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951i
Operating & Maintenance Manual
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Vitrek 95 Series, 951i, 952i, 953i, 954i Operating & Maintenance Manual

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951 to 957i, and 959i
OPERATING & MAINTENANCE MANUAL
95x Series Operating Manual - June 27, 2016
About this Manual ......................................................................................................................................................... 9
Warranty Information ................................................................................................................................................. 10
SECTION 1 – PRODUCT INFORMATION........................................................................................................................ 11
Interfacing Option................................................................................................................................................ 12
DC Voltage Options .............................................................................................................................................. 12
Internal AC Voltage Options ................................................................................................................................ 12
Internal GROUND BOND Option .......................................................................................................................... 13
External AC Voltage Option ................................................................................................................................. 13
Pulse Testing Option ............................................................................................................................................ 13
DUT Isolation Option ........................................................................................................................................... 13
Terminal Option ................................................................................................................................................... 13
Power Input Option ............................................................................................................................................. 13
Rack Mounting Option ......................................................................................................................................... 13
Output Voltage/Current Limiting Options ........................................................................................................... 13
SECTION 2 – SAFETY..................................................................................................................................................... 15
SECTION 3 –INSTALLATION .......................................................................................................................................... 18
SECTION 4 – GENERAL FRONT PANEL OPERATION ...................................................................................................... 21
Base Menu State .................................................................................................................................................. 23
Navigating Menus ................................................................................................................................................ 24
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Modifying Menu Entries ...................................................................................................................................... 24
Unlocking Menus ................................................................................................................................................. 26
Setting, Changing or Clearing a Menu Lock Password ......................................................................................... 27
Relocking Menus.................................................................................................................................................. 27
Unknown Menu Lock Password........................................................................................................................... 28
SECTION 5 – TEST SEQUENCES .................................................................................................................................... 31
Configuring the Test Results Report .................................................................................................................... 39
Manually Commanding a Test Results Report ..................................................................................................... 41
SECTION 6 – TEST STEPS .............................................................................................................................................. 42
Choosing AC, DC or PULSE Testing ....................................................................................................................... 43
Choosing the Limits ............................................................................................................................................. 43
Actions While Running ......................................................................................................................................... 47
Configuring .......................................................................................................................................................... 47
Connecting to the DUT ........................................................................................................................................ 50
Lead Compensation ............................................................................................................................................. 52
Examples .............................................................................................................................................................. 52
Specifications ....................................................................................................................................................... 53
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95x Series Operating Manual - June 27, 2016
Actions While Running ......................................................................................................................................... 57
Configuring .......................................................................................................................................................... 58
Connecting to the DUT ........................................................................................................................................ 62
Lead Compensation ............................................................................................................................................. 63
Examples .............................................................................................................................................................. 64
Specifications ....................................................................................................................................................... 66
Actions While Running ......................................................................................................................................... 71
Configuring .......................................................................................................................................................... 71
Connecting to the DUT ........................................................................................................................................ 72
Lead Compensation ............................................................................................................................................. 72
Examples .............................................................................................................................................................. 73
Specifications ....................................................................................................................................................... 73
Actions while Running ......................................................................................................................................... 74
Configuring .......................................................................................................................................................... 75
Connecting to the DUT ........................................................................................................................................ 75
Lead Compensation ............................................................................................................................................. 76
Examples .............................................................................................................................................................. 76
Specifications ....................................................................................................................................................... 77
Actions while Running ......................................................................................................................................... 77
Configuring .......................................................................................................................................................... 78
Connecting to the DUT ........................................................................................................................................ 78
Lead Compensation (2-Wire) ............................................................................................................................... 79
Lead Compensation (4-Wire) ............................................................................................................................... 80
Examples .............................................................................................................................................................. 80
Specifications ....................................................................................................................................................... 80
Actions While Running ......................................................................................................................................... 82
Configuring .......................................................................................................................................................... 82
Connecting to the DUT ........................................................................................................................................ 83
Lead Compensation ............................................................................................................................................. 85
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Examples .............................................................................................................................................................. 85
Specifications ....................................................................................................................................................... 87
Actions While Running ......................................................................................................................................... 88
Configuring .......................................................................................................................................................... 88
Connecting to the DUT ........................................................................................................................................ 89
Lead Compensation ............................................................................................................................................. 89
Examples .............................................................................................................................................................. 90
Specifications ....................................................................................................................................................... 91
Actions While Running ......................................................................................................................................... 92
Configuring .......................................................................................................................................................... 92
Examples .............................................................................................................................................................. 93
Specifications ....................................................................................................................................................... 93
Configuring .......................................................................................................................................................... 93
Examples .............................................................................................................................................................. 94
Specifications ....................................................................................................................................................... 94
SECTION 7 – CONNECTING AND CONFIGURING INTERFACES ..................................................................................... 95
Configuration ....................................................................................................................................................... 95
Connections ......................................................................................................................................................... 97
Specifications ....................................................................................................................................................... 97
Configuration ....................................................................................................................................................... 97
Connections ......................................................................................................................................................... 98
Configuration ....................................................................................................................................................... 98
Connections ......................................................................................................................................................... 99
Specifications ....................................................................................................................................................... 99
Configuration ....................................................................................................................................................... 99
Connections ....................................................................................................................................................... 101
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Specifications ..................................................................................................................................................... 101
Connecting ......................................................................................................................................................... 101
Printing .............................................................................................................................................................. 102
SECTION 8 – DIO INTERFACE...................................................................................................................................... 103
Starting with the START signal ........................................................................................................................... 107
Aborting with the ABORT or INTERLOCK signals................................................................................................ 107
PASS, FAIL and TESTING signals at the end of a Test Sequence ........................................................................ 107
HV PRESENT and DWELL Output Signals ........................................................................................................... 107
SECTION 9 – PERIODIC MAINTENANCE ..................................................................................................................... 110
Cable Inspection ................................................................................................................................................ 110
Fan Filter Cleaning ............................................................................................................................................. 110
Display Filter Cleaning ....................................................................................................................................... 110
Terminal Inspection ........................................................................................................................................... 111
SECTION 10 – PERFORMANCE VERIFICATION AND ADJUSTMENT ............................................................................ 112
Equipment Required .......................................................................................................................................... 113
Procedure .......................................................................................................................................................... 114
Equipment Required .......................................................................................................................................... 117
Starting Verification ........................................................................................................................................... 117
DC Voltage Verification ...................................................................................................................................... 118
DC Current Scaling Verification .......................................................................................................................... 118
DC Current Zero Verification ............................................................................................................................. 119
AC Voltage Verification ...................................................................................................................................... 119
AC Current Zero Verification .............................................................................................................................. 119
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Low Ohms Resistance Verification..................................................................................................................... 120
Ground Bond Verification .................................................................................................................................. 120
Option HSS Current Verification ........................................................................................................................ 121
SECTION 11 – PROGRAMMING VIA AN INTERFACE ................................................................................................... 123
Field Syntax ........................................................................................................................................................ 124
Field Separator................................................................................................................................................... 125
Command Separator .......................................................................................................................................... 125
Command Terminator ....................................................................................................................................... 125
Device Clear (SDC and DCL) ............................................................................................................................... 127
Interface Clear (IFC) ........................................................................................................................................... 127
Group Execute Trigger (GET) ............................................................................................................................. 127
STB and SRE Registers ........................................................................................................................................ 128
OPC Register ...................................................................................................................................................... 128
ESR Register ....................................................................................................................................................... 129
ERR Register ....................................................................................................................................................... 129
*IDN? Response Fields ....................................................................................................................................... 134
ACez Configuration Fields .................................................................................................................................. 134
ACW Configuration Fields .................................................................................................................................. 135
DCez Configuration Fields .................................................................................................................................. 136
DCW Configuration Fields .................................................................................................................................. 137
DCIR Configuration Fields .................................................................................................................................. 138
GBez Configuration Fields .................................................................................................................................. 139
GB Configuration Fields ..................................................................................................................................... 139
LowΩ Configuration Fields ................................................................................................................................. 140
ACCAP Configuration Fields ............................................................................................................................... 141
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ACI Configuration Fields .................................................................................................................................... 142
DCI Configuration Fields .................................................................................................................................... 142
PULSE Configuration Fields ................................................................................................................................ 143
BRKDN Configuration Fields .............................................................................................................................. 144
PAUSE Configuration Fields ............................................................................................................................... 144
HOLD Configuration Fields ................................................................................................................................. 145
SWITCH (948i configuration) Configuration Fields ............................................................................................ 145
SWITCH (964i configuration) Configuration Fields ............................................................................................ 145
Test Step Status Flags ........................................................................................................................................ 146
STEPRSLT? Response Fields ............................................................................................................................... 147
Migrating from Earlier Firmware Versions ................................................................................................................ 152
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95x Series Operating Manual - June 27, 2016

ABOUT THIS MAN UAL

Throughout this document the instrument is referred to as the 95x, this applies to all instruments in the 95x series having a main firmware revision of 2.30, there may be differences if the 95x being operated has a different main firmware version. At the end of this manual is a section detailing the differences between v2.30 and earlier versions of the firmware (see Migrating from Earlier Firmware Versions).
Due to continuing product refinement and possible manufacturer changes to components used in this product, ViTREK reserves the right to change any or all specifications without notice.
This manual has been created with “clickable” links. Where a reference is made to another section of the manual, the user may click on the section name reference and the document will automatically go to that section.
The table of contents is “clickable”. The user may click on any of the entries to go to that section.
The table of contents is also made available as Bookmarks for Adobe Reader or Acrobat, allowing the user to permanently display the table of contents alongside the document and navigate by clicking on each section as needed.
Page 9 of 154
95x Series Operating Manual - June 27, 2016

WA RRAN TY I NFORMAT ION

This ViTREK instrument is warranted against defects in material and workmanship for a period of 1 year after the date of purchase (extended up to a total of 3 years with registration and annual calibrations at ViTREK). ViTREK agrees to repair or replace any assembly or component (except batteries) found to be defective, under normal use, during the warranty period. ViTREKs obligation under this warranty is limited solely to repairing any such instrument, which in ViTREKs sole opinion proves to be defective within the scope of the warranty, when returned to the factory or to an authorized service center. Transportation to the factory or service center is to be prepaid by the purchaser. Shipment should not be made without prior authorization by ViTREK.
This warranty does not apply to any products repaired or altered by persons not authorized by ViTREK or not in accordance with instructions provided by ViTREK. If the instrument is defective as a result of misuse, improper repair, improper shipment, or abnormal conditions or operations, repairs will be billed at cost.
ViTREK assumes no responsibility for its products being used in a hazardous or dangerous manner, either alone or in conjunction with other equipment. Special disclaimers apply to this instrument. ViTREK assumes no liability for secondary charges or consequential damages, and, in any event, ViTREKs liability for breach of warranty under any contract or otherwise, shall not exceed the original purchase price of the specific instrument shipped and against which a claim is made.
Any recommendations made by ViTREK or its representatives, for uses of its products are based on tests believed to be reliable, but ViTREK makes no warranties of the results to be obtained. This warranty is in lieu of all other warranties, expressed or implied and no representative or person is authorized to represent or assume for ViTREK any liability in connection with the sale of our products other than set forth herein.
Document number MO-95x-GOM revision H, 26 June 2016.
Copyright© 2009-2015 ViTREK.
All rights reserved. No part of this publication may be reproduced, transmitted, transcribed, stored in a retrieval system, or translated into any language in any form without prior written consent from ViTREK. This document is copyrighted and contains proprietary information, which is subject to change without notice. The product displays and instructional text may be used or copied only in accordance with the terms of the license agreement.
In the interest of continued product development, ViTREK reserves the right to make changes in this document and the product it describes at any time, without notice or obligation.
ViTREK 12169 Kirkham Road, Poway, CA 92064 USA Telephone: 858-689-2755 Fax : 858-689-2760 Web : www.vitrek.com Email : info@vitrek.com
Page 10 of 154
95x Series Operating Manual - June 27, 2016

SECTION 1 – PRODUCT INFORMATION

FEATUR ES

The 95x is an advanced Electrical Safety Analyzer with many standard features which make it unique in this field.
Multiple Capabilities. The 95x is capable of a very wide range of safety tests and is also capable of making
specialty measurements on components – all in the same instrument.
Multiple Safety features. The 95x has many built-in safety features, such as ground current detection,
DUT safety ground disconnection detection, and more. The standard digital interface allows the user to use safety interlocks and remote safety indicators with ease.
No regrets. With all of the features shown here, the 95x is capable of so much more than the typical
users’ present requirements, the user will not regret choosing the 95x when new more stringent
requirements come up in the future.
Wide range of voltages and currents generated. The 95x has a test voltage range from a few 10’s of volts
to several 10’s of kilovolts (for withstand testing) and a test current range from a few microamps to 10’s
of amps (for chassis ground bond testing) at DC or over a frequency range from 20 to 500Hz. The 95x is not limited to just a few voltages, currents or frequencies, the user can specify the actual level and frequency they desire. The 95x is not weak either – loads up to 500VA can be accommodated.
Wide range of voltages and currents measured. The 95x does not just have a wide range of generated
voltages and currents – it can measure them too. From microvolts to 10’s of kilovolts, and from 100’s of picoamps to 100’s of milliamps are all measured by the 95x. Using its’ DSP based technology the 95x knows the difference between breakdown currents, leakage currents and arcing currents and gives you all of the results.
Advanced measurements. When it comes to AC measurements the 95x does not just measure the basics -
the 95x measures total, in phase and quadrature components all of the time and makes available more advanced results such as in phase resistance, quadrature reactance, capacitance and dissipation factors.
Result Analysis. The 95x does not just measure, it analyses the measurements – after a test has been run
the minimum, maximum, average and final measurements are available, a running total of the passes and failures for each test step are also maintained across multiple runs.
Not just “does not breakdown” but “does breakdown” too. The 95x is not only capable of testing that a
DUT does not breakdown, but it is also capable of testing that a surge suppressor type device does breakdown at the correct voltage. Ever worried if that surge suppressor you disconnected while safety testing was correctly reconnected, does it work, is it in specification? Not a problem for the 95x – it can be tested after safety testing.
The 95x adapts itself to the load automatically. The 95x does not have the load restrictions so often found
(and so often hidden in the small print) in other safety analyzers – load capacitances up to a farad during DC withstand testing, highly inductive loads when low resistance testing, and more, are automatically accommodated by the 95x adapting itself to the actual load during each test. Measurements on DUTs like solar panels and computer system line filters are made by the 95x with ease.
Stand alone operation. The 95x can be programmed by the user to perform up to 254 test steps in a
sequence. Each step is automatically performed by the 95x either with or without user intervention as the user desires. Up to 100 such sequences can be defined and maintained in the instrument, no
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95x Series Operating Manual - June 27, 2016
AC Voltage Testing
DC Voltage Testing
AC Low Resistance Testing
951i
20-6000V
20-6500V
No
951i
952i
0.1-40A @ 8V
952i
953i
40-11000V
No
953i
954i
0.1-40A @ 8V
954i
955i
40-10000V
No
955i
956i
No
20-6500V
No
956i
957i
20-6000V
(40-10000V Opt AC10)
75-15000V
No
(0.1-40A Opt GB40)
957i 959i
No
No
0.1-40A @ 8V
959i
computer is required. The 95x is capable of controlling switch matrix units (also available from ViTREK) – up to 256 channels can be controlled without needing a computer or software. The 95x can even print a test report on a printer for you when a test sequence has completed.
System operation - Wide range of interfaces available. If the user wishes to use the 95x with a computer,
then RS232, GPIB or Ethernet interfacing can be chosen as the interfacing medium between them. Giving the user the flexibility to use the 95x in almost any computing environment. Software (QuickTest Pro) is available from ViTREK to provide all the control needed for any system from the simple (just the 95x) to the most complex with the 95x terminals being multiplexed between DUTs and/or points within DUTs by up to 1024 channels in switch matrix units (also available from ViTREK).
High Speed. The 95x is capable of performing very quickly, up to 100 tests per second can be performed
with the test results being made available both during each test and after the entire sequence has been run. The 95x is also capable of chaining similar tests without needing to reduce the applied voltage or current to zero between test steps, this considerably speeds up testing when multiple test levels are required.
All of the measurements, all of the time. The 95x does not just measure what the user has set limits for,
all measurement results for the specific type of test being performed are made available to the user.
Energy Efficient. The 95x uses direct line switching power supplies to provide a very energy efficient
instrument, the 95x only draws significant power from the line when needed to power the load.

AVAILABLE MODELS AND O PTIONS

In addition to the above, all models have 2- and 4-wire DC Low Resistance and Ground Leakage Testing capabilities, a RS232 interface, a Digital I/O interface and a VICL proprietary interface.

INT ERFA C ING OPTI ON

This option may be fitted in any 95x.
Option GPIB-9 adds a GPIB interface.
The 95x has Digital I/O, RS232, Ethernet and USB Printer interfaces as standard.

DC VOLT A GE O PTIO N S

This option may be fitted in any 95x except the 959i.
Option DCNEG changes the polarity of the DC Voltage capability to negative, but limits the minimum DC output voltage to 200V.

INT ERNA L AC VOLTA GE O PTIO NS

One or none of these options may be fitted in a 951i, 952i, 953i, 954i or 957i.
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Option AC-2 changes the AC Voltage capability to 10-2000V, and has increased drive capability at all voltage output levels.
Option 500VA (not available for the 952i or 954i) extends the AC voltage drive capability to 100mArms.
Option AC-10 (only available for the 957i) extends the AC voltage drive capability to 10KVrms (same as standard in a 955i).

INT ERNA L GR O UND BOND OPTION

This option may be fitted in a 957i and cannot be fitted if Opt. AC-10 is fitted.
Option GB-40 adds ground bond testing capability to the 957i (same as standard in a 952i, 954i and 959i).

EXT ERNA L AC VOLT AGE OPTI O N

This option may be fitted in a 951i, 952i, 953i, 954i, 955i or 957i.
Option AC-30 extends the maximum AC Voltage capability to 30KV by means of an external unit.

PUL SE T ESTI N G OP TION

This option may be fitted in a 951i, 952i, 953i or 954i (not available with Option 500VA) or a 957i (not available with Opt. AC-10).
Option PMT-1 adds pulsed voltage testing.

DUT ISO L ATI O N OPT ION

One of these options may be fitted in a 951i, 952i or 956i.
Option HSS adds the ability to measure AC or DC breakdown and/or leakage into a grounded DUT with down to 10nA resolution.
Option HSS-2 adds the ability to measure DC breakdown and/or leakage into a grounded DUT with down to 1nA resolution.

TE R MINA L OPT ION

One or none of these options may be fitted in any 95x.
Option RPO-95 adds rear panel terminals in parallel with the front panel terminals.
Option RPOO-95 replaces the front panel terminals with rear panel terminals.

POW ER I NPUT OPTI ON

Any of these options may be fitted in any 95x.
Option LOLINE changes the standard 105-245Vrms line voltage range to 80-125Vrms.
Option INRUSH reduces the power-on inrush current at 230V line from over 100Apk to nominally 40Apk but limits the line voltage range to 200-245Vrms.

RAC K MO UNTI N G OP TION

This option may be fitted in any 95x.
Option RM-1 allows for standard 19” rack mounting of the 95x.

OUT PUT V OLTA GE/CURR E NT L IMITING OPTI O NS

The user may, at the time of order, specify that the DC and/or AC Voltage generated by the 95x may be limited to a user specified voltage less than that normally available from the specific unit model (but must be greater than
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95x Series Operating Manual - June 27, 2016
100V). Similarly, the user may specify that the Ground Bond current generated by a 952i, 954i or 959i is limited to a user specified current between 1 and 40Arms. The remainder of this manual assumes that these optional limits are at the maximum for the specific model.

SOF TWAR E

QT Pro II – 950. A 45 day free trial included with each unit. This software provides-
The user does not need to write software to use the 95x with a computer. Can control testing using very complex switching systems when used with ViTREK 964 Switch Matrix units. Easy to use fully graphical interface on a Windows based computer. Multi-level user login, enabling the configuration of tests to be locked except for certain users. Company wide use of test sequences using the company network. Test sequences can be downloaded into the 95x and run without the computer. Test results recorded on a computer or on the company network. Computer generated multi-level test reports. Compatibility with a wide range of Windows versions (Windows XP through Windows 8 as a Desktop
Application).

ACC ESSO RIES

TL-115-95. 115V Receptacle Hipot Test Adaptor
TL-115-GBR. 115V Receptacle Ground Bond Test Adaptor TL-115-95GBR. 115V Receptacle Hipot and Ground Bond Test Adaptor TL-IEC-95. IEC320 Power Socket Lead set for HiPot TL-IEC-GBR. IEC320 Power Socket Lead set for Ground Bond TL-IEC-95GBR. IEC320 Power Socket Lead set for HiPot and Ground Bond TL-209. Standard HV/CONT Alligator Clip Test Lead Set (one supplied with each unit). K-1R. 4-Wire Kelvin Low Resistance Measurement Lead Set K-2R. 4-Wire 40A GB Test Lead Set (one supplied with each 952i, 954i, 959i, and 957i with Opt GB40). RS-2. 6ft RS232 null-modem cable (95x to Computer). RSS-9. Remote Start Switch. RSF-9. Remote Start Footswitch. HVW-9. High Voltage Warning Light. RM-1. Rack Mount Kit for the 95x series. DIO-IS9. DIO Isolator for the 95x series. Available in models for 3V, 5V, 12V, or 24V logic.
Page 14 of 154
95x Series Operating Manual - June 27, 2016

SECTION 2 – SAFETY

The user should be aware of these safety warnings at all times while using the 95x.
WARNING - THE 95x PRODUCES VOLTAGES AND CURRENTS WHICH MAY BE LETHAL, UNSAFE OPERATION MAY RESULT IN SEVERE INJURY OR DEATH.
WARNING - IF THE 95x IS USED IN A MANNER NOT SPECIFIED BY VITREK, THE PROTECTION PROVIDED BY THE EQUIPMENT MAY BE IMPAIRED AND SAFETY MAY BE COMPROMISED.

POWER AND GROUNDING

WARNING - THE 95x IS INTENDED TO BE POWERED FROM A POWER CORD HAVING A PROTECTIVE
GROUND WIRE WHICH MUST BE INSERTED INTO A POWER OUTLET HAVING A PROTECTIVE GROUND TERMINAL. IF THE 95x IS NOT POWERED FROM A SUITABLE POWER SOURCE THEN THE CHASSIS GROUND TERMINAL LOCATED NEAR THE POWER ENTRY CONNECTOR ON THE REAR PANEL MUST BE PROTECTIVE GROUNDED.
WARNING - TURNING OFF OR OTHERWISE REMOVING POWER TO THE 95x WHILE IT IS GENERATING HIGH VOLTAGES WILL NOT ENABLE THE 95x TO DISCHARGE THE DUT AND MAY DAMAGE THE 95x. THE DUT MAY HAVE DANGEROUS VOLTAGES PRESENT FOR LONG PERIODS OF TIME AFTER THIS OCCURS.
WARNING - DO NOT REMOVE THE POWER CORD FROM THE 95x OR FROM THE SOURCE OF POWER WHILE IT IS OPERATING AT HIGH VOLTAGES. THIS WILL REMOVE THE PROTECTIVE GROUND FROM THE CHASSIS OF THE 95x AND THE DUT WHICH MAY RESULT IN HAZARDOUS VOLTAGES BEING ACCESSIBLE TO THE USER.

TERMINALS AND WIRING

WARNING - THE 95x PRODUCES VOLTAGES AND CURRENTS WHICH MAY BE LETHAL, ENSURE NO
VOLTAGE OR CURRENT IS PRESENT WHEN CONNECTING TO OR DISCONNECTING FROM THE TERMINALS OR DUT.
The HIGH VOLTAGE OR HIGH CURRENT PRESENT warning symbol on the front panel of the 95x is illuminated whenever an unsafe voltage is present on the HV terminal or a high current is present between the SOURCE terminals.
WARNING - THE 95x PRODUCES VOLTAGES OF UP TO 10kVrms ON THE HV TERMINAL(S). THE USER MUST ENSURE THAT CONNECTIONS TO THESE TERMINALS HAVE SUFFICIENT INSULATION FOR THESE VOLTAGES. EVEN WHEN SUFFICIENT INSULATION IS PRESENT, THE USER SHOULD NOT PUT ANY PART OF THEIR BODY IN CLOSE PROXIMITY TO THE CONNECTIONS WHILE HIGH VOLTAGES ARE PRESENT.
The insulation of the wiring to the HV terminal of the 95x must be rated for at least the highest voltage expected during the test sequence.
The user should ensure that all personnel remain at a safe distance from the HV wiring during testing.
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When using high voltages, even if there is sufficient insulation, there may be significant capacitive coupling which can cause an unsafe current to flow to nearby objects and corona can occur even outside of the insulation. This is made worse by sharp corners on objects or the wiring. In severe cases corona can cause interference with the measurements of the 95x and will reduce the capabilities of the wiring insulation over time, eventually resulting in insulation failure.
When using extremely high voltages, especially when using Opt. AC-30, there may be significant mechanical force between the HV wiring and nearby objects. Loose wiring can move several inches, and nearby loose objects (e.g. screws or papers) can be attracted to the high voltage wire.
All terminals of the 95x other than the HV terminal are always protected to be within a safe voltage of the 95x chassis ground, so high voltage wire is generally unnecessary for connections to them.
Should the DUT exhibit significant breakdown or arcing while being tested, there may be very high energy HF interference generated. Although this only lasts for a small period of time before the 95x shuts down, in severe cases this can damage nearby equipment, such as computers. The wiring between the 95x terminals and the DUT should be routed as far as possible away from other equipment and from all cabling connected to other equipment.
When charging high capacitance loads to high DC voltages the capacitor may be unsafe if it or the wiring to it exhibits breakdown while being tested. The energy in the breakdown is generated by the capacitor itself, so there can be no limit on this energy imposed by the 95x.
WARNING - SOME 95x MODELS PRODUCES CURRENTS OF UP TO 40Arms ON THE SOURCE + AND ­TERMINALS. THE USER MUST ENSURE THAT CONNECTIONS TO THESE TERMINALS HAVE A SUFFICIENT CURRENT CARRYING RATING.
The current rating of all wiring must be sufficient for at least the highest current expected from that terminal during the test sequence.
Generally all wiring should be rated for at least 100mA, but the SOURCE+ and SOURCE- terminal wiring for a 952i, 954i or 959i performing Ground Bond testing should be rated for the highest set test current (this may be up to 40A).

