Agilent 53230A Data Sheet

Agilent 53200A Series
RF/Universal Frequency
Counter/Timers

Data Sheet

53210A 350 MHz RF Frequency Counter, 10 digits/sec
53220A 350 MHz Universal Frequency Counter/Timer, 12 digits/sec, 100 ps
53230A 350 MHz Universal Frequency Counter/Timer, 12 digits/sec, 20 ps

Imagine your counter doing More!

More Bandwidth

• 350 MHz baseband frequency

• 6 or 15 GHz optional microwave
channels

More Resolution & Speed

• 12 digits/sec

• 20 ps single-shot time resolution

• Up to 75,000 and 90,000 readings/
sec (frequency and time interval)

More Insight

• Datalog trend plot

• Cumulative histogram

• Built-in math analysis and statistics

• 1M reading memory and USB Flash
storage

More Connectivity

• LXI-C/Ethernet LAN, USB

• Optional GPIB interface

• Optional battery for portability and
timebase accuracy

More Measurement Capability
(53230A only)

• Continuous gap-free measurements

• Basic measurements and
timestamps for modulation domain
analysis (MDA)

• Optional pulse/burst microwave
measurement

Introduction

Frequency counters are depended
on in R&D and in manufacturing for
the fastest, most accurate frequency
and time interval measurements.
The 53200 Series of RF and universal
frequency counter/timers expands on
this expectation to provide you with
the most information, connectivity
and new measurement capabilities,
while building on the speed and
accuracy you’ve depended on with
Agilent’s decades of time and fre­quency measurement expertise.

Three available models offer resolu­tion capabilities up to 12 digits/sec
single-shot frequency resolution on
a one second gate. Single-shot time
interval measurements can be
resolved down to 20 psec. All models
offer new built-in analysis and
graphing capabilities to maximize the
insight and information you receive.

Definitions

The following definitions apply to the specifications and characteristics
described throughout.

Specifi cation (spec)

The warranted performance of a calibrated instrument that has been stored for a
minimum of 2 hours within the operating temperature range of 0º C - 55º C and after a
45-minute warm up period. Automated calibration (*CAL?) performed within ±5ºC before
measurement. All specifi cations were created in compliance with ISO-17025 methods.

Data published in this document are specifi cations unless otherwise noted.

Typical (typ)

The characteristic performance, which 80% or more of manufactured instruments will
meet. This data is not warranted, does not include measurement uncertainty, and is
valid only at room temperature (approximately 23º C). Automated calibration (*CAL?)

performed within ±5º C before measurement.

Nominal (nom)

The mean or average characteristic performance, or the value of an attribute that is
determined by design such as a connector type, physical dimension, or operating speed.
This data is not warranted and is measured at room temperature (approximately 23º C).

Automated calibration (*CAL?) performed within ±5º C before measurement.

Measured (meas)

An attribute measured during development for purposes of communicating the expected
performance.

This data is not warranted and is measured at room temperature (approximately 23º C).
Automated calibration (*CAL?) performed within ±5º C before measurement.

Stability

Represents the 24-hour, ±1º C short-term, relative measurement accuracy.
Includes measurement error and 24-hour ± 1º C timebase aging error.

Accuracy

Represents the traceable measurement accuracy of a measurement for T
Includes measurement error, timebase error, and calibration source uncertainty.

Random measurement errors are combined using the root-sum-square method and are
multiplied by k for the desired confi dence level. Systematic errors are added linearly and
include time skew errors, trigger timing errors, and timebase errors as appropriate for

each measurement type.

T

CAL

Represents the ambient temperature of the instrument during the last adjustment to
calibration reference standards.

T

must be between 10º C to 45º C for a valid instrument calibration.

CAL

T

ACAL

Represents the temperature of the instrument during the last automated calibration
(*CAL?) operation.

All information in this document are subject to change without notice.

2

± 5º C.

CAL

Input Channel Characteristics

53210A 53220A 53230A

Input characteristics (nom)

Channels

Standard (DC - 350 MHz) Ch 1 Ch 1 & Ch 2
Optional (6 GHz or 15 GHz) Ch 2 Ch 3

Standard inputs (nom)

Frequency range

DC coupled DC (1 mHz) to 350 MHz (2.8 ns to 1000 sec)
AC coupled, 50 Ω1 or 1 MΩ 10 Hz - 350 MHz

Input

Connector Front panel BNC(f). Option 201 adds parallel rear panel BNC(f) inputs
Input impedance (typ) Selectable 1 M Ω ± 1.5% or 50 Ω ± 1.5% || <25 pF
Input coupling Selectable DC or AC
Input filter Selectable 100 kHz cut-off frequency low pass

10 Hz (AC coupling) cut-off frequency high pass filter

Amplitude range

Input range ±5 V (±50 V) full scale ranges
Sensitivity

Noise

Input event thresholds

Threshold levels ±5 V (±50 V) in 2.5 mV (25 mV) steps
Noise reject
Slope Selectable Positive or Negative
Auto-scale Acquires signal for current measurement channel,

