature which is initiated by setting
Autostart to On from the TESTS screen.) Correct this fault by turning the
power off, then hold down t he MEAS R ESET and Hz keys while switching t h e po we r back on. Note that this will erase all programs and Save Settings information in RAM.
If the Test Set does not power-up prop erly but there seems to be signs of life, there is likely a digital control problem with one of the digital assemblies. It may be possible to run the Self-Test Diagnostic and read the test results through the diagnostic LEDs on the A7 Controller assembly. See "Description Of Self-Test Diagnostic" in chapter
11, "Diagnostics Descriptions" for details.
for further details on tr oubleshoo ting with the Sel f-T es t
53
Chapter 2, Troubleshooting
More About Step 2 - Run the Self-Test Diagnostic
Power up with cover on.
Fan runs?
Yes
Beeps?
Yes
Power up again
LEDs light?
Yes
LEDS
indicate good
power?
Yes
Power up again.
Is intensity normal
then fades out?
No
No
No
No
Check power line cir­cuits. (Fan runs from unregulate d 12 V.)
Check power supplies.
Controller or memory bad.
Run the self-test diagnostics.
Yes
Press [SHIFT] [CONFIG] [7] [ENTER].
No
At power down does the display
flash?
No
Faulty interconnect cable or bad high voltage powe r supply or CRT.
Yes
Check rear-panel
CRT VIDEO OUTPUT
Video OK?
No
Faulty CRT drive.
Yes
Faulty CRT
Figure 3 Troubleshooting the CRT Flowchart
54
500 mV/div
500 µs/div
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More About Step 3 - Run the Functional Diagnostics

More About Step 3 - Run the Functional Diagnostics
Memory Requirements
If the Test Set does not have 512 KBytes or more of extended RAM (optional in some Test Sets), there is a chance that the memory required to load and run the diagnostic program will overflow m emory. This is particula rly true of the RF Diagnostics. If t here i s a memory o verfl ow, the error message
overflow
MSSG to review the messages.) The Functional Diagnostics reside in the Test Sets firmware (that is, they are
stored in ROM). When a Functional Diagnostic is selected, the program is first loaded into t he Test Sets RAM and then it is run. The loading and running of the program both use RAM. This RAM is also shar ed with t he Save Set tings register s and a few other Test Set settings.
will appear possibly followed by other error messages. (Press SHIFT
Chapter 2, Troubleshooting
ERROR 2 Memory
To run the diagnostics program when there is insufficient mem ory, RAM must first be clea red. This will also clear the Save Settings registers, and the register data cannot be stored elsewhere. The Test Set will also lose its TX Power Zero setting which can easily be reacquired.
To clear RAM:
Select the CONFIGURE screen by pressing SHIFT CONFIG.
Move the cursor to SERVICE in the lower-right corner of the screen and press the knob.
Move the cursor to Clear all RAM and restart at the bottom of the screen and press the
knob.
Press the YES key.
Re-run the diagnos tics program.
USER Keys
USER keys provide the easiest method when making test selections. The default assignments for the USER keys on the TESTS screen match the positions of the selection fields in the upper-right corner of the screen. The key number precedes the field. However, key assignments are easily altered by the ASSIGN key.
If the USER keys do not match the selec tion fiel ds, either reassi gn the keys or use the knob to place the cursor in front of the desired field and press the knob.
55
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Frequently Encountered Error Messages
Error mess ages that appear on the second lin e of the Test Sets display frequently occur while the Functional Diagnostics are running. The most complete and general list of error mess ages is in the Error Messages chapter of the Test Set’s Users Guide and in the Test Set’s Programmers Guide. Some messages relating specifically to t roubleshooting can be fo und in the Err or Messages chapter of this manual. Some of the messages you can expect to occur while running the Functional Diagnostics are as follows:
Functional Diagnosti cs measur ements co mmonly gen erate t he message
latch write occurred. Cycle power when done servicing.
Direct
The message appears the first time the diagnostic program directly addresses a latch. The message should be ignore d until you wish t o make a nor mal (not a diagnos tic) measurement with the Test Set. To clear this message the Test Set should be turned off and back on again.
