5
Table A-2. Supplemental characteristics (continued)
Parameter Agilent 66321B/66321D; Agilent 66319B/66319D
Agilent 66319B/66319D output 2 only
output1 only
Dynamic measurement system
1
Buffer length: 1 - 4096 points NA
Sample rate range: 15.6µs - 31200s
Voltage or current: 50 ms average
Measurement time
(includes 30 ms
2
data acquisition
time and 20 ms data processing
overhead)
Command processing time 4 ms average
(time for output to begin to change
following receipt of digital data)
Savable instrument states 4 (in locations 0 to 3)
(applies only in SCPI mode)
GPIB interface capabilities Language: SCPI
Interface: AH1, C0, DC1, DT1, E1,
L4, PP0, RL1, SH1, SR1, T6
INH/FLT characteristics Maximum ratings: 16.5 Vdc between terminals 1 and 2; 3 and 4;
and from terminals 1 or 2 to chassis ground
FLT terminals: Low-level output current = 1.25 mA max.
Low-level output voltage = 0.5 V max.
INH terminals: Low-level input voltage = 0.8 V max.
High-level input voltage = 2 V min.
Low-level input current = 1 mA
Pulse width = 100 µs min.
Time delay = 4 ms typical
Digital I/O characteristics Maximum ratings: same as INH/FLT Characteristics
Digital OUT port 0, 1, 2 Output leakage @ 16V = 0.1 mA (ports 0,1)
(open collector) = 12.5 mA (port 2)
Output leakage @ 5V = 0.1 mA (ports 0,1)
= 0.25 mA (port 2)
Low-level output sink current @ 0.5 V = 4 mA
Low-level output sink current @ 1 V = 50 mA
Digital IN port 2: Low-level input current @ 0.4 V = 1.25 mA
(internal pull-up) High-level input current @ 5 V = 0.25 mA
Low-level input voltage = 0.8 V max.
High-level input voltage = 2.0 V min.
Isolation to ground 50 Vdc
(Maximum from either output
terminal to chassis)
Mains input ratings: 100 Vac (87-106 Vac): 1.7 A, 125 W 2 A, 170 W
(at full load from 47-63 Hz) 115 Vac (104-127 Vac): 1.5 A, 125 W 1.7 A, 170 W
220 Vac (191-233 Vac): 0.8 A, 125 W 0.92 A, 170 W
230 Vac (207-253 Vac): 0.75A, 125 W 0.85A, 170 W
1. For a pulse waveform, the accuracy of any individual data point in the buffer depends on the rise time of the pulse. For a current pulse of 1.4A
with a rise time constant of 50µs, the error in measurement of a single data point during the rise time is » 10mA.
2. May be reduced by changing the default conditions of 2048 data points but measurement uncertainty due to noise will increase.