Agilent 5965-7742E IC-CAP Device Modeling Software - Technical Overview c20141015 [13] Datasheet
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Keysight Technologies
IC-CAP Device Modeling Software
Complete and Accurate Parameter Extraction
for Semiconductor Device Modeling
Technical Overview
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02 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
About IC-CAP
IC-CAP (Integrated Circuit Characterization and Analysis Program) is the industry standard
software for DC and RF semiconductor device characterization and modeling. IC-CAP extracts
accurate compact models for use in high speed/digital, analog and power RF applications.
IC-CAP offers device engineers and designers a state of-the-art modeling tool that fills numerous modeling needs, including automated instrument control, data acquisition, parameter
extraction, graphical analysis, simulation, optimization, and statistical analysis. All of these
capabilities are combined in a flexible, automated and intuitive software environment for efficient and accurate extraction of active, passive and user-defined devices and circuits. Today’s
most advanced semiconductor foundries and Integrated Device Manufacturers (IDMs) rely on
IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride
(GaN), and many other device technologies.
Features At a Glance
– Open software architecture enables
you to achieve maximum accuracy
by integrating your own modeling
expertise and methodologies, and
provides ultimate flexibility to
create and automate measurement,
extraction and verification
procedures.
– Turnkey extraction solutions for
industry standard CMOS models,
such as BSIM3/BSIM4, PSP, HiSIM,
and HiSIM_HV minimize the learning
curve and maximize model accuracy.
– Unique nonlinear high-frequency
modeling with Keysight NeuroFET,
Root models, high frequency BJT,
MESFET, PHEMT, and state-of-theart VerilogA models.
– Direct links to most commercial
simulators (e.g., ADS, HSPICE,
Spectre, and ELDO) ensure
consistency between extracted
models and the simulators used by
circuit designers.
– The most advanced and complete
on-wafer automated measurement
and characterization environment
with IC-CAP Wafer Professional.
– Powerful data handling capabilities.
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03 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
The IC-CAP Platform – A Complete Device Modeling Solution
The semiconductor industry faces
continuing challenges to maximize product
performance and yield, decrease time-tomarket, and reduce production costs. As
device geometries get smaller, the need
to use accurate models and to control
statistical variations in device processing
performance becomes ever more important.
Typical circuit operating frequencies
continue to advance well into the RF and
microwave frequency range. Accurate device
models are critical to circuit simulation
convergence and accuracy. Circuit designers
need models that can accurately predict
device behaviors at DC, as well as in the RF
and microwave regions.
Different process technologies require
a variety of models that can be quickly
adapted to the unique processes. Modeling
software must therefore, be able to provide
modeling engineers with the flexibility
to modify and extend model parameters
beyond those offered by standard models. To
optimize performance and control variations,
device designers and process engineers
need both accurate models and statistical
analysis capabilities. For circuit designers,
both capabilities are a requirement for
determining nominal performance, as well
as extreme or worst-case behaviors.
The amount of data measured for device
modeling purposes has been increasing
exponentially. With modeling measurement
taking several hours, or even days, it is
important to be as efficient as possible,
without compromising measurement accuracy. Measurement control software must
work in conjunction with the prober native
control software, as well as with
each instrument, to allow automated
measurements across temperature.
advantages to companies within the semiconductor industry.
IC-CAP modeling software offers modular
products so that you can choose precisely
the modules required for your particular
modeling scenario. Central to the IC-CAP
platform is the IC-CAP software environment, which supports graphical analysis,
programming via parameter extraction
language, and custom model and user
interface development. An analysis module
is required in most modeling applications
for simulation, optimization and interfacing
to external simulators. IC-CAP supports an
extensive list of measurement instruments
including DC, LCRZ and RF.
The most advanced
automated measurement
solution
With IC-CAP Wafer Professional (WaferPro),
IC-CAP provides the most advanced solution
for device modeling automated measurement. A dedicated test plan environment
within the IC-CAP Platform allows the test
engineer to measure and post process data
using a variety of Keysight and third-party
instrumentation.
