20-W STEREO DIGITAL AUDIO POWER AMPLIFIER WITH EQ AND DRC
Check for Samples: TAS5707 TAS5707A
1
FEATURES
23
•Audio Input/Output
– 20-W Into an 8-Ω Load From an 18-V Supply– Autobank Switching: Preload Coefficients
– Wide PVDD Range, From 8 V to 26 V
– Efficient Class-D Operation Eliminates
Need for Heatsinks
– Requires Only 3.3 V and PVDD
– One Serial Audio Input (Two Audio
Channels)
– Supports 8-kHz to 48-kHz Sample Rate
(LJ/RJ/I2S)
•Audio/PWM Processing
– Independent Channel Volume Controls With
24 dB to Mute
– Soft Mute (50% Duty Cycle)
– Programmable Dynamic Range Control
– 14 Programmable Biquads for Speaker EQ
and Other Audio Processing Features
– Programmable Coefficients for DRC Filters
– DC Blocking Filters
•General Features
– Serial Control Interface Operational Without
MCLKThe TAS5707 is a slave-only device receiving all
Be Used As Power Limiter. Enables
Speaker Protection, Easy Listening,
Night-Mode Listening
for Different Sample Rates. No Need to
Write New Coefficients to the Part When
Sample Rate Changes.
– Autodetect: Automatically Detects
Sample-Rate Changes. No Need for
External Microprocessor Intervention
APPLICATIONS
•Television
•iPod™ Dock
•Sound Bar
DESCRIPTION
The TAS5707 is a 20-W, efficient, digital-audio power
amplifier for driving stereo bridge-tied speakers. One
serial data input allows processing of up to two
discrete audio channels and seamless integration to
most digital audio processors and MPEG decoders.
The device accepts a wide range of input data and
data rates. A fully programmable data path routes
these channels to the internal speaker drivers.
clocks from external sources. The TAS5707 operates
with a PWM carrier between a 384-kHz switching rate
and 352-KHz switching rate, depending on the input
samplerate.Oversamplingcombinedwitha
fourth-order noise shaper provides a flat noise floor
and excellent dynamic range from 20 Hz to 20 kHz..
The TAS5707A is identical in function to the HTQFP
packaged TAS5707, but has a unique I2C device
address. The address of the TAS5707 is 0x36. The
address of the TAS5707A is 0x3A.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2iPod is a trademark of Apple Inc.
3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
AGND30PAnalog ground for power stage
AVDD13P3.3-V analog power supply
AVSS9PAnalog 3.3-V supply ground
BST_A4PHigh-side bootstrap supply for half-bridge A
BST_B43PHigh-side bootstrap supply for half-bridge B
BST_C42PHigh-side bootstrap supply for half-bridge C
BST_D33PHigh-side bootstrap supply for half-bridge D
DVDD27P3.3-V digital power supply
DVSSO17POscillator ground
DVSS28PDigital ground
FAULT14DOBackend error indicator. Asserted LOW for over temperature, over
GND29PAnalog ground for power stage
GVDD_OUT5, 32PGate drive internal regulator output
LRCLK20DI5-VPulldownInput serial audio data left/right clock (sample rate clock)
MCLK15DI5-VPulldownMaster clock input
NC8–No connection
OC_ADJ7AOAnalog overcurrent programming. Requires resistor to ground.
OSC_RES16AOOscillator trim resistor. Connect an 18.2-kΩ 1% resistor to DVSSO.
OUT_A1OOutput, half-bridge A
OUT_B46OOutput, half-bridge B
OUT_C39OOutput, half-bridge C
OUT_D36OOutput, half-bridge D
PDN19DI5-VPullupPower down, active-low. PDN prepares the device for loss of power
PGND_AB47, 48PPower ground for half-bridges A and B
PGND_CD37, 38PPower ground for half-bridges C and D
PLL_FLTM10AOPLL negative loop filter terminal
PLL_FLTP11AOPLL positive loop filter terminal
PVDD_A2, 3PPower supply input for half-bridge output A
PVDD_B44, 45PPower supply input for half-bridge output B
PVDD_C40, 41PPower supply input for half-bridge output C
PVDD_D34, 35PPower supply input for half-bridge output D
RESET25DI5-VPullupReset, active-low. A system reset is generated by applying a logic low
SCL24DI5-VI2C serial control clock input
SCLK21DI5-VPulldownSerial audio data clock (shift clock). SCLK is the serial audio port input
SDA23DIO5-VI2C serial control data interface input/output
SDIN22DI5-VPulldownSerial audio data input. SDIN supports three discrete (stereo) data
TYPE5-VTERMINATION
(1)
TOLERANT
(2)
DESCRIPTION
current, over voltage, and under voltage error conditions. De-asserted
upon recovery from error condition.
supplies by shutting down the noise shaper and initiating PWM stop
sequence.
to this pin. RESET is an asynchronous control signal that restores the
DAP to its default conditions, and places the PWM in the hard mute
state (tristated).
data bit clock.
formats.
(1) TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output
(2) All pullups are weak pullups and all pulldowns are weak pulldowns. The pullups and pulldowns are included to assure proper input logic
levels if the pins are left unconnected (pullups → logic 1 input; pulldowns → logic 0 input).
SSTIMER6AIControls ramp time of OUT_X to minimize pop. Leave this pin floating
STEST26DIFactory test pin. Connect directly to DVSS.
