Texas Instruments TLV2344IPWR, TLV2344IPWLE, TLV2344IPW, TLV2344IN, TLV2344IDR Datasheet

...
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
Wide Range of Supply Voltages Over Specified Temperature Range:
–40°C to 85°C...2 V to 8 V
D
Fully Characterized at 3 V and 5 V
D
Single-Supply Operation
D
Common-Mode Input-Voltage Range Extends Below the Negative Rail and Up to V
DD
–1 V at 25°C
D
Output Voltage Range Includes Negative Rail
D
High Input Impedance...10
12
Typical
D
ESD-Protection Circuitry
D
Designed-In Latch-Up Immunity
description
The TL V234x operational amplifiers are in a family of devices that has been specifically designed for use in low-voltage single-supply applications. Unlike other products in this family designed primarily to meet aggressive power consumption specifications, the TLV234x was developed to offer ac performance approaching that of a BiFET operational amplifier while operating from a single-supply rail. At 3 V, the TLV234x has a typical slew rate of 2.1 V/µs and 790-kHz unity-gain bandwidth.
Each amplifier is fully functional down to a minimum supply voltage of 2 V and is fully characterized, tested, and specified at both 3-V and 5-V power supplies over a temperature range of –40°C to 85°C. The common-mode input voltage range includes the negative rail and extends to within 1 V of the positive rail.
AVAILABLE OPTIONS
PACKAGED DEVICES
T
A
V
IO
max
AT 25°C
SMALL OUTLINE
(D)
PLASTIC DIP
(N)
PLASTIC DIP
(P)
TSSOP
(PW)
CHIP FORM
§
(Y)
°
°
9 mV TLV2342ID TLV2342IP TLV2342IPWLE TLV2342Y
40°C to 85°C
10 mV TLV2344ID TLV2344IN TLV2344IPWLE TLV2344Y
The D package is available taped and reeled. Add R suffix to the device type (e.g., TL V2342IDR).
The PW package is only available left-end taped and reeled (e.g., TLV2342IPWLE).
§
Chip forms are tested at 25°C only.
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinCMOS is a trademark of Texas Instruments Incorporated.
1 2 3 4
8 7 6 5
1OUT
1IN– 1IN+
V
DD–
/GND
V
DD
2OUT 2IN– 2IN+
1 2 3 4
8 7 6 5
1OUT
1IN–
1IN+
V
DD –
/GND
V
DD+
2OUT 2IN– 2IN+
1 2 3 4 5 6 7
14 13 12 11 10
9 8
1OUT
1IN– 1IN+
V
DD+
2IN+
2N–
2OUT
4OUT 4IN– 4IN+ V
DD–/GND
3IN+ 3IN– 3OUT
1
14
8
7
4OUT 4IN – 4IN + V
DD –
/GND 3IN + 3IN – 3OUT
1OUT
1IN – 1IN + V
DD+
2IN +
2IN –
2OUT
TLV2342
D OR P PACKAGE
(TOP VIEW)
TLV2342
PW PACKAGE
(TOP VIEW)
TLV2344
D OR N PACKAGE
(TOP VIEW)
TLV2344
PW PACKAGE
(TOP VIEW)
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
description (continued)
Low-voltage and low-power operation has been made possible by using the Texas Instruments silicon-gate LinCMOS technology . The LinCMOS process also features extremely high input impedance and ultra-low input bias currents. These parameters combined with good ac performance make the TLV234x effectual in applications such as high-frequency filters and wide-bandwidth sensors.
T o facilitate the design of small portable equipment, the TL V234x is made available in a wide range of package options, including the small-outline and thin-shrink small-outline packages (TSSOP). The TSSOP package has significantly reduced dimensions compared to a standard surface-mount package. Its maximum height of only
1.1 mm makes it particularly attractive when space is critical. The device inputs and outputs are designed to withstand –100-mA currents without sustaining latch-up. The
TLV234x incorporates internal ESD-protection circuits that prevents functional failures at voltages up to 2000 V as tested under MIL-PRF-38535, Method 3015.2; however, care should be exercised in handling these devices as exposure to ESD may result in the degradation of the device parametric performance.
TLV2342Y chip information
This chip, when properly assembled, displays characteristics similar to the TL V2342. Thermal compression or ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
CHIP THICKNESS: 15 MILS TYPICAL BONDING PADS: 4 × 4 MILS MINIMUM TJmax = 150°C TOLERANCES ARE ±10%. ALL DIMENSIONS ARE IN MILS.
+
1OUT
1IN+
1IN–
V
DD
(8)
(6)
(3)
(2)
(5)
(1)
(7)
(4)
V
DD–
/GND
+
2OUT
2IN+
2IN–
59
72
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(1)
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2344Y chip information
This chip, when properly assembled, displays characteristics similar to the TL V2344. Thermal compression or ultrasonic bonding may be used on the doped-aluminum bonding pads. Chips may be mounted with conductive epoxy or a gold-silicon preform.
BONDING PAD ASSIGNMENTS
CHIP THICKNESS: 15 MILS TYPICAL BONDING PADS: 4 × 4 MILS MINIMUM TJmax = 150°C TOLERANCES ARE ±10%. ALL DIMENSIONS ARE IN MILS.
+
1OUT
1IN+
1IN–
V
DD
(4)
(3)
(2)
(1)
V
DD–
/GND
+
3OUT
3IN+
3IN–
(10)
(9)
(8)
+
2OUT
2IN+
2IN–
(3)
(5)
(6)
(7)
+
4OUT
4IN+
4IN–
(12)
(13)
(14)
(11)
68
108
(8)
(9)(10)
(11)(12)
(13)
(14)
(1)
(2)
(3) (4) (5)
(6)
(7)
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
equivalent schematic (each amplifier)
IN+
P1
P2
P3 P4
P5
P6
IN–
R1
R2
R3
R4
R5
R6
R7
N1 N2
N3
N4
N5
N6
N7
D1
D2
C1
OUT
V
DD
GND
ACTUAL DEVICE COMPONENT COUNT
COMPONENT TLV2342 TLV2344
Transistors 54 108 Resistors 14 28 Diodes 4 8 Capacitors 2 4
Includes both amplifiers and all ESD, bias, and trim circuitry.