USER A CTIV ATED SAFETY ABOR T

The user may depress the STOP button on the 95x front panel at any time while a test sequence is being
run to remove the voltage or current as quickly as possible and abort the test sequence.
The user can configure for a digital INTERLOCK signal to be input to the DIO Interface which will abort a
high voltage or current test step if the interlock is opened. See SECTION 8 – DIO INTERFACE.
The user can configure for a digital ABORT signal to be input to the DIO Interface which will abort any type
of test step if asserted. See
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95x Series Operating Manual - June 27, 2016
SECTION 8 – DIO INTERFACE. There are several interface commands which can be used to abort a running test sequence. See SECTION
11 – PROGRAMMING VIA AN INTERFACE.

AUTOMA TIC SAFETY ABORT

For AC or DC voltage test steps, if the breakdown current level is set to <7mApk and the HI SAFETY setting
in the CNFG - TEST menu is enabled, the 95x will fail the test if excessive HV terminal current is detected. This effectively reduces the drive capability of the 95x to a safer level of current (nominally 7.5mA peak) during these test steps. See Test Sequence Configuration.
For AC or DC voltage test steps, the RETURN terminal of the 95x provides a protective ground to the DUT.
The user may wish to take precautions to ensure its’ connection to the DUT. If the CONTINUITY SENSE setting in the CNFG - TEST menu is enabled, and the user connects a separate wire between the SENSE+ terminal of the 95x and the portion of the DUT to which the RETURN terminal wire is connected, then if the RETURN terminal wire becomes disconnected from the DUT the test step will be immediately aborted and the high voltage removed, preventing a potentially unsafe condition. See Test Sequence
Configuration.
If option HSS-2 is not fitted then for AC or DC voltage test steps, if the voltage present on the HV terminal
is detected as being significantly different from that expected during the execution of a test step, then the test sequence is immediately aborted and any high voltage removed, preventing a potentially unsafe condition. This requires no specific configuration by the user.
All processors in the 95x which participate in monitoring the output of the 95x and the condition of the
load check each other nominally every 5ms, if any mis-operation is detected which lasts more than 10ms then the test sequence is immediately aborted and any high voltage removed, preventing a potentially unsafe condition. This requires no specific configuration by the user.
All processors in the 95x have an associated hardware “watchdog” which recovers a mis-operating
processor within typically 100msec. If this occurs during a test then the test sequence is immediately aborted and any high voltage removed, preventing a potentially unsafe condition. This requires no specific configuration by the user.
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SECTION 3 –INSTALLATION

GENERAL SP ECIF ICATIONS

Nominal Dimensions 89mmH x 432mmW x 457mmD (3.5” x 17” x 18”)
Nominal Weight 951i,953i,957i,959i : 9kg (18lb) net, 12kg (25lb) shipping
956i : 5kg (11lb) net, 8kg (18lb) shipping 951i,953i Opt. 500VA : 13kg (27lb) net, 16kg (35lb) shipping 952i, 954i, 955i : 13kg (27lb) net, 16kg (35lb) shipping 957i Opt AC10 or GB40 : 13kg (27lb) net, 16kg (35lb) shipping Opt. AC-30 : additional 17kg (36lb) net, 21kg (46lb) shipping
Storage Environment -20 to 75C (non-condensing)
Operating Environment 0 to 50C, <85% RH (non-condensing), Pollution Degree 2
Operating Altitude 0 to 7000ft ASL (10000ft with reduced output drive capability)
Line Power Installation Category II
Standard: 105-265Vrms (45 to 450Hz) or 160-300Vdc, having at least 500VA (750VA for Opt. 500VA) capability Opt. LOLINE: 85 to 130Vrms (45 to 450Hz) Opt. INRUSH : 200-265Vrms (45 to 450Hz) having at least 500VA (750VA for Opt. 500VA) capability
Measurement Measurement Category I
THE 95x MUST NOT BE USED IN AN ENVIRONMENT WHERE CONDUCTIVE POLLUTION CAN OCCUR, E.G. IN AN OUTDOOR ENVIRONMENT.
IF FLUIDS OR OTHER CONDUCTIVE MATERIALS ARE ALLOWED TO ENTER THE UNIT ENCLOSURE, EVEN IF NOT POWERED, THEN THE UNIT SHOULD BE IMMEDIATELY TAKEN OUT OF OPERATION AND SERVICED AS SAFETY MAY HAVE BEEN COMPROMISED.
IF THE UNIT IS TRANSPORTED BETWEEN DIFFERING ENVIRONMENTS AND CONDENSATION IS SUSPECTED, THE UNIT SHOULD REMAIN UNPOWERED FOR SUFFICIENT TIME FOR CONDENSATION TO HAVE DISSIPATED.

INI TIAL IN SPECTION

After the 95x has been shipped or otherwise handled in an unknown manner, the user should visually inspect the 95x for damage before attempting to operate it. Particular attention should be taken to ensure that there are no significant dents or cracks in any outer surfaces and that all terminals are securely mounted to the unit. If any significant dents or cracks, or any loosely mounted terminals, are noted then it is recommended that the 95x be serviced prior to being placed into use, as safety may have been compromised.

COOLIN G

The 95x is cooled by means of a rear panel mounted fan and cooling vents in the top cover. Sufficient free air must be allowed behind the rear panel and above the top cover to allow sufficient airflow for cooling purposes. At least 2” of well ventilated unrestricted space is recommended around the fan intake and above the vents.
The cooling fan has variable speed to save energy while the 95x is not in use or is not heavily loaded. The user may notice that the fan activates shortly after initial application of line power. This is normal; the fan should stop or
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slow to low speed within 1 minute of application of power. If the fan maintains high speed operation for a long time then the airflow may be overly restricted, or the fan filter may be blocked, the user should take corrective action.
The cooling fan has a removable filter. This is easily removed for cleaning or replacement without disassembling the 95x, see SECTION 9 – PERIODIC MAINTENANCE
The 95x is fully specified for operation in ambient temperatures between 0 and 50C, however best accuracy and full loading capability is obtained if the ambient temperature is maintained below 30C. For best results the user may wish to operate the 95x in a conditioned environment.

MO UNTI NG P OSIT ION AND ORIE NTATION

The 95x may be installed as either a bench top instrument or installed into a standard 19” rack.
The 95x is primarily intended to be used in a horizontal, or close to horizontal position, oriented with the top cover (with the vent holes) uppermost. There are no known issues with mounting the 95x at any angle or orientation, as long as it is mounted in a secure and stable fashion taking into consideration its’ weight and weight distribution.

INSTALLING IN A 19 ” RA CK E NCLOSUR E

Often when installing the 95x into a rack enclosure it is desired to remove the feet from the bottom of the 95x. This is easily achieved by simply removing the screws mounting the feet to the bottom of the unit. The user should place the removed feet and mounting hardware into a bag for safe keeping should they be needed at a later date for bench top usage. DO NOT INSERT THE MOUNTING HARDWARE BACK INTO THE BOTTOM OF THE 95x WITHOUT THE FEET INSTALLED, THIS MAY DAMAGE THE UNIT.
Option RM-1 provides the rack mount ears required for mounting in a standard 19” rack enclosure.
When installing the 95x into a rack enclosure it is recommended that the unit be supported through its’ depth.
The use of a tray or angle brackets supporting the bottom edges of the unit is recommended.

LINE POWER

WARNING - THE 95x IS INTENDED TO BE POWERED FROM A POWER CORD HAVING A PROTECTIVE GROUND WIRE
WHICH MUST BE INSERTED INTO A POWER OUTLET HAVING A PROTECTIVE GROUND TERMINAL. IF THE 95x IS NOT POWERED FROM A SUITABLE POWER SOURCE THEN THE CHASSIS GROUND TERMINAL LOCATED NEAR THE POWER ENTRY CONNECTOR ON THE REAR PANEL MUST BE PROTECTIVE GROUNDED.
The user may connect the 95x to any source of line power within the allowable range of voltages and frequencies (see above) without requiring any adjustment to the 95x.
The 95x line power input is fused with a 5mm x 20mm TT3.15A fuse mounted in the rear panel next to the line power entry. If the user needs to replace this fuse it must be replaced with an exact equivalent fuse, noting the time and current ratings. Although the 95x is fused at 3.15Arms, the unit can draw surges of up to 10Apk during normal operation and up to 100Apk during initial application of power. The user should ensure that the power cord is rated for at least 5Arms continuous operation.

CONNECTING OPTION AC-30 TO T HE 95X

If the 95x has option AC-30 installed, the user must connect the external transformer unit to the 95x in order to be able to use it.
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The user may use the 95x without the external transformer unit if the capabilities of option AC-30 are neither programmed nor required.
CAUTION – ENSURE THAT ALL CONNECTIONS ARE PROPERLY MADE BETWEEN THE OPTION AC-30 EXTERNAL TRANSFORMER UNIT AND THE 95x BEFORE ATTEMPTING TO PERFORM ANY TEST USING OPTION AC-30. EXTREMELY HIGH VOLTAGES CAN BE PRESENT WITHOUT WARNING IF MIS-WIRED.
There are two cables from the option AC-30 external transformer unit which must be correctly connected to the 95x before attempting to perform any test using option AC-30.
A shielded coaxial cable terminated in a BNC connector. This must be connected to the BNC connector
marked EXT FB on the rear panel of the 95x. Ensure this connector is securely fastened to the rear panel connector on the 95x, if this should become disconnected while performing a test, extremely high voltages can exist on the output of the external transformer unit.
A power line cord type cable terminated in three separate connections –
o A spade lug. This must be securely connected to the Ground terminal located above the power
connector on the rear panel of the 95x.
o A pair of shrouded banana plugs. These must be connected to the safety banana sockets marked
EXT DRIVE on the rear panel of the 95x. There is no polarity requirement regarding these connections.
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SECTION 4 – GENERAL FRONT PANEL OPERATION

This section gives general information regarding using the front panel and its’ menus.

FRONT PANE L

1. The display. This shows all menus during interactive data entries, all measurements during a test, and the
present date/time when not performing any other duties.
2. The POWER switch. This turns on/off the power to the 95x.
3. The START and STOP buttons. a. The START button allows the user to start performing a previous selected test sequence, or
(while running a test sequence) select to continue a test step when it is waiting for the user to do so.
b. The STOP button aborts any test sequence in progress (while running a test sequence), aborts
the menu activity in progress discarding any changes made (while performing a menu), or makes no test sequence selected (otherwise).
4. The menu selection keys. During all menus, the selected element of the menu is highlighted by flashing
between the data and blocks. These keys allow the user to move the selection point within a menu.
a. The Left and Right Arrow keys are used to move the selection point within a menu. b. The ENTER key is used to finish entry of a menu data and automatically move to the next menu
item.
c. The EXIT key (labeled EXIT/SAVE on later units) is used to save all changes made within a menu
and return to the previous menu (if any) or to the inactive display.
5. The edit keys. These allow the user to decrement or increment a selected menu items’ value. During
numeric entry these initiate “edit” mode of data entry, rather than “direct” mode of data entry (i.e. allow the user to adjust the existing entry using the Up/Down Arrow keys, rather than overwriting the existing value with a new value using the numeric keys). For convenience, these keys auto-repeat if the user maintains pressure on them.
6. The indicators. a. HIGH VOLTAGE OR HIGH CURRENT PRESENT. This is illuminated whenever the 95x has a high
voltage (>30V) or a high current (>5A) present on its’ terminals.
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b. PASS. This is illuminated whenever a test sequence is passing (while running a test sequence) or
it has passed all test steps (following completion of the test sequence).
c. FAIL. This is illuminated whenever a test sequence is failing (while running a test sequence) or
the previously run test sequence has failed any test steps (following completion of the test sequence).
d. TESTING. This is illuminated when the 95x is running a test sequence. e. READY. This is illuminated after the user has selected a test sequence to run and the 95x is ready
to perform that test sequence.
f. ARC. This is illuminated whenever the 95x is detecting an arc current while running a test
sequence and the specific test step is enabled to detect arc current.
g. C/V LIMITED. This is illuminated when the 95x output is either current or voltage limited by the
load while running a test sequence. This is only used in certain types of test steps.
h. REMOTE. This is illuminated when the 95x is under the control of an interface (i.e. RS232,
Ethernet or GPIB). If the user wishes to return to front panel control of the 95x the CNFG key should be pressed to achieve this.
7. The menu keys. These initiate a menu allowing the user to perform certain activities via the front panel of
the 95x. Many of these can be disabled by the user by requiring a password in order to utilize them.
a. SELECT. Initiates a menu allowing the user to select a test sequence which has already been
defined in the 95x. This never requires a password.
b. EDIT. Initiates a menu allowing the user to select an existing test sequence and then edit it.
After editing it is automatically made ready to run. This optionally requires a password.
c. NEW. Initiates a menu allowing the user to select a presently undefined test sequence number
and name, and then to create the sequence of tests to be performed. This optionally requires a password. While editing or creating a test sequence, this key is also used to insert a new test step into the test sequence.
d. DEL. Initiates a menu allowing the user to select an existing test sequence and delete it from the
95x. This optionally requires a password. While editing or creating a test sequence, this key is also used to delete a test step from the test sequence.
e. PRINT. If option UL-2 or GUL-3 is fitted and a suitable printer is attached, this key causes a
printout to be generated. This never requires a password. The printout generated is dependent on the menu (if any) which is active when the key is pressed –
i. If pressed while no menu is active, or the configuration menu is active, a configuration
printout is generated.
ii. If pressed while selecting an existing test sequence, a test sequence printout is
generated.
iii. If pressed while reviewing the results of a completed test sequence, a test results report
printout is generated. The 95x can also be configured to automatically produce this printout if desired.
f. VIEW. Initiates a menu allowing the user to either –
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i. If no test sequence is ready to run. View the pass and fail counts for any defined test
sequence, and optionally to clear them. This never requires a password except (optionally) to clear the counts.
ii. If a test sequence has been run and is still selected. View the test results of each step
within the previously run test sequence. This is automatically performed after a test sequence has been run. This never requires a password.
g. LEADS. Allows the user to run the presently selected test sequence in Lead Compensation mode.
This allows the 95x to store any load offsets for each step in the test sequence and to correct all future tests using that test sequence for these load offsets. This optionally requires a password.
h. EXT. Allows the user to perform either an adjustment or verification calibration of the 95x
against external standards. This optionally requires a password (this is separate to the other menu activity password).
i. CNFG. Initiates a menu allowing the user to configure the 95x. This uses a series of sub-menus.
This optionally requires a password.
j. TEST. Shows the present operational status of the 95x and allows the user to perform internal
operation verification (this optionally requires a password).
8. The data entry keys. a. The numeric keys (0 through 9), decimal point and change sign keys. These are used during
numeric or character data entry. NOTE – during hexadecimal or character data entry, certain of the menu keys can be used for entry of the A through F characters.
b. The UNIT key. This is used to change the units during numeric data entry, and is also used while
running a test, or while reviewing test results, to change the displayed test result measurement.
c. The LIMIT key. This is used during numeric data entry to set a value to the largest possible.
When setting test dwell times this sets that the dwell should be user terminated rather than automatically terminated after the entered time. When setting a resistance type upper limit, this allows the user to set that there is no upper limit.
d. CLEAR key. This is used to clear an entry during numeric or character data entry.

ME NU O PERATION AND DAT A ENTRY

Most user activities using the front panel controls are performed using menus. All menus use the same general operating methods described in this section. The user should read this section before attempting to operate the 95x.

BAS E ME N U S T ATE

When the 95x is not performing a menu and is not performing a test sequence, the display shows the model # in the uppermost display line and the date and time in the lower most display line, this is called the base menu state in this document. Most menus require the 95x to be in the base menu state to be initiated, an example of the base menu state display is -
ViTREK 951i 9-Feb-10 9:08:51am
If the 95x is not in this state and the user is unsure how to return to this state, then pressing the STOP button will accomplish this (in some circumstances the STOP button may need to be pressed more than once).
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NAV IGAT ING M ENUS

The present selection point in a menu is denoted by the displayed information flashing between the
information and solid blocks.
The user can move the selection point in a menu by using the Left and/or Right Arrow keys.
o The Right Arrow key moves the selection point further down the menu. Moving the selection
point past the last selectable item in a menu selects the first selectable item in the menu (a double beep sound is made when this occurs).
o The Left Arrow key moves the selection point further up the menu. Moving the selection point
before the first selectable item in a menu selects the last selectable item in the menu (a double beep sound is made when this occurs).
Although the 95x display is limited to two lines, most menus have more lines than this. The display is
automatically scrolled up and down the menu to display the menu line containing the present selection point.
Not all menus or menu lines may be available.
o Generally items which are not pertinent to the specific model or option content of the 95x are
not shown.
o All menus in the 95x utilize a “top down” priority. Selections or entries made may affect
subsequent entries in the menu. Entries may be limited in allowable values, or may not be shown.
If a menu line is an entry into a sub-menu, then the left side of the line shows descriptive text followed by
an ellipsis character (…). The descriptive text is selectable. If the user presses the ENTER key while a sub- menu entry line is selected then the sub-menu is opened.
o When a sub-menu is terminated by pressing the EXIT key then the user is returned to the
preceding level of menu.
o If any level of sub-menu is terminated using the STOP button then all levels of menus are aborted
and any changes made at any level are discarded.
o Only when the base level menu is terminated by pressing the EXIT key are any changes made
actually saved.
If a menu line is for informative purposes only, then the left side of the line shows descriptive text
followed by a colon character with the informative data at the right end of the line. The descriptive text is selectable.
If a menu line allows the user to edit its’ contents, then the left side of the line shows descriptive text
followed by a colon character with the editable data at the right end of the line. The editable data is selectable; some menu lines may contain more than one editable data.

MOD IFYI N G ME NU E NTRI ES

In many places the available contents of entries in different menu lines are inter-related. The 95x uses a
“top down” menu approach; the topmost contents in a menu may limit the available entries in the menu below them, but not vice versa. Generally the user cannot set a limit or an output which the specific model and option content of the 95x is not capable of achieving.
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Changing Numeric Data. After making the numeric data the selection point in the menu, the user can
overwrite the data by using the data entry keys. While overwriting, the selection point becomes a single character position within the numeric data.
o A numeric key places the corresponding character and moves the selection point to the right one
position.
o Certain numeric data allow the user to change the units of the data (e.g. between current and
resistance) and/or change the multiplier for the data (e.g. select an entry in microamps or milliamps). To change the units, press the UNIT key while the entire numeric data is selected; to change the multiplier, press the UNIT key while entering the numeric data.
o The Left Arrow key acts as a delete key, deleting the previously entered character. o The CLR key removes all of the existing entry and places the selection point in the rightmost
character position.
o The LIMIT key sets the numeric data to the highest possible value in most cases; while entering
the lower limit in a range pair of data the LIMIT key sets the minimum value; in some other cases the LIMIT key has a special use denoted in the description for that specific data.
o The Right Arrow or ENTER key terminates the numerical data entry and also moves the selection
point to the right or downwards, as applicable.
Changing Multiple Choice Data. After making the multiple choice data the selection point in the menu,
the user can change the selection by repeatedly pressing the Up Arrow or Down Arrow keys until the desired selection is displayed. The ENTER key terminates the multiple choice data entry and also moves the selection point to the right or downwards, as applicable. The Left Arrow and Right Arrow keys automatically terminate the multiple choice data entry prior to moving the selection point accordingly.
Changing Character Data. After making the character data the selection point in the menu, the user can
choose to either edit the existing data, or to overwrite it with new data. While overwriting or editing the data the selection point becomes a single character position within the character data.
o Editing Existing Character Data. If the user presses the Up Arrow or Down Arrow key while the
entire character data is selected then the edit mode of entry is initiated and the leftmost character of the existing data is selected. Character data uses a limited character set; A through Z, a through z, 0 through 9, the space character and most punctuation characters.
The Up Arrow and Down Arrow keys change the selected character to the next or
previous available character in the character set.
The numeric keys and the A through F keys overwrite the selected character. The Left Arrow and Right Arrow keys move the selection point within the character data
area.
The CLR key aborts the edit, the character data is cleared, and the overwrite mode is
initiated.
The ENTER key exits the edit mode retaining the changes made.
o Overwriting Character Data. If the user presses any of the numeric keys or the CLR key then the
overwrite mode of entry is initiated, starting with the corresponding character and with the leftmost character.
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The Up Arrow and Down Arrow keys change the selected character to the next or
previous available character in the character set.
The numeric keys and the A through F keys places the corresponding character and
moves the selection point to the right one position.
The Left Arrow key acts as a delete key, deleting the previous character and moving the
selection point to the left one position.
The Right Arrow key places a space character and moves the selection point to the right
one position.
The CLR key removes all of the existing entry and places the selection point in the
leftmost character position.
The ENTER key terminates the character data entry retaining the changes made and also
moves the selection point in the menu to the right or downwards, as applicable.
Changing Hexadecimal Data. Hexadecimal data is treated exactly the same as character data (see above)
but with the available character set restricted to 0 through 9 and A through F.

ADJUST ING THE DISPLAY CONT RAST

The user can adjust the display contrast while the 95x is in the base menu state (i.e. the display shows the model number and the time/date). An example display when the user can adjust the display contrast is –
ViTREK 951i 9-Feb-10 9:08:51am
Using the Up and Down Arrows keys, select the display contrast which best suits the users normal viewing position.
NOTE – it may be possible to adjust the display contrast such that the display is not visible. If the display appears to be totally blank then press and hold the Down Arrow key to return it to the visible state; if the display appears to have all of its dots “black” then press and hold the Up Arrow key to return it to the visible state.
NOTE – it may be best to select the contrast which shows the least “blurring” when the seconds digit in the displayed time changes. This has been found to produce the best adjustment for viewing angle as well as contrast.

LOCKIN G AN D UN LOCKING MENU S

Many menus in the 95x can be locked by a user, preventing unauthorized changes to test sequences and configuration settings via the front panel of the 95x. When initially delivered from the factory, this capability is disabled.
The password is any combination of six 0 through 9 and A through F characters. The password 000000 indicates a cleared password, disabling this capability until a non-zero password is subsequently set by the user.
If a menu lock password has been set, the 95x always powers up with the menus locked.

UNL OCKI N G M ENUS

If the menu lock password has been set, a user must enter this password to unlock a menu. The user is prompted to enter the password when needed; which is accomplished by using the 0 through 9 and A through F keys as needed to match the previously set password, followed by the ENTER key. After successfully entering the password the front panel menus remains unlocked until the menus are relocked by the user or the 95x is power cycled. Note that the 95x display does not show the characters during unlock password entry for security reasons.
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SET TING , CH A NGIN G OR CLEA RING A MEN U LOC K PAS SWOR D

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. If a password has been already set and the menus are not already unlocked, the user
must enter the correct password to unlock the menu at this point.
The display now shows the main configuration menu. An example of which is as follows –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the LOCK PASSWORD
line.
Using the 0 through 9 keys and/or the A through F keys, enter a six character password. If the password
000000 is set then this clears the password and disables menu locking.
Press the ENTER key. If a non-zero password was entered, the display now shows a message indicating that the front panel is
now locked and returns to the base menu state. Otherwise, a message is displayed indicating that the menu lock is now disabled and the 95x stays in the main configuration menu.

REL OCKI N G M E NUS

If the menu lock password has been set but the menus are presently unlocked (i.e. they have been previously unlocked as described above) then the user may relock the menus as follows –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu. An example of which is as follows –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the RELOCK line. Press the ENTER key. The display now shows a message indicating that the front panel is now locked and returns to the base
menu state.
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UNK NOWN MEN U LOC K PAS S WORD

If the 95x menus have been locked but the password is unknown, the user should contact Vitrek for assistance. The 95x has an internal set of “one time use” passwords for this circumstance.

