VISHAY 6N1135, 6N1136 Technical data

i179081
C(VCC)
NC
A
C
NC
B(V
B
)
C(V
O
)
E (GND)
查询6N1135供应商
6N1135/ 6N1136
Vishay Semiconductors
High Speed Optocoupler, 1 MBd, Photodiode with Transistor Output, 110 °C Rated
Features
• Operating Temperature from -55 °C to +110 °C
• Isolation Test Voltage: 5300 V
• TTL Compatible
• High Bit Rates: 1.0 MBd
• Bandwidth 2.0 MHz
• Open-Collector Output
• External Base Wiring Possible
• Lead-free component
• Component in accordance to RoHS 2002/95/EC and WEEE 2002/96/EC
RMS
e3
Pb
Pb-free
Agency Approvals
• UL 1577 - File No. E52744 System Code H or J
• DIN EN 60747-5-2 (VDE0884)
• CUL - File No. E52744, equivalent to CSA bulletin 5A
Description
The 6N1135 and 6N1136 are 110 °C rated optocou­plers with a GaAIAs infrared emitting diode, optically coupled with an integrated photo detector which con­sists of a photo diode and a high-speed transistor in a DIP-8 plastic package.
Signals can be transmitted between two electrically separated circuits up to frequencies of 2.0 MHz. The potential difference between the circuits to be coupled should not exceed the maximum permissible refer­ence voltages
Order Information
Part Remarks
6N1135 CTR 7 %, DIP-8
6N1136 CTR 19 %, DIP-8
6N1135-X007 CTR 7 %, SMD-8 (option 7)
6N1136-X006 CTR 19 %, DIP-8 400 mil (option 6)
6N1136-X007 CTR 19 %, SMD-8 (option 7)
6N1136-X009 CTR 19 %, SMD-8 (option 9)
For additional information on the available options refer to Option Information.
Absolute Maximum Ratings
T
= 25 °C, unless otherwise specified
amb
Stresses in excess of the absolute Maximum Ratings can cause permanent damage to the device. Functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of this document. Exposure to absolute Maximum Rating for extended periods of the time can adversely affect reliability.
Input
Parameter Test condition Symbol Val ue Unit
Reverse voltages V
Forward current I
Peak forward current t = 1.0 ms, duty cycle 50 % I
Maximum surge forward current t 1.0 µs, 300 pulses/s I
Thermal resistance R
Power dissipation T
Document Number 83909 Rev. 1.5, 26-Oct-04
= 70 °C P
amb
F
FM
FSM
diss
R
th
5.0 V
25 mA
50 mA
1.0 A
700 K/W
45 mW
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1
6N1135/ 6N1136
Vishay Semiconductors
Output
Parame te r Test condition Symbol Val ue Unit
Supply voltage V
Output voltage V
Emitter-base voltage V
Output current I
CC
O
EBO
O
Maximum output current 16 mA Base current I
B
Thermal resistance 300 K/W Power dissipation T
= 70 °C P
amb
diss
Coupler
Paramete r Test condition Symbol Val ue Unit
Isolation test voltage (between emitter and detector climate per DIN 50014 part 2, NOV 74
Storage temperature range T
Ambient temperature range T
Soldering temperature max. ≤ 10 s, dip soldering
t = 1.0 s V
0.5 mm from case bottom
T
ISO
stg
amb
sld
- 0.5 to 15 V
- 0.5 to 15 V
5.0 V
8.0 mA
5.0 mA
100 mW
5300 V
- 55 to + 125 °C
- 55 to + 110 °C
260 °C
RMS
Electrical Characteristics
T
= 25 °C, unless otherwise specified
amb
Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering evaluation. Typical values are for information only and are not part of the testing requirements.
Input
Parame te r Test condition Symbol Min Ty p. Max Unit
Forward voltage I
Breakdown voltage I
Reverse current V
Capacitance V
Temperature coefficient, forward voltage I
= 16 mA V
F
= 10 µAVBR5.0 V
R
= 5.0 V I
R
= 0 V, f = 1.0 MHz C
R
= 16 mA ∆VF/T
F
F
R
I
A
1.6 1.9 V
0.5 10 µA
125 pF
-1.7 mV/°C
Output
Paramete r Test condition Par t Symbol Min Ty p. Max Unit
Logic low supply current I
Supply current, logic high I
Output voltage, output low I
Output current, output high I
= 16 mA, VO open, VCC = 15 V I
F
= 0 mA, VO open, VCC = 15 V I
F
= 16 mA, VCC = 4.5 V,
F
= 1.1 mA
I
O
I
= 16 mA, VCC = 4.5 V,
F
= 2.4 mA
I
O
= 0 mA, VO = VCC = 5.5 V I
F
I
= 0 mA, VO = VCC = 15 V I
F
6N1135 V
6N1136 V
CCL
CCH
OL
OL
OH
OH
150 µA
0.01 1 µA
0.1 0.4 V
0.1 0.4 V
3.0 500 nA
0.01 1 µA
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Document Number 83909
Rev. 1.5, 26-Oct-04
6N1135/ 6N1136
Vishay Semiconductors
Coupler
Parameter Test condition Part Symbol Min Ty p. Max Unit
Capacitance (input-output) f = 1.0 MHz C
Current Transfer Ratio I
= 16 mA, VO = 0.4
F
= 4.5 V
V, V
CC
6N1135 CTR 7 16 %
IO
6N1136 CTR 19 35 %
= 16 mA, VO = 0.5
I
F
= 4.5 V
V, V
CC
6N1135 CTR 5 %
6N1136 CTR 15 %
Switching Characteristics
Parame te r Test condition Part Symbol Min Ty p. Max Unit
High-low I
Low-high I
= 16 mA, VCC = 5.0 V, RL = 4.1 k 6N1135 t
F
I
= 16 mA, VCC = 5.0 V, RL = 1.9 k 6N1136 t
F
= 16 mA, VCC = 5.0 V, RL = 4.1 k 6N1135 t
F
I
= 16 mA, VCC = 5.0 V, RL = 1.9 k 6N1136 t
F
PHL
PHL
PLH
PLH
0.6 pF
0.3 1.5 µs
0.2 0.8 µs
0.3 1.5 µs
0.2 0.8 µs
i6n135_01
Pulse generator Z
=50
O
t
tf=5 ns
,
r
duty cycle 10% t100 µs
I
F
I
Monitor
F
100
R
L
C 15 pF
5V
V
L
O
1
2
3
4
ı
8
7
6
5
I
F
t
V
O
V
OL
t
PHL
t
PLH
5V
1.5 V
t
Figure 1. Switching Times
Common Mode Transient Immunity
Parameter Test condition Part Symbol Min Ty p. Max Unit
High I
Low I
= 0 mA, VCM = 10 V
F
I
= 0 mA, VCM = 10 V
F
= 16 mA, VCM = 10 V
F
I
= 16 mA, VCM = 10 V
F
, VCC = 5.0 V, RL = 4.1 k 6N1135 | CMH | 1000 V/µs
P-P
, VCC = 5.0 V, RL = 1.9 k 6N1136 | CMH | 1000 V/µs
P-P
, VCC = 5.0 V, RL = 4.1 k6N1135 | CML | 1000 V/µs
P-P
, VCC = 5.0 V, RL = 1.9 k6N1136 | CML | 1000 V/µs
P-P
Document Number 83909 Rev. 1.5, 26-Oct-04
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