Agilent 54658A Users Guide

Download

User’s Guide

Publication Number 54657-97010

October 1996 (pdf version Dec 1998)

For Safety information, Warranties, and Regulatory information, see the pages behind the index

HP 54657A, HP 54658A, and HP 54659B Measurement/Storage Modules

Measurement/Storage Modules

The HP 54657A, HP 54658A, and HP 54659B Measurement/Storage Modules provide additional measurement and storage capabilities to the HP 54600–Series oscilloscopes. The HP 54657A has an HP-IB interface and the HP 54658A has a RS-232 interface. The HP 54659B has a RS-232 interface plus an additional parallel output connector which allows the module to be connected to both an RS-232 controller and a parallel printer at the same time. The main features are:

Full Programmability.

•

Hardcopy output.

•

Three additional automatic voltage measurements (amplitude,

•

preshoot, and overshoot).

Two additional automatic time measurements (delay and phase

•

angle). User defined measurement thresholds of 10%/90%, 20%/80%, or selected voltage levels.

Two additional cursor measurements (voltage in percent and time

•

in degrees).

Two additional cursor measurement sources (math function 1

•

and 2).

Waveform math functions (addition, subtraction, multiplication,

•

differentiation, integration, and FFT)

Time and date tagging of hard copy and and nonvolatile memories.

•

Three uncompressed nonvolatile trace memories.

Additional 64K of nonvolatile trace memory (with data

•

compression) for up to 97 more trace memories..

Unattended waveform monitoring by use of mask templates.

•

Built-in automatic mask generation and mask editing capabilities.

•

Accessories available

HP 34810B BenchLink/Scope software package.

•

HP 10833A 1 meter (3.3 feet) HP-IB cable.

•

HP 10833B 2 meter (6.6 feet) HP-IB cable.

•

HP 10833C 4 meter (13.2 feet) HP-IB cable.

•

HP 10833D 0.5 meter (1.6 feet) HP-IB cable.

•

HP 13242G 5 meter (16.7 feet) RS-232 cable for printer/plotter and

•

HP Vectra 25-pin serial port.

HP 17255M 1.2 meter (3.9 feet) RS-232 cable for printer/plotter

•

and HP Vectra 25-pin serial port.

HP 17255D 1.2 meter (3.9 feet) RS-232 cable for IBM PC/XT 25-pin

•

serial port.

HP 92219J 5 meter (16.7 feet) RS-232 cable for IBM PC/XT 25-pin

•

serial port.

HP 24542G 3 meter (9.9 feet) RS-232 cable for 9-pin serial port.

•

HP 34398A 2.5 meter (8.2 feet) RS-232 cable.

•

HP 34399A RS-232 Adapter Kit.

•

iii

In This Book

This book is the user’s guide for the HP 54657A, HP 54658A, and HP 54659B

Measurement/Storage Modules, and contains three chapters.

Installation

interconnection of the Measurement/ Storage Modules.

Operating the Measurement/Storage Module

series of exercises that guide you through the operation of the Measurement/Storage Modules.

Reference Information

concerning the Measurement/Storage Modules.

Chapter 1 contains information concerning installation and

Chapter 2 contains a

Chapter 3 lists the reference information

Installation

Operating the Measurement/

Storage Mo dule

Reference Information

Index

1 Installation

Oscilloscope Compatibility 1–2 To install the Measurement/Storage Module 1–3 To configure the interface 1–4

2 Operating the Measurement/Storage Module

Math Functions 2–3 Function 1 2–4 Function 2 2–5 FFT Measurement 2–8 Automatic Measurements 2–14 Setting Thresholds 2–15 To make delay measurements automatically 2–19 To make phase measurements automatically 2–21 To make additional voltage measurements automatically 2–23 To make additional cursor measurements 2–25 Unattended Waveform Monitoring 2–29 To create a mask template using Automask 2–30 To create a mask template using Autostore 2–31 To create or edit a mask using line segments 2–33 To edit an individual pixel of a mask 2–35 To edit the mask to test only a portion of a waveform 2–36 To start waveform monitoring 2–38 To automatically save test violations 2–40 Creating a delay testing mask 2–42 Creating a frequency testing mask 2–44 Creating an overshoot testing mask 2–46 Creating a rise time testing mask 2–48 Testing the eye opening of an eye-pattern signal 2–50 To save or recall traces 2–52 To create a label for a trace memory 2–54 To set real-time clock 2–55

Contents–1

Contents

3 Reference Information

Operating Characteristics 3–3

Index

Contents–2

Installation

This chapter provides you with the information necessary to install the Measurement/Storage Module on the oscilloscope. Information required to connect and configure the module to the desired external devices (such as printer, plotter, computer) prior to local or remote operation is given in the Interface Modules for HP 54600-Series Instruments I/O Function Guide shipped with your module.

Oscilloscope Compatibility

HP 54657A and HP 54658A

HP 54600-series oscilloscopes except HP 54600A, HP 54601A, and HP 54602A oscilloscopes with an operating system version lower than

2.2. If your 54600A, HP 54601A, or HP 54602A oscilloscope has an earlier operating system, it can be updated using upgrade kit HP part number 54601-68702. The version is briefly displayed on screen when

Print/ Utilit y

the

HP 54659B

HP 54601A, HP 54602A, or HP 54610A Oscilloscope. This module is compatible with all other HP 54600-series oscilloscopes with an operating system version 1.2 or higher or with an operating system version number in the form of HP 54603B Oscilloscope has an earlier operating system, it can be updated using upgrade kit HP part number 54601-68704. If your 54610B Oscilloscope has an earlier operating system, it can be updated using upgrade kit HP part number 54610-68704. The version number is briefly displayed on screen when the

The HP 54659B in

A.XX.XX

. If your HP 54600B, HP 54601B, HP 54602B, or

These modules are compatible with all

key is pressed.

NOT

compatible with the HP 54600A,

Print/ Utilit y

key is pressed.

1–2

Figure 1–1

Installation

To install th e Measurement/ S torage Module

To install the Measurement/Storage Module

Turn off the oscilloscope.

Install the module as shown below.

The oscilloscope is reset after installation. The installed module is reflected in the message displayed when you turn on the oscilloscope.

Installi ng t he Measurement/Storage Modul e

1–3

Interface Cabl es

Instal latio n

To configure t he interface

To configure the interface

The Measurement/Storage Module can be connected to a printer, a plotter, or a computer through the interface. The HP 54657A has an HP-IB interface and the HP 54658A has an RS-232 interface. The HP 54659B has an RS-232 interface plus an additional parallel output connector which allows the module to be connected to both an RS-232 controller and a parallel printer at the same time.

Connect the Measurement/Storage Module to a printer, plotter, or computer through a suitable cable. The following table shows the HP part numbers of the proper cables.

Interface module

HP 54657A (HP-IB)

HP 54658A (RS-232)

HP 54659B (RS-232 and parallel output)

The HP 54659B is not comp at ible with t he HP 54600A, HP 54601A, HP 54602A, and HP 54610A.

Cable funct i on (Instrument to ..)

Printer/plotter/ controller

Controller 25-pin F 25-pin M HP 92219J

Controller 25-pin F 9-pin M HP 24542G 3 m (9.9 ft) RS-232 cont roller 9-pin M 25-pin M HP 34398A 2.5 m (8.2 ft) RS-232 cont roller 9-pin M 9-pin M HP 343 98A 2.5 m (8.2 ft ) RS-232 printer/plotter/

controller Parallel prin ter parallel parallel C2950A

Module connector

HP-IB HP-IB HP 10833A

25-pin F 25-pin F HP 13242G

9-pin M 25-pin F HP 34398A + HP 34399A

Printer/plotter/ controller connector

HP part number Cable

HP 10833B HP 10833C HP 10833D

HP 17255M

HP 17255D

adapter kit

C2951A

Length

1 m (3.3 ft) 2 m (6.6 ft) 4 m (13.2 ft)

0.5 m (1.6 ft) 5 m (16.7 ft)

1.5 m (4.9 ft) 5 m (16.7 ft

1.5 m (4.9 ft)

2.5 m (8.2 ft)

2 m (6.6 ft) 3 m (9.9 ft)

1–4

Figure 1–2

Installation

To configure the interface

HP 54658A Serial Connections

The signals for the RS-232 port on the HP 54658A are listed below.

Pin Number Signal

2 Transmit Data 3 Receive Data 4 Request to Send 5 Clear to Send 6 Data Set Ready 7 Signal Ground 8 Data Carrier Det ect 20 Data Terminal Ready SHELL Protective Ground

Pin out of HP 54 658A RS-232 port looking into DB25 female connect or

The following figures show the pin outs of the suggested HP RS-232 interface cables used with the HP 54658A 25-pin connector.

1–5

Figure 1–3

Figure 1– 4

Installation

To configure t he interface

Pin out of HP 13242G /HP 17255M R S-232 cable

Figure 1–5

Pin out of HP 24 542G RS-2 32 cable

Pin out of HP 92 219J/ HP 17255D RS-232 cable

1–6

Figure 1–6

Installation

To configure the interface

HP 54659B Serial Connections

The signals for the 9-pin RS-232 port on the HP 54659B are listed below.

Pin Number Signal

1 Data Carrier Detect 2 Receive Data 3 Transmit Data 4 Data Terminal Ready 5 Signal Ground 6 Data Set Ready 7 Request to Send 8 Clear to Send 9Ring SHELL Protective Ground

Figure 1–7

Pin out of HP 54659B RS-232 port looking into DB9 male connector

The following figure shows the pin out of the suggested HP RS-232 interface cable used with the HP 54659B 9-pin connector.

1 2 3 4 5 6 7 8 9

9-pin

HP 54659B Module

DCD RX TX DTR GND DSR RTS CTS RI

9-pin male

54657b07.cdr

Printer/Plotter/

Controller

DCD

RX TX

DTR GND DSR

RTS

CTS

9-pin

male

HP 34398A

Cable

1 2 3 4 5 6 7 8 9

9-pin female

Pin out of HP 34398A RS-232 cable

female

Refer to the "Programming over RS-232-C" chapter in the HP 54600–Series Oscilloscopes Programmer’s Guide for additional information.

1–7

1–8

Operating the Measurement/Storage Module

This chapter provides you with the information necessary to use the additional, or enhanced features that the Measurement/Storage Module provides. Basic operation for the oscilloscope is covered in the User and Service Guide for your oscilloscope.

This chapter provides you with practical exercises and detailed information designed to guide you through operation of the following functions:

• Math Functions

• Automatic Measurements

• Cursor Measurements

• Mask generation and waveform monitoring

• Trace Storage

2–2

Operating the Measurement /Storage Module

Math Funct ions

Math Functions

Without the Measurement/Storage module installed, addition and subtraction are the only math operations provided. In addition to the limited selections, the single function is performed on the pixel position of the data on the screen.

With the Measurement/Storage module installed, two functions define up to six operations that create mathematically altered waveforms (not pixel math.)

Function 1 will add (+), subtract (–), or multiply (*) the signals acquired

•

on vertical inputs 1 and 2, then it will display the result as F1.

Function 2 will integrate, differentiate, or perform an FFT on the signal

•

acquired on input 1, input 2, or the result in F1; then it will display the result in F2.

The vertical range and offset of each function can be adjusted for ease of viewing and measurement considerations. Each function can be displayed, measured (with cursors), stored in trace memory, or output over the interface.

