TEXAS INSTRUMENTS TC591 Technical data
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TL1591
SAMPLE-AND-HOLD CIRCUIT FOR CCD IMAGERS
SOCS026B – SEPTEMBER 1989 – REVISED JUNE 1994
• 15-MHz Sampling Rate
• 30-ns Acquisition Time
• Diode-Bridge Switch
• 25-MHz Bandwidth
• Low-Voltage Supply
ANLG V
ANLG GND
ANLG OUT
P OR PS PACKAGE
CC
ANLG IN
(TOP VIEW)
1
2
3
4
8
7
6
5
DGTL V
CC
DGTL IN
DGTL GND
SUB GND
description
The TL1591 is a monolithic integrated sample-and-hold circuit that uses the BiFET process with
Schottky-barrier diodes and is designed for use with CCD area imagers. This device consists of an ultra-fast
input-buffer amplifier , a digital-controlled diode-bridge switch, and a high-impedance output buffer amplifier. The
electronic switch is controlled by an LS-TTL-compatible logic input.
functional block diagram
4
ANLG OUT
ANLG IN
DGTL IN
2
7
C1
A2 A3A1
This device contains circuits to protect its inputs and outputs against damage due to high static voltages or electrostatic fields. These
circuits have been qualified to protect this device against electrostatic discharges (ESD) of up to 2 kV according to MIL-STD-883C,
Method 3015; however, precautions should be taken to avoid application of any voltage higher than maximum-rated voltages to these
conductive foam. In a circuit, unused inputs should always be connected to an appropriate logic voltage level, preferably either VCC or ground.
Specific guidelines for handling devices of this type are contained in the publication
(ESDS) Devices and Assemblies
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
high-impedance circuits. During storage or handling, the device leads should be shorted together or the device should be placed in
Guidelines for Handling Electrostatic-Discharge-Sensitive
available from Texas Instruments.
Copyright 1994, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
TL1591
PACKAGE
SAMPLE-AND-HOLD CIRCUIT FOR CCD IMAGERS
SOCS026B – SEPTEMBER 1989 – REVISED JUNE 1994
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage range, V
Continuous total dissipation See Dissipation Rating Table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
0 to V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
–25°C to 80°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
–55°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
STG
DISSIPATION RATING TABLE
TA ≤ 25°C DERATING FACTOR TA = 80°C
POWER RATING ABOVE TA = 25°C POWER RATING
P 1000 mW 8.0 mW/°C 560 mW
PS 725 mW 5.8 mW/°C 406 mW
recommended operating conditions
MIN NOM MAX UNIT
Supply voltage, V
High-level input voltage, V
Low-level input voltage, V
Peak-to-peak input voltage, V
Operating free-air temperature, T
CC
IH
IL
I(PP)
A
4.75 5 5.5 V
2 V
0.8 V
0.8 V
–25 80 °C
†
CC
electrical characteristics over ranges of supply voltage and operating free-air temperature (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP‡MAX UNIT
V
IK
V
O(PP)
I
IH
I
IL
I
O
I
CC
r
i
r
o
Input clamp voltage –1.5 V
Peak-to-peak output voltage 1.1 V
High-level input current VCC = 5.5 V, VIH = 2.7 V 20 µA
Low-level input current VCC = 5.5 V, V
Output current 0.6 mA
Supply current VCC = 5.5 V 15 20 mA
Input resistance 10 kΩ
Output resistance 50 Ω
= 0.4 V –0.28 –0.4 mA
IL
operating characteristics
PARAMETER MIN TYP‡MAX UNIT
Linearity 0.7% 2%
A
v
‡
All typical values are at VCC = 5 V, TA = 25°C.
Voltage amplification 0.8 0.9 V/V
Sample-to-hold offset error 15 mV
Sample-mode offset error –150 –50 50 mV
Hold-mode feedthrough –50 dB
Hold-mode droop 100 µV/µs
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TL1591
SAMPLE-AND-HOLD CIRCUIT FOR CCD IMAGERS
SOCS026B – SEPTEMBER 1989 – REVISED JUNE 1994
dynamic characteristics (see Figure 1)
PARAMETER MIN TYP†MAX UNIT
Acquisition time, 0.6 V to 2% 18 ns
Acquisition time, 0.6 V to 1% 31 ns
Hold-mode settling time 35 ns
Sampling-mode bandwidth 25 MHz
Sampling rate 15 MHz
†
All typical values are at VCC = 5 V and TA = 25°C.
PARAMETER MEASUREMENT INFORMATION
Sample-to-Hold
Transient
Hold More
Voltage Droop
Sample-and-Hold
Output
Analog
Input
Signal
Sample
Command
Sample-Control Pulse
Sampling
Switch
Closes
(see Note A)
(see Note B)
Hold
Command
Aperture
Uncertainty
(error band)
Sample Switch
Opens
Aperture
Uncertainty
Time
Sample-to-Hold
Offset Error
Figure 1. Sample-Hold Definitions
NOTES: A. Hold-mode settling time is the time from the hold command transistion until the output has settled within a specified error band around
the final value.
B. Acquisition time is the time required, after the closing of the sampling switch, for the hold capacitor to charge to a full-scale voltage
change and then remain within a specified error band around the final value.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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