DISPLA YING BUI LD I NFORMATION

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the BUILD line. Press the ENTER key. The 95x now displays the build configuration menu, an example of which is –
SERIAL# 123456 FIRMWARE: v1.12 FP: v1.10 MEAS: v1.10 DRIVE: v1.10 BASE UNIT: 951i DC OPTION: NONE AC2 OPTION: NO AC30 OPTION: NO 500VA OPTION: NO PMT1 OPTION: YES HSS OPTION: NO MAX DC: 6.5KV MAX AC: 6.0KV INTERFACE: GUL-3 UPGRADE:000000000000
The user may navigate this menu but may not make changes to it. The information available is as follows-
o SERIAL#. This shows the serial number of this 95x. o FIRMWARE. This shows the main firmware revision number installed in this 95x. This can be
upgraded (along with the MEAS and DRIVE firmware) by the user via the RS232, Ethernet or GPIB interface. Contact Vitrek or your local representative for details regarding this.
o FP. This shows the front panel firmware revision number. o MEAS. This shows the Measurement DSP firmware revision number installed in this 95x. o DRIVE. This shows the Output Drive DSP firmware revision number installed in this 95x. o BASE UNIT. This shows the base model number of this 95x.
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o DC OPTION. This shows if option NODC or DCNEG is installed in this 95x. o AC2 OPTION. This shows if option AC-2 is installed in this 95x. o AC30 OPTION. This shows if option AC-30 is installed in this 95x. o 500VA OPTION. This shows if option 500VA is installed in this 95x. o PMT1 OPTION. This shows if option PMT-1 is installed in this 95x. o HSS OPTION. This shows if option HSS or HSS-2 is installed in this 95x. o INTERFACE. This shows if option UL-2 or GUL-3 is installed in this 95x. o MAX DC. This shows the factory limit on the maximum DC Voltage generated by this unit. o MAX AC. This shows the factory limit on the maximum AC Voltage generated by this unit. o MAX GB. This shows the factory limit on the maximum Ground Bond current generated by this
unit.
o UPGRADE. This allows the user to enter a factory supplied code to upgrade their instrument to
enable additional options which were not enabled as originally purchased.
When finished reviewing the build information, press the EXIT key to return to the main configuration
menu, and then press EXIT again (if no additional configuring is to be performed) to exit the main configuration menu.

SY STEM CONFIG URAT ION SETTINGS

There are several system configuration settings available which affect the overall operation. These can be viewed or set as follows –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the SYSTEM line. Press the ENTER key. The 95x now displays the system configuration settings menu, an example of which is –
KEY BEEPS: SOFT TIME FORMAT: 12hr SET TIME: 9:18:06am SET DATE: 9-Feb-10
The user may navigate this sub-menu and change the displayed settings as required.
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o KEY BEEPS. This allows the user to set the volume of the beep sounds made by the 95x
whenever a key is pressed.
o TIME FORMAT. This allows the user to select whether the 95x displays time in 12hour or 24hour
format.
o SET TIME. This allows the user to adjust the presently displayed time. The hour, minute and
second are separately adjusted using the Up and Down Arrow keys.
o SET DATE. This allows the user to adjust the presently displayed date. The day, month and year
are separately adjusted using the Up and Down Arrow keys.
When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings.

RETURNING ALL CON FIGUR ATIO N SETTINGS TO FACTORY DEFAU LTS

The user may return all configuration settings to the factory default settings as follows –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the SET TO DEFAULTS
line.
Press the ENTER key. The 95x now displays a message temporarily and remains in the main configuration menu, allowing the
user to override the factory settings as needed. If no further changes are needed, press the EXIT key to save the changes and return to the base menu state.
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SECTION 5 – TEST SEQUENCES

All usage of the 95x for testing a DUT (Device under Test) uses test sequences. Although this section is primarily written for the front panel user, when programming the 95x via an interface the user should be conversant with the contents of this section.
A test sequence is a series of test steps which form a series of tests to perform on a DUT. Each step in a sequence can be configured to be one of several types of activity, including types for timing, waiting for user interaction and controlling external switch units as well as types for performing a test on the DUT.
There are two types of test sequences which may be defined at the front panel –
MANUAL test sequence (sequence #0).
o This always contains a single test step which may only be a step type which performs a test on
the DUT.
o During testing the user is allowed to change the applied voltage, current and/or frequency as
applicable for the specific step type being performed.
o This test sequence cannot be deleted, it can only be overwritten.
Standard test sequences (sequence #1 through 99 inclusive).
o These may optionally have a name associated with each test sequence, and each may contain up
to 254 steps.
o All step types are available for use in this type of test sequence. o While testing using these the user may not alter the voltages, currents or frequencies being
applied by the 95x.
o Certain step types are able to be “chained”, the DUT does not need to be discharged between
steps. This allows faster and smoother operation when testing certain types of DUT.
Test sequences defined at the front panel are automatically stored in internal non-volatile memory of the 95x. The user does not need to take any action to ensure that a front panel defined test sequence is saved. Note that the 95x is limited to having 1000 non-volatile test steps stored in total.
The user can also define a test sequence via an interface (see a later chapter for details regarding this). The interface defined test sequence differs from a front panel defined standard test sequence as follows –
It is volatile, i.e. it exists until cleared, another sequence is defined or selected, or power is cycled on the
95x.
It is numbered 100 and displayed as either IN or I It has no name associated with it. It cannot be edited or selected from the front panel, although it can be started, stopped and its results
can be reviewed and/or printed at the front panel in the normal manner.
It can have up to 999 steps. If the number of defined steps is within the maximum for a non-volatile store
(1 for sequence #0, otherwise 254) then interface commands are provided to save it into a non-volatile sequence.
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TEST SEQUENCE CON FIGUR ATIO N

There are settings in the 95x which apply to all test steps in all test sequences. To view or change these settings perform the following actions –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the TEST line. Press the ENTER key. The display now shows the test configuration menu. An example of the test configuration menu is as
follows –
START BEEP: MED PASS BEEP: MED FAIL BEEPS: LOUD ARC: FAIL ON DETECT CONTINUITY SENSE:OFF FAST RERUN: ENABLED USER MAX DCV: 10.0KV USER MAX ACV: 10.0KV HI SAFETY: ENABLED MIN LOAD: ENABLED MAX DISCHARGE: 200mA
The user may navigate this sub-menu and change the displayed settings as required.
o START BEEP. This allows the user to set the volume of the beep sound emitted by the 95x when
a test sequence is started.
o PASS BEEP. This allows the user to set the volume of the beep sound emitted by the 95x when a
test sequence is completed with a PASS status.
o FAIL BEEP. This allows the user to set the volume of the beep sounds emitted by the 95x when a
test sequence is completed with a FAIL status.
o ARC. This allows the user to select whether all test steps configured for arc detection will either
fail the test if an arc is detected (FAIL ON DETECT) or not (DETECT ONLY). Note that arc detection is enabled or disabled by a separate user setting in each individual test step.
o CONTINUITY SENSE. This allows the user to turn on/off the Continuity Sense feature in certain
types of test steps (see the specific test step type sections of this manual for details).
o FAST RERUN. This allows the 95x to always allow the user to rerun a test sequence without
having to terminate reviewing the results (ENABLED), or only allow it if all tests passed (IF PASS),
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or never allow it (DISABLED). If fast rerun is not enabled, the user must terminate reviewing results by using the STOP button before they can rerun the test sequence with the START button.
o USER MAX DCV. This allows the user to set a maximum DC Voltage which the 95x will produce.
This limits all test steps subsequently defined and will not allow any existing test sequence containing a test step level outside of this limit to run. Note, the factory default setting for this is 10KV, some models and options may allow a higher setting than this.
o USER MAX ACV. This allows the user to set a maximum AC Voltage which the 95x will produce.
This limits all test steps subsequently defined and will not allow any existing test sequence containing a test step level outside of this limit to run. Note, the factory default setting for this is 10KV, some models and options may allow a higher setting than this.
o HI SAFETY. This turns on/off the ability of the 95x to detect excessive HV terminal current in high
voltage test step types (see the specific test type sections of this manual for details).
o MIN LOAD. This turns on/off the ability to detect that there is a minimum load attached during
DCW or DCIR type test steps (see the specific test type sections of this manual for details). If enabled in this menu, then each DCW and DCIR test step may be individually configured for minimum loading detection as needed.
o MAX DISCHARGE. This sets the maximum current which will be used by the 95x when
discharging a load at the end of a DCez, DCW or DCIR type test step. A value between 1 and 200mA may be configured.
When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings.

CREATING A NEW TEST SE QUENCE

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the NEW key. The display now shows the lowest presently empty test sequence number and a blank name field. An
example is -
NEW TEST SEQUENCE # 2
Either change the test sequence number (using the numeric keys or the Up Arrow and Down Arrow keys)
or press the ENTER key. The display now selects the name field. The user can enter a name by pressing the Up Arrow key followed using the Up, Down, Left and Right Arrow keys to change/select each character, and the user may use the numeric keys to directly enter numeric characters.
Press the ENTER key. The display now shows the first test step (step #1) with no test type selected (NEW
is displayed). An example is ­Seq 2 Step 1 NEW
Using the Up or Down Arrow keys, select the desired first test step type. Using the information for the selected test step type shown later in this document, program the
requirements for this test step.
If no more test steps are required, press the EXIT key. The 95x stores the test sequence and makes it
ready to be run.
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If further steps are required, then press the Up arrow key once when the previously entered step # is
selected, the next step # will be displayed with a NEW test type. Repeat as required for each test step. Note - if the user accidently creates a NEW step after the end of the test sequence, press the DEL key to delete it while it is being displayed.

EDITING AN EXIST ING TEST SEQUEN CE

Note – editing a test sequence, even if no changes are made to the test sequence, will cause any Lead Compensation data for that sequence to be cleared. A “c” character is displayed after the test sequence# if the
test sequence contains previously obtained Lead Compensation data.
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state. A test sequence may also be edited while the user is reviewing the results of a previously run test sequence.
Press the EDIT key. The display now shows the last used test sequence number and the name associated with that test
sequence. An example is -
EDIT TEST SEQUENCE # 2 95x LINE HYPOT
If needed, change the test sequence number to select the desired test sequence by using the Up Arrow or
Down Arrow keys (or using the numeric keys), and then press the ENTER key. The display now selects the name field. The user can enter a name or alter the existing name by pressing the Up Arrow key followed using the Up, Down, Left and Right keys to change/select each character, and the user may use the numeric keys to directly enter numeric characters.
Press the ENTER key. The display now shows the first test step (step #1) of the existing test sequence. An
example is -
Seq 2 Step 1 ACW LEVEL:1500.0V 60.0Hz
To select a different test step # in the existing test sequence, as needed navigate the menu using the Left
and Right Arrow keys to select the test step #, then press the Up or Down Arrow key until the desired test step # is shown.
The user may edit the selected test step by navigating the menu and altering settings as needed. See
SECTION 6 – TEST STEPS.
The user may add a test step to the end of the test sequence by pressing the Up Arrow key while the test
step # is selected until a NEW test step type is shown. Note - if the user accidently creates a NEW test step after the end of the sequence, press the DEL key to delete it while it is being displayed.
The user may delete an existing test step by pressing the DEL key while the undesired test step is selected.
All higher numbered test steps are automatically renumbered. The user cannot delete the only test step in a test sequence.
The user may insert a new test step by pressing the NEW key. A new test step is inserted before the
presently selected test step, and all higher numbered test steps are automatically renumbered. The user cannot insert an additional test step into a test sequence which already has all 254 test steps defined.
When no more changes are required, press the EXIT key. The 95x stores the test sequence and makes it
ready to be run.
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DELETING AN EXIS TING TES T SE QUENCE

CAUTION – this operation cannot be undone, ensure that the correct test sequence # is selected before pressing the ENTER key.
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the DEL key. The display shows the last used test sequence number and the name associated with that test sequence.
An example is -
DELETE TEST SEQUENCE # 2 95x LINE HYPOT
As needed change the test sequence number to select the desired test sequence by using the Up Arrow or
Down Arrow keys (or using the numeric keys), then press the ENTER key. The selected test sequence is now deleted from the 95x internal non-volatile memory.

SE LECT ING AND RUNNING AN EXI STING TE ST SEQU ENCE

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the SELECT key. The display shows the last used test sequence number and the name associated with that test sequence.
An example is -
SELECT TEST SEQUENCE # 2 95x LINE HYPOT
As needed change the test sequence number to select the desired test sequence by using the Up Arrow or
Down Arrow keys (or using the numeric keys), then press the ENTER key. The selected test sequence is now made ready to be run.
NOTE - Whenever a test sequence has been selected and is ready to be run, the front panel READY indicator is illuminated. If the READY indicator is not illuminated then either no test sequence has been selected or it is not ready to run at that time (e.g. it is already running, or the user is viewing the results of a previous run and FAST RERUN has been disabled). Initiating any menu activity on the front panel always makes no test sequence ready to be run.
After an existing test sequence has been selected (either by using the SELECT or EDIT menus) the test may be run by –
Press the START button. The READY indicator is extinguished and the TESTING indicator is illuminated
while the selected test sequence is run.
While the test sequence is running the PASS and FAIL indicators show the present pass/fail status after
the first test step is sufficiently completed, and throughout the test sequence the display shows the progress. An example is -
1.01d 1500V 60.0Hz 22s PASS 5.5nArms
o The selected test sequence number and the present step # are shown in the upper left display.
Following this, the r character is shown during the ramp period or d during the dwell period of
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the test step being performed. During the discharge period an informative message is displayed in the lower line of the display.
o For most types of test step, the present output level and frequency are shown in the remainder
of the upper display line. If the MANUAL test sequence is being run (the upper left shows MAN) then either the level or the frequency can be selected and edited using the arrow keys (start by pressing the Up Arrow key while selected) or may be directly overwritten (enter a new value using the numeric keys while it is selected).
o The time since the start of the present test step and test step period is shown in the lower left
display. If this is flashing between the value and blocks then the unit is waiting for the user to press the START button to continue (e.g. if the dwell period has been programmed for user termination), otherwise the period will automatically end when it reaches the programmed time period.
o For most types of test step, the remainder of the lower display shows a measurement result.
During the test dwell period the displayed measurements are automatically filtered with a rolling time constant. Initially the selected measurement is the first checked measurement, but may be changed during the step by pressing the UNIT key which toggles between all measurement results available for that test type. See Displayed Measurement Results. If certain types of failure occur then a temporary display is shown similar to those shown when reviewing results (see below).
While the test sequence is running it may be aborted by pressing the STOP button. When the test sequence has been completed, the TESTING indicator extinguishes, the PASS or FAIL
indicator is illuminated, and the overall pass or failure status is temporarily displayed for approx. 2 seconds and then the measured results are reviewed, see the following section for details regarding reviewing results. An example temporary display is -
SEQUENCE 1 PASSED ALL TESTS
Use the EXIT key or STOP key to return to the date/time display, or use the START button (if FAST RERUN
is enabled) to start another run of the same test sequence. The READY indicator is illuminated when the test sequence is ready to be run again.

DISPLA YED MEASURE MENT RESULTS

While running a test sequence the 95x allows the user to view measurement results. Generally several different measurement results are available; the user may change between available results by pressing the UNIT key.
So that the user can distinguish between results, the 95x displays each with different units characters following the result as follows –
Applied test voltage (V) Applied test frequency (Hz) DC current (A) DC resistance (Ω) RMS current (Arms) RMS Voltage (Vrms) RMS impedance (Ωrms) In-Phase current (Ainp) In-Phase Voltage (Vinp)
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01.01d 1500V 60.0Hz
5.0s PASS 2.10mArms
The measurement being reviewed was within limits.
01.01d 1500V 60.0Hz
5.0s DET 28mAarc
Arcing was detected during the test but the 95x was not configured to fail on arc detection.
01.01d 1500V 60.0Hz
5.0s FAIL 28mAarc
Arcing was detected during the test which caused the step to fail.
01.01d 1500V 60.0Hz
1.5s >MAX 2.10mArms
The measurement being reviewed was above the maximum limit which caused the step to fail.
01.01d 1500V 60.0Hz
1.5s <MIN 12.3uArms
The measurement being reviewed was below the minimum limit which caused the step to fail.
01.01d 1500V
1.5s UNST 12.3uA
The measurement being reviewed was within limits but was unsteady with increasing leakage current (decreasing resistance) which caused the step to fail.
01.01d 1500V 60.0Hz HV TRIP EXCEEDED
The HV Trip safety feature was tripped which caused the step to fail. This is typically caused by a DUT or cable breakdown to ground.
In-Phase Resistance (Ωinp) Quadrature current (Aqua) Quadrature Voltage (Vqua) Quadrature impedance (Ωqua) Capacitance (F) Dissipation Factor (DF) Peak or breakdown current (Apk) Arc current (Aarc)
Many results are capable of having a negative polarity; a negative result is preceded by the – character. A
positive result has no preceding polarity character.
The 95x automatically formats the displayed result to give the best meaningful resolution using a
multiplier character as needed (e.g. G, M, K, m, u, n or p). Displayed results may have slightly limited resolution; full resolution is available via an interface.
Impedance and resistance results are calculated from voltage and current measurements. For near zero
and negative current measurements, the 95x displays the maximum meaningful resistance value preceded by the > character.

REVIEW ING TEST RESULTS AFT ER RUNNING A TEST SEQUE NCE

Immediately after running a test sequence and temporarily displaying an overall pass/fail status message the 95x automatically initiates reviewing the detailed test results. The results of a previously run test sequence can also be manually reviewed later by pressing the VIEW key if the READY indicator is illuminated, indicating that the test sequence is still ready to be run.
If the test sequence failed, then the review is initiated at the first failed step, otherwise it is initiated at the first test step in the test sequence.
The following table shows example displays of reviewed results and their meanings. See the descriptions following the table for a description of each of the fields in the display.
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01.01d 1500V 60.0Hz
1.5s BRKDN >50mApk
The peak voltage source current limit was exceeded which caused the step to fail. This is typically caused by a fast and severe DUT breakdown (e.g. a flashover).
01.01d 1500V 60.0Hz
1.5s BRKDN 11.3mApk
The user set breakdown current limit was exceeded which caused the step to fail.
01.01d 1500V 60.0Hz
1.5s OVER 11.3mA
The DUT current exceeded the 95x maximum ability for >10ms, this is typically a DUT breakdown whose peak was limited to below the configured breakdown limit, but may also indicate that the configured ramp rate for a DC type step was too fast for the load capacitance (so the charging current was beyond the units’ ability).
01.01d 0.000A 60Hz WIRING FAULT
A wiring fault was detected during a GB, GBez or LowΩ type step which caused the step to fail.
01.01d 1500V 60.0Hz
1.5s ABORTED
The user aborted the test sequence.
01.01d 1500V 60.0Hz
1.5s CONTINUITY
The Continuity Sense safety feature was tripped which caused the step to fail.
01.01d 1500V 60.0Hz INTERLOCK OPENED
The INTERLOCK DIO interface signal became unasserted which caused the step to fail.
01.01r 1500V 60.0Hz UNSTABLE LOAD
The DUT load was too unstable preventing the 95x from providing a stable test voltage or current, or the line voltage was too low to achieve the programmed test voltage and load current.
01.01r 1500V <MIN LOAD
Minimum load detection is enabled and the configured minimum load for this test step was not achieved during ramp in a DCW or DCIR type step which caused the step to fail.
01.01d SWITCH SWITCH FAILED
The 95x could not communicate with an external switch matrix unit during execution of a SWITCH type step.
01.01d HOLD TIMEOUT
The user failed to continue the sequence within the programmed timeout period while executing a HOLD type step.
01.01d 1500V 60.0Hz INT FAULT
An internal fault was detected which caused the step to fail. The 95x may need to be power cycled to recover from this. This is often caused by extreme interference but may be caused by an unrecoverable failure in an internal circuit of the 95x.
01.01d 1500V 60.0Hz OVERHEATED
The 95x overheated which caused the step to fail. This can occur because the load current was too high for too long, or the airflow around the 95x was restricted, or the ambient temperature is too high around the 95x. The user should wait at least 15 seconds to allow it to cool down properly before either re-attempting the test or removing power from the 95x.
The test sequence # and presently shown step # are shown in the upper left corner of the display.
Following the step #, for test step types which have a ramp and a dwell period, a single character is shown which is either r indicating that the failure occurred during the ramp period of the step, or d indicating that either the failure occurred in the dwell period or the test completed normally. The user can change the step number being reviewed by selecting the step # in the display using the Left Arrow or Right Arrow keys as needed, then using the Up Arrow or Down Arrow keys to step forwards or backwards through the
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test steps in the test sequence. Note that test steps which do not have any measurements, i.e. switch unit control steps or timing test steps, are not reviewable and are skipped unless they contain a failure. Only test steps which have been performed can be reviewed, as an example if a 10-step test sequence was aborted during the 2nd test step, then only the 1st and 2nd test steps are reviewable as no others were performed.
The remainder of the upper portion of the display shows the instantaneous applied voltage (or current)
and frequency (if applicable) at the moment of the failure (if FAIL) or at the end of the dwell period (if PASS).
The elapsed time in the period at the completion of the test step is shown in the lower left corner of the
display.
The displayed measurement result can be changed by pressing the UNIT key. This sequentially selects
amongst the available results for the selected test step. When reviewing results, only those which have limits defined are available for review. See Displayed Measurement Results for more details on available results.
The selected measurement result and the pass or fail result for that measurement is shown in the
remainder of the lower portion of the display. If the step contained a failure, other than a simple checked measurement limit failure, then a failure message is displayed instead.
By default the final measurement result is shown in the lower portion of the display. This can be changed
to the minimum (MIN), maximum (MAX) or average (AVG) value by selecting the elapsed time in the display using the Left Arrow or Right Arrow keys as needed, then using the Up Arrow or Down Arrow keys to change the selection.

PRINTING A TEST RESULT S REPOR T

If the 95x has a suitable printer is connected to its USB port, the user can configure the 95x to automatically print a test results report when a test sequence is completed, and/or the user can manually command the 95x to create a test results report. See Printing from the 95x using the USB Interface for details regarding connecting and configuring a printer and the display messages while performing a printout.

CON FIGU RING THE TEST R ESUL TS R EPOR T

Before a test report can be printed, its format should be configured by the user. This is achieved by using the PRINTOUT sub-menu of the CNFG menu as follows –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the PRINTOUT line.
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Press the ENTER key. The display now shows the test report printout configuration menu. An example of the test report
printout configuration menu is as follows –
STATUS: ATTACHED HEADING: AUTO TEST REPORT: NO TEST DETAIL: NORMAL SERIAL #: NO
• The user may navigate this sub-menu and change the displayed settings as required.
o STATUS. This shows the present status of the printer interface. The information shown is not
editable and will automatically update should a change occur.
NOT FITTED. Indicates that the USB interface is not fitted, so there is no printout
capability.
DISABLED. Indicates that the user has disabled the ability to perform printouts by
setting the DISABLE USB setting in the CNFG – INTERFACES menu to YES.
NOT FOUND. Indicates that no valid printer has been detected as being connected to
the 95x USB port.
ATTACHED. Indicates that a valid printer is attached to the 95x USB port and can be
used for printouts.
o HEADING. This allows the user to enter a global 2
nd
heading for all printouts. This can be up to 12 characters long, and can be any alpha-numeric characters. If this is blank then the 2nd heading is omitted from all printouts. Typically this is used to allow the user to print their company name or department name on all printouts.
o AUTO TEST REPORT. This allows the user to set whether the 95x will automatically print a test
report when a test sequence terminates (YES) or not (NO). The user can also command a printout by pressing the PRINT button while reviewing test results independently of this setting.
o TEST DETAIL. This sets the amount of detail to be included in the printed test report.
BRIEF. The pass/fail status, reason for failure (if any), and the level and frequency are
printed for each test step having a result.
NORMAL. The pass/fail status, reason for failure (if any), the level and frequency, the
test limits and the maximum, minimum, average and last measurements are printed for each test step having a result.
FULL. The pass/fail status, reason for failure (if any), the level and frequency, the full
test step settings and the maximum, minimum, average and last measurements are printed for every test step.
o SERIAL #. If set to YES the 95x will prompt the user for entry of a serial # when a test report is to
be printed (either manually or automatically). The serial number can be any alpha-numeric characters; up to 12 characters can be included. This is included in the test report. If NO is selected then the user will not be prompted for the serial # and it will not be included in the printed test report.
• When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings.
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MAN UALL Y COM MAND ING A TEST RE S ULTS REPO R T

When reviewing the results of a completed test sequence, the user can manually command a test results report by pressing the PRINT key.

