Datasheet TLV5623IDR, TLV5623IDGKR, TLV5623ID, TLV5623IDGK, TLV5623CDR Datasheet (Texas Instruments)

...
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
D
Programmable Settling Time vs Power Consumption
3 µs in Fast Mode 9 µs in Slow Mode
D
Ultra Low Power Consumption:
900 µW Typ in Slow Mode at 3 V
2.1 mW Typ in Fast Mode at 3 V
D
Differential Nonlinearity...<0.2 LSB Typ
D
Compatible With TMS320 and SPI Serial Ports
D
Power-Down Mode
D
Buffered High-Impedance Reference Input
D
Monotonic Over Temperature
D
Available in MSOP Package
applications
D
Digital Servo Control Loops
D
Digital Offset and Gain Adjustment
D
Industrial Process Control
D
Machine and Motion Control Devices
D
Mass Storage Devices
description
The TLV5623 is a 8-bit voltage output digital-to­analog converter (DAC) with a flexible 4-wire serial interface. The 4-wire serial interface allows glueless interface to TMS320, SPI, QSPI, and Microwire serial ports. The TLV5623 is pro­grammed with a 16-bit serial string containing 4 control and 12 data bits. Developed for a wide range of supply voltages, the TLV5623 can operate from 2.7 V to 5.5 V.
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer . The buffer features a Class AB output stage to improve stability and reduce settling time. The settling time of the DAC is programmable to allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits within the 16-bit serial input string. A high-impedance buffer is integrated on the REFIN terminal to reduce the need for a low source impedance drive to the terminal.
Implemented with a CMOS process, the TL V5623 is designed for single supply operation from 2.7 V to 5.5 V. The device is available in an 8-terminal SOIC package. The TL V5623C is characterized for operation from 0°C to 70°C. The TLV5623I is characterized for operation from –40°C to 85°C.
AVAILABLE OPTIONS
PACKAGE
T
A
SMALL OUTLINE
(D)
MSOP (DGK)
0°C to 70°C TLV5623CD TLV5623CDGK
–40°C to 85°C TLV5623ID TLV5623IDGK
Available in tape and reel as the TL V5623CDR and the TLV5623IDR
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
1 2 3 4
8 7 6 5
DIN
SCLK
CS
FS
V
DD
OUT REFIN AGND
D OR DGK PACKAGE
(TOP VIEW)
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
functional block diagram
Serial Input
Register
16 Cycle
Timer
REFIN
CS
SCLK
FS
OUT
_ +
Power-On
Reset
DIN
8-Bit Data
Latch
Speed/Power-Down
Logic
2
8
Update
6
1
2 3 4
7
x2
10
8
Terminal Functions
TERMINAL
NAME NO.
I/O
DESCRIPTION
AGND 5 Analog ground CS 3 I Chip select. Digital input used to enable and disable inputs, active low. DIN 1 I Serial digital data input FS 4 I Frame sync. Digital input used for 4-wire serial interfaces such as the TMS320 DSP interface. OUT 7 O DAC analog output REFIN 6 I Reference analog input voltage SCLK 2 I Serial digital clock input V
DD
8 Positive power supply
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage (V
DD
to AGND) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage range – 0.3 V to V
DD
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range – 0.3 V to V
DD
+ 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
: TLV5623C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TLV5623I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
MIN NOM MAX UNIT
pp
VDD = 5 V 4.5 5 5.5 V
Suppl
y v
oltage, V
DD
VDD = 3 V 2.7 3 3.3 V
High-level digital input voltage, V
IH
VDD = 2.7 V to 5.5 V 2 V
Low-level digital input voltage, V
IL
VDD = 2.7 V to 5.5 V 0.8 V
Reference voltage, V
ref
to REFIN terminal VDD = 5 V (see Note 1) AGND 2.048 VDD–1.5 V
Reference voltage, V
ref
to REFIN terminal VDD = 3 V (see Note 1) AGND 1.024 VDD–1.5 V
Load resistance, R
L
2 10 k
Load capacitance, C
L
100 pF
Clock frequency, f
CLK
20 MHz
p
p
TLV5623C 0 70 °C
Operating free-air temperature, T
A
TLV5623I –40 85 °C
NOTE 1: Due to the x2 output buffer, a reference input voltage V
DD/2
causes clipping of the transfer function.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
power supply
PARAMETER TEST CONDITIONS MIN TYP MAX
UNIT
VDD = 5 V, VREF = 2.048 V, No load,
Fast 0.9 1.35 mA
pp