VR_ANA12PInternally regulated 1.8-V analog supply voltage. This pin must not be
VR_DIG18PInternally regulated 1.8-V digital supply voltage. This pin must not be
VREG31PDigital regulator output. Not to be used for powering external circuitry.
TYPE5-VTERMINATION
(1)
TOLERANT
(2)
DESCRIPTION
for BD mode. Requires capacitor of 2.2 nF to GND in AD mode. The
capacitor determines the ramp time.
used to power external devices.
used to power external devices.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
Supply voltage
Input voltage
OUT_x to PGND_X32
BST_x to PGND_X43
Input clamp current, I
Output clamp current, I
Operating free-air temperature0 to 85°C
Operating junction temperature range0 to 150°C
Storage temperature range, T
(1) Stresses beyond those listed under absolute ratings may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under recommended operation conditions are
not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability.
(2) 5-V tolerant inputs are PDN, RESET, SCLK, LRCLK, MCLK, SDIN, SDA, and SCL.
(3) Maximum pin voltage should not exceed 6.0Vele
(4) DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions.
DVDD, AVDD–0.3 to 3.6V
PVDD_X–0.3 to 30V
OC_ADJ–0.3 to 4.2V
3.3-V digital input–0.5 to DVDD + 0.5V
5-V tolerant
over recommended operating conditions (unless otherwise noted)
PARAMETERMINTYPMAXUNIT
f
SCLKIN
t
su1
t
h1
t
su2
t
h2
Frequency, SCLK 32 × fS, 48 × fS, 64 × f
S
Setup time, LRCLK to SCLK rising edge10ns
Hold time, LRCLK from SCLK rising edge10ns
Setup time, SDIN to SCLK rising edge10ns
Hold time, SDIN from SCLK rising edge10ns
LRCLK frequency84848kHz
SCLK duty cycle40%50%60%
LRCLK duty cycle40%50%60%
SCLK rising edges between LRCLK rising edges3264
t
(edge)
tr /ns
tf
(SCLK/LRCLK)
LRCLK clock edge with respect to the falling edge of SCLK–1/41/4
Timing characteristics for I2C Interface signals over recommended operating conditions (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAXUNIT
f
t
t
t
t
t
t
t
t
t
t
C
SCL
w(H)
w(L)
r
f
su1
h1
(buf)
su2
h2
su3
Frequency, SCLNo wait states400kHz
Pulse duration, SCL high0.6μs
Pulse duration, SCL low1.3μs
Rise time, SCL and SDA300ns
Fall time, SCL and SDA300ns
Setup time, SDA to SCL100ns
Hold time, SCL to SDA0ns
Bus free time between stop and start condition1.3μs
Setup time, SCL to start condition0.6μs
Hold time, start condition to SCL0.6μs
Setup time, SCL to stop condition0.6μs
Load capacitance for each bus line400pF
Control signal parameters over recommended operating conditions (unless otherwise noted). Please refer to Recommended
Use Model section on usage of all terminals.
PARAMETERMINTYPMAXUNIT
t
w(RESET)
t
d(I2C_ready)
NOTE: On power up, it is recommended that the TAS5707 RESET be held LOW for at least 100 μs after DVDD has reached
3.0 V
NOTE: If the RESET is asserted LOW while PDN is LOW, then the RESET must continue to be held LOW for at least 100 μs
after PDN is deasserted (HIGH).
Pulse duration, RESET active100us
Time to enable I2C13.5ms
Figure 5. Reset Timing
TYPICAL CHARACTERISTICS, BTL CONFIGURATION
TOTAL HARMONIC DISTORTION + NOISETOTAL HARMONIC DISTORTION + NOISE
To facilitate system design, the TAS5707 needs only a 3.3-V supply in addition to the (typical) 18-V power-stage
supply. An internal voltage regulator provides suitable voltage levels for the gate drive circuitry. Additionally, all
circuitry requiring a floating voltage supply, e.g., the high-side gate drive, is accommodated by built-in bootstrap
circuitry requiring only a few external capacitors.
In order to provide good electrical and acoustical characteristics, the PWM signal path for the output stage is
designed as identical, independent half-bridges. For this reason, each half-bridge has separate bootstrap pins
(BST_X), and power-stage supply pins (PVDD_X). The gate drive voltages (GVDD_AB and GVDD_CD) are
derived from the PVDD voltage. Special attention should be paid to placing all decoupling capacitors as close to
their associated pins as possible. In general, inductance between the power-supply pins and decoupling
capacitors must be avoided.
For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin
(BST_X) to the power-stage output pin (OUT_X). When the power-stage output is low, the bootstrap capacitor is
charged through an internal diode connected between the gate-drive regulator output pin (GVDD_X) and the
bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output
potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM
switching frequencies in the range from 352 kHz to 384 kHz, it is recommended to use 33-nF ceramic capacitors,
size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even
during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the
remaining part of the PWM cycle.
Special attention should be paid to the power-stage power supply; this includes component selection, PCB
placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_X). For
optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_X pin is
decoupled with a 100-nF ceramic capacitor placed as close as possible to each supply pin.
The TAS5707 is fully protected against erroneous power-stage turnon due to parasitic gate charging.
ERROR REPORTING
Any fault resulting in device shutdown is signaled by the FAULT pin going low (see Table 1). A sticky version of
this pin is available on D1 of register 0X02.
