Texas Instruments TAS5733L User Manual

0
5
10
15
20
25
30
8 9 10 11 12 13 14 15
Output Power (W)
PVDD (V)
RL = 4 Ω
RL = 8 Ω
Processor
(DAP)
Sample Rate
Converter
(SRC)
I²C Control Port
Internal Register/State Machine Interfac e
Power-On Reset
(POR)
PVDDDVDD
MCLK Monitoring
and Watchdog
AVDD
PDN RST
AMP_OUT_A
AMP_OUT_C
SDIN
MCLK
SCLK
LRCK
SCL SDA
Serial Audio Port
(SAP)
Sample Rate
Auto-Detect
PLL
Digital to PWM
Converter
(DPC)
Click & Pop
Suppression
2 Ch. PWM
Modulator
Noise Shaping
Open Loop Stereo
Stereo PWM Amplifier
Sensing & Protection
Temperature
Short Circuits PVDD Voltage Output Current
Fault Notification
Internal Voltage Supplies
Internal Regulation and Power Distribution
AMP_OUT_B
AMP_OUT_D
DR_SD
Product Folder
Sample & Buy
Technical Documents
Tools & Software
Support & Community
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
TAS5733L - Digital Input Audio Power Amplifier with EQ and 3-Band AGL
1 Features
1
Audio Input/Output – One-Stereo Serial Audio Input – Supports 44.1-kHz and 48-kHz Sample Rates
(LJ/RJ/I²S) – Supports 3-Wire I²S Mode (no MCLK required) – Automatic Audio Port Rate Detection – Supports BTL and PBTL Configuration – P
Audio/PWM Processing – Independent Channel Volume Controls With
– Programmable Three-Band Automatic Gain
– 20 Programmable Biquads for Speaker EQ
General Features – 104-dB SNR, A-Weighted, Referenced to Full
– I²C Serial Control Interface w/ two Addresses – Thermal, Short-Circuit, and Undervoltage
– Up to 90% Efficient – AD, BD, and Ternary Modulation – PWM Level Meter
= 10 W @ 10% THD+N
OUT
– PVDD = 12 V, 8 Ω, 1 kHz
Gain of 24 dB to Mute in 0.125-dB Steps
Limiting (AGL)
and Other Audio-Processing Features
Scale (0 dB)
Protection
Power vs PVDD
2 Applications
LCD TV, LED TV
Low-Cost Audio Equipment
3 Description
The TAS5733L device is an efficient, digital-input audio amplifier for driving stereo speakers configured as a bridge tied load (BTL). In parallel bridge tied load (PBTL) in can produce higher power by driving the parallel outputs into a single lower impedance load. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers.
The TAS5733L device is a slave-only device receiving all clocks from external sources. The TAS5733L device operates with a PWM carrier between a 384-kHz switching rate and a 288-kHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz.
Device Information
PART NUMBER PACKAGE BODY SIZE (NOM)
TAS5733L HTSSOP (48) 12.50 mm × 6.10 mm (1) For all available packages, see the orderable addendum at
the end of the data sheet.
Simplified Block Diagram
(1)
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA.
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 5
6.1 Absolute Maximum Ratings ...................................... 5
6.2 ESD Ratings ............................................................ 5
6.3 Recommended Operating Conditions....................... 5
6.4 Thermal Characteristics............................................ 6
6.5 Electrical Characteristics........................................... 6
6.6 Speaker Amplifier Characteristics............................. 7
6.7 Protection Characteristics......................................... 7
6.8 Master Clock Characteristics .................................... 7
6.9 I²C Interface Timing Requirements........................... 8
6.10 Serial Audio Port Timing Requirements.................. 8
6.11 Typical Characteristics - Stereo BTL Mode .......... 11
6.12 Typical Characteristics - Mono PBTL Mode ......... 13
7 Detailed Description............................................ 15
7.1 Overview................................................................. 15
7.2 Functional Block Diagram....................................... 15
7.3 Audio Signal Processing Overview......................... 16
7.4 Feature Description................................................. 17
7.5 Device Functional Modes........................................ 19
7.6 Programming........................................................... 20
7.7 Register Maps......................................................... 31
8 Application and Implementation ........................ 49
8.1 Application Information............................................ 49
8.2 Typical Applications ............................................... 50
9 Power Supply Recommendations...................... 55
10 Layout................................................................... 56
10.1 Layout Guidelines ................................................. 56
10.2 Layout Example .................................................... 57
11 Device and Documentation Support................. 59
11.1 Trademarks........................................................... 59
11.2 Electrostatic Discharge Caution............................ 59
11.3 Glossary................................................................ 59
12 Mechanical, Packaging, and Orderable
Information........................................................... 60
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Original (March 2016) to Revision A Page
Moved from Product Preview to Production Data release. ................................................................................................... 1
2
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PowerPAD
TM
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
21 22 23 24
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29
28 27 26 25
BSTRP_B AMP_OUT _B AMP_OUT _B
PGND PGND
AMP_OUT _A
PVDD
PVDD BSTRP_A SSTIMER
PBTL
NC NC
PLL_GND
PLL_FLTM
PLL_FLTP
AVDD_REF
AVDD
ADR / FAULT
MCLK
OSC_RES
OSC _GND
DVDD_REG
PDN
BSTRP_C AMP_OUT _C AMP_OUT _C PGND PGND AMP_OUT _D PVDD PVDD BSTRP_D GVDD_REG AVDD_REG NC NC AGND DGND DVDD TEST RST NC SCL SDA SDIN SCLK
LRCLK
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5 Pin Configuration and Functions
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
PIN
NAME NO.