2–3

Operating the Measurement/Storage Module

Function 1

Press

Toggle the

Press the

A softkey menu with four softkey choices appears. Three of them are related to the math functions.

Toggle the

Function 1 On Off

Function 1 Menu

+ – *

softkey until the desired operation is selected.

softkey to enable math function number 1.

softkey

Results (F1) are displayed on the screen.

All operations are calculated on a point-by-point basis.

plus (+)

•

Press the

Cursor s

algebraically sum input 1 and input 2 (input 1 + input 2).

minus (–) multiply (*)

algebraically subtract input 2 from input 1 (input 1 – input 2).

algebraically multiply input 1 with input 2 (input 1 * input 2).

Units/div

softkey and rotate the knob closest to the

key to set the vertical sensitivity of the resulting

waveform.

Press the

Cursor s

Offset

softkey and rotate the knob closest to the

key to set the offset (from the center graticule) of the

resulting waveform.

Function waveform (F1) is available for viewing, measurement, or storage.

Press the

Funct io n 1 Operating Hints

If channel 1 or 2 are clipped ( not fully displayed on scr een, ) the resulti ng displayed function will als o be clipped. Once the f unction is displayed, channel 1 and 2 may be t urned off for bett er viewing.

Previous Menu

softkey.

When multiply i s the operati on selected, the value displayed for unit s per division and offset is (V

Offset is the value (in V or V Normal screen position is 0 V offset, or at the center graticule (unt i l changed).

See "Making Cursor Measurements", and "S aving and Recalling Traces" in this chapter for more i nformation.

2–4

) assigned to the center grati cul e for function 1.

Operating the Measurement /Storage Module

Function 2

Function 2 will plot differential or integral waveforms, or perform an FFT using the input signals connected to the vertical inputs (1 and 2), or using the function 1 waveform.

Press

Function 2

Toggle the

Press the

Toggle the

Function 2 On Off

Function 2 Menu

Operand

softkey until the desired source is selected.

softkey to enable math function number 2.

softkey.

F1 uses the result waveform in function 1.

Press the

Operation

softkey until the desired operation is selected.

Results (F2) are displayed on the screen.

dV/dt

•

(differentiate) plots the derivative of the selected source using the

"Central Difference" formula. Equation is as follows:

–

n+1

∆

t(2i+1

)

Where

d = differential waveform

c = input 1, 2, or function 1

i = data point step size

∆

t = point-to-point time difference

∫dt

(integrate) plots the integral of the source using the "Trapezoidal Rule".

Equation is as follows:

∆

(

∑

)

Where

∆

t = point-to-point time difference

c = input 1, 2, or function 1

2–5

Figure 2–1

Operating the Measurement/Storage Module

Function 2

The integrate calculation is relative to the currently selected source’s input offset. The following examples illustrate any changes in offset level.

Integrate and Of fset

FFT

(Fast Fourier Transform)

•

and transforms it to the frequency domain. The FFT spectrum is plotted on the oscilloscope display as dBV (dBV or dBm for HP 54610 and HP 54615/54616) versus frequency. Selecting this function also adds the FFT Menu. See "FFT Measurement" later in this chapter for more information.

Press the

Cursor s

Units/div

softkey and rotate the knob closest to the

key to set the vertical sensitivity of the resulting

inputs the digitized time record of the source

waveform.

Units per division changes from volts to dB when FFT is selected.

2–6

Operating the Measurement /Storage Module

Function 2

Press the

Offset

(differentiate and integrate) or

and rotate the knob closest to the

Cursor s

Ref Levl

(FFT) softkey

key to set the offset (from the center graticule) or reference level (top graticule) of the resulting waveform.

Function waveform (F2) is available for viewing, measurement, or storage.

Press the

For FFT functions, an additional menu is available to set additional parameters. See "FFT Measurement" later in this chapter for more information.

Funct io n 2 Operating Hints

Timebase must be set to Ma i n (and input channels 3 and 4 to Off on 4-cha nnel oscilloscopes) when using function 2.

When differen tial i s the operati on selected, the value displayed for un i ts per division and offset is vol ts per second (V/s). When integral is the operation selected, the value displ ayed for units per divisi on and offset is v ol t seconds (Vs).

Offset is the value (in volts per second or v ol t seconds) assigned to the center graticule for function 2. Normal screen position is 0 offset, or at the center graticule (un til changed).

Previous Menu

softkey.

See "Making Cursor Measurements", and "S aving and Recalling Traces" in this chapter for more i nformation.

2–7

Operating the Measurement/Storage Module

FFT Measu rem ent

FFT Measurement

Operating Sy st em R equirements

Refer to "Oscilloscope Compatibility" on page 1-2 for operating system requirements for FFT operation.

FFT (Function 2) is used to compute the fast Fourier transform using vertical inputs (1 and 2), or the Function 1 waveform. This function takes the digitized time record of the specified source and transforms it to the frequency domain. When the function is selected, the FFT spectrum is plotted on the oscilloscope display as dBV (dBV or dBm for HP 54610 and HP 54615/54616) versus frequency. The readout for the horizontal axis changes from time to Hertz and the vertical readout changes from volts to dBV (dBV or dBm for HP 54610 and HP 54615/54616). For the HP 54610 and

HP 54615/54616, when 50Ω input is selected, readout is in dBm; when 1M input is selected, readout is in dBV. dBV is a unit of measure that is referenced to 1 Vrms. If the display of the HP 54600, HP 54601, HP 54602, HP 54603, or HP 54645 is needed to be in dBm, the operator must apply an external 50Ω load (HP 10100C or equivalent), and then perform the following conversion:

dBm = dBV + 13.01

Ω

DC Value

It does not take the offset at center screen into account and is 1.41421 times greater than its actual value. The DC value is not corrected in order to accurately represent frequency components near DC. All DC measurements should be performed in normal oscilloscope mode.

2–8

The FFT computation produces a DC value that is incorrect.

Operating the Measurement /Storage Module

FFT Meas urement

Figure 2–2

Aliasing

When using FFT’s, it is important to be aware of aliasing. This requires that the operator have some knowledge as to what the frequency domain should contain, and also consider the effective sampling rate, frequency span, and oscilloscope vertical bandwidth when making FFT measurements. Effective sample rate is briefly displayed

when the

key is pressed.

Aliasing happens when there are insufficient samples acquired on each cycle of the input signal to recognize the signal. This occurs whenever the frequency of the input signal is greater than the Nyquist frequency (sample frequency divided by 2). When a signal is aliased, the higher frequency components show up in the FFT spectrum at a lower frequency.

The following figure illustrates aliasing. In waveform A, the sample rate is set to 200 kSa/s, and the oscilloscope displays the correct spectrum. In waveform B, the sample rate is reduced by one-half (100 kSa/s), causing the components of the input signal above the Nyquist frequency to be mirrored (aliased) on the display.

Aliasing

Since the frequency span goes from ≈ 0 to the Nyquist frequency, the best way to prevent aliasing is to make sure that the frequency span is greater than the frequencies present in the input signal.

2–9

Operating the Measurement/Storage Module

FFT Measu rem ent

Spectral Leakage

repeats. Unless there is an integral number of cycles of the sampled waveform in the record, a discontinuity is created at the end of the record. This is referred to as leakage. In order to minimize spectral leakage, windows that approach zero smoothly at the beginning and end of the signal are employed as filters to the FFT. The Measurement/Storage Module provides four windows: rectangular, exponential, hanning, and flattop. For more information on leakage, see HP Application Note 243, "The Fundamentals of Signal Analysis" (HP part number 5952-8898.)

FFT Operation

Press

Toggle the

Press the

Toggle the

F1 uses the result waveform in function 1.

Press the

Funct io n 2 On Off

Function 2 Menu

Operand

Operation

The FFT operation assumes that the time record

softkey to enable math function number 2.

softkey.

softkey until the desired source is selected.

softkey until FFT is selected. Results (F2) are

displayed on the screen.

Press the

Cursor s

Units/div

softkey and rotate the knob closest to the

key to set the vertical sensitivity of the resulting

waveform.

Press the

Cursor s

Ref Levl

softkey and rotate the knob closest to the

key to set the reference level (top graticule line) of

the resulting waveform.

The Autoscale F FT softkey will automatically set Units/div and Ref Levl to bring the FFT data on screen. Frequency Span is set to maxim um . S teps 6 and 7 could be replaced to say:

6 Press FFT Menu softkey. 7 Press Autoscale F FT softkey. R otate Time/Div knob until freq span is aro und

the frequencies of intere st .

Press the

A softkey menu with six softkey choices appears. Five of them are related to FFT.

2–10

FFT Menu

softkey.

Operating the Measurement /Storage Module

FFT Meas urement

Cent Freq

•

Select and rotate the knob closest to the

center frequency to the desired value.

Freq Span

•

right graticule). Select and rotate the knob closest to the key to set the center frequency to the desired value. See FFT Measurement Hints (next page) for information on using frequency span to magnify the display.

Move 0Hz To Left

•

the left most graticule represents 0 Hz.

Autoscale FFT

•

and Ref Levl to bring the FFT data on screen. Frequency Span is set to

maximum.

Window

•

knob closest to the rectangular window is useful for transients signals and signals where there are an integral number of cycles in the time record. The hanning window is useful for frequency resolution and general purpose use. It is good for resolving two frequencies that are close together or for making frequency measurements. The flattop window is the best window for making accurate amplitude measurements of frequency peaks. The exponential window is the best window for transients analysis.

Previous Menu

•

FFT spectrum (F2) is available for viewing, measurement, or storage.

The used to measure or move the FFT spectrum. Press then set the

Find Peaks

peak with the highest amplitude and sets Vmarker2 and the stop marker (f2) on the peak with the next highest amplitude. Marker values in dBV/dBm or frequency (dependent on the active cursor)are automatically displayed at the bottom of the oscilloscope screen. The difference in dBV/dBm (∆V) or frequency (∆f) between the two peaks is also displayed.

Move f1 To Center

frequency) to the current f1 marker frequency. If f1 cannot be found, a message is displayed on the screen.

Allows centering of the FFT spectrum to the desired frequency.

Cursor s

Sets the overall width of the FFT spectrum (left graticule to

Pressing this key changes the center frequency so that

The AAutoscale FFT softkey will automatically set Units/div

Allows one of four windows to be selected. Select and rotate the

Cursor s

Returns you to the previous softkey menu.

Cursor s

Pressing this key sets Vmarker1 and the start marker (f1) on the

key contains two additional selections that can be

Source

softkey to F2.

Pressing this key changes the center graticule (or center

key to set the desired window. The

key to set the

Cursor s

2–11

Operating the Measurement/Storage Module

FFT Measu rem ent

The following FFT spectrum was obtained by connecting the front panel probe adjustment signal to input 1. Set Time/Div to 500 s/div, Volts/Div to 100 mV/div, Units/div to 10.00 dB, Ref Level to –10.00 dBV, Center Freq to

6.055 kHz, Freq Span to 12.21 kHz, and window to Hanning.

Figure 2–3

fft(1) 6.05kHz 12.2kHz 1 STOP

f1(F2) = 1.221kHz f2(F2) = 3.662kHz f(F2) = 2.441kHz Cent Freq Freq Span Move 0Hz Autoscale Window Previous

6.055kHz 12.21kHz To Left FFT Hanning Menu

FFT Measurements

FFT Measur em ent Hints

It is easies t t o view FFT’s wi th Vectors set to On. The Vector display m ode is set in the Displ ay menu. Note that on the HP 54615/54616, when Vectors is set from Off to On, the f requency span i s halved, and w hen Vectors is set from On t o Off, the frequency span is doubled.