Table 1. FAULT Output States
FAULTDESCRIPTION
0Overcurrent (OC) or undervoltage (UVP) error or overtemperature error (OTE) or over
1No faults (normal operation)
voltage ERROR
DEVICE PROTECTION SYSTEM
Overcurrent (OC) Protection With Current Limiting
The device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The
detector outputs are closely monitored by two protection systems. The first protection system controls the power
stage in order to prevent the output current further increasing, i.e., it performs a cycle-by-cycle current-limiting
function, rather than prematurely shutting down during combinations of high-level music transients and extreme
speaker load impedance drops. If the high-current condition situation persists, i.e., the power stage is being
overloaded, a second protection system triggers a latching shutdown, resulting in the power stage being set in
the high-impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short
circuit on the output) is removed. Current limiting and overcurrent protection are not independent for half-bridges.
That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C,
and D are shut down.
The TAS5707 has a two-level temperature-protection system that asserts an active-high warning signal (OTW)
when the device junction temperature exceeds 125°C (nominal) and, if the device junction temperature exceeds
150°C (nominal), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the
high-impedance (Hi-Z) state and FAULT being asserted low. The TAS5707 recovers from shutdown
automatically once the temperature drops approximately 30°C. The overtemperature warning (OTW) is disabled
once the temperature drops approximately 25°C.
Undervoltage Protection (UVP) and Power-On
Reset (POR)
The UVP and POR circuits of the TAS5707 fully protect the device in any power-up/down and brownout situation.
While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully
operational when the PVDD and AVDD supply voltages reach 7.6 V and 2.7 V, respectively. Although PVDD and
AVDD are independently monitored, a supply voltage drop below the UVP threshold on AVDD or either PVDD
pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z) state and FAULT being
asserted low.
SSTIMER FUNCTIONALITY
The SSTIMER pin uses a capacitor connected between this pin and ground to control the output duty cycle when
exiting all-channel shutdown. The capacitor on the SSTIMER pin is slowly charged through an internal current
source, and the charge time determines the rate at which the output transitions from a near zero duty cycle to the
desired duty cycle. This allows for a smooth transition that minimizes audible pops and clicks. When the part is
shutdown the drivers are tristated and transition slowly down through a 3K resistor, similarly minimizing pops and
clicks. The shutdown transition time is independent of SSTIMER pin capacitance. Larger capacitors will increase
the start-up time, while capacitors smaller than 2.2 nF will decrease the start-up time. The SSTIMER pin should
be left floating for BD modulation.
CLOCK, AUTO DETECTION, AND PLL
The TAS5707 is a slave device. It accepts MCLK, SCLK, and LRCLK. The digital audio processor (DAP)
supports all the sample rates and MCLK rates that are defined in the clock control register .
The TAS5707 checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 ×
fSLRCLK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section
uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the
internal clock (DCLK) running at 512 time the PWM switching frequency.
The DAP can autodetect and set the internal clock control logic to the appropriate settings for all supported clock
rates as defined in the clock control register.
TAS5707 has robust clock error handling that uses the bulit-in trimmed oscillator clock to quickly detect
changes/errors. Once the system detects a clock change/error, it will mute the audio (through a single step mute)
and then force PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the
system will auto detect the new rate and revert to normal operation. During this process, the default volume will
be restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back
slowly (also called soft unmute) as defined in volume register (0X0E).
SERIAL DATA INTERFACE
Serial data is input on SDIN. The PWM outputs are derived from SDIN. The TAS5707 DAP accepts serial data in
16-, 20-, or 24-bit left-justified, right-justified, and I2S serial data formats.
PWM Section
The TAS5707 DAP device uses noise-shaping and sophisticated non-linear correction algorithms to achieve high
power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to
increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP
and outputs two BTL PWM audio output channels.
The PWM section has individual channel dc blocking filters that can be enabled and disabled. The filter cutoff
frequency is less than 1 Hz. Individual channel de-emphasis filters for 44.1- and 48-kHz are included and can be
enabled and disabled.
Finally, the PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%.
For detailed description of using audio processing features like DRC and EQ, please refer to User's Guide and
TAS570X GDE software development tool documentation. Also refer to GDE software development tool for
device data path.
I2C COMPATIBLE SERIAL CONTROL INTERFACE
The TAS5707 DAP has an I2C serial control slave interface to receive commands from a system controller. The
serial control interface supports both normal-speed (100-kHz) and high-speed (400-kHz) operations without wait
states. As an added feature, this interface operates even if MCLK is absent.
The serial control interface supports both single-byte and multi-byte read and write operations for status registers
and the general control registers associated with the PWM.
SERIAL INTERFACE CONTROL AND TIMING
I2S Timing
I2S timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the
right channel. LRCLK is low for the left channel and high for the right channel. A bit clock running at 32, 48, or
64 × fSis used to clock in the data. There is a delay of one bit clock from the time the LRCLK signal changes
state to the first bit of data on the data lines. The data is written MSB first and is valid on the rising edge of bit
clock. The DAP masks unused trailing data bit positions.
NOTE: All data presented in 2s-complement form with MSB first.
Left-justified (LJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it
is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32,
48, or 64 × fSis used to clock in the data. The first bit of data appears on the data lines at the same time LRCLK
toggles. The data is written MSB first and is valid on the rising edge of the bit clock. The DAP masks unused
trailing data bit positions.
NOTE: All data presented in 2s-complement form with MSB first.
Right-justified (RJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when
it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at
32, 48, or 64 × fSis used to clock in the data. The first bit of data appears on the data 8 bit-clock periods (for
24-bit data) after LRCLK toggles. In RJ mode the LSB of data is always clocked by the last bit clock before
LRCLK transitions. The data is written MSB first and is valid on the rising edge of bit clock. The DAP masks
unused leading data bit positions.
