Agilent 86030A
50 GHz Lightwave Component
Analyzer
Product Overview
2
Characterize 40 Gb/s
optical components
Modern lightwave transmission systems require accurate and repeatable
characterization of their optoelectronic, optical, and electrical components to guarantee high-speed
performance. The Agilent 86030A 50
GHz lightwave component analyzer
improves the design and specification
of these lightwave components by
accurately characterizing their bandwidth and reflection characteristics.
For manufacturers building 40 Gb/s
electro-optical, optical, and electrical
components used in high-speed OC768 lightwave systems, the 86030A is
necessary to completely characterize
these components at modulation frequencies up to 50 GHz. Components
such as photodiode receivers, lightwave modulators, and other optical
and electrical components used in 40
Gb/s lightwave systems can be characterized in either an R&D or manufacturing environment with the
86030A. This system provides you
with confidence in the devices you
design and manufacture for highspeed lightwave systems.
Electro-optical components
Often the limiting elements in a
fiber-optic transmission system are the
electro-optical components (e.g. photodiodes, and modulators) which convert the electrical information to
optical or vice versa. With the
86030A, calibrated measurements
of modulation band-width, responsivity, and modulation range of an
individual transducer are possible.
Optical components
Optical components such as fiber,
connectors, splitters, couplers,
and lenses make up much of a fiberoptic network. The 86030A measures the modulation bandwidth,
insertion loss, group delay, and optical return loss of these components.
Electrical components
Linear electrical components such
as amplifiers, filters, and transmission lines are used in fiber-optic
systems, and require characterization to ensure optimal performance.
Typical measurements are bandwidth, insertion loss or gain,
impedance match, and group delay.
Calibrated measurements
One of the key benefits of the 50 GHz
lightwave component analyzer is its
ability to perform calibrated measurements on optical components.
The system contains an O/E receiver
that has been factory calibrated in
magnitude, and characterized in
phase. The ability to make calibrated
measurements assures accuracy, reliability, and confidence in the components being measured. Additionally,
the laser source, optical modulator,
and calibrated O/E receiver are temperature stabilized which also
improves the accuracy and repeatability of the measurements.
Unique features
Several unique features are utilized
in the system to provide accurate measurements. A response and match calibration is available to remove the
mismatch uncertainty associated
with highly reflective O/E converters. Factory amplitude calibration
of the system uses a NIST traceable
laser heterodyne technique; a time
consuming procedure which provides
the most accurate calibration.
Factory phase characterization of the
system uses a new optical impulse
response technique to characterize the phase response of the internal O/E receiver. Additionally the
laser source, optical modulator, and
calibrated O/E receiver are temperature stabilized to improve the accuracy and repeatability of the
measurements.
Verification device
A verification device is included with
the system. It consists of an Agilent
83440D photo detector and it’s associated amplitude and phase data.
This verification device can be used
at any time to verify the measurement integrity of your system.
A guided verification routine is provided which measures the verification device, and displays a graph of
its response versus acceptable
tolerances (see Figure 1). The verification device can be used periodically to monitor system calibration,
and indicate when the optical test
set needs to be recalibrated. It can
also be used to resolve uncertainty
if unexpected results are obtained
from a test device. This verification
capability provides confidence in the
measurement integrity of the system.
Figure 1. Typical verification device measured data, with tolerance limit lines.
86030A lightwave component analyzer. Remote programming for the
86030A is over a private LAN interface using standard Microsoft(
Distributed Component Object
Module (DCOM) interfaces and commands, which allow accessing the
lightwave component analyzer application from a remote PC.
3
Guided measurement software
Guided measurement software that
is part of the system, provides an
easy-to-use operator interface (see
Figure 2). It provides pictorial diagrams of inter-connections for configuration, calibration, and
measurements. On-screen prompts
also guide the operator through the
entire measurement process, from
the calibration to the measurement.