All inputs = AGND or VDD, DAC latch = 0x800
Slow 0.4 0.6 mA
IDDPower supply current
VDD = 3 V, VREF = 1.024 V No load,
Fast 0.7 1.1 mA
All inputs = AGND or VDD, DAC latch = 0x800
Slow 0.3 0.45 mA
Power down supply current (see Figure 12) 1 µA
pp
Zero scale See Note 2 –68
PSRR
Power supply rejection ratio
Full scale See Note 3 –68
dB
Power on threshold voltage, POR 2 V
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin))/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by: PSRR = 20 log [(EG(VDDmax) – EG(VDDmin))/VDDmax]
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) (continued)
static DAC specifications RL = 10 k, CL = 100 pF
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 8 bits INL Integral nonlinearity See Note 4 ± 0.3 ±0.5 LSB DNL Dif ferential nonlinearity See Note 5 ± 0.07 ± 0.2 LSB E
ZS
Zero-scale error (offset error at zero scale) See Note 6 ±10 mV EZS
TC
Zero-scale-error temperature coefficient See Note 7 10 ppm/°C
E
G
Gain error See Note 8 ±0.6
% of
FS
voltage
Gain-error temperature coefficient See Note 9 10 ppm/°C
NOTES: 4. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error , is the maximum deviation of the output
from the line between zero and full scale excluding the effects of zero code and full-scale errors.
5. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale-error temperature coef ficient is given by: EZSTC = [EZS(T
max
) – EZS(T
min
)]/V
ref
× 106/(T
max
– T
min
).
8. Gain error is the deviation from the ideal output (2V
ref
– 1 LSB) with an output load of 10 kexcluding the effects of the zero-error .
9. Gain temperature coefficient is given by: EGTC = [EG(T
max
) – EG (T
min
)]/V
ref
× 106/(T
max
– T
min
).
output specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
O
Voltage output range RL = 10 k 0 VDD–0.1 V Output load regulation accuracy RL = 2 k, vs 10 k ±0.1 ±0.25
% of FS
voltage
reference input (REF)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
I
Input voltage range 0 VDD–1.5 V
R
I
Input resistance 10 M
C
I
Input capacitance 5 pF
p
Slow 525 kHz
Reference input bandwidth
REFIN
= 0.2
V
pp
+
1.024 V dc
Fast 1.3 MHz
Reference feed through
REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10)
–75 dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
digital inputs
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
I
IH
High-level digital input current VI = V
DD
±1 µA
I
IL
Low-level digital input current VI = 0 V ±1 µA
C
I
Input capacitance 3 pF
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
operating characteristics over recommended operating free-air temperature range (unless otherwise noted)
analog output dynamic performance
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
p
R
= 10 k,
CL = 100 pF,
Fast 3 5.5
t
s(FS)
Output settling time, full scale
L
,
See Note 11
Slow 9 20
µ
s
p
R
= 10 k,
CL = 100 pF,
Fast 1 µs
t
s(CC)
Output settling time, code to code
L
,
See Note 12
Slow 2 µs
R
= 10 k, C
= 100 pF,
Fast 3.6
SR
Slew rate
L
,
See Note 13
L
,
Slow 0.9
V/µs
Glitch energy Code transition from 0x7F0 to 0x800 10 nV–s S/N Signal to noise 57 dB S/(N+D) Signal to noise + distortion
fs = 400 KSPS fout = 1.1 kHz,
p
49 dB
THD Total harmonic distortion
R
L
=
10 k,C
L
=
100 pF
,
BW = 2
0
kHz
–50 dB
Spurious free dynamic range
BW = 20 kHz
60 dB
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFF0 or 0xFF0 to 0x020. Not tested, ensured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change of one count. Not tested, ensured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
digital input timing requirements
MIN NOM MAX UNIT
t
su(CS–FS)
Setup time, CS low before FS 10 ns
t
su(FS–CK)
Setup time, FS low before first negative SCLK edge 8 ns
t
su(C16–FS)
Setup time, sixteenth negative edge after FS low on which bit D0 is sampled before rising edge of FS
10 ns
t
su(C16–CS)
Setup time, sixteenth positive SCLK edge (first positive after D0 is sampled) before CS rising edge. If FS is used instead of the sixteenth positive edge to update the DAC, then the setup time is between the FS rising edge and CS
rising edge.
