• High-Speed Operation:
1 Gb/s Data Rate
500ps min Output Pulse Width
750ps min Input Pulse Width
• Excellent Overall Timing Accuracy:
Ultra-Stable Timing Delays
Minimum Pattern Dependence
Very Fine Timing Resolution (1 LSB = 8ps)
• High Level of Integration Reduces Board Area:
16 Independently Adjustable Delay Lines in a
Single Package
• Configurable as 2 1:8 or 1:16
1Gb/s 16-Channel
Drive-Side Deskew IC
• Wide Span: > 4ns Usable Range
• Pulse Width Adjustment to Compensate for
Dispersion in Pin Electronics:
± 2ns Independent Adjustment of Rising and
Falling Edges
• Fully Digital Single-Chip Solution:
No Off-Chip DACs Required
No DAC-Induced Timing Errors from Analog
Crosstalk, Reference Noise, Temperature, or
Voltage Drift
• Direct RAMBUS DRAM, SLDRAM, DDR
SDRAM, Fast SSRAM
• High-Speed Instrumentation: Pulse Generators,
Timing Margin Testers for Datalink, Interface,
and Disk Drive Applications
• Telecom, Datacom, and Computer Deskew
General Description
The VSC6250 is intended for use in the next generation o f high-speed, high-accurac y memory testers for
devices such as Direct RAMBUS DRAM, SLDRAM, DDR SDRAM, and fast SSRAM.
The VSC6250 provides ultra-precise timing to allow next genera tion memory tes ters to achieve excellent
overall timing accuracy. Timing delays of the VSC6250 are extremely stable with r espect to temperatu re and
voltage. Proprietar y circuit desi gn and process te chnology red uce pattern, data, frequency, and duty-cycle
dependencies to an absolute minimum. The VSC6250 requires no external DACs, which eliminates errors due
to DAC reference noise and analog crosstalk, and DAC temperature and voltage drift. The VSC6250 is available in a 128-pin PQFP, 14x20mm thermally-enhanced package.
G52197-0, Rev. 4.0
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
VITESSE SEMICONDUCTOR CORPORATION
Page 1
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
VSC6250 Block Diagram
DINA
DIN
DINB
Data Sheet
VSC6250
S
R
S
R
S
R
Output 0
Output 7
Output 8
Reference
Clock
(250MHz)
Stability
Control
Parallel Data Interface
S
R
Output 15
Page 2
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC6250
1Gb/s 16-Channel
Drive-Side Deskew IC
Functional Description
The VSC6250 is a 1Gb/s 16- channel drive-path deskew IC desi gned for deske wing differences in path
delay between multiple DUTs in a high-speed memory test system. The VSC6250 can be used as two independent 1:8 fanout and deskew sections or as a single 1:16 fanout and deskew. When used as two 1:8 deskews,
input signals are applied to inputs DINA and DINB. When used as a single 1:16 deskew, the input is applied to
input DIN.
The VSC6250 is designed to operate with a conventional 500MHz timing generator which outputs formatted pulses to the VSC6250 deskew IC. See Figure 1. The waveform at the input of the VSC6250 is the same as
that presented to the DUT pin. In a memory tester, such a 500MHz timing generator IC may be designed:
• Using one edge to output a single 500Mb/s data stream
• Using two edges to output a single 500Mb/s data stream preceded its complement
• Using three edges to output a single data stream at 500Mb/s surrounded by its complement
• Using two edges to output two interleaved 500Mb/s data streams for an aggregate bandwidth of 1Gb/s.
Formatting is performed inside the timing generator IC. An example interface between the timing generator
IC and the deskew is shown in Figure 1. This configuration is capable of supporting the four different data output choices, with appropriate design of the formatting logic.
The VSC6250 can handle pulses with a data rate up to 1Gb/s or a pulse repetition rate up to 2ns. A timing
diagram for the VSC6250 is shown in Figure 2.
Figure 1: VSC6250 Interface to Timing Generator IC
Timing GeneratorVSC6250
Timeset/Dataset
RAM
Format
Logic
DINx
DOUTx
S
R
Figure 2: VSC6250 AC Timing Diagram
t
REFIRE
t
PDR
t
PWI
t
PDF
t
S
R
S
R
PWO
G52197-0, Rev. 4.0
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
VITESSE SEMICONDUCTOR CORPORATION
Page 3
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
The delay of each of the deskewed outputs can be adjusted separately to compensate for differences in path
length between DUTs on a single test head. The maximum delay is 7ns. Delay span is 5ns. Usable range is a
minimum of 4ns
and falling edges can be adjusted independently.