Auto-level Selectable On or Off

Minimum signal frequency
for auto level

Minimum signal for auto
level

Maximum input

50 Ω damage level 1 W
50 Ω protection threshold Will not activate below 7.5 VpK

1 M Ω damage level DC - 5 kHz: 350 Vpk (AC + DC)

3,4

(typ) DC - 100 MHz: 20 mVpk

> 100 MHz: 40 mVpk

3

4

500 µVrms (max), 350 µVrms (typ)

Selectable On/ Off

selects range (5 V or 50 V), sets auto-level 50%

On: Sets auto-level (% of Vpp) operation
Occurs once for each INIT or after a timeout.
Measures signal Vpp and sets Trigger level to 50%
Off: Selectable user set level (Volts)

User selectable (Slow (50 Hz), Fast (10 kHz))

300 mVpp

50 Ω internal termination auto-protects

by switching to 1 M Ω

5 kHz - 100 kHz: Derate linearly to 10 Vpk (AC + DC)

>100 kHz: 10 Vpk (AC + DC)

2

3

Input Channel Characteristics continued

53210A 53220A 53230A

Optional Microwave Inputs (nom)

Frequency range

Option 106 100 MHz - 6 GHz
Option 115 300 MHz - 15 GHz

Input

Connector Front panel precision Type-N(f)

Option 203 moves the input connector to a rear panel SMA(f)
Input impedance (typ) 50 Ω ± 1.5% (SWR < 2.5)
Input coupling AC

Continuous wave
amplitude range

Option 106 Autoranged to +19 dBm max. (2 Vrms)
Option 115 Autoranged to +13 dBm max. (1.0 Vrms)
Sensitivity (typ)

Input event thresholds

Level range Auto-ranged for optimum sensitivity and bandwidth
AM tolerance (CW only) 50% modulation depth

Maximum input

Damage level > +27 dBm (5 Vrms)

5

6 GHz (Opt 106): -27 dBm (10 mVrms)

15 GHz (Opt 115):

0.3 GHz – 2 GHz: -23 dBm
2 GHz – 13 GHz: -26 dBm
13 GHz – 15 GHz: -21 dBm

1. AC coupling occurs after 50 ohm termination

2. When ordered with optional rear terminals, the standard/baseband channel inputs are active on both the front and rear of the
universal counter though the specifications provided only apply to the rear terminals. Performance for the front terminals with rear
terminals installed is not specified.

3. Multiply value(s) by x10 for the 50 V range.

4. Stated specification assumes Noise Reject OFF. Noise Reject ON doubles the sensitivity minimum voltage levels.

5. Assumes sine wave.

4

Measurement Characteristics

53210A 53220A 53230A

Measurement range (nom)

Frequency, period (average) measurements

Common

Channels Ch 1 or optional Ch 2 Ch 1, Ch 2 or optional Ch 3
Digits/s 10 digits/s 12 digits/s 12 digits/s
Maximum display

Resolution

1

Measurement technique Reciprocal Reciprocal and resolution

Signal type Continuous Wave (CW) CW and pulse/burst

Level & slope Automatically preset or user selectable
Gate Internal or external
Gate time

Advanced gating

2

3

FM tolerance ± 50%

Frequency, period

Range9 DC (1 mHz) to 350 MHz (2.8 ns to 1000 s)
Microwave input (optional) Option 106 - 100 MHz to 6 GHz (166 ps to 10 ns)

Frequency ratio

4

Range 1015 Displayable range

Timestamp/modulation domain measurements

Sample rate

5

#Edges/ timestamp N/A N/A Auto-acquired per

Acquisition length N/A N/A up to 1 MSa or

Time interval (single-shot) measurements

Common

Channels N/A Ch 1 or 2
Single-shot time resolution N/A 100 ps 20 ps
Gating N/A Internal or external gate

Slope N/A Independent start, stop slopes
Level N/A Independent start, stop slopes
Channel-to-channel time

skew (typ)

12 digits 15 digits 15 digits

enhanced

1 ms to 1000 s in 10 µs

steps

100 µs to 1000 s in 10 µs

steps

1 µs to 1000 s in 1 µs steps

N/A Start delay (time or events) and stop hold-off

(time or events)

Option 115 - 300 MHz to 15 GHz ( 66 ps to 3.3 ns)

N/A N/A 1 MSa/s, 800 kSa/s,

11

Start delay (time or events) and stop hold-off

(time or events)

N/A 100 ps 50 ps

Reciprocal, resolution-

enhanced or continuous

(gap-free)

(Option 150)

100 kSa/s, 10 kSa/s

acquisition

100,000 s (max)

5

Measurement Characteristics continued

53210A 53220A 53230A

Time interval A to B, B to A

9

Range

Time interval A or B

Range N/A 2 ns to 100,000 s (min)
Minimum width N/A 2 ns
Minimum edge repetition

rate
Level & slope N/A Auto-level or user selectable

Single-period, pulse-width, rise time, fall time

Range N/A 0 s to 1000 s
Minimum width N/A 2 ns
Minimum edge repetition

Rate
Level & slope N/A Auto-level or user selectable

Duty

Range N/A .000001 to .999999 or 0.0001% to 99.9999%
Minumim width N/A 2 ns
Level & slope N/A Auto-level or user selectable

Phase A to B, B to A

6

Range

Totalize measurements

Channels N/A Ch 1 or Ch 2

9

Range
Rate N/A 0 - 350 MHz
Gating N/A Continuous, timed, or external gate input

Level measurements

Voltage level - standard
input channels

Microwave power level
(microwave channel option)