Accurate Keysight
proprietary and industry
standard models
IC-CAP contains accurate models for
building and maintaining up-to-date model
libraries. Within a single environment, you
can use IC-CAP to automate measurements,
simulate device performance, extract
data, optimize model parameters, perform
statistical analysis, and generate worst-case
models. IC-CAP provides extraction routines
for industry standard, as well as Keysight
Technologies, Inc. proprietary models for
diodes, BJT, MOSFET, MESFET, HEMT, noise,
thermal models, and others. Extraction
modules offer complete DC to RF parameter
extraction capabilities. In addition, IC-CAP
supports models and extraction routines
that are developed by third parties, as well
as numerous other simulation software
packages, to accommodate a wide range
of customer requirements. IC-CAP also
supports the use of VerilogA models.
RF and microwave modeling
capabilities
Accurate modeling of RF effects requires
reliable measurement data. Building on
proven strengths in RF and microwave test
and measurement, Keysight EEsof EDA
provides configurations for a variety of RF
instruments such as the Keysight PNA,
PNA-X and ENA series. IC-CAP RF extraction
modules for proprietary and industrystandard models include RF-dependent
parameter extraction, ensuring your models
are suitable for high-frequency circuit
simulation.
environment
IC-CAP operates in an open and flexible
software architecture. Although we provide
turnkey modeling solutions for many industry standard and proprietary models, most
measurement and extraction algorithms
can be modified by the user. Using the
IC-CAP parameter extraction language (PEL)
or the new Python programming environment, you can define and add your own
models or extraction methodologies directly
into IC-CAP. When necessary, the IC-CAP
open measurement interface allows you to
write your own measurement drivers to control instruments. It is also possible to design
custom modeling packages for others to use
by implementing custom user interface
dialogs with IC-CAP GUI Studio.
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04 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Making Measurements with IC-CAP
Successful device modeling requires
accurate measured data and a thorough
understanding of the complex integration
between the measurement hardware and
the modeling software. The IC-CAP software
is a powerful modeling tool that automates
Keysight instruments and systems. Its
measurement interface provides turn-key
measurement drivers for a variety of single
instruments and modeling systems configuration for DC, CV and RF measurements.
The measured data is collected and stored in
IC-CAP and can be directly used for parameter extractions and optimizations of compact
device modeling. See Table 1 on page 8 for a
list of supported instrument drivers.
IC-CAP Wafer Professional
In addition to the comprehensive built-in
instrument library, IC-CAP’s newest product
addition, WaferPro, provides the ability to
drive Keysight measurement equipment
(from top bench instruments to parametric
testers), as well as third-party probers,
switch matrices and thermal chucks to
execute efficient, automated on-wafer
measurements across temperature. IC-CAP
WaferPro is integrated into the IC-CAP
platform and takes advantage of its powerful
measurement and programming environment to enable a custom library of efficient
measurement routines (e.g., adaptive
measurement algorithms) that can greatly
reduce the overall measurement time. Since
the measurement routines are in the IC-CAP
environment, either simple or complex
post processing (such as calculation of
spot measurements or figures of merit, RF
de-embedding and direct extraction), can
be applied to measured data before data is
saved. Data are saved in either file or SQL
Database formats. Sweep data are typically
saved to IC-CAP MDM file format, while
spot measurements are saved to Excel .csv
files. To achieve the most efficient data
query and import of high volume measured
data, data can be saved into SQL Database
file. IC-CAP provides an dedicated API to
query and import data back into IC-CAP.
See Table 2 on page 8 for a list of probers,
switching matrixes and thermal chucks
supported by WaferPro.
Test plan run page and its
log information with display
capabilities. The display also
shows the DUT information,
as well as all the calculated
data (or spot data) included
in this routine.
WaferPro
IC-CAP DataPro
After collecting and storing data to file or
SQL Database, IC-CAP Data Selection and
Processing tool (DataPro) allow users to find
the golden/typical die for modeling. DataPro
applies statistical analysis on measured data
and/or on custom key figures of merit (such
as gm, ring oscillator freq, etc.) and based
on statistical distribution and variances,
outliers can be identified and excluded from
further analysis. The typical (mean) and corners data are identified and their data can be
exported to other tools for target, typical or
corner modeling.
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05 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Extracting Models with IC-CAP
A typical modeling procedure involves selecting a model based on the device technology and its final circuit application (e.g., DC, high frequency
or both), making the necessary measurements to characterize a device or a set of devices, and then applying an extraction algorithm to calculate
the model parameters to minimize discrepancies between measured and simulated data. This last step is achieved by either calculating the
parameters using built-in or custom model equations from measured data, or by using tuning or optimization techniques.