To ensure timing performance, delay of the VSC6250 is measured in product ion at every time ste p of every
vernier. Figure 3 shows measured output waveforms of the VSC6250. Figure 3 (a) shows a measured minimum
output pulse width. The specified mimi mum outpu t pulse wi dth is 500ps, but this measu rement shows operat ion
down to 300ps. Figure 3 (b) shows typical timing resolution of 8ps.
(1).
Resolution is 8ps. To compensate for pulse dispersion in pin electronics, delay of the rising
Figure 3: VSC6250 Measured Output Waveforms
Data Sheet
VSC6250
a) Mininum output pulse width of 300ps(b) Typical timing resolution of 8ps
With next generation testers required to test more DUTs per testhead in the same footprint, board area is a
critical design parameter. Providing 16 deskew channels in a 14mmx20mm thermally-enhanced 128-pin PQFP
package, the VSC6250 consumes less than 1/2 the total board area of the bipolar alternative.
Page 4
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC6250
1Gb/s 16-Channel
Drive-Side Deskew IC
The 32 delays (rising and falling edges for 16 channels) in the VSC6250 are programmed using a parallel
interface. Verniers are selected by a 5-bit address word and controlled by two function enable bits. Each vernier
requires 11 bits to set the delay value.
Power dissipation of the VSC6250 is less than 5W from a single -2V supply.
Table 1: Operational Mode Truth Table
Mode #Mode NameCALENNMode Description
1Cal Mode 0
2User Mode1Generates timing delays as set by data in Cal Mode.
Figure 4: CAL Mode Timing Diagram
ADR[4:0]
CALENN
Sets timing delays with each vernier selected with ADR [3:0] Serial Data
Input.
D[10:0]
MSBLSB
Load Calibration Register
Data Latch Transparent
1 CAL Cycle
Don’t Care
Latch Data into Data Latch
Measure Delay
10 9
G52197-0, Rev. 4.0
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
VITESSE SEMICONDUCTOR CORPORATION
Page 5
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
Figure 5: CAL Mode: Pre-Calibration Delay Range
32 Coarse Vernier Steps +
64 Fine Vernier Steps
Delay
000Delay[0:10]
Figure 6: CAL Mode: Post-Calibration Delay Range
(1)
~275ps Fine Vernier Range
Data Sheet
VSC6250
32 Coarse Vernier Steps +
64 Fine Vernier Steps
Delay
000Delay[0:10]
NOTE: (1) There are 32 coarse vernier codes and 64 fine vernier codes. Not all of the codes are used to reach
maximum delay. The current design utilizes 22 coarse cod es and 47 fine vern ie r code s. Fu tu re de sign s will utilize 22
course designs and 59 fine vernier codes. These numbers must be used whe n calculating INL and DNL. S yst em calibration should be performed with the maximum usable codes. When a code is programmed beyond the maximum
utilized code, the delay will toggle between maximum delay and maximum delay minus 1LSB. Please contact your
local Vitesse sales representative to determine when the future design will be available.
(1)
= Unused Codes
Page 6
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC6250
1Gb/s 16-Channel
Drive-Side Deskew IC
AC Timing Characteristics
Table 2: AC Timing Characteristics
ParameterDescriptionMinTypMaxUnits
t
PDR(MIN), tPDF(MIN)
t
PDR(MAX), tPDF(MAX)
t
PD(SPAN)
t
RES
DNLDelay Differential Nonlinearity-2—+2LSB
t
PWI
t
PWO
FRCKReference Clock Frequency250—MHz
DTDDVariation in Delay vs. Duty Cycle-50—+5 0ps
DTDTVariation in Delay vs Temperature—2—ps/C°
PSRRPower Supply Rejection Ratio
t
).............................................................................................-55oC to + 125oC
C
).........................................................................................................-65oC to + 150oC
(1)
)................................................................................. +0.5V to VTT + -0.5V
1Gb/s 16-Channel
Drive-Side Deskew IC
Recommended Operating Conditions
Power Supply Voltage (VTT).................................................................................................................-2.0V ± 5%
Commercial Operating Temperature Range
NOTES: (1) CAUTION: Stresses listed un de r “Ab solute Maximum Ratin gs” m a y be ap plied to devices one at a t im e without caus-
ing permanent damage. Functionality at or above the values listed is not implied. Exposure to these values for extended
periods may affect device reliability.
(2) Lower limit of specification is ambient temperature and upper limit is case temperature.