The number of p oi nts acquired f or the FFT record i s normally 1024 (see FFT "Operating Characterist i cs" in Chapter 3 for specifics , ) and when frequency span is at maximum, all points are displayed. Once the FFT s pectrum is di splayed, the frequency sp an and center fre quency controls are used much l i ke the control s of a spectrum analyzer to ex am i ne the frequen cy of interest in greater deta i l . Place the des i red part of the wa veform at the center of the screen and decreas e frequency sp an to increase t he di splay res ol ution. As fre quency span is decreased, the number of poi nts shown is reduced, and the di splay is magnified.

2–12

Operating the Measurement /Storage Module

FFT Meas urement

FFT Measur em ent Hints – Cont inued

While the FF T spectrum is displayed, use the and Curs or keys to sw i tch between measurement functions and frequency domai n controls in FFT menu. S ee the end of the manual for display menus. Decreasing the effective sampling rate by selecting a sl ower sweep speed will increase the l ow frequency re solution of the FF T display and also incre ase the chance that an alia s will b e dis play ed. The resolution of the FFT is one-half o f the effective sample rate di vided by the n um ber of points in the FFT. The actual resolution of the display will not be this fine as the shape of the window will be the actual limiting factor in t he FFT’s ability to resolve two closely space frequencies. A good way to test the ability of the F FT to r es olv e two closely spaced frequencies is to e xamine the sidebands of an a m pl i tude modulated sine wave. For exam ple, at 2 MS a/sec effectiv e sampling rat e, a 1 MHz AM signal can be resolved to 2 kHz. Increasing the eff ective sampli ng rate to 4 MS a/sec reduces the res ol ution to 5 kHz.

For the best vertical accuracy on peak measurements:

• Make sure the sour ce i m pedance and probe attenuati on i s set correctly. The impedance and p robe attenuatio n are set from the C hannel menu if the operand is a cha nnel .

• Set the source sensitivity so t hat the input si gnal i s near full screen, but not clipped.

• Use the flattop window.

• Set the FFT sensiti vity to a sens i tive range, such as 2 dB/d i vision.

For best frequency accuracy on peaks:

• Use the Hanning w i ndow .

• Use cursors to pla ce f1 cursor on the frequency of interest.

• Press Move f1 to Center softkey.

• Adjust frequency span for bette r cursor placement.

• Return to the Curso rs m enu to fine tune t he f1 cursor.

For more info rm ation on the us e of window please refer to HP Applicatio n Note 243," The Fundamentals of S i gnal Analysis" Chapter II I, S ection 5 (HP part number 5952 -8898.) Ad di tional information can be obt ai ned from "Spect rum and Network Measurements" by R obert A Witte, in Chapter 4 ( HP part number 5960-5718.)

2–13

Figure 2–4

Operating the Measurement/Storage Module

Automatic M easurements

Automatic Measurements

With the Measurement/Storage Module installed, the oscilloscope is capable of making five additional automatic voltage and time measurements.

Delay Measurements

•

Phase Measurements

•

Voltage Amplitude

•

Voltage Overshoot

•

Voltage Preshoot

•

In addition to the measurements, the thresholds used for automatic time measurements are user-selectable.

Automatic M easurements

2–14

Operating the Measurement /Storage Module

Setting Thres holds

Setting Thresholds

Without the Measurement/Storage module installed, rise time and fall time measurements are performed at the 10%/90% threshold levels. The remaining five time measurements (frequency, period, duty cycle, positive pulse width, and negative pulse width) are all performed at the 50% transition point. Refer to the User and Service Guide for your oscilloscope for more information.

With the Measurement/Storage module installed, the thresholds are user selectable. Rise time and fall time measurements are performed at 10%/90%, 20%/80%, or at a user defined threshold level. The remaining five time measurements are performed at the center point of the currently selected upper and lower threshold values.

If 10%/90% is selected, the center is 50%.

•

If 20%/80% is selected, the center is 50%.

•

If voltage is selected, the center is dependent on the current lower and

•

upper values.

As an example, if the lower value is set to 0 V, and the upper value is set to 50 mV, then the 50% level is 25 mV. 25 mV is the point that frequency, period, duty cycle, positive pulse width, and negative pulse width will be measured. The point of measurement is dependent on the amplitude of the input signal.

2–15

Figure 2–5

Operating the Measurement/Storage Module

Setting Thres holds

User Threshol ds

Press

Press the

Time

Next Menu

softkey until the

Define Thre sholds

softkey is

displayed on the far left side.

Press the

Press the desired

A softkey menu with six softkey choices appears. Five of them are related to selecting thresholds.

10% 90%

•

and 90% (upper) levels. Frequency, period, duty cycle, positive pulse width, and negative pulse width measurements will be performed at the 50% level.

20% 80%

•

and 80% (upper) levels. Frequency, period, duty cycle, positive pulse width, and negative pulse width measurements will be performed at the 50% level.

2–16

Define Thresholds

Thresholds

Rise time/fall time measurements performed at the 10% (lower)

Rise time/fall time measurements performed at the 20% (lower)

softkey.

Operating the Measurement /Storage Module

Setting Thres holds

Voltage

•

upper levels specified by you. Frequency, period, duty cycle, positive

pulse width, and negative pulse width measurements will be performed at

the center of both entered levels.

Lower

•

Select and rotate the knob closest to the lower threshold to the desired value.

Upper

•

Select and rotate the knob closest to the upper threshold to the desired value.

Previous Menu

•

Selecting User Threshold Hints

Lower threshold level ca nnot be set to a v al ue higher than the current upp er threshold le vel. Upper thresh ol d l evel cannot be set to a value lower than the current lower threshold le vel. If the upper and l ow er thresholds are set to level s greater to, or l ess than, the current displ ayed wavefor m , then the automati c ri se time, fal l tim e, frequency, period, duty cycle, positi ve pulse wid th, and negative pulse width m easurements will not be performed. This is b ecause the measurement point is not on the waveform.

Rise time/fall time measurements performed at the lower and

This softkey is displayed only when

Returns you to the previous softkey menu.

Voltage

Cursor s

Voltage

Cursor s

softkey is selected.

key to set the

Cursors can be used to set t he threshold v ol tage levels as follows:

• Select an automati c tim e measurem ent with Show Meas set to On, and thresholds set to 10%/90%. Once initiated, the cursors will dis play on the waveform.

• Press Cursors key and record the current cursor voltage levels.

• Select Define Meas urement Voltage, and adju st the upper and low er levels

to the previously recorded valu es.

• Slowly rotate the k nob closest to the Cursors key to fine tune the upper and lower threshold to the desired v alues. Cursor will track a s long as the measurement is valid.

2–17

Figure 2–6

Operating the Measurement/Storage Module

Setting Thres holds

User Threshol d Ri se Time Measu rement

2–18

Operating the Measurement /Storage Module

To make delay m easurements automatically

To make delay measurements automatically

You can measure the delay of signals connected to the oscilloscope’s input 1 and input 2 connectors when the Measurement/Storage Module is connected to the oscilloscope. Delay is measured from the user-defined slope and edge count of the signal connected to input 1, to the defined slope and edge count of the signal connected to input 2.

Adjust controls so that a minimum of 6 full cycles of the signals connected to inputs 1 and 2 are displayed.

Press

Time

Press the

Next Menu

softkey until the

Define Thresholds

softkey is

displayed on the far left side.

Press the

A softkey menu with five softkey choices appears. Four of them are related to defining the delay measurement.

Chan 1

•

measurement will START. Threshold level is always 50%.

Edge

•

will START.

Chan 2

•

measurement will STOP. Threshold level is always 50%.

Edge

•

will STOP.

Previous Menu

•

Use the displayed softkeys to specify the starting (from) and stopping

Define Delay

Selects the channel 1 slope (rising or falling) where the delay

Selects the edge count (from 1 to 5) where the delay measurement

Selects the channel 2 slope (rising or falling) where the delay

Selects the edge (from 1 to 5) count where the delay measurement

softkey.

Returns you to the previous softkey menu.

(to) slope and edge count. Transition point (measurement threshold level) is fixed at 50%.

Press the

Previous Menu

softkey.

2–19

Operating the Measurement/Storage Module

To make delay m easurements automatically

Figure 2–7

Press the

Measure Del ay

softkey. Delay is measured and displayed on

the screen.

Negative delay values indicate the defined edge on channel 1 occurred after the defined edge on channel 2.

Automatic Delay Measurem ent Hints

If an edge is selected t hat is not displayed o n th e s creen, delay will not be measured.

User threshol ds have no effect on automati c delay measurements. Delay is always meas ured at the 50% transition point (measure m ent threshold le vel).

Automatic D elay Measurement

2–20

Operating the Measurement /Storage Module

To make phas e m easurements automatically

To make phase measurements automatically

Phase shift between two signals can be measured using the Lissajous method. Refer to the User and Service Guide for your oscilloscope for more information.

With the Measurement/Storage Module installed, phase is automatically measured and displayed. Measurement is made from the rising edge of the first full cycle on the input 1 signal, to the rising edge of the first full cycle on the input 2 signal. The method used to determine phase is to measure delay and period, then calculate phase as follows:

Phase =

Adjust controls so that a minimum of one full cycle of the signal

period

delay

of input 1

connected to input 1 is displayed. Press

Time

x 360

Press the

Next Menu

softkey until the

Define Thresholds

softkey is

displayed on the far left side.

Press the

Measure Ph ase

softkey. Phase is measured and displayed on

the screen.

Negative phase values indicate the displayed signal on channel 2 is leading the signal on channel 1.

Automatic Phas e Measurement Hints

If one full cycle of the signal connected to input 1 is not displayed , phas e will not be measured.

User threshol ds has no effect on automati c phase measurements. Phase is always meas ured at the 50% transition point (threshold level).

When using the delaye d time base, the instrument will attempt to perform the measurement using the delayed window. If the selected c hannel 1 edge, channel 2 edg e, and channel 1 period cannot be found in the delayed wind ow , the main wind ow i s used. See "Time Measurem ents" in the

Guide

for your oscilloscope for more information.

User and Service

2–21

Figure 2–8

Operating the Measurement/Storage Module

To make phas e m easurements automatically

Automatic Phase Measurem ent

2–22

Operating the Measurement /Storage Module

To make additional voltage measurements automatically

With the Measurement/Storage Module is installed, the following additional automatic voltage measurements can be performed.

Vamplitude

•

waveform. When performing a measurement on a particular cycle, set the

controls to display only that cycle is displayed. The method used to

determine voltage amplitude is to measure Vtop and Vbase, then calculate

voltage amplitude as follows:

voltage amplitude = Vtop – Vbase

Vovershoot

•

an Overshoot measurement. If more than one waveform, edge, or pulse is

present, the measurement is made on the first edge acquired. The method

used to determine overshoot is to make three different voltage

measurements, then calculate overshoot as follows:

Amplitude Voltage measurement is made using the entire

A minimum of one edge must be displayed in order to perform

percent overshoot =

Vpreshoot

•

a Preshoot measurement. If more than one waveform, edge, or pulse is

present, the measurement is made on the first edge acquired. The method

used to determine preshoot is to make three different voltage

measurements, then calculate preshoot as follows:

A minimum of one edge must be displayed in order to perform

percent preshoot =

Vmax–Vtop

Vtop–Vbase

Vmin–Vbase

Vbase–Vtop

x 100

2–23

Operating the Measurement/Storage Module

To make additional voltage measurements automatically

Adjust controls until the desired signal is displayed.

