Toshiba TC551001BTRL-85L, TC551001BTRL-70L, TC551001BFTL-85L Datasheet

TOSHIBA

TC551001BPL/BFL/BFTL/BTRL-70L/85L

SILICON GATE CMOS
131,072 WORD x 8 BIT STATIC RAM

Description

The TC551001BPL is a 1,048,576 bits static random access memory organized as 131,072 words by 8 bits using CMOS technology,
and operated from a single 5V power supply. Advanced circuit techniques provide both high speed and low power features with an
operating current of 5mA/MHz (typ.) and a minimum cycle time of 70ns. When CE1 is a logical high, or CE2 is low, the device is
placed in a low power standby mode in which the standby current is 2 µ A typically. The TC551001BPL has three control inputs.
Chip Enable inputs (CE1, CE2) allow for device selection and data retention control, while an Output Enable input (OE) provides fast
memory access. The TC551001BPL is suitable for use in microprocessor application systems where high speed, low power, and
battery backup are required.

The TC551001BPL is offered in a standard dual-in-line 32-pin plastic package, a small outline plastic package, and a thin small

outline plastic package (forward, reverse type).

Features

• Low power dissipation : 27.5mW/MHz (typ.)

• Standby current: 4 µ A (max.) at Ta = 25 ° C

• 5V single power supply

• Access time (max.)

TC551001BPL/BFL/BFTL/BTRL

Pin Connection (Top View)

-70L -85L

Access Time
CE1 Access Time 70ns 85ns
CE2 Access Time 70ns 85ns
OE Access Time 35ns 45ns

• Power down feature: CE1

70ns 85ns

, CE2

• Data retention supply voltage: 2.0 ~ 5.5V

• Inputs and outputs directly TTL compatible

• Package TC551001BPL : DIP32-P-600
TC551001BFL : SOP32-P-525

TC551001BFTL : TSOP32-P-0820
TC551001BTRL : TSOP32-P-0820A

Pin Names

A0 ~ A16 Address Inputs

R/W Read/Write Control Input

OE Output Enable Input

CE1, CE2 Chip Enable Inputs

I/O1 ~ I/O8 Data Input/Output

V

DD

GND Ground

N.C. No Connection

PIN NO.

PIN NAME A

PIN NO.

PIN NAME A

Power (+5V)

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

A

A

11

17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32

9

A

3

2

A

8

13

A

A

1

0

CE2 A

R/W

I/O1

I/O2 I/O3 GND I/O4 I/O5 I/O6 I/O7 I/O8 CE1 A

TSOP Pinout

V

15

DD

NC

A

A

16

A

14

A

12

A

7

A

6

A

5

10

4

OE

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.

1

°

°

°

TC551001BPL/BFL/BFTL/BTRL-70L/85L Static RAM SR01020795

Block Diagram

Operating Mode

OPERATION MODE

Read
Write
Output Deselect

Standby

* H or L

CE1 CE2 OE R/W I/O1 ~ I/O8 POWER

L H L H D
L H * L D
L H H H High-Z I

H * * * High-Z I

*

L * * High-Z I

Maximum Ratings

SYMBOL ITEM RATING UNIT

V

V

V

P

T

SOLDER

T

STRG

T

OPR

* -3.0V at pulse width of 50ns Max
** SOP

Power Supply Voltage

DD

Input V oltage

IN

Input and Output Voltage

I/O

Power Dissipation

D

Soldering T emperature (10s)
Storage Temperature
Operating Temperature

-0.3 ~ 7.0 V

-0.3* ~ 7.0 V

-0.5 ~ V

DD

+ 0.5

1.0/0.6** W
260

-55 ~ 150
0 ~ 70

OUT

IN

V

C
C
C

I

DDO

I

DDO
DDO
DDS
DDS

2

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.

±

±

µ

SR01020795 Static RAM TC551001BPL/BFL/BFTL/BTRL-70L/85L

DC Recommended Operating Conditions

SYMBOL

V

V
V

V

* -3.0V at pulse width of 50ns Max.

