TO-92
1
1:CATHODE 2:GATE 3:ANODE
ABSOLUTE MAXIMUM RATINGS ( Ta=25°C ,unless otherwise specified )
PARAMETERS PART NO. SYMBOL TEST
CONDITION
MIN.
RATING
MAX.
RATING
UNITS
Repetitive Peak Off-State Voltage XL1225
ML1225
VDRM
VDRM
Tj=40 to 125°C
(rgk=1kΩ)
400
300
V
On-State Current IT(RMS) Tc=40°C 0.8 A
Average On-State Current IT(AV) Half Cycle=180,
Tc=40°C
0.5 A
Peak Reverse Gate Voltage VGRM IGR=10uA 1 V
Peak Gate Current IGM 10us Max. 0.1 A
Gate Dissipation PG(AV) 20ms Max. 150 W
Operating Temperature Tj -40 125 °C
Storage Temperature TSTG -40 125 °C
Soldering Temperature TSLD 1.6mm from case
10s Max.
250 °C
ELECTRICAL CHARACTERISTICS(Ta=25°C,unless otherwise specified)
PARAMETER SYMBOL TEST CONDITIONS MIN MAX UNIT
Off state leakage current IDRM @VDRM(RGK=1KΩ), Tj=125°C 0.1 mA
Off state leakage current IDRM @VDRM(RGK=1KΩ), Tj=25°C 1.0 µA
On state voltage VT AT IT=0.4A
AT IT=0.8A
1. 4
2.2
V
On state threshold voltage VT(TO) Tj=125°C 0.95 V
On state slops resistance Rt Tj=125°C 600 m
Gate trigger current IGT VD=7V 200 µA
Gate trigger voltage VGT VD=7V 0.8 V
Holding current IH RGK=1KΩ 5 mA
Latching current IL RGK=1KΩ 6 mA
Critical rate of voltage rise DV/DT VD=0.67*VDRM(RGK=1KΩ),
Tj=125°C
V/µs
Critical rate of current rise DV/DT IG=10mA, dIG/dt=0.1A/µs,
Tj=125°C
A/µs
Gate controlled delay time TGD IG=10mA, dIG/dt=0.1A/µs, 500 µs
Commutated turn-off time TG Tj=85°C, VD=0.67*VDRM,
VR=35V, IT=IT(AV)
200 µs