The TAS5707 DAP has a bidirectional I2C interface that compatible with the I2C (Inter IC) bus protocol and
supports both 100-kHz and 400-kHz data transfer rates for single and multiple byte write and read operations.
This is a slave only device that does not support a multimaster bus environment or wait state insertion. The
control interface is used to program the registers of the device and to read device status.
The DAP supports the standard-mode I2C bus operation (100 kHz maximum) and the fast I2C bus operation
(400 kHz maximum). The DAP performs all I2C operations without I2C wait cycles.
General I2C Operation
The I2C bus employs two signals; SDA (data) and SCL (clock), to communicate between integrated circuits in a
system. Data is transferred on the bus serially one bit at a time. The address and data can be transferred in byte
(8-bit) format, with the most significant bit (MSB) transferred first. In addition, each byte transferred on the bus is
acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master
device driving a start condition on the bus and ends with the master device driving a stop condition on the bus.
The bus uses transitions on the data pin (SDA) while the clock is high to indicate a start and stop conditions. A
high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data bit
transitions must occur within the low time of the clock period. These conditions are shown in Figure 26. The
master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another
device and then waits for an acknowledge condition. The TAS5707 holds SDA low during the acknowledge clock
period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence.
Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the
same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for
the SDA and SCL signals to set the high level for the bus.
There is no limit on the number of bytes that can be transmitted between start and stop conditions. When the last
word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is
shown in Figure 26.
The 7-bit address for TAS5707 is 0011 011 (0x36). The 7-bit address for the TAS5707A is 0011 101 (0x3A).
The TAS5707 address can be changed from 0x36 to 0x38 by writing 0x38 to device slave address register 0xF9.
The TAS5707A address can be changed from 0x3A to 0x3C by writing 0x3C to device slave address register
0xF9.
Single- and Multiple-Byte Transfers
The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses
0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only
multiple-byte read/write operations (in multiples of 4 bytes).
During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress
assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does
not contain 32 bits, the unused bits are read as logic 0.
During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes
that are required for each specific subaddress. For example, if a write command is received for a biquad
subaddress, the DAP expects to receive five 32-bit words. If fewer than five 32-bit data words have been
received when a stop command (or another start command) is received, the data received is discarded.
Supplying a subaddress for each subaddress transaction is referred to as random I2C addressing. The TAS5707
also supports sequential I2C addressing. For write transactions, if a subaddress is issued followed by data for
that subaddress and the 15 subaddresses that follow, a sequential I2C write transaction has taken place, and the
data for all 16 subaddresses is successfully received by the TAS5707. For I2C sequential write transactions, the
subaddress then serves as the start address, and the amount of data subsequently transmitted, before a stop or
start is transmitted, determines how many subaddresses are written. As was true for random addressing,
sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to
the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted;
only the incomplete data is discarded.
Single-Byte Write
As shown in Figure 27, a single-byte data write transfer begins with the master device transmitting a start
condition followed by the I2C device address and the read/write bit. The read/write bit determines the direction of
the data transfer. For a write data transfer, the read/write bit will be a 0. After receiving the correct I2C device
address and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the
address byte or bytes corresponding to the TAS5707 internal memory address being accessed. After receiving
the address byte, the TAS5707 again responds with an acknowledge bit. Next, the master device transmits the
data byte to be written to the memory address being accessed. After receiving the data byte, the TAS5707 again
responds with an acknowledge bit. Finally, the master device transmits a stop condition to complete the
single-byte data write transfer.
Multiple-Byte Write
A multiple-byte data write transfer is identical to a single-byte data write transfer except that multiple data bytes
are transmitted by the master device to the DAP as shown in Figure 28. After receiving each data byte, the
TAS5707 responds with an acknowledge bit.
As shown in Figure 29, a single-byte data read transfer begins with the master device transmitting a start
condition followed by the I2C device address and the read/write bit. For the data read transfer, both a write
followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal
memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5707 address
and the read/write bit, TAS5707 responds with an acknowledge bit. In addition, after sending the internal memory
address byte or bytes, the master device transmits another start condition followed by the TAS5707 address and
the read/write bit again. This time the read/write bit becomes a 1, indicating a read transfer. After receiving the
address and the read/write bit, the TAS5707 again responds with an acknowledge bit. Next, the TAS5707
transmits the data byte from the memory address being read. After receiving the data byte, the master device
transmits a not acknowledge followed by a stop condition to complete the single byte data read transfer.
Figure 29. Single-Byte Read Transfer
Multiple-Byte Read
A multiple-byte data read transfer is identical to a single-byte data read transfer except that multiple data bytes
are transmitted by the TAS5707 to the master device as shown in Figure 30. Except for the last data byte, the
master device responds with an acknowledge bit after receiving each data byte.
The DRC scheme has a single threshold, offset, and slope (all programmable). There is one ganged DRC for the
left/right channels.
The DRC input/output diagram is shown in Figure 31.
Professional-quality dynamic range compression automatically adjusts volume to flatten volume level.
• One DRC for left/right
• The DRC has adjustable threshold, offset, and compression levels
• Programmable energy, attack, and decay time constants
• Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging,
and decay times can be set slow enough to avoid pumping.