Press

Voltag e

Figure 2–9

Press the

Source Next Menu

far left side.

Press the desired

Vamp

•

Select to perform a voltage amplitude measurement.

Vover Vpre

Select to perform an overshoot measurement.

Select to perform a preshoot measurement.

softkey until the desired source is selected.

softkey until the

Voltage Measurement

Vamp

softkey is displayed on the

softkey.

Automatic Overshoot Measurement

2–24

Operating the Measurement /Storage Module

To make addi ti onal cursor meas urements

To make additional cursor measurements

Without the Measurement/Storage Module installed, cursor measurements can be performed on channels 1 through 4, and are displayed in volts (V1/V2) and time (t1/t2). Refer to the User and Service Guide for your oscilloscope for more information.

With the Measurement/Storage Module installed, additional cursor measurement features include:

Measurements can now be performed on functions 1 and 2.

•

You can define voltage marker units as either volts or relative percent.

•

You can define the time units as either seconds or relative degrees.

•

Adjust controls until the desired signal is displayed. Press

Cursor s

Toggle the

Source

softkey until the desired source is selected

(channels 1 through 4, functions 1 and 2).

Press the

Toggle the

If Readout Volts is selected, cursor measurements are displayed in volts (V1, V2, and ∆V), and operation is identical as when the module is not installed. Refer to the User and Service Guide for your oscilloscope for more information.

Toggle the

Active Cursor V1 V2

Readout

Active Cursor V1 V2

softkey to select voltage markers in percent.

softkey.

softkey until the desired marker(s) (V1,

V2, or both) are selected, and rotate the knob closest to the

Cursor s

When both V1/V2 markers are selected, rotating the knob closest to the

Cursor s

Press the

key to set the marker(s) to the desired position.

key moves both markers.

Set 100%

softkey to set the V1 marker to 0% and the V2 marker to 100%. All readings are now relative to the established V1/V2 marker positions.

V1 reads the percentage the V1 marker has moved from the established

•

0% position. Negative readings indicate marker has moved away from the V2 marker.

2–25

Figure 2–10

Operating the Measurement/Storage Module

To make additional cursor m easurements

V2 reads the percentage the V2 marker has moved from the established

•

100% position. Negative readings indicate marker has moved through the established V1 marker position.

∆

V reads the percentage difference between the V1 and V2 marker

•

repetitive to the established positions. Negative readings indicate markers have crossed.

Voltage Cursor Measurements in Percent

Press the

Toggle the

If Readout Time is selected, cursor measurements are displayed in seconds (t1, t2, and ∆t), and Hz (1/∆t). Operation is identical as when the module is not installed. Refer to the User and Service Guide for your oscillosocpe for more information.

Toggle the

Active Curs o r t1 t2

Readout

Active Cursor t1 t2

softkey to select time markers in degrees.

softkey.

softkey until the desired marker(s) (t1, t2,

or both) are selected, and rotate the knob closest to the

Cursor s

When both t1/t2 markers are selected, rotating the knob closest to the

Cursor s

2–26

key to set the marker(s) to the desired position.

key moves both markers.

Operating the Measurement /Storage Module

To make addi ti onal cursor meas urements

Press the

Set 100%

softkey to set the t1 marker to 0° and the t2 marker to 360°. All readings (except second ∆t display in seconds) are now

relative to the established t1/t2 marker positions.

t1 reads the phase the t1 marker has moved from established 0° position.

•

Negative readings indicate marker has moved away from the t2 marker.

t2 reads the phase the t2 marker has moved from established 360

•

position. Negative readings indicate marker has moved through the established t1 marker position.

∆

t in degrees reads the phase difference between the t1 and t2 marker

•

repetitive to the established positions. Negative readings indicate markers have crossed.

∆

t in seconds reads the time difference between the t1 and t2 marker

•

positions. Negative readings indicate markers have crossed.

Additional FFT Function Ke ys When the FFT f unction is selected (refer to Math Functions ), two addit i onal k eys

are available as follows: Find Peaks Pressing this key s ets V m arker1 and the start marker (f1) on the FFT

trace peak wi th t he highest ampl i tude and sets Vm arker2 and the stop marker (f2) on the peak w i th the next highest amplitude. Marker va l ues in dBV or frequency (de pendent on the ac tive cursor)are automatical l y displayed at the bottom of the oscilloscope screen. The diffe rence in dBV (∆V) or frequency ( ∆f) between the two peaks is als o displayed.

Move f1 To Center Pressing this key changes the center grati cul e (or center frequency) to the current f1 marker freque ncy. If f1 cannot be found, a mess age is display ed on the screen .

2–27

Figure 2–11

Operating the Measurement/Storage Module

To make additional cursor m easurements

Cursor Measurement Hints

If cursors are po sit i oned too closely t oget her, an error will be dis play ed when the SET softk ey is select ed.

Displayed m arker readings in percent ( %) and degrees (°) are always relative measurement s, w i th the curren t reading dependent on the previ ously established 100% or 360 reference setting.

Time Cursor M easurements in Degrees

2–28

Operating the Measurement /Storage Module

Unattende d W aveform Moni toring

Unattended Waveform Monitoring

The Measurement/Storage Module simplifies circuit debugging by comparing an active channel (not functions) trace on the display to one of two test templates.

When a failure is detected, the oscilloscope can be instructed to take one of several actions.

The test can be set to stop after the first failure, or to continue regardless

•

of the number of failures found.

The failed trace(s) can be stamped with the date and time of the failure,

•

and stored in trace memory or output to a hardcopy device. When trace memory is selected, the user has the option of saving all failures, or saving only the last failure that occurred.

The test can continue with statistics on the number of failures (reported

•

as a percentage of the number of tests performed) being displayed.

The mask templates can be defined one of two ways. Once a mask is created, it is stored in nonvolatile RAM.

Automask

•

data. You are allowed to select the mask tolerance prior to creating the template.

Editor

•

areas of specific interest, or to create a complete new mask. Mask editor allows pixel-by-pixel editing, and smoothing of the mask by using a running average of three pixels.

Failures can be specified one of two ways.

Inside

•

and minimum limit lines of the mask template.

Outside

•

maximum and minimum limit lines of the mask template.

Quickly generates a mask template from currently displayed

Used to adjust the tolerances of a previously created template in

Test fails if signal falls inside the region defined by the maximum

Test fails if signal falls outside the region defined by the

2–29

Operating the Measurement/Storage Module

To create a ma sk template usi ng Automask

To create a mask template using Automask

A mask template contains two limit lines: minimum and maximum. Automask allows you to easily generate a mask with tolerances from a displayed waveform on the screen.

Connect a known good signal to the oscilloscope.

Set up the oscilloscope with the settings that are required to test the signal.

Press

Press the

Toggle the

Mask Test

Use Ma sk

softkey.

softkey to select the desired mask number

(1 or 2).

Press the

Cursor s

Pressing the softkey increases the tolerance value by 0.2%.

Press the

Define Mask Automask Tolerance

softkey, then turn the knob closest to the

softkey.

key to set the tolerance.

Create Mask

softkey to create the mask with the specified

tolerance.

Tolerance Operating Hint

The tolerance used in Automas k is express ed as a percent age of the full-s cal e time and volt age of the lowest num ber of all ac tive channels. It does not represent the tolerance of the actual size of the input signal. To speci fy the tolerance as a percentage of the actual size of the input si gnal requires some additional cal culations.

For example , a signal of 1 v ol t peak-to-peak is tested at a v ertical sensitivity of 500 mV/div. The full-scal e voltage equals the vol ts /div times th e num ber of full-scale divisions ( 50 0 mV * 8 = 4 V) . To s pecify a 4% tolerance on a 1 V peak-to-peak signal requires a 40 mV tol erance, but to specify a 40 m V tolerance on a full-sca l e voltage of 4 volts requires a 1% toleran ce. Therefore, a 1% tolerance shoul d be specified to generate the mask template.

2–30

Operating the Measurement /Storage Module

To create a mask template using Autostore

An envelope of the passing region can be generated using the Autostore function. Then the Automask function can read the Autostore screen information and take the maximum and minimum limits of it as the limit lines of the mask template. This process allows you to create a mask template from a known good signal, allowing certain tolerance margins.

Connect a known good signal to the oscilloscope.

Set up the oscilloscope with the settings that are required to test the signal.

Press

Displa y

, then toggle the

position. Press

Autost or e

Make sure that STORE is displayed in the status line. If STORE is not displayed, press Autostore again.

Set the voltage tolerance by moving the waveform up and down with

the vertical position knob, creating a vertical envelope.

Set the time tolerance by moving the waveform back and forth with the horizontal delay knob, creating a horizontal envelope.

You may need to repeat steps 5 and 6 to fine tune the envelope. Cursors can be used to accurately measure the margins.

An alternative method is to vary the input signal amplitude (level) and frequency (time) by the desired amount.

Press

Grid

softkey to the None

Press the

Mask Test Use Mask Define Mask Automask

softkey.

softkey to select the desired mask number (1 or 2).

softkey.

2–31

Operating the Measurement/Storage Module

To create a ma sk template usi ng Autostore

Press the

Cursor s

If additional tolerance is desired, set the tolerance to the appropriate level. This will be the amount "added on" to the previously created envelope.

Press the

Tolerance

softkey, then turn the knob closest to the

key to set the tolerance to ±0.0%.

Create Mask

softkey to create the mask from the autostore

information.

Automask Using Autostor e Operating Hin t

The Automask function takes all the inform ation displ ayed in half bri ght to create the mask. However, the display grid and the autostore information shares the same half-br i ght display. If the grid is turned on, and Aut ostore information is on the screen when the Create Mask softkey i s pressed, a w arni ng message is displayed: "Grid must be None to generate mask wit h Autostore." T he Display Grid must be turned to None p ri or to creating t he autostore data in order to us e Automask function. Turning the grid to N one after the autos tore data is c reated erases both the grid and the autostore data. Use of cursors does not af fect the Automask function and is hi ghly recommended to ensure the proper te st i ng margin in the autostore inform ation.

If there is noise rising on the limit lines, you can use the smooth function in the mask editor to smooth out the noise.

2–32

Operating the Measurement /Storage Module

To create or edit a mask using line segments

The Measurement/Storage Module has a built-in Mask Editor for creating or editing masks. It provides two editing tools: pixel editing and line drawing editing. The line drawing editing tool can also be used to create a mask using line segments.

To create the mask, you may want to first draw the mask on a piece of paper and mark the coordinates of the end points of each straight line.

Press

Press the

A softkey menu with five softkey choices appears. Four of them are related to the mask editing functions.

If a mask has been previously created, it will be displayed.

Edit Line

•

the bottom limit line, and maximum is selected to edit the top limit line.

Line Drawing - Mark and Connect

•

straight lines in the mask. Their operation is explained later in this paragraph.

Smooth Mas k

•

mask. It is especially useful for smoothing a mask created by Automask, which may contain noise on the mask.