The message printer has been selected as the output destination on the
Printer does not respond. usually indicates tha t an GPI B
TESTS screen and that
the printer doesnt respond. Check that the printer is on and correctly cabled and addressed. (After a few seconds when the message times out, the output destination is changed to CRT by the program.)
The message selected as the o utput d est inat ion on t he
Needs I/O to print. indicates that a printer has been
TESTS screen but that th ere is no I/O p ort
installed in the Test Set. (After the message times out, the output destination is changed to CRT by the program.)
Some error messages you might encounter when running the Functional Diagnostics are the following:
ERROR 173 IN XXXX Active/system controller reqd (where XXXX represents a line number) usually indicates that a printer has been
selected as the output destination on the TESTS screen and that the controller Mode on the I/O CONFIGURE screen is set to Talk&Lstn instead of Control . Change the setting and run the diagnostic again.
56
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Timeouts
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Certain failures may cause a frequency or voltage reading to timeout, that is, the time required for t h e measurement will be un rea sonably long. If a ti meout o ccurs, measurement execution will stop and an error message will be displayed.
If frequency or voltage readings have been successfully made before the timeout, the assembly currently being tested or a multiplexer on the A19 Measurement Assembly may be at fault.
If most measurements fail, the A15 Reference Assembly may be faulty in supplying clock signals to the A19 Measurement Assembly.
Re-run the test to see if the timeout is in termittent.
57
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
The Three Functional Diagnostics
The Functional Diagnostics are contained in three independent program files. Before ordering a replacement assembly based on the diagnostics, you should read the descriptions of the diagnostic tests.
Descriptions"
Audio Diagnostics (AF_DIAGS or AFDIAGS2)
This program tests the audio functions of the following assemblies:
A2 Audio Analyzer 2
A3 Audio Analyzer 1
A4 Modulation Distribution
A6 Signalling Source/Analyzer (AF Generators 1 and 2 only)
A19 Measurement (only a few selected inputs)
also see chapter 9, "Block Diagrams".
See chapter 11, "Diagnostics
After initial cabling, all tests can be run in a loop without further intervention. This makes it easier to catch intermittent failures. The measurement limits of these tests are valid only when operated at nominal room temperature.
When a test fails, a diagnosis is given in three parts:
A diagnostic code.
The name of the assembly or assemblies most likely to have failed.
A rating (high or low) of the confidence of the diagnosis.
Before ordering an assembly based on the diagnosis, you should read the description of the diagnostic test and details of the diagnosis based on the diagnostic code.
"Block Diagrams"
See chapter 11, "Diagnostics Descriptions". Also see chapter 9,
.
58
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Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
RF Diagnostics (RF_DIAGS or RFDIAGS2)
This program tests the RF functions of the foll owing assem blies:
A11 Receiver Mixer
A13 Output
A14 Signal Generator Synthesizer
A15 Reference
A16 Receiver
A17 Receiver Synthesizer
A18 Spectrum Analyzer (optional in some Test Sets)
A23 Input
Some test selections require in itial ca bling befor e running th e RF Diagnost ics; but all tests can be run in a loop without further intervention. This makes it easier to catch intermittent failures. The measurement limits of these tests are valid only when operated at room temperature.
When a test fails, a diagnosis is given in two parts:
The name of the assembly or assemblies most likely to have failed.
A rating (high, medium, or low) of the confidence of the diagnosis.
The diagnosis given by the RF Diagnostics should be verified by other means before ordering and replacing parts. This particularly applies to the Spectrum Analyzer, Receiver, and Receiver Mixer assemblies. Some suggestions for doing this are as follows:
Become familiar with the block diagram and theory of operation of the assemblies in
see chapter 9, "Block Diagrams".
Read the description of the diagnostic test in see chapter 11, "Diagnostics
Descriptions".
Follow the suggestion s in Further Isolating RF Failures in this chapter.
59
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Miscellaneous Diagnostics (MS_DIAGS or MSDIAGS2)
This program verifies the followin g:
The ability of the A15 Reference to detect the presence of an external reference connected to the rear-panel 10 MHz REF INPUT co nnecto r and wh ether it can lock to that signal.
The integrity of the front-panel RF IN/OUT, DUPLEX OUT and ANT IN connectors.