Display, analysis,
and archiving of data
Display, analysis, and archiving of
data is easy and straightforward
with the system. The measured data
is displayed on the screen of the
8510C network analyzer (see
Figure 3). Full use of the analyzer’s
functions such as markers, data formats, and data scaling features are
available to the operator simply by
pushing the appropriate keys on the
network analyzer. Data can be
archived to disk in either ASCII text or
Microsoft
®
Excel formats. The
included Excel software allows
data to be displayed and analyzed
using standard Excel features and
formats (see Figure 4).
Remote programmability for manufacturing test applications
For manufacturing test applications,
it is often desirable to have a manu-
Accuracy and confidence in characterizing components
Modern lightwave transmission systems require accurate and repeatable characterizations of their
electro-optical, optical, and electrical components to guarantee highspeed performance. The ability to
make calibrated measurements with
the 86030A ensures the accuracy of
the measurements, while providing
you with confidence in your device
design, and device specifications.
Microsoft is a U.S. registered trademark of
Microsoft Corporation.
Figure 2. Typical guided measurement software screen for guided setup, calibration, and measurement.
facturing test computer control the
automated testing of your devices
under test. This client computer may
control many aspects of the testing
operation in addition to controlling
the 86030A lightwave component
analyzer. The 86030A version B.01.08
system software cont ains a remote
operation server and an application
program interface that allows you to
operate the 86030A remotely. This
allows manufacturing test programmers to develop automated test programs, which can control the
Figure 4. Typical measured data of an O/E converter displayed in Microsoft Excel format.
Figure 3. Typical data displayed on Agilent
8510C network analyzer.
S log MAG
12
REF –13.0 dB A/W
1.0 dB/
10
OPTICAL–ELECTRICAL BANDWIDTH MEAS.
C
H
–6
–8
–10
–12
–14
Responsivity (dB Below 1 Amp/Watt)
–16
–18
START
0.045000000 GHz
03–02–2000 09:35:08
50.000000000 GHz
STOP
18 JUN 00
04:38:21
–20
0 5 10 15 20 25 30 35
Modulation Frequency (GHz)
40
45 50
4
System block diagram
Figure 5. Simplified block diagram of lightwave test set.
Typical Measurement Repeatability
For a measurement system to be useful when characterizing a device, it must provide repeatable measurements. The relative frequency response error limit
specifications are quite large because the specifications
must contain all the potential measurement uncertainties, plus an adequate guard band. Typical measurement repeatability values are much smaller. Figure 6
illustrates the short-term repeat-ability of the system.
The same O/E device was measured two times with
two user calibrations and two device connections. As
can be seen from the plot, there is very little difference
between the two measurements. Figure 7 shows the difference; there is about a 0.1 dB offset due to connector
repeatability, and a ±0.05 dB difference to 40 GHz, and a
±0.2 dB difference from 40 to 50 GHz.
From 83651B To 8517B
Power
Splitter
Temperature
Stabilization
PMF
Directional
Coupler
Stabilization
Temperature
Laser
50 GHz Modulator
Bias Tee/
50 Ohm Term
AB
Optical
Output
Power
Temperature
Stabilization
3 dB
Pad
To 83651B
External ALC Input
AB
Directional
Coupler
Class IIIb
CW Laser
Output
PMF Jumper
Class IIIb
Modulator
Output
Input Coupled Test
Port
Optical
Receiver
Input
Reference Optical Receiver
Optical Receiver
RF OutputRFOutput
5
Figure 6. Typical short-term measurement repeatability; the two traces
overlay almost exactly.
Figure 7. Typical short-term repeatability difference.
Figure 8. Typical long-term repeatability.
Figure 9. Typical sweep-to-sweep repeatability.
Figure 10. Typical difference between two systems.
Typical sweep-to-sweep repeatability is illustrated in
Figure 9. It shows the standard deviation between
ten different swept traces.
Typical system-to-system repeatability is illustrated in Figure
10. It shows the difference between two measurements
of the same device measured on two different systems.
