Agilent 8753ES User Manual

User’s Guide

Agilent Technologies

8753ET and 8753ES

Network Analyzers

Part Number 08753- 90472

Printed in U SA

June 2002

Supersedes February 2001

© Copyright 1999 −2002 Agilent Technologies, Inc.

Notice

The information contained in this document is subject to change without notice.
Agilent Technologies makes no warranty of any kind with regard to this material,

including but not limited to, the implied warranties of merchantability and fitness for a
particular purpose. Agilent Technologies shall not be liable for errors contained herein or
for incidental or consequent ial damages in connect ion with the furnishing , performance, or
use of this material.

Certification

Agilent Technologie s certi f ies that this product m et i ts p ub lis hed speci fi c ations a t the time
of shipment from the factory. Agilent Technologies further certifies that its calibration
measurements are traceable to the United States National Institute of Standards and
Technology, to the extent allowed by the Institute’s calibration facility, and to the
calibration facilities of other International Standards Organization members.

Regulatory Inf ormation

The regulatory information is located in Chapter 8 , “Safety and Regulatory Information.”

Warranty

THE MATERIAL CONTAINED IN THIS DOCUMENT IS PROVIDED “AS I S,” AND IS SUBJECT TO BEING
CHANGED, WITHOUT NOTICE, IN FUTURE EDITIONS. FURTHER, TO THE MAXIMUM EXTENT
PERMITTED BY APPLICABLE LAW, AGILENT DISCLAIMS ALL WARRANTIES, EITHER EXPRESS OR
IMPLIED WITH REGARD TO THIS MANUAL AND ANY INFORMATION CONTAINED HEREIN,
INCLUDING BUT NOT LIMITED TO THE IMPLIED WARRANTIES OF MERCHANTABILITY AND
FITNESS FOR A PARTICULAR PURPOSE. AGILENT SHALL NOT BE LIABLE FOR ERRORS OR FOR
INCIDENTAL OR CONSEQUENTIAL DAMAGES IN CONNECTION WITH THE FURNISHING, USE OR
PERFORMANCE OF THIS DOCUMENT OR ANY INFORMATION CONTAINED HEREIN. SHOULD
AGILENT AND THE USER HAVE A SEPARATE WRITTEN AGREEMENT WITH WARRANTY TERMS
COVERING THE MATERIAL IN THIS DOCUMENT THAT CONFLICT WITH THESE TERMS, THE
WARRANTY TERMS IN THE SEPARATE AGREEMENT WILL CONTROL.

Assistance

Product maintenance agreements and other customer assistance agreements are availa ble
for Agilent Technologies products. For any assistance, contact your nearest Agilent
Technologies sales or service office. See Table 8-1 for the nearest office.

ii

Safety Note s

Front-Panel Key

SOFTKEY

The following safety notes are used throughout this manual. Familiarize your self with
each of the notes and its meaning before operating this instrument. All pertinent safety
notes for using this product are located in Chapter 8 , “Safety and Regulatory

Information.”

WARNING Warning denotes a hazard. It calls attention to a procedure which, if

not correctly performed or adhered to, could result in injury or loss
of life. Do not proceed beyond a warning note until the indicated
conditions are fully un derstood and met.

CAUTION Caution denotes a hazard. It calls attention to a procedure that, if not

correctly performed or adhered to , would result in damage to or destructi on of
the instrument. Do not proceed beyond a caution sign until the indicated
conditions are fully understood and met.

How to Use This Guide

This guide uses the following conventions:

This represents a key physically located on the

instrument.

This represents a “softkey,” a key whose label is

determined by the instrument’s firmware.

Screen Text This represents text displayed on the instrument’s screen.

iii

Documentation Map

The Installation an d Quick Start Guide pr ovides procedures for
installing, configuring, and verifying the operation of the analyzer. It
also will help you familiarize yourself with the basic operation of the
analyzer.

The User’s Guide shows how to make measurements, explains
commonly-used features, a nd tells you how to get the most
perform ance from your ana ly z e r.

The Reference Guide provides re fere n ce inform at i on, su ch as
specifications, menu maps, and key definitions.

The Programm er’s Guide provides general GPIB programming
informat ion, a comm an d reference, and e xample pr og ra ms. T he
Programmer’s Gui de contains a CD-ROM with example programs.

The CD-ROM provides the Installa tio n and Qu ick Start Guide , the
User’s Guid e, the Referen ce Guide , and the Progra mmer’s Guide in
PDF format for v ie wing or p rin t ing from a PC.

The Service Guide pr ovides information on calibrating,
troubleshooting, and servicing your analyzer . The Serv ic e Gu ide i s not
part of a standard shipment and is available only as Option 0BW, or
by ordering Part number 08753-90484. A CD-ROM with the Service
Guide in PDF format is included for viewing or printing from a PC.

iv

Contents

1. Making Measurements

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-2

More Instrument Functions Not Described in This Guide . . . . . . . . . . . . . . . . . . . . . . . . . . .1-3

Making a Basic Measurement. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-4

Step 1. Connect the dev ice under test a nd any required test equipment. . . . . . . . . . . . . .1-4

Step 2. Choose the measurement parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-4

Step 3. Perform and apply the appropriate error-correction. . . . . . . . . . . . . . . . . . . . . . . .1-5

Step 4. Measure the dev ice under test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-5

Step 5. Output the measurement results. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-6

Measuring Magnitude and Insertion Phase Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-7

Measuring the Magnitude Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-7

Measuring Insertion Phase Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-8

Using Display Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-10

Titling the Active Channel Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-11

Viewing Both Primary Measurement Channels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-12

Viewing Four Measurement Channels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-14

Customizing the Four-Channel Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-17

Using Memory Traces and Memory Math Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-19

Blanking the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-21

Adjusting the Colors of the Display . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-22

Using Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1 -24

To Use Continuous and Discrete Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-24

To Activate Display Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-25

To Move Marker Information Off the Grids . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-26

To Use Delta (∆) Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-28

To Activate a Fixed Marker . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-29

To Couple and Un co u p le Display M a rkers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1- 3 1

To Use Polar Format Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-32

To Use Smith Chart Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-34

To Set Measurement Parameters Using Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-35

Setting the CW Frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-39

To Search for a Specific Amplitude . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-40

To Calculate the Statistics of the Measurement Data . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-43

Measuring Electrical Length and Ph ase Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-44

Measuring Electrical Length . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-44

Measuring Phase Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-46

Characterizing a Duplexer (ES Analyzers Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-50

Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-50

Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-50

Measuring Amplifiers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-54

Measuring Harmonics (Option 002). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-55

Measuring Gain Compression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-60

Measuring Gain and Rev erse Isolatio n Sim ultan eo usly (ES An alyze r s Only ) . . . . . . . . .1-64

Making High Power Measurements with Optio n 014 (ES Analyz ers On ly) . . . . . . . . . . .1-66

Using the Swept List Mode to Test a Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-71

Connect the Device Under Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-71

Observe the Characteristics of the Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-72

Choose the Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-72

Calibrate and Measure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-74

Contents-v

Contents

Using Limit Lines to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-76

Setting Up the Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-76

Creating Flat Limit Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-77

Creating a Sloping Limit Line . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-79

Creating Single Point Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-81

Editing Limit Segments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-82

Running a Limit Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-82

Offsetting Limit Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-83

Using Ripple Limits to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-85

Setting Up the List of Ripple Limits to Test. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-85

Editing Ripple Test Limits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-88

Running the Ripple Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-90

Using Bandwidth Limits to Test a Bandpass Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-95

Setting Up Bandwidth Limits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-95

Running a Bandwidth Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-97

Using Test Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-101

How to Use Test Sequencing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-101

Creating a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-101

Running a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-103

Stopping a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-103

Editing a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-103

Clearing a Sequence from Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-105

Changing the Sequence Title . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-105

Naming Files Generated by a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-106

Storing a Sequence on a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-106

Loading a Sequence from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-107

Purging a Sequence from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-107

Printing a Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-107

In-Depth Sequencing Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-108

Using Test Sequencing to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-116

Cascading Multiple Example Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-116

Loop Counter Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-117

Generating Files in a Loop Counter Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . 1-118

Limit Test Example Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1-120

Single Connection Multiple Measur em ent Conf igu rat ion (Op tion 014 On ly) . . . . . . . . . .1-122

Controlling E xternal Switches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-122

2. Making Mixer Measurements

Using This Chapter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2

Mixer Measure men t Ca pabilities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-3

Measurement Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-4

Minimizing Source and Load Mismatches . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-4

Reducing the Effect of Spurious Responses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-5

Eliminating Unwanted Mixing and Leakage Signals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-6

How RF and IF Are Defined . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-7

Frequency Offset Mode Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-10

LO Frequency Accuracy and Stability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-10

Differences Between Internal and External R Channel Inputs . . . . . . . . . . . . . . . . . . . . 2-10

Power M eter Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-12

Contents-vi

Contents

Conversion Lo s s Usin g t he Fre q uency O f fset M o de . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 - 1 3

Setting Me a s urement Paramete rs for th e Pow e r Met e r C a l i b ratio n. . . . . . . . . . . . . . . . .2-14

Performing a Power Meter (Source) Calibration Over the RF Ra nge . . . . . . . . . . . . . . . .2-15

Setting the Analyzer to Make an R Channel Measurement. . . . . . . . . . . . . . . . . . . . . . . .2-17

High Dynamic Range Swept RF/IF Conversion Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-20

Set Me a s urem e n t Par a mete rs for the I F Rang e . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2 - 2 0

Perform a Power Meter Calibration Over the IF Range. . . . . . . . . . . . . . . . . . . . . . . . . . .2-20

Perform a Receiver Calibration Over the IF Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-22

Set the Analyzer to the RF Frequency Range. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-22

Perform a Power Meter Calibration Over the RF Range . . . . . . . . . . . . . . . . . . . . . . . . . .2-23

Perform t he Hi gh Dynami c R a nge Me a sure ment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2- 2 3

Fixed IF Mixer Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-26

Tuned Receiver Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-26

Sequence 1 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-26

Sequence 2 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-31

Phase or Group Delay Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-34

Phase Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-34

Phase Linearity and Group Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-34

Amplitude and Phase Tracking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-38

Conversion Co m pres s i o n U s i ng the Frequ e n cy Off s e t M o de . . . . . . . . . . . . . . . . . . . . . . . .2- 3 9

Isolation Example Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-44

LO to RF Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-44

RF Feedthrough . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-46

SWR / Return Loss . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-49

3. Making Time Domain Measurements

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-2

Introduction to Time Domain Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-3

Making Transmission Response Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-5

Making Reflection Response Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-9

Time Domain Bandpass Mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12

Adjusting the Relative Velocity Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12

Reflection Measurements Using Bandpass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-12

Transmission Measurements Using Bandpass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-14

Time Domain Low Pass Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-15

Setti ng the Frequenc y Ra nge fo r T i me Do m a in Low Pass . . . . . . . . . . . . . . . . . . . . . . . .3-1 5

Reflection Measurements in Time Domain Low Pa ss . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-16

Fault Location Measurements Using Low Pass . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-18

Transmiss ion M easur emen t s in Tim e Dom a i n Low Pass . . . . . . . . . . . . . . . . . . . . . . . . . 3 - 1 9

Transforming CW Time Measurements into the Frequency Domain . . . . . . . . . . . . . . . . .3-22

Forward Transform Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-22

Masking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-26

Windowing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-27

Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-30

Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-32

Response Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-32

Range Resolution . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-34

Gating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-35

Setting the Gate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-35

Selecting Gate Shape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3-36

Contents-vii

Contents

4. Printing, Plotting, and Saving Mea sureme nt Resul ts

Using This Chapter. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-2

Printing or Plotting Your Measurement Res ults . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-3

Configuring a Print Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-4

Defining a Print Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-6

If You Are Using a Color Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-6

To Reset the Printing Parameters to Default Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-7

Printing One Measurement Per Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-7

Printing Multiple Measurements Per Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-8

Configuring a Plot Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-9

If You Are Plotting to an HPGL/2 Compatible Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-9

If You Are Plotting to a Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-10

If You Are Plotting Measurement Results to a Disk Drive . . . . . . . . . . . . . . . . . . . . . . . .4-11

Defining a Plot Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-13

Choosing Display Elements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-13

Selecting Auto-Feed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-13

Selecting Pen Numbers and Colors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-14

Selecting Line Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-15

Choosing Scale . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4- 1 5

Choosing Plot Speed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-16

To Reset the Plotting Parameters to Default Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-16

Plotting One Measurement Per Page Using a Pen Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . 4-17

Plotting Multiple Measurements Per Page Using a Pen Plotter . . . . . . . . . . . . . . . . . . . . . 4-18

If You Are Plotting to an HPGL Compatible Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-19

To View Plot Files on a PC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-20

Using Ami Pro . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-2 1

Using Freelance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-21

Converting HPGL Files for Use with Other PC Applications . . . . . . . . . . . . . . . . . . . . . . 4-22

Outputting Plot Files from a PC to a Plotter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-22

Outputting Plot Files from a PC to an HPGL Compatible Printer . . . . . . . . . . . . . . . . . . .4-23

Step 1. Store the HPGL initialization sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-23

Step 2. Store the exit HPGL mode and form feed sequence. . . . . . . . . . . . . . . . . . . . . . . .4-24

Step 3. Send the HPGL initialization sequence to the printer. . . . . . . . . . . . . . . . . . . . .4-24

Step 4. Send the plot file to the printer. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-24

Step 5 . Se nd the exit HPGL mode a n d f orm fee d sequ ence t o the printer. . . . . . . . . . . . 4-2 4

Outputting Single Page Plots Using a Printer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-24

Outputting Multiple Plots to a Single Page Using a Printer . . . . . . . . . . . . . . . . . . . . . . . .4-25

Plotting Multiple Measurements Per Page from Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-26

To Plot Multiple Measurements on a Full Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-27

To Plot Measu remen t s in Page Q u a d rant s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-28

Titling the Displayed Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-30

Configuring the Analyzer to Produce a Time Stamp . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-31

Aborting a Pr int or Plot Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-31

Printing or Plotting the List Values or Operating Parameters . . . . . . . . . . . . . . . . . . . . . . 4-32

If You Want a Single Page of Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-32

If You Want the Entire List of Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-32

Solving Problems with Printing or Plotting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-33

Saving and Recalling I nst ru m ent State s . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-34

Places Where You Can Save . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-34

Contents-viii

Contents

What You Can Save to the Analyzer’s Internal Memory . . . . . . . . . . . . . . . . . . . . . . . . . .4-34