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, V
DD
(see Note 1) 8 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Differential input voltage, V
ID
(see Note 2) V
DD±
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(any input) –0.3 V to V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input current, I
I
±5 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output current, I
O
±30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Duration of short-circuit current at (or below) T
A
= 25°C (see Note 3) unlimited. . . . . . . . . . . . . . . . . . . . . . . . .
Continuous total dissipation See Dissipation Rating Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
–40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values, except differential voltages, are with respect to network ground.
2. Differential voltages are at the noninverting input with respect to the inverting input.
3. The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensure that the maximum dissipation rating is not exceeded (see application selection).
DISSIPATION RATING TABLE
T
25°C DERATING FACTOR T
= 85°C
PACKAGE
A
POWER RATING ABOVE TA = 25°C
A
POWER RATING
D–8 725 mW 5.8 mW/°C 377 mW
D–14 950 mW 7.6 mW/°C 494 mW
N 1575 mW 5.6 mW/°C 364 mW P 1000 mW 8.0 mW/°C 520 mW
PW–8 525 mW 4.2 mW/°C 273 mW
PW–14 700 mW 6.0 mW/°C 340 mW
recommended operating conditions
MIN MAX UNIT
Supply voltage, V
DD
2 8 V
p
VDD = 3 V –0.2 1.8
Common-mode input voltage, V
IC
VDD = 5 V –0.2 3.8
V
Operating free-air temperature, T
A
–40 85 °C
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2342I electrical characteristics at specified free-air temperature
TLV2342I
PARAMETER TEST CONDITIONS
T
A
VDD = 3 V VDD = 5 V
UNIT
A
MIN TYP MAX MIN TYP MAX
°
p
V
O
= 1 V,
V
IC
= 1 V,
25°C
0.691.1
9
VIOInput offset voltage
R
S
= 50 Ω,
mV
R
L
= 10
k
Full range
11
11
Average temperature
p
25°C to
°
α
VIO
coefficient of input offset
voltage
85°C
2.7
2.7µV/°C
Input offset current
25°C 0.1 0.1
p
I
IO
(see Note 4)
V
O
= 1 V,
V
IC
= 1
V
85°C 22 1000 24 1000
pA
p
25°C 0.6 0.6
p
IIBInput bias current (see Note 4)
V
O
=
1 V
,
V
IC
=
1 V
85°C 175 2000 200 2000
pA
–0.2 –0.3 –0.2 –0.3
25°C
to to to to
V
Common-mode input voltage
2 2.3 4 4.2
V
ICR
g
range (see Note 5)
–0.2 –0.2
Full range
to to
V
g
1.8 3.8
°
V
IC
= 1 V,
25°C
1.75
1.9
3.2
3.7
VOHHigh-l
evel output voltage
V
ID
=
100 mV
,
IOH = –1 mA
Full range 1.7 3
V
°
V
IC
= 1 V,
25°C
120
15090150
VOLL
ow-level output voltage
V
ID
= –
100 mV
,
IOL = 1 mA
Full range 190 190
m
V
°
Large-signal differential
V
IC
= 1 V,
25°C311523
A
VD
gg
voltage amplification
R
L
= 10 k,
See Note 6
Full range 2 3.5
V/mV
°
V
O
= 1 V,
25°C65786580
CMRR
C
ommon-mode rejection ratio
V
IC
=
V
ICR
min,
RS = 50
Full range 60 60
dB
°
Supply-voltage rejection ratio VIC = 1 V, VO = 1 V,
25°C70957095
k
SVR
ygj
(VDD/VIO)
IC
RS = 50
O
Full range 65 65
dB
°
pp
VO = 1 V, VIC = 1 V,
25°C
0.6531.4
3.2
IDDSu ly current
O
No load
IC
Full range 4 4.4
mA
Full range is –40°C to 85°C.
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2342I operating characteristics at specified free-air temperature, VDD = 3 V
TLV2342I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
°
V
IC
= 1 V,
V
I(PP)
= 1 V,
p
25°C
2.1
SR
Slew rate at unity gain
R
L
= 10 k,
C
L
= 20 F,
°
V/µs
S
ee Figure 34
85°C
1.7
p
f = 1 kHz, R
= 20 ,
°
VnEquivalent input noise voltage
,
See Figure 35
S
,
25°C
25
n
V/H
z
p
V
= V
, C
= 20 pF,
25°C 170
BOMMaximum output-swing bandwidth
OOH
,
RL = 10 k,
L
,
See Figure 34
85°C
145
kH
z
V
= 10 mV, C
= 20 pF,
25°C 790
B1Unity-gain bandwidth
I
,
RL = 10 k,
L
,
See Figure 36
85°C
690
kH
z
=
=
–40°C 53°
φ
m
Phase margin
V
I
= 10 mV,
CL = 20 pF,
f = B
1
,
RL = 10 kΩ,
25°C
49°
See Figure 36
85°C 47°
TLV2342I operating characteristics at specified free-air temperature, VDD = 5 V
TLV2342I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
25°C 3.6
V
IC
= 1 V,
R
= 10 k,
V
I(PP)
=
1 V
85°C 2.8
SR
Slew rate at unity gain
L
,
CL = 20 pF,
25°C 2.9
V/µs
See Figure 34VI(PP)
= 2.5
V
85°C 2.3
p
f = 1 kHz, R
= 20 ,
°
VnEquivalent input noise voltage
,
See Figure 35
S
,
25°C
25
n
V/H
z
p
V
= V
, C
= 20 pF,
25°C 320
BOMMaximum output-swing bandwidth
OOH
,
RL = 10 k,
L
,
See Figure 34
85°C
250
kH
z
V
= 10 mV, C
= 20 pF,
25°C 1.7
B1Unity-gain bandwidth
I
,
RL = 10 k,
L
,
See Figure 36
85°C
1.2
kH
z
=
=
–40°C
49
°
φ
m
Phase margin
V
I
= 10 mV,
CL = 20 pF,
f = B
1
,
RL = 10 k,
25°C
46°
See Figure 36
85°C 43°
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2344I electrical characteristics at specified free-air temperature
TLV2344I
PARAMETER
TEST
T
A
VDD = 3 V VDD = 5 V
UNIT
CONDITIONS
A
MIN TYP MAX MIN TYP MAX
V
= 1 V
,
°
p
V
O
1
V,
VI = 1 V,
25°C
1.1101.1
10
VIOInput offset voltage
IC
,
RS = 50 Ω,
mV
S
RL = 10 k
Full range
12
12
α
VIO