Figure 11 illustrates the difference between an O/E
device measured with an 86030A system, and a metrology
calibration of the device using a NIST traceable heterodyne technique.
Figure 11. Typical difference between metrology heterodyne measurement
of an O/E device and the 86030A.
Typical long-term repeatability is illustrated in Figure 8.
It shows the difference observed between two measurements taken 15 hours apart on an O/E device. No disconnection or recalibration was performed. It illustrates the
typical errors that can be expected due to system drift.
–6
–8
–10
–12
–14
Responsivity (dB Below 1 Amp/Watt)
–16
–18
–20
0 5 10 15 20 25 30 35
Modulation Frequency (GHz)
Measurement #1 Measurement #2
45 50
40
0.1
0.05
0
–0.05
–0.1
–0.15
dB Difference
–0.2
–0.25
–0.3
–0.35
0 5 10 15 20 25 30 35 40 45 50
Modulation Frequency (GHz)
0.025
0.02
0.015
0.01
Standard Deviation (dBe)
0.005
0
051015 20 25 30 35 40 45 50
Modulation Frequency (GHz)
1
0.8
0.6
0.4
0.2
0
–0.2
Difference Between Systems (dBe)
–0.4
–0.6
–0.8
–1
0 5 101520253035404550
Modulation Frequency (GHz)
0.3
0.2
0.1
0
dB Difference
–0.1
–0.2
–0.3
0 5 10 15 20 25 30 35 40 45 50
Modulation Frequency (GHz)
2
1.5
1
0.5
0
dB Difference
–0.5
–1
–1.5
–2
0 5 10 15 20 25 30 35 40 45 50
Modulation Frequency (GHz)
6
Specifications
System Specifications
General Specifications
Parameter Specification
Specified temperature range 20 °C to 30 °C
Operating temperature range
1
5 °C to 40 °C
Storage temperature range –40 °C to +75 °C
Power dissipation 1940 VA max.
Size 1.6 x 0.6 x 0.9 meters
General Optical/Electrical Specifications
Parameter Specification
Modulation frequency range
2
0.045 to 50 GHz
Optical source center wavelength 1550 to 1560 nm
Optical output return loss
3
> 30 dB
Optical input return loss
3
> 25 dB
Average optical output power (modulator set to minimum insertion loss)
4
> 3 dBm
Average optical output power
(modulator set at quadrature)
5
> 0 dBm
Average optical output power
(laser output port)
6
> 8 dBm
RF modulation power (for E/O mode)
7
0.045–30 GHz > 5 dBm
30–50 GHz > 2.5 dBm
Maximum operating optical input
power (to optical receiver input)
8
Do not exceed 4 mW
(6 dBm)
Maximum optical input power to
optical receiver (without damage) Do not exceed 15 mW
(11.8 dBm)
Optical to Electrical
Measurement Mode Specifications
Relative frequency response concerns itself with the
amount of error that accumulates when you compare the
response of two or more frequency points. This would
often be used in calculating the –3 dB roll-off point of an
optical detector. The largest contribution to this error
term is dependent on the reflectivity of the electrical
port of the O/E device. Thus, relative frequency
response is specified as a function of electrical port
reflectivity. The electrical reflectivity of any O/E device
can be measured using the E/E mode on the 86030A.
O/E Relative Frequency Response Uncertainty
9
DUT reflection coefficient
10
≤ 0.25 ≤ 0.5 ≤ 1.0
Specification Specification Specification
Freq. (dBe) (dBe) (dBe)
range With/without With/without With/without
(GHz) attenuator attenuator attenuator
0.1 to 2 ±0.7/0.8 ±0.7/0.9 ±0.8/1.2
2 to 20 ±0.7/1.0 ±0.8/1.4 ±1.0/2.0
20 to 40 ±0.9/1.3 ±1.0/1.7 ±1.2/2.4
40 to 50 ±1.2/1.8 ±1.3/2.3 ±1.6/3.2
For devices with highly reflective electrical ports, such
as unterminated photodetectors, the resultant mismatch uncertainty contributes to high measurement
uncertainty. Using an attenuator on the electrical port
of the 8517B will reduce mismatch uncertainty, and
thus reduce the total measurement uncertainty. The
above specifications are shown with a 6 dB attenuator
(supplied) on the electrical port of the 8517B, as well as
without an attenuator.