IC-CAP provides the platform and tools engineers need to develop their own extraction methodologies. Turnkey modeling extraction packages
for users who need to be up and running extracting models by day one are provided by both Keysight and third-party vendors.
The IC-CAP platform provides the following key tools:
– Advanced Graphical User Interface (GUI)
The IC-CAP GUI enables you to create and
manage measurement and modeling projects,
and read, organize and display data using single or multiple plot window displays. Multiplot
windows allow for an unlimited number of
plots, easy navigation and
zooming capabilities.
– PEL and Python Programming
Measured or simulated data is organized in
IC-CAP Measured or simulated data is organized in IC-CAP units called “setups.” Each
setup provides the ability to post-process and
display data. Data post processing is done
real time using PEL or Python. IC-CAP PEL is
a simple to learn language that is similar to
HP Basic while Python is a modern, object
oriented and very powerful language that
maximizes speed and productivity.
These powerful interpreted languages can
be used to manipulate data, and create
extraction and measurement algorithms
within the IC-CAP environment.
Both PEL and Python allow you to interactively develop new models and extraction
routines, and modify existing extraction
modules, making IC-CAP an extremely
open and flexible working environment.
code outside the IC-CAP environment.
– Efficient Data Management
The IC-CAP Data Manager allows you to
import/export data in an ASCII file format.
This format, which has extension .mdm,
is now recognized as a standard in the
device modeling community and many
measurement tools export data into this
IC-CAP unique format. Data in other file
formats such as .csv, .s2p, and .xls can
also be written and imported.
The new IC-CAP SQL Database link allows
saving measured data into SQL Database
and later import data back into IC-CAP for
modeling.
– Wide Choice of Industry
Standard Simulators
Each IC-CAP project can simulate a
user-defined netlist, which typically
includes the model card and optionally,
a subcircuit to be extracted. The IC-CAP
simulator engine creates and maintains a
Parameter Table based on the model and
subcircuit parameters.. IC-CAP includes
three SPICE simulators and provides direct
links to several external simulators (listed
in Table 3). The analysis license includes
the ability to simulate linear and transient
analysis with the powerful Keysight ADS
simulator at no extra charge.
– Powerful Optimizers
IC-CAP contains 13 optimization algorithms. Using a combination of different
optimization algorithms can be a real
advantage when it comes to enhancing
the model’s fit. A large number of parameters can be optimized to a large number
of weighted data sets. In addition, to
automated optimizers and manual tuners,
which can be invoked by PEL, a powerful
tool called Plot Optimizer makes dynamic
interactive optimization easy. The Plot
Optimizer is a user interface that enables
you to quickly set up all parameter
optimization tasks on the fly. You can
open the Plot Optimizer from every
IC-CAP plot and automatically load the
target and simulated data for a quick
tuning and optimization.
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06 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Extracting Models with IC-CAP [continued]
– Automation with Macros
Tasks within an extraction, or even entire
extraction routines, can be automated
with macros. A macro is a single programming routine that executes a series
of IC-CAP commands, functions, PEL
programs, or calls to the user environment. With macros, extraction techniques
developed in R&D can be automated
and leveraged to your production areas
where minimal user interaction and high
productivity are desired.
– IC-CAP GUI Studio
The GUI Studio adds powerful capabilities
for custom graphical user interface
development to the highly flexible IC-CAP
software environment. IC-CAP Studio
provides users with the ability to directly
create UIs tailored and customized for
specific contexts and users. An engineer
uses IC-CAP Studio to develop a user
interface that automates and simplifies an
entire measurement or extraction process
flow. The customized and optimized UI
modeling environment can then scan
then be shared and exchanged with other
colleagues or outside customers who can
easily comprehend the flow and quickly
perform the necessary measurement and
extraction steps.
CMOS modeling
IC-CAP provides powerful turnkey extraction
packages for all CMC industry-standard
CMOS models: BSIM3, BSIM4, BSIMSOI,
PSP, HiSIM, and HiSIM_HV. The CMOS
Extraction packages all share a common
architecture, which makes it possible to use
the same measured data to extract different
CMOS models.
The packages provide the following key
features:
– DC, CV and temperature dependent mod-
eling with geometry scaling and binning.
– New user interface makes CMOS model-
ing easy and convenient.
– Open and flexible extraction methodol-
ogies. All packages come with a robust
extraction methodology that can be highly
customized to adapt to specific process
technologies.