Average temperature coefficient of input offset voltage
25°C to
85°C
2.7 2.7 µV/°C
p
V
= 1 V,
25°C 0.1 0.1
p
IIOInput offset current (see Note 4)
O
,
VIC = 1 V
85°C 22 1000 24 1000
pA
p
V
= 1 V,
25°C 0.6 0.6
p
IIBInput bias current (see Note 4)
O
,
VIC = 1 V
85°C 175 2000 200 2000
pA
–0.2 –0.3 –0.2 –0.3
25°C
to to to to
V
Common-mode input voltage range
2 2.3 4 4.2
V
ICR
gg
(see Note 5)
–0.2 –0.2
Full range
to to
V
g
1.8 3.8
°
V
IC
= 1 V,
25°C
1.75
1.9
3.2
3.7
VOHHigh-l
evel output voltage
V
ID
=
100 mV
,
IOH = –1 mA
Full range 1.7 3
V
°
V
IC
= 1 V,
25°C
120
15090150
VOLL
ow-level output voltage
V
ID
= –
100 mV
,
IOL = 1 mA
Full range 190 190
m
V
°
Large-signal differential
V
IC
= 1 V,
25°C311523
A
VD
gg
voltage amplification
R
L
= 10 k,
See Note 6
Full range 2 3.5
V/mV
°
V
O
= 1 V,
25°C65786580
CMRR
C
ommon-mode rejection ratio
V
IC
=
V
ICR
min,
RS = 50
Full range 60 60
dB
°
Supply-voltage rejection ratio
V
IC
= 1 V,
25°C70957095
k
SVR
ygj
(VDD/VIO)
V
O
= 1 V,
RS = 50
Full range 65 65
dB
°
V
O
= 1 V,
25°C
1.362.7
6.4
IDDS
upply curren
t
V
IC
= 1 V,
No load
Full range 8 8.8
m
A
Full range is –40°C to 85°C.
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2344I operating characteristics at specified free-air temperature, VDD = 3 V
TLV2344I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
°
V
IC
= 1 V,
V
I(PP)
= 1 V,
p
25°C
2.1
SR
Slew rate at unity gain
R
L
= 10 k,
C
L
= 20 pF,
°
V/µs
S
ee Figure 34
85°C
1.7
p
f = 1 kHz, R
= 20 ,
°
VnEquivalent input noise voltage
,
See Figure 35
S
,
25°C
25
n
V/H
z
p
V
= V
, C
= 20 pF,
25°C 170
BOMMaximum output-swing bandwidth
OOH
,
RL = 10 k,
L
,
See Figure 34
85°C
145
kH
z
V
= 10 mV, C
= 20 pF,
25°C 790
B1Unity-gain bandwidth
I
,
RL = 10 k,
L
,
See Figure 36
85°C
690
kH
z
V
= 10 mV
,
f = B
,
–40°C 53°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f B1,
RL = 10 k,
25°C
49°
See Figure 36
85°C 47°
TLV2344I operating characteristics at specified free-air temperature, VDD = 5 V
TLV2344I
PARAMETER
TEST CONDITIONS
T
A
MIN TYP MAX
UNIT
25°C 3.6
V
IC
= 1 V,
RL = 10 k,
V
I(PP)
=
1 V
85°C 2.8
SR
Slew rate at unity gain
L
,
CL = 20 pF,
25°C 2.9
V/µs
See Figure 34
V
I(PP)
= 2.5
V
85°C 2.3
p
f = 1 kHz, R
= 20 ,
°
VnEquivalent input noise voltage
,
See Figure 35
S
,
25°C
25
n
V/H
z
p
V
= V
, C
= 20 pF,
25°C 320
BOMMaximum output-swing bandwidth
OOH
,
RL = 10 k,
L
,
See Figure 34
85°C
250
kH
z
V
= 10 mV, C
= 20 pF,
25°C 1.7
B1Unity-gain bandwidth
I
,
RL = 10 k,
L
,
See Figure 36
85°C
1.2
MH
z
V
= 10 mV
,
f = B
,
–40°C
49
°
φ
m
Phase margin
V
I
10
mV,
CL = 20 pF,
f B1,
RL = 10 k,
25°C
46°
See Figure 36
85°C 43°
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
SLOS194 – FEBRUARY 1997
10
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TLV2342Y electrical characteristics, T
A
= 25°C
TLV2342Y
PARAMETER TEST CONDITIONS
VDD = 3 V VDD = 5 V
UNIT
MIN TYP MAX MIN TYP MAX
V
IO
Input offset voltage
VO = 1 V, RS = 50 ,
VIC = 1 V, RL = 10 k
0.6 1.1 mV
I
IO
Input offset current (see Note 4) VO = 1 V, VIC = 1 V 0.1 0.1 pA
I
IB
Input bias current (see Note 4) VO = 1 V, VIC = 1 V 0.6 0.6 pA
V
ICR
Common-mode input voltage range (see Note 5)
–0.3
to
2.3
–0.3
to
4.2
V
V
OH
High-level output voltage
VIC = 1 V, IOH = –1 mA
VID = 100 mV ,
1.9 3.7 V
V
OL
Low-level output voltage
VIC = 1 V IOL = 1 mA
VID = 100 mV ,
120 90 mV
A
VD
Large-signal differential voltage amplification
VIC = 1 V, See Note 6
RL = 10 k,
11 23 V/mV
CMRR Common-mode rejection ratio
VO = 1 V, RS = 50
VIC = V
ICR
min,
78 80 dB
k
SVR
Supply-voltage rejection ratio (VDD/VID)
VO = 1 V RS = 50
VIC = 1 V,
95 95 dB
I
DD
Supply current
VO = 1 V, No load
VIC = 1 V,
0.65 1.4 mA
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
TLV2342, TLV2342Y, TLV2344, TLV2344Y
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TLV2344Y electrical characteristics, T
A
= 25°C
TLV2344Y
PARAMETER TEST CONDITIONS
VDD = 3 V VDD = 5 V
UNIT
MIN TYP MAX MIN TYP MAX
V
IO
Input offset voltage
VO = 1 V, RL = 10 k
VIC = 1 V, RL = 10 k
1.1 1.1 mV
I
IO
Input offset current (see Note 4) VO = 1 V, VIC = 1 V 0.1 0.1 pA
I
IB
Input bias current (see Note 4) VO = 1 V, VIC = 1 V 0.6 0.6 pA
V
ICR
Common-mode input voltage range (see Note 5)
–0.3
to
2.3
–0.3
to
4.2
V
V
OH
High-level output voltage
VIC = 1 V, IOH = –1 mA
VID = 100 mV , 1.9 3.7 V
V
OL
Low-level output voltage
VIC = 1 V, IOL = 1 mA
VID = –100 mV, 120 90 mV
A
VD
Large-signal differential voltage amplification
VIC = 1 V, See Note 6
RL = 10 kΩ,
11 23 V/mV
CMRR Common-mode rejection ratio
VO = 1 V, RS = 50
VIC = V
ICR
min,
78 80 dB
k
SVR
Supply-voltage rejection ratio (VDD/VID)
VO = 1 V, RS = 50
VIC = 1 V,
95 95 dB
I
DD
Supply current
VO = 1 V, No load
VIC = 1 V,
1.3 2.7 µA
NOTES: 4. The typical values of input bias current and input offset current below 5 pA are determined mathematically.