The system has the ability to characterize the mismatch
of the device under test, to reduce total measurement
uncertainty. A response and match user calibration is
used to reduce measurement uncertainty due to device
mismatch. With this calibration, relative frequency
response uncertainty is reduced, as shown in the following table.
O/E Relative Frequency Response Uncertainty
11
With response and match user calibration
Specification (dBe)
Frequency range With response and
(GHz) match user calibration
0.1 to 2 ±0.7
2 to 20 ±0.7
20 to 40 ±0.9
40 to 50 ±1.2
1
A user calibration is valid over a ±3.0°C deviation from the initial user
calibration temperature range.
2
Modulation frequency range is 0.045 to 50 GHz. System performance is
not specified at modulation frequencies from 45 to 100 MHz. System
specifications are for modulation frequencies from 0.100 to 50 GHz.
3
With factory new straight connectors. Improper connector care will
degrade this specification.
4
With the modulator set to minimum insertion loss value. This specification is the default value set by the system software. Other power levels
are settable from the system software.
5
With the modulator set at quadrature bias condition, which is the average of the minimum and maximum transmission state of the modulator.
This specification indicates the default value set by the system software.
6
Other power levels are settable from the system software.
7
Power measured at the RF output port of the 86032A optical test set.
System default power setting is 0 dBm. Other power levels are
settable from the system software.
8
Power in excess of this value will cause measurement inaccuracies.
9
This is the relative frequency response uncertainty (dBe). Specifications
are shown with a 6 dB attenuator on the electrical port of the 8517B test
set, as well as without an attenuator. Specification conditions: Response
and isolation calibration, step mode of operation, 512 averages, factory
default laser power setting, factory default optical modulation depth setting, and a signal-to-noise ratio greater than 20 dBe.
10
Device under test electrical port reflection coeff icient. Specifications are
shown for three different reflection coefficients.
11
Total relative frequency response uncertainty (dBe) which contains all of
the uncertainty components. Specification conditions: Response and
match calibration, step mode of operations, 512 averages, factory
default laser power setting, factory default optical modulation depth setting, and a signal-to-noise ratio greater than 20 dBe.
7
Absolute Noise Floor (O/E mode)
Frequency Range Specification
12
(GHz) (dBe)
0.1 to 0.2 –50
0.2 to 0.3 –60
0.3 to 0.5 –62
0.5 to 10 –70
10 to 20 –62
20 to 30 –56
30 to 40 –47
40 to 50 –42
Absolute Responsivity Uncertainty
Absolute responsivity uncertainty will be larger than
the relative responsivity error, due to additional uncertainty contributed by the calibration transfer process,
and the optical and electrical connector repeatability
error.
O/E Absolute Frequency Response Uncertainty13(A characteristic, not a specification)
DUT reflection coefficient
14
≤ 0.25 ≤ 0.5 ≤ 1.0
Frequency range With/without With/without With/without With response &
(GHz) attenuator attenuator attenuator match user calibration
(dBe) (dBe) (dBe) (dBe)
15
0.1 to 2 ±1.2/1.3 ±1.2/1.4 ±1.3/1.7 ±1.2
2 to 20 ±1.2/1.5 ±1.3/1.9 ±1.5/2.5 ±1.2
20 to 40 ±1.4/1.8 ±1.5/2.2 ±1.7/2.9 ±1.4
40 to 50 ±1.7/2.3 ±1.8/2.8 ±2.1/3.7 ±1.7
12
Absolute noise floor in O/E mode of operation. Units are dB electrical relative to 1 amp/watt. Specification conditions: Response and isolation calibration, step mode of operation, 512 averages, factory default laser power setting, factory default optical modulation depth setting, a signal-to-noise
ratio greater than 20 dBe. This noise floor specif ication pertains to O/E converters with responsivity less than 1 amp/watt. O/E converters with
large gain will cause the noise floor to rise.
