Texas Instruments TPD1E0B04, TPD1E04U04 User Manual
User's Guide
SLVUAN6–June 2016
TPD1E0B04 Evaluation Module
This user's guide describes the characteristics, operation, and use of the TPD1E0B04 EVM evaluation
module (EVM). This EVM includes six TPD1E0B04s in various configurations for testing. Five
TPD1E0B04s are configured for IEC 61000-4-2 compliance testing and one is configured for 2-port sparameter analysis. This user's guide includes setup instructions, schematic diagrams, a bill of materials,
and printed-circuit board layout drawings for the evaluation module.
Contents
1 Introduction ................................................................................................................... 2
2 Definitions..................................................................................................................... 2
3 Setup .......................................................................................................................... 3
3.1 IEC 61000-4-2 ESD Rating Tests ................................................................................ 3
3.2 Scattering Parameters ............................................................................................. 4
3.3 ±8-kV ESD Clamping Waveforms ................................................................................ 4
4 Board Layout ................................................................................................................. 6
5 Schematics ................................................................................................................... 6
6 Bill of Materials............................................................................................................... 7
List of Figures
1 Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 4-kV ......................... 3
2 System Level ESD Test Setup............................................................................................. 4
3 TPD1E0B04EVM Top Layer and Silkscreen............................................................................. 6
4 TPD1E0B04EVM Schematic ............................................................................................... 6
List of Tables
1 IEC 61000-4-2 Test Levels ................................................................................................ 2
2 Waveform Parameters in Contact Discharge Mode..................................................................... 2
3 Bill of Materials............................................................................................................... 7
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Introduction
1 Introduction
Texas Instrument’s TPD1E0B04 evaluation module helps designers evaluate the operation and
performance of the TPD1E0B04 device. The TPD1E0B04 is a unidirectional TVS ESD protection diode for
HDMI 2.0 and USB 3.1 Gen II Super-speed data line protection. The TPD1E0B04 is rated to dissipate
ESD strikes at the maximum level specified in the IEC 61000-4-2 international standard (Level 4).
The EVM contains six TPD1E0B04s. Five TPD1E0B04s (D1 – D5) are configured with test points for
striking ESD to the protection pins. One TPD1E0B04 (D6) is configured with 2 SMA (J1 and J2)
connectors for 2-port analysis with a vector network analyzer. TPD1E0B04 (D6) can also be used for
capturing clamping waveforms with an oscilloscope during an ESD test. Caution must be taken when
capturing clamping waveforms during an ESD event so as not to damage the oscilloscope. A proper
procedure is outlined in Section 3.3.1.
2 Definitions
Contact Discharge — a method of testing in which the electrode of the ESD simulator is held in contact
with the device-under-test (DUT).
Air Discharge — a method of testing in which the charged electrode of the ESD simulator approaches
the DUT, and a spark to the DUT actuates the discharge.
ESD Simulator — a device that outputs IEC 61000-4-2 compliance ESD waveforms shown in Figure 1
with adjustable ranges shown in Table 1 and Table 2.
IEC 61000-4-2 has 4 classes of protection levels. Classes 1 – 4 are shown in Table 1. Stress tests
must be incrementally tested to level 4 as shown in Table 2 until the point of failure. If the DUT
does not fail at 8-kV, testing can continue in 2-kV increments until failure.
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Contact Discharge Air Discharge
Class Test Voltage [± kV] Class Test Voltage [± kV]
1 2 1 2
2 4 2 4
3 6 3 8
4 8 4 15
Table 2. Waveform Parameters in Contact Discharge Mode
Stress Level Step Simulator Voltage
[kV]
1 2 7.5 0.8 4 2
2 4 15 0.8 8 4
3 6 22.5 0.8 12 6
4 8 30 0.8 16 8
Table 1. IEC 61000-4-2 Test Levels
Ipeak ±15%
[A]
Rise Time ±25%
[ns]
Current at 30 ns
±30% [A]
Current at 60 ns
±30% [A]
2
TPD1E0B04 Evaluation Module
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10
20
30
0 20 40 60 80 100
Current (A)
Time (ns)
I
PEAK
90% I
PEAK
10% I
PEAK
800 ps 90/10 rise time
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Figure 1. Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 4-kV
3 Setup
This section describes the intended use of the EVM. A generalized outline of the procedure given in IEC
61000-4-2 is described here. IEC 61000-4-2 must be referred to for a more specific testing outline. Basic
configurations for collecting s-parameters and ESD clamping waveforms are outlined as well.
3.1 IEC 61000-4-2 ESD Rating Tests
TPD1E0B04 (D1 – D5) can be used for destructive electrostatic discharge (ESD) pass or fail strikes.
Specifically, they can be used for both IEC 61000-4-2 air and contact discharge tests. The procedure in
Section 3.1.1 ensures proper testing setup and method for both discharge tests. Each IO has a Test Pad
(TP1 – TP5) directly connected to it for striking ESD.
Setup
3.1.1 Test Method and Set-Up
An example test setup is shown in Figure 2. Details of the testing table and ground planes can be found in
the IEC 61000-4-2 test procedure. Ground the EVM using the banana connector J3. Discharge the ESD
simulator on any of the test points TP1 – TP5. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the test point
during contact, it is not during air-gap.
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