TYPE
ADR/FAULT 19 DI/DO
AGND 35 P AMP_OUT_A 6
AMP_OUT_B
AMP_OUT_C
2
3 46 47
AMP_OUT_D 43 AVDD 18 P Power supply for internal analog circuitry
AVDD_REF 17 P
AVDD_REG 38 P
BSTRP_A 9 BSTRP_B 1 BSTRP_C 48 BSTRP_D 40
DGND 34 P DVDD 33 P Power supply for the internal digital circuitry
DVDD_REG 23 P
GVDD_REG 39 P
LRCLK 25 DI
(1) TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output
48-Pin HTSSOP With PowerPAD™
DCA Package
Top View
Pin Functions
(1)
Dual function terminal which sets the LSB of the I²C Address to 0 if pulled to GND, 1 if pulled to AVDD. Also, if configured to be a fault output by the methods described in the
Fault Indication section, this terminal will be pulled low when an internal fault occurs.
Ground reference for analog circuitry (NOTE: This terminal should be connected to the system ground)
AO Speaker amplifier outputs
Internal power supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry)
Voltage regulator derived from AVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry)
P
Connection points to for the bootstrap capacitors, which are used to create a power supply for the gate drive for the high-side device
Ground reference for digital circuitry (NOTE: This terminal should be connected to the system ground)
Voltage regulator derived from DVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry)
Voltage regulator derived from PVDD supply (NOTE: This terminal is provided as a connection point for filtering capacitors for this supply and must not be used to power any external circuitry)
Word select clock for the digital signal that is active on the input data line of the serial port
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DESCRIPTION
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Pin Functions (continued)
PIN
NAME NO.
MCLK 20 DI Master clock used for internal clock tree and sub-circuit/state machine clocking
12 13
(2)
NC
30 36 37
OSC_GND 22 P
OSC_RES 21 AO
PBTL 11 DI PDN 24 DI Places the device in power down when pulled low
4
PGND
5 44 45
PLL_FLTM 15 AO Negative connection point for the PLL loop filter components PLL_FLTP 16 AO Positive connection point for the PLL loop filter components
PLL_GND 14 P
7
PVDD
8 41 42
RST 31 DI Places the devices in reset when pulled low SCL 29 DI I²C serial control port clock SCLK 26 DI Bit clock for the digital signal that is active on the input data line of the serial data port SDA 28 DI/DO I²C serial control port data SDIN 27 DI Data line to the serial data port
SSTIMER 10 AO
TEST 32
PowerPAD P
(2) Although these pins are not connected internally, optimum thermal performance is realized when these pins are connected to the ground
plane. Doing so allows copper on the PCB to fill up to and including these pins, providing a path for heat to conduct away from the device and into the surrounding PCB area.
(1)
TYPE
P
Not connected inside the device (all "no connect" terminals should be connected to system ground)
Ground reference for oscillator circuitry (NOTE: These terminals should be connected to the system ground)
Connection point for precision resistor used by internal oscillator circuit. Details for this resistor are shown in the Typical Applications section
Places the power stage in BTL mode when pulled low, or in PBTL mode when pulled high
Ground reference for power device circuitry (NOTE: This terminal should be connected to the system ground)
Ground reference for PLL circuitry (NOTE: This terminal should be connected to the system ground)
P Power supply for internal power circuitry
Connection point for the capacitor that is used by the ramp timing circuit, as described in the SSTIMER Pin Functionality section
Used by TI for testing during device production (NOTE: This terminal should be connected to system ground)
Exposed metal pad on the underside of the device, which serves as an electrical connection point for ground as well as a heat conduction path from the device into the board (NOTE: This terminal should be connected to ground through a land pattern defined in the Mechanical Data section)
DESCRIPTION
4
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6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
Supply voltage
Input voltage
AMP_OUT_x to GND 22 BSTRP_x to GND 29 Operating free-air temperature 0 to 85 °C Storage temperature range, T
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability.
(2) 5-V tolerant inputs are PDN, RST, SCLK, LRCK, MCLK, SDIN, SDA, and SCL. (3) Maximum pin voltage should not exceed 6 V. (4) DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions.
