The HP OmniBER 717 is a
modular, portable analyzer
that supports optical and
electrical interfaces for TCarrier, PDH, SONET, SDH,
ATM, jitter and LAN
applications from 704 kb/s to
622 Mb/s (OC-12/STM-4).
The HP OmniBER 717 has an
easy-to-read color display. It
offers an extensive range of
T-carrier, PDH, SONET, SDH,
ATM, jitter and LAN
measurements.
Each analyzer provides
dedicated slots for an optical
interface and the printer/
remote-control module, plus
up to eight slots for other
interface and measurement
modules. This provides the
analyzer with the flexibility to
offer dedicated modules for
T-Carrier, PDH, SONET/SDH,
SDH only, ATM, and jitter
which can be combined
together in the one mainframe
enabling a range of test
requirements to be covered.
The test and interface modules
offer a range of measurements
including detailed overhead,
parity and alarm testing as well
as frequency offset tolerance
tests, frequency measurement
and optical power
measurement. The analyzers
also offer enhanced test
features like pointer sequence
generation, overhead access
and manipulation, overhead
sequence generation and
capture, service disruption
measurement, plus thru mode
capability. The structured
T-carrier and PDH modules
also offer ITU-T M.2100/
M.2101/M.2110/M.2120 testing
with comprehensive ITU-T
G.821 and G.826 in-service and
out-of-service analysis.
Dedicated test hardware
provides all results and
analysis simultaneously, so all
relevant measurements are
made in one test run saving
time and hence money.
For transmit and receive
testing of short-, intermediateand long-reach optical circuits,
there is a choice of 1310 and/
or 1550 nm OC-1/STM-0, OC-3/
STM-1 and OC-12/STM-4
optical modules. Electrical
interfaces at STS-1/STM-0 and
STS-3/STM-1 are also
available, as are jitter
generation and measurement
interfacing options.
Side view of the HP OmniBER 717
communications performance analyzer
3
features
introduction
HP OmniBER 717 analyzer with
color display and optional in-lid
graphics printer
powerful, dedicated features
that simplify the assessment of
networks.
This section covers features as
follows:
● General
● Optional PDH
● Optional DS1/DS3
● Optional SDH
● Optional SONET
● Optional ATM cell layer
● Optional ATM services
● Optional jitter
General
Status indicators
HP OmniBER 717:
Stored measurement
graphics
View results graphically.
Event-based time and date
stamped measurement results
are stored by the instrument
with a 1 second resolution. A
text summary of the results is
also available. Graphics
displays may be logged to a
printer.
Parametric testing
Optical power measurement
(requires optical interface
options 130/131 or USN/UKT)
Screen dump
Full-width printing of
instrument screen to
HP OmniBER 717 analyzer's
graphics printer at press of a
key.
‘Trouble Scan’ mode
Use ‘Trouble Scan’ mode to
scan for alarms and to display
non-zero error counts in extra
large characters.
Avoid the need to carry
additional optical power
meters!
5
Frequency offset
features
Measure the clock frequency
and the amount of offset from
the Bellcore/ITU-T standard
rate. Out-of-service or inservice frequency measurement can be made at all the
interface rates.
PDH/DSn features
Spare bits access
Test the capability of network
equipment to reliably recover
the clock by varying the clock
rate of the generated data and
checking for the occurrence of
transmission errors.
Protection switch times
Test protection switching
mechanisms to ITU-T G.783,
G.841 or Bellcore GR-253
limits using the service
disruption test.
‘Alarm Scan’ mode
Automatically scan the PDH/
DSn network hierarchy carried
within an SDH/SONET signal
structure for alarms with the
press of a key. ‘Alarm Scan’
mode shows the alarm state of
all alarms in a structured
signal.
N ´ 64 kb/s
Modify the spare bits at 2,
8, 34 and 140 Mb/s interface
rates. Modify and access the
ABCD signaling bits. (CAS
multiframe mode).
Alarm generation
Check your PDH/DSn network
elements and tributary insert
ports using the PDH/DSn alarm
generation facility.
Frequency measurement
Readily check 64 kb/s or
N × 64 kb/s digital paths (to
ITU-T G.704: 1 to 31
contiguous and non-contiguous
timeslots).
6
SDH features
features
Overhead access
View the section and path
overhead bytes of a received
SDH signal. Bit by bit access of
transmitted section and path
overhead bytes. Display in hex
or binary.
Overhead sequences
DCC drop and insert
Drop or insert RSOH and
MSOH DCC channels via the
SDH module's RS-449
connector.
Pointer adjustments and
analysis
Make positive and negative
adjustments with added and
canceled pointers as per
ITU-T G.783 plus 87:3 pointer
test sequence, then view the
AU and TU pointer value and
AU and TU positive and
negative adjustments.
SDH alarm scan
In-service SDH alarm and BIP
scan automatically scans all
TU-n tributaries within a
received STM-n signal allowing
fast sectionalization of faults.
Auto scan facilities
automatically determines the
received signal structure.
Pointer location graph
Overwrite static values in a
single overhead channel with a
single or repeated sequence of
user-defined values. Detect
intermittents by capturing
selected section and path
overhead channels.
Overhead BER
measurement
Perform a BER measurement
on a selected section or path
channel. Error count, error
ratio, error free seconds and %
error free seconds are
displayed.
Determine the synchronization
status of your network by
monitoring the received AU/TU
pointer value over time. Check
for wander problems or
excessive pointer movements.
PDH drop and insert
Drop/insert of 34/140/2 Mb/s to
or from an STM-1/STM-4
signal.
Thru mode
Use the STM-0/STM-1/STM-4
thru mode for in-service
monitoring where no protected
monitor points are available.
7
Mixed payloads
features
Generate mixed TU-3 and TU12 signal structures in order to
test network elements,
configured to carry mixed 2
Mb/s and 34 Mb/s traffic.
SDH tributary scan
Automatic verification of VC-n
paths within an ADM etc, using
the out-of-service tributary
scan for faster installation
testing.
SONET features
Overhead access
View the transport and path
overhead bytes of a received
SONET signal. Bit by bit access
of transmitted section and path
overhead bytes. Display in hex
or binary.
Overhead sequences
Overwrite static values in a
single overhead channel with a
single or repeated sequence of
user-defined values. Detect
intermittents by capturing
selected section and path
overhead channels.
Overhead BER
measurement
Perform a BER measurement
on a selected section, line or
path channel. Error count,
error ratio, error free seconds
and % error free seconds are
displayed.
DCC drop and insert
Drop or insert TOH and TOH
DCC channels via the SONET/
SDH module's RS-449
connector.
Pointer adjustments and
analysis
Make positive and negative
adjustments with added and
canceled pointers as per
ANSI T1.105.03 plus 87:3
pointer test sequence, then
view the SPE and VT pointer
value and SPE and VT positive
and negative adjustments.
SONET alarm scan
In-service SONET alarm and
BIP scan automatically scans
all VTn tributaries within a
received OC-n/STS-n signal
allowing fast sectionalization of
faults. Auto scan facilities
automatically determines the
received signal structure.
8
Pointer location graph
features
Determine the synchronization
status of your network by
monitoring the received SPE/
VT pointer value over time.
Check for wander problems or
excessive pointer movements.
DSn/PDH drop and insert
Drop/insert of DS1/DS3/2M to
or from an OC-3/OC-12 signal.
ATM features
Change cell stream bandwidth
to obtain quickly quality-ofservice data for the ATM
network.
A single ATM virtual channel
(VC) is set up as the
foreground test signal. The
remaining bandwidth is then
filled with background VCs and
idle or unassigned cells.
Cell delay
Thru mode
Use the OC-1/OC-3/OC/12 thru
mode for in-service monitoring
where no protected monitor
points are available.
Mixed payloads
Generate mixed STS-1 signal
structures within STS-3/OC-3
signal structures in order to
test network elements.
SONET tributary scan
Set cell content to ITU-T O.191
test cells for cell performance
measurements (eg, cell loss,
delay, misinsertion or errors),
PRBS or user defined pattern.
Channel View
Find and identify the VPI/VCI
of up to 1023 channels,
showing cell rates or
percentage for all found VCs;
VPI display filter, AAL type and
ATM alarms displayed against
each VC.
Graphical display for 1-point
and 2-point cell delay variation
(ITU-T I.356) and nonconforming cell count.
AAL monitoring
(AAL-1, AAL-3/4, AAL-5)
SAR-PDU counts/rate, CRC
errors, sequence errors, lost
cell count, aborted PDUs and
length errors.
Automatic verification of VTn
paths within an ADM etc, using
the out-of-service tributary
scan for faster installation
testing.
9
VC rate history
features
Graphical display of maximum,
mean and minimum cell rate on
a chosen VC for short or
extended periods (up to a
month).
Native LAN
Ethernet LAN interfaces; 'ping'
tests for lost packet counts;
round trip delay under
different load conditions.
Verification of file transfer and
transfer time.
Jitter features
Jitter tolerance
Use the automatic jitter
tolerance test to verify
network equipment's
performance margins relative
to ITU-T G.823 (PDH) and
G.958 (SDH) jitter masks.
Jitter transfer
Wander measurement
View current measurements in
graphical or text format on the
results display. Three +ve and
−ve sliding graphs, each
showing ± 1 UI, ± 16 UI and ±
256 UI are provided.
After installing a native LAN
over WAN service and before
handing over to the customer,
you'll want to be certain that
the service performs properly.
Using the provided IP protocol,
you can readily check latency
(delay) and connectivity in
such installations.
Jitter sweep
Automatic jitter transfer test
(with narrow bandwidth
selective filtering) tests jitter
accumulation in regenerative
repeators etc.
Sweep the ITU-T G.823 (PDH)
and G.958 (SDH) jitter masks
to quickly check for jitter
tolerance problems. View the
progress of the jitter sweep on
the analyzer's display.
10
Spot frequency
features
Output jitter
Alternatively, reproduce and
further investigate those jitter
problems by generating a
specified amplitude of jitter at
a spot frequency.
The analyzer's display shows
the generated value of jitter
relative to the ITU.T mask.
Perform PDH and SDH ouput
jitter measurements to ITU-T
G.783, G.825 with ITU-T O.171
LP, HP1 and HP2 filters. RMS
jitter measurements to ITU-T
G.958 are also available with
additional 12 kHz HP filter.
11
Capability summary
SDH and DSn/PDH supported configurations
PDH/ATM cell test
and PDH interfaces
capability
Option UKKPage 14
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJPage 14
Structured PDH generation
and measurement: 2, 8, 34 and
140 Mb/s.
Option UKNPage 14, 53
ATM cell generation and
analysis: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ structured PDH).
Option UH3Page 73
Binary (NRZ) clock and data
Tx/Rx interfaces plus external
clock input. Must also order
option UKK, UKJ, UKN or 110.
Option UHCPage 76
Three additional 2, 8, 34 and
140 Mb/s outputs. Must also
order option UKK, UKJ or
UKN.
Option 110Page 18
Structured: DS1, DS3,
E1, E3.
STM-0, STM-1e test
and interfaces
Option A3RPage 22
STM-0e (52 Mb/s) and
STM-1e (155 Mb/s) electrical
interface: STM-0/STM-1
overhead access, thru mode
and pointer sequence
generation and full ITU-T
G.707 mappings.
STM-1 and STM-4
interfaces
Option UH1Page 29, 67
STM-1 (1310 nm).
Option 130Page 30
Combined STM-0, STM-1 and
STM-4 (1310 and 1550 nm),
STM-0, STM-1 and STM-4
overhead access, optical
power measurement.
Option 131Page 30
Combined STM-0, STM-1 and
STM-4 (1310 nm), STM-0,
STM-1 and STM-4 overhead
access, optical power
measurement.
Option 0YHPage 72
STM-0, STM-1 and STM-4
NRZ interfaces. Must also
order option 130 or 131.
(See Note 1)
Jitter, wander
and slips testing
Option A3KPage 40
PDH and SDH jitter and
wander generation.
Option 140Page 40
PDH and SDH jitter
generation.
Option UHNPage 45
PDH jitter measurement:
2, 8, 34 and 140 Mb/s.
Option A3LPage 45
STM-1e line and PDH jitter
measurement: 2, 8, 34, 140
and 155 Mb/s.
Option A3VPage 45
STM-1o, STM-1e line and
PDH jitter measurement: 2, 8,
34, 140 Mb/s electrical and
155 Mb/s electrical and
optical.
Option A3NPage 45
STM-4o, STM-1o, STM-1e
line and PDH jitter
measurement: 2, 8, 34, 140
Mb/s electrical, 155 Mb/s
electrical and optical and
622 Mb/s optical.
Note 1: All optical interface modules require the STM-0e/STM-1e test and interface module (option A3R).
Dual standard SONET/SDH and DSn/PDH supported configurations
PDH/DSn interfaces
Option 110Page 18
Structured: DS1, DS3, E1, E3.
Option UKKPage 14
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJPage 14
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKNPage 14, 53
ATM cell: 2, 34 and 140 Mb/s
(includes all capability of option
UKJ).
Option UH3Page 73
Binary (NRZ) clock and data
plus external clock input. Must
also order option UKK, UKJ,
UKN or 110.
Note 1: All optical interface modules require the SONET/SDH test and interface module
(option 120).
* Jitter capability does not include DS1/DS3. Synchronous line rate measurements are to
ITU-T specifications.
SONET/SDH
test and interfaces
Option 120Page 34
STS-1/STM-0e (52 Mb/s) and
STS-3/STM-1e (155 Mb/s)
electrical interface: Overhead
access, thru mode and pointer
sequences. Full ITU-T G.707
and Bellcore G-253 mappings.
Optical
interfaces
Option UH1Page 29, 67
155 Mb/s (1310 nm).
Option 130Page 30
622/155/52 Mb/s optical
interface (1310 and
1550 nm), optical power
measurement.
Option 131Page 30
622/155/52 Mb/s optical
interface (1310 nm), optical
power measurement.
Option 0YHPage 72
622/155/52 Mb/s binary (NRZ)
interfaces. Must also order
option 130 or 131.
(See Note 1)
Option A3KPage 40
PDH, 155 Mb/s, 622 Mb/s jitter
and wander generation.
Option 140Page 40
As option A3K, but without
wander generation.
Option UHNPage 45
PDH jitter measurement.
Option A3LPage 45
155 Mb/s electrical and PDH jitter
measurement.
Option A3VPage 45
155 Mb/s optical, electrical and
PDH jitter measurement.
Option A3NPage 45
622 and 155 Mb/s optical,
electrical and PDH jitter
measurement.
Jitter, wander and slips
testing – generation*
Jitter, wander and slips
testing – measurement*
12
Broadband test plug-in modules
ATM cell test
and PDH interfaces
capability
Option UKN1Page 14, 53
ATM cell generation and
analysis: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ structured PDH).
Option UKZ
Generation and measurement
of ATM payloads: 1.544
(DS1), 44.736 (DS3), 2.048
(E1) and 34.368 (E3) Mb/s.
1
ITU-T
2
ANSI/ITU-T
Option 0YKPage 60
Adds Channel View, graphical
display of CDV, AAL analysis,
rate history, benchmark
traffic generation. Must also
order option UKN or UKZ.
Option USLPage 60
Adds Ethernet LAN
connectivity testing plus all
features of option 0YK. Must
also order option UKN or
UKZ.
2
ATM services
layer test
Page 56
STM-1e test
and interfaces
Option A1TPage 63
STM-1e (155 Mb/s) electrical
interface from ATM testing.
Optical
interfaces
Option UH1Page 29, 67
155 Mb/s (1310 nm).
Option USNPage 68
Combined STM-1 and STM-4
(1310 and 1550 nm) STM-1
and STM-4 overhead access,
optical power measurement.
Option UKTPage 68
Combined STM-1 and STM-4
(1310 nm), STM-1 and STM-4
overhead access, optical
power measurement.
Option UH3Page 73
Binary (NRZ) clock and data
Tx/Rx interfaces plus
external clock input. Must
also order option UKK, UKJ
or UKN.
Jitter, wander
and slips testing
Option A3KPage 40
PDH and SDH jitter and
wander generation.
Option 140Page 40
PDH and SDH jitter
generation.
