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TOSHIBA PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC
TLP2066
Preliminary
TLP2066
FA (Factory Automation)
High Speed Interface
3.3V Supply Voltage
The Toshiba TLP2066 consists of a GaAℓAs light-emitting diode and an
integrated high-gain, high-speed photodetector. TLP2066 operates with 3.3 V
supply voltage. Toshiba provides the TLP116 for supply voltage 5V type.
z Inverter logic (totempole output)
z Package type : MFSOP6
z Guaranteed performance over temperature : -40~100°C
z Power supply voltage : 3.0~3.6V
z Input thresholds current: I
z Propagation delay time (tpHL/tpLH): 60ns (Max.)
z Switching speed : 20MBd(TYP.)(NRZ)
z Common mode transient immunity : 15kV/us
=5mA (Max.)
FHL
TOSHIBA 11-4C2
Weight: 0.09 g(Typ.)
Unit in mm
z Isolation voltage : 3750Vrms
z UL recognition: UL1577 under application
Pin Configuration (Top View)
Truth Table
Input LED Tr1 Tr2 Output
H
ON OFF ON L
OFF ON OFF H
L
1
3
SHIELD
Schematic
I
F
1+
3-
SHIELD
VCC
GND
1: ANODE
6
3: CATHODE
5
4: GND
5: VO
4
6: VCC
Tr1
Tr2
I
CC
V
CC
6
I
O
V
O
5
GND
4
0.1uF bypass capacitor must be
connected between pins 6 and 4
2007-11-20 1
Absolute Maximum Ratings (Ta=25°C)
Characteristic Symbol Rating Unit
Forward current IF 25 mA
Forward current derating (Ta≥85°C) ΔIF/ΔTa -0. 7 mA/ °C
LED
Peak transient forward current (Note1) I
Reverse voltage VR 6 V
Output current IO 10 mA
Output voltage VO 6 V
Supply voltage VCC 6 V
DETECTOR
Output power dissipation PO 40 mW
Operating temperature range Topr -40~100 °C
Storage temperature range Tstg -55~125 °C
Lead solder temperature(10s) Tsol 260 °C
Isolation voltage
(AC,1min.,R.H.≤60%,Ta=25°C) (Note2)
1 A
FPT
BVs 3750 Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note1: Pulse width PW≤1us, 300pps.
Note2: This device is regarded as a two terminal device: pins 1 and 3 are shorted together, as are
pins 4, 5 and 6.
Recommended Operating Conditions
TLP2066
Characteristic Symbol Min Typ. Max Unit
Input current , ON I
Input voltage , OFF V
Supply voltage(*) (Note3)
8
F(ON)
F(OFF)
VCC
0
3.0 3.3 3.6 V
—
—
18 mA
0.8 V
(*) This item denotes operating ranges, not meaning of recommended operating conditions.
Note: Recommended operating conditions are given as a design guideline to obtain expected
performance of the device. Additionally, each item is an independent guideline respectively.
In developing designs using this product, please confirm specified characteristics shown in this
document.
Note3: The detector of this product requires a power supply voltage (VCC) of 3.0 V higher for stable operation.
If the VCC is lower than this value, an ICCH may increase, or an output may be unstable.
Be sure to use the product after checking the supply current, and the operation of a power-on/-off.
Note 4: A ceramic capacitor(0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the
high gain linear amplifier. Failure to provide the bypass may impair the switching property.
The total lead length between capacitor and coupler should not exceed 1 cm.
2007-11-20 2
Electrical Characteristics
(Unless otherwise specified, Ta=-40~100°C, VCC=3.0~3.6 V)
Characteristic
Symbol
Te st
Circuit
Conditions Min. Typ. Max. Unit
TLP2066
Input forward voltage VF
Temperature coefficient
of forward voltage
Input reverse current IR
Input capacitance CT
Logic low output voltage VOL 1 IOL=1.6mA, IF=12mA
Logic high output voltage VOH 2 IOH=-0.02mA, VF=1.05V 2.0
Logic low supply current I
Logic high supply current I
Supply voltage VCC — —
Input current logic low
output
Input voltage logic high
output
ΔVF/ΔTa
CCL
CCH
I
FHL
V
FLH
—
IF=10mA ,Ta=25°C 1.45 1.6 1.85 V
—
IF=10mA
—
VR=6V,Ta=25°C
—
V=0,f=1MHz,Ta=25°C
3 IF=12mA, VCC=3.3V
4 VF=0V, VCC=3.3V (Note 3)
—
IO=1.6mA,VO<0.6V —
—
IO=-0.02mA,VO>2.0V 0.8
—
— —
— 60
— —
— —
— —
3.0
*All typical values are at Ta=25°C, VCC=3.3V, IF (ON) =12mA unless otherwise specified
Isolation Characteristics (Ta = 25°C)
2 — mV/°C
10 μA
— pF
0.6 V
— —
5.0 mA
5.0 mA
—
3.6 V
V
— 5 mA
— —
V
Characteristic Symbol Test Conditions Min. Typ. Max. Unit
Capacitance input to output CS Vs = 0, f = 1MHz (Note 2) ― 0.8 ― pF
12
Isolation resistance R
Isolation voltage BV
R.H. ≤ 60%,VS = 500V
S
(Note 2)
AC,1 minute 3750 ― ―
AC,1 second,in oil ― 10000 ―
S
DC,1 minute,in oil ― 10000 ― Vdc
1×10
14
10
― Ω
Note 4: A ceramic capacitor(0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the high
gain linear amplifier. Failure to provide the bypass may impair the switching property.