– Where fine-tuning and optimization is
necessary, the extraction process guides
you through predefined optimizer and
tuner steps.
– Powerful multiplot data display allows
users to create and customize plots,
including geometry and temperature
scaling plots.
– Automatic generation of complete model
documentation in HTML format.
– Automatic failure tracking and reporting
during measurement and extraction
process.
– Highly accurate RF extraction methodolo-
gies with enhanced, scalable RF gate and
substrate resistance models.
– Target modeling capabilities. Target mod-
eling allows users to extract a preliminary
model based on targets (spot data) or
re-center an existing model to match new
process specs.
– Corner modeling extraction. Based on
process parameters statistical variations
and the typical extracted library, this
package allows the user to extract corner
libraries for a CMOS process. The final
library can then be verified for a range of
devices, temperatures and bias conditions
on all supported simulators.
The CMOS extraction packages are regularly updated to support the latest model
versions. Please check the web for updated
information on supported versions and
simulators.
In addition to the CMC compact models,
IC-CAP provides legacy extraction packages
for the NXP’s MOS Model 9, UCB level 2,
3 models, and the data-based Root MOS
Model. Please see Table 4 for a complete
list of CMOS modeling packages and their
product numbers.
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07 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Extracting Models with IC-CAP [continued]
BJT modeling
BCTM VBIC BJT Model in blue since it is a
product. Model VBIC is an abbreviation for
the Vertical Bipolar Inter-Company, a public
domain model developed by the Bipolar
Circuits and Technology Meeting (BCTM)
consortium. It models quasi saturation,
avalanche, and substrate effects. The latest
release includes self-heating effects.
High Frequency BJT Modeling Package
This package includes extractions for the
Gummel-Poon model, which has been the
industry standard model for BJT devices for
decades. The package includes a special
version of the GP model extraction, which
is well suited for RF applications. Here,
CV measurements are replaced with
S-parameter measurements, making the
junction capacitance extraction more
convenient and accurate. Improved methods
for extracting ideality, base resistance and
reverse early voltage are also included. In
addition to the standard GP, the package
offers extraction for the Keysight EEBJT2
model, a modified GP model to improve the
accuracy of both AC and DC behavior.
This Package also includes the extraction
of the MEXTRAM CMC Industry standard
bipolar model. Its extraction has been implemented in IC-AP through work jointly carried
out by Philips/NXP Research Labs, TU Delft
and Keysight EEsof EDA. Extensively used
within Philips/NXP, the model has proven to
be extremely robust and accurate.
MESFET modeling
The High Frequency MESFET and PHEMT
Modeling Package includes extractions for
the following models:
Angelov-GaN Model
Modeling Gallium Nitride (GaN) devices is
challenging due to the impact of trapping
and thermal effects on the device electrical
characteristics. Standard GaAs models are
not accurate enough for this type of device.
The Angelov-GaN model, developed by
Prof. I. Angelov at Chalmers University of
Technology, is quickly establishing itself as
the industry’s solution. Keysight’s W8533
IC-CAP Angelov-GaN extraction package
provides a dedicated software environment
that allows users to perform the necessary
measurements and extraction of the
Angelov-GaN model. Typical DC and network
analyzers are supported for making DC and
S-parameters measurements and de-embedding. A convenient user interface lets users
execute a step-by-step extraction flow to
extract the model parameters. A turn-key
flow provided in the package enables
complete customization. Simulations are
performed using Keysight ADS.
Curtice, Statz MESFET
models
The package includes extraction routines
for three popular industry-standard MESFET
models: the Curtice quadratic, Curtice
cubic and Statz (Raytheon). The differences
between the three models are in the
empirical relationships that describe the
DC and AC characteristics of the device.
IC-CAP extracts the model parameters
from a combination of DC and S-parameter
measurements.
EEFET3/EEHEMT1 models
These are empirical, nonlinear models for
general GaAs FET or HEMT applications,
including large-signal, three-terminal IC and
packaged devices. They accurately model
DC and bias-dependent S-parameters, time
delay, sub-threshold current, and dispersion
of Rds. Also included is the drain current
model based on Keysight EEsof EDA original
equations and advanced models for Cgs and
Cgd, including transcapacitance effects.
Static self-heating effects in drain current
are also taken into account. The modules
provide highly automated parameter
extraction techniques with package parasitics extracted automatically. HEMTs are similar to MESFETs, but with one distinguishing
difference in the behavior of Gm versus Vgs.