Option UHNPage 45
PDH jitter measurement:
2, 8, 34 and 140 Mb/s.
Option A3LPage 45
STM-1e line and PDH jitter
measurement: 2, 8, 34, 140
and 155 Mb/s.
Option A3VPage 45
STM-1o, STM-1e line and
PDH jitter measurement: 2, 8,
34, 140 Mb/s electrical and
155 Mb/s electrical and
optical.
Option A3NPage 45
STM-4o, STM-1o, STM-1e
line and PDH jitter
measurement: 2, 8, 34, 140
Mb/s electrical, 155 Mb/s
electrical and optical and 622
Mb/s optical.
13
PDH
TRANSMIT
2 8 34 140 Mb/s
RECEIVE
2 8 34 140 Mb/s
Option UKK
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Key to all tables
● = compliance
– = non-compliance
Option UKJ*
Pair of modules providing
structured PDH generation
and measurement: 2, 8, 34
OUT
PDH & DS1/DS3
MUX
IN
75Ω
DEMUX
HANDSET
75Ω
and 140 Mb/s.
Option UKN
Pair of modules providing
ATM cell generation and
analysis: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ structured
Option
UKK
Option
UKJ
Option
UKN
PDH).
PDH test optionsUnstructuredStructured
PDHPDH
UKKUKJ* , UKN
OUT and IN ports (used for transmit and receive)
TypeElectrical: To ITU-T G.703.●●
ConnectorsBNC, 75 ohm, unbalanced and Siemens 3-pin,●●
PDH: 2.048, 8.448, 34.368 and 139.264 Mb/s.●●
ATM: 2.048, 34.368, 139.264 and 155.52 Mb/s‡.–●
‡ For ATM you require option UKN and for 155.52 Mb/s you
also require an STM-1 test option (option A3R or A1T).
PDH transmitter
Clock timingInternal: All rates.●●
Frequency offset generation Up to ± 100 ppm in 1 ppm steps.●●
Test patternPRBS (to ITU-T O.151): 2
Output704 kb/s: HDB3 or AMI balanced/unbalanced.●–
Bit error add1 in 103.●●
Recovered (loop timed): From 704 kb/s input.●–
Recovered (loop timed): From 2.048 Mb/s input.●●
Recovered (loop timed): From 8.448, 34.368 and 139.264 Mb/s input.–●
15
PRBS: 29 − 1, 211 − 1 and 220 − 1.–●
Word: User-defined 16-bit word, all ones, all zeros, 1010, 1000.●●
2.048 Mb/s: HDB3 or AMI balanced/unbalanced.●●
8.448 Mb/s: HDB3 or AMI unbalanced.●●
34.368 Mb/s: HDB3 unbalanced.●●
139.264 Mb/s: CMI unbalanced.●●
1 in 104, 1 in 105, 1 in 106 and 1 in 107.–●
Single error.●●
− 1 and 223 − 1.●●
*Adding ATM (option UKN) capability to structured PDH (option UKJ) can be accomplished via a firmware upgrade.
14
PDH test options (continued)UnstructuredStructured
PDHPDH
UKKUKJ, UKN
Frame error add1 in 103, 1 in 104, 1 in 105, 1 in 106, 1 in 10
Code error add2.048, 8.448, 34.368 Mb/s: 1 in 103, 1 in 104, 1 in 105,–●
CRC4 error add1 in 103, 1 in 104, 1 in 105, 1 in 106, 1 in 107 and single error.–●
REBE error add1 in 103, 1 in 104, 1 in 105, 1 in 106, 1 in 107 and single error.–●
Alarm generationLOS, AIS, LOF, RAI, RMFAI, CASMFL.–●
PDH & DS1/DS3
Spare bits generationThe following spare bits may be modified:–●
CAS signaling bitsModify the ABCD signaling bits (timeslot 16 CAS multiframe only).–●
generation
Tx frame formatsAll rates: Unframed only.●–
Test signal at any levelN × 64 kb/s, 64 kb/s, 2.048, 8.448, 34.368–●
within signal structureand 139.264 Mb/s.
Test signal at interface704 kb/s, 2.048, 8.448, 34.368 and 139.264 Mb/s.●–
rate only
Background patternsUnframed 29 − 1 PRBS, AIS or same pattern as–●
140 Mb/s: FAS bits 14 to 16.
34 Mb/s: FAS bit 12
8 Mb/s: FAS bit 12.
2 Mb/s Si bits (international bits): Timeslot 0 bit 1 in both FAS
and NFAS frames.
2 Mb/s E bits: CRC4 frames 13 and 15; timeslot 0 bit 1.
2 Mb/s Sa bit (national bits): NFAS timeslot bits 4 to 8 .
2 Mb/s Sa bit sequences: An 8 bit sequence may be transmitted
in any selected NFAS Sa bit when CRC4 framing has been
selected. The sequence appears in odd-numbered CRC4 frames,
starting at frame 1.
2 Mb/s CAS multiframe: MFAS timeslot bits 5, 7 and 8.
All rates: Unframed, framed and structured.–●
2.048 Mb/s: To ITU-T G.706 and G.732–●
(No MFM, CAS, CRC4 MFM, CAS + CRC4 MFM).
2.048 Mb/s: N × 64 kb/s to ITU-T G.704.–●
8.448 Mb/s: To ITU-T G.742.–●
34.368, 139.264 Mb/s: To ITU-T G.751.–●
foreground test signal.
7
–●
PDH receiver
Jitter toleranceTo ITU-T O.171.●●
Equalization at f/2To ITU-T G.703.●●
Monitor point compensation 704 kb/s.26 to 30 dB–
Frame formatsAll rates: Unframed and framed.●●
704 kb/s.6 dB–
2.048, 8.448 Mb/s.6 dB6 dB
34.368, 139.264 Mb/s.12 dB12 dB
2.048, 8.448 Mb/s.26 to 30 dB20, 26 or 30 dB
34.368, 139.264 Mb/s.26 dB20 or 26 dB
All rates: Structured.–●
2.048 Mb/s: To ITU-T G.706 and G.732●●
(No MFM, CAS, CRC4 MFM, CAS + CRC4 MFM).
2.048 Mb/s: N × 64 kb/s to ITU-T G.704.–●
8.448 Mb/s: To ITU-T G.742.●●
34.368, 139.264 Mb/s: To ITU-T G.751.●●
15
PDH test options (continued)UnstructuredStructured
PDHPDH
UKKUKJ, UKN
Frequency measurementFrequency displayed in Hz, 1 Hz resolution.●●
Ext. 2 Mb/s demux outputNominally to ITU-T G.703, unbalanced HDB3 signal only.–●
AutosetupBit rate, code, framing and level of incoming signal.●●
Errors (out-of-service )Error count and ratio: Bit, code.●–
Errors (ISM only†)Error count and ratio: Code, frame.●–
EFS, %EFS, unavailability, %unavailability,
degraded minutes, %degraded minutes, code error seconds,
elapsed time (including Annex D for bit errors).
path unavailable second count (PUAS), background block
error count (BBE), errored second ratio (ESR), severely
errored second ratio (SESR), background block error
ratio (BBER).
24 hours the instrument compares ES, SES and UAS results
against the S1 and S2 thresholds derived from the path
allocation and flags either PASS/–?–/FAIL. The 7 day
test is then performed on uncertain paths (–?–) during
the 24 hour test, ie, run contiguously for a further 6 days.
† ISM = In-service measurement mode on framed signals (unstructured PDH option UKK).
16
PDH test options (continued)UnstructuredStructured
PDHPDH
UKKUKJ, UKN
M.2120 in-service testContiguous 15 minute (T1) and 24 hour (T2) periods–●
for maintenancewith TR1 and TR2 threshold reports. Based on the user
entered path allocation and maintenance factors, the
T1-ES, T1-SES, T2-ES and T2-SES thresholds are
calculated. A single threshold report (TR1 for 15 minute,
TR2 for 24 hour) is generated when any of the relevant
thresholds are exceeded within each 15 minute or
24 hour period.
PDH & DS1/DS3
Spare bit displayAt all rates. NFAS (2 Mb/s), multiframe sync (2.048 Mb/s CAS),●–
(ISM only†)FAS (8.448, 34.368 to 139.264 Mb/s).
Error outputOne pulse per bit error or code error.●–
Round trip delayUp to 2 seconds delay between transmit and receive.–●
Alarm scanAutomatically scans the PDH network hierarchy–●
CAS signalingDisplays the ABCD signaling status of all 30 timeslots–●
bit monitor(timeslot 15 CAS multiframe only).
N ´ 64 kb/sTo ITU-T G.704; 1 to 31 contiguous and–●
Telephone handsetProvides full talk/listen capability – RJ11 connector–●
connection(Telephone handset accessory available – HP 15722A).
† ISM = In-service measurement mode on framed signals (unstructured PDH option UKK).
Nominal ECL, 75 ohm −2 V BNC.
for alarms (frame loss, AIS and remote alarms).
non-contiguous timeslots.
17
DS1/DS3/E1/E3 structured test interfacing
Option 110
Pair of modules providing structured
DSn and PDH generation and
measurement at DS1 (1.5 Mb/s),
DS3 (45 Mb/s) and E1 (2 Mb/s),
E3 (34 Mb/s ).
PDH & DS1/DS3
Option 110
DS1/DS3/E1/E3 structured test interfacesStructured
Alarm generationDS1: Loss of signal (LOS); Out of frame (OOF); alarm indication signal (AIS);●
FEAC code generationWith C-Bit parity framing loopback and alarm/status codes as per●
Spare bits generationThe following spare bits can be modified;●
Signaling bits generationDS1: User selectable Signaling ON or OFF. When ON user selectable●
DS1: SF (D4), SLC-96.
DS1: ESF to ANSI T1.403-1989, Bellcore TR-TSY-000499 and ITU-T G.704;
the ESF data link (DL) defaults to repetition of idle code (01111110).
DS3: M13 to ANSI T1.107-1995.
DS3: C-bit parity to ANSI T1.107a-1990.
E1: To ITU-T G.706/G.732.
E3: To ITU-T G.751.
N × 64 kb/s structured to ITU-T G.704 for E1, E3
N × 64 kb/s and N x 56 kb/s structured for DS1 and DS3.
11
15
20
– 1, 2
QRSS (DS1 only).
3-in-24 stress pattern (DS1 only).
Word: 1010, 1000, 16 bit user word, all ones, all zeros.
The PRBS polarity of patterns is user selectable.
remote alarm indication (RAI).
DS3: LOS; LOF; AIS; RAI; far end alarm and control (FEAC): As per T1.107-1995.
E1: LOS, LOF, AIS, RAI.
E3: LOS, LOF, AIS, RAI.
ANSI T1.107-1995 can be generated.
Loopback codes: A single burst of N loopback codes and M messages
where N and Mare in the range 1 through 15.
Alarm/status codes: Any ANSI T1.107-1995 message or any
0xxxxxx011111111, message where x is selectable, may be transmitted
either in a single burst of 1 to 15 times or continuously.
34 Mb/s: FAS bit 12
2 Mb/s Si bits (international bits): Timeslot 0 bit 1 in both FAS
and NFAS frames.
2 Mb/s E bits: CRC4 frames 13 and 15; timeslot 0 bit 1.
2 Mb/s Sa bit (national bits): NFAS timeslot bits 4 to 8 .
2 Mb/s Sa bit sequences: An 8 bit sequence may be transmitted
in any selected NFAS Sa bit when CRC4 framing has been
selected. The sequence appears in odd-numbered CRC4 frames, starting at frame 1.
2 Mb/s CAS multiframe: MFAS timeslot bits 5, 7 and 8.
AB bits for SF, ABCD for ESF and AB bits for SLC-96 framing.
– 1, 2
23
– 1, 2
– 1 .●
Background patternsUnframed 29 – 1 PRBS, AIS or same as test pattern as foreground●
test signal.
Ext DS1 mux inputWeco bantam connector, AMI or B8ZS.●
Ext 2 Mb/s mux inputBNC to ITU-T G.703, AMI or B8ZS.●
19
DS1/DS3/E1/E3 structured test interfaces (continued)Structured
DSn/PDH receiver
Type, connectors, rates,As for DSn/PDH transmitter.●
line code and framing
Jitter toleranceTo Bellcore TR-TSY-000009 (DS1/DS3) and ITU-T O.171.●
Operating level (terminate)User selectable as follows:●
PDH & DS1/DS3
Monitor pointDS1 (balanced), E1 (balanced and unbalanced): 20, 26 or 30 dB gain relative●
compensationto terminate mode. E1 (balanced) is restricted to half cable length with
FramingAll rates: Unframed , framed and structured.●
Frequency measurementFrequency displayed in Hz, 1 Hz resolution.●
service testRun a 24 hour out-of-service test using a PRBS. After
DS1 (balanced): DSX-1 to DS1-LO levels.
DS3 (unbalanced): DS3-HI, DSX-3 and DS3-900 levels.
E1 (balanced): 3.0 V ± 20% for cable lengths as per ITU-T G.703.
E1 (unbalanced): 2.37 V ± 20% for cable lengths as per ITU-T G.703.
E3 (unbalanced): 1.0 V ± 20% with automatic equalization for cable lengths
as per ITU-T G.703.
respectto ITU-T G.703 for 26 and 30 dB gains.
DS3 and E3: 20 or 26 dB gain relative to terminate mode.
DS1: SF (D4), SLC-96.
DS1: ESF to ANSI T1.403-1989, Bellcore TR-TSY-000499 and ITU-T G.704.
DS3: M13 to ANSI T1.107-1995.
DS3: C-bit parity to ANSI T1.107a-1990.
E1: To ITU-T G.706/G.732
E3: To ITU-T G.751
N × 64 kb/s structured to ITU-T G.704 for E1, E3
N × 64 kb/s and N x 56 kb/s structured for DS1 and DS3.
and displayed. Displays shows current and last active FEAC message.●
seconds (SES), unavailability seconds (UAS), error second ratio (ESR),
severely errored second ratio (SESR), background block error ratio (BBER),
path unavailable seconds (PUAS).
degraded minutes, (%) degraded minutes, code error seconds,
elapsed (including Annex D for bit errors)
24 hours the instrument compares ES, SES and UAS results
against the S1 and S2 thresholds derived from the path
allocation and flags either PASS/–?–/FAIL. The 7 day
test is then performed on uncertain paths (–?–) during
the 24 hour test, ie, run contiguously for a further 6 days.
DSn/PDH
110
20
DS1/DS3/E1/E3 structured test interfaces (continued)Structured
M.2120 in-service testContiguous 15 minute (T1) and 24 hour (T2) periods●
for maintenancewith TR1 and TR2 threshold reports. Based on the user
PDH & DS1/DS3
Signaling monitorDS1: Signaling bit state is displayed. ABCD format for ESF and●
Alarm scanAlarms at the Interface Rate and at all lower levels in the hierarchy●
entered path allocation and maintenance factors, the
T1-ES, T1-SES, T2-ES and T2-SES thresholds are
calculated. A single threshold report (TR1 for 15 minute,
TR2 for 24 hour) is generated when any of the relevant
thresholds are exceeded within each 15 minute or
24 hour period.
AB for SF/SLC-96. SLC-96 can display one of three states;
0,1 or alternating.
E1: Graphical display, simultaneously showing the ABCD
signalling status of all 30 channels is available.
are scanned continuously. A graphical picture of the hierarchy is shown
which displays the alarm state for all streams.
DSn/PDH
110
21
STM-0/STM-1e test and interfacing
SDH
Option A3R
STM-0e (52 Mb/s) and STM-1e (155 Mb/s)
electrical interface: STM-0/STM-1 overhead
access, thru mode and pointer sequence
generation. Full ITU-T G.707 mappings plus
frequency offset generation, alarm and error
generation/detection plus an error output, SDH
alarm and BIP scan, tributary scan and protection
switch times.