The Self-Test Diagnostics, and power supply voltages. The Self-Test Diagnostic is
described in detail see "Description Of Self-Test Diagnostic" in chapter 11,
"Diagnostics Descriptions.".
Note that the Miscellaneous Diagnostics cannot be run in a loop. Before ordering a replacement assembly based on the diagnostics, you should
read the description of the diagnostic test.
Descriptions"
. Also see chapter 9, "Block Diagrams".
See chapter 11, "Diagnostics
60
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More About Step 3 - Run the Functional Diagnostics
More About Step 4 - Verify Test Set Functioning
Relating Test Set Functions To Hardware
Chapter 2, Troubleshooting
Table 3
relates the simplified block diagram to the Test Sets control and display
screens:
Table 3 The Relationship Between Screens and Hardware
Hardware Block
Screen
RX TEST X X X X TX TEST X X X X DUPLEX TEST X X X X X RF GENERATOR X X RF ANALYZER X X AF ANALYZER X X OSCILLOSCOPE X X SPECTRUM
ANALYZER ENCODER X X
AF
Analyzer
AF
Generator
RF
Analyzer
XXX
RF
Generator
Spectrum
Analyzer
Digital
DECODER X X RADIO
INTERFACE CONFIGURE X
61
X
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Out-of-Lock (OOL) Detectors
Two out-of-lock LEDs, one located on the A14 Signal Generator Synthesizer and the other on the A17 Receiver Synthesizer are found within the Test Set. The LEDs light when the phase-lock loops are not locked and therefore not functioning properly. The location of the LED annunciators is shown in
"Location of the Out-of-Lock Annunciators," on page 62
figure 4,
.
A14 Signal Generator Synthesizer
A17 Receiver Synthesizer
OOL
(Out-of-Lock)
LEDs
Figure 4 Location of the Out-of-Lock Annunciators
62
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Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Swapping Known-Good Assemblies
Swapping a known-good assembly for a suspected faulty assembly must be performed with good judgement. Mos t swapped a ssembli es, which us e calibr ation data, will operate well e nough with the original assemblys calibrati on data to troubleshoot and to run the diagnostics. Do not expect the Test Set to meet its specifications. Some assemblies may appear to fail bec ause of incorrect calibration data. It is also important to keep track of which assemb lies are in th e Test Set. If calibration data is lost, the assembly will have to b e sent back to the factory.
Calibration data is generally stored in a socketed EEPROM on the A7 Controller. If the Controller is replaced or swapped, the original EEPROM must be in the Test Set’s Controller. Should the EEPROM lose its data, the entire instrume nt will require a factory recalibration.
The assemblies that require down-loaded calibration data from a memory card are:
A11 Receiver Mixer
A13 Output
A14 Signal Generator Synthesizer
A15 Reference
A16 Receiver
A17 Receiver Synthesizer
A18 Spectrum Analyzer (optional assembly in some Test Sets)
A19 Measurement
A21 GPIB/RS-232/Cur rent Sense (optional assembly in some Test Sets)
A23 Input Section
A24 High Power Attenuator
Of these assemblies th e A23 Input Secti on is the lea st likel y to simul ate a working assembly without its own calibration data.
The A18 Spectrum Analyzer may also pose difficulties. The Spectrum Analyzer can be checked by measuring the Tracking Generator ported to the DUPLEX OUT and connected to the ANT IN. Make th e che ck with the ce nter f requen cy set to 501 MHz and a span of 1 GHz.
63
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Some assemblies require that a periodic calibration procedure be run. These are:
A2 Audio Analyzer 2 (variable-frequency notch filter null if present)
A3 Audio Analyzer 1 (DC offset)
A4 Modulation Distribution (DC offset, external amplif ier gain )
A15 Reference (time base frequency)
A19 Measurement (voltage references)
For general troubleshooting, these assemblies can generally be swapped without an immediate need of recalibration.
Further Isolating RF Failures
Isolating failures in the RF assemblies of the Test Set is generally more difficult than for the rest of the instrument. One problem is that the RF Diagnostics sometimes use the built-in RF analyzer to test the built-in RF source, and vice versa. This is necessary to make the diagnostics self-contained, that is, they run without external equipment.