N/A -1 ns to 100,000 s (nom)

-0.5 ns to 100,000 s (min)

N/A 6 ns

N/A 6 ns

N/A -180.000º to 360.000º

N/A 0 to 1015 events

Gate accuracy is 20 ns

±5.1 Vpk with 2.5 mV resolution or ±51 Vpk with 25 mV resolution

0 to 4 relative signal power

6

Measurement Characteristics continued

53210A 53220A 53230A

Pulse/burst frequency and pulse envelope detector (Option 150)

Pulse/burst measurements N/A N/A Carrier frequency, carrier

Pulse/burst width

N/A N/A >200 ns
for carrier frequency
measurements

Minimum pulse/burst

10

N/A N/A >50 ns
width for envelope
measurements

Acquisition N/A N/A Auto, Manual7
PRF, PRI range N/A N/A 1 Hz – 10 MHz
Pulse detector response

time (typ)

8

N/A N/A 15 ns rise, fall

Pulse width accuracy (typ) N/A N/A 20 ns + (2*carrier period)
Power ratio (typ) N/A N/A >15 dB
Power range and

N/A N/A +13 dBm (1 Vrms) to
sensitivity (sinusoidal) (typ)

12

period, pulse repetition

interval (PRI), pulse repeti-

tion frequency (PRF), posi-

tive and negative width

Narrow: <17 us

Wide: >13 us

-13 dBm (50 mVrms)

1. Maximum display resolution for frequency and period. Totalize display resolution is 15 digits, time interval based measurements
are 12 digits.

2. Continuous, gap-free measurements limits the gate time setting to 10 µs to 1000 s in 10 µs steps.

3. Refer to the gate characteristics section for more details on advanced gate capabilities.

4. Measurements on each input channel are performed simultaneously using one gate interval. The actual measurement gate interval
on each channel will be synchrounous with edges of each input signal.

5. Maximum sample rate. Actual sample rate will be limited by the input signal edge rate for signals slower than the selected sample
rate. Maximum timestamp rate offers minimal FM tolerance. If high FM tolerance is required, use lower timestamp rates.

6. Assumes two frequencies are identical, only shifted in phase.

7. Manual control of gate width and gate delay are allowed only for wide pulsed mode.

8. For pulsed signals > -7 dBm (100 mVrms) while gated on.

9. For totalize, time interval and frequency measurements, you may get measurement readings beyond the
range stated, but the accuracy of those readings is not specified.

10. Applies when burst width * Carrier Freq >80.

11. Specifications apply if measurement channels are in 5 V range, DC coupled, 50 ohm terminated and at fixed level for: time interval
single and dual channel, pulse width, duty, phase, single period and rise/fall time measurements.

12. Option 150 microwave pulse/burst measurement descriptions:

+ width burst (on)

- 6 dB
p-p

amplitude

-6 dB Detector Level

Burst carrier frequency

- width burst (off)

PRF

PRI = 1/PRF

-12

-6 dB Detector Level

+ width burst (on)

PRI = 1/PRF

Burst carrier frequency

- 12 dB

- width burst (off)

PRF

7

Gate, Trigger and Timebase Characteristics

53210A 53220A 53230A

Gate characteristics (nom)

Gate

Source Time, external Time, external or advanced
Gate time (step size)

Advanced: gate start

Source N/A Internal or external, Ch 1/Ch 2

Slope N/A Positive or negative
Delay time N/A 0 s to 10 s in 10 ns steps
Delay events (edges) N/A 0 to 10

Advanced: gate stop hold-off

Source N/A Internal or external, Ch 1/Ch 2

Slope N/A Positive or negative
Hold-off time
Hold-off events (edges) N/A 0 to 108 (minimum width (positive or negative) >60 ns)

External gate input characteristics (typ)

Connector Rear panel BNC(f)

Impedance 1 k Ω when selected as external gate input
Level TTL compatible
Slope Selectable positive or negative
Gate to gate timing 3 µs gate end to next gate start
Damage level <-5 V, >+10 V

Gate output characteristics (typ)

Connector Rear panel BNC(f)

Impedance 50 Ω when selected for gate output
Level TTL compatible
Slope Selectable positive or negative
Damage level <-5 V, >+10 V

1

1 ms - 1000 s (10 µs) 100 µs - 1000 s (10 µs) 1 µs - 1000 s (1 µs)

(unused standard channel input)

8

for signals up to 100 MHz

(unused standard channel input)

N/A Hold-off Time settable from 60 ns to 1000 s

Selectable as external gate input or gate output signal

Selectable as external gate input or gate output signal

8

Trigger and Timebase Characteristics (nom)

53210A 53220A 53230A

Trigger characteristics (nom)

General

Trigger source Internal, external, bus, manual
Trigger count 1 to 1,000,000
Trigger delay 0 s to 3600 s in 1 µs steps

Samples/trigger 1 to 1,000,000

External trigger input (typ)

Connector Rear panel BNC(f)
Impedance 1 k Ω
Level TTL compatible
Slope Selectable positive or negative
Pulse width > 40 ns min.
Latency Frequency, period: 1 µs + 3 periods

time interval, totalize: 100 ns
External trigger rate 300/s max 1 k/s max 10 k/s max
Damage level <-5 V, >+10 V