13
Specifications are shown with a 6 dB attenuator on the electrical port of the 8517B test set, as well as without an attenuator. Specification conditions: Response and isolation calibration, step mode of operation, 1024 averages, factory default laser power setting, factory default optical modulation depth setting, and a signal-to-noise ratio greater than 20 dBe.
14
Device under test electrical port reflection coeff icient. Specifications are shown for three different reflection coefficients.
15
Total relative frequency response uncertainty (dBe) which contains all the uncertainty components. Specification conditions: Response and match calibration, step mode of operation, 512 averages, factory default laser power setting, factory default optical modulation depth setting, and a signal-tonoise ratio greater than 20 dBe.
8
Electrical to Optical
Measurement Mode Specifications
Relative frequency response concerns itself with the
amount of error that accumulates when you compare
the response of two or more frequency points. This
would often be used in calculating the –3 dB roll-off
point of a modulator. The largest contribution to this
error term is dependent on the reflectivity of the electrical port of the E/O device. Thus, relative frequency
response is specified as a function of electrical port
reflectivity. The electrical reflectivity of any E/O device
can be measured using the E/E mode on the 86030A.
E/O Relative Frequency Response Uncertainty
16
DUT reflection coefficient
17
≤ 0.25 ≤ 0.5 ≤ 1.0
Frequency Specification Specification Specification
range (GHz) (dBe) (dBe) (dBe)
0.1 to 2 ±0.6 ±0.8 ±1.3
2 to 20 ±0.9 ±1.3 ±2.1
20 to 40 ±1.0 ±1.5 ±2.5
40 to 50 ±1.4 ±2.1 ±3.4
Absolute Noise Floor (E/O mode)
Frequency Range Specification
18
(GHz) (dBe)
0.1 to 0.2 –55
0.2 to 0.3 –57
0.3 to 0.5 –60
0.5 to 10 –61
10 to 20 –58
20 to 30 –55
30 to 40 –53
40 to 50 –50
Absolute Responsivity Uncertainty (E/O mode)
Absolute responsivity uncertainty will be larger than
the relative responsivity error, due to additional uncertainty contributions by the calibration transfer process,
and the optical and electrical connector repeatability
error.
Absolute Responsivity Uncertainty
(A characteristic, not a specification)
DUT reflection coefficient
19
≤ 0.25 ≤ 0.5 ≤ 1.0
Frequency
range (GHz) (dBe) (dBe) (dBe)
0.1 to 2 ±1.1 ±1.3 ±1.8
2 to 20 ±1.4 ±1.8 ±2.6
20 to 40 ±1.5 ±2.0 ±3.0
40 to 50 ±1.9 ±2.6 ±3.9
Optical to Optical
Measurement Mode Specifications
Optical Noise Floor
Frequency Range Specification
20
(GHz) (dBo)
0.1 to 0.2 –24
0.2 to 0.3 –27
0.3 to 0.5 –30
0.5 to 10 –33
10 to 20 –30
20 to 30 –27
30 to 40 –22
40 to 50 –18
Electrical to Electrical
Measurement Mode Specifications
When configured as a lightwave component analyzer,
the specifications for the E/E mode of operation is similar to the 85107B 50 GHz vector network analyzer,
with the following exceptions. The user does not have
control of the RF power applied to the 8517B test set,
and the accuracy of the first points in a trace which are in
the 45 MHz to 500 MHz range is significantly degraded.
The full performance specifications of the 85107B,
which are shown in this document, are obtained by
reconnecting the 50 GHz 83651B source directly to the
8517B test set. These specifications are for a system calibrated with an 85056A 2.4 mm calibration kit using full
two-port error correction (with sliding load) user calibration.