What You Can Save to a Floppy Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-35

What You Can Save to a Computer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-35

Saving an Instrument State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-36

Saving Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-37

ASCII Data Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-39

Saving in Textual (CSV) Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-42

Saving in Graphical (JPEG) Form . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-44

Instrument State Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-44

Saving Time Gated Frequency Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-47

Differences between Raw, Data, and Format Arrays . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-47

Re-Saving an Instrument State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-49

Deleting a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-4 9

To Delete an Instrument State File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-49

To Delete all Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-49

Renaming a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-50

Recalling a File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-50

Formatting a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51

Solving Problems with Saving or Recalling Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51

If You Are Using an External Disk Drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-51

5. Optimizing Measurement Results

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-2

Taking Care of Microwave Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-3

Increasing Measurement Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4

Interconnecting Cables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4

Improper Calibration Techniques . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4

Sweeping Too Fast for Electrically Long Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4

Connector Rep eatability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-4

Temperature Drift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5

Frequency Drift . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5

Performance Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5

Reference Plane and Port Extensions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-5

Making Accurate Measurements of Electrically Long Devices . . . . . . . . . . . . . . . . . . . . . . . .5-7

The Cause of Measurement Problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-7

To Improve Measurement Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-7

Increasing Sweep Speed. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-9

To Use Swept List Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-9

To Decrease the Frequency Span . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-10

To Set the Auto Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

To Widen the System Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

To Reduce the Averaging Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

To Reduce the Number of Measurement Points . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

To Set the Sweep Type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

To View a Single Me a sur em ent C h a nnel . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5- 1 2

To Activate Chop Sweep Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12

To Use External Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12

To Use Fast 2-Port Calibration (ES Analyzers Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-12

Increasing Dynamic Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-14

Contents-ix

Contents

Increase the Test Port Input Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14

Reduce the Receiver Noise Floor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14

Reduce the Receiver Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14

Reducing Noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15

To Activate Averaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-15

To Change System Ba ndwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-15

To Use Direct Sampler Access Configurations (Opt ion 014 On ly). . . . . . . . . . . . . . . . . . .5-16

Reducing Receiver Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-18

Reducing Recall Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 - 1 8

Understanding Spur Avoidance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5-18

6. Calibrating for Increased Measurement Accuracy

How to Use Th is Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-2

Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-3

Calibration Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-4

Measurement Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4

Device Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4

Clarifying Type-N Connector Sex . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4

Omitting Isolation Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-4

Saving Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-5

Restarting a Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-5

The Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-5

Frequency Response of Calibration Standards . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-6

Interpolated Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-8

Error-Correction Stimulus State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-9

Procedures for Error Correcting Your Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-10

Types of Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-10

Frequency Response Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-12

Response Error Correction for Reflection Measurements . . . . . . . . . . . . . . . . . . . . . . . . . 6-12

Resp o n se Error Correction for Tran smiss i o n M e a suremen ts . . . . . . . . . . . . . . . . . . . . . . 6-14

Receiver Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-15

Frequency Res ponse and Isolation Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-17

Response and Isolation Error Correction for Transmission Measurements . . . . . . . . . .6-17

Response and Isolation Error Correction for Reflection Measurements . . . . . . . . . . . . .6-19

Enhanced Frequency Response Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-22

Enhanced Reflection Calibration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-25

One-Port Reflection Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-26

Full Two-Port Error Correction (ES Analyzers Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-29

Power Meter Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-33

Loss of Power Meter Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-33

Interpolation in Power Meter Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-34

Entering the Power Sensor Calibration Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-34

Compensating for Directional Coupler Response . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-35

Using Sample-and-Sweep Correction Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-36

Using Continuous Correction Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-38

Calibrating for Noninsertable Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-40

Adapter Removal Calibration (ES Analyzers Only). . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-41

Matched Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-45

Modify the Cal Kit Thru Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-46

Contents-x

Contents

Minimizing Error When Using Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-47

Making Non-Coaxial Measurements. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-48

Fixtures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-48

Calibrating for Non-Coaxial Devices (ES Analyzers Only) . . . . . . . . . . . . . . . . . . . . . . . . . .6-50

TRL Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-50

LRM Error Correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-54

Create a User-Defined LRM Calibration Kit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-54

Perform the LRM Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-56

Calibrating Using Electronic Calibration (ECal). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-58

Set Up the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-58

Connect the ECal Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-59

Select the ECal Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-60

Perform the Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-62

Display the Module Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-64

Perform the Confidence Check. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-65

Investigating the Calibration Results Using the ECal Service Menu. . . . . . . . . . . . . . . .6-67

Adap t e r Removal Us ing ECal (ES Ana l yz ers O nly) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 - 6 9

Perform the 2-Port Error Corrections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-71

Determine the Electrical Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-73

Remove the Adapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-74

Verify the Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6 -75

7. Operating Concepts

Using This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-2

Where to Find More Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-2

System Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-3

The Built-In Synthesized Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4

The Built-In Test Set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4

The Receiver Block . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-4

The Microprocessor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-5

Required Peripheral Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-5

Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7 - 6

Processing Details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-7

Output Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-10

Understanding the Power Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-10

Power Coupling Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-11

Sweep Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-1 2

Manual Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-12

Auto Sweep Time Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-12

Minimum Sweep Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-12

Source Attenuator Switch Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-14

Allowing Repetitive Switching of the Attenuator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-14

Channel Stimulus Coupling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-15

Sweep Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-16

Linear Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-16

Logarithmic Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-16

Stepped List Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-16

Swept List Frequency Sweep (Hz) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-18

Power Sweep (dBm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-20

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Contents

CW Time Sweep (Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-20

Selecting Sweep Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-20

S-Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-21

Understanding S-Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-21

The S-Parameter Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-23

Analyzer Display Formats. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-25

Log Magnitude Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-25

Phase Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-26

Group Delay Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-27

Smith Chart Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-28

Polar Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-2 9

Linear Magnitude Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-30

SWR Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7- 3 1

Real Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-31

Imaginary Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-32

Group Delay Principles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-32

Electrical Delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-35

Noise Reduction Techniques. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-36

Averaging . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-36

Smoothing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-37

IF Bandwidth Reduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-37

Measurement Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-39

What Is Accuracy Enhancement? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-39

What Causes Measurement Errors? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-40

Characterizing Microwave Systematic Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-43

How Effective Is Accuracy Enhancement? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-53

Calibration Routines. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-5 6

Response Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-56

Response and Isolation Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-56

Enhanced Response Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-56

S11 and S22 O ne-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-57

Full Two- Por t Calibration (ES M odels Only ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-57

TRL*/LRM* Two-Port Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-57

E-CAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-57

Modifying Calibration Kits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-58

Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-58

Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-59

Modify Calibration Kit Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-59

Verify Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-66

Saving Modified Calibration Kits to a Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-66

Modifying and Saving a Ca libr atio n Kit from the Calibrat io n Kit Se lection Menu. . . . . 7-67

TRL*/LRM* Calibration (ES Models Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-68

Why Use TRL Calibration? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-68

TRL Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-69

How TRL*/LRM* Calibration Works . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-69

Improving Raw Source Match and Load Match for TRL*/LRM* Calibration . . . . . . . . .7-72

The TRL Calibration Procedure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-73

GPIB Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7- 7 9

Local Key . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-79

Contents-xii

Contents

GPIB STAT US Indicators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

System Controller Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

Talker/Listener Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

Pass Control Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

Address Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

Using the Parallel Port . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-81

Limit Line Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-82

Edit Limits Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-83

Edit Segment Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-83

Offset Limits Menu . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-8 3

Knowing the Instrument Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-84

Network Analyzer Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-84

External Source Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-84

Tuned Receiver Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-86

Frequency Offset Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-87

Harmonic Operation (Op tion 002 On ly) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-88

Differences between 8753 Netwo rk Analy zers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-90

8. Sa fety and Regu latory Inf ormation

General Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2

Maintenance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2

Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2

Shipment for Service . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-2

Safety Symbols . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-4

Instrument Markings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-4

Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5

Safety Earth Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-5

Before Applying Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8 -5

Servicing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8- 6

General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-7

Compliance with German FTZ Emissions Requirements . . . . . . . . . . . . . . . . . . . . . . . . . .8-8

Compliance with German Noise Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-8

Declaration of Conformity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8-9

Contents-xiii

Contents

Contents-xiv

1 Making Measurements

1-1

Making Measurements

Using This Chapter

Using This Chapter

This chapter contains the following example procedures for making measurements. Mixer
and time domain measurements are covered in Chapt er 2 , "Making Mixer Measurements"
and Chapter 3 , “Making Time Domain Measurements.” This chapter also describes how to

use most display, marker, and sequencing functions.

• "Making a Basic Measurement" on page 1-4

• "Measuring Magnitude and Insertion Phase Response" on page 1-7

• "Measuring Electrical Length and Phase Distortion" on page 1-44
— Electr ical Length

— Phase Distortion (deviation from linear phase, group delay)

• Characterizing a Duplexer (ES Analyzers Only)

• "Measuring Amplifiers" on page 1-54
— Measuring Harmonics (Option 002 Only)

— Measuring Gain Compression
— Measuring Gain Compression and Reverse Isolation Simultaneously

(ES Analyzers Only)

— Making High Power Measurements (ES Analyzers Only)

• "Using the Swept List Mode to Test a Device" on page 1-71

• "Using Limit Lines to Test a Device" on page 1-76

• "Using Test Sequencing to Test a Device" on page 1-116

• "Single Connection Multiple Measurement Configuration (Option 014 Only)" on page

1-122

The following chapters describe how to use more instrument functions (as indicated by
their chapter titles):

• Chapter 4 , "Printing, Plotting, and Saving Measurement Results"

• Chapter 5 , "Optimizing Measurement Results"

• Chapter 6 , "Calibrating for Increased Measurement Accuracy"

1-2

Making Measurements

More Instrument Funct ions Not Described in This Guide

More Instrument Functions Not Described in This Guide

To learn about instrument functions not covered in this user’s guide, refer to the following
chapters in the reference guide.

“Menu Maps” contains maps of the instrument menu structure.
“Hardkey/Softkey Reference” contains descriptions of all instrument functions.

1-3

Making Measurements

PRESET : FACTORY

Making a Basic Measurement

Making a Basic Measurement

There are five basic steps when you are making a measurement.

1. Connect the device under test and any required test equipment.

CAUTION Damage may result to the device under test (DUT) if it is sensitive to the

analyzer’s default output power lev el. To avoid damaging a sensitive DUT, be
sure to lower the output power before connecting the DUT to the analyzer.

2. Choose the measurement parameters.

3. Perform and apply the appropriate error-correction.

4. Measure the device under test (DUT).

5. Output the measurement results.

This example procedure shows you how to measure the transmission response of a
bandpass filt e r.

Step 1. Connect the device under test and any required test equipment.

Make the connections as shown in Figure 1-1.

Figure 1-1 Basic Measurement Setup

Step 2. Choose the measurement parameters.

Press .

Preset

To set preset the analyzer to the “Factory Preset” conditions, press the

1-4

softkey if it is not selected. Then press .

Preset

Setting the Frequency Range

POWER RANGE MAN

POWER RANGES

Sweep Setup

NUMBER OF POINTS

Trans: FWD S21 (B/R)

TRANSMISSN

AUTOSCALE

SELECT DISK

INTERNAL MEMORY

RETURN

SAVE STATE

Marker Search

SEARCH: MAX

To se t the center frequency to 134 MHz, press:

Making Measurements

Making a Basic Measurement

Center 134 M/µ

To set the span to 30 MHz, press:

Span 30 M/µ

NOTE You could also press the and keys and enter the frequency

Start Stop

range limits as start frequency and stop frequency values.

Setting the Source Power

To change the power level to −5 dBm, press:

Power −5 x1

NOTE You could also press and select

one of the power ranges to keep the power setting within the defined range.

Setting the Measurement

To change the number of measurement data points to 101, press:

To select the transmission measurement, press:

Meas

or on ET models:

To view the data trace, press:

Scale Ref

Step 3. Perform and apply the appropriate error-correction.

Refer to the Chapter 5 , “Op timizing Measurement Results,” for procedures on

correcting measurement errors.
To save the instrument state and error- correction in the analyzer internal memory,

press:

Save/Recall

Step 4. Measure the device under test.

Replace any standard used for error-correction with the device under test.
To measure the insertion loss of the bandpass filter, press:

1-5

Making Measurements

PRINT MONOCHROME

PLOT

Making a Basic Measurement

Step 5. Output the measurement results.

To create a printed copy of the measurement results, press:

(or )

Copy

Refer to Chapter 4 , “Printing, Plotting , and Saving Measurement Results,” for

procedures on how to set up a printer and define a print, plot, or save results.

1-6

Making Measurements

Trans:FWD S21 (B/R)

TRANSMISSN

AUTO SCALE

Trans:FWD S21 (B/R)

TRANSMISSN

AUTO SCALE

CALIBRATE MENU

RESPONSE

THRU

Measuring Magnitude and Insertion Phase Response

Measuring Magnitud e and Insertion Phase Response

This measurement example shows you how to measure the maximum amplitude of a
surface acoustic wave (SAW) filter and then how to view the measurement data in the
phase format, which provides information about the phase response.

Measuring the Magnitude Response

1. Connect your test device as shown in Figure 1-2.

Figure 1-2 Device Connections for Measuring a Magnitude Response

2. Press and choose the measurement settings. For this example the

Preset

measurement parameters are set as follows:

Meas
Center 134 M/µ
Span 50 M/µ
Power −3 x1
Scale Ref
Chan 2
Meas
Scale Ref

or on ET models:

or on ET models:

You may also want to select settings for the number of data points, averaging, and IF
bandwidth.

3. Remove the device and connect the power cables together (thru) and perfo rm a response
calibration using the following key presses.

Press .

Chan 1 Cal

1-7

Making Measurements

AUTO SCALE

Marker Search

SEARCH: MAX

DUAL | QUAD SETUP

DUAL CHAN ON

PHASE

Measuring Magnitude and Insertion Phase Response

If the channels are coupled (the default condition), this calibration is valid for both
channels.

4. Reconnect your test device.

5. To better view the measurement trace, press:

Scale Ref

6. To locat e the maximum amplitude of the device resp onse, as shown in Figure 1-3, pre s s:

Figure 1-3 Example Magnitude Response Measurement Results

Measuring Insertion Phase Response

7. To view both the magnitude and phase response of the device, as shown in Figure 1-4,
press:

Chan 2
Display
Format

The channel 2 portion of Figure 1-4 shows the insertion phase response of the device under
test. The ana lyz er measures and displays phase over the range o f −180° to +180°. As phase
changes beyond these values, a sharp 360° transition occurs in the displayed data.

