TOSHIBA TLP209D Technical data

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TOSHIBA PHOTOCOUPLER PHOTO RELAY
TLP209D
MEASUREMENT INSTRUMENTS
LOGIC IC TESTERS / MEMORY TESTERS
The TOSHIBA TLP209D consist of a gallium arsenide infrared emitting diode optically coupled to a photo-MOS FET in a plastic SOP package. Its characteristics include low OFF-state current and low output pin capacitance, enabling it to be used in high-frequency measurement instruments.
Features
8 pin SOP (2.54SOP8) : 2.1 mm high, 2.54 mm pitch
2-Form-A
Peak Off-State Voltage : 200 V (min)
Trigger LED Current : 3 mA (max)
On-State Current : 50 mA (max)
On-State Resistance : 50 ohm (max)
Output Capacitance : 20 pF (max)
Isolation Voltage : 1500 Vrms (min)
Pin Configuration
(top view)
Schematic
TLP209D
Unit: mm
JEDEC EIAJ TOSHIBA 11−10H1
Weight: 0.2 g
1, 3 : ANODE
1
2
3
4
2, 4 : CATHODE
8
5 : DRAIN D1 6 : DRAIN D2 7 : DRAIN D3 8 : DRAIN D4
7
6
5
1
2
3
4
8
7
6
5
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TLP209D
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Absolute Maximum Ratings
CHARACTERISTIC SYMBOL RATING UNIT
Forward Current I
Forward Current Derating (Ta
LED
Reverse Voltage VR 5 V
Junction Temperature Tj 125 °C
Off-State Output Terminal Voltage V
On-State Current ION 50 mA
On-State Current Derating (Ta
DETECTOR
Junction Temperature Tj 125 °C
Storage Temperature Range T
Operating Temperature Range T
Lead Soldering Temperature (10 s) T
Isolation Voltage (AC, 1 minute, R.H.
(Ta = 25°C)
25°C) ΔIF/°C 0.5 mA/°C
=
25°C) ΔION/°C 0.5 mA/°C
=
60%) (NOTE1) BVS 1500 Vrms
F
OFF
55~125 °C
stg
40~85 °C
opr
260 °C
sol
50 mA
200 V
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
(NOTE1) : Device considered a two-terminal device : LED side pins shorted together, and DETECTOR side pins
shorted together.
Recommended Operating Conditions
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT
Supply Voltage VDD 160 V
Forward Current IF 5 7.5 15 mA
On-State Current ION 50 mA
Operating Temperature T
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document.
Individual Electrical Characteristics
CHARACTERISTIC SYMBOL TEST CONDITION Min Typ. Max UNIT
Forward Voltage VF IF = 10 mA 1.0 1.15 1.3 V
Reverse Current IR VR = 5 V 10 μA
LED
Capacitance CT V = 0, f = 1 MHz ⎯ 30 ⎯ pF
20 60 °C
opr
(Ta = 25°C)
Off-State Current I
Capacitance C
DETECTOR
V
OFF
V = 0, f = 1 MHz ⎯ 15 20 pF
OFF
= 160 V 1 nA
OFF
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TLP209D
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Coupled Electrical Characteristics
CHARACTERISTIC SYMBOL TEST CONDITION Min Typ. Max UNIT
Trigger LED Current IFT ION = 50 mA 1 3 mA
Return LED Current IFC I
On-State Resistance RON ION = 50 mA, IF = 5 mA 40 50 Ω
(Ta = 25°C)
= 100 μA 0.1 ⎯ mA
OFF
Isolation Characteristics
CHARACTERISTIC SYMBOL TEST CONDITION Min Typ. Max UNIT
Capacitance Input to Output CS VS = 0 V, f = 1 MHz 0.8 pF
Isolation Resistance RS VS = 500 V, R.H.
Isolation Voltage BVS
(Ta = 25°C)
60% 5 × 1010 1014 Ω
AC, 1 minute 1500
AC, 1 second (in oil) 3000
DC, 1 minute (in oil) 3000 Vdc
Vrms
Switching Characteristics
CHARACTERISTIC SYMBOL TEST CONDITION Min Typ. Max UNIT
(Ta = 25°C)
Turn-on Time tON 0.03 0.5
Turn-off Time t
OFF
R
= 200 Ω (NOTE 2)
L
= 10 V, IF = 5 mA
V
DD
0.07 0.2
(NOTE 2) : SWITCHING TIME TEST CIRCUIT
IF
1, 3
2, 4 5, 7
6, 8
V
R
DD
L
I
F
V
OUT
V
OUT
t
ON
10%
90%
t
OFF
ms
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TLP209D
RESTRICTIONS ON PRODUCT USE
The information contained herein is subject to change without notice.
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.
The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk.
The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations.
The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties.
20070701-EN
GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically.
Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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