Each time Smooth Mask is selected, the entire mask is updated. Selecting smoothing numerous times can alter the desired mask pattern.

Previous Menu

•

Mask Test Use Mask Define Mask Editor

Selects the limit line to be edited. Minimum is selected to edit

softkey.

softkey to select the desired mask number (1 or 2).

softkey.

Mark and Connect are used for drawing

A running average of three pixels is used to smooth the

Returns you to the previous softkey menu.

2–33

Operating the Measurement/Storage Module

To create or edit a mask using line segments

Toggle the

Turn the Delay knob to move the X-coordinate of the cursor to the

Edit Line

softkey to select the limit line you want to edit.

time corresponding to the first point.

If a mask has been previously created, both the X and Y coordinate of the cursor will track the selected limit line.

Turn the knob closest to the

Cursor s

key to move the Y-coordinate of the cursor to the voltage corresponding to the first point.

Press the

Mark

softkey to mark this point as the first point of a line

draw.

Turn the delay knob to move the X-coordinate of the cursor to the time corresponding to the second point.

Turn the knob closest to the

Cursor s

key to move the Y-coordinate of the cursor to the voltage corresponding to the second point of the line.

Press the

Repeat procedures 5 through 11 until the desired mask is created.

Mask Editor Operating Hint

When you want to move the cursor to a particular location , i t is essential to first move the X-co ordi nate of the cursor then the Y-coordinate. Ot herwise, the movement of the Y-coordinate changes the position of a pixel at an undesired location.

Connect

softkey to draw the line between both points.

After you press the Connec t s oftkey, the two points are c onnected by a str ai ght line. Points between the two end points ar e i nterpolated. However, if the voltage of a particular poi nt during interpol ation viol ates the rule of the voltage at the maximum limit ≥ the voltage at the minimum limit, the voltage is set to the same value as the other limit.

After you have marked the fi rst point, pres sing the Mark s oftkey again cancels the previously marked point and starts the procedure ov er.

After you have connected the two points, pressing the C onnect softkey again will undo the connect operation.

2–34

Operating the Measurement /Storage Module

To edit an ind iv idual pixel of a mask

To edit an individual pixel of a mask

Previously created masks can be edited pixel-by-pixel using the line drawing editing tool. The Delay knob selects the column to be edited, and the Cursors knob moves the mask vertically.

Press

Press the

Toggle the

Mask Test Use Mask Define Mask Editor

Edit Line

softkey.

softkey to select the desired mask number (1 or 2).

softkey to select the limit line that you want to

softkey.

edit.

Turn the Delay knob to move the cursor to the pixel (column) that you want to modify.

Turn the knob closest to the

Cursor s

key to edit the vertical

position of the pixel.

It is possible to repeat steps 6 and 7 (simultaneously) using two hands to create a nice smooth mask.

Pixel Editing Operating Hint

The time and v ol tage shown at the bottom of the screen corres ponds to the current time b ase and vertic al setting of lowest number of al l active channels. If the mask is v ol tage and time dependent, ma ke sure that the current time base and vertical setting are the same as the on e that you are goi ng to use during the actual testing.

Once the Cursor knob is mov ed, the selected pixel is edited. To re m ove undesired ed i ts , use the mark a nd connect softk eys (previous l y discussed).

2–35

Operating the Measurement/Storage Module

To edit the mas k to test only a portion of a wav eform

To edit the mask to test only a portion of a waveform

In certain circumstances, not all the points on the waveform need to be tested. Only the area of interest needs to be tested. For example, to test the amount of overshoot of a pulse, you only need to test the portion of the waveform after the rising edge. You can select the test region by editing the shape of the mask template.

Press

Press the

Toggle the

Mask Test Use Mask Define Mask Editor

Edit Line

softkey.

softkey to select the desired mask number (1 or 2).

softkey to select the limit line that you want to

softkey.

edit.

Turn the Delay knob to move the cursor to the starting location that you do not want to test.

Turn the knob closest to the

Cursor s

key to move the voltage cursor until it reads "Don’t Care".

Press the

Turn the Delay knob to move the cursor to the ending location of the

Mark

softkey.

region that you do not want to test.

Turn the knob closest to the

Cursor s

key to move the voltage cursor until it reads "Don’t Care".

Press the

This region of this particular limit line is not tested during the mask testing.

Connect

softkey.

2–36

Figure 2–12

Operating the Measurement /Storage Module

To edit the mask to test only a portion of a waveform

Mask Editing Operating Hin t

Each limit line can have its own se lect able test region. The figure below shows a mask that tests the overshoot o f t he w aveform. Note

that only the p art you are inte rested in is te st ed. The test regi on can be set individually for the maximum and minimum limit.

Example mask template with selectable test region

2–37

Operating the Measurement/Storage Module

To start waveform monitor ing

To start waveform monitoring

Before using a testing mask to monitor a waveform, the mask must be created. Once created, the mask is automatically stored in one of the two nonvolatile mask memories. Procedures for creating a mask template are provided in this chapter.

Press

Press the

Mask Test Use Mask

softkey.

softkey to select the previously created mask

number (1 or 2).

Press the

A softkey menu with six softkey choices appears. Five of them are related to the mask testing functions.

Fail When – In or Out

•

out of, or in to the mask template.

On Fail - Stop or Run

•

after a test violation has occurred.

Auto Save – Off or On

•

recorded. When On is selected, an additional softkey appears. See "Automatically Saving Test Violations" later in this chapter for more information.

Save To

•

Toggle softkey to direct test failure data to the Trace memory, or to the Printer. When Trace is selected, an additional softkey appears.

Test Options

When stop is selected, the current acquisitions stop when the first violation of the mask occurs. The test can be restarted by pressing the RUN key.

When run is selected, the oscilloscope continues to acquire data and display the most recent trace.

This softkey is displayed only when

softkey.

Selects if a test failure occurs when the signal moves

Used to select what state the oscilloscope will be in

Used to select if a test violation waveform is

Auto Save On

is selected.

2–38

Operating the Measurement /Storage Module

To start waveform monitor ing

Increment

•

Previous Menu

•

Toggle the softkeys to select the desired testing options.

Press the

Selecting on immediately starts the test using the test options specified. Test indications are displayed on the display line as follows.

Pass

•

Fail

•

and disposition of the failed data is dependent on the testing options selected.

Acquisitions

•

Failures

•

occurred during the test.

This softkey is displayed only when

When On, all test violations are saved by incrementing the trace number. The starting trace number is the one that is currently selected. When the 64K compressed memory is full, the oldest trace memory is overwritten, and the trace count continues incrementing. When the trace count reaches 100, the number resets to 1 (wraps around).

When Off, only the last test violation is saved, as test failure data is written over previously stored data.

Returns you to the previous softkey menu.

Previous Menu Mask Test

Indicates the displayed waveform passed the test.

Indicates the displayed waveform failed the test. Further testing,

Indicates the total acquisitions made during the test.

Indicates the total number (and percentage) of test failures that

softkey.

softkey until On is selected.

Save To Tra ce

is selected.

Waveform Mo nit oring Operating Hint

Mask template testing can only be used in the Main Horizontal M ode, and when Functions 1 and 2 are set to of f.

The trace review softkey ca n be used to revi ew al l saved failures. See "To S ave or Recall Tra ces" in this c hapter for more information.

2–39

Operating the Measurement/Storage Module

To automatical ly save test violations

To automatically save test violations

The signals that fail the waveform monitoring test can be saved, then viewed/measured at a later time. Provisions are provided to save the violations in trace memory, or print a hardcopy of the data. When trace is selected, the option of saving only the last violation, or saving all violations are provided.

Setup for waveform monitoring as described previously.

Press

Press the

Press the Determine how the test violations are being saved, and proceed as follows:

To print test violation data on an externally connected printer, toggle the

•

Save To

To save test violation data in trace memory, toggle the

•

until

To save only the last test violation waveform in trace memory, toggle the

•

Increment

To save all test violation waveforms in trace memory, toggle the

•

softkey until On is selected.

Press the

Mask Test Test Options

Auto Save

softkey until

Trace

is selected. This causes the

softkey until

Previous Menu

Mask Test

softkey.

softkey to ON. This causes the

is selected.

Off

is selected.

softkey.

softkey until On is selected.

Increment

Save To

softkey to appear.

Save To

softkey to appear.

softkey

Increment

2–40

Operating the Measurement /Storage Module

To automatical ly save test violations

Saving Test Vi olation Data Operating Hint

When Increment On is select ed, traces ≥3 to 1 00 are stored in the compres sed state. During the compres sion and stora ge of data, new signals are not acquired or te st ed. The time it takes to compr ess and store data is less than 10 seconds.

When Increment On is select ed, and multiple violations are desired, the On Fail softkey must be set to Run (i n the Test Options menu). The s tarting trace num ber is the one that i s currently sel ected. When the 64K compressed memory is full, the oldest tra ce m em ory is ove rw ri tten, and the trace count cont i nues incrementing. W hen the trace c ount reaches 100, the number resets to 1 (wraps around).

2–41

Figure 2–13

Operating the Measurement/Storage Module

Creating a delay testing ma sk

Creating a delay testing mask

A mask can be used to test the channel to channel delay of two input signals. The shape of the mask varies depending on the channel 2 edge selected (stop edge). Different masks are needed for different edge selections.

To test the channel to channel delay of the signal connected to channel 2, the stop edge of the signal is tested instead of actually measuring the delay. The test can be conducted by triggering on the start edge (channel 1), and testing for the location of the stop edge (channel 2). An example mask is shown in the following figure.

Example of a ma sk t em plate used in channel to channel del ay

2–42

Operating the Measurement /Storage Module

Creating a delay testing ma sk

The following procedure can be used to setup a mask template for testing channel to channel delay.

In the oscilloscope setup, the controls should be selected to display the start edge (channel 1) as the first edge on the display, and the stop edge (channel 2) as the last edge on the display. The trigger source should be set to trigger from channel 1. The mask template can be created by using an external signal source to generate the signals identical to the ones that are going to be tested.

Connect the desired signals to the oscilloscope.

Set the signal source(s) to generate a waveform identical to the ones that you are going to test.

Press

on the oscilloscope, then press the

softkey when finished.

Define Mask Editor

Edit Line

Connect

softkeys to edit the minimum line so only the last edge is

softkey to select the Min limit line. Use the

softkey.

Create a mask (at the desired tolerance) using Automask. Press

Previous Menu

Refer to "Create a Mask Template Using Automask" for more information on using automask.

Press the

Toggle the and

Mask Test

softkey.

present (refer to previous figure).

Refer to "Create or Edit a Mask Using Line Segments" for additional information.

Toggle the

Connect

and present (refer to previous figure). Press

Edit Line

softkey to select the Max limit line. Use the

softkeys to edit the minimum line so only the first edge is

Previous Menu

softkey when

finished.

Mark

2–43

Figure 2– 14

Operating the Measurement/Storage Module

Creating a frequency testing m ask

Creating a frequency testing mask

A mask can be used to test the frequency of the input signal. The shape of the mask varies depending on the shape of the signal to be tested. A mask designed for testing a sine wave cannot be used to test a square wave. Different masks are needed for different shapes of signals. Using the calibrated vertical vernier, position, and time base of the HP 54600–Series oscilloscope, a mask can be re-used to test signals of similar shapes but different frequencies and amplitudes.