Timebase characteristics (nom)

Timebase reference Internal, external, or auto
Timebase adjustment

method
Timebase adjustment

Resolution

External timebase input (typ)

Impedance 1k Ω AC coupled
Level (typ) 100 mVrms to 2.5 Vrms
Lock frequencies 10 MHz, 5 MHz, 1 MHz
Lock range ±1 ppm (±0.1 ppm for Option 010 U-OCXO timebase)
Damage level 7 Vrms

Timebase output (typ)

Impedance 50 Ω ± 5% at 10 MHz
Level 0.5 Vrms into a 50 Ω load

Signal 10 MHz sinewave
Damage level 7 Vrms

Closed-box electronic adjustment

-10

10

-11

(10

for Option 010 U-OCXO timebase)

1.0 Vrms into a 1 k Ω load

1. Continuous, gap-free measurements limits the Gate Time setting to 10 µs to 1000 s in 10 µs steps.

9

Math, Graphing and Memory Characteristics (nom)

53210A 53220A 53230A

Math operations

Smoothing (averaging)

Scaling mX-b or m(1/X)-b

∆-change (X-b)/b scaled to %, ppm, or ppb

Null (X-b)

Statistics

Limit test

1

3

Operation Individual and simultaneous operation of smoothing, scaling, statistics, and limit test

Graphical display selections

Digits Numeric result with input level shown
Trend Strip chart (measurements vs. readings over time)

Histogram Cumulative histogram of measurements; manual reset

Limit test Measurement result, tuning bar-graph, and PASS/ FAIL message
Markers Available to read values from trend & histogram displays

Memory

Data log Guided setup of # of readings/counts;

Instrument state Save & recall user-definable instrument setups
Power-off Automatically saved
Power-on Selectable power-on to reset (Factory), power-off state or user state
Volatile reading memory 1 M readings (16 MBytes)
Non-volatile internal

memory
USB file system Front-panel connector for USB memory device
Capability Store/ recall user preferences and instrument states, reading memory,

1

Selectable 10 (slow), 100 (medium), 1,000 (fast) reading moving average

Selectable filter reset .1% /1000 ppm (fast), .03%/300 ppm (medium), .01%/100 ppm

(slow) change from average

User settable m and b (offset) values

User settable b (reference) value

User settable b (reference) value

Mean, standard deviation,

Max, Min, Peak-to-Peak,

Mean, standard deviation, Allan deviation2, Max, Min, Peak-

to-Peak, count

count

Displays PASS/ FAIL message based on user defined Hi/ Lo limit values.

Selectable screen time

HI/LO limit lines shown

Selectable bin and block size

automatically saves acquisition results to non-volatile memory

75 Mbytes (up to 5 M readings)

and bit map displays

10

Speed Characteristics4 (meas)

53210A 53220A 53230A

Measurement/IO timeout
(nom)

Auto-level speed Slow mode (50 Hz): 350 ms (typ)

Configure-change speed Frequency, Period, Range, Level: 50 ms (typ)

Single measurement throughput5: readings/s

(time to take single measurement and transfer from volatile reading memory over I/O bus)
Typical (Avg. using READ?):

LAN (VXI-11) 110 120

LAN (sockets) 200 200

USB 200 200

GPIB 210 220

Optimized (Avg. using *TRG;DATA:REM? 1, WAIT):

LAN (VXI-11) 160 180

LAN (sockets) 330 350

USB 320 350

GPIB 360 420

Block reading throughput5: readings/s (Example uses: 50,000 readings)

(time to take blocks of measurements and transfer from volatile reading memory over I/O bus)
Typical (Avg. using READ?):

LAN (VXI-11) 300 990 8700

LAN (sockets) 300 990 9700

USB 300 990 9800

GPIB 300 990 4600

Optimized (Avg. using *TRG;DATA:REM? 1, WAIT):

LAN (VXI-11) 300 990 34700

LAN (sockets) 300 990 55800

USB 300 990 56500

GPIB 300 990 16300

no timeout or 10 ms to 2000 s, in 1 ms steps

Fast mode (10 kHz): 10 ms (typ)

11

Speed Characteristics4 (meas) continued

53210A 53220A 53230A

Maximum measurement speed to internal non-volatile memory6: (readings/s)

Timestamp N/A N/A 1,000,000
Frequency, period, totalize
Frequency ratio 44,000
Time interval, rise/fall,

width, burst width

300

N/A 90,000

1000

Duty cycle N/A 48,000
Phase N/A 37,000
PRI, PRF N/A N/A 75,000

Transfer measurements from volatile reading memory over I/O bus:

LAN (sockets) 600,000 readings/sec
LAN (VXI-11) 150,000 readings/sec
USB 800,000 readings/sec
GPIB 22,000 readings/sec

75,000

1. These Math operations do not apply for Continuous Totalize or Timestamp measurements.

2. Allan Deviation is only calculated for Frequency and Period measurements. Allan Deviation calculation is available on both 53220A
and 53230A, it is only gap free on 53230A.