DVDD, AVDD –0.3 to 3.6 V PVDD –0.3 to 20
3.3-V digital input –0.5 to DVDD + 0.5
(2)
digital input (except MCLK) –0.5 to DVDD + 2.5
5-V tolerant MCLK input –0.5 to AVDD + 2.5
stg
6.2 ESD Ratings
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
V
(ESD)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Electrostatic discharge
Charged-device model (CDM), per JEDEC specification JESD22-
(2)
C101
(1)
VALUE UNIT
(3)
(3) (4) (4)
V5-V tolerant
V V
–40 to 125 °C
VALUE UNIT
(1)
±4000 ±1500
V
6.3 Recommended Operating Conditions
MIN NOM MAX UNIT
DVDD, AVDD Digital, analog supply voltage 3 3.3 3.6 V PVDD Output power devices supply voltage 8 16.5
V
IH
V
IL
T
A
(2)
T
J
R
L
R
L
L
O
High-level input voltage 5-V tolerant 2 V Low-level input voltage 5-V tolerant 0.8 V Operating ambient temperature range 0 85 °C Operating junction temperature range 0 125 °C Load impedance 4 8 Load impedance in PBTL 2
Output-filter inductance
Minimum output inductance under short-circuit condition
10 μH
(1) For operation at PVDD levels greater than 14.5 V, the modulation limit must be set to 96.1% or lower via the control port register 0x10. (2) 16.5 V is the maximum recommended voltage for continuous operation of the TAS5733L device. Testing and characterization of the
device is performed up to and including 16.5 V to ensure “in system” design margin. However, continuous operation at these levels is not recommended. Operation above the maximum recommended voltage may result in reduced performance, errant operation, and reduction in device reliability.
(1) (2)
V
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6.4 Thermal Characteristics
DCA (48 PINS)
THERMAL METRIC
(1)
Special Test
Case
θ
θ
θ
ψ
ψ
θ
Junction-to-ambient thermal resistance
JA
Junction-to-case (top) thermal resistance
JCtop
Junction-to-board thermal resistance
JB
Junction-to-top characterization parameter
JT
Junction-to-board characterization parameter
JB
Junction-to-case (bottom) thermal resistance
JCbot
(2)
(3)
(4)
(5)
(6)
(7)
14.9 16.7 °C/W
6.9 7.9 °C/W
1.7 2.2 °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report (SPRA953).
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining R
(6) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining R
(7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
, using a procedure described in JESD51-2a (sections 6 and 7).
θJA
, using a procedure described in JESD51-2a (sections 6 and 7).
θJA
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Spacer
JEDEC
Standard 2-
Layer PCB
JEDEC
Standard 4-
Layer PCB
TAS5733LEVM
50.7 27.6 25.0 °C/W
1.2 0.8 0.7 °C/W
11.8 7.8 5.8 °C/W
UNITS
6.5 Electrical Characteristics
TA= 25°, PVDD_x = 12 V, DVDD = AVDD = 3.3 V, RL= 8 , BTL BD mode, fS= 48 kHz (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
OH
High-level output voltage
ADR/FAULT and SDA
V
OL
I
IL
Low-level output voltage
Low-level input current
Digital Inputs
I
IH
I
DD
High-level input current
3.3-V supply current
3.3-V supply voltage (DVDD, AVDD)
IOH= –4 mA DVDD = AVDD = 3 V
IOL= 4 mA DVDD = AVDD = 3 V
VI< V
IL
DVDD = AVDD = 3.6 V VI> V
IH
DVDD = AVDD = 3.6 V
2.4 V
0.5 V
Normal mode 49 68 Reset (RST = low, PDN =
high)
23 38
75 μA
75 μA
mA
6
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6.6 Speaker Amplifier Characteristics
PVDD = 12 V, BTL BD mode, AVDD = DVDD = 3.3 V, fS= 48 KHz, RL= 8 , audio frequency = 1 kHz, AES17 filter, f 384 kHz, TA= 25°C (unless otherwise specified). All performance is in accordance with recommended operating conditions and as tested on the TAS5733L EVM.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PVDD = 12 V, 10% THD, 1-kHz input signal 10 PVDD = 12 V, 7% THD, 1-kHz input signal 9
P
O
THD+N
V
n
Power output per channel
Total harmonic distortion + noise
Output integrated noise (rms) A-weighted 30 μV
Crosstalk
Output switching frequency
I
PVDD
Supply current No load (PVDD)
Drain-to-source resistance,
DS(on)
Drain-to-source resistance,
low side
(1)
r
high side
R
PD
Internal pulldown resistor at the output of each half-bridge
(1) This does not include bond-wire or pin resistance.
PVDD = 12 V, 1% THD, 1-kHz input signal 7.5 PVDD = 13.2 V, 10% THD, 1-kHz input signal 12 PVDD = 13.2 V, 7% THD, 1-kHz input signal 11 PVDD = 13.2 V, 1% THD, 1-kHz input signal 9 PVDD = 12 V, PO= 1 W 0.25 PVDD = 13.2 V, PO= 1 W 0.3
PO= 1 W, f = 1 kHz (BD Mode), PVDD = 12 V –79 dB PO=1 W, f = 1 kHz (AD Mode), PVDD = 12 V –62 dB
11.025, 22.05, 44.1-kHz data rate ±2% 288 48, 24, 12, 8, 16, 32-kHz data rate ±2% 384
Normal mode 16 25 Reset (RST = low, PDN = high) 3 8
TJ= 25°C, includes metallization resistance 120
TJ= 25°C, includes metallization resistance 120 Connected when drivers are in the high-impedance
state to provide bootstrap capacitor charge.