The TAS5707 uses an approach called bank switching together with automatic sample-rate detection. All
processing features that must be changed for different sample rates are stored internally in three banks. The
user can program which sample rates map to each bank. By default, bank 1 is used in 32kHz mode, bank 2 is
used in 44.1/48 kHz mode, and bank 3 is used for all other rates. Combined with the clock-rate autodetection
feature, bank switching allows the TAS5707 to detect automatically a change in the input sample rate and switch
to the appropriate bank without any MCU intervention.
An external controller configures bankable locations (0x29-0x36 and 0x3A-0x3C) for all three banks during the
initialization sequence.
If auto bank switching is enabled (register 0x50, bits 2:0) , then the TAS5707 automatically swaps the coefficients
for subsequent sample rate changes, avoiding the need for any external controller intervention for a sample rate
change.
By default, bits 2:0 have the value 000; indicating that bank switching is disabled. In that state, updates to
bankable locations take immediate effect. A write to register 0x50 with bits 2:0 being 001, 010, or 011 brings the
system into the coefficient-bank-update state update bank1, update bank2, or update bank3, respectively. Any
subsequent write to bankable locations updates the coefficient banks stored outside the DAP. After updating all
the three banks, the system controller should issue a write to register 0x50 with bits 2:0 being 100; this changes
the system state to automatic bank switching mode. In automatic bank switching mode, the TAS5707
automatically swaps banks based on the sample rate.
Command sequences for updating DAP coefficients can be summarized as follows:
1. Bank switching disabled (default): DAP coefficient writes take immediate effect and are not
influenced by subsequent sample rate changes.
OR
Bank switching enabled:
(a) Update bank-1 mode: Write "001" to bits 2:0 of reg 0x50. Load the 32 kHz coefficients.
(b) Update bank-2 mode: Write "010" to bits 2:0 of reg 0x50. Load the 48 kHz coefficients.
(c) Update bank-3 mode: Write "011" to bits 2:0 of reg 0x50. Load the other coefficients.
(d) Enable automatic bank switching by writing "100" to bits 2:0 of reg 0x50.
26-Bit 3.23 Number Format
All mixer gain coefficients are 26-bit coefficients using a 3.23 number format. Numbers formatted as 3.23
numbers means that there are 3 bits to the left of the decimal point and 23 bits to the right of the decimal point.
This is shown in Figure 33 .
The decimal value of a 3.23 format number can be found by following the weighting shown in Figure 33. If the
most significant bit is logic 0, the number is a positive number, and the weighting shown yields the correct
number. If the most significant bit is a logic 1, then the number is a negative number. In this case every bit must
be inverted, a 1 added to the result, and then the weighting shown in Figure 34 applied to obtain the magnitude
of the negative number.
Figure 34. Conversion Weighting Factors—3.23 Format to Floating Point
Gain coefficients, entered via the I2C bus, must be entered as 32-bit binary numbers. The format of the 32-bit
number (4-byte or 8-digit hexadecimal number) is shown in Figure 35
Figure 35. Alignment of 3.23 Coefficient in 32-Bit I2C Word
The DAP has two groups of commands. One set is for configuration and is intended for use only during
initialization. The other set has built-in click and pop protection and may be used during normal operation while
audio is streaming. The following supported command sequences illustrate how to initialize, operate, and
shutdown the device.
Initialization Sequence
Use the following sequence to power-up and initialize the device:
1.Hold all digital inputs low and ramp up AVDD/DVDD to at least 3V.
2.Initialize digital inputs and PVDD supply as follows:
•Drive RESETZ=0, PDNZ=1, and other digital inputs to their desired state while ensuring that
all are never more than 2.5V above AVDD/DVDD. Provide stable and valid I2S clocks
(MCLK, LRCLK, and SCLK). Wait at least 100us, drive RESETZ=1, and wait at least another
13.5ms.
•Ramp up PVDD to at least 8V while ensuring that it remains below 6V for at least 100us after
AVDD/DVDD reaches 3V. Then wait at least another 10us.
3.Trim oscillator (write 0x00 to register 0x1B) and wait at least 50ms.
4.Configure the DAP via I2C (see Users's Guide for typical values):
Biquads (0x29-36)
DRC parameters (0x3A-3C, 0x40-42, and 0x46)
Bank select (0x50)
The following are the only events supported during normal operation:
(a) Writes to master/channel volume registers
(b) Writes to soft mute register
(c) Enter and exit shutdown (sequence defined below)
(d) Clock errors and rate changes
Note: Events (c) and (d) are not supported for 240ms+1.3*Tstart after trim following AVDD/DVDD powerup
ramp (where Tstart is specified by register 0x1A).
Shutdown Sequence
Enter:
1.Ensure I2S clocks have been stable and valid for at least 50ms.
2.Write 0x40 to register 0x05.
3.Wait at least 1ms+1.3*Tstop (where Tstop is specified by register 0x1A).
4.Once in shutdown, stable clocks are not required while device remains idle.
5.If desired, reconfigure by ensuring that clocks have been stable and valid for at least 50ms before
returning to step 4 of initialization sequence.
Exit:
1.Ensure I2S clocks have been stable and valid for at least 50ms.
2.Write 0x00 to register 0x05 (exit shutdown command may not be serviced for as much as 240ms
after trim following AVDD/DVDD powerup ramp).
3.Wait at least 1ms+1.3*Tstart (where Tstart is specified by register 0x1A).
4.Proceed with normal operation.
Powerdown Sequence
Use the following sequence to powerdown the device and its supplies:
1.If time permits, enter shutdown (sequence defined above); else, in case of sudden power loss,
assert PDNZ=0 and wait at least 2ms.