10 ns
t
wH
Pulse duration, SCLK high 25 ns
t
wL
Pulse duration, SCLK low 25 ns
t
su(D)
Setup time, data ready before SCLK falling edge 8 ns
t
h(D)
Hold time, data held valid after SCLK falling edge 5 ns
t
wH(FS)
Pulse duration, FS high 20 ns
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
123451516
D15 D14 D13 D12 D1 D0
t
su(FS-CK)
t
su(CS-FS)
t
wH(FS)
t
h(D)
t
su(D)
t
wH
t
wL
t
su(C16-CS)
t
su(C16-FS)
SCLK
DIN
CS
FS
Figure 1. Timing Diagram
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 2
1.998
1.996
1.994
1.990 0 0.01 0.02 0.05 0.1 0.2 0.5
– Output Voltage – V
2
2.002
Load Current – mA
OUTPUT VOLTAGE
vs
LOAD CURRENT
2.004
12
3 V Slow Mode, SOURCE
3 V Fast Mode, SOURCE
1.992
V
O
VDD = 3 V, V
ref
= 1 V,
Full Scale
Figure 3
3.995
3.99
3.985
3.975 0 0.02 0.04 0.1 0.2 0.4 1
4
4.005
OUTPUT VOLTAGE
vs
LOAD CURRENT
4.01
24
3.98
– Output Voltage – V
Load Current – mA
5 V Slow Mode, SOURCE
5 V Fast Mode, SOURCE
V
O
VDD = 5 V, V
ref
= 2 V,
Full Scale
Figure 4
0.1
0.08
0.04
0
0 0.01 0.02 0.05 0.1 0.2 0.5
0.16
0.18
OUTPUT VOLTAGE
vs
LOAD CURRENT
0.2
12
0.14
0.12
0.06
0.02
– Output Voltage – V
Load Current – mA
3 V Slow Mode, SINK
3 V Fast Mode, SINK
V
O
VDD = 3 V, V
ref
= 1 V,
Zero Code
Figure 5
0.2
0.15
0.1
0
0 0.02 0.04 0.1 0.2 0.4 1
0.25
0.3
OUTPUT VOLTAGE
vs
LOAD CURRENT
0.35
24
0.05
– Output Voltage – V
Load Current – mA
5 V Slow Mode, SINK
5 V Fast Mode, SINK
V
O
VDD = 5 V, V
ref
= 2 V,
Zero Code
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 6
0.6
0.4
0.2 –55 –40 –25 0 25 40 70
– Supply Current – mA
0.8
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
1
85 125
I
DD
VDD = 3 V, V
ref
= 1 V,
Full Scale
TA – Free-Air Temperature – C°
Fast Mode
Slow Mode
Figure 7
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
0.6
0.4
0.2 –55 –40 –25 0 25 40 70
– Supply Current – mA
0.8
1
85 125
I
DD
VDD = 5 V, V
ref
= 2 V,
Full Scale
TA – Free-Air Temperature – C°
Fast Mode
Slow Mode
Figure 8
––40
–50
–70
–80
0 5 10 20
THD – Total Harmonic Distortion – dB
–30
–10
f – Frequency – kHz
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
0
30 50 100
–20
–60
V
ref
= 1 V dc + 1 V p/p Sinewave,
Output Full Scale
Fast Mode
Figure 9
––40
–50
–70
–80
0 5 10 20
THD – Total Harmonic Distortion – dB
–30
–10
f – Frequency – kHz
TOTAL HARMONIC DISTORTION
vs
FREQUENCY
0
30 50 100
–20
–60
V
ref
= 1 V dc + 1 V p/p Sinewave,
Output Full Scale
Slow Mode
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 10
––40
–50
–70
–80
0 5 10 20
THD – Total Harmonic Distortion And Noise – dB
–30
–10
f – Frequency – kHz
TOTAL HARMONIC DISTORTION AND NOISE
vs
FREQUENCY
0
30 50 100
–20
–60
V
ref
= 1 V dc + 1 V p/p Sinewave,
Output Full Scale
Fast Mode
Figure 11
––40
–50
–70
–80
0 5 10 20
–30
–10
f – Frequency – kHz
TOTAL HARMONIC DISTORTION AND NOISE
vs
FREQUENCY
0
30 50 100
–20
–60
V
ref
= 1 V dc + 1 V p/p Sinewave,
Output Full Scale
THD – Total Harmonic Distortion And Noise – dB
Slow Mode
Figure 12
400
300
100
0
0 100 200 300 400 500 600
– Supply Current –
600
800
T – Time – ns
SUPPLY CURRENT
vs
TIME (WHEN ENTERING POWER-DOWN MODE)
900
700 800 900 1000
700
500
200
I
DD
µ A
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
10
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 13
–0.10
–0.08
–0.06
–0.04
–0.02
0.00
0.02
0.04
0.06
0.08
0.10
0 255
DNL – Differential Nonlinearity – LSB
Digital Output Code
DIFFERENTIAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
12864 192
Figure 14
–0.5
–0.4
–0.3
–0.2
–0.1
–0.0
0.1
0.2
0.3
0.4
0.5
0 255
INL – Integral Nonlinearity – LSB
Digital Output Code
INTEGRAL NONLINEARITY
vs
DIGITAL OUTPUT CODE
64 128 192
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
11
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
general function
The TL V5623 is an 8-bit single supply DAC based on a resistor string architecture. The device consists of a serial interface, speed and power-down control logic, a reference input buffer , a resistor string, and a rail-to-rail output buffer .