3 kΩ
PWM
W
%
kHz
mA
mΩ
=
6.7 Protection Characteristics
TA= 25°, PVDD_x = 12 V, DVDD = AVDD = 3.3 V, RL= 8 , BTL BD mode, fS= 48 kHz (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
uvp(fall)
V
uvp(rise)
OTE Overtemperature error 150 °C I
OC
I
OCT
6.8 Master Clock Characteristics
PVDD = 12 V, BTL BD mode, AVDD = DVDD = 3.3 V, fS= 48 kHz, RL= 8 , audio frequency = 1 kHz, AES17 filter, f 384 kHz, TA= 25°C (unless otherwise specified). All performance is in accordance with recommended operating conditions (unless otherwise specified).
PLL INPUT PARAMETERS
f
MCLKI
tr/ t
f(MCLK)
(1) For clocks related to the serial audio port, please see Serial Audio Port Timing Requirements.
Undervoltage protection limit PVDD falling 5.4 V Undervoltage protection limit PVDD rising 5.8 V
Overcurrent limit protection 4 A Overcurrent response time 150 ns
(1)
PWM
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
MCLK frequency 2.8224 24.576 MHz MCLK duty cycle 40% 50% 60% Rise/fall time for MCLK 5 ns
=
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6.9 I²C Interface Timing Requirements
t
w(RST)
t
d(I²C_ready)
f
SCL
t
w(H)
t
w(L)
t
r
t
f
t
su1
t
h1
t
(buf)
t
su2
t
h2
t
su3
C
L
Pulse duration, RST active 100 μs Time to enable I²C after RST goes high 13.5 ms Frequency, SCL 400 kHz Pulse duration, SCL high 0.6 μs Pulse duration, SCL low 1.3 μs Rise time, SCL and SDA 300 ns Fall time, SCL and SDA 300 ns Setup time, SDA to SCL 100 ns Hold time, SCL to SDA 0 ns Bus free time between stop and start conditions 1.3 μs Setup time, SCL to start condition 0.6 μs Hold time, start condition to SCL 0.6 μs Setup time, SCL to stop condition 0.6 μs Load capacitance for each bus line 400 pF
6.10 Serial Audio Port Timing Requirements
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
f
SCLKIN
t
su1
t
h1
t
su2
t
h2
t
(edge)
tr/t
f
Frequency, SCLK 32 × fS, 48 × fS, 64 × f
S
Setup time, LRCK to SCLK rising edge 10 ns Hold time, LRCK from SCLK rising edge 10 ns Setup time, SDIN to SCLK rising edge 10 ns Hold time, SDIN from SCLK rising edge 10 ns LRCK frequency 8 48 48 kHz SCLK duty cycle 40% 50% 60% LRCK duty cycle 40% 50% 60%
SCLK rising edges between LRCK rising edges 32 64
LRCK clock edge with respect to the falling edge of SCLK –1/4 1/4 Rise/fall time for SCLK/LRCK 8 ns
LRCK allowable drift before LRCK reset 4 MCLKs
MIN NOM MAX UNIT
CL≤ 30 pF 1.024 12.28
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MHz
8
SCLK edges
SCLK
period
8
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SCL
SDA
t
h2
t
(buf)
t
su2
t
su3
Start
Condition
Stop
Condition
T0028-01
SCL
SDA
t
w(H)
t
w(L)
t
r
t
f
t
su1
t
h1
T0027-01
t
w(RST)
RST
t
d(I2C_ready)
System Initialization.
Enable via I C.
2
T0421-01
I C Active
2
I C Active
2
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NOTE: On power up, hold the TAS5733L RST LOW for at least 100 μs after DVDD has reached 3 V. NOTE: If RST is asserted LOW while PDN is LOW, then RST must continue to be held LOW for at least 100 μs after PDN is
deasserted (HIGH).
