vicorpower.com 800-735-6200 V•I Chip Voltage Transformation Module V048K060T040 Rev. 1.0
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PRELIMINARY
V•I Chip Stress Driven Product Qualification Process
Symbol Parameter Min Typ Max Unit Note
Over temperature shutdown 125 130 135 °C Junction temperature
Thermal capacity 0.61 Ws/°C
RθJC Junction-to-case thermal impedance 1.1 °C/W
RθJB Junction-to-BGA thermal impedance 2.1 °C/W
RθJA
Junction-to-ambient
(1)
6.5 °C/W
RθJA
Junction-to-ambient
(2)
5.0 °C/W
Thermal
Notes:
(1) V048K060T040 surface mounted in-board to a 2" x 2" FR4 board, 4 layers 2 oz Cu, 300 LFM.
(2) V048K060T040 with optional 0.25"H Pin Fins surface mounted on FR4 board, 300 LFM.
Test Standard Environment
High Temperature Operational Life (HTOL) JESD22-A-108-B 125°C, Vmax, 1,008 hrs
Temperature cycling JESD22-A-104B -55°C to 125°C, 1,000 cycles
High temperature storage JESD22-A-103A 150°C, 1,000 hrs
Moisture resistance JESD22-A113-B Moisture sensitivity Level 5
Temperature Humidity Bias Testing (THB) EIA/JESD22-A-101-B 85°C, 85% RH, Vmax, 1,008 hrs
Pressure cooker testing (Autoclave) JESD22-A-102-C 121°C, 100% RH, 15 PSIG, 96 hrs
Highly Accelerated Stress Testing (HAST) JESD22-A-110B 130°C, 85% RH, Vmax, 96 hrs
Solvent resistance/marking permanency JESD22-B-107-A Solvents A, B & C as defined
Mechanical vibration JESD22-B-103-A 20g peak, 20-2,000 Hz, test in X, Y & Z directions
Mechanical shock JESD22-B-104-A 1,500g peak 0.5 ms pulse duration, 5 pulses in 6 directions
Electro static discharge testing – human body model EIA/JESD22-A114-A Meets or exceeds 2,000 Volts
Electro static discharge testing – machine model EIA/JESD22-A115-A Meets or exceeds 200 Volts
Highly Accelerated Life Testing (HALT)
Per Vicor Internal
Operation limits verified, destruct margin determined
Test Specification
(1)
Dynamic cycling
Per Vicor internal
Constant line, 0-100% load, -20°C to 125°C
test specification
(1)
Note:
(1) For details of the test protocols see Vicor’s website.
Test Standard Environment
BGA solder fatigue evaluation
IPC-9701 Cycle condition: TC3 (-40 to +125°C)
IPC-SM-785 Test duration: NTC-B (500 failure free cycles)
Solder ball shear test IPC-9701 Failure through bulk solder or copper pad lift-off
V•I Chip Ball Grid Array Interconnect Qualification
Electrical Specifications
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