COMP ENSATING FOR EXTERNAL LEAD LEAK AGE AND IMP E DANC E

Most test sequences can be run in a special mode which saves the measurement results for each test step and will apply these saved measurements as offsets when the test sequence is subsequently run in a normal fashion in order to provide lead error compensation. The details regarding the corrections available and the expected wiring for each test step within the sequence are contained in the respective sections of this manual for each type of test step.
NOTE – certain test step types are not suitable for lead compensation, see the respective sections of this manual for each type of test step for details.
To perform a lead compensation on a test sequence perform the following –
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the SELECT key. The display shows the last used test sequence number and the name associated with that test sequence.
An example is -
SELECT TEST SEQUENCE # 2 95x LINE HYPOT
As needed change the test sequence number to select the desired test sequence by using the Up Arrow or
Down Arrow keys (or using the numeric keys), and then press the ENTER key. The selected test sequence is now made ready to be run.
Press the LEADS key. The display now shows the test sequence is ready to be run in lead compensation
mode, and the READY indicator flashes.
Ensure that the wiring is suitable for lead compensation. See the respective sections of this manual for
each type of test step in the selected test sequence for details.
Press the START switch on the front panel. While the sequence is running the TESTING indicator flashes
and the selected test sequence is performed in the lead compensation mode.
o Any pre-existing lead compensation data is discarded prior to the test sequence being run. o Each test step is performed in the normal manner, only the measurement results are used
differently. See the respective sections of this manual for each type of test step in the test sequence for details.
o Normal measurement limits are not enforced. Any programmed breakdown or arc detections
are performed and if detected aborts the test sequence with a failure.
After the test sequence has been run in this manner –
o The display temporarily shows a message indicating that the lead compensation for this
sequence is ready to be used.
o The lead compensation measurements are saved internally in non-volatile memory and are
automatically retrieved with the test sequence when the test sequence is later selected.
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Activity Required
Test Step
Types
951i
952i
953i
954i
955i
956i
957i
959i
AC Voltage Withstand and Leakage Testing
ACez,
ACW and
ACCAP
20V-6kV,
20-
500Hz
20V-6kV,
20-
500Hz
20V-6kV,
20-
500Hz
20V-6kV,
20-
500Hz
50V-
10kV,
40-
500Hz
No
20V-6kV,
20-
500Hz
No
DC Voltage Withstand and Leakage Testing
DCez,
DCW and
DCIR
20V-
6.5kV
20V-
6.5kV
40V-
11kV
40V-
11kV
40V-
11kV
20V-
6.5kV
75V-
15kV
No
Pulsed Voltage Withstand Testing (Opt. PMT-1 only)
PULSE
50V-8kV
50V-8kV
50V-8kV
50V-8kV
100V-
10kV
No
50V-8kV
No
DC Voltage Breakdown Device Testing
BRKDN
20V-
6.5kV
20V-
6.5kV
40V-
11kV
40V-
11kV
40V-
11kV
20V-
6.5kV
75V-
15kV
No
DC Low Resistance Testing
LowΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
1mΩ to
150KΩ
AC Ground Bond Testing
GBez and
GB
No
1uΩ-10Ω
@ 0.1-
40A
No
1uΩ-10Ω
@ 0.1-
40A
No
No
Opt.
GB40
only
1uΩ-10Ω
@ 0.1-
40A
Ground Leakage Testing
ACI and
DCI
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
0.1nA-
200mA
Switch Unit Control
SWITCH
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Test Sequence Timing Control
PAUSE
and HOLD
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
o The presence of lead compensation data in a test sequence is indicated on the display during test
sequence selection by the presence of a c immediately after the test sequence number.
o Any saved lead compensation data for a test sequence is automatically discarded if the test
sequence is selected for editing by using the EDIT key.

SECTION 6 – TEST STEPS

The previous section described how to use test sequences. This section describes how to choose and configure each step within a test sequence and the specifications and limitations for each step type.
The table below gives an overall summary of the various types of activities available for each step. After the table are individual sections giving full details for each of these activities. The user only need be conversant with the section for each specific activity which the user intends to perform. The levels shown for each model is those for the standard build, option content may change the available levels and/or frequencies.
When the user is selecting testing against the requirements of a safety standard, the information given in this section should only be used as a guideline; the user should consult a safety testing professional for information regarding the specific standard and application. The voltage ranges shown above assume the most common option content for each model; see the specifications for each type of test step for the actual ranges.

CHOOSI NG WITHI N TH E VOLTAG E WITHSTAND AND LEAKAGE TES TING GRO UP

When Voltage Withstand and Leakage Testing is required, the user must first decide whether to perform this using an AC, DC or pulsed voltage, the frequency to use, the limits to use, and the actual test type(s) to perform.
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The 95x makes no distinction between a DC insulation resistance test and any other type of Withstand and Leakage test; the user has the choice of performing a DC insulation resistance test at any test voltage within the capability of the 95x.
Many standards require the user to remove any over-voltage suppression devices which would affect Voltage Withstand testing. To check that such device(s) have been correctly re-installed after this test and to test that they are functioning correctly, see DC Breakdown Voltage Device Testing (BRKDN).

CHO OSIN G AC, DC OR P ULSE TES T ING

When it is required to test a highly capacitive DUT (typically >0.1uF) the user must use DC testing, as the current flow would be too high if AC or pulse testing were attempted (see the applicable Specifications section for details).
Some standards require that testing be performed using an AC voltage waveform, others require a DC voltage, but others allow either to be used. Also, some DUTs may need to be tested using a DC voltage for other reasons (such as non-linearity). Generally, leakage testing is performed using a DC voltage; however the 95x is also capable of accurately measuring resistive leakage using an AC voltage.
In some applications the DUT will not withstand the test voltage for an appreciable period of time because of the
power dissipation caused by its’ leakage. In these applications the user should choose to perform pulse testing which can be performed in as little as a few milliseconds with the 95x. Note that this is different to “static discharge” pulse testing.
If AC testing is to be performed it is recommended that the frequency should be the expected line power frequency of the DUT (i.e. 50, 60 or 400Hz) unless this frequency cannot be used because of loading considerations. The frequency is generally not specified by standards.
To summarize, selecting the type of testing is dependent on the requirement; the following guidelines should be used in the order shown -
If there is a specific requirement for the type of testing – follow the requirement. If the load is capacitive >0.1uF – use DC Voltage Withstand Testing. If the load has power dissipation requirements which preclude DC or AC testing – use Pulse Voltage
Withstand Testing.
If the load is highly non-linear so cannot withstand AC voltages - use DC Voltage Withstand Testing. Otherwise – choose either AC or DC Voltage Withstand Testing.

CHO OSIN G THE LIM I TS

The 95x monitors three different types of DUT current - breakdown, leakage and arc current. Detailed descriptions of these currents are given later in this section. Because the 95x monitors these currents in different ways and can enforce different limits on each in the same test, it can be set to differentiate between a DUT which exhibits any of the following –
Meets all requirements Has excessive leakage, but withstands the applied voltage without breaking down Breaks down when the voltage is applied Exhibits arcing with any of the above
See the detailed description below for setting or disabling arc limits which are optionally enforced throughout the step. If only arc detection is required, the user must still set a breakdown limit.
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The breakdown limit is always enforced throughout the step. Leakage limits are only enforced during the dwell period of the step. When performing DC Voltage Withstand Testing this allows the user to set different limits during the ramp (i.e. charging) and dwell periods of the step by using the breakdown and maximum leakage limits respectively.
A minimum leakage limit can be disabled by setting it to zero (or an unlimited resistance).
A summary of the guidelines for setting breakdown and leakage limits is –
If Pulse Voltage Withstand Testing – set a breakdown limit (no leakage limits are available). If the user has both breakdown and maximum leakage limit requirements – set them both according to
the requirements. ACez or DCez types cannot be used.
If the user has no breakdown limit requirement, only a leakage limit – set the maximum leakage limit
according to the requirement and set the breakdown limit significantly higher than this (but low enough to protect the DUT should it breakdown).
If the user wishes to detect breakdown by using the averaged leakage measurement – set the maximum
leakage limit according to the requirement (use the RMS equivalent for the AC types) and set the breakdown limit significantly higher than this (but low enough to protect the DUT should it breakdown). ACez or DCez types cannot be used.
Otherwise –
o For the ACez or DCez types – set the maximum leakage current limit according to the breakdown
limit requirement (use the RMS equivalent for the ACez type).
o For all other types - set the breakdown limit according to the requirement and either disable the
leakage limits entirely (only for the ACW type) or set the maximum leakage limit equal to or higher than the breakdown limit.
BREAKDOWN CURRENT
A breakdown of a DUT is a sudden, generally heavy, flow of current which does not cease without a reduction in the applied voltage. Many standards bodies (including UL) define breakdown as the sudden uncontrolled flow of current, this is effectively the same definition but is more ambiguous.
Often the user is testing products for compliance with safety standards which specify that the DUT “shall not breakdown” but do not specify a particular current level at which to detect breakdown. It is the industry norm to
set a limit at some level above the normal leakage current level drawn by the DUT. Typically this is a limit of 10mApk (or 7mArms), but this may need to be increased if the DUT has significant leakage, or reduced if the DUT has little leakage.
There are four breakdown detectors in the 95x which are active throughout all types of Voltage Withstand tests; these are listed below in order of decreasing speed (the 3rd listed is set by the user breakdown limit, the others are fixed) -
The 95x AC and DC voltage supplies have a protective trip mechanism which shuts down the voltage if a
large peak current flows beyond its’ capability to supply surge current (for this limit see Surge Current
Limiting and Shutdown in the relevant Specifications section for the test type being run). Typically this detected and shuts down the test within 30usec (this is indicated as BREAKDOWN).
If a step is not set for DUT GROUNDED (option HSS only) and is set for a breakdown limit less than 7mApk,
then the 95x continuously monitors the peak current in the HV terminal and shuts down the voltage if this
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exceeds nominally 7.5mApk. Typically this is detected within 30usec and shuts down the test within 1msec (this is indicated as HV TRIP). This can be disabled in the CNFG-TEST menu.
The 95x continuously monitors the instantaneous DUT current and shuts down the voltage if this exceeds
the user set breakdown peak current limit for that step. Typically this is detected within 30usec and shuts down the test within 3msec (this is indicated as BREAKDOWN).
The 95x monitors the RMS current for each cycle (for AC type steps) and the DC current for periods of
nominally 5msec (for DC type steps). If this is above the loading capability of the 95x voltage source (for this limit see Loading Capability in the relevant Specifications section for the test type being run) then this shuts down the voltage (this is indicated as OVERCURRENT).
LEAKAGE CU RREN T
This is not applicable when pulse testing.
The leakage current of a DUT is a steady flow of current caused by leakage in the DUT, generally either intentionally by circuitry or unintentionally by inter-wiring leakage capacitance and resistances. Unlike breakdown current, leakage current is generally fairly linear vs. the applied voltage (i.e. doubling the voltage produces nominally twice the leakage current) but not necessarily so.
For DC there is only a single component of leakage current (the DC leakage current), whereas for AC there are two components –
In-phase leakage is the component of the leakage current which is in phase with the applied voltage and is
caused by the resistance of the DUT.
Quadrature leakage is the component of the leakage current which is at 90° to the applied voltage and is
caused by the reactance of the DUT (typically capacitance).
The total RMS AC current is the scalar formed by combining the in-phase and quadrature vector currents. In-phase and quadrature currents can be of either polarity, which is ignored when comparing against the user set limits.
The 95x measures the RMS AC current (in-phase, quadrature and total RMS values) for every cycle of the applied voltage, or the mean DC current for every nominally 7.25ms (100ms for dwell times greater than 2 seconds). These values are compared against the user set maximum and minimum limits for leakage current. If enabled and the leakage current is outside the limits during the dwell period of the test then the DUT is failed. The 95x also offers a special variation of AC Voltage Withstand testing for testing the capacitance (and optionally Dissipation Factor) of a DUT – this uses the in-phase and quadrature measurements to internally compute the more advanced capacitance and DF results required for certain testing applications.
For the ACez and DCez types the 95x uses the user set maximum leakage limit as the breakdown limit. For all other types the 95x allows the user to independently set both breakdown and leakage limits. In all cases, setting a minimum leakage limit of zero disables the minimum leakage limit.
ARC CURREN T AND TIME
Arcing is similar to breakdown but rapidly “self-extinguishes” without requiring a reduction in the applied voltage (but typically rapidly re-occurs repeatedly). There are many ways in which arcing can occur and a thorough description of arcing is beyond the scope of this document. Generally, arc currents are AC currents in the frequency range of 1 to 2MHz and are fairly high amplitude (often tens of milliamps or more) and have no relationship to either breakdown or leakage currents. Generally arcing can only occur at higher voltages (>300V) and only in a gas or (in rare circumstances) across a surface.
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ACez
ACW
ACCAP
Separate Breakdown and Leakage Current Limits
No
Yes
Yes
Immediate FAIL on Breakdown detection throughout step
Yes
Yes
Yes
Dual Leakage Current and/or Impedance Min/Max Limits
No
Optional
No
RMS Leakage Current and/or Impedance Min/Max Limits
Yes
Optional
No
In-Phase and/or Quadrature Leakage Current and/or Impedance Min/Max Limits
No
Optional
No
Capacitance and optional Dissipation Factor Min/Max Limits
No
No
Yes
Immediate FAIL on Min/Max Limit detection during dwell
Yes
Yes
Yes
Detect Arcing
No
Optional
Optional
Immediate FAIL on arc current detection throughout step
No
Optional
Optional
Timed Discharge
No
Optional
Optional
Smooth Transition to next test step if also AC withstand type
No
Optional
Optional
Arcing should not be confused with flashover (which is a breakdown), arcing can be very slight and is often not easily visible, corona is a form of arcing but the arcs do not extend entirely across the air gap and so is also called partial discharge or partial breakdown.
Some safety standards do not require detection of arcing, however users often decide to include arc detection because the presence of arcing is often an indication that although the DUT passes breakdown detection at this time it may fail in the future. The 95x allows the user to select either-
a) To not detect arc current. b) If arc current is detected, the DUT is not failed; only the presence of arcing is reported. c) If arc current is detected fail the DUT.
If enabled, the 95x continuously measures the AC (RMS) current with band-pass filtering of 50KHz to 5MHz over consecutive 4us periods and compares each measurement with the user set arc current limit. If the limit is exceeded for more than the user set number of consecutive 4us periods, arcing is detected.
If arc detection is required by the user, typically a limit setting of 10mA for 4us is used, a lower current limit increases the sensitivity, increasing the current and/or time decreases the sensitivity. Although a setting as low as 1mA may be made, this setting is particularly sensitive to pickup of RF interface (e.g. local radio stations) so is not recommended.
If arcing occurs and the DUT has significant capacitance, the DUT capacitance may provide most of the energy for the arcing and there may be little, if any, HF current flow from the DUT. In these cases it may not be possible to detect arcing by current flow. This is generally not the case for DUT capacitances below a few nF, and generally is the case above a few 100nF, but this is very dependent on the DUT and wiring.

AC VOL TAGE WIT HSTAND A ND L EAKA GE TEST ING ( ACEZ, AC W AN D A CCAP )

These are used to test that a DUT does not exhibit breakdown or (optionally) arcing in the presence of an applied AC voltage, and optionally to test that the DUT leakage current, impedance or capacitance is within user set limits.
All are performed in the same manner; the difference between them is in the amount and form of configuration available. The ACez type is intended for basic breakdown detection; the ACW type for comprehensive breakdown, arcing and leakage testing; the ACCAP type for breakdown and capacitance value testing. The ACW type can be configured to provide the same testing as the ACez type.
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VOLTAGE
RAMP
(0 to 10000secs)
DWELL
(0.02 to 10000secs or user terminated)
DISCHARGE
10000secs)
Breakdown and Arc Detection Active
Min & Max Leakage Limits Enforced

ACT IONS WHI LE RU NNIN G

(0 to
On any failure the step is immediately aborted, and optionally the entire test sequence may be aborted. For the ACez type, the discharge period is of zero length, arc detection is not enabled and only RMS
leakage limits may be specified.
If the step is the MANUAL sequence, then the user may manually change the voltage and/or frequency
during the dwell period.
For the ACW or ACCAP type, the discharge period can be programmed to be skipped and the next step
started at this steps’ dwell voltage level if the next step is an ACez, ACW or ACCAP type.

CON FIGU RING

An example ACez type menu is as follows –
Seq 1 Step 1 ACez LEVEL:1500.0V 60.0Hz SOURCE: INT RAMP: 1.00sec DWELL: 30.0sec Lim: 0n-35.00mA ON FAIL: ABORT SEQ
An example ACW type menu is as follows –
Seq 1 Step 1 ACW LEVEL:1500.0V 60.0Hz SOURCE: INT BREAKDOWN: 49.50mApk RAMP: 1.00sec DWELL: 30.0sec Test 1: RMS Lim: 0n-35.00mA Test 2: INPHS Lim: 0n-5.000mA ARC DETECT:4us 10mA
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DISCHARGE: AS RAMP ON FAIL: ABORT SEQ
An example ACCAP menu is as follows –
Seq 1 Step 1 ACCAP LEVEL:1500.0V 60.0Hz BREAKDOWN: 49.50mApk RAMP: 1.00sec DWELL: 30.0sec C: 0.488p-1.512pF DF: 0.0000-0.0005 ARC DETECT:4us 10mA DISCHARGE: AS RAMP ON FAIL: ABORT SEQ
LEVEL. Allows the test voltage level and frequency to be programmed. Values cannot be set which are
beyond the range of possible output voltages and frequencies from the specific 95x or above the maximum voltage limit set by the user in the CNFG – TEST – USER MAX ACV setting.
SOURCE. Only available if Opt. AC-30 is installed. Allows the user to select whether to use the standard
internal source at the front panel HV terminal (INT) or the higher voltage source from the external AC-30 (EXT). This selection is automatically made and is not editable if the programmed level or frequency is beyond the capability of the other source.
DUT GROUNDED. Only available if option HSS is installed (and INT is selected in the SOURCE line above if
option AC-30 is also installed). This selection allows the user to select either –
o NO. This selection indicates that the DUT is isolated from ground, the 95x will use the current in
the RETURN terminal to measure leakage and detect breakdown. This is as if option HSS were not installed.
o YES. This selection indicates that the DUT is grounded, and the breakdown and/or leakage
currents are to be measured to ground. The 95x will use the current in the HV terminal to measure leakage and detect breakdown.
BREAKDOWN. Not available for the ACez type. Allows breakdown detection to be programmed as a
maximum instantaneous peak current level. Pressing the LIMIT key while this setting is selected causes it to be set to the maximum value. See Breakdown Current for further details regarding breakdown currents.
o The minimum value which can be set is 1uA. o The maximum value which can be set is as specified in the Peak Shutdown Current portion of
Surge Current Limiting and Shutdown.
RAMP. Allows the ramp time period to be programmed either as a time or rate. The UNIT key toggles the
selection between these two methods.
DWELL. Allows the dwell time period to be programmed to the desired time, or it may be set to be user
terminated by pressing the LIMIT key while this setting is selected.
Test 1 and Test 2. Only available for the ACW type (the ACez type has a single leakage limit range, which is
always enabled and is always the RMS leakage current, the ACCAP type has limits set in different units to ACez and ACW). These allow the user to define none, 1 or 2 leakage measurements to be checked against limits. For the test step to successfully pass when run, both the Test 1 and Test 2 measurements must pass their respective range checks or be disabled. The available selections for each are –
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o NONE. Disables the leakage measurement. o RMS. Selects that the leakage check is performed on the RMS current measurement. o INPHS. Selects that the leakage check is performed on the in-phase (i.e. resistive loading)
current measurement.
o QUAD. Selects that the leakage check is performed on the quadrature (i.e. reactive loading)
current measurement.
Lim. Not available for the ACCAP type (it has limits set in different units to ACez and ACW). Allows the
user to define ranges within which each selected current measurement is considered a PASS during the dwell period. The range can be entered in units of current or impedance, the UNIT key toggles the selection. For the impedance selection the user may optionally disable the upper limit by pressing the LIMIT key while the upper limit is selected. For the current selection the user may optionally disable the lower limit by entering a zero value for it.
o Setting a 0 minimum current limit disables the minimum limit and only applies the maximum
limit.
o The maximum current limit (or the minimum impedance limit) is the maximum loading current
which the specific 95x model and option content can continuously supply at the configured test voltage and frequency (see Loading Capability).
o For the ACez type the breakdown detection limit is automatically set to 1.414 times the
maximum RMS leakage current limit with a minimum of 1uApk.
C. Only available for the ACCAP type. Allows the user to define the range within which the capacitance
measurement is considered a PASS during the dwell period.
o The highest maximum limit which can be entered is determined by the maximum loading current
which the specific 95x model and option content can continuously supply at the configured test voltage and frequency (see Loading Capability).
DF. Only available for the ACCAP type. Allows the user to define the range within which the dissipation
factor measurement is considered a PASS during the dwell period. The limits are applied without regard to the polarity of the measured dissipation factor.
o Setting a DF range of 0.0000->1.0000 will effectively ignore the dissipation factor measurement
as all dissipation factors lay within this range by definition.
ARC DETECT. Not available for the ACez type and not available if DUT GROUNDED is set to YES. Allows
the user to program arc detection during this step. Both the time and current level can be independently programmed. See Arc Current and Time for details. Arc detection can also be disabled by setting the leftmost (time) setting to OFF. The 95x can be configured to not fail a test step when arcing is detected by setting the ARC setting in the CNFG – TEST sub-menu to DETECT ONLY.
DISCHARGE. Not available for the ACez type. Allows the user to program whether the discharge period
should use the same timing as the ramp period (AS RAMP), be as fast as possible (FAST) or skipped (NONE). If NONE is selected but the next step is not of an AC Voltage Withstand type then the FAST selection is used when the sequence is run. In the majority of cases, FAST should be used.
ON FAIL. Allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this step
(CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.
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HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
Optional Wire for
Continuity Sense
Return Wire
L
N

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is isolated from ground unless –
Option HSS is fitted And, the SOURCE setting is set to INT (or AC-30 is not fitted) And, the DUT GROUNDED setting is set to YES.
TESTING A DU T WITHOUT OPTION HS S OR WITH DUT GROUN DED SET TO NO
The DUT should be wired between the HV and RETURN terminals of the 95x; if Opt. AC-30 is being used (SOURCE setting is set to EXT) then the DUT should be wired between the output of the external AC-30 unit and the RETURN terminal of the 95x.
The 95x provides a safety ground for the DUT during the test via its’ RETURN terminal. The Continuity Sense feature may be used to ensure that the RETURN connection is correctly made by connecting the SENSE+ terminal to a point on the DUT which is connected to the RETURN connection. When deciding which point on the DUT to connect to the HV terminal and which point to connect to the RETURN terminal, the user should consider that only the voltage on the RETURN terminal is safe at all times.
For best high impedance load performance there should be low capacitance and leakage between the wires and for low level current measurements there should be little interference pickup in the RETURN wire. In extreme circumstances the RETURN wire should be the inner wire of a coaxial cable, with the shield connected to the
GUARD terminal of the 95x. This will significantly reduce the capacitance and leakage between the HV and RETURN wires. A cable such as RG174 is a suitable choice. If the Continuity Sense feature is being used then the SENSE+ connection should similarly be a coaxial cable.
The example above shows the connections for performing AC voltage withstand testing of Line/Neutral connections to the chassis of a DUT. The optional wire from the DUT chassis to the SENSE+ terminal of the 95x is used when the user wishes to use the Continuity Sense safety feature.
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SOURCE-
HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
L
N High Current Wire
Low Voltage Wire
SOURCE+
HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
Low Voltage Wire
The example above shows the connections to a DUT to perform both an AC withstand test on the Line/Neutral line power input, and an AC Ground Bond or DC LowΩ test on the chassis of the DUT in the same sequence. If wired in this manner, then no changes in connections are needed. This will increase the capacitive coupling between the HV wire and the other wires, which may need to be compensated for in highly sensitive applications. The Continuity Sense feature may also be used with this wiring configuration.
The example above shows the connections for performing an ACCAP type step to check a capacitor for value and breakdown.
TESTING A GR OUNDED DUT (OPTION HSS ONLY)
In this case the user only need connect the HV terminal of the 95x to the point on the DUT which is to be tested. It is expected that the DUT is grounded and that the breakdown and/or leakage is being tested to ground. For safety reasons or if unsure if the DUT is grounded, it may be desirable to also connect the DUT ground to either the RETURN or GUARD terminals of the 95x, however the user should ensure that the ground of the 95x and that of the DUT are within 5Vrms of each other otherwise excessive ground loop currents may flow, potentially damaging the 95x.
It should be noted that the 95x will measure the leakage current to ground from the HV terminal and it’s wiring in addition to the leakage current in the DUT itself. Particularly when performing AC Withstand testing, the wiring leakage current may be large because of capacitance between the wiring and nearby grounded objects or surfaces.
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CHECKING THA T THE DUT IS CONNECTE D
When testing a DUT using AC Voltage Withstand testing there is the possibility that a disconnected DUT will erroneously pass a test. There is always some amount of capacitance within the load which will always cause an amount of current to flow when properly connected, so the user is recommended to set a minimum RMS or QUAD current setting in one of the two allowed test limit ranges for the ACW type of step. If not configured for a grounded load, the user may also use the Continuity Sense feature to detect a disconnected RETURN path.

LEA D CO MPEN S ATIO N

For many applications lead compensation is not necessary for these types of test steps, as the wiring leakage is generally smaller than the DUT leakage limit and so can be ignored. However for the more sensitive requirements (e.g. the more stringent levels of medical safety leakage testing) and/or when long lengths of wiring are required, particularly if DUT GROUNDED is set to YES, then lead compensation may be needed.
If the capacitance of loose wiring is to be corrected for and an isolated DUT is being tested, then it is recommended to use shielding of the RETURN wiring rather than Lead Compensation; as the capacitance between loose unshielded wiring is very dependent on the exact routing of the wires.
Performing a lead compensation compensates for the resistive and capacitive leakage currents in the wiring to the 95x in all future runs of this test step. When performing a lead compensation the normal connections to the 95x should be in place, with the wiring positioned normally, only the DUT itself should not be connected. CAUTION High voltages will be present on the wiring while running in lead compensation mode. Ensure that the wiring and the (unused) DUT connections are safely positioned.
When performing a lead compensation the leakage limits are not enforced, otherwise the test step is executed normally.