3. Limit Test only displays on instrument front panel. No hardware output signal is available.

4. Operating speeds are for a direct connection to a >2.5 GHz dual core CPU running Windows
a 10/100/1000 LAN interface.

5. Throughput data based on minimum time. Typical reading throughput assumes ASCII format, Auto level OFF with READ? SCPI command.
For improved reading throughput you should also consider setting (FORM:DATA REAL,64), (DISP OFF), and set fastest gate time available.

6. Maximum 53230A rates represent >= 20 MHz input signals with min gate times, no delays or holdoffs. Measurement rates for the
53210A & 53220A are limited by min gate time. Actual meas rates are limited by the repetition rate of the input being measured.

®

XP Pro SP3 or better with 4 GB RAM and

12

General Characteristics (nom)

53210A 53220A 53230A

Warm-up time 45-minutes
Display 4.3" Color TFT WQVGA (480 x 272), LED backlight

User interface and help
languages

USB flash drive FAT, FAT32

Programming language

SCPI 532xx Series and 53131A/53132A/53181A Series compatibility mode

Programming interface

LXI-C 1.3 10/ 100/ 1000 LAN (LAN Sockets and VXI-11 protocol)
USB 2.0 device port USB2.0 (USB-TMC488 protocol)
GPIB interface (Option 400) GPIB (IEEE-488.1, IEEE-488.2 protocol)
Web user interface LXI Class C Compatible

Mechanical

Bench dimensions 261.1 mm W x 103.8 mm H x 303.2 mm D
Rack mount dimensions 212.8 mm W x 88.3 mm H x 272.3 mm D (2U x ½ width)
Weight 3.9 kg (8.6 lbs) fully optioned

Environmental

Storage temperature - 30º C to +70º C
Operating environment EN61010, pollution degree 2; indoor locations
Operating temperature 0º C to +55º C
Operating humidity 5% to 80% RH, non-condensing
Operating altitude Up to 3000 meters or 10,000 ft

Regulatory

Safety Complies with European Low Voltage Directive and carries the CE-marking

EMC Complies with European EMC Directive for test and measurement products.

CISPR Pub 11 Group 1, class A

Acoustic noise (nom) SPL 35 dB(A)

Line power

Voltage 100V - 240V ± 10%, 50-60 Hz ±5%

Power consumption 90 VA max when powered On or charging battery;

English, German, French, Japanese, Simplified Chinese, Korean

3.1 kg (6.9 lbs) without Option 300 (battery option)

Conforms to UL 61010-1, CSA C22.2 61010-1, IEC 61010-1:2001, CAT I

IEC/EN 61326-1

AS/NZS CISPR 11

ICES/NMB-001

Complies with Australian standard and carries C-Tick Mark

This ISM device complies with Canadian ICES-001

Cet appareil ISM est conforme a la norme NMB-001 du Canada

100 V - 120 V, 400 Hz ±10%

6 VA max when powered off/standby

13

General Characteristics (nom) continued

53210A 53220A 53230A

Battery (Option 300)

Technology Internal lithium ion battery with integrated smart battery monitor & charger
Operating temperature

limits

Storage temperature
limits

Extended exposure to temperatures above 45° C could degrade battery

Operating time (typ) 3 hours when operated below +35º C
Standby time - OCXO

powered (typ)
Recharge time (typ)

1

Accessories included

CD User's guide, SCPI/programmers reference, programming examples, drivers (IVI-COM,

Cables Power line cord, 2 m USB 2.0

Warranty

Standard 1-year

0 to 55º C. Battery will only charge under 35º C.
Instrument running on battery power above 50º C

will turn off to minimize battery capacity degradation.

-10º C to 60º C.

performance and life

24 hours

4 hours to 100% capacity; 2-hours to 90% capacity

LabView), IO library instructions

1. Assumes calibrated battery.

103.8 mm

261.2 mm

212.8 mm

88.3 mm

272.3 mm

302.2 mm

Dimensions apply to all three models: 53210A, 53220A, 53230A.

14

Timebase

Timebase Uncertainty = ( Aging + Temperature + Calibration Uncertainty )

Timebase

Standard

TCXO

Ultra-high stability OCXO

Option 010

Aging 1 (spec)

24-hour, T
30-day, T
1-year, T

±1º C ± 0.3 ppb (typ)

CAL

±5º C ± 0.2 ppm (typ) ± 10 ppb

CAL

±5º C ± 1 ppm ± 50 ppb

CAL

Temperature (typ)

0º C to 55º C relative to 25º C ± 1 ppm ± 5 ppb
T

± 5º C ± 0.5 ppm ± 0.5 ppb

CAL

Calibration uncertainty

Initial factory calibration 2 (typ) ± 0.5 ppm ± 50 ppb

Supplemental characteristics (typ)

5-min. warm-up error
72-hour retrace error
Allan deviation t = 1s

1. All Timebase Aging Errors apply only after an initial 30-days of continuous powered operation and for a constant altitude ±100 m.
After the first 1-year of operation, use ½ x (30-day and 1-year) aging rates shown.

2. Only use the Factory Calibration error values for the period before your first re-calibration. Factory Calibration uncertainty includes
the instrument settability error, the factory calibration source uncertainty, and additional timebase uncertainty due to factory
calibration before the required initial 30-days of powered operation. Settability defines the resolution increments you can reach is in
steps of 0.1 ppb (0.01 ppb on Option 010).