Option A3R
SDH ITU-T G.707 mapping structure
22
SDH
STM-0/STM-1e test and interfacing options (continued)STM-0/STM-1e
testing
A3R
OUT and IN ports (used for transmit)
TypeElectrical: To ITU-T G.703.●
ConnectorsBNC, 75 ohm, unbalanced.●
Rate155.52 Mb/s.●
Line code155.52 Mb/s: CMI.●
Output level155.52 Mb/s: ± 0.5 V ± 10%.●
Error outputB3 error output pulse on receipt of STM-0 and STM-1 signals.●
Simultaneous STM-1e/When used in conjunction with the appropriate optical interfaces,●
STM-1e and STM-1otransmit STM-1 electrical output signal simultaneously with
Transmitter
Clock timingInternal: All rates.●
Frequency offsetUp to ± 999 ppm in 0.1 ppm steps.●
51.84 Mb/s:●
Output level is user configurable.
STM-0 X CON: 1.1 V peak nominal (0 ft).
STM-0 HI: 530 mV peak nominal (450 ft).
STM-0 LOW: 350m V peak nominal (900 ft).
TTL pulse termination 75 ohm or 10 kohm.
STM-1 optical output signal.
Recovered: From SDH input (CMI or NRZ electrical or optical).●
Ext MTS: 64 kb/s conforming to ITU-T G.703, 2 Mb/s conforming to ITUT-G.811.●
BNC, 75 ohm, unbalanced or Siemens (3-pin), 120 ohm, balanced.●
(Siemens (3-pin) connector is present on option A3R.
Option 120 replaces this connector with a Bantam connector).
Error typeSingleRate 10
Frame A1A2●N in four
B1●4 to 9
B2†●3 to 9
MS REI●3 to 9
AU-4 path BIP-8 (B3)●4 to 9
AU-4 path REI●4 to 9
AU-4 path IEC●4 to 9
AU-3 path BIP-8 (B3)●4 to 9
AU-3 path REI●4 to 9
AU-3 path IEC●4 to 9
TU-3 path BIP-8 (B3)●3 to 9
TU-3 path REI●3 to 9
TU-2 path BIP (V5)●4 to 9
TU-2 path REI●5 to 9
TU-12 path BIP (V5)●3 to 9
TU-12 path REI●4 to 9
TU-11 path BIP●3 to 9
TU-11 path REI●4 to 9
Bit error*●3 to 9
-N
Comments
frame words
† MSP threshold N errors in T ms
where 0 ≤ N ≤ 1920 (STM-1) and
10 ms ≤ T ≤ 10000 s, in decade
steps.
* For SDH stand-alone operation,
bulk-filled payloads and DS1, DS3
mapped payloads only. For bit
error rates supported with other
payloads refer to the PDH test
option for details.
23
SDH
STM-0/STM-1e test and interfacing options (continued)STM-0/STM-1e
testing
A3R
Alarm generationLOS, LOF, OOF, MS AIS, MS RDI,●
Payload capability
STM-0/STM-1/STM-4139.264 Mb/s into a VC-4 and VC-4 bulk-filled mappings.●
payload mappings34.368 Mb/s into VC-3 and VC-3 bulk-filled mappings.
(to ITU-T G.707)2.048 Mb/s (async and fl. byte sync) into VC-12 and VC-12 bulk-filled mappings.
Payload dataThe following unframed patterns can be generated:
Payload framing139.264, 34.368 and 2.048 Mb/s: Unframed.●
Drop/insert139.264Mb/s: Drop/insert via Tx/Rx on options UKJ/UKN.●
† DS1 and DS3 mappings require PDH options UKJ, UKN or 110 to be fitted.
* AU-3 mappings require HP OmniBER 717 analyzer mainframe.
(Framed and structured signals are available in conjunction
with the PDH/DSn option UKJ/UKN/110).
PRBS: 29 − 1 (O.150), 2
23
and 2
− 1 (O.151)
20
QRSS (2
Word: User-defined 16-bit word, all ones, all zeros, 1010, 1000.
All PRBS patterns can be set to inverted or non-inverted.
† Applicable to DS1 mappings only.
139.264, 34.368 and 2.048 Mb/s: Framed and structured†.
DS3 payloads: Unframed, C-Bit parity (to ANSI T1.107a-1990)†
M13 (to ANSI T1.107-1988).
TU-2: Unframed.
DS1 payloads: Unframed, SF (D4), ESF (to ANSI T1.403-1989,
TR-TSY-000499 and ITU-T G.704), SLC-96†.
† Only available in conjunction with the PDH/DSn option UKJ/UKN/110.
44.736 (DS3): Drop/insert via Tx/Rx on option 110.
34.368 Mb/s: Drop/insert via Tx/Rx on options UKJ/UKN/110.
2.048 Mb/s: Drop/insert via drop/insert ports on options UKJ/UKN/110.
1.544 Mb/s: Drop/insert via drop/insert ports on option 110.
− 1, 14 zero limited)†
11
− 1 (O.152), 2
15
− 1 (O.151)●
24
SDH
STM-0/STM-1e test and interfacing options (continued)STM-0/STM-1e
testing
A3R
Pointer adjustment generation
Increment/decrement/Provides a burst, selectable between 1 and 10 pointer●
alternatingadjustments (between 1 and 5 for TU-12 or TU-11 pointer).
New pointer valueThe AU-4, AU-3, TU-3, TU-2, TU-12 or TU-11 moves to a selectable new●
Frequency offsetPointer sequences are generated by offsetting the●
(and 87:3)frequencies of the AU-4, AU-3 (in these modes the 87:3 sequence is
ITU-T G.783 sequencesBursts of periodic single adjustments with added or canceled●
Transmit overhead
OverheadDefault selection: Standard overhead values to ITU-T G.707.●
SOH user-settableSOH can be set in binary or HEX.●
bytesRSOH: A1, A2, J0, E1, F1, D1 to D3.
Overhead sequenceA single or multi-byte overhead channel is overwritten with●
generationa single or repeated sequence of programmed values.
location in a single jump, with or without an accompanying
new data flag (NDF).
generated to ITU-T G.783) or TU-3, TU-2, TU-12, TU-11 and the line
rate relative to each other.
Range: ± 100 ppm in 0.1 ppm steps.
adjustments. Polarity is selectable.
Bursts of periodic double adjustments with pairs alternating
in polarity. In all cases the interval between adjustments or
pairs of adjustments is programmable.
On starting to run any of the pointer
sequences an initialisation sequence followed by a cool down
period may be run prior to the chosen sequence.
J0 path trace: User-defined/predefined 16-byte
ITU-T E.164 sequence.
MSOH: K1, K2, D4 to D12, S1, M1, Z1†, Z2†, E2 (and access to
bytes reserved for national use plus all bytes reserved
for future international standardization).
VC-4 and VC-3 POH: J1, C2, G1, F2, H4, F3, K3, N1.●
J1 path trace: User-defined/predefined 16-byte
ITU-T E.164 sequence or 64-byte sequence.
VC-2, VC-12, VC-11 POH: V5, J2, N2, K4.●
J2 path trace: User defined/predefined 16-byte
ITU-T E.164 sequence.
† Z1 and Z2 are not present in STM-0 mode.
The sequence can contain up to five different values each
being transmitted for up to 64,000 frames.
RSOH:
6-byte channel A1A2
3-byte channel D1 to D3
Single byte channels: C1, E1, F1.
MSOH:
9-byte channel D4 to D12
2-byte channel K1K2.
Single byte channels: S1, M1, Z1†, Z2†, E2.
† Z1 and Z2 are not present in STM-0 mode.
High order POH:
STM-0/STM-1e test and interfacing options (continued)STM-0/STM-1e
testing
A3R
Overhead BER testAny RSOH, MSOH or POH (except A1, A2, H1, H2, Z1, Z2)●
MSP messageMessages are displayed in text form as per ITU-T G.783●
generationfor linear architecture and to ITU-T G.841 for ring
DCC drop/insertThe data supplied to the DCC port can be inserted into either●
Optical interface2 to 259 bytes of the payload are overwritten with a block●
stress testof zeros or ones after scrambling.
Tributary scanAutomatically test BER on each SDH tributary for error●
Mixed payloadsBackgrounds can be individually configured to have TU-11, TU-12●
Keep alive signalsPDH: Transmit last configured SDH signal while transmitting●
channel is selected and a BER measurement is performed
using a 29 − 1 PRBS inserted into a 64 kb/s channel.
Single errors can be added to the test pattern.
architectures (MSP-ring).
User programmed sequences (K1K2).●
the regenerator section or multiplexer section data
communications channel. Similarly, data can be dropped
from either channel. The data may be dropped/inserted
MSB or LSB first. The data rate for access is: 192 kb/s
(RSOH DCC), 576 kb/s (MSOH DCC).
Alternatively the ITU-T G.958 CID (consecutive identical digits)
test can be selected.
free operation.
Rx setup is used to determine tributary structure and test pattern.
Alarms: Pattern loss.
Test time: Fully user selectable.
User selectable bit error threshold: Off, > 0, ≥ 10−3, ≥ 10−6.
or TU-3 independently of foreground testing channel.
a PDH signal.
SDH: With structured PDH options transmit unframed fixed
word PDH signal while transmitting an SDH signal.
SDH: Using unstructured PDH option transmit last
configured PDH signal while transmitting an SDH signal.
Thru mode
TransparentThe signal is passed through the instrument without being●
thru modealtered for monitoring purposes where no protected monitor
point is available.
Overhead overwriteIn addition to the above, the test features associated with the●
thru modeSOH and POH can be enabled to control one single- or
multi-byte overhead channel (ie, errors and alarms, optical
stress test, overhead sequences, MSP messages, DCC insert,
overhead BER. Full Rx functionality also available).
AU-4/AU-3 overwriteIn addition to both of the above, overwrite the complete AU-4/AU3●
thru modewith the internally generated payload. This enables the SOH
to be looped through while a new payload is inserted.
All of the test features which affect the VC-4/VC-3 and/or the
POH are enabled (ie, errors and alarms, adjust pointer,
overhead sequences, MSP messages, overhead BER. Full Rx
functionality also available).
Tributary overwriteWhen the payload passing through the instrument contains●
thru modea TU structure, thru mode it will be possible to choose a single
TU to be overwritten, as opposed to the complete payload.
All of the test features which affect the TU and/or the POH
are enabled (ie, errors and alarms, adjust pointer.
Full Rx functionality also available).
26
SDH
STM-0/STM-1e test and interfacing options (continued)STM-0/STM-1e
testing
A3R
STM-1e and STM-0/STM-1e receiver functions
STM-1 receive input
EqualizationAutomatic for cable loss up to 12 dB at half the bit rate.●
Monitor pointMonitor mode conforms to ITU-T G.772.●
compensationMonitor gain.20 to 26 dB
STM-0 receive input
Operating levelReceiver mode is user selectable.●
STM-0 HI: 1.1 V peak nominal, equalization up to 450 ft
STM-0 LOW: 1.1 V peak nominal, equalization from 450 to 900 ft
Monitor pointMonitor mode conforms to ITU-T G.772.●
compensationMonitor gain.20 to 26 dB
Alarm secondsAs for alarm indication, plus NDF, missing NDF and clock loss.●
AlarmScan plusAutomatically scans the SDH network hierarchy for alarms●
alarm and BIP scanand BIP errors or alarms only with a graphical display of the
network hierarchy’s status including the indication of
unequipped channels.
Alarms: LOP, path AIS, path RDI, H4 LOM†, TU LOP*,
TU path AIS*, TU path RDI.*
† For TU-11, TU-12 and TU-2 structures.
* If applicable.
† Service disruption test requires PDH/DSn option UKJ,
UKN or 110 to be fitted.
AU +ve adjustment count/seconds, AU −ve adjustment
count/seconds, TU pointer value, TU NDF seconds,
TU missing NDF seconds, TU +ve adjustment count/seconds,
TU −ve adjustment count/seconds, implied VC-4, VC-3, VC-2,
VC-12, VC-11 offset.
SOH and POH of a received STM-0 signal.●
Text message displayed for signal label (C2 and V5) and
sync status (S1) decoded.
together with the number of consecutive frames containing
the value.
location activity can be monitored.
Implied VC offset: The total positive and negative pointer
movements since the start of the measurement period are
summed and the implied mean VC offset calculated from
this total.
using a 29 − 1 PRBS inserted into a 64 kb/s channel. Single
errors can be added to the test pattern. Error count,
error ratio, error free seconds, % error free seconds and
pattern loss seconds are measured.
28
STM-1 optical interfacing
SDH
Option UH1
STM-1 (1310 nm) optical
interfacing. Also provides
STM-1
LASER
ON
OUT
CLASS 1 LASER PRODUCT
IN
Option UH1
OC-3 optical interfacing when
used in conjunction with dual
standard SONET/SDH
option 120.
STM-1 optical interfacing optionsSTM-1
Requires option A1T, A3R or 120 to be fitted.
OUT and IN ports (used for transmit and receive)
TypeOptical.●
ConnectorsCustomer exchangeable optical adaptors allow a range of interfaces to be attached.
RateSTM-1 (155.52 Mb/s).●
Line codeNRZ.●
Protected monitor150 mV to 1000 mVp-p (nominal): ac coupled, nominal 50 ohm.●●
point input level
Optical power measurement Accuracy: ± 1 dB .●●
Range: −8 to −30 dBm.
23
− 1. To ITU-T G.957.
−10
.−8 dBm−8 dBm
Transmitter functions
Clock timingInternal.●●
Frequency offset generation Up to ± 999 ppm in 0.1 ppm steps.●●
STM-4 error addition
Recovered:
From received STM-0, STM-1 or STM-4 optical signal.●●
From received STM-0, STM-1 electrical signal.●●
Ext. MTS: Data or clock format (as ITU-T G.811).●●
-
Error typeSingleRate 10
N
Comments●●
−10
(1310 and (1310 nm)
1550 nm)
Frame A1A2●N in four frame words
B1●N = 4 to 9
B2 %●N = 3 to 9
MS REI●N = 3 to 9
% MSP threshold, N in T where 0 ≤ N ≤ 1920 and 10 ms ≤ T ≤ 10000 s,
in decade steps.
STM-1One STM-1 is selected for test. STM-1 error add capability●●
error additionis provided for the STM-1 under test. Refer to STM-0/STM-1
STM-4 alarm generationLOS, LOF, OOF, MS AIS, MS RDI.●●
STM-1 alarm generationOne STM-1 is selected for test. For STM-1 alarm generation●●
Payload capabilityOne STM-1 is selected for test. The payload data capability of the●●
Background payloadBackground STM-1 contains 00000000 in all bytes or VC-4 payload
VC-4-4c error add
* MLM receivers work with both MLM (multi mode) and SLM (single mode) transmitters.
test option A3R for details.
capability of the STM-1 under test, refer to STM-0/STM-1 test
option A3R for details.
STM-1 under test is defined by the STM-0/STM-1 test option.
Refer to STM-0/STM-1 test option A3R for details.
data is loaded into all four VC-4s of the STM-4.
-
Error typeSingleRate 10
B3●N = 4 to 9
HP REI●N = 4 to 9
HP IEC●N = 4 to 9
Bit●N = 3 to 7
N
●●
31
SDH
STM-4c, STM-4, STM-1 and STM-0 test130131
and interfacing options (continued)
VC-4-4c alarm generationAU-AIS, HP-RDI, AU-LOP, path unequipped.●●
Pointer adjustmentOne STM-1 is selected for test. The pointer adjustment generation●●
generationcapability of the STM-1 under test is defined by the STM-0/STM-1 test option.
Refer to STM-0/STM-1 test option A3R for details.
Transmit overhead
OverheadStandard overhead values to ITU-T G.707.●●
STM-4RSOH:.A1, A2, J0, Z0, E1, F1, D1 to D3.●●
user-programmableMSOH: SS bits, K1, K2, D4 to D12, S1, Z1, Z2, M1.
bytesJ0 path trace: user-defined/predefined 16-byte ITU-T E.164 sequence.
STM-0/STM-1The user-programmable STM-0/STM-1 overhead capability is defined by the●●
user-programmableSTM-0/STM-1 test option. Refer to STM-0/STM-1 test option A3R for details.
bytes
Path overheadThe user-programmable path overhead capability is defined by the●●
user-programmable bytesSTM-0/STM-1 test option. Refer to STM-0/STM-1 test option A3R for details.