Before using the helps in this section, run the RF Diagnostics in their entirety. (
"Step 3 - Run the Functional Diagnostics." on page 50
, earlier in this chapter.) It
will also be helpful to become familiar with:
the RF source and analyzer block diagrams and theory of operation in chapter 9,
"Block Diagrams".
the description of the RF and Miscellaneous Diagnostic tests in chapter 11,
"Diagnostics Descriptions".
Some general-purpose, RF test equipment will be needed:
RF signal generator
RF modulation analyzer or spectrum analyzer.
Isolating Input and Output Failures
If all RF diagnostic tests pass, there could still be a problem with the input and output paths (including reverse-power and overpower protection). Run the Miscellaneous Diagnostics test titled RF Input Output Test. A failure indicates that the Input Section or front-panel connection is faulty.
See
64
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Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Isolating the RF Analyzer
The RF Analyzer includes the following assemblies. (Refer to block diagrams 3 and 4 in
A23 Input Section
A11 Receiver First Mixer
A16 Receiver
A17 Receiver Synthesizer
A18 Spectrum Analyzer (optional on some Test Sets)
chapter 9, "Block Diagrams".)
To isolate the RF Analyzer:
On the Test Set:
Press PRESET.
Press TX.
Set
Tune Mode to Manual. .
Set
Tune Freq to 100 MHz.
Set
Input Port to Ant.
On the external RF signal generator:
Set the frequency to 100 MHz CW.
Set the amplitude to 0 dBm.
Connect the output to the Test Sets ANT IN connector.
Set the RF signal generator frequency to 100, 500, and 900 MHz. For each frequency,
the TX TEST display on the Test Set should read as follows:
TX POWER should read approximately 0.001 for each frequency.
TX FREQUENCY should read 100, 500, and 900 MHz respectively.
If the Test Set has a Spectrum Analyzer, temporarily select SPEC ANL and note the
level and frequency of the signal’s fundamental component. (Press TX to return to the TX TEST screen.)
Refer to block diagram BD4 in chapter 9, "Block Diagrams". The down­conversion frequencies for the three input frequencies are shown in the following table.
65
Chapter 2, Troubleshooting
More About Step 3 - Run the Functional Diagnostics
Table 4 The Relationship Between Screens and Hardware
Input Frequency
(MHz)
First LO Frequency
(MHz)
IF From First Mixer
(MHz) 100 714.3 614.3 500 614.3 114.3 900 785.7 114.3
Isolating the RF Source
The RF Source includes the following assemblies. Refer to block diagrams BD3 and BD4 in
A15 Reference
A14 Signal Generator Synthesizer
A13 Output Section
A23 Input Section
chapter 9, "Block Diagrams".
To isolate the RF Source:
On the Test Set:
Press PRESET.
Press RX.
66
Set
Set
Set
RF Gen Freq Mode to 600 MHz. Amplitude to 0 dBm. Output Port to Dupl.
On the external RF modulation analyzer or spectrum analyzer:
Set the tuning for a 600 MHz 0 dBm input signal.
Connect the input to the Test Sets DUPLEX OUT co nnecto r .
Set the Test Sets generator frequency to 600 , 3 00, and 150 MHz. For each frequ ency,
the external RF analyzer should read as follows:
Power should read approximately 0.001 for each frequency.
Frequency should read 600, 300, and 150 MHz respectively.
S:\agilent\8920\ALR\MANUAL\trouble.fb
3

Repair

67
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Chapter 3, Repair

Introduction

Introduction
Repair of a Test Set (or Test System) is straightforward. It involves troubleshooting a problem to an assembly by running diagnostics and then replacing the defective assembly. This section contains tools required, hints, and drawings to help you perform these tasks effectively. Detailed step-b y-step procedures are not given. A procedure for downloading calibration data is also included in this section.
CAUTION: Perform the following procedures only at a static-safe work station. The printed circuit
assemblies in this instrument are sensitive to STATIC ELECTRICITY DAMAGE. Wear an anti-static wrist strap that is connected to earth ground.
Recommended Torque
Screws: Tighten until just snu g. Do not to strip threads.