The output voltage (full scale determined by external reference) is given by:
2REF
CODE
0x1000
[V]
Where REF is the reference voltage and CODE is the digital input value within the range of 0x000 to 0xFF0. Bits 3 to 0 must be set to zero. A power-on reset initially resets the internal latches to a defined state (all bits zero).
serial interface
The device has to be enabled with CS set to low. A falling edge of FS starts shifting the data bit-per-bit (starting with the MSB) to the internal register on the falling edges of SCLK. After 16 bits have been transferred or FS rises, the content of the shift register is moved to the DAC latch, which updates the voltage output to the new level.
The serial interface of the TLV5623 can be used in two basic modes:
D
Four wire (with chip select)
D
Three wire (without chip select)
Using chip select (four-wire mode), it is possible to have more than one device connected to the serial port of the data source (DSP or microcontroller). The interface is compatible with the TMS320 family . Figure 15 shows an example with two TLV5623s connected directly to a TMS320 DSP.
TMS320
DSP
XF0 XF1
FSX
DX
CLKX
TLV5623
CS
FS DIN SCLK
TLV5623
CS
FS DIN SCLK
Figure 15. TMS320 Interface
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
12
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
serial interface (continued)
If there is no need to have more than one device on the serial bus, then CS can be tied low. Figure 16 shows an example of how to connect the TLV5623 to a TMS320, SPI, or Microwire port using only three pins.
TMS320
DSP
FSX
DX
CLKX
TLV5623
FS DIN SCLK
CS
SPI
SS
MOSI
SCLK
TLV5623
FS DIN SCLK
CS
Microwire
I/O
SO
SK
TLV5623
FS DIN SCLK
CS
Figure 16. Three-Wire Interface
Notes on SPI and Microwire: Before the controller starts the data transfer, the software has to generate a falling edge on the I/O pin connected to FS. If the word width is 8 bits (SPI and Microwire), two write operations must be performed to program the TLV5623. After the write operation(s), the DAC output is updated automatically on the sixteenth positive clock edge.
serial clock frequency and update rate
The maximum serial clock frequency is given by:
f
SCLKmax
+
1
t
wH(min)
)
t
wL(min)
+
20 MHz
The maximum update rate is:
f
UPDATEmax
+
1
16
ǒ
t
wH(min)
)
t
wL(min)
Ǔ
+
1.25 MHz
The maximum update rate is a theoretical value for the serial interface, since the settling time of the TL V5623 has to be considered also.
data format
The 16-bit data word for the TLV5623 consists of two parts:
D
Control bits (D15 . . . D12)
D
New DAC value (D11 ...D0)
D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
X SPD PWR X New DAC value (8 bits) 0 0 0 0
X: don’t care SPD: Speed control bit. 1 fast mode 0 slow mode PWR: Power control bit. 1 power down 0 normal operation
In power-down mode, all amplifiers within the TLV5623 are disabled.
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
13
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
TLV5623 interfaced to TMS320C203 DSP
hardware interfacing
Figure 17 shows an example how to connect the TL V5623 to a TMS320C203 DSP. The serial interface of the TLV5623 is ideally suited to this configuration, using a maximum of four wires to make the necessary connections. In applications where only one synchronous serial peripheral is used, the interface can be simplified even further by pulling CS
low all the time as shown in the figure.
FS DIN SCLK
OUT
REFIN
CS
AGND
V
DD
REF
FS
DX
CLKX
TMS320C203 TLV5623
R
LOAD
Figure 17. TLV5623 to DSP Interface
TLV5623 interfaced to MCS51 microcontroller
hardware interfacing
Figure 18 shows an example of how to connect the TL V5623 to an MCS51 compatible microcontroller. The serial DAC input data and external control signals are sent via I/O port 3 of the controller. The serial data is sent on the RxD line, with the serial clock output on the TxD line. P3.4 and P3.5 are configured as outputs to provide the chip select and frame sync signals for the TLV5623.