Figure 1. Reset Timing
TAS5733L
Figure 2. SCL and SDA Timing
Figure 3. Start and Stop Conditions Timing
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t
h1
t
su1
t
(edge)
t
su2
t
h2
SCLK
(Input)
LRCLK
(Input)
SDIN
T0026-04
t
r
t
f
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Figure 4. Serial Audio Port Timing
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Frequency (Hz)
THD+N (%)
0.001
0.01
0.1
1
55
20 100 1k 10k 20k
D003
1 W
2.5 W 5 W
Output Power (W)
THD+N (%)
0.01 0.1 1 10 50
0.01
0.1
1
10
D001
20 Hz 1 kHz 7 kHz
Frequency (Hz)
THD+N (%)
0.002
0.01
0.1
1
10
20 100 1k 10k 20k
D001
1 W
2.5 W 5 W
Frequency (Hz)
THD+N (%)
0.002
0.01
0.1
1
10
10 100 1k 10k 20k
D002
1 W
2.5 W 5 W
PVDD (V)
Output Power (W)
8 9 10 11 12 13 14 15
0
5
10
15
20
25
30
D007
THD+N = 10%; 8 Ohms THD+N = 1%; 8 Ohms THD+N = 10%; 6 Ohms THD+N = 1%; 6 Ohms THD+N = 10%; 4 Ohms THD+N = 1%; 4 Ohms
PVDD (V)
Idle Channel Noise (µV)
8 9 10 11 12 13 14 15
0
5
10
15
20
25
30
35
40
45
50
D012
8 Ohms 6 Ohms 4 Ohms
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6.11 Typical Characteristics - Stereo BTL Mode
Figure 5. Output Power vs Supply Voltage - BTL Figure 6. Idle Channel Noise vs Supply Voltage - BTL
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
PVDD = 12 V RL= 8 Ω
Figure 7. THD+N vs Frequency - BTL
PVDD = 12 V RL= 4 Ω
Figure 9. THD+N vs Frequency - BTL
PVDD = 12 V RL= 6 Ω
PVDD = 12 V RL= 8 Ω
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Figure 8. THD+N vs Frequency - BTL
Figure 10. THD+N vs Output Power - BTL
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Frequency (Hz)
Crosstalk (dB)
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
20 100 1k 10k 20k
D010
Right to Left Left to Right
Frequency (Hz)
Crosstalk (dB)
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
20 100 1k 10k 20k
D011
Right to Left Left to Right
Total Output Power (W)
Efficiency (%)
0 5 10 15 20 25
0
10
20
30
40
50
60
70
80
90
100
D008
PVDD = 8 V PVDD = 12 V PVDD = 13.2 V
Output Power (W)
Efficiency (%)
0 5 10 15 20 25 30 35 40 45 50
0
10
20
30
40
50
60
70
80
90
100
D009
PVDD = 8 V PVDD = 12 V PVDD = 13.2 V
Output Power (W)
THD+N (%)
0.01 0.1 1 10 50
0.001
0.01
0.1
1
10
2020
D001
20 Hz 1 kHz 7 kHz
Output Power (W)
THD+N (%)
0.01 0.1 1 10 50
0.01
0.1
1
10
D006
20 Hz 1 kHz 7 kHz
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
Typical Characteristics - Stereo BTL Mode (continued)
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PVDD = 12 V RL= 6 Ω
Figure 11. THD+N vs Output Power - BTL
RL= 8 Ω
Total Output Power includes power delivered from both amplifier
outputs. For instance, 40 W of total output power means 2 × 20 W,
with 20 W delivered by one channel and 20 W delivered by the
other channel.
Figure 13. Efficiency vs Total Output Power - BTL
PVDD = 12 V RL= 4 Ω
Figure 12. THD+N vs Output Power - BTL
RL= 4 Ω
Total Output Power includes power delivered from both amplifier
outputs. For instance, 40 W of total output power means 2 × 20 W,
with 20 W delivered by one channel and 20 W delivered by the
other channel.
Figure 14. Efficiency vs Total Output Power - BTL
PVDD = 12 V RL= 8 Ω
Figure 15. Crosstalk vs Frequency - BTL
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PVDD = 12 V RL= 4 Ω
Figure 16. Crosstalk vs Frequency - BTL
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Output Power (W)
THD+N (%)
0.001 0.01 0.1 1 10 50
0.01
0.1
1
10
2020
D017
20 Hz 1 kHz 7 kHz
Output Power (W)
THD+N (%)
0.002 0.01 0.1 1 10 6060
0.02
0.1
1
10
2020
D018
20 Hz 1 kHz 7 kHz
Frequency (Hz)
THD+N (%)
0.001
0.01
0.1
1
10
20 100 1k 10k 20k
D015
1 W
2.5 W 5 W
Output Power (W)
THD+N (%)
0.001 0.01 0.1 1 10 50
0.01
0.1
1
10
2020
D016
20 Hz 1 kHz 7 kHz
Frequency (Hz)
THD+N (%)
0.001
0.01
0.1
1
10
20 100 1k 10k 20k
D013
1 W
2.5 W 5 W
Frequency (Hz)
THD+N (%)
0.001
0.01
0.1
1
55
20 100 1k 10k 20k
D014
1 W
2.5 W 5 W
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6.12 Typical Characteristics - Mono PBTL Mode
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
PVDD = 12 V RL= 4 Ω
Figure 17. THD+N vs Frequency - PBTL
PVDD = 12 V RL= 2 Ω
Figure 19. THD+N vs Frequency - PBTL
PVDD = 12 V RL= 3 Ω
Figure 18. THD+N vs Frequency - PBTL
PVDD = 12 V RL= 4 Ω
Figure 20. THD+N vs Output Power - PBTL
PVDD = 12 V RL= 3 Ω
Figure 21. THD+N vs Output Power - PBTL
PVDD = 12 V RL= 2 Ω
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Figure 22. THD+N vs Output Power - PBTL
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Output Power (W)
Efficiency (%)
0 5 10 15 20 25 30 35 40 45
0
10
20
30
40
50
60
70
80
90
100
D021
PVDD = 8 V PVDD = 12 V PVDD = 13.2 V
PVDD (V)
Idle Channel Noise (µV)
8 9 10 11 12 13 14 15
0
10
20
30
40
50
60
D022
RL = 4 R RL = 3 R RL = 2 R
Supply Voltage (V)
Output Power (W)
8 9 10 11 12 13 14 15
0
10
20
30
40
50
60
D019
THD+N = 10%; RL = 4R THD+N = 1%; RL = 4R THD+N = 10%; RL = 3R THD+N = 1%; RL = 3R THD+N = 10%; RL = 2R THD+N = 1%; RL = 2R
Output Power (W)
Efficiency (%)
0 5 10 15 20 25
0
20
40
60
80
100
D020
PVDD = 8 V PVDD = 12 V PVDD = 13.2 V
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
Typical Characteristics - Mono PBTL Mode (continued)
Figure 23. Output Power vs PVDD - PBTL
Total Output Power includes power delivered from both amplifier
outputs. For instance, 40 W of total output power means 2 × 20 W,
with 20 W delivered by one channel and 20 W delivered by the
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RL= 4 Ω
other channel.