EXA MPLE S

Example 1 -
A DUT is to have its’ Line/Neutral power connections tested to its’ chassis for “no breakdown” at 2000Vrms/60Hz
using a 1 second ramp and a 30 second dwell. It is known that the DUT leakage is less than 5mArms at this voltage level and frequency (if this is not known, then start by using 5mArms as the limit and adjust it as needed).
This is accomplished in a single step as follows –
Seq 1 Step 1 ACez Only breakdown detection is needed, so use the ACez type LEVEL:2000.0V 60.0Hz As required RAMP: 1.00sec As required DWELL: 30.0sec As required Lim: 0n-5.000mA As required
ON FAIL: ABORT SEQ
Example 2 -
It is required to test a 2 conductor cable which has a specification of >100Mohm resistive leakage and <100pF capacitance at 500Vrms, and a minimum breakdown voltage of 2000Vrms. A decision is made to test for breakdown using a 1 second ramp and a 1 second dwell time since the requirement does not specify it.
Optionally, the Lead Compensation feature could be used to adjust for the DUT wiring capacitance, allowing accurate measurement of the 100pF limit. Otherwise the measurement will include the capacitance of the wiring between the 95x and the DUT.
All of these tests are accomplished by two ACW test steps in a test sequence –
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Firstly test the lower voltage resistance and capacitance leakage.
Seq 1 Step 1 ACW Different breakdown and leakage limits needed, so use ACW LEVEL: 500.0V 60.0Hz As required BREAKDOWN: 5.000mApk Since the DUT is known to have little leakage this could be set lower RAMP: 0.02sec No timing requirement, so set for fast testing DWELL: 0.10sec No timing requirement, so set for fast testing Test 1: INPHS Test the resistive leakage Lim:100.0M-no maxΩ As required Test 2: QUAD Test the capacitive leakage Lim:26.50M-no maxΩ 26.5Mohm = 1/(2πFC) = the impedance of 100pF at 60Hz ARC DETECT:4us 10mA Optional DISCHARGE: NONE No need to discharge between this and the next step ON FAIL: ABORT SEQ No further test steps if this step fails
Secondly test the high voltage withstand capability.
Seq 1 Step 2 ACW Could use ACez if arc detection not needed LEVEL:2000.0V 60.0Hz As required BREAKDOWN: 5.000mApk Since the DUT is known to have little leakage this could be set lower RAMP: 1.00sec As required DWELL: 1.00sec As required Test 1: NONE No leakage testing required Test 2: NONE No leakage testing required ARC DETECT:4us 10mA Optional DISCHARGE: FAST Immediately discharge as this is the last step
ON FAIL: ABORT SEQ
Example 3 -
A 0.033uF 1000Vac capacitor is to be tested against its tolerance (0.033uF ± 5%) and DF (<1%) specifications.
A nominal capacitor at 1000V/60Hz will draw 12.4mArms, so this is within the capabilities of all 95x models so the capacitor can be tested at its’ maximum voltage rating.
This is accomplished in a single step as follows –
Seq 1 Step 1 ACCAP LEVEL:1000.0V 60.0Hz As required BREAKDOWN: 25.00mApk As required RAMP: 1.00sec Slow ramp to better measure breakdown voltage DWELL: 5.0sec Optional, could be faster C: 31.35n-34.65nF As required DF: 0.0000-0.0100 As required ARC DETECT:OFF Optional
DISCHARGE: FAST ON FAIL: ABORT SEQ

SPE CIFI C ATIO NS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the
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calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
LOADING CAPA BILITY
The listings below show the maximum loading current and power capabilities of the 95x at ambient temperatures ≤30C. For ambient temperatures above 30C linearly reduce the maximum loading current and power by 1%/C.
For frequencies above 100Hz other than 400Hz, the user should linearly interpolate using the <100Hz and 400Hz capabilities shown in the applicable listing.
Where both a current and power limit is shown, the most stringent limit applies.
951i-954i and 957i, <100Hz : 50mArms (40mArms resistive), reduce by 0.08mA per V above 5525Vrms
951i-954i and 957i, 400Hz : 35mArms, reduce by 0.065mA per V above 5600Vrms
Option AC-2, <100Hz : 200mArms (135mArms resistive), reduce by 0.67mA per V above 1750Vrms
Option AC-2, 400Hz : 140mArms, reduce by 0.4mA per V above 1700Vrms
Option 500VA, <100Hz : 100mArms (50mArms resistive), reduce by 0.14mA per V above 5425Vrms
500VA Above 65mArms has a limited test time (e.g. 1sec at 100mArms)
Option 500VA, 400Hz : 85mArms (50mArms resistive), reduce by 0.11mA per V above 5375Vrms
Above 65mArms has a limited test time (e.g. 1sec at 100mArms)
955i and 957i Opt. AC-10, <100Hz : 30mArms (20mArms resistive)
955i and 957i Opt. AC-10, 400Hz : 22mArms
Option AC-30 : 10mArms (7mArms resistive)
250VA
SURGE CURREN T LI MITING AND SH UTDOWN
Impedance Limiting 951-4i and 957i (standard build) : 12KΩ + 0.5H
Opt. 500VA : 7KΩ + 0.25H Opt. AC2 : 1.4KΩ + 0.2H 955i and 957i Opt. AC10 : 25KΩ + 1.0H SOURCE set to EXT : 200KΩ
Peak Shutdown Current 951-4i and 957i (standard build) : 120mA
Opt. 500VA : 145mA Opt. AC2 : 280mA 955i and 957i Opt. AC10 : 60mA SOURCE set to EXT : 21mA DUT GROUNDED set to YES : 50mA
TEST VOL TAGE AND FREQUENCY
Test Voltage Range 951-4i and 957i (standard build or Opt. 500VA) : 20 to 6000Vrms, reduce maximum
voltage by 0.6V per Hz above 100Hz 955i and 957i Opt. AC-10 : 50 to 10000Vrms, reduce maximum voltage by 1V per Hz above 100Hz Opt. HSS or HSS-2 : 20 to 4000Vrms Opt. AC-2 : 10 to 2000Vrms, reduce maximum voltage by 0.2V per Hz above 100Hz
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Opt. AC-30 : 120 to 30000Vrms For line voltages below 115V linearly reduce the maximum test voltage by 1%/V unless Opt. LOLINE is fitted (there is no reduction for Opt. LOLINE).
Test Voltage Accuracy <(± 0.5% ± 1.5V ± (0.01% + 0.2V) per mArms load ± 0.01% per Hz above 100Hz)
955i and 957i Opt. AC10 : Add ±0.1% above 7000Vrms Opt. AC-30 : <(± 1.5% ± 5V ± (0.05% + 1V) per mArms load)
Test Voltage Overshoot <5% (<0.5s ramp time)
<2% (>0.5s ramp time) Settling to <±0.5% of final value in <0.1sec + 2 cycles
Test Voltage Waveform Sinewave, 1.35 – 1.46 Crest Factor
Test Frequency Range 951-4i and 957i : 20 to 500Hz
955i and 957i Opt. AC10 : 40 to 500Hz Opt. AC-30 : 40 to 80Hz
Test Frequency Accuracy <±0.1%
CURRENT MEASUREMENTS (D UT I SOLATED)
Measurements are performed in the RETURN terminal of the 95x.
Breakdown Current 1uA to 280mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy <30usec detection time, <3msec response time (typically <500usec)
Leakage Current 0.0nA to 200mArms (RMS, In-phase or Quadrature)
Greater of 1 cycle or 10ms measurement period RMS : <(± 0.5% ± 10nA ± 0.15nA per kV*Hz) accuracy InPhs : <(± 0.5% ± 10nA ± 0.01nA per kV*Hz) accuracy Quad : <(± 0.5% ± 10nA ± 0.15nA per kV*Hz) accuracy Add 0.005% per Hz above 100Hz 955i and 957i Opt. AC10 : Add 50nA (RMS, InPhs and Quad) above 7000Vrms <±0.005° per Hz phase relative to test voltage (InPhs, Quad)
Arc Current 1 to 30mArms (50KHz-5MHz bandwidth)
<(± 10% ± 1mA) accuracy at 1MHz 4us, 10us, 15us, 20us, 30us or 40us measurement period
Cable Compensation <(± 1% of error ± 0.01pF)
CURRENT MEASUREMENTS (D UT GROUN DED, OPTION HSS ONLY)
Measurements are performed in the HV terminal of the 95x.
Breakdown Current 1uA to 50mApk (DC-50kHz bandwidth)
<(± 1.5% ± 1uA) accuracy <30usec detection time, <3msec response time (typically <500usec)
Leakage Current 0.0nA to 35mArms (RMS, In-phase or Quadrature)
Greater of 1 cycle or 10ms measurement period RMS or Quad : <(± 1.5% ± 100nA ± 10nA per kV*Hz) accuracy InPhs : <(± 1.5% ± 100nA ± 1nA per kV*Hz) accuracy
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DCez
DCW
DCIR
Use with High Capacitance Loads
Yes
Yes
Yes
Separate Breakdown and Leakage Limits
No
Yes
Yes
Detect Minimum Loading during ramp
No
Optional
Optional
Immediate FAIL on Breakdown detection throughout step
Yes
Yes
Yes
Delay after charging prior to applying leakage limits
No
Optional
Optional
Immediate FAIL on Leakage Failure
Yes
Yes
Optional
End Test on Passing Leakage current or impedance
No
No
Optional
End Test on Steady or improving Leakage current or impedance
No
No
Optional
Detect Arcing
No
Optional
Optional
Immediate FAIL on arc current detection throughout step
No
Optional
Optional
Timed Discharge
No
Optional
Optional
Smooth Transition to next test step if DC Withstand type
No
Optional
Optional
Add 0.005% per Hz above 100Hz <±0.005° per Hz phase relative to test voltage (InPhs, Quad)
Cable Compensation <(± 1% of error ± 0.1pF)
CAPACITANCE AN D DI SSIPATION FACTOR MEASURE MENTS (ACCAP TYPE)
Capacitance Add Test Voltage, Frequency, and Quad Leakage Current Accuracies as percentages
Examples at 1000V/60Hz with an isolated DUT ­1pF (= 377nA) : 0.65% + 0.1% + 4.73% = ±5.48% 10pF (= 3.77uA) : 0.65% + 0.1% + 0.92% = ±1.67% 100pF (= 37.7uA) : 0.65% + 0.1% + 0.54% = ±1.29% 1nF (= 377uA) : 0.65% + 0.1% + 0.5% = ±1.25% 10nF (= 3.77mA) : 0.65% + 0.1% + 0.5% = ±1.25% 100nF (= 37.7mA) : 0.65% + 0.1% + 0.5% = ±1.25%
Dissipation Factor For test voltages >100V at 60Hz and capacitive load currents >200uA, the DF
accuracy is ±0.005. For accuracy under other circumstances please contact ViTREK.
TEST TIMING
Ramp 0.00 to 9999sec
<(± 1% ± 0.1sec ± 1 cycle) accuracy
Dwell 0.02 to 9999sec or user terminated
<(± 0.05% ± 20ms ± 1 cycle) accuracy
Fast Discharge <(20ms + 1 cycle)

DC VOL TAGE WIT HSTAND A ND L EAKAGE TEST ING ( DCEZ , D CW A ND DCIR)

These are used to test that a DUT does not exhibit breakdown or (optionally) arcing in the presence of an applied DC voltage and optionally to test that the DUT leakage current or impedance is within user set limits.
All of these are performed in the same manner; the difference between them is in the amount of configuration available. The DCez type is intended for basic breakdown detection, the DCW and DCIR types for comprehensive breakdown, arcing and leakage testing.
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VOLTAGE
TIME
RAMP
(0 to 10000secs)
DWELL
(0.02 to 10000secs or user terminated)
DISCHARGE
(0 to 10000secs)
Breakdown and Arc Detection Active
Min & Max Leakage Limits
Enforced
DELAY
(0 to 10000secs)

ACT IONS WHI LE RU NNIN G

For the DCez and DCW types, on any failure the step is immediately aborted, and optionally the entire test
sequence may be aborted.
For the DCW and DCIR types, the loading current is analyzed during the last ¾ of the ramp phase and
compared to the configured minimum load capacitance for the step (if enabled to do so).
If the step is the MANUAL sequence, then the user may manually change the voltage during the dwell
period if the load capacitance is low.
For the DCIR type, on any failure other than leakage limit testing the step is immediately aborted. The
operation of the leakage limit test is dependent on the “End On” setting.
For the DCez type, the delay is of zero length, the discharge period is of zero length and arc detection is
not enabled.
For the DCW and DCIR types, the discharge period can be programmed to be skipped and the next step
started at this steps’ dwell voltage level if the next step is of the DCez, DCW or DCIR type.
During the discharge period the voltage is reduced to zero in the programmed time or at the programmed
rate. If the actual voltage significantly lags the expected voltage during the discharge, then discharge circuitry is automatically engaged to speed up the discharge. The test step will not fully complete until the actual voltage is reduced to a safe level. The discharge circuitry is a combination of fixed and controlled loading. Refer to Discharge in the Specifications section for details. The controlled loading has energy limitations which may prevent it engaging until the voltage has been reduced by the fixed loading, and the user may restrict this further by setting a lower maximum discharge current setting in the CNFG – TEST menu. The HIGH VOLTAGE OR HIGH CURRENT PRESENT warning symbol on the front panel of the 95x is illuminated whenever an unsafe voltage is present on the HV terminal. If this is the last step in a sequence then the discharge circuitry remains engaged after the test step has fully terminated. It is not disengaged until the user finishes reviewing the results of this sequence.
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CON FIGU RING

An example DCez menu is as follows –
Seq 1 Step 1 DCez LEVEL: 1500.0V RAMP: 1.00sec DWELL: 30.0sec Lim: 0n-15.00mA ON FAIL: ABORT SEQ
An example DCW menu is as follows –
Seq 1 Step 1 DCW LEVEL: 1500.0V BREAKDOWN: 30.00mApk RAMP: 1.00sec DWELL: 30.0sec Delay: 0.25sec Lim: 0n-15.00mA ARC DETECT:4us 10mA DISCHARGE: AS RAMP ON FAIL: ABORT SEQ
An example DCIR menu is as follows –
Seq 1 Step 1 DCIR LEVEL: 1500.0V BREAKDOWN: 30.00mApk RAMP: 1.00sec DWELL: 30.0sec Delay: 0.25sec End On: PASS
Lim: 100.0K-no max ARC DETECT:4us 10mA DISCHARGE: AS RAMP ON FAIL: ABORT SEQ
LEVEL. Allows the test voltage level to be programmed. Note that a value cannot be set which is beyond
the range of possible output voltages from the specific 95x or above the maximum voltage limit set by the user in the CNFG – TEST – USER MAX DCV setting.
DUT GROUNDED. Only available if option HSS or HSS-2 is installed. This selection allows the user to
select either –
o NO. This selection indicates that the DUT is isolated from ground, the 95x will use the current in
the RETURN terminal to measure leakage and detect breakdown. This is as if option HSS or HSS- 2 were not installed.
o YES. This selection indicates that the DUT is grounded, the 95x will use the current in the HV
terminal to measure leakage and detect breakdown.
BREAKDOWN. Not available for the DCez type. Allows breakdown detection to be programmed as a
maximum instantaneous peak current level. Pressing the LIMIT key while this setting is selected causes it to be set to the maximum value. See Breakdown Current for further details regarding breakdown currents.
o The minimum value which can be set is 1uA.
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o The maximum value which can be set is as specified in the Peak Shutdown Current portion of
Surge Current Limiting and Shutdown.
RAMP. Allows the ramp time period to be programmed either as a time or rate. The UNIT key toggles the
selection between these two methods.
o For loads having >0.03uF capacitance the test ramp time should be >0.1sec. The ramp time may
need to be extended beyond this to ensure the charging current is less than the desired breakdown detection current. For reference, the charging current (in microamps) = C.(dV/dT) where C is the capacitance in uF and (dV/dT) is the ramp rate in Volts per second (e.g. 1000V/sec ramp into a 10uF load is 10000uA =10mA charging current). For optimum results –
For loads >0.05uF the ramp time should be >0.5sec. For loads >2uF the ramp time should be >1sec. For loads >20uF the ramp time should be >2sec.
o If a load has significant resistance in series with capacitance, then ensure that the charging
current is within the capability of the series resistance to avoid it being damaged. If necessary, reduce the charging current by using a slower ramp rate.
Min Load. Not available for the DCez type. This is only available if CNFG–TEST–MIN LOAD is set to YES.
This allows the user to specify a minimum capacitance load which should be encountered during ramp. If this loading is not encountered during ramp then the test is failed with a <MIN LOAD status. This provides an easy to use and very sensitive determination of whether the load is properly connected. Please note the following –
o For settings of below 1nF there must be enough charging current flow during ramp for the set
minimum capacitive load to be successfully detected. For a DUT GROUNDED setting of NO (or option HSS or HSS-2 not fitted), then the ramp rate should be >1000V/sec for a 1pF setting reducing to >1V/sec (and lower) for a 1nF (and higher) setting. For a DUT GROUNDED setting of YES a setting below 1nF is not recommended.
o For settings of over 1nF then the actual load capacitance is estimated during ramp and compared
to the Min Load setting (this has no minimum ramp time requirement). This is not an accurate DUT capacitance measurement, the accuracy is typically 10%.
o If there is sufficient resistive load then this is automatically detected and there will be no <MIN
LOAD failure.
o If the expected capacitive load is known, then a setting of half the expected capacitance is
recommended.
DWELL. Allows the dwell time period to be programmed to the desired time, or it may be set to be user
terminated by pressing the LIMIT key while this setting is selected.
Delay. Not available for the DCez type. Allows the user to program a delay within the dwell period before
the leakage range check is to be performed.
o The 95x series use a “strong voltage source” method for the DCez, DCW and DCIR types. This
enables the use of much shorter test times when performing testing into capacitive loads since it
is being both charged and tested from a low impedance source, unlike the “classical” approach of
using a high source impedance to reduce the effects of voltage source noise but needing very long test times into capacitive loads. For the 95x, there is a short stabilization period required
after the end of ramp when making very low leakage current tests (e.g. 10’s of nA) with
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significant capacitance, typically this is less than 0.5sec for loads up to 1uF extending to 5sec for loads of 10uF and above, which should be accommodated by setting the delay setting accordingly. After this there is no further settling time required for the 95x at any leakage current level. If performing breakdown testing at higher current levels (e.g. 100’s of uA and above) then no delay is typically required.
o Some capacitive loads have a significant dielectric storage affect. Because of this there may be
significant leakage current flowing for some time after the dwell period starts. Depending on the materials, dielectric storage effects can last from a fraction of a second to many tens of seconds or even longer.
End On. Only available for the DCIR type. Allows the user to select when the dwell period will be ended –
o PASS. The dwell period will be immediately terminated with a PASS status if the leakage
measurement is within limits continuously for at least 2% of the dwell period. If the dwell period ends without this being detected then the pass/fail status for leakage is based upon the final measurement taken at the end of the dwell period.
o FAIL. The dwell period will be immediately terminated with a FAIL status if the leakage
measurement is outside of limits continuously for at least 2% of the dwell period. If the dwell period ends then the test step will have a PASS status for leakage. This selection produces similar results to the DCez and DCW types (which terminate dwell immediately on a FAIL condition).
o TIME. The dwell period always extends for the entire programmed period. The pass/fail status
for leakage is based upon the final measurement taken at the end of the dwell period.
o STDY. The dwell period will be automatically terminated when the leakage is within the
allowable limits and the current is steady or decreasing (i.e. steady or increasing resistance). If the dwell period ends then the test step will have a FAIL status for leakage.
Lim. Allows the user to define the range within which the leakage current is considered a PASS during the
dwell period. The range can be entered in units of current or impedance for any type of test step, the UNIT key toggles the selection. For the impedance selection the user may optionally disable the upper limit by pressing the LIMIT key while the upper limit is selected.
o Setting a zero minimum current limit disables the minimum limit and only applies the maximum
limit.
o The maximum allowed current limit (or the minimum impedance limit) is the maximum loading
current which the specific 95x model and option content can continuously supply at the configured test voltage (see Loading Capability).
o Setting a zero minimum and maximum leakage currents for the DCW type disables leakage
current testing entirely, only the breakdown and (optionally) the arc current limits are used.
o Setting a very small minimum leakage current (or maximum leakage resistance) limit to attempt
to detect a disconnected DUT is not recommended, the Min Load setting should be used instead.
o For the DCez type the breakdown detection limit is automatically set to the maximum leakage
current limit with a minimum of 1uApk.
ARC DETECT. Not available for the DCez type and not available if DUT GROUNDED is set to YES. Allows
the user to program arc detection during this step. Both the time and current level can be independently programmed. See Arc Current and Time for details. Arc detection can also be disabled by setting the
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leftmost (time) setting to OFF. The 95x can be configured to not fail a test step when arcing is detected by setting the ARC setting in the CNFG – TEST sub-menu to DETECT ONLY.
DISCHARGE. Not available for the DCez type. Allows the user to program whether the discharge period
should use the same timing as the ramp period (AS RAMP), be as fast as possible (FAST) or skipped (NONE). If NONE is selected but the next step is not of a DCez, DCW, or DCIR type then the FAST selection is used when the sequence is run.
o If a load has significant resistance in series with capacitance, then ensure that the discharging
current is within the capability of the series resistance to avoid it being damaged. If necessary, reduce the maximum discharging current by reducing the CNFG – TEST – MAX DISCHARGE setting.
ON FAIL. Allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this step
(CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.
PERFORMING A MULTI-STAGE RA MP O R MULTIPLE VO LTAGE TESTS
The 95x allows the user to skip the discharge phase if desired in DCW and DCIR types. If a step has DISCHARGE set to NONE and the next step is also a DC Voltage Withstand type and is at a higher voltage than the preceding step, then the discharge phase is skipped automatically. This enables the user to perform a multi-stage ramp with optional dwell phases between each ramp stage.
If each step in such a series has non-zero dwell times then their leakage currents tests are performed normally, however if the dwell time is set to zero in any but the final step then the dwell phase is also skipped in those steps and any dwell leakage current (or resistance) limits defined in such a step will be ignored and the ramp phase of the next step is immediately started after the end of the preceding stage ramp.
There are several scenarios where this capability assists the user, for example –
If it is desired to perform leakage measurements at several voltages but it is not desirable to discharge
to zero between each voltage. The user can configure several steps, each with DISCHARGE set to NONE. In this case there is no discharge phase between each step, only for the final step or if a failure occurs.
If it is desired to perform leakage current tests at timed intervals, e.g. at 10 minute intervals, then the
user may configure many steps, all set for the same voltage and leakage current limits and with DISCHARGE set to NONE. The first step would be configured with the desired ramp settings, all remaining steps are configured with the desired interval between leakage checks as the ramp time. All steps should have a short (but not zero) dwell time configured during which the leakage current will be measured and checked against the limits. Up to 255 such steps can be configured in this manner in a sequence.
If ramping to a final voltage near the maximum ability of the 95x but the maximum current of the 95x
at the final voltage is limiting the ability to charge the load in a timely manner, then the user should consider using a multi-stage ramp by using two (or more) steps. The first step should be configured with a final voltage less than the desired final voltage and with a faster ramp rate and a higher breakdown setting than would have otherwise been possible in a single step because of the lower final voltage. This first step should be configured with DISCHARGE set to NONE and a 0sec dwell period. The second step will be configured as required in all regards, having the slower ramp rate associated with the lower possible breakdown current setting.
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HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
Optional Wire for
Continuity Sense
Return Wire
L
N
Most materials have a higher dielectric storage effect when the ramp charging current is higher. It
may be desirable to perform a faster, higher current ramp to a voltage lower than required in one step, followed by a slower, lower current, ramp to the required final voltage to assist in reducing these effects.

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is isolated from ground unless –
Option HSS or HSS-2 is fitted And, the DUT GROUNDED setting is set to YES.
TESTING A DU T WI TH OUT OPTION HS S, WITHOUT OP TION H SS-2, OR WITH D UT GROUNDED SET TO NO
The DUT should be wired between the HV and RETURN terminals of the 95x.
The 95x provides a safety ground for the DUT during the test via its’ RETURN terminal. The Continuity Sense feature may be used to ensure that the RETURN connection is correctly made by connecting the SENSE+ terminal to a point on the DUT which is connected to the RETURN connection. When deciding which point on the DUT to connect to the HV terminal and which point to connect to the RETURN terminal, the user should consider that only the voltage on the RETURN terminal is safe at all times.
For best high impedance load performance there should be low leakage between the wires and for low level current measurements there should be little interference pickup in the RETURN wire. In extreme circumstances the RETURN wire should be the inner wire of a coaxial cable, with the shield connected to the GUARD terminal of the 95x. This will significantly reduce the capacitance and leakage between the HV and RETURN wires. A cable such as RG174 is a suitable choice. If the Continuity Sense feature is being used then the SENSE+ connection should similarly be a coaxial cable.
The example above shows the connections for performing DC voltage withstand testing of Line/Neutral connections to the chassis of a DUT. The optional wire from the DUT chassis to the SENSE+ terminal of the 95x is used when the user wishes to use the Continuity Sense safety feature.
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SOURCE-
HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
L
N High Current Wire
Low Voltage Wire
SOURCE+
The example above shows the connections to a DUT to perform both a DC withstand test on the Line/Neutral line power input, and an AC Ground Bond or DC LowΩ test on the chassis of the DUT in the same sequence. If wired in this manner, then no changes in connections are needed. This will increase the capacitive coupling between the HV wire and the other wires, which may need to be compensated for in highly sensitive applications. The Continuity Sense feature may also be used with this wiring configuration.
TESTING A GR OUNDED DUT (OPTION HSS OR HSS-2 ONLY)
In this case the user only need connect the HV terminal of the 95x to the point on the DUT which is to be tested. It is expected that the DUT is grounded and that the breakdown and/or leakage is being tested to ground. For safety reasons or if unsure if the DUT is grounded, it may be desirable to also connect the DUT ground to either the RETURN or GUARD terminals of the 95x however the user should ensure that the ground of the 95x and that of the DUT are within 5Vrms of each other otherwise excessive ground loop currents may flow, potentially damaging the 95x.
CHECKING THA T THE DUT IS CONNECTE D
When testing a DUT during DC Voltage Withstand testing there is the possibility that a disconnected DUT will erroneously pass a test. There is always some amount of capacitance within the load which will always cause an amount of current to flow during ramp when properly connected, so the user is recommended to set a MIN LOAD setting for this type of step. If not configured for a grounded load, the user may also use the Continuity Sense feature to detect a disconnected RETURN path.
Using the MIN LOAD setting is preferred over setting a minimum leakage current or maximum leakage impedance, particularly when the load has very little leakage and is capacitive, as this method is both more reliable and more sensitive.