1-8

Measuring Magnitude and Insertion Phase Response

Figure 1-4 Example Insertion Phase Response Measurement

Making Measurements

The phase response shown in Figure 1-5 is undersampled; that is, there is more than 180°
phase delay between frequency points. If the ∆Φ ≥ 180°, incorrect phase and delay
inform at io n may result . Figu re 1-5 shows an example of phase samples being with
∆Φ less than 180° and greater than 180°.

Figure 1-5 Phase Samples

Undersampling may arise when measuring devices with long electrical length. To correct
this problem, the frequency span should be reduced, or the number of points increased
until ∆Φ is less than 180° per point. Electrical delay may also be used to compensate for
this effect (as shown in the next example procedure).

1-9

Making Measurements

Using Display Functions

Using Display Functions

This section provides the necessary information for using the display functions. These
functions are very helpful for displaying measurement data so that it will be easy to read.
This section covers the following topics:

• Adding titles to your measurements

• Viewing both primary channels at the same time

• Viewing and customizing four-channel measurements

• Using the memory traces

• Using the memory math functions

• Blanking the analyzer’s display

• Changing the colors of the display

1-10

Titling the Active Channel Display

MORE

TITLE

ERASE TITLE

ENTER

SELECT LETTER

DONE

NEWLINE

FORMFEED

Making Measurements

Using Display Functions

1. Press to access the title menu.

Display

2. Press and enter the title you want for your measurement display.

• If you have a DIN keyboard attached to the analyzer, type the titl e you w ant from the
keyboard. Then press to enter the title into the analyzer. You can enter a

title that has a maximum of 50 characters. (For more information on using a
keyboard with the analyzer, refer to the “O ptions and Accessories” chapter in the
reference guide.)

• If you do not have a DIN keyboard attached to the analyzer, enter the title from the
analyzer front panel.

a. Turn the front panel knob to move the arrow pointer to the first character of the

title.

b. Press .
c. Repeat the previous two steps to enter the re st of the char acter s in yo ur title. You

can enter a title that has a maximum of 50 characters.

d. Press to complete the title entry.

Figure 1-6 Example of a Display Title

CAUTION The and keys are not intended for creatin g display

titles. Those keys are for creating commands to send to peripherals during a
sequence program.

1-11

Making Measurements

DUAL | QUAD SETUP

DUAL CH AN on O FF

SPLIT DISP

SPLIT DISP

Using Display Functions

Viewing Both Primary Measurement Channels

In some cases, you may want to view more than one measured parameter at a time.
Simultaneous gain and phase measurements, for example, are useful in evaluating
stability in negative feedback amplifiers. You can easily make such measurements using
the dual channel display.

1. To see channels 1 and 2 in the same grid, press:

Display

, set to ON, and

to 1X.

Figure 1-7 Example of Viewing C hannel 1 and 2 Simultaneously

2. To view the measurements on separate graticules, press: Set to 2X. The
analyzer shows channel 1 on the upper half of the display and channel 2 on the lower
half of the display. The analyzer defaults to measuring S

on channel 1 and S21 on

11

channel 2.

1-12

Figure 1-8 Example Dual Channel with Split Display On

SPLIT DISPLAY 1X

COUPLED CH OFF

COUPLED CH ON off

MARKERS: UNCOUPLED

Making Measurements

Using Display Functions

3. To return to a single-graticule display, press: .

NOTE You can control the stimulus functions of the two channels independent of

each other by pressing .

Sweep Setup

Dual Channel Mode with Decoupled Stimulus

The stimulus functions of the two channels can be controlled independently using

in the stimulus menu. In ad dition, the markers can be controlled
independently for each channel using in the marker mode
menu, under the key.

Marker Fctn

NOTE ES mo dels only: F or dual cha nnel, if channels a re uncoup led and yo u have f ull

2-port calibrations on b oth channels, you will not be able to select a
non-ratioed measurement. For example, you can measure S

or B/R, but not

21

input B.

NOTE Auxiliary channels 3 and 4 are permanently coupled by stimulus to primary

channels 1 and 2, respectively. Decoupling the primary channels’ stimulus
from each other does not affect the stimulus coupling between the auxiliary
channels and their primary channels.

1-13

Making Measurements

MEASURE RESTART

AUX CHAN

AUX CHAN

DUAL | QUAD SETUP

DUAL CHAN

AUX CHAN

SPLIT DISP

4X

Using Display Functions

Dual Channel Mode with De coupled Channel Power

By decoupling the channel power or port power and using the dual channel mode, you can
simultaneously view two measurements (or two sets of measurements, if both auxiliary
channels are enabled) having different power levels.

However, there are situations where the analyzer will not update all measurements
continuously. For analyzers with source attenuators, such situations occur if channel 1
requires one attenuation value and channel 2 requires a different value, or if 2-port cal is
active and the port 1 attenuation value is not equal to the attenuation value of port 2.
Since one attenuator is used for both measurements, this would cause the attenuator to
continuously switch power ranges, which is not allowed.

If one of these conditions exist, the test set hold mode will engage, and the status notation
tsH will appear on the left side of the screen. The hold mode leaves the measurement
function in only one of the two measurement paths. To update both measurements, press

Sweep Setup

. Refer to "Source Attenuator Switch Protection" on

page 7-14.

Viewing Four Measurement Channels

Four m easur ement c hannels c an be viewed simultaneously by enabli ng auxil iar y c ha nnel s
3 and 4. Although independent of other channels in most variables, channels 3 and 4 are
permanently coupled to channels 1 and 2 respectively by stimulus. That is, if channel 1 is
set for a center frequency of 200 MHz and a span of 50 MHz, channel 3 will have the same
stimulus values.

NOTE Channels 1 and 2 are referred to as primary channels and channels 3 and 4

are referre d t o as au xiliary channels.

Channel 3 or 4 are activated when the Chan 3 or Chan 4 keys are pressed. Alternatively,
you can enable the auxiliary setting to ON. For example, if channel 1 is
active, pressing to ON enables channel 3 and its trace appears on the display.

Channel 4 is similarly enabled and viewed when channel 2 is active.

1. Press to select the type of display of the data. This example uses the l og mag

Format

format.

2. If channel 1 is not a ctive, make it active by pressing .

3. Press , set to ON, set to

Display

Chan 1

ON, and set to .
The display will appear as show n in Figure 1-9. Channel 1 is in the upper-left quadrant

of the display, channel 2 is in the upper-right quadrant, and channel 3 is in the lower
half of the display.

1-14

Figure 1-9 Three-Channel Display

Chan 2

AUX CHAN

Making Measurements

Using Display Functions

4. Press Chan 4 (or press , set to ON).

This enables channel 4 and the screen now displays four separate grids as shown in

Figure 1-1 0. Channel 4 is in the lower-right quadrant of the screen.

1-15

Making Measurements

MARKER 1

MARKER 2

Using Display Functions

Figure 1-10 Four-Channel Display

5. Press .
Observe that the amber LED adjacent to the key is lit and the CH4 indicator

Chan 4

Chan 4

on the display has a box around it. This indicates that channel 4 is now active and can
be configured.

6. Press .

Marker

Markers 1 and 2 appear on all four channel traces. Rotating the front panel control
knob moves marker 2 on all four channel traces. Note that the active function, in this
case the marker frequency, is the same color and in the same grid as the active channel
(channel 4).

7. Press .
Observe that the amber LED adjacent to the key is lit. This indicates that

Chan 3

Chan 3

channel 3 is now active and can be configured.

8. Rotate the front panel control knob and notice that marker 2 still moves on all four
channel traces.

1-16

9. To independently control the channel markers:

MARKER MODE MENU

MARKERS:

Format

SMITH CHART

DUAL CH AN on O FF

SPLIT DISP 1X 2X 4X

CHANNEL POSITION

DUAL|Q UAD SE TUP

CHANNEL POSITION

CHANNEL POSITION

SPLIT DISP 1X 2X 4X

SPLIT DISP 2X

CHANNEL POSITION

SPLIT DISP 4X

CHANNEL POSITION

Making Measurements

Using Display Functions

Press ; set to UNCOUPLED.

Marker Fctn

Rotate the front panel control knob. Marker 2 moves only on the channel 3 trace.

Once made active, a channel can be confi gured independentl y of the other channel s in most
variables except stimulus. For example, once channel 3 is active, you can change its format

to a Smith chart by pressing .

Customizing the Four-Channel Display

When one or both auxiliary channels are enabled, and

interact to produce different display configurations according to

Table 1-1.

Table 1-1 Customizing the Display

Split Display Dual Channel Aux Channels On Number of Graticules

1X Don’t Care Do n’t Care 1
1X/2X/4X Off None
2X/4X Off 3 or 4 2
2X On Don’t Care
4X On 3 or 4 3
4X On Both on 4

Channel Position So ftkey

gives you options for arranging the display of the channels. Press

Display

, to use .

works with . When is

selected, gives you two choices for a two-graticule display:

• Channels 1 and 2 overlaid in the top graticule, and channels 3 and 4 are overlaid in the
bottom graticule.

• Channels 1 and 3 are overlaid in the top graticule, and channels 2 and 4 are overla id in
the bottom graticule.

When is selected, gives you two choices for a
four-graticul e di spl ay:

• Channels 1 and 2 are in separate graticules in the upper half of the display, channels 3
and 4 are in separate graticules in the lower half of the display.

• Channels 1 and 3 are in the upper half of the display, channels 2 and 4 are in the lower
half of the display.

1-17

Making Measurements

4 PARAM DISPLAYS

4 PARAM DISPLAYS

SETUP A

SETUP F

SETUP A

SETUP A

SETUP B

TUTORIAL

MORE HELP

Using Display Functions

4 Param Displays Softkey

The menu does two things:

• provides a quick way to set up a four-parameter display

• gives information for using softkeys in the menu

Display

Figure 1-1 1 shows the first screen. Six setup options are described

with softkeys through . is a four-parameter display
where each channel is displayed on its own grid. Pressing immediately
produces a four-grid, four-parameter display. is also a four-parameter display,

except that channel 1 and channel 2 are overlaid on the upper grid and channel 3 and
channel 4 are overlaid on the lower grid. The other setup softkeys operate similarly. Notice
that setups D and F produce displays which include Smith charts.

Pressing opens a scr een which lis ts the order of keystrokes you would have to
enter in order to create some of the setups without using one of the setup softkeys. The
keystroke entries are listed (from top to bottom) beneath each setup and are color-coded to
show the relationship between the keys and the channels. Fo r example, bene ath the
four-grid display, [CHAN 1] and [MEAS] S11 are shown in yellow. Notice that in the
four-grid graphic, Ch1 is also yellow, indicating that the keys in yellow apply to channel 1.

Pressing opens a screen which lists the hardkeys and softkeys associated
with the auxiliary channels and setting up multiple-channel, multiple-grid displays. Next
to each key is a description of its function.

Figure 1-11 4 Param Displays Menu

1-18

Making Measurements

DATA/MEM

DATA-MEM

DATA/MEM

DATA-MEM

DATA→MEMORY

Using Display Functions

Using Memory Traces and Memory Math Functions

The analyzer has four ava ilable memory tr aces , one per ch annel. Memory traces are t otally
channel dependent: channel 1 cannot access the channel 2 memory trace or vice versa.
Memory traces can be saved with instrument states: one m emory trace can be saved per
channel for each saved instrument state. There are up to 31 save/rec al l r egi ster s a vail abl e,
so the total number of memory traces that can be present is 128 including the four active
for the current instrument state. The memory data is stored as full precision, complex
data. Memory traces must be displayed in order to b e saved with instrument states.

Additional data can be stored onto 3.5-inch floppy disks using the front panel disk drive.

NOTE You may not be able to store 31 instrument states if they include a large

amount of calibration data. The calibration data contributes considerably to
the size of the instrument state file and therefore the available memory may
be full p rior to filling all 31 registers.

Two trace math operations are i m plemented:

• (data/me m o ry)

• (data−memory)

(Note that normalization is not .) Memory traces are saved and
recalled and trace math is done immediately after error-correction. This means that any
data processing done after error-correction, including parameter conversion, time domain
transformation (Option 010), scaling, etc., can be performed on the memory trace. You can
also use trace math as a simple means of error-correction, although that is not its main
purpose.

All data processing operations that occur after trace math, except smoothing and gating,
are identical for the data trace and the memory trace. If smoothing or gating is on w hen a
memory trace is saved, this state is maintained regardless of the data trace smoothing or
gating status. If a memory trace is saved with gating or smoothing on, these features can
be turned on or off in the memory-only display mode.

The actual memory for storing a memory trace is allocated only as needed. The memory
trace is cleared on instrument preset, power on, or instrument state recall.

If sweep mode or sweep range is differ ent between the d ata and memory trac es, tr ace math
is allowe d, and no warni n g message is di splayed. If the number of points in the two traces
is different, the memory trace is not displayed nor rescaled. However, if the number of
points fo r t he da t a t race is chang ed back to the number of poin ts in the memory, the
memory trace can then be displayed.

If trace math or display memory is requested and no memory trace exists, the message
CAUTION: NO VA LI D M EMO RY TR ACE is displayed.

To Save a Data Trace to the Display Memory

Press to store the current active measurement data in the
memory of the active channel. The data trace is now also the memory trace. You can use a
memory trace for subsequent math manipulations.

Display

1-19

Making Measurements

MEMORY

DATA and MEMORY

DATA/MEM

DATA-MEM

COUPLED CH OFF

MORE

D2/D1 TO D2 ON

Using Display Functions

To View the Measurement Data and Memory Trace

The analyzer default setti ng shows you the current measurement data for the active
channel.

1. To view a data trace that you have already stored to the active channel memory, press:

Display

This is the only memory display mode where you can change the smoothing and gating
of the memory trace.

2. To view both the memory trace and the current measurement data trace, press:

Display

To Divide Measurement Data by the Memory Trace

You can use this feature for ratio comparison of two traces, for example, measurements of
gain or attenuation.

1. Y ou m ust have alr eady stored a d ata trace to the active channel memory, as described i n

"To Save a Data Trace to the Display Memory" on page 1-19.

2. Press to divide the data by the memory.

Display

The analyzer normalizes the data to the memory, and shows the results.