EEHEMT1 is a superset of EEFET3 and has a
set of analytic functions for modeling the Gm
compression of a HEMT.
Root MESFET/HEMT models
These are process and technology independent, data-based models for large-signal,
three-terminal applications. They model
nonlinearities of GaAs FETs and HEMTs,
including frequency dispersion. These
models are scalable for varying geometries
and feature automated data acquisition as
well as high-speed model generation.
The Root MESFET/HEMT model creator
is included in the Root Models generator
software license.
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08 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Extracting Models with IC-CAP [continued]
Keysight NeuroFET Model
The NeuroFET is a measurement-based
model that uses Artificial Neural Network
(ANN) to describe the device measured
states, charges and currents. The ANN
is made up of simple, interconnected
functions, called neurons, with weighted
connections. These functions are infinitely
differentiable, providing a good distortion
behavior and they also work well on the
boundaries and outside the measured
regions resulting to a better convergence
behavior in the simulator.
Advantages of the NeuroFET:
– Usable for all bias condition (even
Vds ≤ 0 as may happen in switches)
– Improved DC and RF convergence,
compared to table-based models
– Improved distortion simulation at low
amplitude, compared to table-based
models
– More accurate S-parameters vs. bias
– Better PAE simulation
– The model is general and works for
HEMT, FET
Third-party models
Open framework and
development environment
The unique open and flexible IC-CAP
framework enables third-parties to design
and develop models and related extraction
packages that work as add-ons in the
IC-CAP environment. This is possible thanks
to the IC-CAP GUI Studio and PEL capabilities. IC-CAP GUI Studio and PEL enable third
parties to design and implement custom
extraction packages, with specific user
interfaces and related extraction routines.
BSIMSOI3v2 and EKV 2.6 Extraction
Packages are available from ADMOS
www.admos.de
HiCUM and VBIC Extraction Toolkits are
available from X-MOD
www.xmodtech.com
The IC-CAP NeuroFET Extraction package
controls the necessary data acquisition (DC
and S-parameters measurements that are
necessary to extract the model), includes
some basic deembedding). The ANN training
is then accomplished through a specific
error optimization procedure. The output
model file can then be simulated via ADS
within the IC-CAP environment. The model
can be verified by comparison to the original
data or if available, to other measured data,
such as non linear measurements (not
provided).
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09 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
The IC-CAP product includes 5 major components:
– IC-CAP Core Environment
– IC-CAP Simulation and Analysis
– IC-CAP Instrument Connectivity
– IC-CAP Wafer Professional (WaferPro)
– IC-CAP Data Processing and selection (DataPro)
IC-CAP is available as a complete Modeling Platform Bundle or as individual modules to give you the flexibility of choosing the exact modeling
capabilities you need. In addition to the suite, the IC-CAP WaferPro Measurement Bundle is also now available and provides all the capabilities
to make on-wafer automated measurements. In addition to these 5 base components, turnkey extraction modules are available (see Table 4).
Keysight W8500 IC-CAP
Modeling Platform Bundle
The Keysight W8500 modeling suite provides
the basic tools you need to start measuring
and modeling devices and circuits. The
modeling suite consists of the following
components:
– W8501 Core environment
– W8502 Simulation and Analysis
– W8520 Instrument Connectivity
The modeling bundle lets you set up custom
extraction routines, measure data using
instrument drivers, analyze results, perform
simulations, and optimize extracted parameters. Hundreds of modeling examples are
available at no extra cost as a starting points
to build and design your own extraction
toolkits.
Keysight W8511 IC-CAP Wafer
Professional Measurement Bundle
The W8511 provides the ability to run
automated DC, CV and RF measurement
on-wafer using WaferPro. It includes the
following components:
– W8501 Core Environment
– W8520 Instrument Connectivity
– W8510 IC-CAP Wafer Professional
(WaferPro)
IC-CAP WaferPro works within, and in
conjunction with, the IC-CAP platform and
lets users create and execute automated
test plans. See the W8510 WaferPro section
below for more details. Note that this bundle
does not include the W8502 Simulation and
Analysis which must be added to run the
test plan in simulation mode.
Keysight W8501 IC-CAP
Core Environment
The W8501 is the IC-CAP framework. It
allows you to perform mathematical transforms, customize plots, write and Python
macros, create extraction routines using
PEL, and write user-defined functions using
the C programming language. An extensive
function library is included. Also included is
IC-CAP Studio, which allows you to develop
custom graphical user interfaces.