RF connectors
Nuts holding semi-rigid coax to moth erboard: 6.0 lb-in. (68 N-cm)
SMA: 9.0 lb-in. (102 N-cm) SMC: 6.0 lb-in. (68 N-cm)
68
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Downloading Calibration Data

Most assemblies in the Test Set require calibration data. To insure that the Test Set remains calibrated after an assembly is replaced, new calibration data must be downloaded. Depending on t he vintage and mode l number of the Test Set this may be done with either an ‘Epson-style’ memory card (early 8920As and 8921As) or a PCMCIA memory card (8920Bs). Newer Test Sets can, when powered-up, automatically download calibration data directly from assemblies with on-board calibration data.
Instructions for downloading calibration data are listed below. They are also included with a replacement assem bly.
Switch the Test Sets power off. Remove the original assembly.
Install the replacement assembly. Switch the Test Sets power on.
Insert the memory card (Epson-style or PCMCIA) into the Test Set.
Press the TESTS key.
Set the
Set the
Press the k1 (Run Test) key.
Follow the instructions on the scr een.
Select Procedure Location: field to Card. Select Procedure Filename: field to: DNLDCAL.
Chapter 3, Repair
Downloading Calibration Data
69
Chapter 3, Repair
Troubleshooting Aids for Assemblies
Troubleshooting Aids for Assemblies
Refer to following table to determine out which Diagnostic Tests, Performance Tests, and Periodic Self Calibration adjustments apply to an assembly you have replaced.
Table 5 Relating Assemblies To Troubleshooting Aids
Troubleshooting with
Diagnostics (Chap 2)
Ref. Des.
Assembly
Name
Power­Up Self
Tests
ROM
a
Performance Tests
(Chap 4)
Periodic
Self Cal
Cal Data
Needed After
Replacement ?
A1 Keyboard X MS_DIAGS:
(Self Test)
A2 Audio
Analyzer 2
AF_DIAGS: (Audio Analyzer 2)
A3 Audio
Analyzer 1
AF_DIAGS: (Audio Analyzer 1 Internal Paths)
A4 Modulation
Distribution
AF_DIAGS: (Mod Distribution Internal Paths)
A5 Serial I/O X MS_DIAGS:
(Self Test)
A6 Signaling
Source Analyzer
X AF_DIAGS:
(Audio Frequency Generators 1 and 2)
AF Analyzer (AC Voltage Accuracy)
AF Generator: (AC Level Accuracy)
Variable Frequency Notch Filter
Audio Analyzer Offset
AF Gen Gain EXT Mod Path Gain
NO
YES, E
NO
NO
NO
NO
b
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Troubleshooting Aids for Assemblies
Table 5 Relating Assemblies To Troubleshooting Aids (Continued)
Troubleshooting with
Diagnostics (Chap 2)
Ref.
Des.
Assembly
Name
Power­Up Self
Tests
ROM
a
Performance Tests
(Chap 4)
Periodic Self Cal
Chapter 3, Repair
Cal Data
Needed After
Replacement ?
A7 Controller X MS_DIAGS:
(Self Test)
A8 Memory X MS_DIAGS:
(Self Test)
A9 Power Supply MS_DIAGS:
(Self Test)
A10 Power Supply
Regulator
A11 Receiver
Mixer
A12 Radio Inter-
face (Opt.
MS_DIAGS: (Self Test)
RF_DIAGS: (Receiver)
MS_ DIAGS: (Self Test)
020)
A13 Output RF_DIAGS:
(Output)
A14 Sig Gen
Synthesizer
RF_DIAGS: (Signal Generator Synthesizer)
AF Generat o r: (AM Accuracy)
RF Generator: (Harmonic and Spurious Spe c t ra l Purity)
NO
NO
NO
NO
YES, E
NO
YES, E
YES, E
b
, P
b
, OB
b
,OB
c
c
c
A15 Reference RF_DIAGS:
(Reference)
A16 Receiver RF_DIAGS:
(Receiver)
71
RF Generator| (Residual FM)
RF Analyzer: (AM Accuracy and FM Accuracy)
Timebase Reference
YES, E
YES, E
b
, OB
b
, OB
c
c
Chapter 3, Repair
Troubleshooting Aids for Assemblies
Table 5 Relating Assemblies To Troubleshooting Aids (Continued)
Troubleshooting with
Diagnostics (Chap 2)
Ref. Des.