Overhead sequenceA single- or multi-byte overhead channel is over-written with a single or●●
generationrepeated sequence of programmed values. The sequence can contain up to
five different values each being transmitted for up to 64,000 frames.
RSOH: D1 to D3 (3-byte channel); J0, E1, F1; Z0 for STM-1 under test.
MSOH: D4 to D12 (9-byte channel); K1 to K2 (2-byte channel); S1, E2;
Z1, Z2; M1.
High order POH: J1, C2, G1, F2, H4, F3, K3, N1.
Overhead BER testAny overhead channel detailed above, for overhead sequences●●
(except Z1 and Z2) can have a 29 − 1 PRBS inserted into a 64 kb/s channel.
Single errors can be added to the test pattern and a BER measurement
performed.
MSP messageMessages are displayed in text form as per ITU-T G.783 for linear●●
generationarchitecture and to ITU-T G.841 for ring architectures (MSP-ring).
User programmed sequences (K1K2).●●
DCC drop/insertThe DCC drop/insert capability is defined by the STM-0/STM-1 test option.●●
Refer to STM-0/STM-1 test option A3R for details.
STM-4 thru modeThe signal is passed through the instrument without being altered for●●
monitoring purposes where no protected monitor point is available.
Overhead overwriteThe test features assocuated with the section overhead can be enabled●●
STM-4 modein order to control one single- or multi-byte overhead channel. The B1
and B2 bytes are recalculated.
Overhead overwriteThe test features assocuated with the section overhead and path overhead●●
STM-4-4c modecan be enabled in order to control one single- or multi-byte overhead channel.
The B1, B2 and B3 bytes are recalculated.
AU-4 overwrite modeOverwrite the complete AU-4 with the internally generated payload. This●●
enables the SOH and the three background AU-4s to be looped through
while a new payload is inserted into the STM-1 under test. All of the test
features which affect the VC-4 and/or the POH are enabled. The B1, B2 and
B3 bytes are recalculated. The AU-4 under test is delayed by a greater
amount than the three background AU-4s.
Tributary overwriteIf the payload contains a TU structure a single TU can be overwritten.●●
All of the test features which affect the tributary and/or the POH are
enabled. The B1, B2, B3 and TU BIP bytes are recalculated.
(1310 and (1310 nm)
1550 nm)
32
SDH
STM-4c, STM-4, STM-1 and STM-0 test130131
and interfacing options (continued)
Receiver functions
STM-4 error resultsFrame A1A2, B1, B2, MS REI.●●
STM-0/STM-1 error resultsOne STM-1 is selected for test. The errors detected in the payload of the●●
STM-1 under test are defined by the STM-0/STM-1 test option.
Refer to STM-0/STM-1 test options A3R for details.
VC-4-4c error resultsB3, HP REI, HP IEC, bit.●●
Error analysisRefer to STM-0/STM-1 test options A3R for details.●●
Pointer resultsRefer to STM-0/STM-1 test options A3R for details.●●
Alarm indicationLOS, LOF, OOF, LOP (refer to STM-1 test option A1T or A3R for details),●●
MS AIS, MS FERF, K1/K2 change, clock loss.
One STM-1 is selected for test. The alarm detection capability in the●●
payload of the STM-1 under test are defined by the STM-1 test option.
Refer to STM-1 test options A1T or A3R for details.
VC-4-4c alarms detectedAs above plus LOP, path AIS, AU AIS, HP RDI, pattern sync loss.●●
Alarm secondsAs for alarm indication, plus power loss, NDF and missing NDF,●●
and except clock loss.
Received overhead snapshot SOH and POH from STM-1 number 1, or from STM-1 under test can be displayed. ●●
Refer to STM-1 test options A1T or A3R for details.
Overhead sequence captureA single- or multi-byte overhead channel can be selected to be monitored.●●
After a manual or programmed trigger, the captured byte values are
displayed together with the number of consecutive frames containing
the value.
RSOH: D1 to D3 (3-byte channel); J0, E1, F1; Z0 for STM-1 under test.
MSOH: D4 to D12 (9-byte channel); K1 to K2 (2-byte channel); S1, E2;
Z1, Z2; M1.
High order POH: J1, C2, G1, F2, H4, F3, K3, N1.
Pointer location graphA graphical display that shows the variation with time of the AU-n●●
and TU-n pointer location. Refer to STM-0/STM-1 test option A3R for details.
Overhead BER measurement Any RSOH, MSOH or POH channel detailed above (for overhead sequences●●
capture) can be selected and a BER measurement performed using a
29 − 1 PRBS inserted into a 64 kb/s channel. Single errors can be added to the test
pattern. Error count, error ratio, error free seconds and % error free seconds,
pattern loss seconds are measured.
(1310 and (1310 nm)
1550 nm)
33
Dual standard SONET/SDH test and interfacing
Option 120
Dual standard SONET/SDH module.
Provides electrical outputs at STS-3/STS-1
and STM-1/STM-0. SONET/SDH optical
interfaces provided when used in
conjunction with option UH1 (page 29)
and options 130/131 (page 30).
SONET specifications detailed below.
Please see option A3R for SDH
specification (page 22).
Option 120
STS-3/STS-1 and STM-1e/STM-0e testand interfacingDual standard
dual standard SONET/SDH
(for SDH specifications see option A3R)testing
OUT and IN ports (used for transmit)
TypeElectrical: To ITU-T G.703.●
ConnectorsBNC, 75 ohm, unbalanced.●
Rate155.52 Mb/s.●
Line code155.52 Mb/s: CMI.●
Output level155.52 Mb/s: ± 0.5 V ± 10%.●
Error outputB3 error output pulse on receipt of STS-1 and STS-3 signals.●
Simultaneous STS-1When used in conjunction with the appropriate optical interfaces,●
and OC-1transmit STS-1 electrical output signal
Transmitter
Clock timingInternal: All rates.●
51.84 Mb/s.●
51.84 Mb/s: B3ZS.●
51.84 Mb/s:●
Output level is user configurable.
STS-1 X CON: 1.1 V peak nominal (0 ft).
STS-1 HI: 530 mV peak nominal (450 ft).
STS-1 LOW: 350m V peak nominal (900 ft).
TTL pulse termination 75 ohm or 10 k ohm.
simultaneously with OC-1 optical output signal.
Recovered: From SONET input (CMI or NRZ electrical or optical)
Bits: 1.544Mb/s DS1 timing reference as per TA-TSY-000378Bantam,
100 ohm nominal, unbalanced
Ext MTS: 64kb/s conforming to ITU-T G.703 , Bantam, 120 ohm, balanced
2 Mb/s conforming to ITU-T G.811, BNC 75 ohm unbalanced,
Bantam 120 ohm balanced.
SONET/SDH
120
34
STS-3/STS-1 and STM-1e/STM-0e testand interfacing (continued)Dual standard
(for SDH specifications see option A3R)testing
Frequency offsetUp to ± 999 ppm in 0.1 ppm steps.●
generation
Error addition●
Error typeSingleRate 10
Frame A1A2●N in four
CV-S (B1)●4 to 9
CV-L (B2)†●3 to 9
REI-L●3 to 9
STS SPE CV-P (B3)●4 to 9
STS SPE REI-P●4 to 9
STSc SPE IEC-P●4 to 9
VT6 CV-V (V5)●4 to 9
VT6 REI-V●5 to 9
VT2 CV-V (V5)●3 to 9
VT2 REI-V●4 to 9
VT1.5 CV-V●3 to 9
VT1.5 REI-V●4 to 9
Bit error*●3 to 9
-N
Comments
frame words
SONET/SDH
120
dual standard SONET/SDH
Alarm generationLOS, LOF, SEF, AIS-L, RDI-L.●
† APS threshold N errors in T ms where 0 ≤ N ≤ 1920 (STM-3) and 10 ms ≤ T ≤ 10000 s,
in decade steps.
*For SONET stand-alone operation, bulk-filled payloads and DS1, DS3 mapped payloads only.
For bit error rates supported with other payloads refer to the DSn/PDH test option for details.
OC-12/OC-12c/OC-3/OC-3c/OC-1 capability when optical module fitted.
DS3(44.736 Mb/s) into STS-1 SPE† and STS-1 SPE bulk filled mappings:●
DS1(1.544Mb/s) async into VT1.5†.
139.264 Mb/s into a STS-3c SPE and STS-3c SPE bulk-filled mappings.
2.048 Mb/s (async and fl. byte sync) into VT2 SPE and VT2 SPE bulk filled mappings:
34.368 Mb/s, into STS-1 SPE and STS-1 SPE bulk filled mappings:
VT6 SPE bulk filled mapping and VT6 -Nc (for N = 2 to 6):
† DS1, DS3 mappings require DSn/PDH option UKJ, UKN or 110 to be fitted.
35
STS-3/STS-1 and STM-1e/STM-0e testand interfacing (continued)Dual standard
(for SDH specifications see option A3R)testing
SONET/SDH
120
Payload dataThe following unframed patterns can be generated:
Payload framing139.264, 34.368 and 2.048 Mb/s: Unframed.●
Drop/insert139.264Mb/s: Drop/insert via Tx/Rx on options UKJ/UKN.●
(Framed and structured signals are available in conjunction
with the PDH/DSn options UKJ/UKN/110).
PRBS: 29 − 1 (O.150), 2
20
QRSS (2
Word: User-defined 16-bit word, all ones, all zeros, 1010, 1000.
All PRBS patterns can be set to be inverted or non-inverted.
† Applicable to DS1 mappings only.
139.264, 34.368 and 2.048 Mb/s: Framed and structured signals†
DS3 payloads: Unframed, C-Bit parity (to ANSI T1.107a-1990)
M13 (to ANSI T1.107-1988)†.
VT6 : Unframed.
DS1 payloads: Unframed, SF (D4), ESF (to ANSI T1.403-1989,
TR-TSY-000499 and ITU-T G.704), SLC-96†.
† Only available in conjunctionwith the PDH/DSn option UKJ/UKN/110.
44.736 (DS3): Drop/insert via Tx/Rx on option 110.
34.368 Mb/s: Drop/insert via Tx/Rx on options UKJ/UKN/110.
2.048 Mb/s: Drop/insert via drop/insert ports on options UKJ/UKN/110.
1.544 Mb/s (DS1): Drop/insert via drop/insert ports on option 110.
− 1, 14 zero limited)†
11
− 1 (O.152), 2
15
− 1 (O.151) and 2
23
− 1 (O.151)●
dual standard SONET/SDH
Pointer adjustment generation
Increment/decrement/Provides a burst, selectable between 1 and 10 pointer●
alternatingadjustments (between 1 and 5 for VT6, VT2 and VT1.5 pointer).
New pointer valueThe STS SPE, VT6, VT2 or VT1.5 moves to a selectable new●
Frequency offsetPointer sequences are generated by offsetting the frequencies●
(and 87:3)of the SPE, (in this mode the 87:3 sequence is generated to
Bellcore GR-253-COREBursts of periodic single adjustments with added or canceled●
and ANSI T1.105.03adjustments. Polarity is selectable.
location in a single jump, with or without an accompanying
new data flag (NDF).
Bellcore GR-253-CORE/ANSI T1.105.03) or VT6, VT2, VT1.5
and the line rate relative to each other.
Range: ± 100 ppm in 0.1 ppm steps.
Bursts of periodic double adjustments with pairs alternating in polarity.
In all cases the interval between adjustments or pairs of adjustments
is programmable.
On starting to run any of the pointer sequences an initialisation
sequenced followed by a cool down period may be run prior to running
the chosen sequence.
Transmit overhead
OverheadDefault selection: Standard overhead values to Bellcore GR-253-CORE .●
and ANSI T1.05
STS-3/STS-1TOH can be set in binary or HEX.●
user-settable bytesSOH: A1, A2, J0, E1, F1, D1 to D3.
J0 path trace: User-defined/predefined 16-byte ITU-T E.164 sequence.
LOH: K1, K2, D4 to D12, S1, M1, E2 (and access to bytes reserved
for national use plus all unmarked bytes reserved for future
international standardization).
STS SPE POH: J1, C2, G1, F2, H4, Z3, Z4 ,N1.●
J1 path trace: User-defined/predefined 16-byte ITU-T E.164 sequence
or 64-byte sequence.
VT6 SPE , VT2 SPE, VT1.5 SPE POH: V5, J2, Z6, Z7.●
J2 path trace: User defined/predefined 16-byte ITU-T E.164 sequence.
36
STS-3/STS-1 and STM-1e/STM-0e testand interfacing (continued)Dual standard
(for SDH specifications see option A3R)testing
Overhead sequenceA single or multi-byte overhead channel is overwritten with●
generationa single or repeated sequence of programmed values.
Overhead BER testAny SOH, LOH or POH (except A1, A2, H1, H2, Z1, Z2)●
APS messageMessages are displayed in text form as per Bellcore GR-253-CORE for linear●
generationarchitecture and to Bellcore GR-1230-CORE for ring architectures (BLSR).
dual standard SONET/SDH
DCC drop/insertThe data supplied to the DCC port can be inserted into either●
Optical interface2 to 259 bytes of the payload are overwritten with a block●
stress testof zeros or ones after scrambling.
Tributary scanAutomatically test BER on each SONET tributary for error free operation.●
Mixed payloadsMixed payloads: Each STS-1 SPE within an STS-3 can be independently configured●
Keep alive signalsDSn/PDH:Transmit last configured SONET signal while transmitting●
The sequence can contain up to five different values each
being transmitted for up to 64,000 frames.
SOH:
6-byte channel A1A2
3-byte channel D1 to D3
Single byte channels: C1, E1, F1.
LOH:
9-byte channel D4 to D12
2-byte channel K1K2
Single byte channels: S1, M1, Z1†, Z2†, E2.
† Z1 and Z2 are not present in STS-1 mode.
High order POH:
Single byte channels: J1, C2, G1, F2, H4, Z3, Z4, N1.
channel is selected and a BER measurement is performed
using a 29 − 1 PRBS inserted into a 64 kb/s channel.
Single errors can be added to the test pattern.
User programmed sequences (K1/K2).
the regenerator section or multiplexer section data
communications channel. Similarly, data can be dropped
from either channel. The data may be dropped/inserted
MSB or LSB first. The data rate for access is: 192 kb/s (SOH DCC),
576 kb/s (LOH DCC).
Alternatively the ITU-T G.958 CID (consecutive identical digits)
test can be selected.
Rx setup is used to determine tributary structure and test pattern.
Alarms: Pattern loss.
Test time: Fully user selectable.
User selectable bit error threshold: Off, > 0, ≥ 10−3, ≥ 10−6.
to contain a STS-1 SPE user word, VT2 or VT1.5 structure.
a DSn/PDH signal.
SONET/SDH
120
Thru mode
TransparentThe signal is passed through the instrument without being altered for●
thru modemonitoring purposes where no protected monitor point is available.
Overhead overwriteIn addition to the above, the test features associated with the●
thru modeTOH and POH can be enabled to control one single- or
multi-byte overhead channel (ie, errors and alarms, optical
stress test, overhead sequences, APS messages, DCC insert,
overhead BER. Full Rx functionality also available).
37
STS-3/STS-1 and STM-1e/STM-0e testand interfacing (continued)Dual standard
(for SDH specifications see option A3R)testing
STS-3c/STS-1 SPEIn addition to both of the above, overwrite the complete SPE●
overwrite thru modewith the internally generated payload. This enables the TOH
Tributary overwriteWhen the payload passing through the instrument contains●
thru modea VT structure, thru mode it will be possible to choose a single
to be looped through while a new payload is inserted.
All of the test features which affect the SPE and/or the
POH are enabled (ie, errors and alarms, adjust pointer,
overhead sequences, APS messages, overhead BER. Full Rx
functionality also available).
VT to be overwritten, as opposed to the complete payload.
All of the test features which affect the VT and/or the POH
are enabled (ie, errors and alarms, adjust pointer.
Full Rx functionality also available).
