ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Typical V
< 0.8 V at V
D
Typical V
> 2 V at V
D
Inputs Accept Voltages to 5.5 V
D
Package Options Include Plastic
(Output Ground Bounce)
OLP
= 3.3 V, TA = 25°C
CC
(Output VOH Undershoot)
OHV
= 3.3 V, TA = 25°C
CC
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), and
Thin Shrink Small-Outline (PW) Packages,
Ceramic Flat (W) Package, Ceramic Chip
Carriers (FK), and DIPs (J)
description
The SN54LVC86A quadruple 2-input
exclusive-OR gate is designed for 2.7-V to 3.6-V
V
operation and the SN74LVC86A quadruple
CC
2-input exclusive-OR gate is designed for 1.65-V
to 3.6-V V
The ’LVC86A devices perform the Boolean
function Y = A ⊕ B or Y = A
operation.
CC
B + AB in positive logic.
SN54LVC86A...J OR W PACKAGE
SN74LVC86A. . . D, DB, DGV, OR PW PACKAGE
SN54LVC86A. . . FK PACKAGE
1Y
NC
2A
NC
2B
NC – No internal connection
(TOP VIEW)
1A
1B
1Y
2A
2B
2Y
GND
(TOP VIEW)
1B1ANC
3212019
4
5
6
7
8
910111213
2Y
1
2
3
4
5
6
7
GND
NC
14
13
12
11
10
9
8
CC
V
3Y
V
4B
4A
4Y
3B
3A
3Y
4B
18
17
16
15
14
3A
CC
4A
NC
4Y
NC
3B
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced
in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at
the output.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
The SN54L VC86A is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74LVC86A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each gate)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
INPUTS
AB
LLL
LHH
HLH
HHL
OUTPUT
Y
Copyright 1998, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, DB, DGV , J, PW, and W packages.
†
1A
1B
2A
2B
3A
3B
4A
4B
1
2
4
5
9
10
12
13
= 1
3
1Y
6
2Y
8
3Y
11
4Y
exclusive-OR logic
An exclusive-OR gate has many applications, some of which can be represented better by alternative logic
symbols.
EXCLUSIVE OR
= 1
These five equivalent exclusive-OR symbols are valid for an SN74LVC86A gate in positive logic; negation may be shown at any two ports.
LOGIC-IDENTITY ELEMENTEVEN-PARITY ELEMENTODD-PARITY ELEMENT
=2k2k + 1
The output is active (low) if
all inputs stand at the same
logic level (i.e., A = B).
The output is active (low) if
an even number of inputs
(i.e., 0 or 2) are active.
The output is active (high) if
an odd number of inputs
(i.e., only 1 of the 2) are
active.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Storage temperature range, T
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The value of VCC is provided in the recommended operating conditions table.
3. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
High-level input voltage
IH
Low-level input voltage
IL
Input voltage05.505.5V
I
Output voltage0V
O
p
p
Operating free-air temperature–55125–4085°C
A
Implications of Slow or Floating CMOS Inputs
Operating23.61.653.6
Data retention only1.51.5
VCC = 1.65 V to 1.95 V0.65 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V22
VCC = 1.65 V to 1.95 V0.35 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V0.80.8
VI = 5.5 V or GND3.6 V±5±5µA
VI = VCC or GND,IO = 03.6 V1010µA
One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = VCC or GND3.3 V55pF
CC
1.65 V to 3.6 VVCC–0.2
2.7 V to 3.6 VVCC–0.2
2.7 V2.22.2
3 V2.42.4
1.65 V to 3.6 V0.2
2.7 V to 3.6 V0.2
2.7 V to 3.6 V500500µA
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figure 3)
SN54LVC86A
PARAMETER
t
pd
FROM
(INPUT)
AY5.614.6ns
TO
(OUTPUT)
VCC = 2.7 V
MINMAXMINMAX
VCC = 3.3 V
± 0.3 V
UNIT
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
SN74LVC86A
PARAMETER
t
pd
‡
t
sk(o)
‡
Skew between any two outputs of the same package switching in the same direction
operating characteristics, T
C
Power dissipation capacitance per gatef = 10 MHz6.57.58.5pF
pd
FROM
(INPUT)
AY13.617.65.614.6ns
= 25°C
A
TO
(OUTPUT)
VCC = 1.8 V
TYPMINMAXMINMAXMINMAX
TEST
CONDITIONS
VCC = 2.5 V
± 0.2 V
VCC = 1.8 VVCC = 2.5 VVCC = 3.3 V
TYPTYPTYP
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
UNIT
1ns
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 30 pF
(see Note A)
SN54LVC86A, SN74LVC86A
QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES
SCAS288I – JANUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
= 1.8 V ± 0.15 V
V
CC
2 × V
Open
GND
CC
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
1 kΩ
1 kΩ
S1
Open
2 × V
Open
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54LVC86A, SN74LVC86A
QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES
SCAS288I – JANUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.7 V AND 3.3 V ± 0.3 V
CC
From Output
Under Test
CL = 50 pF
(see Note A)
Timing
Input
Data
Input
Input
t
PLH
Output
500 Ω
500 Ω
LOAD CIRCUIT
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
h
S1
t
PHL
6 V
GND
Open
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
OH
V
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
w
t
1.5 V
t
1.5 V
Open
6 V
GND
1.5 V1.5 V
PLZ
PHZ
VOL + 0.3 V
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤2.5 ns, tf ≤2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
.
Figure 3. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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