12 Gb/s error performance analyzer
Accurately
characterize
your Gbit
systems and
devices
71612B
HP
Design and manufacture reliable
Gbit transmission modules and
system hardware
Fast transition time and low jitter of the data
output eye diagram at 12 Gb/s.
Use the HP 71600 Series of Gbit
testers to measure bit error
ratio (BER) and to verify the
performance and quality of your
components and system
hardware.
• Lightwave submarine cable
systems
• SONET/SDH synchronous
network transmitters and
receivers
• Gbit datacom serial links
• Lasers and photodetectors
• High-speed logic devices
• Optical amplifiers and
modulators
• Decision circuits
• Multiplexers and output drivers.
For high-performance pattern
generation and error analysis
across the entire 100 Mb/s to
12 Gb/s range, use an HP 71612B
error performance analyzer with
optional low-rate clock.
See captured errored bit on an oscilloscope. 8 Mbit programmable memory allows creation
Thoroughly test and verify
device performance
When looking at pulse shapes,
eye diagrams and waveform
distortions, use the pattern
generator with a high-speed
oscilloscope from the HP 83480
Series for characterizing
components up to 12 Gb/s.
Both pattern generator and error
analyzer provide a wide range of
PRBS and user-defined patterns,
with versatile triggering facilities.
And to help you identify the
address of the errored bits use
optional error location analysis.
Once the position of an errored
bit is identified, the flexible
triggering features can be used
to view the errored pattern on an
oscilloscope for further
diagnosis.
of complete, structured SONET and SDH frames
on the HP 71612B analyzer’s display.
• Exceptional waveform
performance (even with
reflective or poor
terminations)
• Display maybe totally
dedicated to pattern editing
• Error location analysis identifies
individual errored bits in custom
patterns; measure bit, block or
total pattern BER
• Flexible pattern trigger allows
oscilloscope to be triggered on
any bit in custom pattern,
allowing errored bits to be
displayed on oscilloscope
• Cost effective addition of
12 Gb/s jitter analysis with the
HP 71501C jitter analyzer
• Eye line display with HP 83480A
communications analyzer
• Q measurement and eye-contour
analysis with HP E4543A
application software.
The HP 71600 Series of
Gbit testers help you be more
competitive in today’s
rapidly developing global
communications marketplace
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Design better lightwave
and Gbit devices
Optional, powerful eye analysis features are enabled when the HP 83480A is used with an HP 71600 Series pattern generator.
HP Eye line mode allows recovery of low level eye diagrams from the noise, and display of the eye diagram as continous traces
instead of dots. (Above example shows unfiltered laser output.)
Create powerful, practical
test patterns
Perform real-time editing of your
longest test patterns, too. Use
the efficient, on-screen pattern
editor to copy, cut, and paste at
the touch of a key, then save
patterns to the non-volatile
memory or to the integral
flexible disk. The large CRT
displays in binary or hex, as
you wish.
Thoroughly stress test
components and sub-systems
Use your own patterns that
accurately represent the type of
signal carried by a transmission
system.
Simulate multiple SONET/SDH
frames, and check out alarms
and frame alignment circuits.
The error performance analyzer
has over 8 Mbit of user-programmable memory. This is large
enough for your most complex,
structured test patterns and
ideal for up to six OC-192/
STM-64 frames.
Efficiently edit and transfer
patterns off-line
To help you start testing, we’ve
included a disk with sample
SONET/SDH frames and with
clock-recovery stress patterns.
In addition, use HP E4544A
STM-64/OC-192 functional test
application software with a
personal computer off-line to
create, edit, and store your own
SONET/SDH test patterns. This
way, it’s also easy to exchange
test patterns among your other
test stations.
Easily investigate patterndependent errors
It’s often important to know how
devices and systems such as line
terminals and multiplexers
respond to sudden changes of
pattern. So, use the “hitless”
pattern switch to change
error-free between two patterns.
Each may be up to 4 Mbit long.
Improve productivity
– set up and measure fast
The auto-decision error
detector threshold setting, and
auto-phase alignment simplify
measurements for you.
They quickly and automatically
locate the optimum decision
point in the eye, clearly
displaying eye width and height
for user-defined error ratio
thresholds.
View only the measurements of
interest to you by building a
display from any of the set of
standard measurements.
Improve device performance
specifications
When making accurate
measurements on critical
devices you need the very fast
transition times and low jitter
capability typical of an
HP 71612B error performance
analyzer.
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