LEA D CO MPEN S ATIO N

For many applications lead compensation is not necessary for these types of test steps, as the wiring leakage is generally smaller than the DUT leakage limit and so can be ignored. However for the more sensitive requirements lead compensation may be needed.
Performing a lead compensation compensates for any leakage currents in the wiring to the 95x in all future runs of this test step. When performing a lead compensation the normal connections to the 95x should be in place, with the wiring positioned normally, only the DUT itself should not be connected. CAUTION High voltages will be present on the wiring while running in lead compensation mode. Ensure that the wiring and the (unused) DUT connections are safely positioned.
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When performing a lead compensation the leakage limits are not enforced, otherwise the test step is executed normally.

EXA MPLE S

Example 1 -
A DUT is to have its’ Line/Neutral power connections tested to its’ chassis for “no breakdown” at 2000Vdc using a 1
second ramp and a 30 second dwell. It is known that the DUT leakage is less than 5mA at this voltage level (if this is not known, then start by using 5mA as the limit and adjust it as needed).
This is accomplished in a single step as follows –
Seq 1 Step 1 DCez Only breakdown detection is needed, so use the DCez type LEVEL: 2000.0V As required RAMP: 1.00sec As required DWELL: 30.0sec As required Lim: 0n-5.000mA As required
ON FAIL: ABORT SEQ
Example 2 –
A solar panel is to be tested for “no breakdown” at 2500Vdc using a 1 second ramp and a 5 second dwell time. The
panel is estimated to have between 1 and 4uF of capacitance. The test limit for breakdown has been decided to be 1mA and it has been decided to not test for arcing in the panel because of its’ capacitance.
This is accomplished in a single step as follows –
Seq 1 Step 1 DCW Different breakdown and leakage limits, so use DCW LEVEL: 2500.0V As required BREAKDOWN: 20.00mApk Must be greater than the charging current RAMP: 1.00sec As required DWELL: 5.00sec As required Delay: 1.00sec Allow for dielectric storage in the panel Lim: 0n-1.000mA As required ARC DETECT:OFF As required
DISCHARGE: FAST ON FAIL: ABORT SEQ
Example 3 –
The solar panel used in example 2 above is also required to be tested for insulation resistance at 500Vdc, the specification requires the panel to have >100Mohm resistance. A ramp time of 1 second and a dwell time of 5 seconds have been chosen.
The DCIR test is performed first since if the DCIR were performed after the breakdown test then there would be much longer settling time required because the panel is settling from 2500V to 500V, i.e. a 2000V change rather than a 500V change prior to the very sensitive DCIR measurement.
This is accomplished in two steps as follows –
Seq 1 Step 1 DCIR This could also be a DCW test with the same results LEVEL: 500.0V As required BREAKDOWN: 5.000mApk Must be greater than the charging current RAMP: 1.00sec As required DWELL: 5.00sec As required
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Delay: 2.00sec Allow for dielectric storage in the panel End On: FAIL As required Lim: 100.0M-no max As required ARC DETECT:OFF As required DISCHARGE: NONE No need to discharge before the next step, reduces test time ON FAIL: ABORT SEQ Optional, could continue testing if fails
Seq 1 Step 2 DCW Different breakdown and leakage limits, so use DCW LEVEL: 2500.0V As required BREAKDOWN: 20.00mApk Must be greater than the charging current RAMP: 1.00sec As required DWELL: 5.00sec As required Delay: 1.00sec Allow for dielectric storage in the panel Lim: 0n-1.000mA As required ARC DETECT:OFF As required
DISCHARGE: FAST ON FAIL: ABORT SEQ
Example 4 –
In example 3 above, it is required to ensure that the panel is connected to the 95x during the tests. Since the panel has very little DC leakage but has significant capacitance this is easily achieved by adding a low voltage AC test at the start of the sequence. Since the load has a minimum capacitance of 1uF and a maximum of 4uF, the current at 10V/20Hz will be between 1.25 and 5mArms. This requires that Opt.AC-2 is installed.
This is accomplished in three steps as follows –
Seq 1 Step 1 ACez Simple RMS min and breakdown, so use ACez LEVEL: 10.0V 20.0Hz As required RAMP: 0.02sec Use a fast time to reduce test time DWELL: 0.10sec Use a fast time to reduce test time Lim: 1.000m-5.000mA As required ON FAIL: ABORT SEQ No need for further tests if fails
Seq 1 Step 2 DCIR This could also be a DCW test with the same results LEVEL: 500.0V As required BREAKDOWN: 5.000mApk Must be greater than the charging current RAMP: 1.00sec As required DWELL: 5.00sec As required Delay: 2.00sec Allow for dielectric storage in the panel End On: FAIL As required Lim: 100.0M-no max As required ARC DETECT:OFF As required DISCHARGE: NONE No need to discharge before the next step, reduces test time ON FAIL: ABORT SEQ Optional, could continue testing if fails
Seq 1 Step 3 DCW Different breakdown and leakage limits, so use DCW LEVEL: 2500.0V As required BREAKDOWN: 20.00mApk Must be greater than the charging current RAMP: 1.00sec As required DWELL: 5.00sec As required
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Delay: 1.00sec Allow for dielectric storage in the panel Lim: 0n-1.000mA As required ARC DETECT:OFF As required
DISCHARGE: FAST ON FAIL: ABORT SEQ

SPE CIFI CATI ONS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
LOADING CAPA BILITY
The listings below show the loading capabilities of the 95x at ambient temperatures ≤30C. For ambient temperatures above 30C linearly reduce the maximum loading power and current by 1%/C.
Output powers above 200W have a limited test time (e.g. 4 seconds at 250W).
If option HSS-2 is fitted then the maximum loading is restricted to a maximum of 5mA.
Capacitive loading is only limited by the maximum ramp time (9999.9sec) and the maximum load current, typically this is a 1F load.
951i, 952i and 956i : <50mA, reduce by 0.05mA per V above 6000V
953i, 954i and 955i : <9000V : <30mA, reduce by 0.0067mA per V above 6000V
>9000V : <10mA, reduce by 0.0025mA per V above 9000V
957i : <10mA, reduce by 0.001mA per V above 10000V
SURGE CURREN T LI MITING AND SHUTDOWN
Impedance Limiting 951i, 952i and 956i : 6.5KΩ
953i, 954i and 955i : 12.5KΩ 957i : 24 KΩ
Peak Shutdown Current 951i, 952i and 956i : 80mA (50mA if DUT GROUNDED set to YES)
953i, 954i and 955i : 40mA 957i : 20mA Option HSS-2: 5mA
TEST VOL TA GE
Test Voltage Range 951i, 952i and 956i : 20 to 6500V
953i, 954i and 955i : 40 to 11000V 957i : 75 to 15000V Opt. HSS or HSS-2 : 20 to 5000V For line voltages below 115V linearly reduce the maximum test voltage by 1%/V unless Opt. LOLINE is fitted (there is no reduction for Opt. LOLINE).
Test Voltage Accuracy Except 957i: <(± 0.25% ± 1.25V ± (0.01% + 0.05V) per mA load)
957i: <(± 0.75% ± 2V ± (0.01% + 0.05V) per mA load), add 0.5% above 10000V Opt. HSS-2: <(± 1% ± 2V ± 1V per mA load)
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Test
Voltage
C < 0.01uF
C = 0.01uF to 1uF
C = 1uF to 5uF
951i, 952i or 956i
50V
10K-30GΩ : ±0.8%±(R/1GΩ)%
10K-20GΩ :
±0.8%±(R/600MΩ)%
10K-10GΩ :
±0.8%±(R/400MΩ)%
100V
10K-60GΩ : ±0.7%±(R/2GΩ)%
10K-30GΩ : ±0.7%±(R/1GΩ)%
10K-20GΩ :
±0.7%±(R/600MΩ)%
250V
10K-150GΩ : ±0.6%±(R/5GΩ)%
10K-60GΩ : ±0.6%±(R/1.5GΩ)%
10K-30GΩ : ±0.6%±(R/1GΩ)%
500V
10K-300GΩ :
±0.6%±(R/10GΩ)%
10K-80GΩ : ±0.6%±(R/2.5GΩ)%
10K-40GΩ : ±0.6%±(R/1GΩ)%
1000V
20K-600GΩ :
±0.6%±(R/20GΩ)%
20K-100GΩ : ±0.6%±(R/3GΩ)%
20K-50GΩ : ±0.6%±(R/1.5GΩ)%
2500V
50K-1.5TΩ : ±0.6%±(R/50GΩ)%
50K-100GΩ : ±0.6%±(R/3GΩ)%
50K-50GΩ : ±0.6%±(R/1.5GΩ)%
5000V
100K-3TΩ :
±0.6%±(R/100GΩ)%
100K-100GΩ : ±0.6%±(R/3GΩ)%
100K-50GΩ :
±0.6%±(R/1.5GΩ)%
953i, 954i or 955i
50V
10K-30GΩ : ±0.8%±(R/1GΩ)%
10K-15GΩ :
±0.8%±(R/500MΩ)%
10K-10GΩ :
±0.8%±(R/300MΩ)%
Test Voltage Overshoot <5% (<0.25s ramp time)
<1% Settling to <±0.1% of final value in <0.5sec
CURRENT MEASUREMENTS (D UT I SOLATED)
Measurements are performed in the RETURN terminal of the 95x.
Breakdown Current 1uA to 280mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy <30usec detection time <3msec response time (typically <500usec)
Leakage Current 0.0nA to 200mA
7.25msec measurement period (100ms for dwell time >2 sec) <(± 0.25% ± 0.5nA) accuracy Capacitive Loading Effects : 951i, 952i and 956i : add X * (± 0.2nA ± (2.5nA per KV)) 953i, 954i and 955i : add X * (± 0.3nA ± (3.5nA per KV)) 957i : add X * (± 0.5nA ± (5nA per KV)) X = (C/0.01uF) below 0.01uF, or X = √(C/1uF) above 1uF, or otherwise X = 1.0
Arc Current 1 to 30mArms (50KHz-5MHz bandwidth)
<(± 10% ± 1mA) accuracy at 1MHz 4us, 10us, 15us, 20us, 30us or 40us measurement period
Cable Compensation <(± 1% of error)
RESISTANCE MEASUREMENTS (DUT ISOLATED)
Measurements are performed between the HV and RETURN terminals of the 95x.
For applied voltage, breakdown current and arc current accuracies see above.
In the chart below R is the reading in Ohms, C is the capacitive loading. Interpolate between voltages as needed, for accuracies at capacitances above 5uF consult ViTREK. Accuracies are shown as the percentage of the reading.
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100V
10K-60GΩ : ±0.7%±(R/2GΩ)%
10K-25GΩ :
±0.7%±(R/800MΩ)%
10K-15GΩ :
±0.7%±(R/500MΩ)%
250V
10K-150GΩ : ±0.6%±(R/5GΩ)%
10K-40GΩ : ±0.6%±(R/1.3GΩ)%
10K-25GΩ :
±0.6%±(R/750MΩ)%
500V
17K-300GΩ :
±0.6%±(R/10GΩ)%
17K-60GΩ :
±0.6%±(R/1.75GΩ)%
17K-30GΩ :
±0.6%±(R/900MΩ)%
1000V
34K-600GΩ :
±0.6%±(R/20GΩ)%
34K-75GΩ : ±0.6%±(R/2GΩ)%
34K-35GΩ : ±0.6%±(R/1GΩ)%
2500V
84K-1.5TΩ : ±0.6%±(R/50GΩ)%
84K-80GΩ : ±0.6%±(R/2.5GΩ)%
84K-40GΩ : ±0.6%±(R/1GΩ)%
5000V
167K-3TΩ :
±0.6%±(R/100GΩ)%
167K-90GΩ :
±0.6%±(R/2.5GΩ)%
167K-40GΩ : ±0.6%±(R/1GΩ)%
10000V
1.34M-6TΩ :
±0.6%±(R/200GΩ)%
1.34M-90GΩ :
±0.6%±(R/2.5GΩ)%
1.34M-40GΩ :
±0.6%±(R/1GΩ)%
957i
100V
10K-60GΩ : ±1.2%±(R/2GΩ)%
10K-20GΩ :
±1.2%±(R/500MΩ)%
10K-10GΩ :
±1.2%±(R/300MΩ)%
250V
25K-150GΩ : ±1.1%±(R/5GΩ)%
25K-30GΩ : ±1.1%±(R/1GΩ)%
25K-15GΩ :
±1.1%±(R/500MΩ)%
500V
50K-300GΩ :
±1.1%±(R/10GΩ)%
50K-40GΩ : ±1.1%±(R/1.3GΩ)%
50K-20GΩ :
±1.1%±(R/650MΩ)%
1000V
100K-600GΩ :
±1.1%±(R/20GΩ)%
100K-50GΩ :
±1.1%±(R/1.5GΩ)%
100K-25GΩ :
±1.1%±(R/700MΩ)%
2500V
250K-1.5TΩ :
±1.1%±(R/50GΩ)%
250K-60GΩ :
±1.1%±(R/1.75GΩ)%
250K-25GΩ :
±1.1%±(R/800MΩ)%
5000V
500K-3TΩ :
±1.1%±(R/100GΩ)%
500K-60GΩ :
±1.1%±(R/1.8GΩ)%
500K-25GΩ :
±1.1%±(R/800MΩ)%
10000V
1M-6TΩ : ±1.1%±(R/200GΩ)%
1M-60GΩ : ±1.1%±(R/1.8GΩ)%
1M-25GΩ :
±1.1%±(R/800MΩ)%
15000V
3M-10TΩ : ±1.6%±(R/300GΩ)%
3M-60GΩ : ±1.6%±(R/1.8GΩ)%
3M-25GΩ :
±1.6%±(R/800MΩ)%
CURRENT MEASUREMENTS (D UT GROUN DED, OPTION HSS ONLY)
Measurements are performed in the HV terminal of the 95x.
Breakdown Current 1uA to 50mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy <30usec detection time <3msec response time (typically <500usec)
Leakage Current 0.00uA to 50mA
7.25msec measurement period (100ms for dwell time >2 sec) <(± 1% ± 50nA ± (10nA per KV)) accuracy Capacitive Loading Effects : Add X * (± 0.2nA ± (2.5nA per KV)) X = (C/0.01uF) below 0.01uF, or X = √(C/1uF) above 1uF, or otherwise X = 1.0
Cable Compensation <(± 1% of error)
CURRENT MEASUREMENTS (D UT GROUN DED, OPTION HSS-2 ONLY)
Measurements are performed in the HV terminal of the 95x.
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Test
Voltage
C < 0.01uF
C = 0.01uF to 1uF
C = 1uF to 5uF
50V
10K-300MΩ :
±1.5%±(R/10MΩ)%
10K-300MΩ :
±1.5%±(R/10MΩ)%
10K-300MΩ :
±1.5%±(R/10MΩ)%
100V
10K-600MΩ :
±1.4%±(R/20MΩ)%
10K-600MΩ :
±1.4%±(R/19MΩ)%
10K-600MΩ :
±1.4%±(R/18MΩ)%
250V
10K-1.5GΩ : ±1.3%±(R/45MΩ)%
10K-1.5GΩ :
±1.3%±(R/45MΩ)%
10K-1.4GΩ :
±1.3%±(R/40MΩ)%
500V
10K-3GΩ : ±1.3%±(R/90MΩ)%
10K-2.75GΩ :
±1.3%±(R/80MΩ)%
10K-2.6GΩ :
±0.6%±(R/80MΩ)%
1000V
20K-5GΩ : ±1.3%±(R/160MΩ)%
20K-5GΩ : ±1.3%±(R/150MΩ)%
20K-4.5GΩ :
±1.3%±(R/130MΩ)%
2500V
50K-11GΩ : ±1.3%±(R/300MΩ)%
50K-9GΩ : ±1.3%±(R/250MΩ)%
50K-8GΩ : ±1.3%±(R/240MΩ)%
4000V
80K-14.5GΩ :
±1.3%±(R/400MΩ)%
80K-12GΩ :
±1.3%±(R/350MΩ)%
80K-9.5GΩ :
±1.3%±(R/280MΩ)%
Test
Voltage
C < 0.01uF
C = 0.01uF to 1uF
C = 1uF to 5uF
50V
50K-3GΩ : ±3.5%±(R/100MΩ)%
50K-3GΩ : ±3.5%±(R/100MΩ)%
50K-3GΩ : ±3.5%±(R/100MΩ)%
100V
50K-6GΩ : ±2.5%±(R/200MΩ)%
50K-6GΩ : ±2.5%±(R/190MΩ)%
50K-6GΩ : ±2.5%±(R/180MΩ)%
250V
50K-15GΩ :
±2.5%±(R/450MΩ)%
50K-15GΩ : ±2.5%±(R/450MΩ)%
50K-14GΩ :
±2.5%±(R/400MΩ)%
500V
100K-30GΩ :
±2.5%±(R/900MΩ)%
100K-27.5GΩ :
±2.5%±(R/800MΩ)%
100K-26GΩ :
±2.5%±(R/800MΩ)%
Breakdown Current 1uA to 5mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy <30usec detection time <3msec response time (typically <500usec)
Leakage Current 0.000uA to 5mA
7.25msec measurement period (100ms for dwell time >2 sec) <(± 1% ± 5nA ± (1nA per KV)) accuracy Capacitive Loading Effects : Add X * (± 0.2nA ± (2.5nA per KV)) X = (C/0.01uF) below 0.01uF, or X = √(C/1uF) above 1uF, or otherwise X = 1.0
Cable Compensation <(± 1% of error)
RESISTANCE MEASUREMENTS (DUT GROUNDED, OPTIO N HSS ONLY)
Measurements are performed between the HV terminal of the 95x and ground.
For applied voltage, breakdown current and arc current accuracies see above.
In the chart below R is the reading in Ohms, C is the capacitive loading. Interpolate between voltages as needed, for accuracies at capacitances above 5uF consult ViTREK.
RESISTANCE MEASUREMENTS (DUT GROUNDED, OPTIO N HSS-2 ONLY)
Measurements are performed between the HV terminal of the 95x and ground.
For applied voltage, breakdown current and arc current accuracies see above.
In the chart below R is the reading in Ohms, C is the capacitive loading. Interpolate between voltages as needed, for accuracies at capacitances above 5uF consult ViTREK.
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1000V
200K-50GΩ : ±2%±(R/1.6GΩ)%
200K-50GΩ : ±2%±(R/1.5GΩ)%
200K-45GΩ : ±2%±(R/1.5GΩ)%
2500V
500K-90GΩ : ±2%±(R/3GΩ)%
500K-75GΩ : ±2%±(R/2.5GΩ)%
500K-45GΩ : ±2%±(R/1.5GΩ)%
4000V
800K-120GΩ : ±2%±(R/4GΩ)%
800K-75GΩ : ±2%±(R/2.5GΩ)%
800K-30GΩ : ±2%±(R/1GΩ)%
TEST TIMING
Ramp 0.01 to 9999sec
50kV/sec max slew rate <(± 1% ± 0.1sec) accuracy with typical loads
0.5sec minimum for 957i only
Dwell 0.02 to 9999sec or user terminated
<(± 0.05% ± 20ms) accuracy (add 100ms for dwell time >2 sec)
Delay 0.00 to 9999sec
<(± 0.05% ± 20ms) accuracy
DISCHARGE
Fixed Discharge Always selected
951i,952i,956i : Nominal loading 7MΩ 953-5i : Nominal loading 13MΩ 957i : Nominal loading 17MΩ
Controlled Discharge Auto-selected resistance values in real-time during discharge
Selection Criteria : <400W power, <400J energy, <7500V, current <CNFG-TEST-MAX DISCHARGE setting 951i,952i,956i : Nominal loading 9.5KΩ or 40KΩ 953-4i and 957i : Nominal loading 9.5KΩ or 40KΩ or 240KΩ 955i : Nominal loading 15KΩ or 40KΩ or 240KΩ
Minimum Discharge Time <(20ms + 10ms per kV) (below 7500V)

PULSED VOLTAG E WI THSTAND TEST ING (PUL SE)

This type of testing is performed whenever it is required to test that a device can withstand a voltage without breakdown or arcing, but the device will not withstand the voltage for significant periods of time. An example of this is in the testing of the voltage withstand capability of physically small resistors, in this case the resistor may not be able to withstand the power dissipation if the voltage is applied for lengthy periods of time, so normal AC or DC Voltage Withstand testing cannot be performed.
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VOLTAGE
TIME
RAMP
(tr = 0.5 to 20ms)
HOLD
(0.5 to 30ms)
RAMP
(= tr)

ACT IONS WHI LE RU NNIN G

Breakdown and (optionally) arc detection is performed throughout the test. On any failure the pulse is
immediately aborted.
A UNIPOLAR+ pulse is shown above, a UNIPOLAR- pulse has the same timing but has the opposite voltage
polarity, a BIPOLAR pulse is a pair of opposite polarity pulses (positive first) with no delay between them.
A delay is enforced following the pulse(s) to allow any stored energy in the 95x or the DUT caused by
asymmetry in the waveform to dissipate.
o After a unipolar pulse of either polarity or after an abnormally terminated bipolar pulse this delay is
500ms.
o After a normally terminated bipolar pulse this delay is 40ms.

CON FIGU RING

An example PULSE menu is as follows –
Seq 1 Step 1 PULSE LEVEL: 200.0V POLARITY: UNIPOLAR+ BREAKDOWN: 150.0mApk RAMP: 1.0msec HOLD: 1.5msec ARC DETECT:4us 10mA ON FAIL: ABORT SEQ
LEVEL. Allows the test voltage level to be programmed. For a bipolar pulse, both polarities have
nominally the same voltage amplitude.
o The amplitude of the pulse is not accurately controlled by the 95x during this type. The actual
peak voltage amplitude is displayed for review after a test step has been run, enabling the user to adjust the peak test voltage for a specific DUT. Alternatively, the 95x can do this semi­automatically by using the Lead Compensation feature.
POLARITY. Allows the polarity of the pulse to be selected.
o UNIPOLAR+. A single, positive polarity, pulse of voltage is produced. o UNIPOLAR-. A single, negative polarity, pulse of voltage is produced.
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HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
Low Voltage Wire
o BIPOLAR. A pair of opposite polarity pulses of voltage is produced.
BREAKDOWN. Allows breakdown detection to be programmed as a maximum peak current level. Note
that the maximum drive current during testing is limited by the test voltage and the 95x output impedance (see Specifications), entering a value higher than can be achieved renders this setting inactive.
RAMP. See figures in Actions While Running. The minimum value is 1ms (0.5ms if Opt. AC-2 if installed),
and the maximum value is 20ms.
HOLD. See figures in Actions While Running. The minimum value is 1ms (0.5ms if Opt. AC-2 if installed),
and the maximum value is 30ms.
ARC DETECT. Allows the user to program arc detection during this step. Both the time and current level
can be independently programmed. Arc detection can also be disabled by setting the leftmost (time) setting to OFF. The 95x can be configured to not fail a test step when arcing is detected by setting the ARC setting in the CNFG – TEST sub-menu to DETECT ONLY.
ON FAIL. This allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this
step (CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is isolated from ground.
The DUT should be wired between the HV and RETURN terminals of the 95x.
The 95x provides a safety ground termination for the DUT during the test via its’ RETURN terminal. When deciding which point on the DUT to connect to the HV terminal and which point to connect to the RETURN terminal, the user should consider that only the voltage on the RETURN terminal is safe at all times.

LEA D CO MPEN S ATIO N

This type of test step uses the Lead Compensation feature of the 95x in a different way to all other types as it does not compensate for any cabling effects, but instead compensates for the loading effect on the 95x caused by the load resistance. The output voltage level from the 95x cannot be accurately controlled for this type. The output impedance when running this type is of significance, refer to Specifications.
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The 95x reports the actual highest voltage applied across the DUT following the end of this type of test step. Using the reported actual voltage, the user can manually adjust the programmed test voltage level to accommodate loading effects for future runs. Alternatively the user can run a Lead Compensation with an example DUT connected normally, in which case the 95x will save the measured highest voltage and automatically adjust the output level in subsequent runs. Both of these methods assume that the load resistance does not vary significantly with voltage; if the resistance does vary significantly then the user may need to manually adjust the test voltage accordingly.