(2)
(T) ............................................................................ 30oC to 70oC
ESD Ratings
Proper ESD procedures should be used when handling this product. The VSC6250 is rated to the following
ESD voltages based on the human body model:
1. All pins are rated at or above 1500V.
G52197-0, Rev. 4.0
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
100VTT—-2.0VPower Supply
101VREFDC-1.32VECL Reference Voltage
102CALENNIECLWrite Delay Register
103VDD—0VGround
104DATA0IECL Delay Bit 0
105DATA1IECLDelay Bit 1
106VTT—0VPower Supply
107DATA2IECL Delay Bit 2
108DATA3IECLDelay Bit 3
109DATA4IECLDelay Bit 4
Asynchronously reset s all vernier outputs to l ogic
LOW.
Chip Reset. Resets all vernier outputs to LOW a nd
initializes all delay registers to zero.
Page 14
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC6250
Package Information
1Gb/s 16-Channel
Drive-Side Deskew IC
128-Pin Thermally-Enhanced PQFP
Body + 3.2mm Footprint, 2.70mm Thick
DIMENSIONSLEADSTOLERANCES
A
A
A
D
D1
E
E
L
e
b
θ
θ
ddd
ccc
3.40
0.25 / 0.50
2.70
17.20
14.00
23.20
20.00
0.88
0.50
0.22
0˚ - 7˚
6˚
0.8 MAX.
0.08
1
2
1
1
MAX.
MIN./MAX.
±0.10
±0.20
±0.10
±0.20
±0.10
+0.15 / –0.10
BASIC
±0.05
±4˚
MAX.
G52197-0, Rev. 4.0
NOTES:
1) All dimensions in mm.
2) Dimensions shown are
nominal with tolerances as indicated.
3) Foot length "L" is measure at gage
plane, 0.25 above the seating plane.
VITESSE SEMICONDUCTOR CORPORATION
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
Page 15
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
Data Sheet
VSC6250
Package Thermal Characteristics
The VSC6250 is packaged in an 128-pin, 14x20mm thermally-enhanced PQFP with an internal heat
spreader. These packages use industry-standard EIAJ footprints, which have been enhanced to improve thermal
dissipation. The construction of the packages are as shown in Figure 9. The VSC6250 is designed to operate
with a case temperature up to 90
Exposed Heat Slug
Insulator
Wire Bond
o
C. The user must guarantee that the temperature specification is not violated.
Figure 9: Package Cross Section
Plastic Molding Compound
Lead
Thermal Epoxy
Die
Table 7: Thermal Resistance
SymbolDescription ValueUnits
θ
θ
CA-0
θ
CA-100
θ
CA-200
θ
CA-400
θ
CA-600
θ
CA-800
JC
Thermal resistance from junction-to-case6.6
Thermal resistance from case-to-ambient, st ill air23
Thermal resistance from case-to-ambient, 100 LFPM air21
Thermal resistance from case-to-ambient, 200 LFPM air19.9
Thermal resistance from case-to-ambient, 400 LFPM air18
Thermal resistance from case-to-ambient, 600 LFPM air17.3
Thermal resistance from case-to-ambient, 800 LFPM air16.6
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
o
C/W
Page 16
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
VITESSE
SEMICONDUCTOR CORPORATION
Data Sheet
VSC6250
Ordering Information
The part number for this product is formed by a combination of the device type and the package style:
Device Type
1Gb/s 16-Channel Drive-Side Deskew IC
VSC6250
1Gb/s 16-Channel
Drive-Side Deskew IC
xx
Package
QW: 128-Pin, 14x20mm Body
Notice
Vitesse Semiconductor Corporation reserves the right to make changes in its products, specifications, or
other information at any time without prior notice. Therefore the reader is cautioned to confirm that this data
sheet is current prior to placing any orders. The Company assumes no responsibility for any circuitry described
other than circuitry entirely embodied in a Vitesse product.
Warning
Vitesse Semiconductor Corporation’s products are not intended for use in life support appliances, devices
or systems. Use of a Vitesse product in such applications without written consent is prohibited.
G52197-0, Rev. 4.0
8/19/00741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
VITESSE SEMICONDUCTOR CORPORATION
Page 17
VITESSE
SEMICONDUCTOR CORPORATION
1Gb/s 16-Channel
Drive-Side Deskew IC
Data Sheet
VSC6250
This page left intentionally blank.
Page 18
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-58968/19/00
VITESSE SEMICONDUCTOR CORPORATION
G52197-0, Rev. 4.0
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