Figure 24. Efficiency vs Output Power - PBTL
RL= 2 Ω
Total Output Power includes power delivered from both amplifier
outputs. For instance, 40 W of total output power means 2 × 20 W,
with 20 W delivered by one channel and 20 W delivered by the
other channel.
Figure 25. Efficiency vs Output Power - PBTL
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Figure 26. Idle Channel Noise vs PVDD - PBTL
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Digital Audio
Processor
(DAP)
Sample Rate
Converter
(SRC)
I²C Control Port
Internal Register/State Machine Interface
Power-On Reset
(POR)
PVDDDVDD
MCLK Monitoring
and Watchdog
AVDD
PDN RST
AMP_OUT_A
AMP_OUT_C
SDIN
MCLK
SCLK
LRCK
SCL SDA
Serial Audio Port
(SAP)
Sample Rate
Auto-Detect
PLL
Digital to PWM
Converter
(DPC)
Click & Pop
Suppression
2 Ch. PWM
Modulator
Noise Shaping
Open Loop Stereo
Stereo PWM Amplifier
Sensing & Protection
Temperature
Short Circuits
PVDD Voltage
Output Current
Fault Notification
Internal Voltage Supplies
Internal Regulation and Power Distribution
AMP_OUT_B
AMP_OUT_D
DR_SD
TAS5733L
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7 Detailed Description
7.1 Overview
The TAS5733L device is an efficient, digital-input audio amplifier for driving stereo speakers configured as a bridge tied load (BTL). In parallel bridge tied load (PBTL) in can produce higher power by driving the parallel outputs into a single lower impedance load. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers.
The TAS5733L device is a slave-only device receiving all clocks from external sources. The TAS5733L device operates with a PWM carrier between a 384-kHz switching rate and a 288-kHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz.
7.2 Functional Block Diagram
Figure 27. TAS5733L Functional Block Diagram
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L
R
Input
Mixer L
AGL 1
Low Band
Vol 1
Vol 2
Mixer L
AGL 4
Full Band
Mixer R
AGL 2
High Band
AGL 3
Mid Band
10 Biquads
Biquad
Biquad
2 Biquads
2 Biquads
Biquad
Biquad
10 Biquads
Biquad
0x26
0x59
0x8
0x9
0x51
0x52
0x5E
0x5A
0x5F
0x5B, 0x5C
0x60, 0x61
0x76, 0x77
0x72, 0x73
0x27 - 0x2F, 0x58
0x3B - 0x3C, 0x40
0x3E - 0x3F, 0x43
0x44 - 0x45, 0x48
0x42 - 0x41, 0x47
0x31 - 0x39, 0x5D
0x30
DC Bloc k and L R Mixer Equalize r Mu lti Ban d AGL Full Ba nd AGL
L
R
Master Volume,
Pre Scale,
Post Scale
0x07 - 0x57, 0x56
Master Volume
Biquad
Input
Mixer R
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
7.3 Audio Signal Processing Overview
Figure 28. TAS5733L Audio Process Flow
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B0396-01
1 – a
rms
ABSCh1
Z
–1
a
Post-DAP Processing
32-BitLevel
I CRegisters
(PWMLevelMeter)
2
rms
ABSCh2
Z
–1
32-BitLevel
ADDR=0x6C
ADDR=0x6B
1 – a
a
TAS5733L
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7.4 Feature Description
7.4.1 Clock, Autodetection, and PLL
The TAS5733L device is an I²S slave device. The TAS5733L device accepts MCLK, SCLK, and LRCK. The digital audio processor (DAP) supports all the sample rates and MCLK rates that are defined in the Clock Control
Register.
The TAS5733L device checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 × fSLRCK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the internal clock (DCLK) running at 512 times the PWM switching frequency.
The DAP can autodetect and set the internal clock control logic to the appropriate settings for all supported clock rates as defined in the Clock Control Register.
