The TIBP AL22V10-10C is a programmable array logic device featuring high speed and functional equivalency
when compared to presently available devices. They are implemented with the familiar sum-of-products
(AND-OR) logic structure featuring the new concept “Programmable Output Logic Macrocell”. These
IMPACT-X circuits combine the latest Advanced Low-Power Schottky technology with proven titaniumtungsten fuses to provide reliable, high-performance substitutes for conventional TTL logic.
These devices contain up to 22 inputs and 10 outputs. They incorporate the unique capability of defining and
programming the architecture of each output on an individual basis. Outputs may be registered or nonregistered
and inverting or noninverting as shown in the output logic macrocell diagram. The ten potential outputs are
enabled through the use of individual product terms.
Further advantages can be seen in the introduction of variable product term distribution. This technique
allocates from 8 to 16 logical product terms to each output for an average of 12 product terms per output. This
variable allocation of terms allows far more complex functions to be implemented than in previously available
devices.
This device is covered by U.S. Patent 4,410,987.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Circuit design is enhanced by the addition of a synchronous set and an asynchronous reset product term. These
functions are common to all registers. When the synchronous set product term is a logic 1, the output registers
are loaded with a logic 1 on the next low-to-high clock transition. When the asynchronous reset product term
is a logic 1, the output registers are loaded with a logic 0. The output logic level after set or reset depends on
the polarity selected during programming. Output registers can be preloaded to any desired state during testing.
Preloading permits full logical verification during product testing.
With features such as programmable output logic macrocells and variable product term distribution, the
TIBPAL22V10-10C offers quick design and development of custom LSI functions with complexities of 500 to
800 equivalent gates. Since each of the ten output pins may be individually configured as inputs on either a
temporary or permanent basis, functions requiring up to 21 inputs and a single output or down to 12 inputs and
10 outputs are possible.
A power-up clear function is supplied that forces all registered outputs to a predetermined state after power is
applied to the device. Registered outputs selected as active-low power up with their outputs high. Registered
outputs selected as active-high power up with their outputs low.
A single security fuse is provided on each device to discourage unauthorized copying of fuse patterns. Once
blown, the verification circuitry is disabled and all other fuses will appear to be open.
The TIBPAL22V10-10C is characterized for operation from 0°C to 75°C.
00Register feedbackRegisteredActive low
01Register feedbackRegisteredActive high
10I/O feedbackCombinational Active low
11I/O feedbackCombinational Active high
0 = unblown fuse, 1 = blown fuse
S1 and S0 are select-function fuses as shown in the output logic macrocell
diagram.
FEEDBACK AND OUTPUT CONFIGURATION
Figure 1. Resultant Macrocell Feedback and Output Logic After Programming
electrical characteristics over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
V
IK
V
OH
V
OL
‡
I
OZH
‡
I
OZL
I
I
‡
I
IH
I
IL
I
OS
I
CC
C
i
C
o
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
I/O leakage is the worst case of I
§
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
preload procedure for registered outputs (see Notes 3 and 4)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below:
Step 1. With VCC at 5 V and pin 1 at VIL, raise pin 13 to V
IHH
.
Step 2. Apply either VIL or VIH to the output corresponding to the register to be preloaded.
Step 3. Pulse pin 1, clocking in preload data.
Step 4. Remove output voltage, then lower pin 13 to V
. Preload can be verified by observing the voltage level
IL
at the output pin.
V
V
V
V
V
V
IHH
IL
IH
IL
OH
OL
Pin 13
t
t
d
Pin 1
Registered I/OInputOutput
su
t
w
t
d
V
IH
V
IL
Figure 2. Preload Waveforms
NOTES: 3. Pin numbers shown are for the NT package only. If chip-carrier socket adapter is not used, pin numbers must be changed accordingly .
Following power up, all registers are reset to zero. The output level depends on the polarity selected during
programming. This feature provides extra flexibility to the system designer and is especially valuable in
simplifying state-machine initialization. To ensure a valid power-up reset, it is important that the rise of VCC be
monotonic. Following power-up reset, a low-to-high clock transition must not occur until all applicable input and
feedback setup times are met.
V
CC
Active High
Registered Output
Active Low
Registered Output
CLK
4 V
†
tpd
(600 ns typ, 1000 ns MAX)
State Unknown
State Unknown
1.5 V
1.5 V
1.5 V
tsu
t
w
‡
1.5 V
5 V
V
V
V
V
V
V
OH
OL
OH
OL
IH
IL
†
This is the power-up reset time and applies to registered outputs only. The values shown are from characterization data.
‡
This is the setup time for input or feedback.
Figure 3. Power-Up Reset Waveforms
programming information
Texas Instruments programmable logic devices can be programmed using widely available software and
inexpensive device programmers.
Complete programming specifications, algorithms, and the latest information on hardware, software, and
firmware are available upon request. Information on programmers capable of programming T exas Instruments
programmable logic is also available, upon request, from the nearest TI field sales office, local authorized TI
distributor, or by calling Texas Instruments at (214) 997-5666.
Thermal management of the TIBP AL22V10-10CNT and TIBP AL22V10-10CFN is necessary when operating at
certain conditions of frequency , output loading, and outputs switching simultaneously. The device and system
application will determine the appropriate level of management.
Determining the level of thermal management is based on factors such as power dissipation (P
), ambient
D
temperature (TA), and transverse airflow (FPM). Figures 4 (a) and 4 (b) show the relationship between ambient
temperature and transverse airflow at given power dissipation levels. The required transverse airflow can be
determined at a particular ambient temperature and device power dissipation level in order to ensure the device
specifications.
Figure 5 illustrates how power dissipation varies as a function of frequency and the number of outputs switching
simultaneously . It should be noted that all outputs are fully loaded (C
= 50 pF). Since the condition of eight fully
L
loaded outputs represents the worst-case condition, each application must be evaluated accordingly.
NOTES: A. CL includes probe and jig capacitance and is 50 pF for tpd and ten, 5 pF for t
B. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2
is for an output with internal conditions such that the output is high except when disabled by the output control.
D. When measuring propagation delay times of 3-state outputs, switch S1 is closed.
E. Equivalent loads may be used for testing.
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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