5. This range also applies to each input individually.
6. At VDD = 5 V, VO = 0.25 V to 2 V; at VDD = 3 V, VO = 0.5 V to 1.5 V.
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TYPICAL CHARACTERISTICS
Table of Graphs
FIGURE
V
IO
Input offset voltage Distribution 1 – 4
α
VIO
Input offset voltage temperature coefficient Distribution 5 – 8
I
IB
Input bias current vs Free-air temperature 9
I
IO
Input offset current vs Free-air temperature 9
V
IC
Common-mode input voltage vs Supply voltage 10
V
OH
High-level output voltage
vs High-level output current vs Supply voltage vs Free-air temperature
11 12 13
V
OL
Low-level output voltage
vs Common-mode input voltage vs Free-air temperature vs Differential input voltage vs Low-level output current
14
15, 16
17 18
A
VD
Large-signal differential voltage amplification
vs Supply voltage vs Free-air temperature vs Frequency
19 20, 21 22, 23
I
DD
Supply current
vs Supply voltage vs Free-air temperature
24
25
SR Slew rate
vs Supply voltage vs Free-air temperature
26
27
V
O(PP)
Maximum peak-to-peak output voltage vs Frequency 28
B
1
Unity-gain bandwidth
vs Supply voltage vs Free-air temperature
29
30
φ
m
Phase margin
vs Supply voltage vs Free-air temperature vs Load capacitance
31
32
33
Phase shift vs Frequency 22, 23
V
n
Equivalent input noise voltage vs Frequency 34
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TYPICAL CHARACTERISTICS
Figure 1
–5 –4 –3 –2
50
40
20
10
0
30
–1 0 1
Percentage of Units – %
2345
DISTRIBUTION OF TLV2342
INPUT OFFSET VOLTAGE
VIO – Input Offset Voltage – mV
VDD = 3 V TA = 25°C P Package
Figure 2
50
40
20
10
0
30
–1 0 1602345
Percentage of Units – %
VIO – Input Offset Voltage – mV
DISTRIBUTION OF TLV2342
INPUT OFFSET VOLTAGE
VDD = 5 V TA = 25°C P Package
–5 –4 –3 –2
Figure 3
–5 –4 –3 –2
50
40
20
10
0
30
01
Percentage of Units – %
2345
DISTRIBUTION OF TLV2344
INPUT OFFSET VOLTAGE
VIO – Input Offset Voltage – mV
VDD = 3 V TA = 25°C N Package
–1
Figure 4
50
40
20
10
0
30
01602345
Percentage of Units – %
VIO – Input Offset Voltage – mV
DISTRIBUTION OF TLV2344
INPUT OFFSET VOLTAGE
VDD = 5 V TA = 25°C N Package
–1
–5 –4 –3 –2
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TYPICAL CHARACTERISTICS
Figure 5
–8 –6 –4 –210 0246810
α
VIO
– Temperature Coefficient – µV/°C
50
40
20
10
0
30
DISTRIBUTION OF TLV2342
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
Percentage of Units – %
VDD = 3 V TA = 25°C to 85°C P Package
Figure 6
Percentage of Units – %
10 0246810
50
40
20
10
0
30
60
DISTRIBUTION OF TLV2342
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
VDD = 5 V TA = 25°C to 85°C P Package Outliers: (1) 20.5 mV/°C
–8 –6 –4 –2
α
VIO
– Temperature Coefficient – µV/°C
Figure 7
02
Percentage of Units – %
46810
α
VIO
– Temperature Coefficient – µV/°C
50
40
20
10
0
30
VDD = 3 V TA = 25°C to 85°C N Package
DISTRIBUTION OF TLV2344
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
–10 –8 –6 –4 –2
Figure 8
α
VIO
– Temperature Coefficient – µV/°C
Percentage of Units – %
0246810
50
40
20
10
0
30
60
DISTRIBUTION OF TLV2344
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
VDD = 5 V TA = 25°C to 85°C N Package Outliers: (1) 20.5 mV/°C
–10 –8 –6 –4 –2
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TYPICAL CHARACTERISTICS
Figure 9
INPUT BIAS CURRENT AND INPUT OFFSET CURREN
T
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
IIB and IIO – Input Bias and Offset Currents – pA
I
IB
I
IO
10
4
10
3
10
2
10
1
1
0.1 25 45 65 85 105 125
VDD = 3 V VIC = 1 V See Note A
I
IB
I
IO
NOTE: The typical values of input bias current and input offset
current below 5 pA were determined mathematically.
