D Very Low Distortion
D High AC/DC Switch Off-Isolation
GS(off)
(V)V
(BR)GSS
Min (V)gfs Min (mS) I
Min (mA)
DSS
D Wideband High Gain
D Very High System Sensitivity
D High Quality of Amplification
D High-Speed Switching Capability
D High Low-Level Signal Amplification
D High-Frequency Amplifier/Mixer
D Oscillator
D Sample-and-Hold
D Very Low Capacitance Switches
DESCRIPTION
The 2N/SST5484 series consists of n-channel JFETs
designed to provide high-performance amplification,
especially at high frequencies up to and beyond 400 MHz.
TO-226AA
(TO-92)
D
S
G
For applications information see AN102 and AN105.
1
2
3
Top View
2N5484
2N5485
2N5486
The 2N series, TO-226AA (TO-92), and SST series, TO-236
(SOT-23), packages provide low-cost options and are
available with tape-and-reel to support automated assembly
(see Packaging Information).
TO-236
(SOT-23
)
D
1
G
3
S
2
Top View
SST5484 (H4)*
SST5485 (H5)*
SST5486 (H6)*
SPECIFICATIONS FOR SST SERIES (TA = 25_C UNLESS OTHERWISE NOTED)
Limits
SST5484SST5485SST5486
ParameterSymbolTest ConditionsTypbMin MaxMinMax MinMax Unit
Static
Gate-Source
Breakdown Voltage
Gate-Source Cutoff VoltageV
Saturation Drain Current
b
Gate Reverse CurrentI
Gate Operating Current
Gate-Source
Forward Voltage
c
c
Dynamic
Common-Source
Forward Transconductance
Common-Source
Output Conductance
Common-Source
Input Capacitance
Common-Source
Reverse Transfer
Capacitance
Common-Source
Output Capacitance
Equivalent Input
Noise Voltage
c
NO TAG
NO TAG
High-Frequency
Common-Source
Transconductance
Common-Source
Output Conductance
Common-Source
Input Conductance
-
Power Gain
Noise FigureNF
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.NH
b. Pulse test: PW v300 s duty cycle v3%.
c. This parameter not registered with JEDEC.
d. Not a production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only , and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability .
Equivalent Input Noise Voltage vs. FrequencyOutput Conductance vs. Drain Current
20
V
= −3 V
GS(off)
16
12
VDS = 10 V
20
V
= −3 V
GS(off)
16
TA = −55_C
12
Vishay Siliconix
VDS = 10 V
f = 1 kHz
8
en − Noise Voltage nV / Hz
4
ID = I
DSS
0
10100 k10 k
1001 k
ID = 5 mA
8
− Output Conductance (µS)
os
4
g
0
0.1110
125_C
I
− Drain Current (mA)f − Frequency (Hz)
D
25_C
Vishay Siliconix maintains worldw ide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and
Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see
http://www.vishay.com/ppg?70246.
Document Number: 70246
S-50148—Rev. G, 24-Jan-05
www.vishay.com
7
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