The W8501 also provides a new PEL API
to query IC-CAP SQL Database and quickly
import selected data into the IC-CAP environment.
Keysight W8502 analysis
module
The analysis module is the IC-CAP simulator
engine that provides the ability to simulate
device or circuit performance using the
default simulator ADS, the built-in SPICE
simulators or by linking to a wide range
of other external simulators. The ability to
simulate linear (DC, CV and AC) and transient simulation with ADS is included. Links
to other (SPICE) simulators can be added
using the IC-CAP open simulator interface.
Please refer to the web for a complete list of
supported simulator links and their versions.
Agielnt W8520 Instrument
Connectivity
Measurement drivers allow IC-CAP to
control and automate the measurement
instruments required to characterize your
device or circuit. Table 1 lists the wide range
of Keysight instruments that are supported
with built-in drivers. All C-V, DC, AC, Time
Domain and Noise instrument drivers are
included in this license.
In addition to turnkey built-in drivers, users
can add links to other instruments using
the IC-CAP open measurement interface or
using PEL to send write/read commands to
any instrument connected to the GPIB bus.
Keysight W8510 Wafer
Professional (WaferPro)
IC-CAP WaferPro is a powerful test plan
suite specifically designed for on-wafer
DC/CV and RF measurements. WaferPro
allows users to create and execute
automated test plans by managing wafer
map and device information, measurement
routines and conditions. WaferPro includes
several built-in measurement routines, yet
is flexible enough for users to customize
the measurement and calculation of
post-processed data. Measured sweep data
is saved to IC-CAP MDM files, while spot
measurements are conveniently saved to
.csv files (MS Excel Comma Limited Files).
For high volume applications, WaferPro can
also save data to IC-CAP SQL Database.
The SQL Database has been specifically
designed to store on-wafer measurement
data and has a built-in flexibility to accommodate a variety of custom data. SQLite and
MySQL are supported. WaferPro supports all
IC-CAP instruments, including the Keysight
Parametric 407x and 408x Parametric Test
Systems and a variety of industry-standard
fully and semi-automated probers. See Table
2 on page 8 for a list of Probers, Switch
Matrixes and thermal Chucks supported
by WaferPro.
Keysight W8503 Data
Selection and Processing
IC-CAP Data Selection and Processing tool
(DataPro) is a separate toolkit that applies
statistical analysis on selected measured
data and based on statistical distribution
and variances, identifies golden and corner
dies. DataPro can import data directly from
WaferPro (either file-based or database)
or from simple IC-CAP project format.
Statistical analysis can be applied to either
sweep or spot type of measurements.
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10 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Table 1. Supported measurement drivers in IC-CAP W8520 Instrument Connectivity licence.
W8520 Instrument Connectivity Drivers Instrument supported
LCRZ measurement drivers Keysight E4991A impedance analyzer
Keysight E4980A Precision LCR meter
Keysight 4194 impedance analyzer
Keysight 4271 1 MHz dig. capacitance meter
Keysight 4275 multi-frequency LCR meter
Keysight 4280 2 MHz capacitance meter
Keysight 4284 precision LCR meter
Keysight 4285 precision LCR meter
Keysight 4294A precision LCR meter
DC measurement drivers Keysight B1500A Semiconductor Device Analyzer
Keysight B1505A Power Device Analyzer/Curve Tracer
Keysight E5270 Series parameter analyzer: E5270B , E5272A, and E5273A
Keysight B2900 Series Precision Source/Measure Unit
Keysight 4156x semiconductor parameter analyzer
Keysight 4140 pA meter/DC voltage source
Keysight 4141 DC source/monitor
Keysight 4142x modular DC source/monitor
Keysight 4145x semiconductor parameter analyzer
Keysight 4155x semiconductor parameter analyzer
1
1
1
1
1
1
1
AC measurement drivers Keysight PNA Series
Keysight PNA-X Series (S-parameters, gain compression and intermodulation)
Keysight ENA Series
Keysight E8356A 10 MHz to 3 GHz
Keysight E8357A 10 MHz to 6 GHz1
Keysight E8358A 10 MHz to 9 GHz
Keysight N5250A Millimeter-wave PNA, 10 MHz to 110 GHz
Keysight 3577 network analyzer
Keysight 8510 network analyzer
Keysight 8702 network analyzer
1
1
1
1
Keysight 8719 network analyzer
Keysight 8720 network analyzer