2.Assert RESETZ=0.
3.Drive digital inputs low and ramp down PVDD supply as follows:
•Drive all digital inputs low after RESETZ has been low for at least 2us.
•Ramp down PVDD while ensuring that it remains above 8V until RESETZ has been low for at
least 2us.
4.Ramp down AVDD/DVDD while ensuring that it remains above 3V until PVDD is below 6V and
that it is never more than 2.5V below the digital inputs.
Table 4. Serial Control Interface Register Summary
SUBADDRESSREGISTER NAMECONTENTS
0x00Clock control register1Description shown in subsequent section0x6C
0x01Device ID register1Description shown in subsequent section0x70
0x02Error status register1Description shown in subsequent section0x00
0x03System control register 11Description shown in subsequent section0xA0
0x04Serial data interface1Description shown in subsequent section0x05
register
0x05System control register 21Description shown in subsequent section0x40
0x06Soft mute register1Description shown in subsequent section0x00
0x07Master volume1Description shown in subsequent section0xFF (mute)
0x08Channel 1 vol1Description shown in subsequent section0x30 (0 dB)
0x09Channel 2 vol1Description shown in subsequent section0x30 (0 dB)
0x0AFine master volume1Description shown in subsequent section0x00 (0 dB)
0x0B–0X0D1Reserved
0x0EVolume configuration1Description shown in subsequent section0x91
register
0x0F1Reserved
0x10Modulation limit register1Description shown in subsequent section0x02
0x11IC delay channel 11Description shown in subsequent section0xAC
0x12IC delay channel 21Description shown in subsequent section0x54
0x13IC delay channel 31Description shown in subsequent section0xAC
0x14IC delay channel 41Description shown in subsequent section0x54
0x15–0x191Reserved
0x1AStart/stop period register1Description shown in subsequent section0x0F
0x1BOscillator trim register1Description shown in subsequent section0x82
0x1CBKND_ERR register1Description shown in subsequent section0x02
0x1D–0x1F1Reserved
0x20Input MUX register4Description shown in subsequent section0x0001 7772
0x21-0X244Reserved
0x25PWM MUX register4Description shown in subsequent section0x0102 1345
0x46DRC control4Description shown in subsequent section0x0000 0000
0x47–0x4FReserved
0x50Bank switch control4Description shown in subsequent section0x0F70 8000
0x51–0xC9Reserved
0xCA8Reserved
0xCB–0xF8Reserved
0xF9
Update device address4New Dev Id[7:1], ZERO[0] (New Dev Id = 0x38),0x00000036
register(7:1) defines the new device address
0xFA-0xFFReserved
(2) Reserved registers should not be accessed.
(3) "ae" stands for µ of energy filter, "aa" stands for µ of attack filter and "ad" stands for µ of decay filter and 1- µ = ω.
The clocks and data rates are automatically determined by the TAS5707. The clock control register contains the
auto-detected clock status. Bits D7–D5 reflect the sample rate. Bits D4–D2 reflect the MCLK frequency. The
device accepts a 64-fSor 32-fSSCLK rate for all MCLK rates, but accepts a 48-fSSCLK rate for MCLK rates of
192 fSand 384 fSonly.
Table 5. Clock Control Register (0x00)
D7D6D5D4D3D2D1D0FUNCTION
000–––––fS= 32-kHz sample rate
001–––––Reserved
010–––––Reserved
011–––––fS= 44.1/48-kHz sample rate
100–––––fs = 16-kHz sample rate
101–––––fs = 22.05/24 -kHz sample rate
110–––––fs = 8-kHz sample rate
111–––––fs = 11.025/12 -kHz sample rate
–––000––MCLK frequency = 64 × f
–––001––MCLK frequency = 128 × f
–––010––MCLK frequency = 192 × f
–––011––MCLK frequency = 256 × f
–––100––MCLK frequency = 384 × f
–––101––MCLK frequency = 512 × f
–––110––Reserved
–––111––Reserved
––––––0–Reserved
–––––––0Reserved
(1) Reserved registers should not be accessed.
(2) Default values are in bold.
(3) Only available for 44.1 kHz and 48 kHz rates.
(4) Rate only available for 32/44.1/48 KHz sample rates
(5) Not available at 8 kHz
(1)
(1)
(2)
(3)
S
(3)
S
(4)
S
(2) (5)
S
S
(1)
(1)
(1)
(1)
S
DEVICE ID REGISTER (0x01)
The device ID register contains the ID code for the firmware revision.
The error bits are sticky and are not cleared by the hardware. This means that the software must clear the
register (write zeroes) and then read them to determine if they are persistent errors.
Error Definitions:
•MCLK Error : MCLK frequency is changing. The number of MCLKs per LRCLK is changing.
•SCLK Error: The number of SCLKs per LRCLK is changing.
•LRCLK Error: LRCLK frequency is changing.
•Frame Slip: LRCLK phase is drifting with respect to internal frame sync.
This register can be used to provide precision tuning of master volume.
Table 13. Master Fine Volume Register (0x0A)
D7D6D5 D4D3D2D1D0FUNCTION
––––––000 dB
––––––010.125 dB
––––––100.25 dB
––––––110.375 dB
1–––––––Write enable bit
0–––––––Ignore Write to register 0X0A
(1) Default values are in bold.