STS-3 and STS-1 receiver functions
STS-3 receive input
EqualizationAutomatic for cable loss up to 12 dB at half the bit rate.●
Monitor pointMonitor mode conforms to ITU-T G.772.●
compensationMonitor gain.20 to 26 dB
dual standard SONET/SDH
STS-1 receive input
Operating levelReceiver mode is user selectable.●
Monitor pointMonitor mode conforms to ITU-T G.772.●
compensationMonitor gain.20 to 26 dB
STS-1 HI: 1.1 V peak nominal, equalization up to 450 ft
STS-1 LOW: 1.1 V peak nominal, equalization from 450 to 900 ft
STS-3/STS-1 and STM-1e/STM-0e testand interfacing (continued)Dual standard
(for SDH specifications see option A3R)testing
AlarmScan plusAutomatically scans the SONET network hierarchy for alarms●
alarm and BIP scanand BIP errors or alarms only with a graphical display of the network
Protection switch timesService disruption test measures error burst length for●
FrequencyFrequency displayed in Hz, 1 Hz resolution.●
measurementOffset displayed in ppm and Hz.
Received overheadTOH can be set in binary or HEX.●
snapshotTOH and POH of a received STS-3 signal.
Overhead sequenceAny one overhead channel is selected. After a manual or programmed●
capturetrigger, the captured byte values are displayed together with the
PointerA graphical display that shows the variation with time of the●
location graphSTS Path and VT pointer location. Up to four days of pointer location
Overhead BERAny SOH, LOH or POH (except A1, A2, H1, H2, Z1, Z2)●
measurementchannel is selected and a BER measurement is performed
hierarchy’s status including the indication of unequipped channels.
Alarms: LOP, path AIS, RDI-P, H4 LOM†, VT LOP*, AIS-V*, RDI-V.*
† For VT6 , VT2 AND VT1.5 structures.
* If applicable.
TOH and POH of a received STS-1 signal.
Text message displayed for signal label (C2 and V5) and sync status
(S1) decoded.
number of consecutive frames containing the value.
activity can be monitored.
Implied SPE offset: The total positive and negative pointer
movements since the start of the measurement period are summed
and the implied mean SPE offset calculated from this total.
using a 29 − 1 PRBS inserted into a 64 kb/s channel. Single errors can
be added to the test pattern. Error count, error ratio, error free seconds,
% error free seconds and pattern loss seconds are measured.
SONET/SDH
120
39
Jitter generation
Option 140
PDH jitter generation: 2, 8, 34 and
140 Mb/s up to 80 UI (2 Mb/s).
SDH jitter generation: STM-1
(155 Mb/s) and STM-4 (622 Mb/s)
up to 200 UI (STM-4).
Option A3K
All the capability of option 140 plus
wander generation: 2 Mb/s, STM-1
(155 Mb/s) and STM-4 (622 Mb/s)
up to 14400 UI (STM-4).
Option A3K
Option 140
Jitter generation option†SDH and PDH
PDH jitter generation requires a PDH test option (UKK, UKJ or UKN) to be fitted.
SDH jitter generation requires an STM-1 test option (A3R, 120 or A1T) to be fitted.A3K140
OUT and IN ports (used for transmit and receive)
ConnectorsPDH jitter generation uses the Tx ports on the PDH option● ●
jitter generation and measurement
Rate2.048, 8.448, 34.368 and 139.264 Mb/s if appropriate PDH option fitted.●●
Other portsExternal jitter modulation input (75 ohm, unbalanced).●●
(UKK, UKJ, UKN or UH3).
SDH jitter generation uses the electrical Tx ports on the STM-1 test option (A1T, 120 or A3R)
or the Tx ports on the optical interfacing STM-1/STM-4 (UH1, USN, UKT, 130, 131 or 0YH).
155.52 Mb/s (STM-1) and 622.08 Mb/s (STM-4) if appropriate SDH and optical
interface options fitted.
Ext MTS: Data or clock format (as ITU-T G.811).●●
Jitter modulation
Frequency0.1 Hz to 5 MHz.●●
Frequency accuracy± 1% above 3 Hz, ± 3% below 3 Hz.●●
Frequency resolution 1 Hz for 1 and 10 UI ranges steps.●●
† NB: Jitter generation can be used simultaneously with frequency offset.
0.1 Hz for 50, 80 and 200 UI ranges.
jitter generation
40
Jitter generation option (continued)SDH and PDH
jitter generation
A3K140
ITU-T 0.171Meets and exceeds the requirements of ITU-T G.825, G.958 and G.823.●●
specification
Meets the following ITU-T O.171 jitter amplitude versus modulation frequency specification.
Automatic jitterThe mask is swept in frequency increments and at each frequency the jitter●●
toleranceamplitude is increased until errors (of any type) are detected.
Number of3 to 55 in steps of 1. Step sizes calculated as follows●●
frequency points
Dwell time0.1 to 99.9 seconds in 0.1 second steps.●●
Delay time0.1 to 99.9 seconds in 0.1 second steps.●●
Bit error thresholdAny error or 1 to 106 bit errors in steps of 1.●●
modulating frequencies to ITU-T G.823 Table 2 covering low and high Q systems.
The masks can be used to measure tolerance to jitter amplitude at spot jitter
frequencies or can be swept in 20% frequency increments.
When generating an SDH signal, the masks available are those specified in
ITU-T G.958. A choice of type A or B masks is available at STM-1 and STM-4.
log (f
) – log (f
log (m) =
n = Number of frequency steps
m = Multiplier applied to the frequency to determine the next frequency value.
For 55 steps, the multiplier is +20%. For 10 steps, the multiplier is +200%.
Time spent at each amplitude point/frequency point waiting for error events.
Time spent at each amplitude/frequency point waiting for the system under
test to settle before performing the measurement.
Any error allows jitter tolerance testing using the “Onset of Errors Technique”
The bit error threshold allows the instrument to record a pass at a particular point when
the bit error count is non-zero and allows the instrument to make measurements using the
“1 dB Power Penalty Technique”
2 Mb/sITU-T G.823 Low Q and high Q
8 Mb/sITU-T G.823 Low Q and high Q
34 Mb/sITU-T G.823
140 Mb/sITU-T G.823
STM-1ITU-T G.958Type A and type B
STM-4ITU-T G.958Type A and type B
max
(n – 1)
)
min
43
Jitter generation option (continued)SDH and PDH
jitter generation
A3K140
Wander modulation
External MTSData or clock format (as ITU-T G.811).●
clock inputBNC, 75 ohm, unbalanced or Siemens (3-pin) 120 ohm balanced.–
Frequency10 µHz to 0.125 Hz.●–
Frequency accuracy± 1%.●–
Frequency resolution 1 µHz.●–
Wander amplitudeGenerated wander amplitude versus modulation frequency●–
versus modulation
frequency’Bit rateA0A1F0F11F9
Fixed wanderA pre-programmed wander tolerance mask to ITU-T G.823 Table 2 and ITU-T G.958●–
tolerance maskcan be selected to automatically control the wander amplitude. The analyzer will
‡ PDH jitter measurement uses Rx ports on PDH module.
Impedance: 75 ohm.
Equalization: Automatic for cable loss up to 12 dB
at half the bit rate.
Monitor: 20 to 26 dB of flat gain.
PDH jitterand
PDH jitter
* MLM receivers work with both MLM (multi mode) and SLM (single mode) transmitters.
45
Jitter measurement test options (continued)PDH jitterSTM-1eSTM-1o,STM-4o,
andSTM-1eSTM-1o,
PDH jitterandSTM-1e
UHNA3LA3VA3N
PDH jitterand
PDH jitter
STM-1o inputLine code: NRZ.––●●
STM-4o inputLine code: NRZ.–––●
Wavelength: 1200 to 1600 nm.
Sensitivity: −28 dBm minimum.
Using 1300 nm wavelength, 100% modulation depth
and BER of 10
Dynamic range: 20 dB minimum.
Maximum input power: −8 dBm.
Wavelength: 1200 to 1600 nm.
Sensitivity: −26 dBm minimum.
Using 1300 nm wavelength, 100% modulation depth
and BER of 10
Dynamic range: 18 dB minimum.
Maximum input power: −8 dBm.
−10
and PRBS of 223 − 1.
−10
and PRBS of 223 − 1.
SDH-PDH jitter transfer
Automatic jitterAutomatic jitter transfer test at 2, 8, 34, 139 Mb/s, STM-1e, STM-1o–●●●
transferor STM-4o. Narrow band selective filtering is performed in
Number of1 to 55 in steps of 1.–●●●
frequencyNB When a single point is selected, no graph is available.
pointsOnly text results will be displayed.
jitter generation and measurement
Delay time5 to 30 seconds in 1 second steps.–●●●
Dwell time5 to 30 seconds in 1 second steps.–●●●
Jitter transferSelect between ITU-T defined fixed mask or user selectable–●●●
input maskinput mask.
the receiver. Jitter transfer results are plotted graphically
alongside the relevant ITU-T mask.
Step sizes calculated as follows
log (f
) – log (f
log (m) =___________________
n = Number of frequency steps
m = Multiplier applied to the frequency to determine the next
frequency value.
For 55 steps, the multiplier is +20%.
For 10 steps, the multiplier is +200%.
Time spent at each amplitude point/frequency point waiting for
the system under test to settle before performing the measurement.
During calibration, the delay time used is fixed at 5 sec.
Test period time spent at each amplitude/frequency point.
The result recorded is the maximum peak-to-peak jitter amplitude
detected during the dwell time test period.
max
(n – 1)
min
)
46
Jitter measurement test options (continued)PDH jitterSTM-1eSTM-1o,STM-4o,
andSTM-1eSTM-1o,
PDH jitterandSTM-1e
UHNA3LA3VA3N
Fixed jitter
transfer inputBit–●●●
masksrate MaskF1F2F3F4A1A2
(Mb/s)(Hz)(Hz)(Hz)(Hz)(UI) (UI)
2 Mb/sG.823, High Q202.4 k18 k100 k1.50.2
Note: The maximum value that can be generated is as defined by
= F4 in ITU-T O.171 Table 3.
max
ITU-T O.171 Table 3 (shown in jitter and wander generation section
except for 8 Mb/s where F2
is enabled, the ITU-T pass mask can also be displayed along
= 10.7 kHz. When user selectable
max
with the results.
Jitter transfer10 Hz.–●●●
measurement
bandwidth
Jitter transfer+5 dB to −40 dB.–●●●
dynamic range
Jitter transfer0.02 dB.–●●●
stabilityMeasurements must be completed within 10 mins of the
completion of the calibration cycle.
Jitter transfer0.01 dB.–●●●
jitter generation and measurement
calibration
Jitter transferFigures quoted below include stability and calibration factors.–●●●
accuracy
Rx jitter amplitudeAccuracy
(UI)(dB)
PDH jitterand
PDH jitter
3 to 0.30.04
0.3 to 0.030.25
0.03 to 0.010.5
0.01 to 0.0031
0.003 to 0.0013
The accuracy figures were verified using the following patterns,
PDH: Unframed 1000, unframed default PRBS (refer to UKJ specification).
STM-1, STM-4: VC-4 containing unframed 140 Mb/s at 223 − 1.
47
Jitter measurement test options (continued)PDH jitterSTM-1eSTM-1o,STM-4o,
andSTM-1eSTM-1o,
PDH jitterandSTM-1e
UHNA3LA3VA3N
PDH jitterand
PDH jitter
Jitter transferTabular or graphical form–●●●
Jitter transferResults will be compared to ITU-T pass mask
pass maskspecified in the appropriate standard.
Jitter transferThe result is plotted alongside the pass mask on a graph of–●●●
graphical results gain versus frequency. The y-axis range is selectable as
Jitter transferThe result will be displayed in a table, with the following–●●●
tabular resultsinformation displayed for each result: Point number, frequency,
results
Bit
rate MaskF1F2F3F4A1A2–●●●
(Mb/s)(Hz)(Hz)(Hz)(Hz)(UI)(UI)
2 Mb/sG.8231 High Q2040400100 k0.5−19.5
G.8231 Low Q2070700100 k0.5−19.5
8 Mb/sG.8232 High Q201001 k400 k0.5−19.5
G.8232 Low Q208 k80 k400 k0.5−19.5
34 Mb/sG.823
STM-1G.958, Type A130 k Note b–0.1–
STM-4G.958, Type A1 k500 k Note b–0.1–
1
Actual values from ITU-T G.742.
2
Actual values from ITU-T G.751.
Note
(a) No mask is defined in the ITU-T standards for 139 Mb/s.
In this case, the display will show the result without the pass threshold being indicated.
(b) The mask shows threshold falling off by 20 dB per decade after F2.
+5 dB to −60 dB or +3 dB to −3 dB.
mask value, result, pass fail indication.
2
1003003 k800 k0.5−19.5
G.958, Type B50030 k–0.1–
G.958, Type B1 k30 k–0.1–
Peak-peak jitter measurement
jitter generation and measurement
JitterThese ranges cope with the measurements required in●●●●
measurementITU-T O.171 Table 3.
ranges
HP filters: Slope below 3 dB point is 20 dB per decade;
LP filters: Slope above 3 dB point is 60 dB per decade.
Combinations of filters available: Off (no filters), LP only,
HP1 only, HP2 only, LP and HP1, LP and HP2,
12 kHz HP (can be enabled in addition to all of the above or by itself).
Demodulated1.0 V per UI (range 1.6); 0.1 V per UI (range 16).●●●●
jitter output
PDH jitterand
PDH jitter
RMS jitter measurement
jitter generation and measurement
RMS jitterThe RMS ranges are linked to the selection for peak.–●●●
measurementNo separate selection will exist.
ranges
1.0n 5 UI range: Z (high frequency accuracy) is only applicable at 2 Mb/s rate.
Where V is display resolution: 0.002 UI for 0.5 UI Range, 0.02 UI for 5 UI range.
W is rms receiver intrinsic jitter detailed below.
Z is rms high frequency accuracy detailed below.
Receiver range
Peak rangerms range
(UI)(UI)
1.60.5
165.0
(UI)20 Hz to 3 MHz> 3 MHz
0.5± 5% ± V ± W ± Z± 5%
5± 5% ± V ± W ± Z
1
± 5%
50
Jitter measurement test options (continued)PDH jitterSTM-1eSTM-1o,STM-4o,
Jitter measurement test options (continued)PDH jitterSTM-1eSTM-1o,STM-4o,
andSTM-1eSTM-1o,
PDH jitterandSTM-1e
UHNA3LA3VA3N
Jitter results
PDH jitterand
PDH jitter
ResultsHits: Jitter hit count, jitter hit seconds, jitter hit-free seconds,●●●●
Jitter transferDisplay results from last auto-jitter transfer measurement.–●●●
AlarmsLoss of signal, jitter unlock and jitter out of range.●●●●
Graphical results Jitter hit count result plus jitter unlock, jitter out-of-range●●●●
Wander alarmsNo reference and excess wander. If wander > 5 UI in any●●●●
BandwidthLow pass response −3 dB at 10 Hz (nominal).●●●●
jitter generation and measurement
jitter generation and measurement
Resolution0.125 UI.●●●●
Range± 99999 UI.●●●●
Accuracy± 0.125 UI ± 0.5% of reading (up to 1 Hz wander frequency).●●●●
Estimate frame0 to 9 999 999 frames.●●●●
slips
Estimate bit0 to 9 999 999 bits.●●●●
slips
Implied frequency TIE expressed as a ppm offset to nominal (0 .. 999.99 ppm).●●●●
offset
Graphical wander Wander measurement presented in graphical form.
amplitude, peak-to-peak amplitude (15 minutes)
peak-to-peak amplitude (24 hours), time interval error, implied
frequency offset, estimated frame slips, estimated bit slips.
All results can be displayed in bits (0..99 999 999.999 bits)
or µs (0..99 999 999.999 µs) except:
Estimated frame slips: 0..9 999 999 frames,
Estimated bit slips: 0..9 999 999 bits,
Implied frequency offset: 0..999.99 ppm.
15 minute period or > 28 UI in any 24 hour period then the
status message “excess wander” is displayed.
Three positive and negative sliding bar graphs each of ± 1 UI,
± 16 UI, ± 256 UI are provided. Bit slips and estimated frame
slip results plus wander reference unlock and excessive wander
alarms are stored/displayed in SMG (stored measurement graphics).
Definitions
Time interval error:Current offset with respect to the position at start of gating displayed with a resolution of 0.125 UI.