EXA MPLE S

A nominally 10Kohm NTC thermistor is to be tested for breakdown at 400Vpk. The thermistor will only withstand 400V for a maximum of 100msec and will exhibit self-heating very quickly.
This is accomplished in a single step as follows –
Seq 1 Step 1 PULSE LEVEL: 400.0V As required POLARITY: UNIPOLAR+ As required BREAKDOWN: 100.0mApk Must be greater than the peak load current RAMP: 1.0msec Performed as fast as possible, the load has little capacitance HOLD: 1.5msec Performed as fast as possible, the load has little capacitance ARC DETECT:4us 10mA Optional ON FAIL: ABORT SEQ
The actual test voltage may not have achieved the required test voltage with sufficient accuracy. When reviewing the results the actual test voltage is displayed, as an example this may be 366V. The user may adjust the programmed test voltage from the original 400V setting, to 400*(400/366) = 437V. Then the next time the step is run the applied test voltage into this load will be closer to 400V. Alternatively, the user could run the test sequence using the Lead Compensation feature with a nominal load connected; the 95x will then automatically apply this in future runs of the test.

SPE CIFI CATI ONS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
TEST VOL TA GE AND LOADIN G CA PA BI LI TY
Test Voltage 951-4i (standard build): 50V to 8000V
951-4i (opt. AC2): 20V to 2750V
Output Impedance 951-4i (standard build): 12Kohm + 0.5H nominal output impedance
951-4i (opt. AC2): 1.4Kohm + 0.2H nominal output impedance
Max Load Current Limited by the lesser of -
a) the test voltage and output impedance b) 145mA (288mA for Opt. AC-2).
MEASURED TEST VOLTAGE ACCURACY
Test Voltage Accuracy <(± 0.5% ± 5V ± (0.2V per mA load))
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VOLTAGE
TIME
RAMP
SEARCH
DISCHARGE
LOAD CURRENT MEASUREMEN TS
Measurements are performed in the RETURN terminal of the 95x.
Breakdown Current 1uA to 280mApk (DC-50kHz bandwidth)
<(± 1% ± 1uA) accuracy <30usec detection time <3msec response time (typically <500usec)
Arc Current 1 to 30mArms (50KHz-5MHz bandwidth)
<(± 10% ± 1mA) accuracy at 1MHz 4us, 10us, 15us, 20us, 30us or 40us measurement period
TEST TIMING
The ramp and dwell times are those specified ± 100us

DC BREAKDO WN VOLT AGE D EVIC E TE STING ( BRKD N)

This tests that a DUT exhibits breakdown when tested with a user set DC current. The measured breakdown voltage is checked against an allowable range.
The BRKDN type is commonly used for testing high voltage protection devices such as spark gap surge arrestors and MOV style voltage limiters.

ACT IONS WHI LE RU NNIN G

RAMP. During this period the test voltage is ramped at the user set maximum ramp rate to an
automatically selected voltage level between 50 and 90% of the minimum breakdown voltage limit setting. If the user set breakdown current limit occurs during this period then the DUT is failed and the highest voltage and current are recorded and the DISCHARGE period is started (i.e. the SEARCH period is skipped).
SEARCH. During this period the test voltage is ramped at an automatically selected slower rate than
during the RAMP period. The search ramp rate is selected to give best accuracy within the set breakdown voltage limits. If the user set breakdown current limit occurs during this period then the highest voltage is recorded as the DUT breakdown voltage and the DISCHARGE period is started. If a voltage significantly higher than the maximum breakdown voltage limit is reached before the load current achieves the user breakdown current limit then the DUT is failed and the final voltage and current are recorded and the DISCHARGE period is started.
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DISCHARGE. During this period the DUT is discharged as fast as possible.
NOTE – the actual reported test current in breakdown may be slightly higher than expected because of the characteristics of the breakdown of the DUT. If this is excessive then the user should select a slower maximum ramp rate.

CON FIGU RING

An example BRKDN menu is as follows –
Seq 1 Step 1 BRKDN CURRENT: 5.000mA RAMP: 5.00KV/s Lim: 800.0-850.0V ON FAIL: ABORT SEQ
DUT GROUNDED. Only available if option HSS or HSS-2 is installed. This selection allows the user to
select either –
o NO. This selection indicates that the DUT is isolated from ground, the 95x will use the current in
the RETURN terminal to detect breakdown. This is as if option HSS or HSS-2 were not installed.
o YES. This selection indicates that the DUT is grounded, the 95x will use the current in the HV
terminal to detect breakdown.
CURRENT. Allows the DC test current to be programmed. The entry is limited to be a minimum value of
1uA.
RAMP. Allows the maximum ramp rate to be programmed.
o The accuracy of the breakdown voltage measurement may be limited by the ramp rate at high
rates. It is not recommended to set ramp rates of more than 10 times the lowest expected breakdown voltage per second (e.g. if the lowest expected breakdown voltage is 500V then the highest recommended rate setting is 5000V/s).
o If the DUT and cables connected to it have any significant capacitance then a significant portion
of the test current may be consumed by the charging current. In this case the DUT will be measured as having a considerably lower breakdown voltage than expected. The user should consider using a lower maximum ramp rate setting in these circumstances.
Lim. This allows the user to define the range within which the breakdown voltage measurement is
considered a PASS.
ON FAIL. This allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this
step (CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is isolated from ground unless –
Option HSS or HSS-2 is fitted And, the DUT GROUNDED setting is set to YES.
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HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
Low Voltage Wire
TESTING A DU T WI TH OUT OPTION HS S, WITHOPUT OPTION HS S-2, OR WITH DUT GROUNDED SET TO NO
The DUT should be wired between the HV and RETURN terminals of the 95x.
The 95x provides a safety ground termination for the DUT during the test via its’ RETURN terminal. When deciding which point on the DUT to connect to the HV terminal and which point to connect to the RETURN terminal, the user should consider that only the voltage on the RETURN terminal is safe at all times.
TESTING A GR OUNDED DUT (OPTION HSS OR HSS-2 ONLY)
In this case the user only need connect the HV terminal of the 95x to the point on the DUT which is to be tested. It is expected that the DUT is grounded and that the breakdown is being tested to ground. For safety reasons or if unsure if the DUT is grounded, it may be desirable to also connect the DUT ground to either the RETURN or GUARD terminals of the 95x however the user should ensure that the ground of the 95x and that of the DUT are within 5Vrms of each other otherwise excessive ground loop currents may flow, potentially damaging the 95x.

LEA D CO M PEN S ATIO N

Performing a lead compensation for this type of test step has no affect; the test step is performed normally during lead compensation mode.

EXA MPLE S

A MOV is to be tested against its’ breakdown specifications. The specifications are at a current of 10mA the breakdown voltage shall be between 405 and 495V. The specifications state that a maximum ramp rate of 100000V/sec is to be used. The MOV has <1000pF capacitance.
This is achieved by using a single test step as follows -
Seq 1 Step 1 BRKDN CURRENT: 10.00mA As required RAMP: 2.00KV/s As recommended (<10*Vmin/sec) Lim: 405.0-495.0V As required ON FAIL: ABORT SEQ
The total test time will be less than 350ms. After the sequence is run the actual highest voltage and load current are available for review.
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SPE CIFI CATI ONS

Specifications are as for the DC Voltage Withstand Test types except as shown below.
The BRKDN type must not be used with loads having >0.05uF capacitance.
VOLTAGE AN D CURRENT A CC UR AC Y
Breakdown Voltage Accuracy <(± 0.5% ± 1.5V) (add an additional ±5V if option HSS-2 installed)
<30usec detection time <10msec response time
Breakdown Current Accuracy <(± 1.5% ± 3uA)
<30usec detection time <10msec response time
TEST TIMING
Ramp and Search <50kV/sec , ± 15% ± 10ms accuracy

CHOOSI NG WITHI N TH E RE SISTANCE TES TING GR OUP

The user may choose for the 95x to test the resistance of a DUT using one of three activities-
If the resistance to be tested is more than 100KΩ - use the DC Voltage Withstand capability of the 95x to
measure the resistance of the DUT. This can accommodate resistances of below 10KΩ to over 1TΩ using a fixed DC Voltage across the DUT. Typical applications for this include insulation resistance and higher value resistor component testing. See DC Voltage Withstand and Leakage Testing (DCez, DCW and DCIR).
If the resistance is between 1mΩ and 100KΩ and it is allowable to measure using DC at a current of up to
50mA and voltages up to 5V - use the DC Low Resistance capability of the 95x. Typical applications for this include component testing, cable resistance testing, and (if allowed by the safety standard) chassis ground bond testing. See DC Low Resistance Testing (LowΩ).
If the resistance is between 1uΩ and 10Ω and it is allowable (or required) to measure using AC at a user
defined current between 0.1A and 40Arms and a voltage up to 8Vrms (11.5Vpk) - use the AC Ground Bond capability of the 95x (not all models have this capability). Typical applications for this include chassis ground bond testing and cable resistance testing at high currents. The 95x also offers the ability to independently measure the in-phase (resistance) and quadrature (reactance) components of the DUT while maintaining stability with inductive loads for component testing applications. See AC Ground Bond Testing (GBez and GB).

DC LOW RESIST ANCE TESTING (LOW Ω)

This type is primarily for testing resistance values from a few milliohms up to 100KΩ using either 2-wire or 4-wire measurement methods.

ACT IONS WHI LE RU NNIN G

This type of test step is performed using a single measurement period. The user may program for a delay at the start of the test period before the resistance measurement is checked against the limits. This can be used to allow for capacitance in parallel with the DUT.
When programmed to perform a 4-terminal measurement, the 95x continuously performs a set of checks that the DUT is correctly wired to the 95x throughout the test period.
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CON FIGU RING

An example Low Ω menu is as follows –
Seq 1 Step 1 LOW 2/4-WIRE: 4-WIRE TIME: 1.00sec Delay: 0.05sec
Lim: 0.0m-150.0K ON FAIL: ABORT SEQ
2/4-WIRE. Allows the user to program whether the 2-wire or 4-wire measurement technique is to be
employed.
TIME. Allows the test time period to be programmed (in seconds) or set to be user terminated (with the
START button) by pressing the LIMIT key while this setting is selected.
Delay. Allows the user to program a delay in the test period before the measurement range check is
performed.
Lim. Allows the user to define the range within which the resistance measurement is considered a PASS
during the dwell period.
ON FAIL. Allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this step
(CONT SEQ) if this step fails any of its checks. A user abort (STOP button) always aborts the entire sequence.

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is floating with respect to ground.
2-WIRE MEA SURE ME NT CONNECTI ONS
When making 2-terminal measurements the resistance of the wires, the contact resistance to the DUT, and the contact resistance within the 95x front panel terminals are all included in the result, use the following recommendations to reduce these effects –
Use heavy gage wires. Ensure that the connections to the DUT are clean and are solidly made. Ensure that the connectors on the wires to the 95x are clean and are not loose. If the connectors are left
inserted into the sockets of the 95x front panel for an extended period of time (e.g. a few weeks or more) then they should be occasionally removed, cleaned and re-inserted into the 95x to prevent build-up of corrosion on the connectors.
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SENSE-
SENSE+
95x
DUT
Low Voltage Wire
Low Voltage Wire
SENSE-
SENSE+
95x
DUT
SOURCE+
SOURCE-
4-WIRE MEA SURE ME NT CONNECTI ONS
When making 4-terminal measurements the resistance of the wires, the contact resistance to the DUT, and the contact resistance within the 95x front panel terminals are not included in the result, the only recommendation is that the SOURCE+ and SOURCE- wires be of sufficient gage to withstand the 50mA test current. When wired as shown below, the actual resistance measured is that between the innermost connection points to the DUT (i.e. between the SENSE+ and SENSE- connections).
If any wire has more than nominally 100Ω of resistance then the test is failed with a WIRING FAULT condition.

LEA D CO MPEN S ATIO N (2-WI RE)

Performing a lead compensation for this type of test step compensates for lead resistance.
During a lead compensation the SENSE+ and SENSE- wires should be solidly shorted together at the DUT end, the 95x will then measure the lead resistance and automatically subtract it from all future measurements.
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LEA D CO MPEN S ATIO N (4 -WIR E )

Lead Compensation is not usually performed when using a 4-wire measurement since lead resistance is automatically eliminated. If a 4-wire test is configured but the DUT is connected in a 2-wire manner (e.g. separate wires for SOURCE and SENSE, but they are shorted together before the connection to the DUT) then a Lead Compensation may be performed in the same manner as for the 2-wire configuration above.

EXA MPLE S

Example 1 -
A DUT has a 50Ω input and it is desired to check that the input impedance is within 5% of the nominal 50Ω value.
This is accomplished in a single step as follows –
Seq 1 Step 1 LOW 2/4-WIRE: 2-WIRE Lead resistance is well below 2.5ohm, so 2-wire is chosen TIME: 0.10sec Load has very little capacitance so use a fast time Delay: 0.00sec Load has very little capacitance so no delay needed
Lim: 47.50-52.50  As required ON FAIL: ABORT SEQ
Example 2 -
It is required to test that a DUT chassis is bonded to its’ grounding terminal with no more than 0.1ohm of resistance.
This is accomplished in a single step as follows –
Seq 1 Step 1 LOW 2/4-WIRE: 4-WIRE Lead resistance is significant, so 4-wire is chosen TIME: 0.10sec Load has very little capacitance so use a fast time Delay: 0.00sec Load has very little capacitance so no delay needed
Lim: 0u- 100m  As required ON FAIL: ABORT SEQ

SPE CIFI CATI ONS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
TEST CUR RE NT SOURCE
Test Current 55mAdc max
Opt. LRE-10 : 10mAdc max
Open Circuit Voltage 5V (nominal)
Source Resistance 130Ω (nominal)
Opt. LRE-10 : 530 Ω (nominal)
MEASUREMEN T ACCURACY (2-WIRE)
Measurement Period 7.25msec measurement period (100ms for test time >2 sec)
Accuracy <30KΩ : 0.8% + 0.02Ω
30-100KΩ : 1.5%
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GBez
GB
User set open circuit voltage limit
No
Yes
RMS Impedance Min/Max Limits
Yes
Optional
In-Phase or Quadrature Impedance Min/Max Limits
No
Optional
Timed Ramp
No
Optional
Timed Discharge
No
Optional
Smooth Transition to next test step if GB type
No
Optional
100-150KΩ : 5% Opt. LRE-10 : add 0.001Ω Using rear terminals (option RPO only) : add 0.3Ω
Lead Compensation <(±1% of error ± 0.005Ω)
MEASUREMEN T ACCURACY (4-WIRE)
Measurement Period 7.25msec measurement period (100ms for test time >2 sec)
Accuracy <30KΩ : 0.8% + 0.002Ω
30-100KΩ : 1.5% 100-150KΩ : 5% Opt. LRE-10 : add 0.001Ω
Lead Compensation <(±1% of error ± 0.001Ω)
4-wire Compensation SOURCE <(±1% total lead impedance, 100Ω max)
SENSE <(±0.1% total lead impedance, 100Ω max)
TEST TIMING
Test Time 0.02 to 9999sec or user terminated
<(0.05% + 20ms) accuracy (add 100ms for test time >2 sec)
Delay 0.00 to 9999sec
<(0.05% + 20ms) accuracy (add 100ms for test time >2 sec)

AC GROUND BOND TESTING (GB EZ AND GB)

These types are primarily for testing resistance values from a few microohms up to 8Ω at a user set AC test current between 0.1 and 40Arms, typically for ground bond testing requirements of safety standards and also for high current connector, cabling or component testing.
Both GBez and GB are performed in the same manner; the difference between them is in the amount of configuration available. The GBez type is intended for basic applications; the GB type for comprehensive testing. The GB type can be configured to provide the same testing as the GBez type.
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CURRENT
TIME
RAMP
(0 to 10000secs)
DWELL
(0.02 to 10000secs or user terminated)
DISCHARGE
(0 to 10000secs)
Min & Max Impedance Limits Enforced

ACT IONS WHI LE RU NNIN G

Throughout the entire test the actual compliance voltage is measured and the test current reduced to
maintain a constant voltage if above the user set limit – in this situation the front panel C/V LIMITED indicator is illuminated. NOTE – if this limiting occurs during the dwell period but the impedance measurement is within limits then the test is failed with a WIRING FAULT condition.
On any failure the step is immediately aborted, and optionally the entire test sequence may be aborted. For the GBez type, the ramp and discharge periods are of zero length. For the GB type the discharge period can optionally be skipped if the next step is also a GB type.

CON FIGU RING

An example GBez type menu is as follows –
Seq 1 Step 1 GBez LEVEL:25.000A 60.0Hz DWELL: 30.0sec Lim: 0.0u-100.0mΩ ON FAIL: ABORT SEQ
An example GB type menu is as follows –
Seq 1 Step 1 GB LEVEL:25.000A 60.0Hz V CLAMP: 8.0V RAMP: 1.00sec DWELL: 30.0sec Test: RMS Lim: 0.0u-100.0mΩ DISCHARGE: FAST ON FAIL: ABORT SEQ
LEVEL. Allows the test current level and frequency to be programmed. V CLAMP. Only available for the GB type. Allows the open circuit voltage limit to be programmed as a
maximum RMS voltage level.
o The open circuit voltage limit is automatically set to 8Vrms for the GBez type.
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RAMP. Only available for the GB type. Allows the ramp time period to be programmed either as a time
or rate. The UNIT key toggles the selection between these two methods. In the majority of cases a zero setting should be used.
DWELL. Allows the dwell time period to be programmed or set to be user terminated (with the START
button) by pressing the LIMIT key while this setting is selected.
Test. Only available for the GB type (the GBez type is always set to test the RMS impedance). Allows the
user to define the impedance measurements to be checked against range limits. The available selections are –
o RMS. Selects that the impedance check is performed on the RMS impedance measurement. o INPHS. Selects that the impedance check is performed on the in-phase (i.e. resistance)
impedance measurement.
o QUAD. Selects that the impedance check is performed on the quadrature (i.e. reactance)
impedance measurement.
Lim. Allows the user to define ranges within which the selected impedance measurement is considered a
PASS during the dwell period. The range can be entered in units of impedance or voltage, the UNIT key toggles the selection. The user may optionally disable the lower limit by entering a zero value for it.
o In-Phase and Quadrature measurements can be of either polarity; the limits are applied to the
measurement without regard to polarity.
DISCHARGE. Only available for the GB type. Allows the user to program whether the discharge period
should use the same timing as the ramp period (AS RAMP), be as fast as possible (FAST) or skipped (NONE). If NONE is selected but the next step is not of a GB type then the FAST selection is used when the sequence is run. In the majority of cases, FAST should be used.
ON FAIL. Allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this step
(CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.

CON NECT ING T O TH E DUT

See Terminals and Wiring for general wiring and safety recommendations.
The 95x requires that the DUT (at least that portion which is being measured) is floating with respect to ground.
When making 4-terminal measurements the resistance of the wires, the contact resistance to the DUT, and the contact resistance within the 95x front panel terminals are not included in the result, the only recommendation is that the SOURCE+ and SOURCE- wires be of sufficient gage to withstand the user set test current.
When wired as shown below, the actual resistance measured is that between the innermost connection points to the DUT (i.e. between the SENSE+ and SENSE- connections).
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SENSE-
SENSE+
95x
DUT
SOURCE+
SOURCE-
If there is more than nominally 1.5V peak between the respective SOURCE and SENSE terminals of the 95x then the test is failed with a WIRING FAULT condition – the user must ensure that sufficient wire gage is used for the SOURCE wires (there is very little current flow in the SENSE wires).
If the user needs to make optimum measurements of low impedances, particularly less than a few 10’s of mΩ, then the following points should be considered -
The user should be aware that inductive coupling between the current flow in the SOURCE wires and the
respective SENSE wires will cause errors in the measurement results. If the wires are longer than a few feet and/or are tightly coupled then these errors can be 10’s of milliohms at 60Hz and significantly more at 400Hz, particularly when high test currents are being used. This effect is not specific to the 95x, it applies to any high current, low impedance AC measurement.
When making very low level measurements or when using long lengths of wiring, the user is
recommended to couple (e.g. use a twisted pair) the SOURCE wires together and/or couple the SENSE wires together for at least the majority of the wire length. Alternatively, if the user maintains at least a ¾“ spacing between each wire and all other wires then these effects are also reduced.
Similarly, there will be some inductive coupling between the DUT and the SENSE wires if they are not
separated from the DUT sufficiently, to reduce this the SENSE wires should not rest on or close to the DUT, but should be routed nominally 90° away from the DUT for at least several inches.
The coupling effects described above will almost always yield a higher than expected measurement. If the
users’ test passes with the measurement within the allowable range of impedances then, even if these are
not accounted for, the DUT is guaranteed to have passed the test – the above effects may only cause a false failure of the test.
Use caution when handling the connections to the DUT after performing a test. If high currents are being used then the power in the contact resistance between the DUT and the SOURCE wires, particularly when using clips, may be high, causing the contacts to become hot – at 40A the power in 1mΩ is 1.6Watts. Similarly the user should ensure that the connections to the front panel SOURCE terminals are fully secure – the user is recommended to use lugs and not plug-in connectors for currents above 10A.
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SOURCE-
HV
RETURN
SENSE+
95x
DUT
High Voltage Wire
L
N
High Current Wire
Low Voltage Wire
SOURCE+
The example below shows the connections to a DUT to perform a DC or AC withstand test on the Line/Neutral line power input, and an AC Ground Bond test on the chassis of the DUT in the same sequence. If wired in this manner, then no changes in connections are needed.

LEA D CO MPEN S ATIO N

Lead Compensation is not usually performed when using a 4-wire measurement since lead resistance is automatically eliminated. If the DUT is connected in a 2-wire manner (e.g. separate wires for SOURCE and SENSE, but they are shorted together before the connection to the DUT) then a Lead Compensation may be performed to offset the resistance of the common wiring in future runs.
Lead Compensation should be used with caution to offset errors caused by inductive coupling between the wiring; the inductive coupling effect is not strictly an offset error as it varies with the DUT resistance and reactance and the use of Lead Compensation could introduce significant errors.
When performing a lead compensation the impedance limits are not enforced, otherwise the test step is executed normally.
During a lead compensation the SOURCE+, SENSE+, SOURCE- and SENSE- wires should be solidly shorted together at the DUT end, the 95x will then measure the resistance and reactance and will automatically subtract them from all future measurements.
For reference, a near perfect 4-terminal short circuit can be created by connecting the leads to the same short, straight, length of heavy gage conductor in the order SOURCE+, SOURCE-, SENSE+ and then SENSE-. This creates the situation where there is no current flow in the DUT between the SENSE terminals, so there is no measurable impedance between them. The effective impedance of this connection is well below 1uΩ at line frequencies.

EXA MPLE S

Example 1 -
It is required to test that a DUT chassis is bonded to its’ grounding terminal with no more than 2.5V drop at
25Arms when tested for at least 30 seconds.
This is accomplished in a single step as follows –
Seq 1 Step 1 GBez No ramp or discharge, RMS limits, so use GBez LEVEL:25.000A 60.0Hz As required DWELL: 30.0sec As required Lim: 0u-2.5000V As required
ON FAIL: ABORT SEQ
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Example 2 -
It is required to test that a DUT chassis is bonded to its’ grounding terminal with no more than 0.1Ω impedance at 40Arms when tested for at least 30 seconds. The source of the test current must be maintained below 5Vrms at all times to avoid corrosion breakthrough.
This is accomplished in a single step as follows –
Seq 1 Step 1 GB Require a voltage limit, so use GB LEVEL:40.000A 60.0Hz As required V CLAMP: 5.0V As required DWELL: 30.0sec As required Test: RMS As required Lim: 0.0u-100.0mΩ As required
DISCHARGE: FAST ON FAIL: ABORT SEQ
Example 3 –
It is required to test that a line filter inductor is within ±10% of its’ 1mH nominal inductance and <10mΩ resistance at both 1A @ 60Hz and 10Arms @ 60Hz. At 60Hz the reactance of 1mH is given by 2.π.F.L = 2*3.1416*60.0*0.001 = 0.37699Ω, which is a voltage drop of nominally 3.7699V at 10A so is within the capabilities of the 95x. It has been decided to only test the resistance at the 10A level as that test is the most demanding. It is desired to perform all tests within less than 0.5 second to ensure production throughput.
This is accomplished in three steps as follows –
Seq 1 Step 1 GB Not testing RMS impedance, so use GB LEVEL: 1.000A 60.0Hz As required, perform the 1A test of inductance first V CLAMP: 8.0V Not needed, so set to the maximum DWELL: 0.1sec No timing requirement, so perform a fast test Test: QUAD Test the inductance Lim: 339.3m-414.7mΩ As required DISCHARGE: NONE Don’t discharge before the next test, saves test time
ON FAIL: ABORT SEQ
Seq 1 Step 2 GB Not testing RMS impedance, so use GB LEVEL:10.000A 60.0Hz As required V CLAMP: 8.0V Not needed, so set to the maximum DWELL: 0.1sec No timing requirement, so perform a fast test Test: QUAD Test the inductance Lim: 339.3m-414.7mΩ As required DISCHARGE: NONE Don’t discharge before the next test, saves test time
ON FAIL: ABORT SEQ
Seq 1 Step 3 GB Not testing RMS impedance, so use GB LEVEL:10.000A 60.0Hz As required V CLAMP: 8.0V Not needed, so set to the maximum DWELL: 0.1sec No timing requirement, so perform a fast test Test: INPHS Test the resistance Lim: 0.0u-10.00mΩ As required
DISCHARGE: FAST ON FAIL: ABORT SEQ
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The total test time is nominally 0.3 seconds, which could be reduced to 0.15 second with ease.