Figure 10
VIC – Common-Mode Input Voltage – V
IC
V
COMMON-MODE INPUT VOLTAGE
vs
SUPPLY VOLTAGE
4
2
0
8
6
02468
V
DD
– Supply Voltage – V
TA = 25°C Positive Limit
Figure 11
V0H – High-Level Output Voltage – V
V
OH
3
2
1
0
0
4
5
IOH – High-Level Output Current – mA
HIGH-LEVEL OUTPUT VOLTAGE
vs
HIGH-LEVEL OUTPUT CURRENT
VIC = 1 V VID = 100 mV TA = 25°C
VDD = 3 V
VDD = 5 V
–2 –4 –6 –8
Figure 12
V0H – High-Level Output Voltage – VV
OH
4
2
0
8
6
02468
HIGH-LEVEL OUTPUT VOLTAGE
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
VIC = 1 V VID = 100 mV RL = 10 k TA = 25°C
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TYPICAL CHARACTERISTICS
Figure 13
1.8
1.2
0.6
0
2.4
3
HIGH-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
V0H – High-Level Output Voltage – V
V
OH
VDD = 3 V VIC = 1 V VID = 100 mV
IOH = –500µA IOH = –1 mA IOH = –2 mA IOH = –3 mA IOH = –4 mA
Figure 14
VOL – Low-Level Output V oltage – mV
V
OL
500
400
350
300
0 0.5 1 1.5 2 2.5
600
650
700
3 3.5 4
550
450
LOW-LEVEL OUTPUT VOLTAGE
vs
COMMON-MODE INPUT VOLTAGE
VIC – Common-Mode Input Voltage – V
VDD = 5 V IOL = 5 mA TA = 25°C
VID = –100 mV
VID = –1 V
Figure 15
–75 –50 –25 0 25 50 75 100 125
175
150
100
75
50
125
200
LOW-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
VOL – Low-Level Output V oltage – mV
V
OL
VDD = 3 V VIC = 1 V VID = –100 mV IOL = 1 mA
400
200
100
0
600
700
800
500
300
LOW-LEVEL OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
900
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
VOL – Low-Level Output V oltage – mV
V
OL
VDD = 5 V VIC = 0.5 V VID = –1 V IOL = 5 mA
Figure 16
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TYPICAL CHARACTERISTICS
Figure 17
0–2–4–6–8–1 –3 –5 –7
400
200
100
0
600
700
800
500
300
LOW-LEVEL OUTPUT VOLTAGE
vs
DIFFERENTIAL INPUT VOLTAGE
VOL – Low-Level Output V oltage – mV
V
OL
VID – Differential Input Voltage – V
VDD = 5 V VIC = |VID/ 2| IOL = 5 mA TA = 25°C
Figure 18
0.5
0.4
0.2
0.1 0
0.9
0.3
0123456
0.7
0.6
0.8
1
78
LOW-LEVEL OUTPUT VOLTAGE
vs
LOW-LEVEL OUTPUT CURRENT
VOL – Low-Level Output Voltage – V
V
OL
IOL – Low-Level Output Current – mA
VDD = 3 V
VDD = 5 V
VIC = 1 V VID = –100 mV TA = 25°C
Figure 19
02468
LARGE-SIGNAL
DIFFERENTIAL VOLTAGE AMPLIFICATION
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
40
30
0
20
50
10
RL = 10 k
TA = –40°C
TA = 25°C
TA = 85°C
60
– Large-Signal Differential Voltage A
VD
Amplification – V/mV
Figure 20
TA – Free-Air Temperature – °C
20 15
35
30
45
50
10
40
25
5
–75 –50 –25 0 25 50 75 100 125
VDD = 5 V
VDD = 3 V
RL = 10 k
0
– Large-Signal Differential Voltage A
VD
Amplification – V/mV
TLV2342
LARGE-SIGNAL
DIFFERENTIAL VOLTAGE AMPLIFICATION
vs
FREE-AIR TEMPERATURE
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TYPICAL CHARACTERISTICS
Figure 21
1000
800
400 200
0
1800
600
1400
1200
1600
2000
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
RL = 1 M
VDD = 5 V
VDD = 3 V
– Large-Signal Differential Voltage A
VD
Amplification – V/mV
TLV2344
LARGE-SIGNAL
DIFFERENTIAL VOLTAGE AMPLIFICATION
vs
FREE-AIR TEMPERATURE
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION AND PHASE MARGIN
vs
FREQUENCY
10 100 1 k 10 k 100 k 1 M
f – Frequency – Hz
10 M
Phase Shift
–60°
–30°
0°
30°
60°
90°
120°
150°
180°
10
7
10
6
10
5
10
4
10
3
10
2
10
1
0.1
VDD = 3 V RL = 1 M CL = 20 pF TA = 25°C
A
VD
Phase Shift
1
– Large-Signal Differential Voltage Amplification A
VD
Figure 22
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TYPICAL CHARACTERISTICS
LARGE-SIGNAL DIFFERENTIAL VOLTAGE
AMPLIFICATION AND PHASE MARGIN
vs
FREQUENCY
10 100 1 k 10 k 100 k 1 M 10 M
f – Frequency – Hz
Phase Shift
–60°
–30°
0°
30°
60°
90°
120°
150°
180°
10
6
10
5
10
4
10
3
10
2
10
1
1
A
VD
Phase Shift
10
7
0.1
VDD = 5 V RL = 1 M CL = 20 pF TA = 25°C
– Large-Signal Differential Voltage Amplification A
VD
Figure 23
Figure 24
5
4
2
1
0
3
02468
V
DD
– Supply Voltage – V
TA = 85°C
TA = –40°C
SUPPLY CURRENT
vs
SUPPLY VOLTAGE
VIC = 1 V VO = 1 V No Load
IDD – Supply Current – mA
DD
I
TA = 25°C
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TYPICAL CHARACTERISTICS
Figure 25
2
1
0.5
0
3
3.5
4
2.5
1.5
TA – Free-Air Temperature – °C
VDD = 5 V
VDD = 3 V
VIC = 1 V VO = 1 V No Load
–75 –50 –25 0 25 50 75 100 125
IDD – Supply Current – mA
DD
I
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
Figure 26
02468
4
2
1
0
6
3
5
8
7
SLEW RATE
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
V
I(PP)
= 1 V AV = 1 RL = 10 k CL = 20 pF TA = 25°C
SR – Slew Rate – V/us
sµV/
Figure 27
SR – Slew Rate – V/us
sµV/
SLEW RATE
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
V
I(PP)
= 1 V AV = 1 RL = 10 k CL = 20 pF
VDD = 5 V
VDD = 3 V
4
2
1
0
6
3
5
8
7
–75 –50 –25 0 25 50 75 100 125
Figure 28
10 100 1000 10000
3
2
1
0
4
5
VO9PP) – Maximum Peak-to-Peak Output Voltage – V
f – Frequency – kHz
V
O(PP)
MAXIMUM PEAK-TO-PEAK OUTPUT VOLTAGE
vs
FREQUENCY
RL = 10 k
TA = 85°C
TA = 25°C
VDD = 5 V
VDD = 3 V
TA = –40°C
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TYPICAL CHARACTERISTICS
Figure 29
1.3
0.9
0.7
0.5
1.7
1.9
1.5
1.1
2.1
012345678
V
I
= 3 mV RL = 10 k CL = 20 pF TA = 25°C
UNITY-GAIN BANDWIDTH
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
0.3
0.1
B1 – Unity-Gain Bandwidth – MHz
B
1
Figure 30
–75 –50 –25 0 25 50 75 100 125
B1 – Unity-Gain Bandwidth – MHz
1.1
2.3
2.9
3.5
1.7
0.5
B
1
VDD = 5 V