Assembly
Name
A17 Receiver
Synthesizer
Power­Up Self
Tests
ROM
a
RF_DIAGS: (Receiver
Performance Tests
(Chap 4)
RF Analyzer: (Residual FM)
Synthesizer)
A18 Spectrum
Analyzer (Opt. 102)
RF_DIAGS: (Spectrum Analyzer)
Spectrum Analyzer
Periodic
Self Cal
Cal Data
Needed After
Replacement ?
b
YES, E
YES, E
, OB
b
, P
c
c
A19 Measure-
d
ment
X MS_DIAGS:
(Self Test)
A20 CR T Drive X MS_DIAGS:
Oscilloscope Voltmeter-
Reference
YES, E
NO
b
, P
(Self Test)
A21 GPIB/RS-
232/Current
X MS_DIAGS:
(Self Test)
YES, E
b
, P
Sense (Opt.
103) A22 CRT NO A23 Input Section RF_DIAGS:
(Input)
A24 High Power
Attenuator
MS_DIAGS: (RF Input/
RF Generator (Level Accuracy)
YES, E
YES, E
b
, P
b
, P
Output) A25 Motherboard NO A26
Terminator
e
NO
a. Besides checking the assemblies marked X, the power-up self test checks the serial data lines which the controller uses to send control signals to and receive status signals from the RF and AF assemblies. b. 8920A and 8921A: E=Epson-style smart card. c. 8920B: P=PCMCIA-style smart card, OB=EEPROM on board. d. Measurement board checked indirectly by all diagnostics.
c
c
c
c
72
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Chapter 3, Repair
Troubleshooting Aids for Assemblies
e. A26 is a 50 termination assembly that plugs into the A18 Spectrum Analyzer position in a test set that does not have a Spectrum Analyzer.
73
Chapter 3, Repair
Disassembly and Replacement Procedures
Disassembly and Replacement Procedures
Ordering Replacement Parts: See chapter 10, "Replaceable Parts".
Figure 5 Removing External Cover
74
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A13 Output A14 Sig Gen Synth
Chapter 3, Repair
Disassembly and Replacement Procedures
A21 GPIB/RS-232 Centronics, Current Sense
A15 REF Synth A16 RCVR
A17 RCVR Synth
A18 Spectrum Analyzer
A2 Audio Analyzer 2 A3 Audio Analyzer 1
A20 CRT Drive
A19 Measurement
A8 Memory
A7 Controller A6 Signal Source Analyzer
A5 Serial I/O Controller
A4 Modulation Distribution
Figure 6 AF, Digital, and Most RF Assemblies
75
Chapter 3, Repair
Disassembly and Replacement Procedures
GPIB
Figure 7 Internal Covers
Ordering Replacement Parts: see chapter 10, "Replaceable Parts".
76
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A23 RF Input Assembly
Chapter 3, Repair
A23 RF Input Assembly
Figure 8 A23 RF Input Assembly
77
Chapter 3, Repair
A23 RF Input Assembly
Tools Required
TX-15 Torx head screwdriver 15/64 inch open end wrench 5/8 inch square drive socket
Ribbon Cable
(not shown)
Semi-Rigid Cables
(15/64 SMC Connector)
(2) TX-15 Screws
Semi-Rigid Cable
(15/64 SMC Connector)
(1) TX-15 Screw
Reassemble spacer so notched corner fits keyboard.
(2) 5/8 Nuts
Ordering Replacement Parts: see chapter 10, "Replaceable Parts". Calibration Data: The Test Set requires new cal data when the Input section is
replaced. A cal data memory card com es with the replacement assembly.
78
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A1 Front Panel (includes keyboard)

Hints: The A1 Keyboard a sse mbly is held to the fro nt panel by TX-10 screws an d the cursor control knob. Use a 1/16-inch allen wrench to remove the knob. Ordering Replacement Parts:
Chapter 3, Repair
A1 Front Panel (includes keyboard)
see chapter 10, "Replaceable Parts".
79
Chapter 3, Repair
A1 Front Panel (includes keyboard)
TOOLS REQUIRED TX-15 Torx head screwdriver
TX-10 Torx head screwdriver
1/16 inch allen wrench
5/16 inch open end wrench
5/8 inch nut driver
Ribbon Connector (Behind front panel.)