Estimated frame slips: Each time a complete UI of wander (+ or –) is accumulated the bit slips count is incremented..
Estimated bit slips:Each time the accumulated movement equals +/– 256 UI (ie, the 2 Mb frame size), the frame slips
count is incremented.
52
ATM cell test options
ATM
Option UKN (ETSI only)
Pair of modules providing ATM cell layer
generation and measurement: 2, 34 and
140 Mb/s (includes structured PDH generation
and measurement: 2, 8, 34 and
140 Mb/s – refer to page 12 and 13).
Option UKN
ATM cell test options – ETSI onlyATM cell
ATM transmitter
Physical layer
TypeElectrical: To ITU-T G.703.●
ConnectorsBNC, 75 ohm, unbalanced and Siemens 3-pin, 120 ohm balanced.●
jitter generation and measurement
Rates2.048, 34.368, 139.264 and 155.52 Mb/s‡.●
Frequency offset generation‡ 2.048, 34.368 and 139.264 Mb/s: Up to ± 100 ppm in 1 ppm steps.●
Clock timing‡Internal: All rates.●
Framing2.048 Mb/s (E1): As per ITU-T G.804/G.704;●
Transmission convergence2.048 Mb/s: To ITU-T G.804/G.704 (CRC4 on/off);●
Error addSingle HEC or double HEC; 1 in 103 or single error; HEC error sequences.●
34.368 Mb/s (E3) and 139.264 Mb/s: As per ITU-T G.832;
Error monitoring (EM) contains correct BIP-8;
Trail trace (TR) is user-definable (ITU-T E.164 format);
Maintenance adaptation (MA) is set to 011 (hexadecimal);
Network operator (NR) and general communications (GC) are set to all zeros;
155.520 Mb/s: As per ITU-T G.707‡.
34.368 Mb/s and 139.264 Mb/s: To ITU-T G.804/G.832;
155.52 Mb/s: To ITU-T G.707‡.
generation
and analysis
UKN
‡ For 155.52 Mb/s you also require an STM-1 test option (option A1T or A3R).
53
ATM
ATM cell test options – ETSI only (continued)ATM cell
generation
and analysis
UKN
ATM layer
ATM layer interfacesUNI, NNI.●
Number of foreground1.●
virtual channels (VCs)
Foreground VC bandwidth2.048 Mb/s: 100 to 4,528 cells per second in steps of 1 cell/s;●
Foreground VC distributionConstant: Single cell is transmitted at regular intervals determined by the cell rate●
Error add (foreground VC)Payload bit errors; 1 in 103 or single error.●
Number of background VCsUp to 3.●
Background VC densityIndividually set from 0 to maximum in 1% steps after foreground allocation.●
Background VC distributionConstant (for constant bit rate service).●
Background VC payloadUser-defined byte repeated to fill cell payload (individually set per background VC).●
VC priorityForeground VC has top priortity; background VCs have approximately equal priority.●
Fill cellsIdle or unassigned. All bytes of the payload are set to 6AH.●
34.368 Mb/s: 100 to 80,000 cells per second in steps of 1 cell/s;
139.264 Mb/s: 100 to 326,037 cells per second in steps of 1 cell/s;
155.52 Mb/s:‡ 100 to 353,207 cells per second in steps of 1 cell/s‡.
(cells/s = 100 to max). Also allows a single burst of consecutive cells from
1 to 2048 in steps of 1 cell.
Burst: User-specified burst of up to 2047 consecutive cells added.
Single cell PRBS (29 − 1);
User-defined byte repeated to fill cell payload (48 bytes);
Test cell (to draft ITU-T O.191).
PDH physical layerAs for PDH physical alarm indication above, plus power loss.●
alarm seconds‡
2.048 Mb/s:6 dB;
34.368, 139.264 Mb/s: 12 dB.
34.368, 139.264 Mb/s: 20 or 26 dB.
CRC4, REBE: 2 Mb/s only, CRC on only.
unavailability seconds (UAS), error second ratio (ESR), severely errored second
ratio (SESR), background block error ratio (BBE) for EM BIP-8 and FEBE (PDH)‡.
‡ For 155.52 Mb/s you require an STM-1 test option (option A1T or A3R).
54
ATM
ATM cell test options – ETSI only (continued)ATM cell
generation
and analysis
UKN
ATM layer
ATM layer interfacesUNI, NNI.●
Cell stream selected forAll user cells, by VP, by VC, idle, unassigned,●
test (cell filter)expert mode (all bits selectable).
Measurement modesIn-service and out-of-service.●
PayloadCross cell PRBS, single cell PRBS, user byte, test cell (to draft ITU-T O.191).●
Test cell synchronizationSynchronization loss when seven consecutive errored cells are received;●
Synchronization gain when six consecutive error-free cells are received.
cell misinsertion, cell errors, bit errors, gated mean cell transfer delay,
min cell transfer delay, peak-to-peak 2-point CDV, max 1-point CDV
(to ITU-T I.356). Non-conforming cell count.
test cell loss, payload pattern loss; see below for OAM alarms.
results for cell loss, cell misinsertion and BEDC BIP-16 errors.
VC-AIS, VC-FERF/VC-RDI, VC-LOC (all to ITU-T I.610), PM-OAM loss.
Alarm seconds: As for alarm indication above.●
Thru mode
Thru mode is provided to allow ATM measurements of live traffic when●
no protected monitor point is available. This mode is available at all rates.
55
ATM
HP OmniBER 717 analyzer only
Option UKZ (ITU-T/ANSI)
Pair of modules providing ATM cell generation
and analysis at interface rates of 1.544 (DS1),
Rate1.544, 2.048, 34.368, 44.736 and 155.52 Mb/s‡.●
Frequency offset generation‡ 1.544, 2.048, 34.368 and 44.736 Mb/s: up to ± 100 ppm in 1 ppm steps.●
Clock timing‡Internal: All rates; recovered by the receiver.●
Clock outputSelected transmitter clock (internal or looped receiver clock)●
Line codingDS1: B8ZS.●
Output levelDS1: DSX-1, DS1-LO.●
FramingDS1: ESF to ANSI T1.403-1989, Bellcore TR-TSY-000499 and ITU-T G.704;●
(BNC connector, externally terminated to 50 ohm to ground).
DS3: B3ZS.
E1: AMI, HDB3.
E3: HDB3.
DS3: DS3-HI, DSX-3.
the ESF data link (DL) defaults to repetition of idle code (01111110);
DS3: C-bit parity to ANSI T1.107a-1990.
E1: To ITU-T G.804/G.704.
E3: To ITU-T G.832; error monitoring (EM) contains correct BIP-8;
trail trace (TR) is user-definable (ITU-T E.164 format); maintenance
adaptation (MA) is set to 011 (hexadecimal); network operator (NR) and
general communications (GC) are set to all zeros.
OC-3c to ANSI T1.105-1991 and TR-TSY-000253‡.
STM-1 to ITU-T G.707‡.
‡ For 155.52 Mb/s you require test option A1T.
56
ATM
ATM cell test options – ITU-T/ANSI (continued)ATM cell
generation
and analysis
UKZ
Transmission convergenceDS1: To ANSI T1E1.2/95-003 and ITU-T G.804; cell scrambling selectable.●
Error addDS1: FAS, BPV/code (rates: single or 103 to 107); CRC-6 (rates: single or 104 to 107);●
Alarm generationDS1: Loss of signal (LOS); loss of frame (LOF); alarm indication signal (AIS);●
DS3 (direct): To ANSI T1E1.2/95-003 and ITU-T G.804; cell scrambling selectable.
DS3 (PLCP): To ANSI T1E1.2/95-003 (Annex A) and ITU-T G.804; cell scrambling
is selectable; growth bytes Z1 to Z6 default to 0 but are user alterable; link signal
status (LSS) defaults to '000' but is alterable; F1, M1 and M2 are set to '11111111';
cycle/stuff counter (C1) can be set to three fixed patterns:
13 14 13 13 14 13 (minimum rate adaption);
13 14 13 13 14 14 (nominal rate adaption);
13 14 14 13 14 14 (maximum rate adaption);
E1: To ITU-T G.804/G.704 (CRC4 on/off); cell scrambling is selectable.
E3: To ITU-T G.804/G.832; cell scrambling is selectable.
STS-3c‡: To Bellcore TR-TSY-000253 and ITU-T G.708/709; cell scrambling is selectable.
STM-1‡: To ITU-T G.708/709; cell scrambling is selectable.
also, single burst of 1 to 6 consecutive FAS errors; EXZ (excess zeros): single burst
of 3 to 16 uncoded zeros sent.
DS3: BPV/code, FAS, MFAS, (rates: single or 103 to 107); parity (P bits), CP (path parity),
FEBE (rates: single or 104 to 107); also, single burst of 1 to 4 consecutive
FAS or MFAS errors; EXZ (excess zeros): single burst of 3 to 16 uncoded zeros sent.
DS3 PLCP: B1 (error mask; rates: single or 103 to 107), FEBE (values: 1 to 15 sent in first
4 bits of G1 byte; rates: single or 103 to 107),
C1 (error mask and frame phase selection, single error); frame (1 to 6 pairs of
A1A2 bytes can be errored with 16-bit mask).
E1: FAS, BPV/code (rates: single or 103 through 107); CRC-4, REBE (rates: single
or 104 through 107); single burst of 1 to 4 FAS errors.
E3: BPV/code (rates: single or 103 to 107); BIP (rates: single or 104 to 107);
OC-3c and STM-1: As per test option A1T‡.
Single HEC or double HEC; 1 in 103 or single error; HEC error sequences.
remote alarm indication (RAI).
DS3: LOS; LOF; AIS; RAI; far end alarm and control (FEAC): As per T1.107-1995.
DS3 PLCP: RAI.
E1: LOF, AIS, RAI.
E3: LOF, AIS, far end receive failure (FERF).
OC-3c/STM-1: As per test option A1T‡.
ATM layer
ATM layer interfacesUNI, NNI.●
Number of foreground1.●
virtual channels (VCs)
Foreground VC bandwidthDS1: 100 to 3623 cells/s in steps of 1 cell/s.●
DS3 (direct): 100 to 104,268 cells/s in steps of 1 cell/s.
DS3 (PLCP): 100 to 96,000 cells/s in steps of 1 cell/s.
E1: 100 to 4,528 cells/s in steps of 1 cell/s.
E3: 100 to 80,000 cells/s in steps of 1 cell/s.
OC-3c/STM-1: 100 to 353,207 cells/s in steps of 1 cell/s‡.
Foreground VC distributionConstant: Single cell is transmitted at regular intervals determined●
by the cell rate (cells/s = 100 to max). Also allows a single burst of
consecutive cells from 1 to 2047 in steps of 1 cell.
Burst: User-specified burst of up to 2047 consecutive cells added.
Single cell PRBS (29 − 1);
User-defined byte repeated to fill cell payload (48 bytes);
Test cell (to draft ITU-T O.191).
‡ For 155.52 Mb/s you require test option A1T.
57
ATM
ATM cell test options – ITU-T/ANSI (continued)ATM cell
generation
and analysis
UKZ
Number of background VCsUp to 3 (see option 0YK).●
Background VC densityIndividually set from 0 to maximum in 1% steps after foreground allocation.●
Background VC distributionConstant (for constant bit rate service).●
Background VC payloadUser-defined byte repeated to fill cell payload (individually set per background VC).●
Error addPayload bit errors; 1 in 103 or single error.●
VC priorityForeground VC has top priortity; background VCs have approximately equal priority.●
Fill cellsIdle or unassigned. All bytes of the payload are set to 6AH.●
ATM alarm generationVP-FERF/VP-RDI, VP-AIS, VC-FERF/VC-RDI, VC-AIS (all end-to-end).●
Continuity checkVP-CC, VC-CC.●
ATM receiver
Physical layer
Type, connectors, rates,As for ATM transmitter.●
line code and framing
Jitter toleranceTo Bellcore TR-TSY-000009 (DS1/DS3) and ITU-T O.171.●
Operating level (terminate)User selectable as follows:●
DS1 (balanced): DSX-1 to DS1-LO levels.
DS3 (unbalanced): Automatic equalization for 0 to 900 ft
encompassing DS3-HI, DSX-3 and DS3-900 levels.
E1 (balanced): 3.0 V ± 20% for cable lengths as per ITU-T G.703.
E1 (unbalanced): 2.37 V ± 20% for cable lengths as per ITU-T G.703.
E3 (unbalanced): 1.0 V ± 20% with automatic equalization for cable lengths
as per ITU-T G.703.
OC-3c/STM-1: As per test option A1T‡.
Monitor point compensation DS1 (balanced), E1 (balanced and unbalanced): 20, 26 or 30 dB gain relative●
to terminate mode. E1 (balanced) is restricted to half cable length with respect
to ITU-T G.703 for 26 and 30 dB gains.
DS3 and E3: 20 or 26 dB gain relative to terminate mode.
OC-3c/STS-3c/STM-1: As per test option A1T‡.
seconds (SES), unavailability seconds (UAS), error second ratio (ESR),
severely errored second ratio (SESR), background block error ratio (BBER),
path unavailable seconds (PUAS).
DS1: CRC6.
DS3: C-bit and FEBE.
E1: CRC4 and REBE.
E3: EM BIP-8 and FEBE.
OC-3c/STM-1: As per test option A1T‡.
PDH physical layerDS1: LOS, LOF, AIS, FERF/RDI, excess zeros.●
alarm indicationDS3: LOS, LOF, AIS, FERF/RDI, loss of multiframe.
DS3 PLCP: Loss of PLCP frame, RAI (yellow).
E1: LOS, LOF, AIS, FERF/RDI, loss of CRC multiframe.
E3: LOS, LOF, AIS, FERF/RDI.
OC-3c/STM-1: As per test option A1T‡.
PDH physical layerAs for PDH physical alarm indication above, plus power loss, except for FEAC●
alarm seconds‡and link signal status (LSS), which are treated as messages, as is trail trace for E3.
‡ For 155.52 Mb/s you require test option A1T.
58
ATM
ATM cell test options – ITU-T/ANSI (continued)ATM cell
generation
and analysis
UKZ
ATM layer
ATM layer interfacesUNI, NNI.●
Cell stream selected forAll user cells, by VP, by VC, idle, unassigned,●
test (cell filter)expert mode (all bits selectable).
Measurement modesIn-service and out-of-service.●
PayloadCross cell PRBS, single cell PRBS, user byte, test cell (to draft ITU-T O.191).●
Test cell synchronizationSynchronization loss when seven consecutive errored cells are received;●
Synchronization gain when six consecutive error-free cells are received.
cell misinsertion, cell errors, bit errors, gated mean cell transfer delay,
min cell transfer delay, peak-to-peak 2-point CDV, max 1-point CDV (to ITU-T I.356),
non-conforming cell count.
test cell loss, payload pattern loss; see below for OAM alarms.
Results for cell loss, cell misinsertion and BEDC BIP-16 errors.
VC-AIS, VC-FERF/VC-RDI, VC-LOC (all to ITU-T I.610), PM-OAM loss.
Alarm seconds: As for alarm indication above.
Thru modeThis mode is provided to facilitate testing where protected monitoring points●
are not available. A DS1, DS3, E1 or E3 signal received in the companion
receiver module can be retransmitted unchanged from the transmitter module.
The digital content of the signal at all levels is maintained. There is a fixed delay
from receiver input to transmitter output.
Number of background VCsUp to 9.●●
Background VC densityIndividually set from 0 to maximum in 1 cell/s steps after foreground allocation.●●
Background VC distributionConstant, burst, random, as for the foreground channel.●●
Backgound VC payloadUser-defined byte repeated to fill cell payloads (individually set per background).●●
VC priorityForeground VC has top priortity; background VCs have approximately equal priority. ●●
generation capability of the ATM cell layer modules (options UKN or UKZ)
is replaced by that described here. Other features of the ATM cell layer modules
apply except where otherwise stated.
Sets 1 foreground and up to 9 background virtual channels independently.
by the cell rate (cells/s = 1 to max).
Burst: User-specified burst of cells, from 1 to 4096 in steps of 1 cell;
cell rate during burst can be varied (cells/s = 1 to max).
Burst intervals are determined by the cell rate.
