TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSVI)
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2SK3767
2SK3767
Switching Regulator Applications
•
Low drain-source ON resistance: R
•
High forward transfer admittance: |Y
•
Low leakage current: I
•
Enhancement mode: V
= 100μA (VDS = 600 V)
DSS
= 2.0 to 4.0 V (VDS = 10 V, ID = 1 mA)
th
= 3.3Ω (typ.)
DS (ON)
| = 1.6S (typ.)
fs
Maximum Ratings
Characteristics Symbol Rating Unit
Drain-source voltage V
Drain-gate voltage (RGS = 20 kΩ) V
Gate-source voltage V
Drain current
Drain power dissipation (Tc = 25°C)
Single pulse avalanche energy
(Note 2)
Avalanche current IAR 2 A
Repetitive avalanche energy (Note 3) EAR 4 mJ
Channel temperature Tch 150 °C
Storage temperature range T
(Ta = 25°C)
DC (Note 1) I
Pulse (Note 1) I
DSS
DGR
GSS
DP
P
E
D
AS
stg
D
600 V
600 V
±30 V
2
5
25 W
93 mJ
-55~150 °C
A
Thermal Characteristics
Unit: mm
1: Gate
2: Drain
3: Source
JEDEC ―
JEITA SC-67
TOSHIBA 2-10U1B
Weight : 1.7 g (typ.)
Characteristics Symbol Max Unit
Thermal resistance, channel to case R
Thermal resistance, channel to ambient R
5.0 °C/W
th (ch-c)
62.5 °C/W
th (ch-a)
Note 1: Ensure that the channel temperature does not exceed 150℃.
Note 2: VDD = 90 V, Tch = 25°C(initial)), L = 41mH, RG = 25 Ω , IAR = 2 A
Note 3: Repetitive rating: pulse width limited by maximum channel temperature
This transistor is an electrostatic-sensitive device. Please handle with caution.
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Electrical Characteristics
Characteristics Symbol Test Condition Min Typ. Max Unit
Gate leakage current I
Gate-source breakdown voltage V
Drain cut-off current I
Drain-source breakdown voltage V
Gate threshold voltage Vth VDS = 10 V, ID = 1 mA 2.0 ⎯ 4.0 V
Drain-source ON resistance R
Forward transfer admittance ⎪Y
Input capacitance C
Reverse transfer capacitance C
Output capacitance C
Rise time tr ⎯
Switching time
Total gate charge Qg ⎯
Gate-source charge Qgs ⎯
Gate-drain charge Qgd
Turn-on time ton ⎯ 55 ⎯
Fall time tf ⎯ 20 ⎯
Turn-off time t
(Ta = 25°C)
(BR) GSSIG
(BR) DSSID
DS (ON)
VGS = ±25 V, VDS = 0 V
GSS
= ±10 µA, VDS = 0 V
VDS = 600 V, VGS = 0 V ⎯⎯ 100 µA
DSS
= 10 mA, VGS = 0 V 600 ⎯⎯ V
VGS = 10 V, ID = 1 A ⎯ 3.3 4.5 Ω
⎪ V
fs
iss
rss
oss
off
= 10 V, ID = 1 A 0.8 1.6 ⎯ S
DS
= 10 V, VGS = 0 V, f = 1 MHz
V
DS
10 V
V
GS
0 V
Duty
V
DD
50 Ω
1%, tw = 10 µs
400 V, VGS = 10 V, ID = 2A
I
D
= 1A
V
DD
Output
R
=
L
200 Ω
200 V
⎯ ⎯ ±
30
±
⎯
320 ⎯
⎯
30 ⎯
⎯
⎯
100 ⎯
15 ⎯
80 ⎯
⎯
⎯
10
⎯
9
⎯
5
⎯
4
⎯
Source-Drain Ratings and Characteristics
(Ta = 25°C)
µA
V
pF
ns
nC
Characteristics Symbol Test Condition Min Typ. Max Unit
Continuous drain reverse current (Note 1)
Pulse drain reverse current (Note 1) I
Forward voltage (diode) V
Reverse recovery time trr ⎯ 1000 ⎯ ns
Reverse recovery charge Qrr
I
⎯⎯⎯ 2 A
DR
DRP
IDR = 2 A, VGS = 0 V
DSF
I
= 2 A, VGS = 0 V,
DR
/dt = 100 A/µs
dI
DR
⎯
⎯
⎯
⎯ 3.5 ⎯ µC
5 A
⎯
⎯ −
1.7 V
Marking
K3767
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
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⎪
⎪
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– VDS
I
D
5.5
6
1.6
(A)
D
1.2
2
10
0.8
Drain current I
0.4
VGS = 4V
0
0 4 8 12 16