(2) TX-15 Screws on each side.
i-Rigid Cable on back F IN/OUT Connector
6 SMA Connector)
Microphone Connector (under instrument)
Figure 9 Front Panel
(1) TX-10 Screw
Spacing Plates (fit behind front panel.)
(5) 5/8 BNC Nut
Squelch and Volume Knobs (4) 1/16 Allen screws (2) 5/16 nuts
80
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A11 Receiver Mixer

Chapter 3, Repair
A11 Receiver Mixer
A11
Figure 10 A11 Receiver Mixer
Hints: To identify specific RF assemblies see figure 6, "AF, Digital, and Most RF
Assemblies," on page 75
Ordering Replacement Parts: Calibration Data: The Test Set requires new cal data when the Receiver Mixer
assembly is replaced. A cal data memory card comes with the replacement assembly.
Remove RF assemblies.
.
see chapter 10, "Replaceable Parts".
81
Chapter 3, Repair
A11 Receiver Mixer
Disconnect (3) RF cables and the red wire that connects to the Regulator assembly.
(RF cables are accessed from the bottom of the Test Set.)
Tools Required
15/64 inch open and wrench (for RF cable connectors)
TX-10 Torx head screwdriver
Attachment Method #1:
Pull to Release Plastic Rivet
82
Attachment Method #2:
Unscrew to Release 3mm Torx
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A10 Power Supply Regulator

Chapter 3, Repair
A10 Power Supply Regulator
Figure 11 A10 Power Supply Regulator
Hints: To identify specific RF assemblies see figure 6, "AF, Digital, and Most RF
Assemblies," on page 75
Ordering Replacement Parts:
Tools Required
TX-10 Torx head screwdriver
Remove RF assemblies.
.
see chapter 10, "Replaceable Parts".
83
Chapter 3, Repair
A10 Power Supply Regulator
A10 Power Supply
Regulator
(5) TX-10 Screws
(Short)
Power Supply
Red Wire
Molex Connector
Remove RF Assemblies
CRT
84
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A9 Power Supply
Chapter 3, Repair
A9 Power Supply
Figure 12 A9 Power Supply
Use the following sequence to remove the Power Supply:
1. Remove the Input assembly (see figure 8, "A23 RF Input Assembly," on page 77).
2. Pull the POWER switch shaft forward from the power supply, then pull it out back
toward the rear of the Test Set.
3. Remove the screws and molex connector.
4. Slide the power supply out from the bottom of the Test Set.
Ordering Replacement Parts: see chapter 10, "Replaceable Parts".
85
Chapter 3, Repair
A9 Power Supply
(2) TX-15 Screws
(4) TX-15 Screws
Molex Connector (Not shown)
Figure 13 (upper left corner of test set)
86
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A25 Motherboard
Chapter 3, Repair
A25 Motherboard
(27) TX-10 Screws
Screws in shaded area are longer.
(6) 5/8 BNC Nuts
(3) RF Connectors (1) 5/16 RF conn. nut, and
(1) 15/16 SMC conn. nut (on each end,
Remove speaker (3) TX-10 Screws
Speaker Connector
not shown), on each cable.
Center Connector
Figure 14 A25 Motherboard
87
Chapter 3, Repair
A25 Motherboard
Use the following sequence to remove the motherboard:
1. Remove all RF, AF, and digital assemblies that plug in to the mo therb oard (see figure
6, "AF, Digital, and Most RF Assemblies," on page 75).
2. Remove the RF cables on the bottom of th e mo therbo ard. To d o th is, uns crew the n uts
and pull the cable straight out (you may have to pull hard). Be careful not to bend the center conductor.
3. Remove the screws.
4. Remove the front panel (see figure 9, "Front Panel," on page 80).
5. Remove the rear-panel BNC nuts.
6. Lift the motherboard slightly away from the chassis and unplug the cables from the top
of the motherboard.
Ordering Replacement Parts: see chapter 10, "Replaceable Parts".
88
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Fan
Chapter 3, Repair
Fan
Remove RF assemblies.