To Subtract the Memory Trace from the Measurement Data Trace

You can use this feature for s toring a measured vecto r error, for example , directivity. Then,
you can later subtract it from the device measurement.

1. Y ou m ust have alrea dy stored a data tr ace to the acti ve channel memory, as described i n

"To Save a Data Trace to the Display Memory" on page 1-19.

2. Press to subtract the memory from the measurement data.

Display

The analyzer performs a vector subtraction on the complex data.

To Ratio Measurements in Channel 1 and 2

You may want to use this feature when making amplifier m easur ement s to produce a tr ace
that represents gain compression. For example, with the channels uncoupled, you can
increase the power for channel 2 while channel 1 remains unchanged. This will allow you
to observe the gain compression on channel 2.

1. Press to uncouple the channels.

Sweep Setup

2. Make sure that both channels must have the same number of points.

3. Press to ratio channels 1 and 2, and put the

Display

results in the channel 2 data array. This ratio is applied to the complex data.

4. Refer to "Measuring Gain Compression" on page 1-60 for the procedure to identify the
1 dB compression point.

1-20

Blanking the Display

ADJUST DISPLAY

BLANK DISPLAY

FREQUENCY BLANK

Making Measurements

Using Display Functions

Pressing switc hes off the analyzer

Display

display while leaving the instrument in its current measurement state. This feature may
be helpful in prolonging the life of the LCD in applications where the analyzer is left
unattended (such as in an automated test system). Turning the front panel knob or
pressing any front panel key will restore normal display operation.

Pressing will blank the displayed frequency notation for

Display

security purposes. The frequency labels cannot be restored except by instrument preset or
turning the power off and then on.

1-21

Making Measurements

ADJUST DISPLAY

INTENSITY

DEFAULT COLORS

MODIFY COLORS

CH1 DATA/LIMIT LN

CH3 DATA/LIMIT LN

CH1 MEM

CH3 MEM

CH2 DATA/LIMIT LN

CH4 DATA/LIMIT LN

CH2 MEM

CH4 MEM

GRATICULE

REF LINE

TEXT

WARNING

CH1 DATA

TINT

Using Display Functions

Adjusting the Colors of the Display

Setting Display Intensity

To adjust the intensity of the display, press

Display

and rotate the front panel knob , use the ( ) ( ) keys, or use the numerical keyp ad
to set the inte nsity va lue bet ween 50 and 1 00 per cent . L owering the intensity may p rolong
the life of the LCD.

Setting Default Colors

To set all the display elements to the factory-defined default colors, press

.

NOTE does not reset or cha nge colors to the default color values. However,

Preset

cycling power to the instrument will reset the colors to the default color
values.

The Modify Colors Menu

The softkey within the adjust display menu provides access to the
modify colors menu.

The modify colors menu allows you to adjust the c olors on your analyzer’s display. The
default colors in this instrument were chosen to maximize your ability to discern the
difference between the channel colors, and to comfortably and effectively view the colors.

Each channel’s memory trace colo r wa s chosen because the c olor is simila r to the channels
data trace color. This allows easy association between the data trace and the memory trace
for each channel.

You may choose to change the default colors to suit environmental needs, individual
preferences, or to accommodate color deficient vision. You can use any of the available
colors for any of the display elements listed:

To change the color of a display elements, press the softkey for that element (such as

). Then pr ess and turn the analyzer f r ont panel knob; use the step keys

or the numeric keypad, until the desired color appears.

1-22

Making Measurements

BRIGHTNESS

COLOR

Preset

SAVE COLORS

RECALL COLORS

Using Display Functions

NOTE Maximum viewing w ith the LCD display i s achieve d when primary colors or a

combination of them are selected at full brightness (100%). Table 1-2 li s ts the
recommended colors and their corresponding tint numbers.

Table 1-2 Display Colors with Maximum Viewing Angle

Display Color Tint Brightness Color

Red 0 100 100
Yellow 17 100 100
Green 33 100 100
Cyan 50 100 100
Blue 67 100 100
Magenta 83 100 100
White N/A 100 0

Color is comprised of three parameters:

• Tint: The continuum of hues on the color wheel, ranging from red, through green and
blue, and back to red.

• Brightness : A measure of the brightness of the color.

• Color: The degree of whiteness of the color. A scale from white to pure color.

The most frequently occurring color deficiency is the inability to distinguish red, yellow,
and green from one another. Confusion between these colors can usually be eliminated by
increasing the brightness between the colors. To accomplish this, press the

softkey and turn the analyzer front panel knob. If additional adjustment

is needed, vary the degree of whiteness of the color. To accomplis h thi s, press the
softkey and turn the analyzer front panel knob.

NOTE Color changes and adjustments remain in effect until changed again in these

menus or the analyzer is powered off and then on again. Cycling the power
changes a ll co lor adjustments to defau l t val u e s. Once t h e col o rs are saved,

pressing the key does not affect the color selections.

Saving Modified Colors

To s a v e a m odif ied color set, pr ess . Modified color s are not part of a saved
instrument state and are lost unless saved using these softkeys. Once modified colors are

saved, they will be the colors applied until is pushed.

Preset

Recalling Modified Colors

To recall the previously saved color set, press .

1-23

Making Measurements

MARKER MODE MENU

MARKERS: CONTINUOUS

MARKERS: DISCRETE

Using Markers

Using Markers

The key displays a movable active marker on the screen and provides access to a

Marker

series of menus to control up to five display markers for each channel. Markers are used to
obtain numerical readings of measured values. They also provide capabilities for reducing
measurement time by changing stimulus parameters, searching the trace for specific
values, or statistically analyzing part or all of the trace.

Markers have a stimulus value (the x-axis value in a Cartesian format) and a response
value (the y-axis value in a Cartesian format). In polar format, the second part of a
complex data pair is also provided as an auxiliary response value. In Smith chart format,
the real and imaginary rectangle are both displayed, and the effective capacitance or
inductance of the imaginary part is also displayed. When a marker is activated and no
other function is active, its stimulus value is displayed in the active entry area and can be
controlled with the knob, the step keys, or the numeric keypad. The active marker can be
moved to any point on the trace, and its response and stimulus values are displayed at the
top right corner of the graticule for each displayed channel, in units appropriate to the
display format. The displayed marker response values are valid even when the measured
data is above or below the range displayed on the graticule.

• If you activate both data and memory traces, the marker values apply to the data trace.

• If you activate only the memory trace, the marker values apply to the memory trace.

• If you activate a memory math function (data/memory or data-memory), the marker
values apply to the trace resulting from the memory math function.

Marker values are normally continuous: that is, they are interpolated between measured
points. They can also be set to read only discrete measured points. Markers normally have
the same stimulus values for all channels, or they can be uncoupled so that each channel
has independent markers, regardless of whether stimulus values are coupled or dual
channel display is on.

To Use Continuous and Discrete Markers

The analyzer can either place markers on discrete measured points, or move the markers
continuously along a trace by interpolating the data value between measured points.

• Press and select one of the following choices:
— Choose if you want the analyzer to place markers at

— Choose if you want the analyzer to place markers only on

Marker Fctn

any point on the t rac e, by interpolating between measured points . This default mode
allows you to conveniently obtain round numbers for the stimulus value.

measured trace points determined by the stimulus settings. This may be the best
mode to use with automated testing, using a computer or test sequencing because
the analyzer does not interpolate between measured points.

1-24

Making Measurements

MARKERS: DISCRETE

MARKER 1

MARKER 2

MARKER 3

MARKER 4

MARKER 5

Using Markers

NOTE Using will also affect marker search and positioning

functions when the value entered in a search or positioning function does not
exist as a measurement point. The marker will be positioned to the closest
adjacent point that satisfies the search or positioning value.

To Activate Display Markers

• To switch on marker 1 and make it the active marker, press:

Marker

The active marker is identified on the analyzer display with the following symbol: ∇
The active marker stimulus value is displayed in the active entry area. You can modify

the stimulus value of the active marker, using the front panel knob or numerical
keypad. All of the mar ker response a nd stimulus val ues are di splayed i n the upper r ight
corner of the display.

Figure 1-12 Active Marker Control Example

To switch on the corresponding marker and make it the active marker, press:
, , or

All of the markers, other than the active marker, become inactive and are represented on
the analyzer display as ∆. The active and inactive markers are sh o wn in Figure 1-13.

1-25

Making Measurements

ALL OFF

1

2

3

4

MARKER MODE MENU

MARKERS:

Using Markers

Figure 1-13 Active and Inactive Markers Example

• To switch off all of the markers, press .

To Move Marker Information Off the Grids

If marker information obscures the display traces, you can turn off the softkey menu and
move the marker information off the display traces and into the softkey menu area.

Pressing the backspace key performs this function. This is a toggle function.
Pressing alternately hides and restor es the current softkey menu. The softkey menu

is also restored when you press any softkey or a hardkey which leads to a menu.

1. Set up a four- graticule display as described in "Viewing Four Measurement Channels"

on page 1-14.

2. Activate four markers by pressing .

NOTE Observe that the markers appear on all of the grids. To activate markers on

individual grids, press , and set

to UNCOUPLED. Then, acti va te the channel in which you wish

to have markers, press , then select the markers for that channel.

3. Turn off the softkey menu and move the marker information off the grids by pressing

.

Marker

Marker Fctn

Marker

The disp lay will be similar to Figu re 1-14.

1-26

Making Measurements

Figure 1-14 Marker Information Moved into the Softkey Menu Area

Using Markers

pg654e

4. Restore the softkey menu and move the m arker information back onto the graticules:
Press .

The display will be sim il ar t o Figure 1-1 5.

1-27

Making Measurements

∆ MODE MENU

∆ REF=1

MARKER 2

Using Markers

Figure 1-15 Marker Information on the Graticules

pg655e

You can also restore the softkey menu by pressing a hardkey which opens a menu (such as

Meas

) or pressing a softkey.

To Use Delta (∆) Markers

This is a relative mode, where the marker values show the position of the active marker
relative to the delta refere nce marker. You can switch on the delta mode by defining one of
the five markers as the delta reference.

1. Press to make marker 1 a reference marker.

2. To move marker 1 to any point that you want to reference:

• Turn the front panel knob.

• Enter the frequency value (relative to the reference marker) on the numeric keypad.

3. Press and move marker 2 to any position that you want to m eas ure in
reference to marker 1.

Marker

OR

1-28

Figure 1-16 Marker 1 as the Reference Marker Example

∆ MODE MENU

∆ REF=2

MKR ZERO

∆ MODE MENU

∆REF=∆FIXED MKR

MKR ZERO

FIXED MKR POSITION

MKR ZERO

∆MODE MENU

FIXED MKR POSITION

FIXED MKR STIMULUS

4. To change the reference marker to marker 2, press:

Making Measurements

Using Markers

To Activate a Fixed Marker

When a reference marker is fixed, it does not rely on a current trace to maintain its fixed
position. This is convenient when comparing two different measurement conditions. To

activate a fixed marker on the analyzer, press .
Marker zero puts a fixed reference at the current position of the active marker.

To change to a Delta Marker to a fixed reference marker, press

.

Using the Key to Activate a Fixed Reference Marker

Marker zero enters the position of the active marker as the ∆ reference position.
Alternatively, you can specify the fixed point with . Marker zero

is cance le d by switchin g d e lt a mode off.

1. To place marker 1 at a point that you would like to reference, press:

Marker

and turn the front panel knob, or enter a value from the front panel keypad.

2. To measure values along the measurement data trace, relative to the reference point
that you set in the previous step, press:

Marker

Marker

keypad.

3. To move the reference position, press:

front panel knob, or enter a value from the front panel keypad.

and turn the front panel knob, or enter a value from the front panel

and turn the

1-29

Making Measurements

∆REF=∆FIXED MKR

∆MODE MENU

∆REF=∆FIXED MKR

∆MODE MENU

FIXED MKR POSITION

FIXED MKR STIMULUS

FIXED MKR VALUE

FIXED MKR AUX VALUE

Using Markers

Figure 1-17 Example of a Fixed Reference Marker Using MKR ZERO

Using the Key to Activate a Fixed Reference Marker

1. To s et the frequency value of a fi xed mar ker t hat appe ars on the a nalyzer display, press:

Marker

and turn the front panel knob, or

enter a value from the front panel keypad.
The marker is shown on the display as a small delta (∆), smaller tha n ∆ the inactive

marker triangles.

2. To set the response value (dB) of a fixed marker, press:
and turn the front panel knob, or enter a value from the front

panel keypad.
In a Cartesian format, the setting is the y-axis value. In polar or Smith chart format,

with a magnitude/phase marker, a real/imaginary marker, an R+jX marker, or a G+jB
marker, the setting applies to the first part of the complex data pair. (Fixed marker
response values are always uncoupled in the two channels.)

3. To set the auxiliary response value of a fixed marker when you are viewing a polar or

Smith format, press:

and turn the front panel knob, or enter a value from the

front panel keypad.
This value is the second part of complex data pair, and applies to a magnitude/phase

marke r, a real/imaginary marker, an R+jX marker, or a G+jB mark e r. (Fixed marker
auxiliary response values are always uncoupled in the two channels.)

1-30

Making Measurements

MARKER MODE MENU

MARKERS: COUPLED

MARKERS: UNCOUPLED

Using Markers

Figure 1-18 Example of a Fixed Reference Marker Using (∆)REF=(∆)FIXED

MKR

To Couple and Uncouple Display Markers

At a preset state, the markers have the same stimulus values on each channel, but they
can be uncoupled so that each channel has independent markers.

Press and select from the following keys:

• Choose if you want the analyzer to couple the mark er stimulus

• Choose if you want the analyzer to uncouple the marker

Marker Fctn

values for the display channels.

stimulus values for the display channels. This allows you to control the marker
stimulus values independently for each channel.

1-31

Making Measurements

LIN MKR

LOG MKR

Re/Im

MKR MODE MENU

MARKERS:DISCRETE

POLAR

Marker Fctn

MARKER MODE MENU

POLAR MKR MENU

LIN MKR

LOG MKR

Re/Im MKR

Using Markers

Figure 1-1 9 Exa mp le of Coup led and Unc ou pled Ma rk ers

To Use Polar Format Markers

The analyzer can displa y the mar ker value as magni tude and phase, or as a real/imagi nary
pair: gives linear magnitude and phase, gives log magnitude and
phase, gives the real value first, then the imaginary value.