SPE CIFI CATI ONS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
TEST CURRENT SOURCE
The following apply at the SOURCE terminals.
Test Current Range 0.100 to 40.000Arms
Test Current Accuracy <(±0.5% ± 0.005A ± 0.005% per Hz above 100Hz) accuracy
Test Current Overshoot <10% (<0.2s ramp time)
<5% (<0.5s ramp time) <2% (>0.5s ramp time) Settling to <±0.5% of final value in <0.1sec + 2 cycles
Test Frequency 40Hz to 500Hz
<0.1% accuracy
Test Waveform Sinewave, 1.3 – 1.5 Crest Factor
Compliance (8Vrms – 0.015V/A) max compliance at test frequencies <75Hz.
For line voltages below 115V linearly reduce the maximum compliance by 1%/V unless Opt. LOLINE is fitted (there is no reduction for Opt. LOLINE).
Loading 10ohm max impedance (any phase, within compliance limits)
250W maximum load power
VOLTAGE ME ASUREMENTS
The following apply at the SENSE terminals.
Range 0uV to 8.0000Vrms (RMS, In-phase and quadrature)
Accuracy <(±0.5% ± 30uV ± 0.5uV*A) accuracy
(add 0.005% + 0.05uV*A per Hz above 100Hz) <±0.005° per Hz phase relative to test current
Cable Compensation <(1% of error)
IMPEDANCE ME ASUREMENTS
Accuracy Add Test Current and Voltage Accuracies as percentages
Examples at 50 or 60Hz -
0.1ohm at 1A : 1% + 0.53% = 1.53%
0.1ohm at 10A : 0.55% + 0.5% = 1.05%
0.1ohm at 40A : 0.51% + 0.5% = 1.01%
0.01ohm at 1A : 1% + 0.8% = 1.8%
0.01ohm at 10A : 0.55% + 0.53% = 1.08%
0.01ohm at 40A : 0.51% + 0.51% = 1.02% 0ohm at 1A : 30.5uohm
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0ohm at 10A : 3.5uohm 0ohm at 40A : 1.25uohm
TEST TIMING
Ramp 0.00 to 9999sec
<(± 1% ± 0.1sec ± 1 cycle) accuracy
Dwell 0.02 to 9999sec or user terminated
<(± 0.05% ± 20ms ± 1 cycle) accuracy
Fast Discharge <(20ms + 1 cycle)

GROUND LEA KAGE TESTING (DC I AND A CI)

These types are intended for testing that a product does not exceed ground leakage requirements, usually of safety standards.
Both types are similar, the difference being that the DCI type tests for DC ground leakage current while the ACI type tests for AC ground leakage current.

ACT IONS WHI LE RU NNIN G

During the test step the 95x measures the ground leakage current and checks that the result is within the user set range. The 95x also measures the voltage on the HV terminal relative to ground and makes the result of this measurement available to the user, if not required then this can be ignored.
Optionally, the user can also detecting arc currents and fail the DUT if they are found over the user set limit.
The user can set for there to be a delay at the beginning of the test step before the limits are enforced on the ground leakage current measurement.

CON FIGU RING

An example DCI menu is as follows –
Seq 1 Step 1 DCI TIME: 25.0sec Delay: 0.05sec Lim: 0n-35.00mA ARC DETECT:4us 10mA ON FAIL: ABORT SEQ
An example ACI menu is as follows –
Seq 1 Step 1 ACI TIME: 25.0sec Delay: 0.05sec Lim: 0n-35.00mA ARC DETECT:4us 10mA ON FAIL: ABORT SEQ
TIME. Allows the user to program the total test time. Delay. Allows the user to set a delay time before which the limits are not enforced. Lim. Allows the user to set a minimum and maximum limit for the ground leakage current beyond which
the DUT will be failed.
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RETURN
95x
DUT
L
N
ARC DETECT. Allows the user to program arc detection during this step. Both the time and current level
can be independently programmed. ARC detection can also be disabled by setting the leftmost (time) setting to OFF.
o The 95x can be configured to not fail a test step when arcing is detected. This is configured by
the ARC setting in the CNFG – TEST sub-menu.
ON FAIL. This allows the user to program the 95x to abort the entire sequence (ABORT SEQ) or only this
step (CONT SEQ) if this step fails any of its checks. A safety related failure or a user abort (STOP button) always aborts the entire sequence.

CON NECT ING T O TH E DUT

The 95x measures the current flowing into the RETURN terminal to the 95x ground during these tests.
The RETURN terminal of the 95x provides a safety ground to the DUT during these types.
NOTE – since the 95x does not control the source of power to the DUT, there is no automatic shutdown if an excessive current flows. The 95x contains a low voltage (<30V) MOV type protection device from the RETURN terminal to its chassis ground if excessive current flows, but the user should take additional measures to protect the system from high current flows in the event of a DUT failure.
The example above shows a typical DUT ground leakage connection between the DUT and the 95x. The DUT line and neutral connections would normally be connected to a line and neutral line power source. The 95x is used to check that the DUT does not have excessive ground leakage using the ACI type test step.
For this type of testing it is often also required to test the ground leakage of several exposed portions of the DUT as well as the ground connection of the DUT. In those cases the same connection to the 95x would be used, but the connection to the DUT would be to each required test point on the DUT.
This type of testing is often used for testing that the patient connections of a medical device meet ground leakage
safety standards. In these cases the DUT would be connected normally, either with or without its’ power ground
connection as required by the standard, and each patient connection would be tested for ground leakage by connecting it to the 95x RETURN terminal.

LEA D CO MPEN S ATIO N

Lead Compensation is not usually performed on these types. If needed, then Lead Compensation can be used to reduce the effects of external leakage current.
When performing a lead compensation the ground leakage current limits are not enforced, otherwise the test step is executed normally.
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During a lead compensation the RETURN wire should not be connected to the DUT.

EXA MPLE S

Example 1 -
It is required to test that a DUT ground leakage from its chassis is less than 5mArms when line powered. The DC leakage current is not required to be tested.
It is assumed that the connection is made prior to the start of the test.
This is accomplished in a single step as follows –
Seq 1 Step 1 ACI AC RMS leakage required, so use ACI TIME: 0.10sec No timing requirement, so perform quickly Delay: 0.00sec Already connected, so no delay needed Lim: 0n-5.000mA Per the requirement ARC DETECT:OFF Not required so disabled
ON FAIL: ABORT SEQ
Example 2 -
The same requirement as in example 1 but both AC and DC leakage currents are to be tested.
This is accomplished in two steps as follows –
Seq 1 Step 1 ACI AC RMS leakage required, so use ACI TIME: 0.10sec No timing requirement, so perform quickly Delay: 0.00sec Already connected, so no delay needed Lim: 0n-5.000mA Per the requirement ARC DETECT:OFF Not required so disabled
ON FAIL: ABORT SEQ
Seq 1 Step 2 DCI DC leakage required, so use DCI TIME: 0.10sec No timing requirement, so perform quickly Delay: 0.00sec Already connected, so no delay needed Lim: 0n-5.000mA Per the requirement ARC DETECT:OFF Not required so disabled
ON FAIL: ABORT SEQ
Example 3 -
It is required to test that a medical device patient connection has less than 50uArms ground leakage. The test is to be performed over a 10 second period to ensure that any periodic current is detected.
This is accomplished in a single step as follows –
Seq 1 Step 1 ACI AC RMS leakage required, so use ACI TIME: 10.0sec Per the timing requirement Delay: 0.00sec Already connected, so no delay needed Lim: 0n-50.00uA Per the requirement ARC DETECT:OFF Not required so disabled
ON FAIL: ABORT SEQ
Example 4 -
It is required to test the leakage current of material sample over a range of voltages. This is to be performed manually, using an external source of voltage. This could be a DC or AC test, for this example DC is used.
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The external voltage source is connected to one end of the material sample, with its’ common terminal grounded, and the 95x RETURN terminal is connected to the other end of the material sample.
If the voltage being used is within the measurement capability of the 95x, then the output of the external voltage source could also be connected to the HV terminal of the 95x, in which case the 95x display would also show the actual applied voltage to the material sample.
A single step is used as follows –
Seq 1 Step 1 DCI DC leakage required, so use DCI TIME: user sec Use manual timing, press the START button when finished Delay: 0.00sec Already connected, so no delay needed Lim: 0n-5.000mA Set wide limit, the user will manually check the results ARC DETECT:OFF Not required so disabled
ON FAIL: ABORT SEQ

SPE CIFI CATI ONS

Specifications are valid at the 95x terminals for 1 year at ambient temperatures within ±5C of calibration temperature (add 5% of accuracy specification per C outside of this). All specifications are relative to the calibration standards used. Add ½ digit to all accuracies for displayed results (results available with enhanced resolution from interfaces).
HV VOLTAGE MEASUREMEN TS
DC Voltage Range 951i,952i,956i : 0.0 to +/-8000V
953i,954i,955i : 0.0 to +/-11000V Option HSS or HSS-2 : 0.0 to +/-5000V
AC Voltage Range 951-4i,956i : 0.0 to 6000Vrms
955i : 0.0 to 10000Vrms Option HSS or HSS-2 : 0.0 to 4000Vrms
DC Accuracy <(± 0.25% ± 0.5V)
AC Accuracy <(± 0.5% ± 0.5V ± 0.01% per Hz above 100Hz)
Input Impedance Nominally 100MΩ
RETURN CURRENT M EASUREM ENTS
Current Range 0.0nA to 200mA (DC or ACrms)
DC Current Accuracy <(± 0.25% ± 0.5nA)
AC Current Accuracy <(± 0.5% ± 20nA ± 0.005% per Hz above 100Hz)
Input Impedance <150uA : Nominally 5KΩ
>150uA : Nominally 37Ω
Arc Current 1 to 30mArms (50KHz-5MHz bandwidth)
<(± 10% ± 1mA) accuracy at 1MHz 4us, 10us, 15us, 20us, 30us or 40us measurement period
Cable Compensation <(± 1% of error)
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TEST TIMING
Test 0.02 to 9999sec or user terminated
<(± 0.05% ± 100ms) accuracy
Delay 0.00 to 9999sec
<(± 0.05% ± 100ms) accuracy

SW ITCH UNI T CO NTROL (S WITC H)

This type is used to control one or more external Switch Matrix Units (either ViTREK 948 or 964 units).
NOTE – to be able to define or edit a SWITCH test step the 95x must already be configured to control one or more switch matrix units, see Controlling External Switch Matrix Units.

ACT IONS WHI LE RU NNIN G

The external switch matrix units are controlled by the 95x in three periods as follows –
1. Pre-switch Period. During this period the 95x checks for the presence of each configured switch matrix
unit and also delays for at least the user set pre-switch delay period. If a configured switch matrix unit fails to be detected then the sequence is aborted. As soon as all units have been detected and the minimum delay has expired, the switch command period is started.
2. Switch Command Period. During this period all configured switch matrix units have their relays
commanded into the user set states. As soon as this is completed the post-switch period is started.
3. Post-switch Period. The 95x stays in this period until the user set post-switch delay has expired. This
period allows for relay and wiring settling after changing the relay states. As soon as the delay has expired the next test step in the test sequence is started.

CON FIGU RING

An example SWITCH type menu is as follows –
Seq 1 Step 1 SWITCH PRE-DELAY: 0.00sec POST-DELAY: 0.25sec #1: 0000000000000000
PRE-DELAY. Allows the pre-switch delay to be specified. Generally this should be set to zero, but may
need to be extended if external circumstances require a delay between the preceding step and the relays being changed in this step.
POST-DELAY. Allows the post-switch delay to be specified. When controlling a ViTREK 948 this should be
set to a minimum of 0.20sec, for a ViTREK 964 this can be set to zero if there are negligible wiring settling requirements.
#1. Allows the user to specify, using a hexadecimal code, the required relay states for switch matrix unit
#1. If configured for more than one switch matrix unit, there are further menu lines added for each additional switch matrix unit. If configured for a ViTREK 948 then this menu line has 14 characters, for a ViTREK 964 it has 16 characters. The hexadecimal code sets a binary code defining the required states of relays #64 through 1 (for a 964) or #56 through 1 (for a 948) in left-to-right order. A ‘1’ in this code indicates that the relay is to be in the ON state. See the relevant switch matrix manual for further details regarding setting these codes. The user should ensure that the state of any relay which is not actually fitted in the switch matrix unit is ‘0’.
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NOTE – the 95x does not change the states of switch matrix units unless commanded to do so by a SWITCH test step. It is recommended to finish a test sequence using switch matrix units with a SWITCH type step setting the relays to best “quiescent” state for the users’ specific system (generally the OFF state for all relays).

EXA MPLE S

Example 1 -
The user wishes to set a single ViTREK 964 to engage (ON) relays #1, 28 and 47; all other relays are to be disengaged (OFF).
Since a ViTREK 964 is being used, no delays are needed.
The 64-bit code for the required state is (splitting the binary into groups of 8 bits for easier viewing) –
00000000 00000000 10000000 00000000 00010000 00000000 00000000 00000001
In hexadecimal this is 00 00 80 00 10 00 00 01 (keeping the same grouping as above)
The SWITCH step is configured as –
Seq 1 Step 1 SWITCH PRE-DELAY: 0.00sec POST-DELAY: 0.00sec #1: 0000800010000001
Example 2 -
This is the same as example 1 above, but using a ViTREK 948.
Since a ViTREK 948 is being used, a 0.25sec post-switch delay is needed.
The 56-bit code for the required state is (splitting the binary into groups of 8 bits for easier viewing) –
00000000 10000000 00000000 00010000 00000000 00000000 00000001
In hexadecimal this is 00 80 00 10 00 00 01 (keeping the same grouping as above)
The SWITCH step is configured as –
Seq 1 Step 1 SWITCH PRE-DELAY: 0.00sec POST-DELAY: 0.25sec #1: 00800010000001

SPE CIFI CATI ONS

Pre- or Post-Switch Delay 0.00 to 9999sec
<(± 0.05% ± 20ms) accuracy

TEST SEQUENCE TIMING C ONTR OL ( PAUSE A ND H OLD)

The PAUSE type is generally used when the user needs to have a fixed delay inserted into a test sequence to allow for wiring or DUT settling between two test steps.
The HOLD type is generally used when the user needs to have some user interaction to occur prior to continuing the test sequence. A timeout is provided which, if it occurs, will abort the entire sequence is the user does not provide user interaction (e.g. pressing the START button, asserting the DIO interface START signal, or sending the interface CONT command).

CON FIGU RING

An example PAUSE type menu is as follows –
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Seq 1 Step 1 PAUSE TIME: 0.00sec
TIME. Allows the user to set the desired pause time. Any value between 0.00 and 9999 seconds may be
entered.
An example HOLD type menu is as follows –
Seq 1 Step 1 HOLD TIMEOUT: 30.0sec
TIMEOUT. Allows the user to set the desired hold timeout. Any value between 0.00 and 9999 seconds
may be entered. Setting a zero value disables the timeout entirely; the 95x will wait “forever” for user
interaction to occur.

EXA MPLE S

Example 1 -
The user wishes to program a 1 second pause into a test sequence to allow for wiring settling between two steps.
A PAUSE step is configured as –
Seq 1 Step 28 PAUSE TIME: 1.00sec
Example 2 -
The user wishes to program a step to have the sequence wait for user interaction before proceeding. This will be used to allow the user to manually alter the DUT wiring. It is desired to timeout the sequence if the user does not respond within 1 minute.
A HOLD step is configured as –
Seq 1 Step 28 HOLD TIME: 60.0sec

SPE CIFI CATI ONS

Delay or Timeout 0.00 to 9999sec
<(± 0.05% ± 20ms) accuracy
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GPIB
CONNECTOR
ETHERNET
CONNECTOR
USB
CONNECTOR
DIO
CONNECTOR
RS232
CONNECTOR
VICL-OUT
CONNECTOR

SECTION 7 – CONNECTING AND CONFIGURING INTERFACES

The 95x contains several interfaces, some of which are options. This section describes how to configure and connect to each interface. Each description of menus only includes the settings pertinent to the section being described.
For the DIO interface, see SECTION 8 – DIO INTERFACE
For programming information using an interface to control the 95x see SECTION 11 – PROGRAMMING VIA AN
INTERFACE.
NOTE – The user is recommended to disable all unused interfaces to avoid interference affects.
PRINTER

LOCAL AND REMOTE OPERA TION

When the 95x receives a command from an enabled interface the front panel REMOTE indicator is illuminated and the user may not use the front panel menus. To attempt to return the 95x into the local state the user should press the CNFG key on the 95x front panel. If the 95x has been enabled to return to the local state by the controlling interface then the REMOTE indicator will extinguish and a message is displayed on the 95x front panel.

CONTROLLIN G EX TERNAL SWIT CH M ATRI X UNITS

The 95x can be configured to control one ViTREK 948i or up to 4 ViTREK 964i Switch Matrix units.
NOTE – the 95x must be configured to control an external Switch Matrix unit before a test sequence can be created which contains steps to control it.

CON FIGU RATIO N

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST…
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PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the INTERFACES line. Press the ENTER key. The 95x now displays the base interfaces configuration settings menu, an example of which is –
RS232 BAUD: 115200 SWITCH: NONE DISABLE USB: NO DISABLE GPIB: NO DISABLE ENET: NO ETHERNET… GPIB ADDR: 2
The user may navigate this sub-menu and change the displayed settings as required. The settings
affecting controlling external switch matrix units are -
o RS232 BAUD. This setting is only used when controlling an external 964i Switch Matrix unit via
the RS232 interface. Its setting should match the baud rate setting in the attached 964i.
o SWITCH. This allows the user to select the method by which external switch matrix units are
interfaced to the 95x. The available selections are –
NONE. No switch matrix units are controlled by the 95x. 948 (SERIAL). A single ViTREK 948i Switch Matrix unit is being controlled by the 95x via
the RS232 serial interface. The RS232 BAUD setting is ignored if this is selected.
964 (SERIAL). A single ViTREK 964i Switch Matrix unit is being controlled by the 95x via
the RS232 serial interface.
964 (VICLx1). A single ViTREK 964i Switch Matrix unit is being controlled by the 95x via
the VICL interface. The 964i must be configured for VICL and set to address 1.
964 (VICLx2). Two ViTREK 964i Switch Matrix units are being controlled by the 95x via
the VICL interface. All 964i’s must be configured for VICL and set to addresses 1 and 2.
964 (VICLx3). Three ViTREK 964i Switch Matrix units are being controlled by the 95x via
the VICL interface. All 964i’s must be configured for VICL and set to addresses 1, 2 and
3.
964 (VICLx4). Four ViTREK 964i Switch Matrix units are being controlled by the 95x via
the VICL interface. All 964i’s must be configured for VICL and set to addresses 1, 2, 3
and 4.
When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings. NOTE – the settings are not active until all menus have been exited.
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CON NECT IONS

Refers to the instructions received with the specific Switch Matrix unit(s) for details regarding connecting the terminals of the 95x to those of the Switch Matrix Units.
RS232 INTERFACE
Using a RS232 cable supplied by ViTREK, connect the RS232 port on the 95x rear panel to the RS232 (Serial) port of the ViTREK 948i or 964i. The user may supply their own cable, in which case it should be a 9-wire female-female null modem cable capable of full handshake 115200baud operation.
VICL
Using a VICL cable supplied by ViTREK, connect the VICL – OUT port on the 95x to a ViTREK 964i VICL – IN port. If using more than one 964i, then connect each additional ViTREK 964i VICL – IN port to the preceding 964i’s VICL – OUT port. The 964i’s do not need to be wired together in any specific order when using the VICL interface.

CONTROLLIN G TH E 95 X BY THE RS232 INTERFACE

NOTE – the RS232 interface can only be used for a single purpose, it cannot be used for both controlling an external Switch Matrix unit and controlling the 95x.

SPE CIFI CATIO NS

Baud Rate 9600, 19200, 57600 or 115200
Handshake Bi-directional, hardware (RTS/CTS)
Data Bits 8
Parity None
Start/Stop Bits 1
Connector 9-pin Male Dsub
Interface Pinout Type DTE (same as PC computer)
Cable required 9-wire female-female null modem cable, fully wired
Cable Length <50ft (per standard)

CON FIGU RATIO N

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the INTERFACES line.
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Press the ENTER key. The 95x now displays the base interfaces configuration settings menu, an example of which is –
RS232 BAUD: 115200 SWITCH: NONE DISABLE USB: NO DISABLE GPIB: NO DISABLE ENET: NO ETHERNET… GPIB ADDR: 2
The user may navigate this sub-menu and change the displayed settings as required. The settings
affecting using the RS232 to control the 95x are -
o RS232 BAUD. This setting must match the baud rate setting of the attached computer.
When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings. NOTE – the settings are not active until all menus have been exited.

CON NECT IONS

Using a RS232 cable supplied by ViTREK, connect the RS232 port on the 95x rear panel to the RS232 (Serial) port of a computer. The user may supply their own cable, in which case it should be a 9-wire female-female null modem cable capable of full handshake 115200baud operation.

CONTROLLIN G TH E 95 X BY THE GPIB INTER FACE

CON FIGU RATIO N

Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key. The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the INTERFACES line. Press the ENTER key. The 95x now displays the base interfaces configuration settings menu, an example of which is –
RS232 BAUD: 115200 SWITCH: NONE DISABLE USB: NO DISABLE GPIB: NO DISABLE ENET: NO ETHERNET… GPIB ADDR: 2
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The user may navigate this sub-menu and change the displayed settings as required. The settings
affecting using the RS232 to control the 95x are –
o DISABLE GPIB. This must be set to NO to enable the GPIB interface in the 95x. o GPIB ADDR. This must be set to a chosen address for the 95x on the GPIB bus. Addresses in the
range 1 through 29 may be used if there is no other device on the bus at that address. Software in the computer will need to be set to match this address in order for it to communicate with the 95x.
When finished, press the EXIT key to exit this sub-menu, and then press EXIT again (if no additional
configuring is to be performed) to exit the main configuration menu and save the settings.

CON NECT IONS

Using a standard GPIB cable connect the GPIB port on the 95x rear panel to the GPIB port of a computer. It is recommended to use a high quality, shielded GPIB cable. Cables may be purchased from ViTREK.

CONTROLLIN G TH E 95 X BY THE ETHERN ET INTE RFACE

SPE CIFI CATI ONS

Speed 10baseT or 100baseTX, auto-selected
Duplex Half or full-duplex, auto-selected
MDI/MDIX Auto-selected
Protocols ICMP, ARP, DHCP, TCP/IP (IPv4 only)
TCP Port 10733
Remote Connections Only one remote connection is allowed at any given time
Connector RJ45
Cable required CAT5 or CAT5e, UTP or STP
Cable Length <100m (per standard)

CON FIGU RATIO N

Prior to configuring the 95x or connecting the 95x to a network, the user must have knowledge of certain aspects of the network –
The user must ascertain if the network uses DHCP or not for allocation of IP addresses. If the network does not use DHCP for allocation of IP addresses, then the user must choose a suitable
unused IP address within the local network subnet, the subnet mask of the local network, and the gateway IP address to additional networks.
Some networks which use DHCP allocation of IP addresses limit the allocation of addresses to known
devices by means of a list of known MAC addresses. In this case the user must ascertain the MAC address of the 95x and correctly configure the DHCP server prior to connecting the 95x to the local network.
Configure the Ethernet Interface of the 95x as follows -
Ensure that the display indicates that the 95x is in the base menu state, i.e. the display shows the date
and time. If necessary press the STOP button to abort a menu and return to the base menu state.
Press the CNFG key.
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The display now shows the main configuration menu, an example of which is –
TEST… PRINTOUT… SYSTEM… INTERFACES… DIGITAL I/O… BUILD… SET TO DEFAULTS…
LOCK PASSWORD:000000 RELOCK…
Using the Left Arrow or Right Arrow keys as needed, change the selection point to the INTERFACES line. Press the ENTER key. The 95x now displays the base interfaces configuration settings menu, an example of which is –
RS232 BAUD: 115200 SWITCH: NONE DISABLE USB: NO DISABLE GPIB: NO DISABLE ENET: NO ETHERNET… GPIB ADDR: 2
The user may navigate this sub-menu and change the displayed settings as required. The settings
affecting using the RS232 to control the 95x are –
o DISABLE ENET. This must be set to NO to enable the Ethernet interface in the 95x. o ETHERNET… This selection is the entry point to the sub-menu for configuring the Ethernet
interface. The user should navigate to select this menu line and press then ENTER key.
The Ethernet sub-menu allows the user to configure the 95x for the local network. An example of this
sub-menu is as follows –
USE DHCP: YES
IP: 000.000.000.000 SNET:000.000.000.000 GTWY:000.000.000.000 MAC: 1234567890AB
The user may navigate this sub-menu and change the displayed settings as required. The settings are –
o USE DHCP. Allows the user to configure the 95x to use DHCP for IP address allocation (YES) or
not (NO).
o IP. If using DHCP, this shows the IP address which the 95x has been allocated. If not using DHCP
this allows the user to enter an IP address for the 95x on the local network.
o SNET. If using DHCP, this shows the IP subnet mask which the 95x has been given. If not using
DHCP this allows the user to enter the subnet mask for the local network.
o GTWY. If using DHCP, this shows the IP of the gateway to additional networks which the 95x has
been given. If not using DHCP this allows the user to enter the IP address of the gateway.
o MAC. This is not editable and shows the MAC address of the 95x. This may be needed to
configure the local network to allow connection of the 95x to it. In most networks this is not needed.
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