SDIN SCLK CS
OUT
REFIN
AGND
REF
RxD
TxD
P3.4
MCS51
Controller TLV5623
FS
P3.5
V
DD
R
LOAD
Figure 18. TL V5623 to MCS51 Controller Interface
MCS is a registered trademark of Intel Corporation
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
14
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
linearity, offset, and gain error using single ended supplies
When an amplifier is operated from a single supply , the voltage offset can still be either positive or negative. With a positive offset, the output voltage changes on the first code change. With a negative offset, the output voltage may not change with the first code, depending on the magnitude of the offset voltage.
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage to overcome the negative offset voltage, resulting in the transfer function shown in Figure 19.
DAC Code
Output
Voltage
0 V
Negative
Offset
Figure 19. Effect of Negative Offset (single supply)
This offset error , not the linearity error, produces this breakpoint. The transfer function would have followed the dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after offset and full scale are adjusted out or accounted for in some way . However , single supply operation does not allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity is measured between full-scale code and the lowest code that produces a positive output voltage.
power-supply bypassing and ground management
Printed-circuit boards that use separate analog and digital ground planes offer the best system performance. Wire-wrap boards do not perform well and should not be used. The two ground planes should be connected together at the low-impedance power-supply source. The best ground connection may be achieved by connecting the DAC AGND terminal to the system analog ground plane, making sure that analog ground currents are well managed and there are negligible voltage drops across the ground plane.
A 0.1-µF ceramic-capacitor bypass should be connected between V
DD
and AGND and mounted with short leads as close as possible to the device. Use of ferrite beads may further isolate the system analog supply from the digital power supply.
Figure 20 shows the ground plane layout and bypassing technique.
0.1 µF
Analog Ground Plane
1 2 3 4
8 7 6 5
Figure 20. Power-Supply Bypassing
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
15
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
definitions of specifications and terminology
integral nonlinearity (INL)
The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale errors.
differential nonlinearity (DNL)
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant) as a change in the digital input code.
zero-scale error (E
ZS
)
Zero-scale error is defined as the deviation of the output from 0 V at a digital input value of 0.
gain error (E
G
)
Gain error is the error in slope of the DAC transfer function.
signal-to-noise ratio + distortion (S/N+D)
S/N+D is the ratio of the rms value of the output signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels.
spurious free dynamic range (SFDR)
SFDR is the difference between the rms value of the output signal and the rms value of the largest spurious signal within a specified bandwidth. The value for SFDR is expressed in decibels.
total harmonic distortion (THD)
THD is the ratio of the rms sum of the first six harmonic components to the rms value of the fundamental signal and is expressed in decibels.
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
16
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
MECHANICAL DATA
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
4040047/D 10/96
0.228 (5,80)
0.244 (6,20)
0.069 (1,75) MAX
0.010 (0,25)
0.004 (0,10)
1
14
0.014 (0,35)
0.020 (0,51)
A
0.157 (4,00)
0.150 (3,81)
7
8
0.044 (1,12)
0.016 (0,40)
Seating Plane
0.010 (0,25)
PINS **
0.008 (0,20) NOM
A MIN
A MAX
DIM
Gage Plane
0.189
(4,80)
(5,00)
0.197
8
(8,55)
(8,75)
0.337
14
0.344
(9,80)
16
0.394
(10,00)
0.386
0.004 (0,10)
M
0.010 (0,25)
0.050 (1,27)
0°–8°
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15). D. Falls within JEDEC MS-012
TLV5623C, TLV5623I
2.7 V TO 5.5 V LOW POWER 8-BIT DIGITAL-TO-ANALOG CONVERTERS WITH POWER DOWN
SLAS231 – JUNE 1999
17
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
MECHANICAL DATA
DGK (R-PDSO-G8) PLASTIC SMALL-OUTLINE PACKAGE
0,69
0,41
0,25
0,15 NOM
Gage Plane
4073329/B 04/98
4,98
0,25
5
3,05
4,78
2,95
8
4
3,05 2,95
1
0,38
1,07 MAX
Seating Plane
0,65
M
0,25
0°–6°
0,10
0,15 0,05
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion. D. Falls within JEDEC MO-187
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICA TIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
Loading...