The TAS5733L device has robust clock error handling that uses the built-in trimmed oscillator clock to quickly detect changes/errors. Once the system detects a clock change/error, the system mutes the audio (through a single-step mute) and then forces PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the system autodetects the new rate and reverts to normal operation. During this process, the default volume is restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back slowly (also called soft unmute) as defined in the Volume Configuration Register.
7.4.2 PWM Section
The TAS5733L DAP device uses noise-shaping and customized nonlinear correction algorithms to achieve high power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP and outputs two BTL PWM audio output channels.
The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff frequency is less than 1 Hz.
The PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%. For PVDD > 14.5 V the modulation index must be limited to 96.1% for safe and reliable operation.
7.4.3 PWM Level Meter
The structure in Figure 29 shows the PWM level meter that can be used to study the power profile.
7.4.4 Automatic Gain Limiter (AGL)
The AGL scheme has three AGL blocks. One ganged AGL exists for the high-band left/right channels, the mid­band left/right channels, and the low-band left/right channels.
The AGL input/output diagram is shown in Figure 30.
Figure 29. PWM Level Meter Structure
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S
Z
–1
Alpha Filter Structure
w
a
Output Level (dB)
Input Level (dB)
T
M0091-04
1:1 TransferFunction
Implemented TransferFunction
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
Feature Description (continued)
Professional-quality dynamic range compression automatically adjusts volume to flatten volume level.
• Each AGL has adjustable threshold levels.
• Programmable attack and decay time constants
Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging, and decay times can be set slow enough to avoid pumping.
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Figure 30. Automatic Gain Limiter
T = 9.23 format, all other AGL coefficients are 3.23 format
Figure 31. AGL Structure
Table 1. AGL Structure
α, ω T αa, ωa / αd, ωd
AGL 1 0x3B 0x40 0x3C AGL 2 0x3E 0x43 0x3F AGL 3 0x47 0x41 0x42 AGL 4 0x48 0x44 0x45
7.4.5 Fault Indication
ADR/FAULT is an input pin during power up. This pin can be programmed after RST to be an output by writing 1 to bit 0 of I²C register 0x05. In that mode, the ADR/FAULT pin has the definition shown in Table 2.
Any fault resulting in device shutdown is signaled by the ADR/FAULT pin going low (see Table 2). A latched version of this pin is available on D1 of register 0x02. This bit can be reset only by an I²C write.
Table 2. ADR/FAULT Output States
ADR/FAULT DESCRIPTION
0 Overcurrent (OC) or undervoltage (UVP) error or overtemperature error (OTE) or overvoltage
1 No faults (normal operation)
error
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7.4.6 SSTIMER Pin Functionality
The SSTIMER pin uses a capacitor connected between this pin and ground to control the output duty cycle when exiting all-channel shutdown. The capacitor on the SSTIMER pin is slowly charged through an internal current source, and the charge time determines the rate at which the output transitions from a near-zero duty cycle to the desired duty cycle. This allows for a smooth transition that minimizes audible pops and clicks. When the part is shut down, the drivers are placed in the high-impedance state and transition slowly down through an internal 3­kresistor, similarly minimizing pops and clicks. The shutdown transition time is independent of the SSTIMER pin capacitance. Larger capacitors increase the start-up time, while smaller capacitors decrease the start-up time. The SSTIMER pin can be left floating for BD modulation.
7.4.7 Device Protection System
7.4.7.1 Overcurrent (OC) Protection With Current Limiting
The TAS5733L device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The detector outputs are closely monitored to prevent the output current from increasing beyond the overcurrent threshold defined in the Protection Characteristics table.
If the output current increases beyond the overcurrent threshold, the device shuts down and the outputs transition to the off or high impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short circuit on the output) is removed. Current-limiting and overcurrent protection are not independent for half-bridges. That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C, and D shut down.
7.4.7.2 Overtemperature Protection
The TAS5733L device has an overtemperature-protection system. If the device junction temperature exceeds 150°C (nominal), the device enters thermal shutdown, where all half-bridge outputs enter the high-impedance (Hi-Z) state, and ADR/FAULT asserts low if the device is configured to function as a fault output. The TAS5733L device recovers automatically once the junction temperature of the device drops approximately 30°C.
7.4.7.3 Undervoltage Protection (UVP) and Power-On Reset (POR)
The UVP and POR circuits of the TAS5733L device fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the PVDD and AVDD supply voltages reach 7.6 V and 2.7 V, respectively. Although PVDD and AVDD are independently monitored. For PVDD, if the supply voltage drops below the UVP threshold, the protection feature immediately sets all half-bridge outputs to the high-impedance (Hi-Z) state and asserts ADR/FAULT low.
7.5 Device Functional Modes
The TAS5733L device is a digital input class-d amplifier with audio processing capabilities. The TAS5733L device has numerous modes to configure and control the device.
7.5.1 Serial Audio Port Operating Modes
The serial audio port in the TAS5733L device supports industry-standard audio data formats, including I²S, Left­justified(LJ) and Right-justified(RJ) formats. To select the data format that will be used with the device can controlled by using the serial data interface registers 0x04. The default is 24bit, I²S mode. The timing diagrams for the various serial audio port are shown in the Serial Interface Control and Timing section
7.5.2 Communication Port Operating Modes
The TAS5733L device is configured via an I²C communication port. The I²C communication protocol is detailed in the 7.7 I²C Serial Control Port Requirements and Specifications section.