Figure 15 Fan
Remove AF assemblies.
Hints: To remove AF and RF Assemblies see figure 6, "AF , Digital, and Most RF
Assemblies," on page 75
Ordering Replacement Parts:
.
see chapter 10, "Replaceable Parts".
89
Chapter 3, Repair
Fan
Disconnect fan cable from motherboard.
Pull (4) Fasteners
Rotate fan in the direction of arrow.
Remove AF assemblies.
Figure 16 (close-up view of fan)
90
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High-Power Attenuator
Chapter 3, Repair
High-Power Attenuator
Figure 17 High-Pow er Attenuator
Hints: To remove AF assemblies see figure 6, "AF, Digital, and Most RF
Assemblies," on page 75
Ordering Replacement Parts: Calibration Data: The Test Set requires new cal data when the High-Power
Attenuator assembly is replaced. A cal data memory card comes with the replacement assembly.
Remove AF assemblies.
.
see chapter 10, "Replaceable Parts".
91
Chapter 3, Repair
High-Power Attenuator
(2) TX-15 Screws
(2) 5/16 SMA Connecto rs
Figure 18 (close-up view of attenuator assembly)
Push top of attenu­ated firmly away from CRT.
92
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A20 Display (CRT)
(2) Mounting Brackets Under CRT (TX-15 screws)
CRT Shielding
Chapter 3, Repair
A20 Display (CRT)
CRT Cable Connector and Socket
(2) TX-15 Screws
Display (CRT)
Figure 19 A20 Display (CRT)
Use the following sequence to remove the Display (CRT):
1. Remove the Input assembly (see figure 6, "AF, Digital, and Most RF Assemblies,"
on page 75).
2. Remove the front panel (see figure 9, "Front Panel," on page 80).
3. Remove the RF assemblies that plug into the motherboard (see figure 6, "AF, Digital,
and Most RF Assemblies," on page 75).
4. Unplug the cable.
5. Remove the bottom and side screws fr om the display.
6. Slide the display to the front.
Ordering Replacement Parts: see chapter 10, "Replaceable Parts"
93
Chapter 3, Repair

A7 Controller

A7 Controller
Hints: To identify and access Controller assembly see figure 6, "AF, Digital, and
Most RF Assemblies," on page 75
.
Ordering Replacement Parts:
see chapter 10, "Replaceable Parts".
Table 6 Controller Switch Settings
Test Set Switch 1 Switch 2 Switch 3 Switch 4
8920A C losed Not Used Not Used Not Used 8920B Closed Open Open Not Used 8921A C losed Not Used Not Used Not Used
Switch 1: W rit e Cali bration E EPROM (Open= Disabl ed, Clos ed=Enabl ed) Swi tch 2: Smart Card (Open=PCMCIA, Closed=Epson) Switch 3: Run from Flash/OTP (Open=Flash, Closed=OTP) Switch 4: Not Used
Open
S4 S3 S2 S1
OPEN
Boot ROM U65 (8920B Only)
Front of Test Set
Closed
Locating Notch
Figure 20 A7 Controller
94
Cal Data EEPROM
U13 (8920A/8921A) U20 (8920B)
S:\agilent\8920\ALR\MANUAL\repair.fb
A8 Memory Assembly
0(025<$66(0%/<
Chapter 3, Repair
A8 Memory Assembly
8162/'(5&217$&76
21%$&.6,'(2)$66<
Figure 21 A8 Memory Assembly
Use the following procedure to remove the batteries on the Memory assembly:
1. Remove the external cover (see figure 5, "Removing External Cover," on page 74).
2. Remove the internal covers (see figure 7, "Internal Covers," on page 76).
3. Remove the A8 Memory assembly that plugs into the motherboard (see figure 6 on
page 75 for assembly removal and figure 7 on page 76 for location of side-mounte d
screws).
4. Place the assembly component-side down on a static-free surface. Unsolder, remove and properly dispose batttery (some memory assemblies may contain two batteries). Replace battery BT1 with part number 1420-0338.
5. Reinstall Memory assembly, internal and external covers.
Ordering Replacement Parts: see chapter 10, "Replaceable Parts"
%7
95
Chapter 3, Repair
A8 Memory Assembly
96
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