(1)
VOLUME CONFIGURATION REGISTER (0x0E)
BitsVolume slew rate (Used to control volume change and MUTE ramp rates). These bits control the
D2–D0:number of steps in a volume ramp.Volume steps occur at a rate that depends on the sample rate of
the I2S data as follows
Sample Rate (KHz)Approximate Ramp Rate
8/16/32125 us/step
–––––000Volume slew 512 steps (43 ms volume ramp time at 48kHz)
–––––001Volume slew 1024 steps (85 ms volume ramp time at 48kHz)
–––––010Volume slew 2048 steps (171 ms volume ramp time at 48kHz)
–––––011Volume slew 256 steps (21ms volume ramp time at 48kHz)
–––––1XXReserved
0x11101011––Default value for channel 1
0x12010101––Default value for channel 2
0x13101011––Default value for channel 1
0x14010101––Default value for channel 2
(1) Default values are in bold.
(1)
(1)
(1)
(1)
ICD settings have high impact on audio performance (e.g., dynamic range, THD, crosstalk etc.) Therefore,
appropriate ICD settings must be used. By default, the device has ICD settings for AD mode. If used in BD
mode, then update these registers before coming out of all-channel shutdown.
This register is used to control the soft-start and soft-stop period following an enter/exit all channel shut down
command or change in the PDN state. This helps reduce pops and clicks at start-up and shutdown.The times are
only approximate and vary depending on device activity level and I2S clock stability.
Table 17. Start/Stop Period Register (0x1A)
D7D6D5 D4D3D2D1D0FUNCTION
000–––––Reserved
–––00–––No 50% duty cycle start/stop period
–––0100016.5-ms 50% duty cycle start/stop period
–––0100123.9-ms 50% duty cycle start/stop period
–––0101031.4-ms 50% duty cycle start/stop period
–––0101140.4-ms 50% duty cycle start/stop period
–––0110053.9-ms 50% duty cycle start/stop period
–––0110170.3-ms 50% duty cycle start/stop period
–––0111094.2-ms 50% duty cycle start/stop period
–––01111125.7-ms 50% duty cycle start/stop period
–––10000164.6-ms 50% duty cycle start/stop period
–––10001239.4-ms 50% duty cycle start/stop period
–––10010314.2-ms 50% duty cycle start/stop period
–––10011403.9-ms 50% duty cycle start/stop period
–––10100538.6-ms 50% duty cycle start/stop period
–––10101703.1-ms 50% duty cycle start/stop period
–––10110942.5-ms 50% duty cycle start/stop period
–––101111256.6-ms 50% duty cycle start/stop period
–––110001728.1-ms 50% duty cycle start/stop period
–––110012513.6-ms 50% duty cycle start/stop period
–––110103299.1-ms 50% duty cycle start/stop period
–––110114241.7-ms 50% duty cycle start/stop period
–––111005655.6-ms 50% duty cycle start/stop period
–––111017383.7-ms 50% duty cycle start/stop period
–––111109897.3-ms 50% duty cycle start/stop period
–––1111113,196.4-ms 50% duty cycle start/stop period
The TAS5707 PWM processor contains an internal oscillator to support autodetect of I2S clock rates. This
reduces system cost because an external reference is not required. Currently, TI recommends a reference
resistor value of 18.2 kΩ (1%). This should be connected between OSC_RES and DVSSO.
Writing 0X00 to reg 0X1B enables the trim that was programmed at the factory.
Note that trim must always be run following reset of the device.
Table 18. Oscillator Trim Register (0x1B)
D7D6D5D4 D3D2D1D0FUNCTION
1–––––––Reserved
–0––––––Oscillator trim not done (read-only)
–1––––––Oscillator trim done (read only)
––0000––Reserved
––––––0–Select factory trim (Write a 0 to select factory trim; default is 1.)
––––––1–Factory trim disabled
–––––––0Reserved
(1) Default values are in bold.
(1)
(1)
(1)
(1)
(1)
BKND_ERR REGISTER (0x1C)
When a back-end error signal is received from the internal power stage, the power stage is reset stopping all
PWM activity. Subsequently, the modulator waits approximately for the time listed in Table 19 before attempting
to re-start the power stage.
Table 19. BKND_ERR Register (0x1C)
D7D6D5 D4D3D2D1D0FUNCTION
0000000XReserved
––––0010Set back-end reset period to 299 ms
––––0011Set back-end reset period to 449 ms
––––0100Set back-end reset period to 598 ms
––––0101Set back-end reset period to 748 ms
––––0110Set back-end reset period to 898 ms
––––0111Set back-end reset period to 1047 ms
––––1000Set back-end reset period to 1197 ms
––––1001Set back-end reset period to 1346 ms
––––101XSet back-end reset period to 1496 ms
––––11XXSet back-end reset period to 1496 ms
(1) This register can be written only with a "non-Reserved" value. Also this register can be written once after the reset.
(2) Default values are in bold.
This register controls the modulation scheme (AD or BD mode) as well as the routing of I2S audio to the internal
channels.
Table 20. Input Multiplexer Register (0x20)
D31D30D29D28D27D26D25D24FUNCTION
00000000Reserved
D23D22D21D20D19D18D17D16FUNCTION
0–––––––Channel-1 AD mode
1–––––––Channel-1 BD mode
–000––––SDIN-L to channel 1
–001––––SDIN-R to channel 1
–010––––Reserved
–011––––Reserved
–100––––Reserved
–101––––Reserved
–110––––Ground (0) to channel 1
–111––––Reserved
––––0–––Channel 2 AD mode
––––1–––Channel 2 BD mode
–––––000SDIN-L to channel 2
–––––001SDIN-R to channel 2
–––––010Reserved
–––––011Reserved
–––––100Reserved
–––––101Reserved
–––––110Ground (0) to channel 2
–––––111Reserved
(1)
(1)
(1)
D15D14D13D12D11D10D9D8FUNCTION
01110111Reserved
D7D6D5D4D3D2D1D0FUNCTION
01110010Reserved
(1) Default values are in bold.