Drain-source voltage VDS (V)
I
– VGS
D
(A)
D
5
Common source
VDS = 20 V
4
Pulse test
3
2
Drain current I
1
0
0 2 4 6 8 10
Tc=100℃
Gate-source voltage VGS (V)
Common source
Tc = 25°C
Pulse test
−55
25
I
– VDS
4
Common source
Tc = 25°C
3
2
1
0
0
Pulse test
5.25
(A)
5
4.75
4.5
20
24
D
Drain current I
D
10
8
12 4
16
VGS = 4V
20
6
5.5
5.25
5
4.75
4.5
24
Drain-source voltage VDS (V)
V
– V
DS
ID = 2A
GS
1
Common source
Tc = 25℃
Pulse test
0.5
20
16
(V)
DS
12
8
4
Drain current voltage V
0
0
4 12 16 20
8
Gate-source voltage VGS (V)
(S)
fs
Y
Forward transfer admittance
0.1
0.01
10
1
0.01
Y
– ID
fs
Tc = −55°C
100
25
Common source
V
DS
Pulse test
0.1
1
Drain current ID (A)
=
20 V
R
100
Common source
Tc = 25°C
Pulse test
(Ω)
10
DS (ON)
R
DS (ON)
VGS=10V
– ID
Drain source ON resistance
1
10
0.011
0.1
10
Drain current ID (A)
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R
10
Common source
VGS =10V
pulse test
8
)
Ω
6
(
4
DS (ON)
R
Drain-source ON resistance
2
0
Case temperature (°C)
DS (ON)
ID=2A
– Tc
0.5
10
Common source
Tc = 25°C
DR
0.1
0.01
1
0
Pulse test
10
1
−0.4
(A)
1
Drain reverse current I
200 -50 0 50 100 15 0 -100
Drain-source voltage (V)
1000
Capacitance – V
100
DS
6
C
iss
5
(V)
th
4
3
I
DR
V
th
– VDS
VGS = 0, −1 V
0.8
−
– Tc
1.2
−
Common source
VDS = 10 V
ID = 1 mA
Pulse test
−1.6
10
Capacitance C (pF)
1
0.1
50
40
(W)
D
30
20
10
Drain power dissipation P
0
0 40
Common source
VGS = 0 V
f = 1 MHz
Tc = 25°C
1 10 100
Drian-source voltage VDS (V)
P
– Tc
D
80
Case temperature Tc (°C)
120
C
oss
C
rss
3
2
1
Gate threshold voltage V
0
−80
−40 0 40 80 120 150
Case temperature Tc (°C)
Dynamic Input / output
characteristics
160
800
100V
200V
6 8
VDD = 400V
Common source
ID = 7.5 A
Tc = 25°C
Pulse test
10
(V)
600
DS
400
200
Drain-source voltage V
0
0 2
4
16
(V)
12
GS
8
4
Gate-source voltage V
0
12
Total gate charge Qg (nC)
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r
– tw
th
10
3
0.01
Duty=0.5
SINGLE PULSE
P
DM
t
Duty = t/T
R
th (ch-c)
T
= 5℃/W
1
0.2
0.3
0.1
th (ch-c)
0.1
0.05
/R
0.02
0.03
th (t)
r
0.01
0.003
Normalized transient thermal impedance
0.001
10μ100μ 1m 10m100m1 10
Pulse width tw (s)
2SK3767
100
ID max (PULSED) *
10
(A)
ID max (CONTINUOUS) *
D
1
DC OPERATION
Drain current I
0.1
※ Single nonrepetitive pulse
Curves must be derated linearly with
increase in temperature.
0.01
1
erating area
Safe o
100 µs *
Tc = 25°C
Tc= 2 5 ℃
10
Darin-source voltage VDS (V)
1 ms *
100
V
DSS
max
1000
200
160
(mJ)
AS
120
80
40
Avalanche energy E
0
25 50 75 100 125 150
15
−15
R
= 25
Ω
G
VDD = 90 V, L = 41mH
E
– Tch
AS
Channel temperature (initial) Tch (°C)
B
V
V
VDSS
I
AR
V
V
DD
DS
TEST CIRCUITWAVE FORM
⎛
1
Ε
AS
2
B
2
⎜
IL
⋅⋅⋅=
⎜
B
VDSS
⎝
VDSS
−
⎞
⎟
⎟
V
DD
⎠
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RESTRICTIONS ON PRODUCT USE
•
The information contained herein is subject to change without notice.
•
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
•
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
•
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
•
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.
030619EAA
6
2004-12-10
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