TC74VCX162721FT
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74VCX162721FT
Low-Voltage 20-Bit D-Type Flip-Flop with 3.6-V Tolerant Inputs and Outputs
The TC74VCX162721FT is a high-performance CMOS 20-bit
D-type flip-flop. Designed for use in 1.8-V, 2.5-V or 3.3-V systems,
it achieves high-speed operation while maintaining the CMOS
low power dissipation.
It is also designed with overvoltage tolerant inputs and outputs
up to 3.6 V.
The TC74VCX162721FT is an edge-triggered D-type flip-flop
with qualified clock storage. On the positive transition of the
clock (CK) input, the device provides true data at the Q outputs if
the clock-enable (CKEN) input is low. If CKEN is high, no data is
stored. When the OE input is high, the outputs are in a
high-impedance state. This device is designed to be used with
3-state memory address drivers, etc.
The 26-Ω series resistor helps reducing output overshoot and undershoot without external resistor.
All inputs are equipped with protection circuits against static discharge.
Features
Weight: 0.25 g (typ.)
• 26-Ω series resistors on outputs
• Low-voltage operation: V
• High-speed operation : t
: tpd = 5.8 ns (max) (VCC = 2.3 to 2.7 V)
: t
• Output current : I
: IOH/IOL = ±8 mA (min) (VCC = 2.3 V)
: I
• Latch-up performance: −300 mA
• ESD performance: Machine model ≥ ±200 V
Human body model ≥ ±2000 V
• Package: TSSOP
• 3.6-V tolerant function and power-down protection provided on all inputs and outputs
OH/IOL
OH/IOL
= 1.8 to 3.6 V
CC
= 4.4 ns (max) (VCC = 3.0 to 3.6 V)
pd
= 9.8 ns (max) (VCC = 1.8 V)
pd
= ±12 mA (min) (VCC = 3.0 V)
= ±4 mA (min) (VCC = 1.8 V)
1
2007-10-19
TC74VCX162721FT
Absolute Maximum Ratings (Note 1)
Characteristics Symbol Rating Unit
Power supply voltage V
DC input voltage V
DC output voltage V
Input diode current I
Output diode current I
DC output current I
Power dissipation P
DC VCC/ground current per supply pin ICC/I
Storage temperature T
CC
IN
OUT
IK
OK
OUT
D
GND
stg
−0.5 to 4.6 (Note 2)
−0.5 to V
±50 (Note 4) mA
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
−0.5 to 4.6 V
−0.5 to 4.6 V
+ 0.5
CC
(Note 3)
−50 mA
±50 mA
400 mW
±100 mA
−65 to 150 °C
V
Note 2: OFF state
Note 3: High or low state. I
Note 4: V
OUT
< GND, V
absolute maximum rating must be observed.
OUT
> VCC
OUT
Operating Ranges (Note 1)
Characteristics Symbol Rating Unit
Power supply voltage V
Input voltage V
Output voltage V
Output current IOH/IOL
Operating temperature T
Input rise and fall time dt/dv 0 to 10 (Note 8) ns/V
CC
IN
OUT
opr
1.2 to 3.6 (Note 2)
0 to 3.6 (Note 3)
0 to VCC (Note 4)
±12 (Note 5)
±8 (Note 6)
1.8 to 3.6
−0.3 to 3.6 V
±4 (Note 7)
−40 to 85 °C
Note 1: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
V
V
mA
Note 3: OFF state
Note 4: High or low state
Note 5: V
= 3.0 to 3.6 V
CC
Note 6: VCC = 2.3 to 2.7 V
Note 7: VCC = 1.8 V
Note 8: VIN = 0.8 to 2.0 V, VCC = 3.0 V
4
2007-10-19