VDD = 3 V
VI = 10 mV RL = 10 k CL = 20 pF
UNITY-GAIN BANDWIDTH
vs
FREE-AIR TEMPERATURE
TA – Free-Air Temperature – °C
Figure 31
om – Phase Margin
φ
m
53°
51°
49°
47°
45°
024 68
PHASE MARGIN
vs
SUPPLY VOLTAGE
VDD – Supply Voltage – V
VI = 10 mV RL = 10 k CL = 20 pF TA = 25°C
Figure 32
PHASE MARGIN
vs
FREE-AIR TEMPERATURE
–75 –50 –25 0 25 50 75 100 125
TA – Free-Air Temperature – °C
VDD = 5 V
VI = 10 mV RL = 10 k CL = 20 pF
om – Phase Margin
φ
m
60° 58°
56° 54°
52° 50°
48° 46°
44°
42° 40°
VDD = 3 V
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TYPICAL CHARACTERISTICS
Figure 33
om – Phase Margin
φ
m
50°
40°
35°
30°
25°
PHASE MARGIN
vs
LOAD CAPACITANCE
CL – Load Capacitance – pF
VDD = 3 V
VDD = 5 V
VI = 10 mV RL = 10 k TA = 25°C
45°
02040608010010 30 50 70 90
Figure 34
300
200
100
0
400
Vn – Equivalent Input Noise Voltage – nV Hz
V
n
nV/ Hz
350
150
50
f – Frequency – Hz
EQUIVALENT INPUT NOISE VOLTAGE
vs
FREQUENCY
1 10 100 1000
RS = 20 TA = 25°C
VDD = 3 V
VDD = 5 V
250
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PARAMETER MEASUREMENT INFORMATION
single-supply versus split-supply test circuits
Because the TL V234x is optimized for single-supply operation, circuit configurations used for the various tests often present some inconvenience since the input signal, in many cases, must be offset from ground. This inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives the same result.
– +
– +
V
DD
V
I
C
L
R
L
V
O
V
DD+
V
DD–
V
I
V
O
C
L
R
L
(a) SINGLE SUPPLY
(b) SPLIT SUPPL Y
Figure 35. Unity-Gain Amplifier
– +
– +
1/2 V
DD
V
DD
20
20
2 k
V
DD–
V
O
V
O
20
20
(a) SINGLE SUPPLY
2 k
V
DD+
(b) SPLIT SUPPL Y
Figure 36. Noise-Test Circuit
– +
– +
10 k
1/2 V
DD
100
V
O
V
DD
V
I
V
I
100
(a) SINGLE SUPPLY
(b) SPLIT SUPPL Y
10 k
V
DD+
V
DD–
C
L
C
L
V
O
Figure 37. Gain-of-100 Inverting Amplifier
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PARAMETER MEASUREMENT INFORMATION
input bias current
Because of the high input impedance of the TL V234x operational amplifier , attempts to measure the input bias current can result in erroneous readings. The bias current at normal ambient temperature is typically less than 1 pA, a value that is easily exceeded by leakages on the test socket. Two suggestions are offered to avoid erroneous measurements:
Isolate the device from other potential leakage sources. Use a grounded shield around and between the
device inputs (see Figure 38). Leakages that would otherwise flow to the inputs are shunted away.
Compensate for the leakage of the test socket by actually performing an input bias current test (using a
picoammeter) with no device in the test socket. The actual input bias current can then be calculated by subtracting the open-socket leakage readings from the readings obtained with a device in the test socket.
Many automatic testers as well as some bench-top operational amplifier testers use the servo-loop technique with a resistor in series with the device input to measure the input bias current (the voltage drop across the series resistor is measured and the bias current is calculated). This method requires that a device be inserted into a test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method.
V = V
IC
14
8
71
Figure 38. Isolation Metal Around Device Inputs
(N or P package )
low-level output voltage
To obtain low-level supply-voltage operation, some compromise is necessary in the input stage. This compromise results in the device low-level output voltage being dependent on both the common-mode input voltage level as well as the differential input voltage level. When attempting to correlate low-level output readings with those quoted in the electrical specifications, these two conditions should be observed. If conditions other than these are to be used, please refer to the Typical Characteristics section of this data sheet.
input offset voltage temperature coefficient
Erroneous readings often result from attempts to measure temperature coefficient of input offset voltage. This parameter is actually a calculation using input offset voltage measurements obtained at two different temperatures. When one (or both) of the temperatures is below freezing, moisture can collect on both the device and the test socket. This moisture results in leakage and contact resistance which can cause erroneous input offset voltage readings. The isolation techniques previously mentioned have no effect on the leakage since the moisture also covers the isolation metal itself, thereby rendering it useless. These measurements should be performed at temperatures above freezing to minimize error.
full-power response
Full-power response, the frequency above which the operational amplifier slew rate limits the output voltage swing, is often specified two ways: full-linear response and full-peak response. The full-linear response is
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PARAMETER MEASUREMENT INFORMATION
generally measured by monitoring the distortion level of the output while increasing the frequency of a sinusoidal input signal until the maximum frequency is found above which the output contains significant distortion. The full-peak response is defined as the maximum output frequency , without regard to distortion, above which full peak-to-peak output swing cannot be maintained.