3. Warm-up error applies when the instrument is powered on in a stable operating environment.
When moved between different operating environments add the Temperature error during the initial 30-minutes of powered operation

4. Retrace error may occur whenever the instrument line-power is removed or whenever the instrument is battery operated and the
battery fully discharges. Retrace error is the residual timebase shift that remains 72-hours after powering-on an instrument that has
experienced a full power-cycle of the timebase. Additional frequency shift errors may occur for instrument exposure to severe
impact shocks >50 g.

3

4

± 1 ppm ± 10 ppb

< 50 ppb < 2 ppb

1 ppb 0.01 ppb

15

Accuracy Specifications

Definitions

Random Uncertainty

The RSS of all random or Type-A measurement errors expressed as the total RMS or 1-σ measurement uncertainty. Random
uncertainty will reduce as 1/√N when averaging N measurement results for up to a maximum of approximately 13-digits or 100 fs.

Systematic Uncertainty

The 95% confidence residual constant or Type-B measurement uncertainty relative to an external calibration reference.
Generally, systematic uncertainties can be minimized or removed for a fixed instrument setup by performing relative measurements to
eliminate the systematic components.

Timebase Uncertainty

The 95% confidence systematic uncertainty contribution from the selected timebase reference. Use the appropriate uncertainty for the
installed timebase or when using an external frequency reference substitute the specified uncertainty for your external frequency
reference.

Basic accuracy 1 = ± [(k * Random Uncertainty) + Systematic Uncertainty + Timebase Uncertainty]

Measurement Function 1-σ Random Uncertainty Systematic Uncertainty

2

Frequency

3

Period (parts error)

Option 106 & 115:

Frequency

3

Period (parts error)

Frequency Ratio A/B (typ)

(parts error)

Single Period measurement

(parts error)

16

1.4* (T
RE x Gate Time

1.4 * (T
RE x Gate Time

5

1.4 x Random Uncertainty

of the worst case Freq input

1.4* (TSS 2 + T

Period Measurement

SS

SS

+ T

2

+ T

2

½

)

E

If R

>=2: 10

E

-11

/gate max, 2*10

-12

/gate (typ)

If RE<2 or REC mode (RE=1): 2*10

2

½

)

E

If R

E

>=2: 10

-11

/gate max, 2*10

If RE<2 10

-10

-12

/gate

Uncertainty of Frequency A plus Uncertainty

of Frequency B

2

½

)

E

T

accuracy

Period Measurement

-10

/gate

/gate (typ)

Timebase

Uncertainty

4

●

4

●

●

2

2

Time Interval (TI)
Rise/Fall Time

Duty

16

, Width 16, or

7, 16

(parts error)

5, 9, 10, 16

1.4* (T

|TI Measurement|

2* (TSS 2 + T

2

½

+ T

)

SS

E

2

½

)

* Frequency (T

E

(fraction of cycle error)

Phase

Totalize

5, 9, 16

(Degrees error) 2* (TSS 2 + T

11

(counts error) ± 1 count

2

½

)

* Frequency * 360º (T

E

11

Volts pk to pk 12 (typ)

5v range

Optional Microwave Channel Opt 150 - Pulse/Burst Measurements

PRF, PRI (parts error) 2* (Tss+Carrier Period)

x Gate Time

R

Pulse/burst Carrier Frequency

14

(Narrow Mode) (parts error)

Pulse/burst Carrier Frequency 15
(Wide Mode) (parts error)

E

10*T

SS

Burst Width

2*TSS

x Burst Width

R

E

linearity
offset

6

= T

8

(typ) = T

/|TI Measurement|

accuracy

+ skew + T

LTE

|TI Measurement|

LTE

+skew+2*T

LTE

+ 2*T

)*Frequency

accuracy

)*Frequency*360º

accuracy

DC-1 KHz: ± 0.15 % rdg ± 0.15 % of range

1 KHz-1 MHz: ±2 % rdg± 1 % range

1 MHz-200 MHz: ±1 % range ± 5 % rdg

± 30 % x(Freq/250 MHz)rdg

3, 13

-10

10

/(RE*gate)

2*T

accuracy

Burst Width

-11

10

/Burst Width

if Burst Width < 10ms 10

accuracy

-10

/Burst Width

●

●

●

●

16

Accuracy Specifications continued

1. Apply the appropriate errors detailed for each measuring function.

2. Use Timebase Uncertainty in Basic Accuracy calculations only for Measurement Functions that show the ● symbol in the Timebase
Uncertainty column.

3. Assumes Gaussian noise distribution and non-synchronous gate, non-gaussian noise will effect Systematic Error. Note all optional
microwave channel specifications (continuous wave and pulse/burst) assume sine signal.

4. Typical is achieved with an average of 100 readings with 100 samples per trigger. Worst case is trigger and sample count set to 1.

5. Improved frequency ratio, duty and phase specifications are possible by making independent measurements.

6. Minimum Pulse Width for using stated linearity is 5 ns; Pulse Widths of 2-5 ns use linearity=400 ps/|TI Measurement|.

7. Residual instrument Rise/ Fall Time 10%-90% 2.0 ns (typ). Applies to fixed level triggering. Threshold can still be set based on % of
auto-level detected peaks, but since these peak levels may contain unknown variations, accurate measurements need to be based on
absolute threshold levels.

