1
December 4, 1998 (Version 3.0)
11*
Features
• 7.5 ns pin-to-pin logic delays on all pins
•f
to 125 MHz
CNT
• 108 macrocells with 2400 usable gates
• Up to 108 user I/O pins
• 5 V in-system programmable (ISP)
- Endurance of 10,000 program/erase cycles
- Program/erase over full commercial voltage and
temperature range
• Enhanced pin-locking architecture
• Flexible 36V18 Function Block
- 90 product terms drive any or all of 18 macrocells
within Function Block
- Global and product term clocks, output enables, set
and reset signals
• Extensive IEEE Std 1149.1 boundary-scan (JTAG)
support
• Programmable power reduction mode in each
macrocell
• Slew rate control on individual outputs
• User programmable ground pin capability
• Extended pattern security features for design protection
• High-drive 24 mA outputs
• 3.3 V or 5 V I/O capability
• Advanced CMOS 5V FastFLASH technology
• Supports parallel programming of more than one
XC9500 concurrently
• Available in 84-pin PLCC, 100-pin PQFP, 100-pin TQFP
and 160-pin PQFP packages
Description
XC95108 In-System Programmable
CPLD
Product Specification
Power Management
Power dissipation can be reduced in the XC95108 by configuring macrocells to standard or low-power modes of
operation. Unused macrocells are turned off to minimize
power dissipation.
Operating current for each design can be approximated for
specific operating conditions using the following equation:
(mA) =
I
CC
(1.7) + MCLP (0.9) + MC (0.006 mA/MHz) f
MC
HP
Where:
= Macrocells in high-performance mode
MC
HP
= Macrocells in low-power mode
MC
LP
MC = Total number of macrocells used
f = Clock frequency (MHz)
Figure1 shows a typical calculation for the XC95108
device.
300
(250)
High Performance
200
(180)
(mA)
CC
Low Power
(170)
The XC95108 is a high-performance CPLD providing
advanced in-system programming and test capabilities for
Typical I
100
general purpose logic integration. It is comprised of six
36V18 Function Blocks, providing 2,400 usable gates with
propagation delays of 7.5 ns. See Figure2 for the architecture overview.
050
Clock Frequency (MHz)
100
X5898
Figure 1: Typical ICC vs. Frequency for XC95108
December 4, 1998 (Version 3.0) 1
XC95108 In-System Programmable CPLD
JTAG Port
I/O/GCK
I/O/GSR
I/O/GTS
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
3
1
3
1
2
JTAG
Controller
I/O
Blocks
In-System Programming Controller
36
18
36
18
36
18
FastCONNECT Switch Matrix
36
18
Function
Macrocells
Function
Macrocells
Function
Macrocells
Function
Macrocells
Block 1
1 to 18
Block 2
1 to 18
Block 3
1 to 18
Block 4
1 to 18
Figure 2: XC95108 Architecture
Function Block outputs (indicated by the bold line) drive the I/O Blocks directly
Note:
18
18
36
36
Function
Block 5
Macrocells
1 to 18
Function
Block 6
Macrocells
1 to 18
X5897
2 December 4, 1998 (Version 3.0)
XC95108 In-System Programmable CPLD
Absolute Maximum Ratings
Symbol Parameter Value Units
V
CC
V
IN
V
TS
T
STG
T
SOL
Warning:Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those listed under
Recommended Operating Conditions is not implied. Exposure to Absolute Maximum Rating conditions for extended periods
of time may affect device reliability.
Supply voltage relative to GND -0.5 to 7.0 V
DC input voltage relative to GND -0.5 to VCC + 0.5 V
Voltage applied to 3-state output with respect to GND -0.5 to VCC + 0.5 V
Storage temperature -65 to +150 °C
Max soldering temperature (10 s @ 1/16 in = 1.5 mm) +260 °C
Recommended Operation Conditions
1
Symbol Parameter Min Max Units
V
CCINT
V
CCIO
Supply voltage for internal logic and input buffer 4.75
(4.5)
5.25
(5.5)
Supply voltage for output drivers for 5 V operation 4.75 (4.5) 5.25 (5.5) V
Supply voltage for output drivers for 3.3 V operation 3.0 3.6 V
V
IL
V
IH
V
O
Low-level input voltage 0 0.80 V
High-level input voltage 2.0 V
Output voltage 0 V
+0.5 V
CCINT
CCIO
Note: 1. Numbers in parenthesis are for industrial-temperature range versions.
Endurance Characteristics
Symbol Parameter Min Max Units
t
N
DR
PE
Data Retention 20 - Years
Program/Erase Cycles 10,000 - Cycles
V
V
December 4, 1998 (Version 3.0) 3