You can use these markers only when you are viewing a polar display format. (The format
is available fro m the key.)

Format

NOTE For greater accuracy when using markers in the polar format, it is

recommended to activate the discrete marker mode. Press

Marker Fctn

.

1. To access the polar markers, press:

Format

2. Select the type of polar marker you want from the following choices:

• Choose if you want to view the magnitude and the phase of the active
marker. The magnitude values appear in units and the phase values appear in
degrees.

• Choose if you want to view the logarithmic magnitude and the phase of
the active marker. The magnitude values appear in dB and the phase values appear
in degrees.

• Choose if you want to view the real and imaginary pair, where the
complex data is separated into its real part and imaginary part. The analyzer shows
the real part as the first marker value (M cos Θ), and the second value is the
imaginary part (M sin Θ, where M = magnitude).

1-32

Figure 1-20 Example of a Log Marker in Polar Format

Making Measurements

Using Markers

1-33

Making Measurements

MKR MODE MENU

MARKERS:DISCRETE

SMITH CHART

MARKER MODE MENU

SMITH MKR MENU

LIN MKR

LOG MKR

Re/Im MKR

R+jX MKR

G+jB MKR

Using Markers

To Use Smith Chart Markers

For greater accuracy when using markers in the Smith chart format, activate the discrete
marker mo de. Pr es s .

To use Smith chart format:

Marker Fctn

1. Press .

2. Press and turn the front

Format
Marker Fctn

panel knob, or enter a value from the front panel keypad to read the resistive and
reactive components of the complex impedance at any point along the trace. This is the
default Smith chart marker.

The marker annotation tells that the complex impedance is capacitive in the bottom
half of the Smith chart display and is inductive in the top half of the display.

• Choose if you want the analyzer to show the linear magnitude and the
phase of the reflection coefficient at the marker.

• Choose if you want the analyzer to show the logari thm ic magni tude a nd
the phase of the reflection coefficient at the active marker. This is useful as a fast
method of obtaining a reading of the log magnitude value without changing to log
magnit u de format.

• Choose if you want the analyzer to show the values of the reflection
coefficient at the marker as a real and imaginary pair.

• Choose to show the real and imaginary parts of the device impedance
(the series resistance and reactance, in ohms) at the marker. Also shown is the
equivalent series inductance or capacitance.

• Choose to show the complex admittance values of the active marker in
rectangular form. The active marker values are displayed in terms of conductance
(in Siemens), susceptance, and equivalent parallel circuit capacitance or inductance.
Siemens are the international unit of admittance and are equivalent to m hos (the
inverse of ohms).

1-34

Figure 1-21 Exam ple of Impe da n ce Smith Cha rt Mark er s

MARKER→START

To Set Measurement Parameters Using Markers

Making Measurements

Using Markers

The analyzer allows you to set measurement parameters with the markers, without going
through the usual key sequence. You can change certain stimulus and response
parameters to make them equal to the current active marker value.

Setting the Start Frequency

1. Press and turn the front panel knob, or enter a value from the front panel

Marker Fctn

keypad to position the marker at the value that you want for the start frequency.

2. Press to change the start frequency value to the value of the active
marker.

Figure 1-22 Example of Setting the Start Frequency Using a Marker

1-35

Making Measurements

MARKER→STOP

MARKER→CENTER

Using Markers

Setting the Stop Frequency

1. Press and turn the front panel knob, or enter a val ue from the fr ont panel

Marker Fctn

keypad to position the marker at the value that you want for the stop frequency.

2. Press to change the stop frequency value to the value of the active
marker.

Figure 1-23 Example of Setting the Stop Frequency Using a Marker

Setting the Center Frequency

1. Press and turn the front panel knob, or enter a val ue from the fr ont panel

Marker Fctn

keypad to position the marker at the value that you want for the center frequency.

2. Press to change the center frequency value to the value of the
active marker.

1-36

Making Measurements

∆MODE MENU

∆REF=1

MARKER 2

MARKER 1

MARKER 2

MKR ZERO

MARKER 1

MARKER→SPAN

Figure 1-24 Example of Setting the Center Frequency Usin g a Marker

Setting the Frequency Span

Using Markers

You can set the span equal to the spacing between two markers. If you set the center
frequency before you set the frequency span, you will have a better view of the area of
interest.

1. Press .

Marker

2. Turn the front panel knob, or enter a value from the front panel keypad to position the
markers where you want the frequency span.

Iterate between marker 1 and marker 2 by pressing and ,
respectively, and turning the front panel knob or entering values from the front panel
keypad to position the markers around the center freq uenc y. When finished positioning
the markers, make sure that marker 2 is selected as the active marker.

NOTE Step 2 can also be performed using and . However,

when using this method, it will not be p ossible to iter ate between marker zero
and marke r 1.

3. Press to change the frequency span to the range

Marker Fctn

between marker 1 and marker 2.

1-37

Making Measurements

MARKER→REFERENCE

Using Markers

Figure 1-25 Example of Setting the Frequency Span Using Marker

Setting the Display Reference Value

1. Press and turn the front panel knob, or enter a val ue from the fr ont panel

Marker Fctn

keypad to position the marker at the value that you want for the analyzer display
reference value.

2. Press to change the reference value to the value of the
active marker.

Figure 1-26 Example of Setting the Reference Value Using a Marker

1-38

Making Measurements

PHASE

MARKER→DELAY

SPECIAL FUNCTIONS

MKR→CW

MKR→CW FREQ

Using Markers

Setting the Electrical Delay

This feature adds phase delay to a variation in phase versus frequency, therefore it is only
applicable for ratioed inputs.

1. Press .

2. Press and turn the front panel knob, or enter a value from the front panel

Format
Marker Fctn

keypad to position the marker at a point of interest.

3. Press to automatically add or subtract enough line length to the
receiver input to compensate for the phase slope at the active marker position. This
effectively flattens the phase trace around the active marker. You can use this to
measure the electrical length or deviation from linear phase.

Additional electrical delay adjustments are required on devices without constant group
delay over the measured frequency span.

Figure 1-27 Ex ample o f Setting the Electrical Dela y Using a Mark er

Setting the CW Frequency

1. To place a marker at the desired CW frequency, press:

Marker

terminator.

2. Press .
You can use this function to set t he marker to a g ain peak in an a mplifier. After pressi ng

compression with increasing input power.

and either turn the front panel knob or enter the value, followed by a unit

Seq

, activate a CW frequency power sweep to look at the gain

1-39

Making Measurements

Marker Search

SEARCH: MAX

Marker Search

SEARCH: MIN

Using Markers

To Search for a Specific Amplitude

These functions place the marker at an amplitude-r elated point on the tr ace. If you switch
on tracking, the analyzer searches every new trace for the ta rget point.

Searching for the Maximum Amplitude

1. Press to access the marker search menu.

2. Press to move the active marker to the maximum point on the
measurement trace.

Figure 1-28 Example of Searching for the Maximum Amplitude Using a

Marker

Searching for the Mini mum Amplitude

1. Press to access the marker search menu.

2. Press to move the active marker to the minimum point on the
measurement trace.

1-40

Making Measurements

Marker Search

SEARCH: TARGET

TARGET

Marker Search

TARGET VALUE

SEARCH LEFT

SEARCH RIGHT

Using Markers

Figure 1-29 Example of Searching for the Minimum Amplitude Using a Marker

Searching for a Target Amplitude

1. Press to access the marker search menu.

2. Press to move the active marker to the target point on the
measurement trace.

3. If you want to change the target amplitude value (default is −3 dB), press
and enter the new value from the front panel keypad. You may also press

to enter the new value.

4. If you want to search f or multiple responses at the target amplitude value, press

and .

Figure 1-30 Example of Searching for a Target Amplitude Using a Marker

1-41

Making Measurements

Marker Search

SEARCH: MAX

MKR ZERO

Marker Search

WIDTHS ON

WIDTH VALUE

Marker Search

TRACKING ON

Using Markers

Searching for a Bandwidth

The analyzer can automatically calculate and display the bandwidth (BW:), center
frequency (CENT:), Q, and loss of the device under test at the center frequency. (Q stands

for “quality factor,” defined as the ratio of a circuit's resonant frequency to its bandwidth.)
These values are shown in the marker data readout.

1. Press and to place the marker near the center of the
filter passban d.

2. Press if you want the bandwidth relative to the maximum.

3. Press to access the marker search menu.

4. Press to calculate the center stimulus value, bandwidth, and the Q of a
bandpass or band reject shape on the measurement trace.

5. If you want to change the amplitude value (default is −3 dB) that defines the passband
or reject band, press and enter the new value from the front panel

keypad.

Figure 1-31 Example of Searching for a Bandwidth Using Markers

Tracking the Amplitude that You Are Searching

1. Set up an ampli t u de se arch by followi n g one of the previous procedures in "To Search

2. Press to track the specifi e d amplitude search with

1-42

for a Specific Amplitude" on page 1-40.

every new trace and put the active marker on that point.
When tracking i s not activat ed, the analyzer finds the specified amplitude on the

current sweep and the m arker remains a t same stimulus value , reg ardless of change s in
the trace response value with subsequent sweeps.

Making Measurements

∆ MODE MENU

∆ REF=1

MARKER 2

MKR MODE MENU

MKR STATS ON

Using Markers

To Calculate the Statistics of the Measurement Data

This function calculates the mean, standard deviation, and peak-to-peak values of the
section of the displayed trace betwe en the active marker and the del ta reference . If there is
no delta reference, the analyzer calculates the statistics for the entire trace.

1. Move marker 1 to any point that you want to reference:

• Turn the front panel knob.
OR

• Enter the frequency value on the numeric keypad.

2. Press to make marker 1 a reference marker.

Marker

3. Press and move marker 2 to any position that you want to measure in
reference to marker 1.

4. Press to calculate and view the

Marker Fctn

mean, standard deviation, and peak-to-peak values of the section of the measurement
data between the active marker and the delta reference marker.

An application for this feature is to find the peak-to-peak value of passband ripple
without searching separately for the maximum and minimum values.

If you are viewing a measurement in the polar or Smith Chart format, the analyzer
calculates the statistics using the first value of the complex pair (magnitude, real part,
resistance, or conductance).

Figure 1-32 Example Statistics of Measurement Data

1-43

Making Measurements

Trans:FWD S21 (B/R)

TRANSMISSN

PHASE

AUTO SCALE

Measuring Electrical Length and Phase Distortion

Measuring Electrical Length and Phase Distortion

Electrical Length

The analyzer mathematically implements a function similar to the mechanical “line
stretchers” of ea rlier analyzers. This feature simulates a variable length lossless
transmission line, which you can add to or remove from the analyzer's receiver input to
compensate for interconnecting cables, etc. In this example, the electronic line stretcher
measures the electrical length of a SAW filter.

Phase Distortion

The analyzer allows you to measure the linearity of the phase shift thr ough a device over a
range of frequencies and the analyzer can express it in two different ways:

• deviation from linear phase

• group delay

Measuring Electrical Length

1. Connect your test device as shown in Figure 1-33 .

Figure 1-33 Device Connections for Measuring Electrical Length

2. Press and choose the measurement settings. For this example, the

Preset

measurement settings incl ude r educi ng t he f requenc y sp a n to el i min ate under-sampled
phase response. Press the following keys as shown:

Meas

or on ET models:

1-44

Center 134 M/µ
Span 2 M/µ
Format
Scale Ref

Making Measurements

CALIBRATE MENU

RESPONSE

THRU

AUTO SCALE

MARKER→DELAY

Scale Ref

ELECTRICAL DELAY

Measuring Electrical Length and Phase Distortion

You may also want to select settings for the number of data points, averaging, and IF
bandwidth.

3. Substitute a thru for the device and perform a response calibration by pressing:

Cal

4. Reconnect your test device.

5. To better view the measurement trace, press:

Scale Ref

Notice that in Figure 1-34 the SAW filter under test has considerabl e phase shift within
only a 2 MHz span. Other filters may require a wider frequency span to see the effects
of phase shift.

The linearly changing phase is due to the device’s electrical length. You can measure
this changing phase by adding electrical length (electrical delay) to compensate for it.

Figure 1-34 Linearly Changing Phase

6. To place a marker at the center of the band, press and turn the front panel
knob, or enter a value from the front panel keypad.

7. To activate the electrical dela y function, press .
This function calculates and adds in the appropriate electrical delay by taking a ±10%

span about the marker, measuring the ∆Φ, and computing the delay as the negative of
∆Φ / ∆ frequency.

Alternatively, press and turn the front panel knob
to increase the electrical length until you achieve the best flat line, as shown in Figure

1-35.

Marker

Marker Fctn

1-45

Making Measurements

MORE

VELOCITY FACTOR

ELECTRICAL DELAY

Measuring Electrical Length and Phase Distortion

The measurement value that the analyzer displays represents the electrical length of
your device relative to the speed of light in fr ee space . The physic al length of your device
is related to this value by the propagation velocity of its medium.

NOTE Velocity factor is the ratio of the velocity of wave propagation in a coaxial

cable to the velocity of wave propagation in free space. Most cables have a
relative velocity of about 0.66 the speed in free space. This velocity depends
on the relative permittivity of the cable dielectric (εr) as

You could change the velocity factor t o compensate for p ropagation veloci ty by
pressing (enter the value) . This

Cal

x1

will allow the analyzer to accurately display the equivalent distance that
corresponds to the enter ed electrical delay.

Figure 1-35 Example Best Flat Line with Added Electrical Delay

8. To display the electrical length, press .

Scale Ref

In this example, ther e is a large amount of electrical delay due to the long electrical
length of the SAW filter under test.

Measuring Phase Distortion

This portion of the example shows you how to me asure the linearity of the phase shift over
a range of frequencies . The analyzer a llows you to measure this lin earity and read i t in two
different ways: deviation from linear phase, or group delay.

1-46

Making Measurements

SCALE DIV

Marker Fctn

MKR MODE MENU

STATS ON

Measuring Electrical Length and Phase Distortion

Deviation From Linear Phase

By adding electrical length to “flatten out” the phase response, you have removed the
linear phase shift through your device. The deviation from linear phase shift through your
device is all that remains.

1. Follow the procedure in "Measuring Electrical Length" on page 1-44.

2. To increase the scale resolution, press and turn the front

Scale Ref

panel knob, or enter a value from the front panel keypad.

