The W3EG6433S is a 2x16Mx64 Double Data Rate
SDRAM memory module based on 256Mb DDR SDRAM
component. The module consists of sixteen 16Mx8 DDR
SDRAMs in 66 pin TSOP packages mounted on a 184
pin FR4 substrate.
Synchronous design allows precise cycle control with the
use of system clock. Data I/O transactions are possible on
both edges and Burst Lengths allow the same device to be
useful for a variety of high bandwidth, high performance
memory system applications.
* This product is under development, is not qualifi ed or characterized and is subject to
change without notice.
November 2005
Rev. 2
1
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
W3EG6433S-D3
White Electronic Designs
PRELIMINARY
ABSOLUTE MAXIMUM RATINGS
ParameterSymbolValueUnits
Voltage on any pin relative to V
Voltage on VCC supply relative to V
SS
SS
Storage TemperatureT
Power DissipationP
Short Circuit CurrentI
Note: Permanent device damage may occur if ‘ABSOLUTE MAXIMUM RATINGS’ are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability
VIN, V
VCC, V
STG
OS
OUT
CCQ
-0.5 to 3.6V
-1.0 to 3.6V
-55 to +150°C
D
24W
50mA
-JD3
Recommended perating conditions (Voltage referenced to VSS=0V, TA=0 to 70°C)
DC OPERATING CONDITIONS
ParameterSymbolMinMaxUnitNote
Supply Voltage (for device with a nominal V
I/O Supply VoltageV
I/O Reference VoltageV
I/OTermination VoltageV
Input Logic High VoltageV
Input Logic Low VoltageV
Input Voltage Level, CK and CK# InputsV
Input Differential Voltage, CK and CK# InputsV
of 2.5V)V
CC
CC
CCQ
REF
TT
IH
IL
IN(DC)
ID(DC)
V-I Matching: Pullup to Pulldown Current RatioVI(Ratio)0.711.4-4
Input leakage currentI
Output leakage currentI
Output High Current(Normal strengh driver); V
Output High Current(Normal strengh driver); V
Output High Current(Half strengh driver); V
Output High Current(Half strengh driver); V
NOTES:
1. V
is expected to be equal to 0.5*V
REF
value.
2. V
is not applied directly to the device. V
TT
V
REF.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK#.
4. The ratio of the pullup current to the pulldown current is specifi ed for the same temperature and voltage, over the entire temperature and voltage range, for device drain to source
voltages from 0.25V to 1.0V. For a given output, it represents the maximum difference between pullup and pulldown drivers due to process variation. The full variation in the ratio
of the maximum to minimum pullup and pulldown current will not exceed 1/7 for device drain to source voltages from 0.1 to 1.0.
CCQ
= V
= 0.84VI
OUT
TT
= V
= 0.84VI
OUT
TT
= V
= 0.45VV
OUT
TT
= V
= 0.45VV
OUT
TT
of the transmitting device, and to track variations in the dc level of same. Peak-to peak noise on V
is a system supply for signal termination resistors, is expected to be set equal to V
TT
I
OZ
OH
OL
OH
OL
2.32.7V
2.32.7V
0.49*V
CCQ
V
-0.04V
REF
V
+ 0.15V
REF
-0.3V
-0.3V
0.36V
0.51*V
CCQ
+0.04V2
REF
+ 0.3V
CCQ
-0.15V
REF
+ 0.3V
CCQ
+ 0.6V3
CCQ
V1
-22uA
-55uA
-16.8uA
16.8uA
-9uA
9uA
may not exceed +/-2% of the dc
REF
, and must track variations in the DC level of
REF
November 2005
Rev. 2
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
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