The total lead length between capacitor and coupler should not exceed 1 cm.
V
rms
2007-11-20 3
Switching Characteristics
(Unless otherwise specified, Ta=-40~100°C, VCC=3.3V)
Characteristic Symbol
Propagation delay time
to logic high output
Propagation delay time
to logic low output
Propagation delay time
to logic high output
Propagation delay time
to logic low output
Switching time dispersion
between ON and OFF
Output fall time (90-10%) tf
Output rise time (10-90%) tr
tpHL
tpLH
tpHL
tpLH
|tpHL-
tpLH|
Te st
Circuit
5
6
5
Conditions Min. Typ. Max. Unit
IF=0→12mA
IF=12→0mA
V
=0→3.3V
IN
(IF=0→8mA)
V
=3.3→0V
IN
(IF=8→0mA)
IF=12mA , R
CL=15pF (Note 5)
IF=0→12mA
IF=12→0mA
(Note 5)
=100Ω,
IN
R
=100Ω
IN
CL=15pF
(Note 5)
R
=220Ω
IN
47pF
C
IN=
CL=15pF
R
=100Ω
IN
CL=15pF
(Note 5)
— —
— —
— —
— —
—
—
—
— 30
4
5
TLP2066
60 ns
60 ns
60 ns
60 ns
ns
—
—
ns
ns
Common mode transient
immunity at high Level
output
Common mode transient
immunity at low level
output
*All typical values are at Ta=25°C
Note 5: CL is approximately 15pF which includes probe and Jig/stray wiring capacitance.
CMH
CML
VCM=1000Vp-p,IF=0mA,
Vo(Min)=2V,Ta=25°C
7
VCM=1000Vp-p,IF=12mA,
Vo(Max)=0.8V,Ta=25°C
15000
-15000
TEST CIRCUIT 1: VOL TEST CIRCUIT 2: VOH
IF
→
↑
1
3
SHIELD
VCC
GND
6
1
0.1uF
5
V
4
↑
V
IOL
VOL
CC
3
SHIELD
V
CC
GND
6
5
4
TEST CIRCUIT 3: ICCL TEST CIRCUIT 4: ICCH
IF
→
↑
I
1
3
SHIELD
VCC
GND
CCL
6
A
5
4
VCC
1
3
SHIELD
V
CC
GND
6
5
4
— —
— —
IOH
↑
V
V
0.1uF
I
CCH
A
VCC
V/μs
V/μs
CC
2007-11-20 4
(
TEST CIRCUIT 5: tpHL , tpLH
TLP2066
IF=12mA (P.G)
(f=5MHz, duty=50%
tr =tf =5ns)
INPUT
MONITORING
NODE
CL=15pF
SHIELD
RIN=100Ω
CL is capacitance of the probe and JIG.
P. G): Pulse Generator
TEST CIRCUIT 6: tpHL, tpLH
VIN=3.3V (P.G)
(f=5MHz, duty=50%
tr = tf =5ns)
CL=15pF
INPUT MONITORING NODE
CIN=47pF
SHIELD
RIN=220Ω
VCC
GND
VCC
GND
0.1uF
0.1uF
Vo
MONITORING
NODE
CL=15pF
Vo
MONITORING
NODE
CL=15pF
IF
50%
VO
V
CC
1.5V
tf
tpHL
tpLH
tr
10%
90%
VOH
VOL
50%
VIN
VO
V
CC
1.5V
tf
tpHL
tpLH
tr
10%
90%
VOH
VOL
CL is capacitance of the probe and JIG.
(P.G): Pulse Generator
TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit
VCC
GND
6
0.1uF
5
4
V
O
V
CC
・SW B: IF=0mA
・SW A: IF=12mA
CM
SW
A
IF
→
B
1
3
SHIELD
V
CM
H
10%
=
90%
800(V)
s)tr(
μ
tr
2V
CM
L
tf
800(V)
=
t
f
1000V
0.8V
)( s
μ
CM
CML
H
2007-11-20 5
TLP2066
RESTRICTIONS ON PRODUCT USE
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
20070701-EN
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
2007-11-20 6
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