3. To use the marker statistics to measure the maximum peak-to-peak deviation from
linear phase, press .

4. Activate and adjust the electrical delay to obtain a minimum peak-to-peak value.

NOTE It is possible to use delta markers to measure peak-to-peak deviation in only

one portion of the trace. See "To Calculate the Statistics of the Measurement

Data" on page 1-43.

Figure 1-36 Deviation from Linear Phase Example Measurement

Group Delay

The phase linearity of many devices is specified in terms of group or envelope delay. The
analyzer can translate thi s in formati on into a related parameter, group delay. Group delay
is the transmission time through your device under test as a function of frequency.
Mathematically, it is the derivative of the phase response which can be approximated by
the following ratio:

−∆Φ /(360 × ∆Φ)

where ∆Φ is the d iff er ence in phase at two frequ encies sep ara ted by ∆F. The quantity ∆F is
commonly called the “aperture” of the measurement. The analyzer calculates group delay
from its phase response measurements.

1-47

Making Measurements

DELAY

SCALE DIV

SMOO THIN G ON

Measuring Electrical Length and Phase Distortion

The default aperture is the total frequency span divi ded by the number of points a cross the
display (i.e. 201 points or 0.5% of the total span in this example).

1. Continue with the same instrument settings and measurements as in the previous
procedure, “Deviation From Linear Phase.”

2. To view the measurement in delay format, as shown in Figure 1-37, press:

Format

Scale Ref

3. To activate a marker to measure the g roup delay at a particular frequency, press

Marker

and turn the front panel knob, or enter a value from the front panel keypad.

Figure 1-37 Group Delay Example Measurement

Group delay measurements may require a specific aperture (∆)F) or frequency spacing
between measurement points. The phase shift between two adjacent frequency points
must be less tha n 180 °, otherwise incorrect group delay information may result.

4. To vary the effective group delay aperture from minimum aperture (no smoothing) to
approximately 1% of the frequency span, press: .

Avg

When you increase the aperture, the analyzer removes fine grain variations from the
response. It is critical that you specify the group delay aperture when you compare
group delay measurements.

1-48

Making Measurements

SMOOTHING APERTURE

Measuring Electrical Length and Phase Distortion

Figure 1-38 Group Delay Example Measurement with Smoothing

5. To increase the effective group delay aperture, by increasing the number of
measurement points over which the analyzer calculates the group delay, press:

5 x1

As the aperture is increased the “smoothness” of the trace improves markedly, but at
the expense of measurement detail.

Figure 1-39 Group Delay Example Measurement with Smoothing Aperture

Increased

Group delay is calculated by divi d ing the phase difference between points by the frequency
spacing. Thus, if n equals the number of points, the number of phase difference values (or
frequency segments) will be n−1. The first data point is repeated so that the total number
of points rema ins n.

1-49

Making Measurements

Characterizing a Duplexer (ES Analyzers Only)

Characterizing a Duplexer (ES Analyzers Only)

This measurement example demonstrates how to characterize a 3-port device, in this case
a duplexer, using four-parameter display mode. You must use a test adapter or a special
3-port test adapter to route the signals from the analyzer (a two-port instrument) to the
duplexer (a three-port device). This example procedure is performed using one of the
following test adapters:

❏ 8753D Option K36 Duplexer Test Adapter
❏ 8753D Option K39 3-Port Test Adapter
❏ 8753ES Option H39 3-Port Test Adapter (use the same instructions as those for K39

mode)

Definitions

The following abbreviations are used in reference to a duplexer:

Tx Transmitter port
Ant Antenna port
Rx Receiver port

Procedure

1. Press .

2. Connect the test adapter to the analyzer according to the instructions for your
particular model. Connect any test fixture or cables to the duplexer test adapter. Refer
to Figure 1-4 0.

Preset

1-50

Figure 1-40 Duplexer Connections

COUPLED CH on OFF

OFF

CONFIGURE MENU

USER SETTINGS

K36 MODE on OFF

SELECT [TX-ANT]

K39 MODE on OFF

SELECT PORTS [1-3]

SAVE STATE

Making Measurements

Characterizing a Duplexer (ES Analyzers Only)

3. Set up channel 1 for the Tx-Ant sti mul us par ameters (s ta rt/ s top freq uenc y, power level,
IF bandwidth). In thi s example, a wide fr equency range tha t covers b oth the Tx -Ant and
Ant-Rx parameters has been chosen.

4. Uncouple the primary channels from each other and then press and
toggle to .

5. Press .

System

Sweep Setup

6. Set up the desired mode.

• For K36 mode, toggle to ON. Then, press

Meas

.

• For K39 mode, toggle to ON. Then, press

Meas

.

7. Perform a full two-port calibration on channel 1 (refer to Chapter 6 , “Calibrating for

Increased Measurement Accuracy,” if necessary).

NOTE Make sure you connect the standards to the Tx port of the test adapter (or a

cable attached to it) for FORWARD calibrations, and to the Ant port for
REVERSE calibrations.

8. Save the instrument state by pressing .

9. Press .

10.Set up channel 2 for the Ant -Rx stimulus p arameters . In thi s example, a wide frequenc y
range that covers both the Tx-Ant and Ant-Rx parameters has been chosen.

Chan 2

Save/Recall

1-51

Making Measurements

SELECT [RX -ANT]

SELECT PORTS [2-3]

SAVE STATE

DUAL|Q UAD SE TUP

4-PARAM DISPLAYS

SETUP B

Trans: REV S 12 (A/R)

Refl: REV S 22 (B/R)

Trans:FWD S21 (B/R)

Refl: FWD S11 (A/R)

DUAL CHAN on OFF

ON

Characterizing a Duplexer (ES Analyzers Only)

11.Set up control of the test adapter so that channels 2 and 4 are Rx:

• For K36 mode, press .

• For K39 mode, press .

Meas
Meas

12.Perfo rm a full two -po rt calibra t io n on ch annel 2.

NOTE Make sure you connect the standards to the Rx port of the test adapter (or a

cable attached to it) for FORWARD calibrations, and to the Ant port for
REVERSE calibrations.

13.Save this state in the analyzer:
Press .

Save/Recall

14.Connect the duplexer to the test adapter.

15.Set up a 2-graticule, 4-parameter display with transmission measurements on the top
graticule and reflection measurements on the bottom graticule:

Press

Display

Meas

Chan 4

, then set to .

Chan 1

Chan 3

The disp lay will be similar to Figu re 1-41.

Figure 1-41 Duplexer Measurement

1-52

Making Measurements

CONFIGURE MENU

TESTSET SW CONTINUOUS

CONFIGURE MENU

TESTSET SW CONTINUOUS

Characterizing a Duplexer (ES Analyzers Only)

Normally, a 2-port calibration requires a forward and reverse sweep to complete before the
displayed trace updates . For faster tuning, it is possible to set the number of s weeps for the
active display channel (S11 and S21 for channel 1 in this case) to update more often than

the inactive display channel. In this example we choose 8 updates of the forward
parameters to 1 update of the reverse in channel 1, and 8 updates of the reverse to 1
update of the forward in channel 2 (where the active parameters are S22 and S12).

Press .
Press .

Chan 1 System
Chan 2 System

8 x1

8 x1

1-53

Making Measurements

Measuring Amplifiers

Measuring Amplifiers

The analyzer allows you to measure the transmission and reflection characteristics of
many amplifiers and ac tiv e d ev ices. Y ou c an measure sca lar p arameter s suc h a s gain, gain
flatness, gain compress ion, rever se isola tion, retur n loss (SWR), and gain dri ft versus ti me.
Additionally, you can measure vector parameters such as deviation from linear phase,
group delay, complex impedance and AM-to -PM conver sion. You can also make high power
measurements.

Figure 1-42 Amplifier Parameters

When you are measuring a device that is very sensitive to absolute power level, it is
important that you accuratel y set the power lev el at either the device input or output. The
analyzer is capable of using an external GPIB power meter and controlling source power
directly. Refer to Cha pter 6 , "Calibrating for Increased Measurement Accuracy" for
information on power meter calibration.

This section contains the following measurement examples:

• "Measuring Harmonics (Option 002)" on page 1-55

• "Measuring Gain Compression" on page 1-60

• Measuring Gain and Reverse Isolation Simultaneously

• Making High Power Measurements
— Option 014 Configuration

1-54

Making Measurements

Measuring Amplifiers

Measuring Harmonics (Option 002)

The analyzer has the capability of measuring swept second and third harmonics as a
function of frequency in a real-time manner. By using trace math, the second/third
harmonic response can be display ed di re ctly i n dBc (d B below t he funda mental or carr ier) .

The ability to display harmonic level versus frequency or RF power allows “real-time”
tuning of harmonic distortion.

Figure 1-43 Absolute Fundamental, 2nd, and 3rd Harmonic Output Levels

Figure 1-44 2nd and 3rd Harmonic Distortion in dBc

1-55

Making Measurements

INPUT PORTS

B

INPUT PORTS

B

Sweep Setup

COUPLED CH OFF

CHAN POWER [COUPLED]

DUAL | QUAD SETUP

DUAL CHAN ON

HARMONIC MEAS

SECOND

Measuring Amplifiers

Making Harmonic Measurements

Perform the following steps to display the absolute power of the fundamental and second
harmonic in dBm.

1. Press to measure the power for the fundamental

Chan 1 Meas

frequencies.

2. Press to measure the power for the harmonic

Chan 2 Meas

frequencies.

3. Set the start frequency to a value greater than 16 MHz.

4. Press and select . Uncoupling the channels allows
you to have the separate sweeps necessary for measuring the fundamental and
harmonic frequencies.

5. Press and select . Coupling the channel power

Power

allows you to maintain the same fundamental frequency power level for both channels.

6. Press and set the power level for both channels.

7. Press an d select .

8. Press and position marker to desired frequency.

9. Press . You can view both the f undamental

Power
Display
Marker
System

power and harmonic power levels at the same time. (Refer to Figure 1-45.)

Figure 1-45 Fundamental and 2nd Harmonic Power Levels in dBm

1-56

Making Measurements

MORE

D2/D1 toD2 ON

Measuring Amplifiers

To sho w the second harmonic’s power level relative to the fund amental power in dBc, p ress

Chan 2 Display

and select . This display mode lets y ou s ee the
relationship between the fundamental and second or third harmonic in dBc. (Refer to

Figure 1-46.)

Figure 1-46 2nd Harmonic Power Level in dBc

Additional Harmonic Measurements

Vector network analyzers are commonly used to characterize amplifier gain compression
versus frequency and power le vel . T his is essentially linea r cha racterization since onl y the
relative level of the fundamental input to the fundamental output is measured. The
narrow band receiver is tuned to a precise frequency and, as a result, is immune from
harmonic distortion. You may want to quantify the harmonic distortion itself. Figur e 1 -47
illustrates a simultaneous measurement of fundamental gain compression and second
harmonic power as a function of input power.

1-57

Making Measurements

COUPLED PWR ON off

COUPLED PWR ON off

Measuring Amplifiers

Figure 1-47 Gain Compression and 2nd Harmonic Output Level

Understanding Harmonic Operation
Single-Channel Operation You can view the second or third harmonic alone by using

only one of the analyzer’s channels.
Dual-Channel Operation To make the following types of measurements, uncouple

channels 1 and 2, and switch on dual channel.

• The analyzer measures the fundamental on one channel whil e measuri ng the second or
third harmonic on the other channel.

• The analyzer measures the second harmonic on one channel while measuring the third
harmonic on the other channel.

• Using the feature , the a na ly zer measur es the f undamenta l on
channel 1 while measuring the second or third harmonic in dBc on channel 2.

• Using the feature, the analyzer couples power between
channels 1 and 2. This is useful when you are using the D2/D1 to D2 feature because
you can change fundamental power and see the resultant change in the harmonic
power.

The analyzer shows the fundamental frequency v alue on the display. However, a marker in
the active entry area shows the harmonic frequency i n additi on to the funda mental . If you
use the harmonic mode, the annotation H=2 or H=3 appears on the left-hand side of the
display. The measured harmonic cannot not exceed the f requency limitations of the
network analyzer's receiver.

1-58

Making Measurements

COUPLED PWR ON off

D2/D1 toD2 on OFF

COUPLED CHAN ON off

COUPLED PWR ON

Measuring Amplifiers

Coupling Power Between Channels 1 and 2 is intended to
be used with the softkey. You can use the D2/D1 to D2 function in

harmonic measurements, where the analyz er shows the fundamental on channel 1 and the
harmonic on channel 2. D2/D1 to D2 ratios the two, showing the fundamental and the
relative power of the measured harmonic in dBc. You must uncouple channels 1 and 2 for

this measurement, using the softkey set to OFF to allow
alternating sweeps.

After uncoupling channels 1 and 2, you may want to change the fundamental power and
see the resultant change in relative harmonic power (in dBc). off

allows you to change the power of both channels simultaneously, even though they are
uncoupled in all other respects.

Frequency Range The frequency range is determined by the upper frequency range of
the instrument or system (3 or 6 GHz) and by the harmonic being displayed. The 6 GHz
operation requires an 8753ET/ES Option 006. Table 1-3 shows the highest fundamental
frequency for maximum frequency and harmonic mode.

Table 1-3 Maximum Fundamental Frequency using Harmonic Mode

Maximum Fundamental Frequency
Harmonic
Measured

2nd Harmonic 1.5 GHz 3.0 GHz
3rd Harmonic 1.0 GHz 2.0 GHz

8753ET/ES 8753ET/ES

Option 006

3 GHz 6 GHz

Accuracy and input pow er Refer to the “Specific ations and Characteristi cs” c hapter in
the reference guide. The maximum recommended input power and maximum
recommended source power are related specifications.

Using power levels greater than the recommended values may cause undesired harmonics
in the source and recei ver. The recommended power level s ensure tha t these harmonics are
less than −45 dBc. Use test port power to limit the input power to your test device.

1-59

Making Measurements

IF BW

Trans:FWD S21 (B/R)

TRANSMISSN

Measuring Amplifiers

Measuring Gain Compression

Gain compression occurs when the input power of an amplifier is increased to a level that
reduces the gain of the amplifier and causes a nonlinear increase in output power. The
point at which the gain is reduced by 1 dB is called the 1 dB compression point. The gain
compression will vary with fr eq uency, so it is necessary to find the worst-case point of g ain
compression in the frequency band.