To test the frequency of the signal, the period of the signal is tested instead of actually measuring the frequency. The test can be conducted by triggering on an edge of the signal and testing for the location of the second edge. An example mask is shown in the following figure.

Example mask for testi ng t he frequency of a sine wave

2–44

Operating the Measurement /Storage Module

Creating a frequency testing m ask

The following procedure can be used to setup a mask template for testing the frequency of a sine wave or a square wave. Similar methods can be used to generate masks for testing the frequency of signals of other shapes.

In the oscilloscope setup, the vertical sensitivity and position should be adjusted so that the amplitude is almost full scale. The trigger level should be adjusted to the middle of the input signal. The mask template can be created by using a function generator to generate a signal of variable frequency but of similar shape and amplitude to the one that is going to be tested.

Connect the output of a function generator to the oscilloscope.

Set the function generator to generate a waveform with a similar shape to the one that you are going to test.

Adjust the amplitude of the output until it is similar to the signal that you are going to test.

Press

Time

on the oscilloscope, then press the

Freq

softkey to

turn on the automatic measurement for frequency.

Adjust the frequency of the output of the function generator to the lower test limit.

The frequency can be verified by the automatic measurement.

Press

Autost or e

Adjust the frequency of the output of the function generator to the upper test limit.

An envelope of the test limit is generated.

Create a mask in the Define Automask menu with a tolerance of 0.0%.

For more information, refer to "To Create a Mask Template Using Autostore" in this chapter.

Specify your test region in the Mask Editor menu.

2–45

Figure 2–15

Operating the Measurement/Storage Module

Creating an overshoot tes ti ng m ask

Creating an overshoot testing mask

There are two parameters associated with the overshoot of a signal: the percentage of overshoot and the settling time of the overshoot. A mask template can be created to test the upper limit of these two parameters at the same time. The following figure shows an example of a mask template for testing overshoot.

Example of a ma sk t em plate for test ing overshoot

2–46

Operating the Measurement /Storage Module

Creating an overshoot tes ti ng m ask

The critical factors for creating the mask template are:

The vertical window of the middle region of the mask template determines

•

the upper limit of the overshoot.

The horizontal window of the middle region determines the upper limit of

•

the settling time.

The vertical window of the rightmost region determines the settling

•

window. Normally, the settling window is ±5% or ±10% of the V top voltage.

2–47

Figure 2–16

Operating the Measurement/Storage Module

Creating a ris e time testing mask

Creating a rise time testing mask

Mask template testing can be used to test the rise time of a signal, including specifying an upper limit for rise time. For example, you can specify that the rise time must be 15 ns or faster to pass the test.

Use the voltage and time readouts of the mask editor to ensure the correct settings. In the following figure, T1 and T2 are the critical points for determining the maximum rise time limit (rise time limit = T2 – T1).

Example of a def inition of a rise ti m e t esting mask

2–48

Figure 2–17

Operating the Measurement /Storage Module

Creating a ris e time testing mask

Determine the top and base of the signal.

Use the automatic measurement determine these values.

Calculate the 10% and 90% points.

Determine the upper limit for the rise time.

Draw the mask template using the mask editor.

The mask should look similar to the one in the following figure.

Vtop

and

Vbase

of the oscilloscope to

Example of a mask template for testing rise time

2–49

Figure 2–18

Operating the Measurement/Storage Module

Testing the eye opening of an eye-pattern signal

There are generally two tests that you want to perform on an eye-pattern signal: an eye boundary test and an eye opening test. Since the eye boundary can be easily tested by using the normal mask template testing, this section mainly focuses on how to create the mask for testing the eye opening.

A fail region in the shape of a hexagon is usually used to test the eye opening. An example of the shape of the mask is shown below.

Example of the definition of an ey e-pattern test ing mask

2–50

Figure 2–19

Operating the Measurement /Storage Module

Testing the eye opening of an eye-pattern signal

Set up the oscilloscope for proper viewing of the eye-pattern signal.

Determine the fail region.

Create the mask using the line drawing capabilities of the mask editor.

The voltage and time readouts in the mask editor can be used to ensure the correct shape and position of the mask. An example of how the mask template looks during testing is shown below.

Select the fail region as Inside of the mask template.

Example of a ma sk t em plate used for eye- opening testi ng

2–51

Operating the Measurement/Storage Module

To save or recall traces

With the Measurement/Storage Module installed, the two volatile pixel memories are replaced with four high-speed non-volatile memories.

In addition, 64 Kbytes of nonvolatile trace memory with data compression is also provided. A data compression algorithm maximizes the number of traces and front-panel setups that can be stored into this memory.

The total number of traces that can be saved depends on the complexity of each trace. At least 4 highly complex traces, or up to 96 simple traces, can be saved in this 64 Kbytes of memory. Storage time is less than 10 seconds.

Adjust Oscilloscope controls for desired stable display.

Press

A softkey menu with six choices appears. All of them are related to the trace memories of the module.

•

Trace

Selects the trace memory (ALL, 1 to 100). When ALL is selected,

four additional softkeys are displayed.

All Off

All On

Clear All

one time.

Review Traces

(with stored data) one at a time. View time is approximately 3 seconds. When selected, two additional softkeys are displayed.

Pause Review

pressed again, and

Trace X Off O n

is selected, trace status is temporarily displayed on the screen.

Save to Trace X

setup to the selected trace memory location.

Clear Trace X

from the selected trace memory location.

Used to turn all 100 trace memories to off.

Used to turn all 100 trace memories to on.

Used to clear the contents of all 100 trace memories at

Used to view the contents of all trace memories

pauses review cycle on current trace until key is

Cancel Rev iew cancels

Turns the selected memory number to on or off. When on

Saves the currently displayed waveform and front-panel

Erases a previously stored waveform and front-panel setup

the review cycle.

2–52

Operating the Measurement /Storage Module

To save or recall traces

Recall Setup

•

saved with the waveform for the trace selected.

Edit Label

•

waveform. See "Create a Label for Trace Memory" later in this chapter for more information.

Turn the knob closest to the

Recalls the previously stored front-panel setup that was

Used to enter a 20 character label that identifies the stored

Cursor s

key to move the cursor in

the character area to select the desired trace location (from 1 to

100).

Trace status is displayed on the screen. Information includes the edit label (or trace number if label has not been entered), and the time and date the memory was saved or cleared.

Select the desired softkey (

Saving Traces Hint

For traces 1 to 3, the trace i s saved in the non-compressed state. For traces greater than 3 , the trace is saved in 64 Kbytes of nonvolatile trace me m ory with data compression. After a com pressed trace i s saved, the available area (in percent) is displayed.

The number of traces that can be saved in 6 4 Kbytes of nonv ol atile trace memory is depende nt o n the trace complexit y a nd the current oscilloscope configuratio n. For example:

Save, Clear

, or

Recall

Up to 97 simple traces (e. g. , square wave) can be stored. As few as four com pl ex traces (A M m odulated sine wave) can be stored. Saving a trace wi th autostore information or the grid tak es more memory .

In most cases , i f t he i nformation i s not needed, tu rn i t off to save m em ory. The data compr ession algori thm uses run length encoding to compress the data.

Where possi bl e, runs of ident i cal bi ts are stored as a single word (1 identification bit and 15 l ength bits).

The Review Traces feature i s useful when observing test failures. To store only t he front-panel s etup, blank the screen prior to saving the trace.

The edit label function can be used to iden tify the setup.

2–53

Operating the Measurement/Storage Module

To create a label for a trace mem ory

To create a label for a trace memory

Each trace stored in Measurement/Storage Module can have a label up to 20 characters long to identify the stored waveform.

Press

Trace

Press the

A softkey menu with six softkey choices appears. Five of them are related to editing the message.

Enter

•

message area under the cursor position.

Space

•

Delete

•

position.

Insert

•

Enter or Space inserts the character or space into the message before the character at the cursor position. The rest of the message is shifted to the right by one character. With insert off, pressing Enter or Space replaces the character highlighted in the character area.

Clear To End

•

the message including the one under the cursor.

Done

•

Turn the Delay knob to move the cursor in the label to the position

Edit Label

Enters the highlighted character in the character area into the

Enters a space in the message area under the cursor position.

Deletes the character in the message area under the cursor

Toggles the insert function on or off. With insert on, pressing

Exits the editing of the message.

softkey.

Clears the characters from the cursor position to the end of

that you want to edit.

Turn the knob closest to the

Cursor s

key to move the cursor in the character area to select the character that you want to enter.

Press the message, or press the

Enter

softkey to enter the highlighted character into the user

Space

softkey to enter a space into the user

message.

Repeat procedures 3 through 5 until finished editing the message.

The maximum length of the label is 20 characters.

Press the

Your message is displayed when you execute the various trace functions.

Done

softkey.

2–54

Operating the Measurement /Storage Module

To set real -ti m e clock

To set real-time clock

Time (24-hour format) and date tagging of hard copy and nonvolatile trace memories is provided using a built in, battery backed up real-time clock. To set time and date, or view current contents:

Press

Print/ Ut il it y

Press the

A softkey menu with five choices appears. Four of them are related to setting the real-time clock time.

Hour

•

be changed using the knob closest to the

repeatedly pressing the softkey.

Minute

•

using the knob closest to the

pressing the softkey.

Second

•

using the knob closest to the

pressing the softkey.

Enter Time

•

the softkey area.

Previous Menu

•

Set Clock Set Time

Selects the hours digits (in 24 hour format). Current selection can

Selects the minutes digits. Current selection can be changed

Selects the seconds digits. Current selection can be changed

softkey.

Cursor s

Press to set the real-time clock time to the values displayed in

Returns you to the previous softkey menu.

key, or by repeatedly

key, or by

2–55

Operating the Measurement/Storage Module

To set real-time clock

Press the

A softkey menu with six choices appears. Five of them are related to setting the real-time clock date.

Day

•

closest to the

Month

•

knob closest to the

softkey.

Date

•

using the knob closest to the

pressing the softkey.

Year

•

closest to the

Enter Date

•

the softkey area.

Previous Menu

•

Press the

Set Date

Selects the day. Current selection can be changed using the knob

Selects the month. Current selection can be changed using the

Selects the day of the month. Current selection can be changed

Selects the year. Current selection can be changed using the knob

Current Time /D ate

softkey.

Cursor s

Press to set the real-time clock date to the values displayed in

Returns you to the previous softkey menu.

key, or by repeatedly pressing the softkey.

Cursor s

key, or by repeatedly pressing the

Cursor s

key, or by repeatedly pressing the softkey.

key, or by repeatedly

softkey to display current real-time clock

time and date information.

Real-time Clock Hint

The real-time cl ock only all ow s selection of valid dat es. If a day is s el ected and the month or year is changed s o the day is n ow i nvalid, the d ay is automatically adjusted (e.g. Feb 29).

2–56

Reference Information

This chapter contains reference information for the Measurement/Storage Modules including its operating characteristics.

3–2

Reference Inf orm ation

Operating Characteristics

Operating Characteristics are specified with the Measurement/Storage Module installed on an HP 54600–Series Oscilloscope.