Power Supply Voltage

DD

Input High Voltage

IH

Input Low Voltage

IL

Data Retention Supply Voltage

DH

PARAMETER MIN. TYP. MAX. UNIT

4.5 5.0 5.5

2.2 – V

-0.3* – 0.8

2.0 – 5.5

DC and Operating Characteristics (Ta = 0 ~ 70ºC, V

SYMBOL

I

Input Leakage Current

LI

I
I

I

I

DDO1

Output Leakage Current

LO

Output High Current

OH

Output Low Current

OL

Operating Current

I

DDO2

I

DDS1

Standby Current

(1)

I

DDS2

Note: (1) In standby mode with CE1 ≥ V

PARAMETER TEST CONDITION MIN. TYP. MAX. UNIT

V

IN

CE1 = V
OE

V

OH

V

OL

CE1 = V
and R/W = V
I

OUT

Other Inputs = V
CE1

CE2 = V
R/W = V
I

OUT

Other Inputs
= V

CE1 = V
CE1

CE2 = 0.2V
V

DD

- 0.2V, these specification limits are guaranteed under the condition of CE2 ≥ V

DD

= 5V ± 10%)

DD

= 0 ~ V

= V

DD

or CE2 = V

IH

V

IH,

OUT

= 2.4V

= 0.4V

and CE2 = V

IL

IH,

= 0mA

= 0.2V and

- 0.2V

DD

- 0.2V

DD

= 0mA

- 0.2V/0.2V

DD

or CE2 = V

IH

- 0.2V or

= V

DD

= 2.0V ~ 5.5V

DD

= 0 ~ V

/V

IH

IL

+ 0.3

or R/W = V

IL

DD

IH

IL

V

–

or

IL

–

–
–

1.0 µ A

1.0 µ A

-1.0 – – mA

4.0 – – mA

t

cycle

t

cycle

Min.

1 µ s – – 20

Min.

1 µ s – – 10

– – 70

– – 60

–

– 3 mA

Ta = 0 ~ 70 ° C – – 30
Ta = 25 ° C – 2 4

- 0.2V or CE2 ≤ 0.2V.

DD

mA

A

Capacitance (Ta = 25ºC, f = 1MHz)

SYMBOL

C

C

Note: This parameter is periodically sampled and is not 100% tested.

Input Capacitance

IN

Output Capacitance

OUT

PARAMETER TEST CONDITION MAX. UNIT

V

= GND

IN

V

OUT

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= GND

10
10

.

pF

3

TC551001BPL/BFL/BFTL/BTRL-70L/85L Static RAM SR01020795

AC Characteristics (Ta = 0 ~ 70°C, VDD = 5V±10%)

Read Cycle

TC551001BPL/BFL/BFTL/BTRL

SYMBOL PARAMETER

t

t

ACC

t

CO1

t

CO2

t

t

COE

t

OEE

t

t

ODO

t

Read Cycle Time 70 – 85 –

RC

Address Access Time – 70 – 85
CE1 Access Time – 70 – 85
CE2 Access Time – 70 – 85
Output Enable to Output in Valid – 35 – 45

OE

Chip Enable (CE1, CE2) to Output in Low-Z 10 – 10 –
Output Enable to Output in Low-Z 5 – 5 –
Chip Enable (CE1, CE2) to Output in High-Z – 25 – 30

OD

Output Enable to Output in High-Z – 25 – 30
Output Data Hold Time 10 – 10 –

OH

Write Cycle

SYMBOL PARAMETER

t
t
t

t

t

t

ODW

t

OEW

t
t

Write Cycle Time 70 – 85 –

WC

Write Pulse Width 50 – 60 –

WP

Chip Selection to End of Write 60 – 75 –

CW

Address Setup Time 0 – 0 –

AS

Write Recovery Time 0 – 0 –

WR

R/W to Output in High-Z – 25 – 30
R/W to Output in Low-Z 5 – 5 –
Data Setup Time 30 – 35 –

DS

Data Hold Time 0 – 0 –

DH

UNIT-70L -85L

MIN. MAX. MIN. MAX.

ns

TC551001BPL/BFL/BFTL/BTRL

UNIT-70L -85L

MIN. MAX. MIN. MAX.

ns

AC Test Conditions

Input Pulse Levels 2.4V/0.6V
Input Pulse Rise and Fall Time 5ns
Input Timing Measurement Reference Level 1.5V
Output Timing Measurement Reference Level 1.5V
Output Load 1 TTL Gate and CL = 100pF

4

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