8. Input signal slew rates and settling time have effects on offset. Offset is calibrated with rise times < 100 ps.

9. Constant Duty or Phase are required during the measurement interval. Duty and Phase are calculated based on two automated
sequential measurements - period and width or TI A to B, respectively.

10. Duty is represented as a ratio (not as a percent).

11. Additional count errors need to be added for gated totalize error, latency or jitter. If gated, add gate accuracy term (See Totalize
measurements in the the Measurement Characteristics section).

12. Volts pk error apply for signal levels between full range and 1/10th range. Spec applies to sine wave only.
50 v range reading accuracy is 2% at DC-1 KHz, 5% 1 KHz -1 MHz band. Accuracy above 200 MHz is not specified on both ranges.

13. Specifications apply to signals from ±13 dBm, operable to ±19 dBm.

14. Applies when Burst Width * Carrier Freq > 80.

15. Specifications based on gate and width for automated detection. If in manual mode, delay and width selected will impact accuracy
specification. For approximate accuracy for manual gate. Use the Re calculation, but Fin is now 10

16. Specifications apply if measurement channels are in 5 V range, DC coupled, 50 Ω terminated and at fixed level. The following
minimum pulse width requirements apply:

6

and use gate as burst width.

Single-Period: <250 MHz, 50% Duty
Phase, Dual Channel Time Interval: <160 MHz, 50% Duty

Negative width, Negative duty,

> 2 ns > 4 ns

> 2 ns > 4 ns

Single Channel Time Interval Fall to Rise

Positive width, Positive duty,
Single Channel Time Interval Rise to Fall

Definition of Measurement Error Sources and Terms used in Calculations

53210A 53220A 53230A

R

E

T

SS

Skew 100 ps 50 ps
T

accuracy

1 use RE equation use RE equation

100 ps 100 ps 20 ps

200 ps 100 ps

Confidence Level (k)

For 99% Confidence use k= 2.5 in accuracy calculations.
For 95% Confidence use k= 2.0 in accuracy calculations.

17

Definition of Measurement Error Sources and Terms
used in Calculations continued

Resolution enhancement factor (RE)

The resolution enhancement (RE) calculates the added frequency resolution beyond the basic reciprocal measurement
capability that is achieved for a range of input signal frequencies and measurement gate times. The maximum enhance­ment factor shown is for input signals where TSS > TE and is limited due to intrinsic measurement limitations. For signals
where TSS << TE, RE may be significantly higher than the specified levels. RE will always be >=1.

For signals where TSS >> TE, R = √(FIN * Gate_time/16). RE is limited by gate time as show below
Gate time > 1 s, RE max of 6
Gate time 100 ms, RE max of 4
Gate time 10 ms, RE max of 2
Gate time < 1 ms, RE = 1

Interpolation between listed gate times allowed.

Single shot timing (TSS)

Timing resolution of a start/stop measurement event.

Skew

Skew is the additional time error if two channels are used for a measurement. It is not used for width, rise/fall time, and
single channel time interval.

T

accuracy

T

is the measurement error between two points in time.

accuracy

Threshold error (TE)

Threshold error (TE) describes the input signal dependent random trigger uncer­tainty or jitter. The total RMS noise voltage divided by the input signal slew rate
(V/s) at the trigger point gives the rms time error for each threshold crossing.

For 5v (500µV2 + E

SR

-TRIG POINT

For simplicity TE used in the Random Uncertainty calculations is the worst TE
of all the edges used in the measurement. RSS of all edge’s TE is an acceptable
alternative. Vx is the cross talk from the other standard input channel. Typically
this is -60 dB. Vx = 0 on 53210A, and when no signal is applied to other stan­dard input channel on 53220A/53230A. (Note: the best way to eliminate cross

For 50v (5000µV2 + E

SR

-TRIG POINT

talk is to remove the signal from the other channel).

Threshold level timing error (T

This time interval error results from trigger level setting errors and input hyster­esis effects on the actual start and stop trigger points and results in a combined
time interval error. These errors are dependant on the input signal slew rate at

)

LTE

± T
SR

LSE-start

-start

± T

LSE-stop

SR

-stop

each trigger point.

= 20 mV hysteresis or 40 mV when Noise Reject is turned ON. Double VH values for frequencies > 100 MHz.

V

H

Phase Noise and Allan Deviation

The input signal’s jitter spectrum (Phase noise) and low-frequency wander characteristics (Allan variation) will limit the
achievable measurement resolution and accuracy. The full accuracy and resolution of the counter can only be achieved
when using a high-quality input signal source or by externally filtering the input

signal to reduce these errors.

Threshold level setting error (T

Threshold level setting error (T
old point due to the inaccuracies of the threshold circuitry.

)

LSE

) is the uncertainty in the actual signal thresh-

LSE

±(0.2%-of setting + 0.1%-of range)

Slew rate (SR)

Slew rate (SR) describes the input signal’s instantaneous voltage rate of change
(V/s) at the chosen threshold point at customer BNC.
For sine wave signals, the maximum slew rate SR= 2πF*V
For Square waves and pulses, the max slew rate = 0.8 Vpp/ t
Using the 100 kHz low pass filter will effect Slew Rate.