(1)
(1)
PWM OUTPUT MUX REGISTER (0x25)
This DAP output mux selects which internal PWM channel is output to the external pins. Any channel can be
output to any external output pin.
Bits D21–D20:Selects which PWM channel is output to OUT_A
Bits D17–D16:Selects which PWM channel is output to OUT_B
Bits D13–D12:Selects which PWM channel is output to OUT_C
Bits D09–D08:Selects which PWM channel is output to OUT_D
Note that channels are enclosed so that channel 1 = 0x00, channel 2 = 0x01, channet 1 = 0x02, and channel 2 =
0x03.
1–––––––32 kHz, uses bank 3
–0––––––Reserved
––0–––––Reserved
(1)
(1)
–––0––––44.1/48 kHz, does not use bank 3
–––1––––44.1/48 kHz, uses bank 3
––––0–––16 kHz, does not use bank 3
––––1–––16 kHz, uses bank 3
(1)
–––––0––22.025/24 kHz, does not use bank 3
–––––1––22.025/24 kHz, uses bank 3
––––––0–8 kHz, does not use bank 3
––––––1–8 kHz, uses bank 3
(1)
–––––––011.025 kHz/12, does not use bank 3
–––––––111.025/12 kHz, uses bank 3
D23D22D21D20D19D18D17D16FUNCTION
0–––––––32 kHz, does not use bank 2
1–––––––32 kHz, uses bank 2
–1––––––Reserved
––1–––––Reserved
(1)
(1)
–––0––––44.1/48 kHz, does not use bank 2
–––1––––44.1/48 kHz, uses bank 2
––––0–––16 kHz, does not use bank 2
––––1–––16 kHz, uses bank 2
–––––0––22.025/24 kHz, does not use bank 2
–––––1––22.025/24 kHz, uses bank 2
––––––0–8 kHz, does not use bank 2
––––––1–8 kHz, uses bank 2
–––––––011.025/12 kHz, does not use bank 2
–––––––111.025/12 kHz, uses bank 2
(1)
(1)
(1)
(1)
(1)
(1)
(1)
www.ti.com
(1)
(1)
(1)
D15D14D13D12D11D10D9D8FUNCTION
0–––––––32 kHz, does not use bank 1
1–––––––32 kHz, uses bank 1
–0––––––Reserved
––0–––––Reserved
–––0––––44.1/48 kHz, does not use bank 1
–––1––––44.1/48 kHz, uses bank 1
––––0–––16 kHz, does not use bank 1
––––1–––16 kHz, uses bank 1
–––––0––22.025/24 kHz, does not use bank 1
–––––1––22.025/24 kHz, uses bank 1
––––––0–8 kHz, does not use bank 1
––––––1–8 kHz, uses bank 1
–––––––011.025/12 kHz, does not use bank 1
–––––––111.025/12 kHz, uses bank 1
1–––––––EQ OFF (bypass BQ 0-6 of channels 1 and 2)
–0––––––Reserved
––0–––––Ignore bank-mapping in bits D31–D8.Use default mapping.
1Use bank-mapping in bits D31–D8.
–––0––––L and R can be written independently.
–––1––––
L and R are ganged for EQ biquads; a write to Left channel BQ is
also written to Right channel BQ. (0X29-2F is ganged to 0X30-0X36).
––––0–––Reserved
–––––000No bank switching. All updates to DAP
–––––001Configure bank 1 (32 kHz by default)
–––––010Configure bank 2 (44.1/48 kHz by default)
–––––011Configure bank 3 (other sample rates by default)
–––––100Automatic bank selection
–––––101Reserved
–––––11XReserved
Changes from Revision A (November 2008) to Revision BPage
•Added TAS5707A device to data sheet ................................................................................................................................ 1
•Changed PVDD maximum voltage to 26 V in Features ....................................................................................................... 1
•Inserted paragraph on TAS5707A into Description section .................................................................................................. 1
•Changed PVDD maximum voltage to 26 V in simplified application diagram ...................................................................... 2
•Changed PVDD maximum voltage to 26 V in recommended operating conditions ............................................................. 7
•Added AVDD to output voltage test conditions ..................................................................................................................... 9
•Added rows to Electrical Characteristics fro OTW and OTW ............................................................................................... 9
•Changed OLPC typical value to 0.63 ms. ............................................................................................................................. 9
•Replaced text of Overtemperature Protection section ........................................................................................................ 18
•Added address information for the TAS5707A ................................................................................................................... 25
•Revised Sample Calculation for 3.23 Format table ............................................................................................................ 30
•Added 0xCA row to Register Summary table ..................................................................................................................... 36
•Revised 0xF9 row of Register Summary table ................................................................................................................... 36
•Corrected temperature from 145°C to 125°C ..................................................................................................................... 38
•Changed de-emphasis settings in register 0x03 table ........................................................................................................ 38
•Added text to Modulationi Limit Register section ................................................................................................................ 43
•Added text to the DRC Control section ............................................................................................................................... 47
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
PACKAGE OPTION ADDENDUM
www.ti.com
9-Sep-2014
Addendum-Page 2
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