Because there is no industry-wide accepted value for significant distortion, the full-peak response is specified in this data sheet and is measured using the circuit of Figure 35. The initial setup involves the use of a sinusoidal input to determine the maximum peak-to-peak output of the device (the amplitude of the sinusoidal wave is increased until clipping occurs). The sinusoidal wave is then replaced with a square wave of the same amplitude. The frequency is then increased until the maximum peak-to-peak output can no longer be maintained (Figure 39). A square wave is used to allow a more accurate determination of the point at which the maximum peak-to-peak output is reached.
(d) f > B
OM
(c) f = B
OM
(b) BOM > f > 100 Hz(a) f = 100 Hz
Figure 39. Full-Power-Response Output Signal
test time
Inadequate test time is a frequent problem, especially when testing CMOS devices in a high-volume, short-test-time environment. Internal capacitances are inherently higher in CMOS than in bipolar and BiFET devices, and require longer test times than their bipolar and BiFET counterparts. The problem becomes more pronounced with reduced supply levels and lower temperatures.
APPLICATION INFORMATION
single-supply operation
While the TLV234x performs well using dual­power supplies (also called balanced or split supplies), the design is optimized for single­supply operation. This includes an input common­mode voltage range that encompasses ground as well as an output voltage range that pulls down to ground. The supply voltage range extends down to 2 V, thus allowing operation with supply levels commonly available for TTL and HCMOS.
Many single-supply applications require that a voltage be applied to one input to establish a reference level that is above ground. This virtual ground can be generated using two large resistors, but a preferred technique is to use a virtual-ground generator such as the TLE2426 (see Figure 40).
– +
TLE2426
V
O
V
I
R1
R2
V
DD
Figure 40. Inverting Amplifier With
Voltage Reference
V
O
+ ǒ
VDD–V
I
2
Ǔ
R2 R1
)
V
DD 2
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
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APPLICATION INFORMATION
single-supply operation (continued)
The TLE2426 supplies an accurate voltage equal to VDD/2 while consuming very little power and is suitable for supply voltages of greater than 4 V.
The TLV234x works well in conjunction with digital logic; however, when powering both linear devices and digital logic from the same power supply, the following precautions are recommended:
Power the linear devices from separate bypassed supply lines (see Figure 41); otherwise, the linear
device supply rails can fluctuate due to voltage drops caused by high switching currents in the digital logic.
Use proper bypass techniques to reduce the probability of noise-induced errors. Single capacitive
decoupling is often adequate; however, RC decoupling may be necessary in high-frequency applications.
– +
Logic Logic Logic
Power Supply
– +
Logic Logic Logic
Power Supply
(a) COMMON-SUPPLY RAILS
(b) SEPARATE-BYPASSED SUPPLY RAILS (preferred)
Figure 41. Common Versus Separate Supply Rails
input characteristics
The TL V234x is specified with a minimum and a maximum input voltage that, if exceeded at either input, could cause the device to malfunction. Exceeding this specified range is a common problem, especially in single-supply operation. The lower range limit includes the negative rail, while the upper range limit is specified at V
DD
– 1 V at TA = 25°C and at VDD – 1.2 V at all other temperatures.
The use of the polysilicon-gate process and the careful input circuit design gives the TL V234x very good input offset voltage drift characteristics relative to conventional metal-gate processes. Offset voltage drift in CMOS devices is highly influenced by threshold voltage shifts caused by polarization of the phosphorus dopant implanted in the oxide. Placing the phosphorus dopant in a conductor (such as a polysilicon gate) alleviates the polarization problem, thus reducing threshold voltage shifts by more than an order of magnitude. The offset voltage drift with time has been calculated to be typically 0.1 µV/month, including the first month of operation.
Because of the extremely high input impedance and resulting low bias-current requirements, the TLV234x is well suited for low-level signal processing; however, leakage currents on printed-circuit boards and sockets can easily exceed bias-current requirements and cause a degradation in device performance.
– +
Figure 43. Compensation for Input Capacitance
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
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APPLICATION INFORMATION
input characteristics (continued)
It is good practice to include guard rings around inputs (similar to those of Figure 38 in the Parameter Measurement Information section). These guards should be driven from a low-impedance source at the same voltage level as the common-mode input (see Figure 42).
The inputs of any unused amplifiers should be tied to ground to avoid possible oscillation.
– +
– +
– +
(a) NONINVERTING AMPLIFIER (b) INVERTING AMPLIFIER
(c) UNITY-GAIN AMPLIFIER
V
O
V
I
V
O
V
O
V
i
V
I
Figure 42. Guard-Ring Schemes
noise performance
The noise specifications in operational amplifier circuits are greatly dependent on the current in the first-stage differential amplifier . The low input bias-current requirements of the TLV234x results in a very low noise current, which is insignificant in most applications. This feature makes the device especially favorable over bipolar devices when using values of circuit impedance greater than 50 k, since bipolar devices exhibit greater noise currents.
feedback
Operational amplifiers circuits nearly always employ feedback, and since feedback is the first prerequisite for oscillation, a little caution is appropriate. Most oscillation problems result from driving capacitive loads and ignoring stray input capacitance. A small-value capacitor connected in parallel with the feedback resistor is an effective remedy (see Figure 43). The value of this capacitor is optimized empirically.
electrostatic-discharge protection
The TLV234x incorporates an internal electrostatic-discharge (ESD)-protection circuit that prevents functional failures at voltages up to 2000 V as tested under MIL-PRF-38535. Method 3015.2. Care should be exercised, however, when handling these devices as exposure to ESD may result in the degradation of the device parametric performance. The protection circuit also causes the input bias currents to be temperature dependent and have the characteristics of a reverse-biased diode.