Keysight 8722 network analyzer
Keysight 8753 network analyzer
Time domain measurement drivers Keysight 54121T-54124T digitizing oscilloscopes
Keysight 54510 digitizing oscilloscopes
Keysight 54750 TDR oscilloscope
Keysight 8130 pulse generator
Keysight 8131 pulse generator
1
1
1
1
Noise measurement drivers Keysight 35670A dynamic signal analyzer
Table 2a. WaferPro supported Probers
Wafer Probers - Tokyo Electron (TEL)
Cascade PS21
Cascade Summit 12K
Suss PA300
Accretech UF3000
Table 2b. Switching Matrix
Switching Matrix
Keysight HP4070 1
Keysight 707/708
Keysight HP4080 1
Keysight B2200
Tokyo Electron (TEL) P8 and P12
1
Table 2c. Thermal Controllers
Thermal Controllers
Accretech
Cascade Summit
Cascade PS21
Temptronic TP032A
Tokyo Electron (TEL)
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11 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
Table 3. Supported Simulators
Simulator Company Licences Required
ADS (hpeesofsim) Keysight EESof Included in the W8502 Analysis Module are linear,
transient and Verilog-A simulations)
MMSIM (SPECTRE) Cadence License required
HSPICE Synopsys License required
SABER Synopsys License required
ELDO Mentor Graphics License required
Spice3, spice2, PSPICE, HPSPICE Various Still included W8502 Analysis Module, however, these
simulators are no longer actively supported (legacy
simulators)
IC-CAP extraction modules and model generators
The modules listed in Table 4 include all of the measurement setups, mathematical transforms, extraction routines, and documentation required
to perform extractions with IC-CAP.
Table 4. Extra packages
Device Technology Product Number Model Extraction Package
CMOS W8553 UCB BSIM3, Target and Corner Modeling
W8554 UCB BSIM4, Target and Corner Modeling
W8550 PSP Extraction, Target and Corner Modeling
W8551 HiSIM2 Extraction,Target and Corner Modeling
W8555 HiSIM_HV Extraction,Target and Corner Modeling
W8560 HiSIM2 & HiSIM_HV,Target and Corner Modeling
W8552 UCB BSIMSOI, Target and Corner Modeling
W8532 Keysight Root MOS
BJT & HBT W8541 Keysight HBT
W8540 High Frequency BJT (EEBJT2) Gummel-Poon & MEXTRAM
W8542 VBIC
MESFET & HEMT W8530 Curtice, Cubic Curtice, Quadratic Statz-Pucel (Raytheon) EEFET3, EEHEMT1
W8531 NeuroFET
W8532 Keysight Root MESFET/HEMT
W8533 Angelov-GaN
Diode W8532
Keysight Root diode
Licensed software
Each IC-CAP module is available in two license versions:
A node-locked version allowing thesoftware to execute only on a singleworkstation or a PC. A network-licensed version for execution on multiple workstations or PCs on a network, allowing various workgroups to share the software.
Both licenses use the FLEXlm license management system. These two license options can be mixed freely. For example, a node-locked license
of an instrument driver package can reside on a workstation or PC in the lab, while a network license for the analysis module can be shared
among a group of engineers for data analysis.
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12 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
World Wide Web
Our Keysight EEsof EDA World Wide Web includes a special Support Web area for downloadable patches, defects and solutions, and online technical support. In addition, Keysight EEsof EDA gives you access
to other services, including:
– News and events
– Product information and on-line demos
– Product applications and examples
– Online product documentation
– Customer training classes
– Online and telephone technical support
– Knowledge center with application examples and users’ discussion forum
World-Class Support and Training
Keysight EEsof EDA is committed to helping you achieve success with IC-CAP through customer education courses, technical support, and custom solution services.
To help you begin using IC-CAP quickly and productively, a comprehensive, three-day course is offered at
various locations, including the Keysight EEsof EDA facility in Santa Rosa, California, USA.
A support contract also includes automatic software updates, literature, and documentation to bring you
the latest product enhancements and features.
Page 13
13 | Keysight | IC-CAP Device Modeling Software Complete and Accurate Parameter Extraction for Semiconductor Device Modeling - Technical Overview
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© Keysight Technologies, 2010 - 2014
Published in USA, August 2, 2014
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