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7-BitSlave Address
R/ W
8-BitRegister Address(N)
A
8-BitRegisterDataFor
Address(N)
Start Stop
SDA
SCL
7
6
5
4
3
2 1
0
7
6
5
4
3
2 1
0
7
6
5
4
3
2 1
0
7
6
5
4
3
2 1
0
A
8-BitRegisterDataFor
Address(N)
A A
T0035-01
TAS5733L
SLASE77A –MARCH 2016–REVISED MARCH 2016
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Device Functional Modes (continued)
7.5.3 Speaker Amplifier Modes
The TAS5733L device can be configured as:
Stereo Mode
Mono Mode
7.5.3.1 Stereo Mode
Stereo mode is the most common option for the TAS5733L. TAS5733L can be connected in 2.0 mode to drive stereo channels. Detailed application section regarding the stereo mode is discussed in the Stereo Bridge Tied
Load Application section.
7.5.3.2 Mono Mode
Mono mode is described as the operation where the two BTL outputs of amplifier are placed in parallel with one another to provide increase in the output power capability. This mode is typically used to drive subwoofers, which require more power to drive larger loudspeakers with high-amplitude, low-frequency energy. Detailed application section regarding the mono mode is discussed in the Mono Parallel Bridge Tied Load Application section.
7.6 Programming
7.6.1 I²C Serial Control Interface
The TAS5733L device has a bidirectional I²C interface that is compatible with the Inter IC (I²C) bus protocol and supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-byte write and read operations. This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The control interface is used to program the registers of the device and to read device status.
The DAP supports the standard-mode I²C bus operation (100 kHz maximum) and the fast I²C bus operation (400 kHz maximum). The DAP performs all I²C operations without I²C wait cycles.
7.6.1.1 General I²C Operation
The I²C bus employs two signals, SDA (data) and SCL (clock), to communicate between integrated circuits in a system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte (8-bit) format, with the most-significant bit (MSB) transferred first. In addition, each byte transferred on the bus is acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master device driving a start condition on the bus and ends with the master device driving a stop condition on the bus. The bus uses transitions on the data pin (SDA) while the clock is high to indicate start and stop conditions. A high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data-bit transitions must occur within the low time of the clock period. These conditions are shown in Figure 32. The master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another device and then waits for an acknowledge condition. The TAS5733L device holds SDA low during the acknowledge clock period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence. Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for the SDA and SCL signals to set the high level for the bus.
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Figure 32. Typical I²C Sequence
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Programming (continued)
No limit exists for the number of bytes that can be transmitted between start and stop conditions. When the last word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is shown in Figure 32.
The 7-bit address for the TAS5733L device is 0101 010 (0x54) or 0101 011 (0x56) as defined by ADR/FAULT (external pulldown for 0x54 and pullup for 0x56).
7.6.1.2 I²C Slave Address
The ADR/FAULT is an input pin during power-up and after each toggle of RST, which is used to set the I²C sub­address of the device. The ADR/FAULT can also operate as a fault output after power-up is complete and the address has been latched in.
At power-up, and after each toggle of RST, the pin is read to determine its voltage level. If the pin is left floating, an internal pull-up will set the I²C sub-address to 0x56. This will also be the case if an external resistor is used to pull the pin up to AVDD. To set the sub-address to 0x54, an external resistor (specified in Typical Applications ) must be connected to the system ground.
As mentioned, the pin can also be reconfigured as an output driver via I²C for fault monitoring. Use System
Control Register 2 (0x05) to set ADR/FAULT pin to be used as a fault output during fault conditions.
I²C Device Address Change Procedure
1. Write to device address change enable register, 0xF8 with a value of 0xF9A5 A5A5.
2. Write to device register 0xF9 with a value of 0x0000 00XX, where XX is the new address.
3. Any writes after that should use the new device address XX.
7.6.1.3 Single- and Multiple-Byte Transfers
The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses 0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only multiple­byte read/write operations (in multiples of 4 bytes).
During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does not contain 32 bits, the unused bits are read as logic 0.
During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes that are required for each specific subaddress. For example, if a write command is received for a biquad subaddress, the DAP must receive five 32-bit words. If fewer than five 32-bit data words have been received when a stop command (or another start command) is received, the received data is discarded.
Supplying a subaddress for each subaddress transaction is referred to as random I²C addressing. The TAS5733L device also supports sequential I²C addressing. For write transactions, if a subaddress is issued followed by data for that subaddress and the 15 subaddresses that follow, a sequential I²C write transaction has taken place, and the data for all 16 subaddresses is successfully received by the TAS5733L device. For I²C sequential-write transactions, the subaddress then serves as the start address, and the amount of data subsequently transmitted before a stop or start is transmitted determines how many subaddresses are written. As was true for random addressing, sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted; only the incomplete data is discarded.
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