– +
RP+
VDD*
V
O
IF)
IL)
I
P
IP = Pullup Current Required by the Operational Amplifier (typically 500 µA)
V
O
V
DD
R
P
I
P
I
F
I
L
R
L
V
I
R1
R2
Figure 44. Resistive Pullup to Increase V
OH
– +
V
O
C
L
V
i
2.5 V
TA = 25°C f = 1 kHz V
I(PP)
= 1 V
–2.5 V
Figure 45. Test Circuit for Output Characteristics
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
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APPLICATION INFORMATION
latch-up
Because CMOS devices are susceptible to latch-up due to their inherent parasitic thyristors, the TL V234x inputs and outputs are designed to withstand –100-mA surge currents without sustaining latch-up; however, techniques should be used to reduce the chance of latch-up whenever possible. Internal protection diodes should not by design be forward biased. Applied input and output voltage should not exceed the supply voltage by more than 300 mV . Care should be exercised when using capacitive coupling on pulse generators. Supply transients should be shunted by the use of decoupling capacitors (0.1 µF typical) located across the supply rails as close to the device as possible.
The current path established if latch-up occurs is usually between the positive supply rail and ground and can be triggered by surges on the supply lines and/or voltages on either the output or inputs that exceed the supply voltage. Once latch-up occurs, the current flow is limited only by the impedance of the power supply and the forward resistance of the parasitic thyristor and usually results in the destruction of the device. The chance of latch-up occurring increases with increasing temperature and supply voltages.
output characteristics
The output stage of the TLV234x is designed to sink and source relatively high amounts of current (see Typical Characteristics). If the output is subjected to a short-circuit condition, this high-current capability can cause device damage under certain conditions. Output current capability increases with supply voltage.
Although the TLV234x possesses excellent high-level output voltage and current capability, methods are available for boosting this capability if needed. The simplest method involves the use of a pullup resistor (R
P
) connected from the output to the positive supply rail (see Figure 44). There are two disadvantages to the use of this circuit. First, the NMOS pulldown transistor N4 (see equivalent schematic) must sink a comparatively large amount of current. In this circuit, N4 behaves like a linear resistor with an on resistance between approximately 60 and 180 , depending on how hard the operational amplifier input is driven. With very low values of R
P
, a voltage offset from 0 V at the output occurs. Secondly , pullup resistor R
P
acts as a drain load to N4 and the gain of the operational amplifier is reduced at output voltage levels where N5 is not supplying the output current.
All operating characteristics of the TLV234x are measured using a 20-pF load. The device drives higher capacitive loads; however, as output load capacitance increases, the resulting response pole occurs at lower frequencies thereby causing ringing, peaking, or even oscillation (see Figure 45 and Figure 46). In many cases, adding some compensation in the form of a series resistor in the feedback loop alleviates the problem.
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
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TYPICAL APPLICATION DATA
output characteristics (continued)
(a) CL = 20 pF, RL = NO LOAD (b) CL = 130 pF, RL = NO LOAD (c) CL = 150 pF, RL = NO LOAD
Figure 46. Effect of Capacitive Loads
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PIN SHOWN
4040047/B 03/95
0.228 (5,80)
0.244 (6,20)
0.069 (1,75) MAX
0.010 (0,25)
0.004 (0,10)
1
14
0.014 (0,35)
0.020 (0,51)
A
0.157 (4,00)
0.150 (3,81)
7
8
0.044 (1,12)
0.016 (0,40)
Seating Plane
0.010 (0,25)
PINS **
0.008 (0,20) NOM
A MIN
A MAX
DIM
Gage Plane
0.189
(4,80)
(5,00)
0.197
8
(8,55)
(8,75)
0.337
14
0.344
(9,80)
16
0.394
(10,00)
0.386
0.004 (0,10)
M
0.010 (0,25)
0.050 (1,27)
0°–8°
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15). D. Four center pins are connected to die mount pad.
E. Falls within JEDEC MS-012
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
N (R-PDIP-T**) PLASTIC DUAL-IN-LINE PACKAGE
20
0.975
(24,77)
0.940
(23,88)
18
0.920
0.850
14
0.775
0.745
(19,69)
(18,92)
16
0.775
(19,69)
(18,92)
0.745
A MIN
DIM
A MAX
PINS **
0.310 (7,87)
0.290 (7,37)
(23.37)
(21.59)
Seating Plane
0.010 (0,25) NOM
14/18 PIN ONL Y
4040049/C 08/95
9
8
0.070 (1,78) MAX
A
0.035 (0,89) MAX
0.020 (0,51) MIN
16
1
0.015 (0,38)
0.021 (0,53)
0.200 (5,08) MAX
0.125 (3,18) MIN
0.240 (6,10)
0.260 (6,60)
M
0.010 (0,25)
0.100 (2,54)
0°–15°
16 PIN SHOWN
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-001 (20 pin package is shorter then MS-001.)
TLV2342, TLV2342Y, TLV2344, TLV2344Y LinCMOS LOW-VOLTAGE HIGH-SPEED OPERATIONAL AMPLIFIERS
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MECHANICAL INFORMATION
P (R-PDIP-T8) PLASTIC DUAL-IN-LINE PACKAGE
4040082/B 03/95
0.310 (7,87)
0.290 (7,37)
0.010 (0,25) NOM
0.400 (10,60)
0.355 (9,02)
58
41
0.020 (0,51) MIN
0.070 (1,78) MAX
0.240 (6,10)
0.260 (6,60)
0.200 (5,08) MAX
0.125 (3,18) MIN
0.015 (0,38)
0.021 (0,53)
Seating Plane
M
0.010 (0,25)
0.100 (2,54)
0°–15°
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice. C. Falls within JEDEC MS-001
TLV2342, TLV2342Y, TLV2344, TLV2344Y
LinCMOS LOW-VOLTAGE HIGH-SPEED
OPERATIONAL AMPLIFIERS
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33
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
MECHANICAL INFORMATION
PW (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
4040064/D 10/95
14 PIN SHOWN
Seating Plane
0,10 MIN
1,20 MAX
1
A
7
14
0,19
4,50 4,30
8
6,10
6,70
0,32
0,75 0,50
0,25
Gage Plane
0,15 NOM
0,65
M
0,13
0°–8°
0,10
PINS **
A MIN
A MAX
DIM
2,90
3,10
8
4,90
5,10
14
6,60
6,404,90
5,10
16
7,70
20
7,90
24
9,60
9,80
28
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold flash or protrusion not to exceed 0,15. D. Falls within JEDEC MO-153
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Copyright 1998, Texas Instruments Incorporated
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