Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), Standard Plastic (N) and
Ceramic (J) 300-mil DIPs, and Ceramic Flat
(W) Packages
description
These octal D-type transparent latches feature
3-state outputs designed specifically for driving
highly capacitive or relatively low-impedance
loads. They are particularly suitable for
implementing buffer registers, I/O ports,
bidirectional bus drivers, and working registers.
While the latch-enable (LE) input is high, outputs
(Q) respond to the data (D) inputs. When LE is low,
the outputs are latched to retain the data that was
set up.
A buffered output-enable (OE
to place the eight outputs in either a normal logic
state (high or low) or a high-impedance state. In
the high-impedance state, the outputs neither load
nor drive the bus lines significantly. The
high-impedance state and the increased drive
provide the capability to drive bus lines without
interface or pullup components.
) input can be used
SN54ALS573C, SN54AS573A ...J OR W PACKAGE
SN74ALS573C, SN74AS573A . . . DW OR N PACKAGE
SN54ALS573C, SN54AS573A . . . FK PACKAGE
3D
4D
5D
6D
7D
(TOP VIEW)
OE
1
1D
2
2D
3
3D
4
4D
5
5D
6
6D
7
7D
8
9
8D
GND
10
(TOP VIEW)
2D1DOE
3212019
4
5
6
7
8
910111213
8D
LE
20
19
18
17
16
15
14
13
12
11
V
8Q
CC
V
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
LE
18
17
16
15
14
7Q1Q
CC
2Q
3Q
4Q
5Q
6Q
GND
OE
does not affect internal operation of the
latches. Old data can be retained or new data can
be entered while the outputs are in the
high-impedance state.
The SN54ALS573C and SN54AS573A are characterized for operation over the full military temperature range
of –55°C to 125°C. The SN74ALS573C and SN74AS573A are characterized for operation from 0°C to 70°C.
FUNCTION TABLE
(each latch)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
INPUTS
OELED
LHHH
LHL L
LLX Q
HXX Z
OUTPUT
Q
0
Copyright 1995, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54ALS573C, SN54AS573A, SN74ALS573C, SN74AS573A
UNIT
OCTAL D-TYPE TRANSPARENT LATCHES
WITH 3-STATE OUTPUTS
SDAS048D – DECEMBER 1989 – REVISED JANUARY 1995
logic symbol
OE
LE
1D
2D
3D
4D
5D
6D
7D
8D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
†
1
11
2
3
4
5
6
7
8
9
EN
C1
1D
19
18
17
16
15
14
13
12
logic diagram (positive logic)
1
OE
11
LE
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
1D
2
To Seven Other Channels
C1
1D
19
1Q
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Supply voltage4.555.54.555.5V
High-level input voltage22V
Low-level input voltage0.70.8V
High-level output current–1–2.6mA
Low-level output current1224mA
Pulse duration, LE high2510ns
Setup time, data before LE↓1010ns
Hold time, data after LE↓77ns
Operating free-air temperature–55125070°C
SN54ALS573CSN74ALS573C
MINNOMMAXMINNOMMAX
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS573C, SN54AS573A, SN74ALS573C, SN74AS573A
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
V
V
D
Q
ns
LE
Q
ns
OE
Q
ns
OE
Q
ns
OCTAL D-TYPE TRANSPARENT LATCHES
WITH 3-STATE OUTPUTS
SDAS048D – DECEMBER 1989 – REVISED JANUARY 1995
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54ALS573CSN74ALS573C
MIN TYP†MAXMIN TYP†MAX
V
IK
V
OH
OL
I
OZH
I
OZL
I
I
I
IH
I
IL
‡
I
O
I
CC
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
VCC = 4.5 V,II = –18 mA–1.2–1.2V
VCC = 4.5 V to 5.5 V,IOH = –0.4 mAVCC –2VCC –2
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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