Once that point is identified, you can perform a power sweep of that CW frequency to
measure the input power at which the 1 dB compression occurs and the absolute p ower out
(in dBm) at compression. The following steps provide detailed instruction on how to apply
various features of the analyzer to accomplish these measurements.

NOTE I n a compression measur ement it is necess ary to know the RF input or output

power at a certain level of gain compression. Therefore, both gain and
absolute power level need to be accurately characterized. Uncertainty in a
gain compression measurement is typically less than 0.05 dB. Also, each
input channel of the analyzer is calibrated to display absolute power
(typically within +0.5 dBm up to 3 GHz, and +1 dB up to 6 GHz). This can be
improved by calibrating the power meter. Refer to "Power Meter

Measurement Calibration" on page 6-33 for informat io n o n c al ibrating the

power meter.

Figure 1-48 Diagram of Gain Compression

1. Set up the stimulus and response parameters for your amplifier under test. To reduce
the effect of noise on the trace, press:

Avg
Chan 1 Meas

or on ET models:

1000 x1

2. Perform the desired error correction procedure. Refer to Chapter 6 , "Calibrating for

Increased Measurement Accuracy" for instructions on how to make a measurement

correction.

3. Connect the amplifier under test.

1-60

Making Measurements

D1/D2 to D2 ON

DATA →MEMORY

DATA/MEM

DUAL | QUAD SETUP

DUAL CHANNEL ON

Trans:FWD S21 (B/R)

TRANSMISSN

Sweep Setup

COUPLED CH OFF

DISPLAY

MORE

D2/D1 to D2 ON

MARKER 1

SCALE/DIV

Marker Search

SEARCH:MIN

Measuring Amplifiers

4. To produce a normalized trace that represents gain compression, perform either step 5
or step 6. (Step 5 uses trace math and step 6 uses uncoupled channels and the display

function .)

5. Press to produce a normalized trace.

Display

6. To produce a normalized trace, perform the following steps:

• Press and select to view

Display

both channels simultaneously.

• Press or on ET models:

Chan 2 Meas

• To uncouple the channel stimulus so that the channel power will be uncoupled,

press:

This will allow you to separately increase the power for channel 2 and channel 1, so
that you can observe the gain compression on channel 2 while channel 1 remains
unchanged.

• To display the ratio of channel 2 data to channel 1 data on the channel 2 display,

press:

Chan 2

This produces a trace that represents gain compression only.

7. Press and position the marker at approximately mid-span.

8. Press to change the scale to 1 dB per division.

Marker
Scale Ref

x1

9. Press .

Power

10.Increase the power until you observe approximately 1 dB of compression on channel 2,
using the step keys or the front panel knob.

11.To locate the worst case point on the trace, press:

1-61

Making Measurements

D2/D1 to D2 ON

COUPLED CH OFF

Sweep Setup

COUPLED CH ON

MARKER MODE MENU

MARKERS:DISCRETE

SPECIAL FUNCTIONS

MARKER→ CW

Sweep Setup

SWEEP TYPE MENU

POWER SWEEP

DUAL | QUAD SETUP

DUAL CHANNEL ON

D2/D1 to D2 ON

MORE

D2/D1 to D2 OFF

INPUT PORTS

B

SCALE/DIV

x1

Measuring Amplifiers

Figure 1-49 Gain Compression Using Linear Sweep and

12.If was selected, recouple the channel stimulus by pressing:

13.To place the marker exactly on a measurement point, press:

Marker Fctn

14.To set the CW frequency before going into the power sweep mode, press:

Seq

15.Press .
If interpolation is on (the default setting), the calibration will be applied to the power

sweep.

16.Enter the start and stop power levels for the sweep.
Now channel 1 is displayi ng a gain c ompres sion c ur ve . ( Do n ot p a y attention to channel

2 at this time.)

17.Press .

Chan 2 Display

18.If was selected, press .

19.Press .

Meas

Now channel 2 displays a bs olute output power (in dBm) as a function of power input.

20.Press to change the sc ale of c hannel 2 t o 10 dB per
division.

21.Press to change the scale of channel 1 to 1 dB per division.

1-62

Scale Ref

Chan 1 1 x1

10

Making Measurements

MARKER MODE MENU

MARKERS:COUPLED

Marker Search

SEARCH:MAX

MKR ZERO

SEARCH:TARGET

MKR MODE MENU

MARKERS:UNCOUPLED

∆ MODE MENU

∆ MODE OFF

Measuring Amplifiers

NOTE A receiver calib ratio n will improve the accuracy of this measurement. Refer

to Chapter 6 , “Calibrating for Increased Measurement Accuracy.”

22.Press .

Marker Fctn

23.To find the 1 dB compression point on channel 1, press:

−1 x1

Marker

Marker Search

Notice that the marker on channel 2 tracked the marker on channel 1.

24.Press .

Chan 2 Marker

25.To take the channel 2 marker out of the ∆ mode so that it reads the absolute output
power of the amplifier (in dBm), press:

Marker

Figure 1-50 Gain Compression Using Power Sweep

1-63

Making Measurements

Sweep Setup

COUPLED CH ON

PORT POWER [UNCOUPLED]

Trans:FWD S21 (B/R)

Trans: REV S 12 (A/R)

DUAL | QUAD SETUP

DUAL CHAN ON

Measuring Amplifiers

Measuring Gain and Reverse Isolation Simultaneously (ES Analyzers Only)

Since an amplifier will have high gain in the forward direction and high isolation in the
reverse direction, the gain (S

Therefore, the power you apply to the input of the amplifier for the forward measurement

) should be considerably lower than the power you apply to the output for the reverse

(S

21

measurement (S12). By applying low power in the forward direction, you’ll prevent the
amplifier from being saturated. A higher power in the reverse direction keeps noise from

being a factor in the measurement and accounts for any losses caused by attenuators or
couplers on the amplifier’s outp ut need ed to low er the output powe r into the analy zer. The
following steps demonstrate the features that best accomplish these measurements.

1. Press .
Coupling the channels allows you to have the same frequency range and calibration

applied to channel 1 and channel 2.

) will be much greater than the reverse isolation (S12).

21

2. Press .

Power

Uncoupling the port power allows you to apply different power levels at each port. In

Figure 1-51, the port 1 power is set to −25 dBm for the gain measurement (S

) and the

21

port 2 power is set to 0 dBm for the reverse isolation measurement (S12).

3. Press and se t t h e pow e r le vel for

Chan 1 Meas

Power

port 1.

4. Press and set the power leve l fo r

Chan 2 Meas

Power

port 2.

5. Perform an error-correction and connect the amplifier to the network analyzer. Refer to
the Chapter 5 , “Optimizing Measurement Results,” for error-correction procedures.

6. Press .

Display

You can view both measurements simultaneously by using the dual channel display
mode. Refer to Figure 1-51. If the port power level s are in different power range s , one of
the displayed measurements will not be continually updated and the annotation tsH
will appear on the left side of the display. Refer to "Source Attenuator Switch

Protection" on page 7-14 for information on how to override this state.

NOTE To obtain best accuracy, you should set the power levels prior to performing

the calibration. However, the analyzer compensates for nominal power
changes you make during a measurement, so that the error correction still
remains quite valid. In these cases, the Cor annunciator will change to C∆.

1-64

Figure 1-51 Gain and Reverse Isolation

Making Measurements

Measuring Amplifiers

1-65

Making Measurements

Measuring Amplifiers

Making High Power Measurements with Option 014 (ES Analyzers Only)

Analyzers equipped with Option 014 can be configured to measure high power devices.
This ability is useful if the required input power for a device under test is greater than the
analyzer can provide or if t he maximum output p ower from an amplifier under test e xceeds
safe input limits for a standard analyzer. This section describes three configurations for
performing high power measurements.

Figure 1-52 Internal Signal Paths of the Option 014 Analyzer

1-66

Making Measurements

Measuring Amplifiers

High Power Configuration One

Figure 1-53 shows a one-path 2-port forward direction high power measurement. In this

configuration the maximum power from test PORT 1 is 1 watt or 30 dBm. An external
amplifier and coupler are connected between the SWITCH and COUPLER access port for
PORT 1. The coupled arm of the external coupler must be connected through an external
switch to the R CHANNEL to maintain the phase lock in the forward direction .

NOTE This is only an example configuration for high power applications. Actual

device values need to be determined for each individual application.

Figure 1-53 High Power Configuration One

A power divider must be placed between the PORT 2 SWITCH and PORT 2 COUPLER
ports with one leg of the divider connected through the external switch to the R
CHANNEL port to maintain the phase lock in the reverse direction. (A coupler could also
be used in place of the power divider.)

The recommended external switch for this application is the HP/Agilent 8762B Option
T24. The maximum recommended power to the R CHANNEL input is −10 dBm, so
depending on the coupling factor of the external coupler, an attenuator may need to be
added to the R CHANNEL path.

Maximum power to PORT 2 is 2 watts or 33 dBm. Attenuators need to be added to the A
and B sampler access ports to reduce the power to the A and B samplers. An additional
attenuator must be added to the PORT 2 COUPLER/SWITCH ports to reduce the power to
the transfer switch.

1-67

Making Measurements

Measuring Amplifiers

Control of the external switc h c an be done through the test set interface on the rear panel.
Pin 8 on the TEST SET-I/O INTERCONNECT connector is a TTL 5 volt line that changes
from TTL high in the forward measurement state to T TL low in the reverse measurement
state. Refer to Fi gu re 1-81 on page 1-112. Table 1-6 is a complete listing of the connector’s

pins.
Pin 1 on the external switch must be grounded. It can be grounded to:

• the analyzer's chassis

• the front panel binder post

• the outer shell of the TEST SET-I/O INTERCONNECT connector

• a ground pin on the TEST SET-I/O INTERCONNECT connector (pin 7, 12 or 18). Refer
to Figure 1-8 1.

Pin C (common) on the HP/Agilent 8762B Option T24 must be connected to the test set
interface Pin 14 (+22 volt l ine). Pin 2 on the 8762B Opti on T24 connects to Pin 8 (T TL 0) on
the test set interface.

1-68

Making Measurements

Measuring Amplifiers

High Power Configuration Two

Figure 1-54 shows a full 2-port forward direction high power measurement. In this

configuration the maximum power from test PORT 1 and test PORT 2 is 0.10 watt or
20 dBm.

NOTE This is only an example configuration for high power applications. Actual

device values need to be determined for each individual application.

Figure 1-54 High Power Configuration Two

An external amplifier and coupler are connected between the RF OUT and the RF IN
access ports to the transfer switch.

The coupled arm of the external coupler must be connected to the R CHANNEL IN port.
Maximum recommended power to the R CHANNEL input is −10 dBm, so depending on the
coupling factor of the external coupler, an attenuator may need to be added to the R
CHANNEL path.

Maximum power to the RF IN port is 26 dBm. With the PORT 1 or PORT 2
SWITCH/COUPLER ports connected, the approximate loss from RF IN to either test
PORT is 6 dB at 3 GHz, and 8 dB at 6 GHz. The approximate loss for the Option 075 is
8 dB at 3 GHz.

Maximum power to PORT 2 from the DUT is 2 watts or 33 dBm. Attenuators need to be
added to the A and B sampler ports to reduce the power to the samplers. An isolator was
added to the PORT 2 SWITCH/COUPLER ports to reduce power to the transfer switch.
Maximum power to the transfer switch is 26 dBm. Some compression may occur above

−123 dBm.

NOTE Isolators must be inserted so that maximum isolation is achieved from the

COUPLER to the SWITCH ports. Refer to the isolators’ manufacturer
specifications for more information.

1-69

Making Measurements

Measuring Amplifiers

High Power Configuration Three

Figure 1-5 5 shows the external high power configuration. With this setup you can develop

your own high power configuration. This solution can be used for measurements in the
forward dire ct io n as long as the maximum power limits of the analyzer are not exceeded.
This configuration offers higher power capabilities.

NOTE This is only an example configuration for high power applications. Actual

device values need to b e determined for each individual application.

Figure 1-55 High Power Configuration Three

1-70

Making Measurements

Using the Swept List Mode to Test a Device

Using the Swept List Mode to Test a Device

When using a list frequency sweep, the analyzer has the ability to sweep arbitrary
frequency segments, each containing a list of frequency points. One major advantage of
using list frequency sweep is that it allows you to measure the minimum number of data
points, and only at the frequencies of interest. This serves to minimize the overall test
time. Two different l ist frequency sweep modes can be selected:

Stepped List
Mode In this mode, the source steps to each defined frequency point, stopping

while data is taken. This mode eliminates IF delay and allows frequency
segments to overlap. However, the sweep time is substantially slower than
for a continuous sweep with the same number of points.

Swept List
Mode This mode takes data while sweeping through the defined frequency

segments, increa sing throughput by up to 6 times over a stepped sweep. In
addition, this mode allows the test port power and IF bandwidth to be set
independently for each seg ment tha t is def ined. The frequency segments i n
this mode cannot overlap.

The ability to completely customize the frequency sweep while using swept list mode is
useful when setting up a measurement for a device with high dynamic range, like a filter.
The following measurement of a filter illustrates the advantages of using the swept list
mode.

• For in-de p t h info rmation on swept list mode, refer to "Swept List Frequency Sweep

(Hz)" on page 7-18.

• For information on optimizing your measurement results when using swept list mode,
refer to "To Use Swept List Mode" on page 5-9.

Connect the Device Under Test

1. Connect the equipment as shown in Figure 1-56.

Figure 1-56 Swept List Measurement Setup

1-71

Making Measurements

Trans: FWD S21 (B/R)

TRANSMISSN

Sweep Setup

SWEEP TYPE MENU

EDIT L IST

Using the Swept List Mode to Test a Device

2. Set the following measurement parameters:

Meas
Center 900 M/µ
Span 500 M/µ

or on ET models:

Observe the Characteristics of the Filter

Figure 1-57 Characteristics of a Filter

• Generally, the passband of a filter exhibits low lo ss. A relatively low inc ident power may
be needed to avoid overdriving the next stage of the DUT (if that stage contains an
amplifier) or the network analyzer receiver.

• Conversely, the stopband of a filter generally exhibits high isolation. To measure this
characteristic, the dynamic range of the system will have to be maximized. This can be
done by increasing the incident power and narrowing the IF bandwidth.