16
Total relative frequency response uncertainty (dBe) which contains
all the uncertainty components. Specification conditions: Response
and isolation calibration, 512 averages, factory default laser power
setting, factory default optical modulation depth setting, and a signal-to-noise ratio greater than 20 dBe.
17
Device under test electrical port reflection coeff icient. Specifications
are shown for three different reflection coefficients.
18
Absolute noise floor in E/O mode of operation. Units are dB electrical relative to 1 watt/amp. Specification conditions: Response and
isolation calibration, 512 averages, factory default laser power setting, factory default optical modulation depth setting, and a signalto-noise ratio greater than 20 dBe.
19
Device under test electrical port reflection coeff icient. Specifications
are shown for three different reflection coefficients.
20
Optical noise floor is specified as dB below the 0 dBo loss reference.
Specification conditions: Response and isolation calibration, 512 averages, factory default laser power settings, factory default modulation
power setting, and a signal-to-noise ratio greater than 20 dBe.
9
Dynamic Range (for transmission measurements)
Frequency Range (GHz)
0.045–0.84 0.84–20 20–40 40–50
Maximum power +17 dBm +8 dBm +3 dBm –4 dBm
measured at port 2
Reference power +2 dBm –7 dBm –17 dBm –29 dBm
at port 1 (nominal)
Minimum power –75 dBm –97 dBm –91 dBm –90 dBm
measured at port 2
Receiver dynamic 92 dB 105 dB 94 dB 86 dB
range
System dynamic 77 dB 90 dB 74 dB 61 dB
range
Measurement uncertainty
Reflection measurements
Magnitude Phase
Transmission measurements
Magnitude Phase
Measurement Port Characteristics
21
Frequency range (GHz)
Residual 0.045–2 2–20 20–40 40–50
Directivity 42 dB 42 dB 38 dB 36 dB
Source match 41 dB 38 dB 33 dB 31 dB
Load match 42 dB 42 dB 38 dB 36 dB
Reflection tracking ±0.001 dB ±0.008 dB ±0.02 dB ±0.027 dB
Transmission tracking ±0.014 dB ±0.043 dB ±0.110 dB ±0.137 dB
Crosstalk 99 dB 110 dB 93 dB 81 dB
21
After a user calibration with full 2-port error correction.
Receiver noise floor
10
Maximum Input Power to the 8517B Test Ports
The following maximum power levels into the 8517B
test set ports should not be exceeded in order to avoid
an IF overload condition in the receiver, which can
cause a non-linear receiver error.
Frequency range Max power into
(GHz) 8517B test set (dBm)
0.045 to 2 +18
2 to 20 +8
20 to 40 +4
40 to 50 –3
Typical Optical Modulation Power
This table shows the typical optical modulation power
available from the output of the laser modulator with factory default settings.
Frequency range Typical optical
(GHz) modulation power (dBm)
0.045 to 0.84 0
0.84 to 20 –3
20 to 40 –5
40 to 50 –10
Optical Test Set Typical Characteristics
The system has the ability to monitor input and output
power levels.
Laser power setting accuracy:
±0.5 dB over the 0 to 10 dBm range.
Output power monitor accuracy:
±0.5 dB over the –10 to 5 dBm range.
Input power monitor accuracy:
±0.5 dB over the –10 to 5 dBm range.
Configuration Options
86030A-120: 110-130 volt a.c. power operation
86030A-230: 220-240 volt a.c. power operation
86030A-011: Diamond HMS-10 optical connector interface
86030A-012: FC/PC optical connector interface
86030A-013: DIN 47256 optical connector interface
86030A-014: ST optical connector interface
86030A-017: SC optical connector interface
Ordering Information
For more information, or to order a system, contact your
local sales engineer.
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Product specifications and descriptions in this document subject to change without notice.
© 2000, 2002 Agilent Technologies, Inc.
Printed in USA September 27, 2002
5968-9734E
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