Signal noise (E

The input signal rms noise voltage (E
The input signal noise voltage is RSS combined with the instruments equivalent

)

N

) measured in a DC - 350 MHz bandwidth.

N

input noise voltage when used in the Threshold Error (T
calculation.

E

)

0 to PK

.

RISE 10-90

18

V/s (at threshold point)

2

½

+Vx2)

N

2

½

+Vx2)

N

± ½ VH - ½ V

[

SR

-start

SR

-stop

H

]

Ordering Information

Model numbers
53210A 350 MHz, 10-digit/s RF Frequency Counter
53220A 350 MHz, 12 digit/s, 100 ps Universal Frequency Counter/Timer
53230A 350 MHz, 12-digit/s, 20 ps Universal Frequency Counter/Timer

All models include:

• Certificate of Calibration and 1-year standard warranty

• IEC Power Cord, USB cable

• Documentation CD including Quick Reference Guide,
Operating Guide, Programming Guide, and Example programs

• Agilent IO Library CD

Available options
Option 010 Ultra-high-stability OCXO timebase
Option 106 6 GHz microwave input
Option 115 15 GHz microwave input
Option 150 Pulse microwave measurements (53230A only)
Option 201 Add rear panel parallel inputs for baseband channels1
Option 202 Optional microwave input - front Type N
(default if 106 or 115 ordered)
Option 203 Optional microwave input - rear panel SMA(f) connector
Option 300 Add internal lithium ion smart battery and charger
Option 400 Add GPIB interface

Recommended accessories2

1250-1476 BNC(f) to type-N adapter
N2870A Passive probe, 1:1, 35 MHz, 1.3 m
N2873A Passive probe, 10:1, 500 MHz, 1.3 m
N2874A Passive probe, 10:1, 1.5 GHz, 1.3 m
34190A Rack mount kit ; Use for mounting one 2U instrument by itself,
without another instrument laterally next to it. Includes one
rack flange and one combination rack flange-filler panel.
34191A 2U dual flange kit ; Use for mounting two 2U instruments
side-by-side. Includes two standard rack flanges. Note:
Mounting two instruments side-by-side will require the 34194A
Dual-lock link kit and a shelf for the instruments to sit on.
34194A Dual-lock link kit ; for side-by-side combinations of
instruments, and includes links for instruments of different
depths.
34131A Transit case

Support options
3-year Extended warranty
5-year Extended warranty
3-year Annual calibration service
5-year Annual calibration service

1. When ordered with optional rear terminals, the standard/baseband channel inputs
are active on both the front and rear of the universal counter though the specifications
provided only apply to the rear terminals. Performance for the front terminals with rear
terminal options is not specified.

2. All probes must be compatible with a 20 pf input capacitance.

19

Appendix A - Worked Example

Basic Accuracy Calculation for Frequency Measurement

Parameter assumptions:

• 53220A

• 95% Confidence

• 100MHz signal, 1sec gate

• AUTO frequency mode

• Level: 5V input signal amplitude

• TCXO standard timebase for unit plugged in for 30 days

Process:

Basic Accuracy = ± [(k * Random Uncertainty) + Systematic Uncertainty + Timebase Uncertainty]

1. Use k=2 for 95% confidence and k=2.5 for 99% confidence calculations)………………..k = 2

2

2

1.4* (T

2. Random Uncertainty for Frequency Measurement = = =

SS

RE x Gate Time

+ T

½

)

E

1.4* (100ps2 + .159ps2)
6 x 1 s

TSS = 100 ps

½

23.3 E-12
parts error

TE (for 5 V)

=

(500 μV2 + E

SR

N

-TRIG POINT

2

+Vx2)

½

==

(500 μV2)

3.14 * 10

½

9

.159 ps

EN = Assume input signal RMS noise voltage is 0.
Vx = N/A (remove signal from other channel)
SR

= maximum slew rate (sine)SR= 2πF*V

-TRIG POINT

= 2π(100 MHz)*5 V = 3.14*109 Volts/Hz

0 to PK

Since TSS >> TE, we use the RE equation. Value is much greater than 6, so we limit RE to 6 due to gate time. RE = 6
Gate time = 1 sec

3. Systematic uncertainty for frequency measurement = If RE>=2: 10

-11

/gate max, 2*10

4. Timebase uncertainty = (aging + temperature + calibration uncertainty) = (0.2 ppm + 1 ppm + 0.5 ppm) =
Aging: 0.2 ppm

-12

/gate (typ) = 10 E-12 parts error

1.7 E-6
parts error

Temperature: 1 ppm
Calibration uncertainty: 0.5 ppm

Basic accuracy = ± [(k * random uncertainty) + systematic uncertainty + timebase uncertainty] =
± [(2 * (23.3 E-12)) + 10 E-12 + 1.7 E-6] = ± 1.7000566 E-6 parts error

Note: Using a higher accuracy timebase or locking to an external timebase standard will have the biggest impact on
improvement to accuracy calculations.

20

Front/rear view of 53230A

21

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Revised: July 8, 2010

Product specifications and descriptions
in this document subject to change
without notice.

© Agilent Technologies, Inc. 2010
Printed in USA, October 14, 2010
5990-6283EN