Choose the Measurement Parameters

1. Decide the frequency ranges of the segments that will cover the stopbands and
passband of the filter. For this example, the following ranges will be used:

• Lower stopband: 650 to 880 MHz

• Passban d: 880 to 920 M H z

• Upper stopband: 920 to 1150 MHz

2. To set up the swept list measurement, press:

1-72

Making Measurements

ADD

START

STOP

NUMBER of POINTS

MORE

LIST POWER ON off

SEGMENT POWER

LIST IF BW ON off

SEGMENT IF BW

RETURN

DONE

ADD

CENTER

SPAN

STEP SIZE

MORE

SEGMENT POWER

SEGMENT IF BW

RETURN

DONE

ADD

START

STOP

NUMBER of POINTS

Using the Swept List Mode to Test a Device

Set Up the Lower Stopband Parameters

3. To set up the segment for the lower stopband, press

650 M/µ

880 M/µ

51 x1

4. To maximize the dynamic range in the stopband (increasing the incident power and
narrowing the IF bandwidth), press

until ON is selected

until ON is selected

10 x1

1000 x1

Set Up the Passband Parameters

5. To set up the segment for the passband, press

900 M/µ

40 M/µ

.2 M/µ

6. To specify a lo we r power leve l an d a wider IF ban dwidth fo r the passband, pre ss

−10 x1

3700 x1

Set Up the Upper Stopband Parameters

7. To set up the segment for the upper stopband, press

920 M/µ

1150 M/µ

51 x1

1-73

Making Measurements

MORE

SEGMENT POWER

SEGMENT IF BW

RETURN

DONE

DONE

LIST FREQ [SWEPT]

Using the Swept List Mode to Test a Device

8. To maximize the dynamic range in the stopband (increasing the incident power and
narrowing the IF bandwidth), press:

10 x1

300 x1

9. Press .

Calibrate and Measure

1. Remove the DUT and perform a full two-port calibration. Refer to Chapter 6 ,

“Calibrating for Increased Measurement Accuracy.”

2. With the thru connected, set the scale to autoscale to observe the benefits of using
swept list mode.

• The segments used to measure the stopbands have less noise, thus maximizing

dynamic range within the stopband frequencies.

• The segment used to measure the passband has been set up for faster sweep speed

with more measurement points.

Figure 1-58 Calibrated Swept List Thru Measurement

3. Reconnect the filter and adjust the scale to compare results with the first filter
measurement that used a linear sweep.

In Figure 1-59, notice that the noise level has decreased over 1 0 dB, confirming that the
noise reduction techniques in the stopbands were successful. Also, notice that the
stopband noise in the third segment is slightly lower than in the first segment. This is
due to the narrower IF bandwidth of the third segment (300 Hz).

1-74

Making Measurements

Using the Swept List Mode to Test a Device

Figure 1-59 Filter Measurements Using Linear Sweep and Swept List Mode

Using Linear Sweep

(Power: 0 dBm/IF BW: 3700 Hz)

Using Swept List Mode

1-75

Making Measurements

Trans: FWD S21 (B/R)

TRANSMISSN

AUTO SCALE

Using Limit Lines to Test a Device

Using Limit Lines to Test a Device

Limit testing is a measurement technique that compares meas urement data to constraints
that you define. D epending on the results of this comparison, the analyzer will indicate if
your device either passes or fails the test.

Limit testing is implemented by creating individual flat, sloping, and single-point limit
lines on the analyzer display. When combined, these lines can represent the performance
parameters for your device under test. The limit lines created on ea ch measurement
channel are independent of each other.

This example measurement shows you how to test a bandpass filter using the following
procedures:

• c re at in g flat limit line s

• c re at in g slop in g limit li n es

• c re at in g single poin t li mit line s

• editing limit segments

• running a limit test

Setting Up the Measurement Parameters

1. Connect your test device as shown in Figure 1-60 .

Figure 1-60 Connections for SAW Filter Example Measurement

2. Press and choose the measurement settings. For this example the
measurement settings are as follows:

• or on ET models:

Preset

Meas

•

Center 134 M/µ

•

Span 50 M/µ

•

Scale Ref

You may also want to select setti ngs for the number of data points, power, averaging,
and IF bandwidth.

1-76

Making Measurements

CALIBRATE MENU

RESPONSE

THRU

AUTO SCALE

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

CLEAR LIST

YES

ADD

STIMULUS VALUE

UPPER LIMIT

LOWER LIMIT

DONE

MIDDLE VALUE

DELTA LIMITS

MIDDLE VALUE

x1

DELTA LIMITS

LIMIT TYPE

FLAT LINE

RETURN

Using Limit Lines to Test a Device

3. Substitute a thru for the device and perform a response calibration by pressing:

Cal

4. Reconnect your test device.

5. To better view the measurement trace, press:

Scale Ref

Creating Flat Limit Lines

In this example procedure, the following flat limit line values are set:

Frequency Range Power Range

127 MHz to 140 MHz −27 dB to −21 dB
100 MHz to 123 MHz −200 dB to −65 dB
146 MHz to 160 MHz −200 dB to −65 dB

NOTE The minimum value for measured data is −200 dB.

1. To access the limits menu and activate the limit lines, press:

System

2. To create a new limit line, pr ess:

The analyzer generates a new segment that appears on the center of the display.

3. To specify the limit’s stimulus value, test limits (upper and lower), and the limit type,
press:

127 M/µ

−21 x1

−27 x1

NOTE You could also set the upper and lower limits by using the

and keys. To use these keys for the entry, press:

−24

3 x1

This would correspond to a test specification of −24 ±3 dB.

4. To define the limit as a flat line, press:

1-77

Making Measurements

ADD

STIMULUS VALUE

M/µ

DONE

LIMIT TYPE

SINGLE POINT

RETURN

ADD

STIMULUS VALUE

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

FLAT LINE

RETURN

ADD

STIMULUS VALUE

DONE

LIMIT TYPE

SINGLE POINT

RETURN

Using Limit Lines to Test a Device

5. To terminate the flat line segment by establishing a single point limit, press:

140

Figure 1-61 shows the flat limit lines that you have just created with the following

parameters:

• s t im u lu s from 127 M H z to 140 MH z

• upper limit of −21 dB

• lower limit of −27 dB

Figure 1-61 Example Flat Limit Line

• To create a limit line that tests the low side of the filter, press:

100 M/µ

−65 x1

−200 x1

123 M/µ

1-78

Making Measurements

ADD

STIMULUS VALUE

M/µ

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

FLAT LINE

RETURN

ADD

STIMULUS VALUE

M/µ

DONE

LIMIT TYPE

SINGLE POINT

RETURN

Using Limit Lines to Test a Device

• To create a limit line that tests the high side of the bandpass filter, press:

146

−65 x1

−200 x1

160

Figure 1-62 Example Flat Limit Lines

Creating a Sloping Limit Line

This example procedure shows you how to make limits that test the shape factor of a SAW
filter. The following limits are set:

Frequency Range Power Range

123 MHz to 125 MHz −65 dB to −26 dB
144 MHz to 146 MHz −26 dB to −65 dB

1-79

Making Measurements

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

CLEAR LIST

YES

ADD

STIMULUS VALUE

M/µ

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SLOPING LINE

RETURN

ADD

STIMULUS VALUE

M/µ

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SINGLE POINT

RETURN

ADD

STIMULUS VALUE

M/µ

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SLOPING LINE

RETURN

ADD

STIMULUS VALUE

M/µ

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SINGLE POINT

RETURN

Using Limit Lines to Test a Device

1. To access the limits menu and activate the limit lines, press:

System

2. To establish the sta rt f r eque ncy a nd limits for a sloping limit li ne that tests the low side
of the filter, press:

−65 x1

123

−200 x1

3. To terminate the lines and create a sloping limit line, press:

−26 x1

125

−200

x1

4. To establish the start frequency and limits for a sloping limit line that tests the high
side of the filter, press:

−26 x1

144

−200 x1

5. To terminate the lines and create a sloping limit line, press:

−65 x1

146

−200 x1

You could use this type of limit to test the shape factor of a filter.

Figure 1-63 Sloping Limit Lines

1-80

Creating Single Point Limits

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

CLEAR LIST

YES

ADD

STIMULUS VALUE

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SINGLE POINT

RETURN

ADD

STIMULUS VALUE

UPPER LIMIT

LOWER LIMIT

DONE

LIMIT TYPE

SINGLE POINT

RETURN

In this example procedure, the following limits are set:

• from −23 dB to −28.5 dB at 141 MHz

• fro m −23 dB to −28.5 dB at 126.5 MHz

1. To access the limits menu and activate the limit lines, press:

Making Measurements

Using Limit Lines to Test a Device

System

2. To designate a single point limit line, as shown in Figure 1-64, you must define two
pointers:

• downward pointing, indicating the upper test limit

• upward pointing, indicating the lower test limit
Press:

−23 x1

141

M/µ

−28.5 x1

−23

−28.5 x1

126.5 M/µ

x1

Figure 1-64 Example Single Points Limit Line

1-81

Making Measurements

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

SEGMENT

SEGMENT

EDIT

UPPER LIMIT

DONE

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

SEGMENT

SEGMENT

DELETE

LIMIT MENU

LIMIT LINE

LIMIT LINE ON

EDIT LIMIT LINE

SEGMENT

LIMIT MENU

LIMIT LINE

LIMIT TEST ON

BEEP FAIL ON

Using Limit Lines to Test a Device

Editing Limit Segments

This example shows you how to edit the upper limit of a limit line.

1. To access the limits menu and activate the limit lines, press:

System

2. To move the pointer symbol (>) on the analyzer display to the segment you wish to
modify, press:

or repeatedly OR and enter the seg ment number

followed by .

x1

3. To change the upper limit (for example, −20) of a limit line, pr ess:

−20 x1

Deleting L imit Segments

1. To access the limits menu and activate the limit lines, press:

System

2. To move the pointer symbol (>) on the analyzer display to the segment you wish to
delete, press:

or repeatedly OR and enter the seg ment number

followed by .

x1

3. To delete the segment that you have selected with the pointer symbol, press:

Running a Limit Test

1. To access the limits menu and activate the limit lines, press:

System

Reviewing the Limit Line Segments

The limit table data that you have previously entered is shown on the analyzer display.

• To verify that each segment in your limits table is correct, review the entr ies by
pressing:

• To modify an incorrect entry, refer to the “Editing Limit Segments” procedure, loca ted
earlier in this section.

Activating the Limit Test

To activate the limit test and the beep fail indicator, press:

System

1-82

and

Making Measurements

BEEP FAIL ON

LIMIT LINE ON

BEEP FAIL ON

LIMIT MENU

LIMIT LINE

LIMIT LINE OFFSETS

STIMULUS OFFSET

Using Limit Lines to Test a Device

NOTE Selecting the beep fail indicator is optional and will add

approximately 50 ms of sweep c ycle ti me. Because the li mit test will sti ll work
if the limits lines are off, selecting is also optional.

The limit test results appear on the right side on the analyzer display. The analyzer
indicates whether the filter passes or fails the defined limit test:

• The message FAIL will appear on the right side of the display if the limit test fails.

• The analyzer beeps if the limit test fails and if has been selected.

• The analyzer changes the color of the trace to flashing red where the measurement
trace is out of limits.

• A TTL signal on the rear panel BNC connector "LIMIT TEST" provides a pass/fail
(5 V/0 V) indication of the limit test results.

Offsetting Limit Lines

The limit offset functions allow you to adjust the limit lines to the frequency and output
level of your device. For example, you could apply the stimulus offset feature for testing
tunable filters. Or, you could apply the amplitude offset feature for testing variable
attenuators, or passband ripple in filters with variable loss.

This example shows you the offset feature and the limit test failure indications that can
appear on the analyzer display.

1. To offs et all of the s egments in the l imit table by a fixed f requency (for example, 3 MHz),
press:

System

3 M/µ

The analyzer beeps and a FAIL notation appears on the analyzer display, as shown in

Figure 1-6 5.

Figure 1-65 Example Stimulus Offset of Limit Lines

1-83

Making Measurements

STIMULUS OFFSET

AMPLITUDE OFFSET

AMPLITUDE OFFSET

MARKER → AMP. OFS.

AMPLITUDE OFFSET

Using Limit Lines to Test a Device

• To return to 0 Hz offset, press:

0 x1

• To offset all of the segments in the limit table by a fixed amplitude, press:

5 x1

The analyzer beeps and a FAIL notation appears on the analyzer display.

• To return to 0 dB offset, press:

0 x1

• To offset the a mp litude offset value by the active marker reading, press
. Pressing shows the current value.

1-84

Making Measurements

Using Ripple Limits to Test a Device

Using Ripple Limits to Test a Device

Setting Up the List of Ripple Limits to Test

Two tasks are involved in preparing for ripple testing:

• First, set up the analyzer settings to view the frequency of interest.

• Second, set up the analyzer to test over the appropriate frequencies against your
specific lim its.

This example will show you how to set up the analyzer to test ripple limits. In this
example, we will be testing the pass band of a bandpass filter where the center frequency
of the filter is approximately 1.8 GHz and has a bandwidth of approximately 2.9 GHz.
Refer to Figure 1-66.

Figure 1-66 Ban dpass Filter Being Ripple Tested

Setting Up the Analyzer to Perform the Ripple Test

This section sets up the analyzer so that a bandpass filter can be easily viewed on the
analyzer di splay.

1. Connect your filter as shown in Figure 1-6 7.

1-85

Making Measurements

Trans: FWD S21 (B/R)

TRANSMISSN

AUTO SCALE

CALIBRATE MENU

RESPONSE

THRU

AUTO SCALE

Using Ripple Limits to Test a Device

Figure 1-67 Connections for an Example Ripple Test Measurement

2. Press and choose the measurement settings. For this example, the

Preset

measurement settings are as follows:

• or on ET models:

Meas

•

Center 1.8 G/n

•

Span 3.4 G/n

•

Scale Ref

You may also want to select setti ngs for the number of data points, power, averaging,
and IF bandwidth.

3. Substitute a thru for the device and perform a response calibration by pressing:

Cal

4. Reconnect your test device.

5. To better view the measurement trace, press . Refer to

Scale Ref

Figure 1-68.

1-86