Random: Poisson distribution of cells (mean cell rate: cells/s = 1 to max).
Single cell PRBS (29 − 1);
User-defined byte repeated to fill cell payload (48 bytes);
Test cell (to draft ITU-T O.191);
Stored cell streams: One of five pre-defined cell streams, provided
for training purposes.
Cell contention buffering: Up to 2048 background cells awaiting a cell slot.
60
ATM
ATM services test options (continued)0YKUSL
Receiver
Physical layerRefer to ATM cell layer option (UKN or UKZ) for details.●●
Channel View●●
Finds and displays up to 1023 VCs on a link; specialized hardware
is used to detect even single cell events. Calculates and graphically displays mean
cell traffic load of each VPI or VPI/VCI. User-defined VPI mask. Easy user selection
from link activity graph of the path/channel for detailed analysis. Found channels
are scanned sequentially to identify the payload and ATM alarm condition (if any).
Cell stream identificationCell stream types: All VPs, all VCs.●●
DisplayDisplay modes: Cell count, cells/sec, % of possible max traffic.●●
ATM payloads identifiedAAL-1, AAL-3/4, AAL-5, test cell, unknown, VP-CC, VC-CC, no cells;●●
VCs identifiable: 1023 maximum.
Capture range: Entire VPI/VCI range, include user-specified VP
exclude user-specified VP
exclude single user-specified VP.
Display type: Histogram showing traffic level.
Maximum number of VP/VCs displayed: 27 simultaneously (page up/down for others).
Display sorting: Hierarchically by VPI/VCI or by order of occurence.
Resolution of cell rate: 1 cell/s.
Resolution of cell count: Displayed as 8 digit integer then x.xx E+xx.
Resolution of % possible max traffic: xxx.xx%.
where cells are found in VCI < 32, the payload is described by the
expected content, as specified in ITU-T I.610.
congestion experienced.
min
to VP
, include single user- specified VP,
max
min
to VP
max
,
VP/VC rate history●●
Displays the variation of maximum, mean and minimum cell rates of the cell
stream selected for test. Results are displayed graphically against real time.
Measurement period1 second to 1 hour (represented by one histogram bin).●●
Number of periods1000 maximum.●●
Cell delay variation●●
Graphical display of the 1-point CDV and 2-point CDV measurements described
in the ATM cell layer specification. Refer to ATM cell layer option. Provides a
multi-point bar graph of the delay distribution. Numerical values of CDV are also
available (see ATM cell layer option specification).
Measurement detailsRefer to ATM cell layer option.●●
Cell time-deviation unitsMicroseconds.●●
Delay display rangeAutoranged, linear.●●
No of distribution32 maximum.●●
AAL regain criterion: Receipt of the first PDU without error.
EthernetEthernet MAC standard: IEEE Std 802.3; Ethernet “DIX” standard.–●
Networking protocolsIP.–●
LAN measurementPing origination: Single ping packet manually initiated.–●
and generationContinuous ping rate: Off, 1 to 10 per second.
LAN measurement analysisVerification of ping received: Response time for ping, ping packet return count,–●
Ping historyDisplays the variation of maximum, mean and minimum ping response delays–●
Physical network address: 48 bit address.
Physical connectors: Standard Ethernet AUI (15-pin D-submin) for
attachment of multistation access unit (MAU) (not supplied) allowing access to
10Base-5 (ThickLAN), 10Base-2 (ThinLAN) etc.
RJ-45 for direct connection of Ethernet 10Base-T unshielded twisted
pair (EtherTwist).
End-to-end packet load:
Packet load length mix: All packets min length; all packets max length;
20% min/80% max length packets; 80% min/20% max length packets.
Packet load level: Rate variable from 1 to 5000 (where appropriate) packets/sec.
File transfer simulation (bulk transfer): Approx length 1 Mbyte.
ping packet loss count.
Verification of file transfer.
over extended time. Results are displayed graphically against real time.
Measurement period: 1 second to 1 hour (represented by one histogram bin).
Number of measurement periods: 1000 maximum.
62
STM-1e ATM test and interfacing
ATM
Option A1T – HP OmniBER 717 only
STM-1e (155 Mb/s) electrical interface:
STM-1 overhead access, thru mode and pointer
sequence generation, TU-12, TU-2 and VC-4
mappings plus frequency offset generation, alarm
and error generation/detection. Only for use with
options 0YK/USL/UKZ
Option A1T
STM-1e ATM test and interfacing optionsSTM-1 overhead
This module can work alone. Also work with STM-1 optical module (option UH1)
and STM-1 and STM-4 optical modules (eg, options UH2, URU, USN, UKT).A1T
OUT and IN ports (used for transmit and receive)
TypeElectrical: To ITU-T G.703.●
ConnectorsBNC, 75 ohm, unbalanced.●
Frequency offsetUp to ± 999 ppm in 0.1 ppm steps.●
generation
Error addition●
Recovered: From SDH input.●
Ext MTS: Data or clock format (as ITU-T G.811).●
-
Error typeSingleRate 10
Frame A1A2●N in four frame words
B1●4 to 9
B2†●3 to 9
AU-4 path BIP-8 (B3)●4 to 9
AU-4 path FEBE●4 to 9
TU-3 path BIP-8 (B3)●3 to 9
TU-3 path FEBE●3 to 9
TU-12 path BIP (V5)●3 to 9
TU-12 path FEBE●4 to 9
Bit error●3 to 9
N
Comments
and stress testing
† MSP threshold N in T where 0 ≤ N ≤ 1920 (STM-1) and 10 ms ≤ T ≤ 10000 s, in decade steps.
-
Error typeSingleRate 10
MS FEBE●3 to 9
AU-4 path IEC●4 to 9
TU-2 path BIP (V5)●4 to 9
TU-2 path FEBE●5 to 9
N
Comments●
63
ATM
STM-1e ATM test and interfacing options (continued)STM-1 overhead
and stress testing
A1T
Payload capability
Payload mappings139.264 Mb/s: Mapped into VC-4 to ITU-T G.707.●
Payload dataThe following unframed patterns can be generated:
Payload framing139.264, 34.368 and 2.048 Mb/s: Unframed.●
Drop/insert139.264 and 34.368 Mb/s: Data may be inserted and dropped via●
Pointer adjustment generation
Increment/decrement/Provides a burst, selectable between 1 and 10 pointer●
alternatingadjustments (between 1 and 5 for TU-12 and TU-2 pointer).
New pointer valueThe AU-4, TU-3, TU-12 or TU-2 moves to a selectable new●
Frequency offsetPointer sequences are generated by offsetting the●
ITU-T G.783 sequences Bursts of periodic single adjustments with added or canceled●
34.368 Mb/s: Mapped into VC-3 to ITU-T G.707.●
2.048 Mb/s (asynchronous): Mapped into VC-12 to ITU-T G.707.●
2.048 Mb/s (floating byte synchronous): Mapped into VC-12●
to ITU-T G.707.
VC-2: Bulk loaded and mapped into TU-2 and TU-2-Nc●
(for N = 2 to 6) to ITU-T G.707.
(Framed and structured signals are available in
conjunction with the PDH option UKJ/UKN).
PRBS (to ITU-T O.151): 215 − 1 and 223 − 1.●
Word: User-defined 16-bit word, all ones, all zeros,●
1010, 1000.
PRBS (to ITU-T O.151): 29 − 1 and 211 − 1.●
139.264, 34.368 and 2.048 Mb/s: Framed and structured signals●
are available in conjunction with the PDH option UKJ/UKN.
TU-2: Unframed.●
the Tx/Rx ports on the structured PDH option UKJ/UKN.
2.048 Mb/s: Data may be inserted and dropped via the 2 Mb/s●
drop/insert ports on the structured PDH option UKJ/UKN.
location in a single jump, with or without an accompanying
new data flag (NDF).
frequencies of the AU-4 (in this mode the 87:3 sequence is
generated to ITU-T G.783) or TU-3, TU-12, TU-2 and the line
rate relative to each other.
Range: ± 100 ppm in 0.1 ppm steps.
adjustments. Polarity is selectable.
Bursts of periodic double adjustments with pairs alternating
in polarity.
In all cases the interval between adjustments or pairs of
adjustments is programmable.
Transmit overhead
OverheadStandard overhead values to ITU-T G.707.●
User-programmableRSOH: A1, A2, C1, E1, F1, D1 to D3.●
bytes
MSOH: K1, K2, D4 to D12, S1, M1, Z1, Z2, E2●
(and access to bytes reserved for national use plus all unmarked
bytes reserved for future international standardization).
The sequence can contain up to five different values each
being transmitted for up to 64,000 frames.
channel is selected and a BER measurement is performed
using a 29 − 1 PRBS inserted into a 64 kb/s channel.
Single errors can be added to the test pattern.
the regenerator section or multiplexer section data
communications channel. Similarly, data can be dropped
from either channel. The data may be dropped/inserted
MSB or LSB first. The data rate for access is: 192 kb/s (RSOH DCC),
156 kb/s (MSOH DCC).
Alternatively the ITU-T G.958 CID (consecutive identical digits)
test can be selected.
STM-1 thru mode
TransparentThe signal is passed through the instrument without being●
thru modealtered for monitoring purposes where no protected
Overhead overwriteIn addition to the above, the test features associated with the●
thru modeSOH and POH can be enabled to control one single- or
AU-4 overwriteIn addition to both of the above, overwrite the complete AU-4●
thru modewith the internally generated payload. This enables the SOH
monitor point is available.
multi-byte overhead channel (ie, errors and alarms, optical
stress test, overhead sequences, MSP messages, DCC insert,
overhead BER. Full Rx functionality also available).
to be looped through while a new payload is inserted.
All of the test features which affect the VC-4 and/or the
POH are enabled (ie, errors and alarms, adjust pointer,
overhead sequences, MSP messages, overhead BER.
Full Rx functionality also available).
STM-1 receiver functions
EqualizationAutomatic for cable loss up to 12 dB at half the bit rate.●
Monitor pointMonitor mode conforms to ITU-T G.772.●
compensationMonitor gain.20 or 26 dB
Error resultsB1, B2, AU-4 path BIP-8 (B3), AU-4 path FEBE,●
Error analysisTo ITU-T G.826 (G.821 and M.2100/2110/2120 for PDH payload).●
STM-1e ATM test and interfacing options (continued)STM-1 overhead
and stress testing
A1T
Pointer resultsAU pointer value, AU NDF seconds, AU missing NDF seconds,●
Alarm indicationLOS, LOF, OOF, LOP (AU-4, TU-3, TU-12), MS AIS, MS FERF,●
Alarm secondsAs for alarm indication, plus power loss, NDF and missing NDF,●
FrequencyFrequency displayed in Hz, 1 Hz resolution.●
measurementOffset displayed in ppm and Hz.
Received overheadSOH and POH of a received STM-1 signal.●
snapshotText message displayed for signal label (C2 and V5) and sync
Overhead sequenceAny one overhead channel is selected. After a manual or programmed●
capturetrigger, the captured byte values are displayed together with the
AU-4 pointerA graphical display that shows the variation with time of the●
location graphpointer location. Up to four days of pointer location
Overhead BERAny RSOH, MSOH or POH (except A1, A2, H1, H2, Z1, Z2)●
measurementchannel is selected and a BER measurement is performed
AU +ve adjustment count seconds, AU −ve adjustment
count/seconds, implied VC-4 offset, TU pointer value,
TU NDF seconds, TU missing NDF seconds, TU +ve adjustment
count/seconds, TU −ve adjustment count/seconds.
path AIS (AU-4), path FERF (AU-4), TU path AIS (TU-3, TU-12),
TU path FERF (TU-3, TU-12), pattern sync loss, clock loss
and errors (any type).
LOP (TU-2), K1/K2 change, H4 multiframe sync,●
TU path AIS (TU-2), TU path FERF (TU-2).
and except clock loss.
status (S1) decoded.
number of consecutive frames containing the value.
activity can be monitored.
Implied VC offset: The total positive and negative pointer
movements since the start of the measurement period are summed
and the implied mean VC offset calculated from this total.
using a 29 − 1 PRBS inserted into a 64 kb/s channel. Single errors can
be added to the test pattern. Error count, error ratio, error free seconds,
% error free seconds and pattern loss seconds are measured.
66
STM-1 optical interfacing
ATM
Option UH1
STM-1 (1310 nm) optical
interfacing. Also provides
STM-1
LASER
ON
OUT
CLASS 1 LASER PRODUCT
IN
Option UH1
OC-3 optical interfacing when
used in conjunction with dual
standard SONET/SDH
option 120.
STM-1 optical interfacing optionsSTM-1
Requires option A1T, A3R or 120 to be fitted.
OUT and IN ports (used for transmit and receive)
TypeOptical.●
ConnectorsCustomer exchangeable optical adaptors allow a range of interfaces to be attached.
RateSTM-1 (155.52 Mb/s).●
Line codeNRZ.●
Protected monitor150 mV to 1000 mVp-p (nominal): ac coupled, nominal 50 ohm.●●
point input level
Optical power measurement Accuracy: ± 1 dB .●●
Range: −8 to −30 dBm.
23
− 1. To ITU-T G.957.
−10
.−8 dBm−8 dBm
Transmitter functions
Clock timingInternal.●●
Frequency offset generation Up to ± 999 ppm in 0.1 ppm steps.●●
STM-4 error addition
Recovered:
From received STM-1 or STM-4 optical signal.●●
From received STM-1 electrical signal.●●
Ext MTS: Data or clock format (as ITU-T G.811).●●
-
Error typeSingleRate 10
N
Comments●●
−10
.
Frame A1A2●N in four frame words
B2 %●N = 4 to 9●●
% MSP threshold, N in T where 0 ≤ N ≤ 1920 and 10 ms ≤ T ≤ 10000 s, in decade steps.
Note: STM-4 error addition capability is only available with STM-1 test
options A1T or A3R.
STM-1 error additionOne STM-1 is selected for test. STM-1 error add capability is provided●●
STM-4 alarm generationLOS, LOF, MS AIS, MS FERF.●●
STM-1 alarm generationOne STM-1 is selected for test. For STM-1 alarm generation capability●●
Payload capabilityOne STM-1 is selected for test. The payload data capability of the STM-1●●
Pointer adjustmentOne STM-1 is selected for test. The pointer adjustment generation●●
generationcapability of the STM-1 under test is defined by the STM-1 test option.
* MLM receivers work with both MLM (multi mode) and SLM (single mode) transmitters.
for the STM-1 under test. Refer to STM-1 test options A1T or A3R for details.
of the STM-1 under test, refer to STM-1 test options A1T or A3R for details.
under test is defined by the STM-1 test option. Refer to STM-1 test options
A1T or A3R for details. Background STM-1 contains 00010001 in all
payload bytes.
Refer to STM-1 test options A1T or A3R for details.
69
ATM
STM-4 and STM-1 test and interfacing options (continued)USNUKT
(1310 and (1310 nm)
1550 nm)
Transmit overhead
OverheadStandard overhead values to ITU-T G.707.●●
STM-4RSOH: A1, A2, C1, E1, F1, D1 to D3.●●
user-programmableMSOH: SS bits, K1, K2, D4 to D12, S1, Z2 (column 4);
bytesZ1, Z2 for STM-1 under test;
STM-1The user-programmable STM-1 overhead capability is defined by the●●
user-programmableSTM-1 test option. Refer to STM-1 test options A1T or A3R for details.
bytes
Path overheadThe user-programmable path overhead capability is defined by the●●
user-programmable bytesSTM-1 test option. Refer to STM-1 test options A1T or A3R for details.
Overhead sequenceA single- or multi-byte overhead channel is over-written with a single or●●
generationrepeated sequence of programmed values. The sequence can contain up to
Overhead BER testAny overhead channel detailed above, for overhead sequences (except Z1 and Z2) ●●
MSP messageMessages are displayed in text form as per ITU-T G.783 for linear●●
generationarchitecture and to ITU-T G.841 for ring architectures (MSP-ring).
DCC drop/insertThe DCC drop/insert capability is defined by the STM-1 test option.●●
STM-4 thru modeThe signal is passed through the instrument without being altered for●●
M1 when STM-1 number 3 selected for test.