Measurements

Voltage Time

Thresholds Cursor Readout Waveform Math Funct io n s

Fast Fourier Transforms

Test Region Inputs Freq Cursor Re sol ut i on

Points

Peak Find:

Variable Sensi t iv i ty and Offset

Time Record Length Horizontal M agnification

and Center Frequency Control

Vamp, Vavg, Vrms, Vpp, Vpre, Vovr, Vtop, Vbase, Vmin & Vmax Delay, Duty Cy cl e, Fre quency, Period, Phas e A ngle, Rise Time,

Fall Time, +Width, & –Width User-sele ctable among, 10% /90%, 20 %/80% or volt age levels

Voltage, tim e, perc ent age, and phase ang le . Addition, subtraction, multiplication, differentiation,

integration, and FFT.

Each pixel is selectable to be t ested or not. On either ch1, ch 2, or F 1 From 1.22 mHz (milliHz) to 9.766 MHz (1.22 mHz to 48.828 MHz

for HP 54615/546 16) Fixed at 10 24 for all models except HP 54615/54616

Fixed at 10 24 for HP 54615/546 16 with vect ors off Fixed at 51 2 for HP 54615/5461 6 w i th vectors on

Find Peak automatically snaps cursor to t he t wo largest pea ks located anywhere in the dis pl ayed frequency span. Measurement in formation is automatically di spl ayed at the bottom of the screen together wit h the difference i n frequency bet w een the two sel ect ed peaks.

Sensitivity and vertical offset (position) ar e cont rolled from the front panel to display an opti m um vi ew of the spectrum. Sensitivity is calibrated in dB per divisions; vertical offset is calibrated in dBV.

10x main s w eep speed. As the frequency span is changed, the display is magnified

about center frequency so that you get a closer view.

3–3

Reference Information

Operating Characteristics

Selectable Windows

Window Characteristics

FFT Freq Range

Freq Span Control

Center Freq Control

Move 0 Hz to Left

FFT Vector display

Display Units/Div

Reference Level

Programmability

Four windows are selectable: Hanning, for best frequency resolution and general purpose use; flattop, for best amplitude accuracy; rectangular, for single-shot signals such as transients and signals where there are an integral number of cycles in the time record, and exponential for best transient analysis.

Window Highest

Side Lobe

(dB) Rectangular –13 0.89 1.21 3.92 Hanning −32 1.44 2.00 1.42 Flattop –70 3.38 4.17 0.005

dc to 100 MHz HP 54600/54601/54645 dc to 150 MHz HP54602 dc to 60 MHz HP54603 dc to 500 MHz HP54610/54615/54616

This control allows you to specify the frequency span of the FFT display. When the Span is adjusted the display will expand or contract about the center frequency as set by the Center Frequency control. Refer to Figure 3-1 for the limits of the Frequency Span control.

This control allows you to specify the frequency at the center of the FFT display. When the Frequency Span is changed, the FFT display will expand or contract about the frequency at the center of the display. Refer to Figure 3-1 for the limits of this control.

Pressing this soft key will move the FFT display so that the left hand edge of the display will be 0Hz.

When the time domain display is turned off the FFT display will be displayed in vector drawing mode. The time domain display can be turned off by pressing the Channel # key twice

FFT vertical units in dB. This control allows you to adjust the vertical scaling of the FFT display in

a 1-2-5 sequence from 1 dB/div to 50 dB/div. This control allows adjustment of the reference level of the FFT display

across a range of 400 dBV. The minimum setting is -196 dB at 1 dBV/div decreasing to 0 dBV at 50 dBV/div. The maximum setting is 400 dBV at 50 dB/div, decreasing to 204 dB at 1 dBV/div.

All front-panel controls are fully programmable over HP-IB (HP 54657A) or RS-232 (HP 54658A and HP 54659B)

3dB Bandwidth(b ins)

6dB Bandwidth(b ins)

Scallop Loss (dB)

3–4

Figure 3–1

5.E+10

5.E+09

5.E+08

5.E+07

5.E+06

5 GSa/s 500 MSa/s 50 MSa/s

5 MSa/s

Effective Sample Rate Frequency Span

FFT operation limited by bandwidth of scope

Reference Inf orm ation

Operating Characteristics

5 GHz

500 MHz 50 MHz

5 MHz

5.E+05

Samples/s

5.E+04

5.E+03

5.E+02

5.E+01

0.5E+01

500 kSa/s

5 s/div

200 ms/div

10 ms/div

500 us/div

Sweep Speed

5 s/div 2 s/div 1 s/div 500 ms/div 200 ms/div 100 ms/div 50 ms/div 20 ms/div 10 ms/div 5 ms/div 2 ms/div 1 ms/div 500 µs/div 200 µs/div 100 µs/div * 2 ns/div FFT valid only on HP 54615/54616

Effective Sample Rate

20 Hz 50 Hz 100 Hz 200 Hz 500 Hz 1 kHz 2 kHz 5 kHz 10 kHz 20 kHz 50 kHz 100 kHz 200 kHz 500 kHz 1 MHz

Maximum Frequency Span

9.75 Hz

24.4 Hz

48.85 Hz

97.5 Hz 244 Hz

488.5 Hz 975 Hz

2.44 kH z

4.885 kH z

9.75k Hz

24.4 kH z

48.85 kH z

97.5 kH z 244 kHz

488.5 kHz

20 us/div 1 us/div

Sweep Speed

50 µs/div 20 µs/div 10 µs/div 5 µs/div 2 µs/div 1 µs/div 500 ns/di v 200 ns/di v 100 ns/di v 50 ns/div 20 ns/div 10 ns/div 5 ns/div 2 ns/div*

Effective Sample Rate

2 MHz 5 MHz 10 MHz 20 MHz 50 MHz 100 MHz 200 MHz 500 MHz 1 GHz 2 GHz 5 GHz 10 GHz 20 GHz 50 GHz

50 ns/div

Maximum Frequency Span

975k kHz

2.44 MHz

4.885 MH z

9.75 MHz

24.4 MHz

48.85 MHz

97.5 MHz 244 MHz

488.5 MHz 975 MHz

2.44 GHz

4.885 GHz

9.75 GHz

24.41 GHz

500 kHz 50 kHz 5 kHz 500 Hz 50 Hz

Frequency Span in Hz

FFT Operati on Frequency Span and Effective Sampling Rat e vs Sweep Speed

3–5

Reference Information

Operating Characteristics

Mask Template Testing

Number of mask templates

Mask template generation

Test Region Fail Region

Failure indication

Failure mode

2, nonvolatile

Automask generates a mask from waveform data with variable tolerances.

Mask editor al lo w s pi xel-by-pixel edi ting and line drawing edi ting. Smooth mask function pe rforms a running average of 3 pixels.

Each pixel is selectable to be tested or not Inside-si gnal fails if it falls i nside the region bounded by the

maximum and minimum limit lines. Outside-si gnal fails if it fa lls outside the regi on bounded by the

maximum and minimum limit lines. Failure zone indicator shows where the signal fails the mask

template. Failure modes are stop or cont in ue on f ai l ure. Failure(s) can be

saved to trace memory or print ed

Trace Memory (all nonvolatil e)

1 through 3 4 through 100

High-spee d storage without com pression. Storage with compressio n, num ber of traces is a funct i on of

complexity. Storage time is le ss than 10 seconds.

Real Time Cloc k

Can be set from front panel.

24-hour format with batt ery back-up.

Hardcopy Ou tput

Printer/Plotter Supported

HP 54658A and HP 54659B only

HP ThinkJet, HP QuietJet, HP PaintJet, HP DeskJet, and HP Laser Jet printer. HP-GL com patible plotter s.

Epson FX-80 or compatibl e print er.

3–6

Reference Inf orm ation

Operating Characteristics

RS-232 Co nfi gurations

Connector Typ e

Protocols Data Bits Stop Bits Parity: Baud Rates

With the adapter cable conne ct ed, at the end of the cable i s a 9 pin/25 pin D TE por t; a printer cable is required to connec t it to hardcopy devices or a compu te r.

XON/XOF F, har dw are. 8 1 none. 1200, 2400, 960 0, 19200.

Programmab ilit y

All instrument settings and operating m odes may be remotely progra m m ed vi a RS-232 and HP-IB (IEE E-4 88).

3–7

3–8

Index

∫dt, 2–5

aliasing, 2–9 Automask, 2–30 automatic measurements, 2–14

delay, 2–19 phase, 2–21 Vamplitude, 2–23 voltage, 2–23 Vovershoot, 2–23 Vpreshoot, 2–23

Autostore, 2–31

cable, 1–4

HP-IB, 1–4 parallel, 1–4

RS-232, 1–4, 1–6 to 1–7 center frequency, 2–11 clock, set, 2–55 compatibility, 1– 2 configure module, 1–4 connector

DB25, 1–5

DB9, 1–7 create a mask

Automask, 2–30

Autostore, 2–31

delay, 2–42

eye-pattern, 2–50

frequency, 2–44

line se gments, 2–3 3

overshoot, 2–46

rise time, 2–48 create a trace memory label, 2–54 cursor measurements, 2–25

time (degrees), 2–26

voltage (percent), 2–25

DB25 connector, 1–5 DB9 connector, 1–7 dBm, 2–8 DC Value, 2–8 delay measurements, 2–19 delay testing mask, 2–42 differentiate, 2–5 dV/dt, 2–5

edit a mask

line se gments, 2–3 3 pixel, 2–35

waveform portion, 2–36 exponential window, 2–11 eye-pattern testing mask, 2–50

FFT, 2–6, 2–8

aliasing, 2–9

center frequency, 2–11

DC Value, 2–8

Find Peaks, 2–11

frequency span, 2–11

measurement, 2–8

measurement hints, 2–12

Move 0Hz To Left, 2–11

Move f1 To Center, 2–11

operating characteristics, 3–3

operation, 2–10

spectral leakage, 2–10

window, 2–11 Find Peaks, 2–11 flattop window, 2–11 frequency span, 2–11 frequency testing mask, 2–44 Function 1, 2–4 Function 2, 2–5

hanning window, 2–11 hardcopy output, operating characteristics, 3–6 HP-IB

cable, 1–4

installation, 1–3 integrate, 2–5 interface cables, 1–4

label, trace memory, 2–54 leakage, spectral, 2–10 line segments, 2–33 Lissajous, 2–21

mask template testing, characteristics, 3–6 mask,creating

eye-pattern, 2–50 frequency, 2–44 overshoot, 2–46 rise time, 2–48

mask,editing

line se gments, 2–3 3 pixel, 2–35

waveform portion, 2–36 math functions, 2–3 measurements, automatic, 2–14

delay, 2–19

phase, 2–21

Vamplitude, 2–23

voltage, 2–23

Vovershoot, 2–23

Vpreshoot, 2–23 measurements, cursor, 2–25 measurements, operating characteristics,

3–3 minus (-), 2–4 monitoring, waveform, 2–29 Move 0Hz To Left, 2–11 Move f1 To Center, 2–11 multiply, 2–4

Index–1

Index

Nyquist frequency, 2–9

operating characteristics, 3–3

FFT, 3–3 hardcopy output, 3–6 mask template testing, 3–6 measurments, 3–3 programmability, 3–7 real-time clock, 3–6 RS-232 configurations, 3–7

trace memory, 3–6 operating system, 1–2 oscilloscope compatibility, 1–2 overshoot testing mask, 2–46

parallel cable, 1–4 phase measurements, 2–21 phase shift, 2–21 pixel editing, 2–35 plus (+), 2–4 programmability, operating characteristics,

3–7

real time clock, operating characteristics, 3–6 real-time clock, set, 2–55 recall traces, 2–52 rectangular window, 2–11 rise time testing mask, 2–48 RS-232

cable, 1–4, 1–6 to 1–7

configurations, characteristics, 3–7

port, 1–5, 1–7

save traces, 2–52 saving test violations, 2–40 set real-time clock, 2–55 settin g thresholds, 2–15 spectral leakage, 2–10 subtract, 2–4

test violations, saving, 2–40 testing mask, creating

delay, 2–42 eye-pattern, 2–50 frequency, 2–44 overshoot, 2–46

rise time, 2–48 thresholds, 2–15 time cursor measurements, 2–26 trace memory label, 2–54 trace memory, operating characteristics,

3–6 traces

non-volatile memorie s, 2–52

recall, 2–52

save, 2–52

unattended waveform monitoring, 2–29 upgrade kit, 1–2

Vamplitude, 2–23 voltage cursor measurements, 2–25 voltage measurements, 2–23 Vovershoot, 2–23 Vpreshoot, 2–23

waveform mask edit, 2–36 waveform monitoring, 2–29

starting, 2–38

test violations, 2–40 window

exponential, 2–11

FFT, 2–11

flattop, 2–11

hanning, 2–11

rectangular, 2–11

Index–2

Reproduction, adaptation, or translation without prior written permission is prohibited, except as allowed under the copyright laws.

