UTRON
UT62L12816
Rev. 1.1
128K X 16 BIT LOW POWER CMOS SRAM
UTRON TECHNOLOGY INC. P80050
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919
4
CAPACITANCE
(TA=25℃, f=1.0MHz)
PARAMETER SYMBOL MIN. MAX UNIT
Input Capacitance C
IN
-
6 pF
Input/Output Capacitance C
I/O
-
8 pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels 0V to 3.0V
Input Rise and Fall Times 5ns
Input and Output Timing Reference Levels 1.5V
Output Load CL = 30pF, IOH/IOL = -1mA / 2mA
AC ELECTRICAL CHARACTERISTICS
(VCC =2.7V~3.6V, TA =0℃ to 70℃ / -20℃ to 85℃(E))
(1) READ CYCLE
PARAMETER SYMBOL UT62L12816-55 UT62L12816-70 UT62L12816-100
UNIT
MIN. MAX. MIN. MAX. MIN. MAX.
Read Cycle Time
tRC 55 - 70 - 100 - ns
Address Access Time
tAA - 55 - 70 - 100 ns
Chip Enable Access Time
t
ACE
- 55 - 70 - 100 ns
Output Enable Access Time
tOE - 30 - 35 - 50 ns
Chip Enable to Output in Low Z
t
CLZ*
10 - 10 - 10 - ns
Output Enable to Output in Low Z
t
OLZ*
5 - 5 - 5 - ns
Chip Disable to Output in High Z
t
CHZ*
- 20 - 25 - 30 ns
Output Disable to Output in High Z
t
OHZ*
- 20 - 25 - 30 ns
Output Hold from Address Change
tOH 5 - 5 - 5 - ns
LB
,UB
Access Time
tBA - 55 - 70 - 100 ns
LB
,UB
to High-Z Output
t
HZB
- 25 - 30 - 40 ns
LB
,UB
to Low-Z Output
t
LZB
0 - 0 - 0 - ns
(2) WRITE CYCLE
PARAMETER SYMBOL UT62L12816-55 UT62L12816-70 UT62L12816-100
UNIT
MIN. MAX. MIN. MAX. MIN. MAX.
Write Cycle Time
tWC 55 - 70 - 100 - ns
Address Valid to End of Write
tAW 50 - 60 - 80 - ns
Chip Enable to End of Write
tCW 50 - 60 - 80 - ns
Address Set-up Time
tAS 0 - 0 - 0 - ns
Write Pulse Width
tWP 45 - 55 - 70 - ns
Write Recovery Time
tWR 0 - 0 - 0 - ns
Data to Write Time Overlap
tDW 25 - 30 - 40 - ns
Data Hold from End of Write Time
tDH 0 - 0 - 0 - ns
Output Active from End of Write
t
OW*
5 - 5 - 5 - ns
Write to Output in High Z
t
WHZ*
- 30 - 30 - 40 ns
LB
,UB
Valid to End of Write
t
PWB
45 - 60 - 80 - ns
*These parameters are guaranteed by device characterization, but not production tested.
*55ns for Vcc=3.0V~3.6V