D TrenchFETr Power MOSFET
D New MICRO FOOTr Chipscale Packaging
Reduces Footprint Area Profile (0.62 mm) and
On-Resistance Per Footprint Area
D Pin Compatible to Industry Standard Si3443DV
APPLICATIONS
D PA, Battery and Load Switch
D Battery Charger Switch
MICRO FOOT
Bump Side ViewBackside View
32
DD
8401
xxx
S
41
G
Device Marking: 8401
Ordering Information: Si8401DB-T1
D PA Switch
xxx = Date/Lot Traceability Code
Si8401DB-T1—E1 (Lead (Pb)-Free)
ABSOLUTE MAXIMUM RATINGS (TA = 25_C UNLESS OTHERWISE NOTED)
ParameterSymbol5 secsSteady StateUnit
Drain-Source VoltageV
Gate-Source VoltageV
a
=
nuous Drain Curren
Pulsed Drain CurrentI
continuous Source Current (Diode Conduction)
Maximum Power Dissipation
Operating Junction and Storage Temperature RangeTJ, T
Package Reflow Conditions
_
a
a
TA = 25_C
TA = 70_C
TA = 25_C
TA = 70_C
VPR215/245
IR/Convection220/250
P
DM
I
DS
GS
D
S
D
stg
−4.9
−3.9−2.8
−2.5−2.5
2.771.47
1.770.94
−20
"12
−10
−55 to 150_C
c
c
S
G
D
P-Channel MOSFET
−3.6
_
_C
V
W
THERMAL RESISTANCE RATINGS
ParameterSymbolTypicalMaximumUnit
Maximum Junction-to-Ambient
Maximum Junction-to-Foot (drain)Steady StateR
Notes
a. Surface Mounted on 1” x 1” FR4 Board.
b. Refer to IPC/JEDEC (J-STD-020A), no manual or hand soldering.
c. Package reflow conditions for lead-free.
Document Number: 71674
S-50066—Rev. G, 17-Jan-05
a
t v 5 sec
Steady State
R
thJA
thJF
3545
7285
1620
_C/W
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1
Si8401DB
DS
,
GS
,
D
VDD = −10 V, RL = 10 W
ns
Vishay Siliconix
SPECIFICATIONS (TJ = 25_C UNLESS OTHERWISE NOTED)
ParameterSymbolT est ConditionMinTypMaxUnit
Static
Gate Threshold VoltageV
Gate-Body LeakageI
Zero Gate Voltage Drain CurrentI
On-State Drain Current
Drain-Source On-State Resistance
Forward Transconductance
Diode Forward Voltage
Dynamic
b
a
a
a
a
Total Gate ChargeQ
Gate-Source ChargeQ
Gate-Drain ChargeQ
Turn-On Delay Timet
Rise Timet
Turn-Off Delay Timet
Fall Timet
Source-Drain Reverse Recovery Timet
Reverse Recovery ChargeQ
Notes
a. Pulse test; pulse width v 300 ms, duty cycle v 2%.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
GS(th)
GSS
DSS
I
D(on)
r
DS(on)
g
V
d(on)
d(off)
fs
SD
g
gs
gd
r
f
rr
rr
VDS = VGS, I
= −250 mA−0.45−0.91.4V
D
VDS = 0 V, VGS = "12V"100nA
VDS = −20 V, VGS = 0 V−1
VDS = −20 V, VGS = 0 V, TJ = 70_C−5
VDS v−5 V, VGS = −4.5 V−5A
VGS = −4.5 V, ID = −1 A0.0570.065
VGS = −2.5 V, ID = −1 A0.0800.095
VDS = −10V, ID = −1 A
6S
IS = −1 A, VGS = 0 V−0.73−1.1V
1117
V
= −10 V, VGS = −4.5 V, ID = −1 A2.1nC
DS
2.9
1725
VDD = −10 V, RL = 10 W
ID ^ −1 A, V
GEN
= −4.5 V, RG = 6 W
2845
88135
6090
IF = −1 A, di/dt = 100 A/ms
4060
2030nC
mA
W
ns
conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS (25_C UNLESS NOTED)
10
8
6
4
− Drain Current (A)I
D
2
0
0246810
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2
Output CharacteristicsTransfer Characteristics
VGS = 5 thru 2.5 V
2 V
1.5 V
VDS − Drain-to-Source Voltage (V)
10
8
6
4
− Drain Current (A)I
D
2
TC = 125_C
25_C
−55_C
0
0.00.51.01.52.02.5
VGS − Gate-to-Source Voltage (V)
Document Number: 71674
S-50066—Rev. G, 17-Jan-05
TYPICAL CHARACTERISTICS (25_C UNLESS NOTED)
Si8401DB
Vishay Siliconix
W )
− On-Resistance (r
DS(on)
0.15
On-Resistance vs. Drain Current
0.12
VGS = 2.5 V
0.09
0.06
0.03
0.00
01234567
ID − Drain Current (A)
10
VDS = 10 V
I
= 1 A
D
8
6
Gate Charge
VGS = 4.5 V
1500
1200
900
600
C − Capacitance (pF)
300
C
0
1.6
1.4
1.2
rss
048121620
V
On-Resistance vs. Junction Temperature
VGS = 4.5 V
I
= 1 A
D
Capacitance
C
iss
C
oss
− Drain-to-Source Voltage (V)
DS
− Gate-to-Source Voltage (V)
GS
V
− Source Current (A)I
S
0.1
4
2
0
048121620
Qg − Total Gate Charge (nC)
Source-Drain Diode Forward VoltageOn-Resistance vs. Gate-to-Source Voltage
1. Laser mark on the silicon die back, coated with a thin metal.
2. Bumps are Eutectic solder 63/57 Sn/Pb. (Sn 3.8 Ag, 0.7 Cu for Pb-free bumps)
3. Non-solder mask defined copper landing pad.
4. The flat side of wafers is oriented at the bottom.
MILLIMETERS*INCHES
DimMinMaxMinMax
A
A
1
A
2
b
D
E
e
S
0.6000.6500.02360.0256
0.2600.2900.01020.0114
0.3400.3600.01340.0142
0.3700.4100.01460.0161
1.5201.6000.05980.0630
1.5201.6000.05980.0630
0.7500.8500.02950.0335
0.3700.3800.01460.0150
e
eS
D
* Use millimeters as the primary measurement.
Vishay Siliconix maintains worldwide manufacturing capability. Products m ay be manufac tured at one of several qualified locations. Reliability d at a for Silicon Technology and
Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see
http://www.vishay.com/ppg?71674.
Document Number: 71674
S-50066—Rev. G, 17-Jan-05
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5
Legal Disclaimer Notice
Vishay
Notice
Specifications of the products displayed herein are subject to change without notice. Vishay Intertechnology, Inc.,
or anyone on its behalf, assumes no responsibility or liability for any errors or inaccuracies.
Information contained herein is intended to provide a product description only. No license, express or implied, by
estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Vishay's
terms and conditions of sale for such products, Vishay assumes no liability whatsoever, and disclaims any express
or implied warranty, relating to sale and/or use of Vishay products including liability or warranties relating to fitness
for a particular purpose, merchantability, or infringement of any patent, copyright, or other intellectual property right.
The products shown herein are not designed for use in medical, life-saving, or life-sustaining applications.
Customers using or selling these products for use in such applications do so at their own risk and agree to fully
indemnify Vishay for any damages resulting from such improper use or sale.