Document Warranty

The information contained in this document is subject to change without notice.

Hewlett-Packard makes no warranty of any k ind with regard to this material, including, but not limited to, the implied warranties of merchantability or fitness for a particular purpose.

Hewlett-Packard shall not be liable for errors contained herein or for damages in conne ction with the furnishing, performance, or use of th is mate rial.

Safety

This apparatus has been design ed and tested in accordance with IEC Publication 348, Safety Requirement s for Measuring Apparatus, an d has been supplied in a safe condition. This is a S afety Class I instrument (provided with terminal for protective earthing). Before applying power, verify that the correct safety precautions are taken (see the following warnings). In addition, note the external markings on the instrument that are described under "Safety Symbols."

Warning

Before turning on the

•

instrument, you must connect the protective earth terminal of the instrument to th e protective conductor of the (mains) power cord. The mains plug shall only be inserted in a socket outlet provided with a prot ective earth contact. You must not negate the protective action by using an extension cord (power cable) without a protective conductor (grounding). Grounding one conductor of a two-conductor outlet is not sufficient protection.

Only fuses with the

•

required rated current, voltage, and specified type (normal blow, time delay, etc.) should be used. Do not use repaired fuses or short-circuited fuseholders. To do so could cause a shock or fire hazard.

Service instructions are for

•

trained service personnel. To avoid dangerous electric shock, do not perform any service unless qualif ied to do so. Do not attempt internal service or adjustment unless another person, capable of rendering first aid and resuscitation, is present.

If you energize this

•

instrument by an auto transformer (for voltage reduction), make sure the common terminal is connect ed to the earth terminal of the power source.

Whenever it is likely that

•

the ground p rotection is impaired, yo u must make the instrument inoperative and secure it against any uninte nded operation.

Do not operate the

•

instrument in the presence of flammable gasses or fumes. Operation of any electrical instrument in such an environment constitutes a definite safety hazard.

Do not install substitute

•

parts or perform any unauthorized modification to the instrument.

Capacitors inside the

•

instrument may retain a charge even if the instrument is disconnected from its source of supply.

Use caution when exposing

•

or handling the CRT. Handling or replacing the CRT shall be do ne only by qualified maintenance personnel.

Safety Symbols

Instruction manual symbol: the product is marked with this symbol when it is necessary for you to refer to the instruction manual in order to protect against damage to the product.

Hazardous voltage symbol.

Earth terminal symbol: Used to indicate a circuit common connected to ground ed chassis.

WARNING

The Warning sign denotes a hazard. It calls attention to a procedure, practice, or the like, which, if not co rrectly performed or adhered to, could result in personal injury. Do not proceed beyond a Warning sign until the indicated conditions are fully understood and met.

CAUTIO N

The Cautio n sign denotes a hazard. It calls attention to an operating procedure, practice, or the like, which, if not correctly performed or adhered to, could result in damage to or destruction of part or all of the product. Do not proceed beyond a Caution symbol until the indicated conditions are fully understoo d or met.

Hewlett-Packard P.O. Box 2197 1900 Garden of the Gods Road Colorado Springs, CO 80901

Product Warranty

This Hewlett-Packard product has a warranty against defects in material and workmanship for a period of three years from date of shipment. During the warranty period, Hewlett-Packard Company will, at its opti on, either repair or replace products that prove to be defective.

For warranty service or repair, this product must be returned to a service facility designated by Hewlett-Packard.

For products returned to Hewlett-Packard for warranty service, the Buyer shall prepay shipping charges to Hewlett-Packard and Hewlett-Packard shall pay shipping charges to return the product to the Buyer. However, the Buyer shall pay all shipping charges, duties, and taxes fo r products returned to Hewlett-Packard from another country.

Hewlett-Packard warrants that its software and firmware designated by Hewlett-Packard for use with an instrument will execute its programming instructions when properly installe d on that instrument. Hewlett-Packard does not warrant that the operation of the instrument software, or firmware will be uninterrupted or error free.

Limitation of Warranty

The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by the Buyer, Buyer-supplied software or interfacing, unauthorized modification or misuse, operation o utside of the environmental spe cification s for the product, or improper site preparation or maintenance.

No other warranty is expressed or im plied. Hewlett-Packard specifically disclaims the implied warranties of merchantability or fitness for a particular purpose.

Exclusive Remedies

The remedies provided herein are the buyer’s sole and exclusive remedies. Hewlett-Packard shall not be liable for any direct, indirect, special, incidental, or consequential damages, whether based on contract, tort, or any other legal theory.

Assistance

Product maintenance agreements and other customer assistance agreements are available for Hewlett-Packard prod ucts.

For any assistance, contact your nearest Hewlett-Packard Sales Office.

Certification

Hewlett-Packard Company certif ies that this product met its published specifications at the time of ship ment from the factory. Hewlett-Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.

About this edition

This is the first edition of the

HP 54657A, HP 54658A, and HP 54659B Measurement/Storage Modules User’s Guide.

Publication number 54657-97010

Printed in USA. Edition dates are as follows: First edition, October 1996

New editions are complete revisions of the manual. Update packages, which are issued between editions, contain additional and replaceme nt pages to be merged into the manual by you. The dates on the title page change only when a new edition is published.

A software or firmware code may be printed befo re the date. This code indicates the version level of the so ftware or firmware of this product at the time the manual or update was issued. Many product updates do not require manual changes; and, conversely, manual corrections may be done without accompanying product changes. Therefore, do not expect a one-to-o ne correspondence between product updates and manual updates.

The following li st of page s gives the date of the current edition and of any changed pages to that edition .

All pages original edition

DECLARATION OF CONFORMITY

according to I S O/IEC Guide 22 and EN 45014

Manufacturer’s Name: Manufacturer’s Address:

declares, th at t he product

Product Name: Model Number(s): Product Option(s):

conforms to th e following Pr oduct Specific ations:

Safety:

EMC:

IEC 1010-1:1990+A1 / EN 61010-1:1993 UL 3111 CSA-C22.2 No. 1010.1:1993

CISPR 11:1990 / EN 55011:1991 Group 1 Class A IEC 555-2:1982 + A1:1985 / EN 60555-2:1987 IEC 555-3:1982 + A1:1990 / EN 60555-3:1987 + A1:1991 IEC 801-2:1991 / EN 50082-1:1992 4 kV CD, 8 kV AD IEC 801-3:1984 / EN 50082-1:1992 3 V/m, {1kHz 80% AM, 27-1000 MHz} IEC 801-4:1988 / EN 50082-1:1992 0.5 kV Sig. Lines, 1 kV Power Lines

Hewlett-Pac kard Company

Colorado Spr i ngs Division

1900 Garden of the Gods Road

Colorado Springs, CO 80907 USA

Digitizing Oscilloscope

HP 54657A, HP 54658A, and HP 54659B

All

Supplementar y I nformation:

The product herew i th complies w i th the requirements of the Lo w V ol tage Directiv e 73/23/EEC and the EMC Directive 89/336/EEC and carries the CE m arking accordi ngl y.

This product w as tested in a ty pi cal configu ration with Hew l ett-Packard test systems.

Colorado Spr i ngs, 01/12/95

John Strathman, Quality Manager

European Contact: Your local Hewlett-Packard Sales and Service Office or Hewlett-Packard GmbH, Department ZQ / Standards Europe, Herrenber ger Strasse 130, D-71034 B öblingen Germany (FAX: +49-7031- 14-3143)

Product Regulations

Safety

EMC

Sound Press ure Level

IEC 1010-1:1990+A1 / EN 61010-1:1993 UL 3111 CSA-C22.2 No.1010.1:1993

This Product m eets the requi rem ent of the European Communi ties (EC) EMC Directive 89/336/EEC.

Emissions Immunity

EN55011/CISPR 11 (ISM, Group 1, Class A equipment) EN50082-1 Code IEC 555-2

IEC 555-3 IEC 801-2 (ESD) 4kV CD, 8kV AD IEC 801-3 (Rad.) 3 V/m IEC 801-4 (EFT) 0.5 kV, 1kV

Performance Co des: 1 PASS - Normal operati on, no ef fect. 2 PASS - Temporary degradation, sel f recoverable. 3 PASS - Temporary degradation, operator interventi on required. 4 F A I L - Not recoverable, com ponent damage.

Notes: * Code 1 for HP 54616C Code 2 for HP 54615B and HP 5461 6B

1 1 1,2 2 1,2

Notes

* *

Less than 60 dBA

Press this key . . .

Voltage

Time

. . . to obtain this menu

Cursors

Press this key . . .

Print Utility

. . . to obtain this menu

Trace

Press this key . . .

. . . to obtain this menu

Setup

Agilent 54658A Users Guide

Specifications and Main Features

Frequently Asked Questions

User Manual

Measurement/Storage Modules

Accessories available

In This Book

Contents

Oscilloscope Compatibility

HP 54657A and HP 54658A

HP 54659B

To install th e Measurement/ S torage Module

Interface Cabl es

To configure t he interface

HP 54658A Serial Connections

HP 54659B Serial Connections

Math Funct ions

Function 1

Function 2

FFT Measu rem ent

DC Value

Aliasing

Spectral Leakage

FFT Operation

Automatic M easurements

Setting Thres holds

To make delay m easurements automatically

To make phas e m easurements automatically

To make additional voltage measurements automatically

To make addi ti onal cursor meas urements

Unattende d W aveform Moni toring

To create a ma sk template usi ng Automask

To create a mask template using Autostore

To create or edit a mask using line segments

To edit an ind iv idual pixel of a mask

To edit the mas k to test only a portion of a wav eform

To start waveform monitor ing

To automatical ly save test violations

Creating a delay testing ma sk

Creating a frequency testing m ask

Creating an overshoot tes ti ng m ask

Creating a ris e time testing mask

Testing the eye opening of an eye-pattern signal

To save or recall traces

To create a label for a trace mem ory

To set real -ti m e clock

Operating Characteristics

Measurements

Fast Fourier Transforms

Mask Template Testing

Real Time Cloc k

Hardcopy Ou tput

RS-232 Co nfi gurations

Programmab ilit y

Index

DECLARATION OF CONFORMITY