STM-4 user-programmable bytes are only available with STM-1 test
options A1T or A3R.
five different values each being transmitted for up to 64,000 frames.
RSOH: D1 to D3 (3-byte channel); E1, F1; C1 for STM-1 under test.
MSOH: D4 to D12 (9-byte channel); K1 to K2 (2-byte channel); S1, E2;
Z1, Z2 for STM-1 under test; M1 for STM-1 number 3 under test.
High order POH: J1, C2, G1, F2, H4, Z3, Z4, Z5.
can have a 29 − 1 PRBS inserted into a 64 kb/s channel. Single errors can be added
to the test pattern and a BER measurement performed.
User programmed sequences (K1K2).●●
Refer to STM-1 test options A1T or A3R for details.
monitoring purposes where no protected monitor point is available.
Receiver functions
STM-4 error resultsB1, B2.●●
STM-1 error resultsOne STM-1 is selected for test. The errors detected in the payload of the●●
STM-1 under test are defined by the STM-1 test option. Refer to STM-1
test options A1T or A3R for details.
Error analysisRefer to STM-1 test options A1T or A3R for details.●●
Pointer resultsRefer to STM-1 test options A1T or A3R for details.●●
Alarm indicationLOS, LOF, OOF, LOP (refer to STM-1 test option A1T or A3R for details),●●
MS AIS, MS FERF, K1/K2 change, clock loss.
One STM-1 is selected for test. The alarm detection capability in the●●
payload of the STM-1 under test are defined by the STM-1 test option.
Refer to STM-1 test options A1T or A3R for details.
Alarm secondsAs for alarm indication, plus power loss, NDF and missing NDF,●●
and except clock loss.
70
ATM
STM-4 and STM-1 test and interfacing options (continued)USNUKT
(1310 and (1310 nm)
1550 nm)
Received overhead snapshot SOH and POH from STM-1 number 1, or from STM-1 under test can be displayed. ●●
Overhead sequence captureA single- or multi-byte overhead channel can be selected to be monitored.●●
Pointer location graphA graphical display that shows the variation with time of the AU-n●●
Overhead BER measurement Any RSOH, MSOH or POH channel detailed above (for overhead sequences●●
Refer to STM-1 test options A1T or A3R for details.
After a manual or programmed trigger, the captured byte values are
displayed together with the number of consecutive frames containing
the value.
RSOH: A1, A2 (6-byte channel) for STM-1 under test;
E1, F1;
C1 for STM-1 under test;
D1 to D3 (3-byte channel);
MSOH: H1 to H2 (2-byte channel) for STM-1 under test;
K1 to K2 (2-byte channel);
D4 to D12 (9-byte channel);
S1, E2, Z1, Z2 for STM-1 under test;
M1 for STM-1 number 3 under test;
High order POH: J1, C2, G1, F2, H4, Z3, Z4, Z5.
and TU-n pointer location. Refer to STM-1 test options A1T or A3R for details.
capture) can be selected and a BER measurement performed using a
29 − 1 PRBS inserted into a 64 kb/s channel. Single errors can be added to the test
pattern. Error count, error ratio, error free seconds and % error free seconds,
pattern loss seconds are measured.
71
STM-4, STM-1 and STM-0 binary interfaces
Option 0YH
STM-4, STM-1 and STM-0 binary
interfaces provide all capability of
options 130/131.
NB: Must be ordered with option
130/131.
Option 0YH
STM-4, STM-1 and STM-4 binary interfacesSDH binary
Requires an STM-4, STM-1 and STM-0 test and interfacing option (130 or 131) to be fitted.0YH
Out and in ports (used for transmit and receive)#
TypeElectrical.●
ConnectorsSMA, Tx clock and data, Rx clock and data.●
LevelECL: 50 ohm to −2 V.●
RatesSTM-0, STM-1, STM-4.●
Binary transmitter
Clock rate51.84, 155.52, 622.08 MHz.●
Clock polarityPositive or inverted.●
Clock waveformNominal squarewave.●
Clock duty cycle50% nominal.●
Data rate51.84, 155.52, 622.08 Mb/s.●
Data polarityPositive or inverted.●
binary interfacing and multiple outputs
Clock to data timing STM-0, STM-1 clock edge nominally 800 ps prior to center of data output.●
STM-4 clock edge nominally centered on data output.●
Binary receiver
Clock rate51.84, 155.52, 622.08 MHz.●
Clock polarityPositive or inverted.●
Clock waveformNominal squarewave.●
Clock duty cycle50% ± 10% nominal.●
Data rate51.84 Mb/s nominal, 155.52 Mb/s nominal, 622.08 Mb/s nominal.●
Data polarityPositive or inverted.●
Date setup and600 ps min.●
hold time
* STM-0, STM-1 and STM-4 thru mode is not available when using the binary interfaces to transmit or receive an
STM-0, STM-1 or STM-4 binary signal.
# Jitter generation is available on SDH NRZ interfaces when used in conjunction with jitter generation modules A3K/140.
Jitter measurement is not available on SDH NRZ interfaces.
72
PDH binary interfaces
Option UH3
Single module providing binary interfaces
and external clock input for the PDH test
options UKK, UKJ, UKN and 110.
Option UH3
PDH binary interfacesPDH binary interfaces
Requires a PDH test option UKK, UKJ, UKN or 110 to be fitted.UH3
Transmitter
Binary data output
Data rates700 kb/s to 50 Mb/s (TTL);●
FormatNRZ.●
ConnectorBNC.●
Source impedanceSelectable, nominal TTL into 75 ohm to ground, or nominal ECL into 75 ohm to −2 V.●
PolaritySelectable, normal or inverted.●
Return loss> 15 dB, 500 kHz to 100 MHz (TTL), typical.●
Protection± 5 V maximum input voltage.●
700 kb/s to 170 Mb/s (ECL).
PDH test option dependent. See "Related information" on page 75.
binary interfacing and multiple outputs
Binary clock output
Clock rates700 kb/s to 50 Mb/s (TTL);●
FormatNominal squarewave, 60/40 to 40/60 duty cycle.●
ConnectorBNC.●
Source impedanceSelectable, nominal TTL into 75 ohm to ground or nominal ECL into 75 ohms to −2 V.●
PolaritySelectable, normal or inverted.●
Return loss> 10 dB, 500 kHz to 100 MHz (TTL), typical.●
Protection± 5 V maximum input voltage.●
700 kb/s to 170 Mb/s (ECL).
PDH test option dependent. See "Related information" on page 75.
73
PDH binary interfacesPDH binary interfaces
UH3
External binary
clock input
Clock rates700 kb/s to 50 Mb/s (TTL);●
Logic threshold1.5 V (TTL), −1.3 V (ECL), ground (0 V), signal mean level.●
TerminationSelectable, nominal TTL into 75 ohm to ground, or nominal ECL into 75 ohm to −2 V.●
FormatNominal squarewave, 60/40 to 40/60 duty cycle.●
ConnectorBNC.●
PolaritySelectable, normal or inverted.●
Return loss> 15 dB, 500 kHz to 200 MHz (TTL), typical.●
Protection± 5 V maximum input voltage.●
700 kb/s to 170 Mb/s (ECL).
Clocks the transmitter instead of internal clock source.
Coded interfaces can be clocked at the fixed telecom rates.
See "related information" on page 75.
Receiver
Binary data input
Data rates700 kb/s to 50 Mb/s (TTL);●
Logic threshold1.5 V (TTL), −1.3 V (ECL), ground (0 V).●
TerminationSelectable, nominal TTL into 75 ohm to ground, or nominal ECL into 75 ohm to −2 V.●
FormatNRZ.●
ConnectorBNC.●
PolaritySelectable, normal or inverted.●
Return loss> 15 dB, 500 kHz to 200 MHz (TTL), typical.●
Protection± 5 V maximum input voltage.●
700 kb/s to 170 Mb/s (ECL).
PDH test option dependent. See "Related information" on page 75.
Binary clock input
Clock rates700 kb/s to 50 Mb/s (TTL);●
binary interfacing and multiple outputs
Logic threshold1.5 V (TTL), −1.3 V (ECL), ground (0 V), signal mean level.●
TerminationSelectable, nominal TTL into 75 ohm to ground, or nominal ECL into 75 ohm to −2 V.●
FormatNominal squarewave, 60/40 to 40/60 duty cycle.●
ConnectorBNC.●
PolaritySelectable, normal or inverted.●
Return loss> 15 dB, 500 kHz to 200 MHz (TTL), typical.●
Protection± 5 V maximum input voltage.●
700 kb/s to 170 Mb/s (ECL).
PDH test option dependent. See "Related information" on page 75.
74
PDH binary interfacesPDH binary interface
UH3
Related information
Interworking betweenBinary outputsInternal clock*External clock†●
option UH3 and the
PDH test optionsModule
ConfigurationsSave/recall of instrument configurations to/from floppy disk drive●
general
GraphicsSave/recall of stored measurements graphics to/from floppy disk drive.●
LoggingDirection of logging output to floppy disk drive.●
PC results formatSave SMG stored results in a CSV (comma separated variable) PC compatible●
Disk managementInstrument provides the following disk drive features:●
Firmware upgradesAllows the upgrading of instrument firmware from the floppy disk drive.●
Graphics/loggingStandard
(in addition to the 5 internal stored settings).
Extends internal event based storage from 10,000 events to 310,000 events.
format for importing to PC spreadsheets etc.
Copying of instrument measurement graphics files to/from internal instrument
storage to/from floppy disk drive.
Copying of stored measurement graphics files from internal instrument
storage to floppy disk drive.
Deleting files or directories from floppy disk drive.
Renaming of files.
Labeling of floppy disks.
Formatting of floppy disks.
Max test result stores5 internal SMG stores (stored graphics and data)●
Graphic displayBar chart (results versus time periods with up to 1 second resolution)●
or printoutfor current or stored measurement period.
Storage capacity10,000 events (increases to 310,000 events with floppy disk drive).●
Bar resolution1 second or 1, 15, 60 minutes.●
Unstructured PDHBit error count, code error count, frame error count, CRC error count,●
bar graphsREBE error count and PDH alarms.
(option UKK)
ATM bar graphsReceived cells, corrected HEC, non-corrected HEC, cell loss, errored cells,●
(option UKN)misinserted cells, BEDC BIP-16, bit errors, mean cell transfer delay, min cell
binary interfacing and multiple outputs
SDH bar graphsFrame errors (A1A2), B1, B2, MS FEBE, B3, HP FEBE, HP IEC,●
(options A1T/A3R)LP BIP, LP FEBE bit errors.
Jitter bar graphsJitter hit count, plus jitter loss and jitter out-of-range alarms.●
(options UHN/A3L/
A3V/A3N)
Wander bar graphsFrame slip count and bit slip count, plus no reference and excess●
(options UHN/A3L/wander alarms.
A3V/A3N)
Printing/loggingResults, time, date and instrument control settings to internal/external●
Print/logging period10 minutes, 1 hour, 24 hours, user-defined (10 to 99 minutes, or 1 to 99 hours).●
(increases with floppy disk drive – number of stores limited
only by free disk space).
transfer delay, peak-to-peak 2-point CDV, max 1-point CDV (to ITU-T I.356).
Non-conforming cell count and PDH physical layer alarms and ATM
cell layer alarms.
HP-IB printer/remote-control interface.●●
Parallel printer interface.●●
LAN remote control interface.●–
Distributed/remote testing
HP E4540APC/laptop/MS Windows® software (Windows 3.1, Windows NT or Windows 95) which allows
distributed networkcontrol of HP 377xx PDH/SDH/ATM family of analyzers via a virtual instrument display.
analyzer (DNA) software Allows remote user to store and recall instrument configurations, create and run test sequences,
transfer test results to other Windows-based applications and provide quality-of-service
information for managers and customers.
Option 0A9: License to use up to 10 copies.
Option UAT: License to use unlimited copies.
For full details of centralized testing using the HP OMNIBER 717 analyzer and other telecom
testers from HP, please ask your local HP representative for brochure 5964-2240E
(distributed network analyzer software).
At remote siteHP OMNIBER 717
Option USS
Instrument firmwareAllows instrument to be controlled by HP E4540A distributed●
network analyzer software. Also order an RS-232-C interface.
78
GeneralStandard
Preset facilityComplete instrument configurations can be saved in non-volatile memory.●
general
Supply180 to 264, and 90 to 132 Vac;●
Dimensions (mm)190 (H) × 340 (W) × 470 (D) (× 510 (D) with lid fitted).●
Weight8 kg (unladen); 10 kg (typical).●
Internal clockAccuracy: ± 0.5 ppm.●
EnvironmentalOperating temperature.0 to +45 °C
CE markESD/Electrical fast transients/radiated susceptibility: Meets EN50082-1 (1992).●
Product safetyEN 61010-1 (1993);●
EMC compatibilityImmunity: EN 50082-1 (1992);●
Regulatory standards21 CFR CH.1 1040;●
Four independent configurations plus one factory default can be saved.
Each store has a user-programmable name (disk drive increases storage –
number of stores only limited by free disk space).
IEC 1010-1 (1990) +A1 (1992);
CSA C-22.2 No 1010.1-92.
Emmissions: EN 55011 (1991).
EN 60825-1 (1994);
Group 1, Class A;
EN 55011 (1991);
EN 50082-1 (1992).
Accessories
Optical connector-pairIf you order an SDH optical interface module or SDH optical jitter
adaptor and opticalmeasurement module, specify the connector adaptor(s) to suit your
couplerparticular equipment.
Rack mount kitHP 15770A: Rack mount kit.
Warranty3-year warranty as standard.
ManualsOption AVA: Calibration manual
Calibration certificateOption UK6: Commercial calibration certificate with test data.
HP 15772B: Hard, robust transit case.
Option OB3: Service manual.
Option OB2: One additional operating manual.
Option OBF: One additional manual for remote operation.
79
Distributed network analyzer
(DNA) features
Use HP E4540A DNA software to pin-point elusive
network faults and identify links with low
performance. The DNA software's long-term testing
and automatic results logging capability let you
easily monitor the PDH, SDH and ATM quality of
service you provide to key customers.
Monitor the network to identify performance and
signal degradation. Interactively control analyzers
for faster problem resolution.
Create and run your own customized test
sequences effectively.
Transfer results to other Windows®-based
applications and provide detailed quality-of-service
information for managers and customers.
MS Windows and Windows are US trademarks of Microsoft Corporation.
HP manufactures the HP OmniBER 717 analyzer under a quality
system approved to the international standard ISO 9001 plus TickIT
(BSI Registration Certificate No FM 10987).
Class 3a laser product
EN60825-1: 1994
Class 1 laser product
FDA 23 CER CH.1 1040.10 (1994)
For more information about Hewlett-Packard
test and measurement products, applications,
services, and for a current sales office listing,
visit our web site: http://www.hp.com/go/
tmdir. You can also contact one of the
following centers and ask for a test and
measurement sales representative.
United States:
Hewlett-Packard Company
Test and Measurement Call Center
P.O. Box 4026
Englewood, CO 80155-4026
Tel: 1 800 452 4844
Hewlett-Packard
European Marketing Centre
P. O. Box 999
1180 AZ Amstelveen
The Netherlands
Tel: (31 20) 547 9999
Japan:
Hewlett-Packard Japan Ltd.
Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi
Tokyo 192-8510, Japan
Tel: (81) 426 56-7832
Fax: (81) 426 56-7840
Latin America:
Hewlett-Packard Company
Latin American Region Headquarters
5200 Blue Lagoon Drive
9th Floor
Miami, Florida 33126
USA
Tel: (305) 267 4245/4220
Fax: (305) 267-4288
Australia/New Zealand:
Hewlett-Packard Australia Ltd.
31-41 Joseph Street
Blackburn, Victoria 3130
Australia
Tel: 1 800 629 485 (Australia)
Tel: 0 800 738 378 (New Zealand)
Fax: (61 3) 9210 5489
Asia Pacific:
Hewlett-Packard Asia Pacific Ltd.
17-21/F Shell Tower, Times Square
1 Matheson Street, Causeway Bay
Hong Kong, SAR
Tel: (852) 2599 7777
Fax: (852) 2506 9285