3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
D
Members of the Texas Instruments
Widebus
D
State-of-the-Art Advanced BiCMOS
Family
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
D
Support Mixed-Mode Signal Operation
(5-V Input and Output Voltages With
3.3-V V
D
Support Unregulated Battery Operation
CC
)
Down to 2.7 V
D
Typical V
< 0.8 V at V
D
I
off
and Power-Up 3-State Support Hot
(Output Ground Bounce)
OLP
= 3.3 V, TA = 25°C
CC
Insertion
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
Flow-Through Architecture Optimizes PCB
Layout
D
Latch-Up Performance Exceeds 500 mA Per
JESD 17
D
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Package Options Include Plastic Shrink
Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
SN54LVTH16240. . . WD PACKAGE
SN74LVTH16240. . . DGG OR DL PACKAGE
1OE
1Y1
1Y2
GND
1Y3
1Y4
V
CC
2Y1
2Y2
GND
2Y3
2Y4
3Y1
3Y2
GND
3Y3
3Y4
V
CC
4Y1
4Y2
GND
4Y3
4Y4
4OE
(TOP VIEW)
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17
32
18
31
19
30
20
29
21
28
22
27
23
26
24
25
2OE
1A1
1A2
GND
1A3
1A4
V
CC
2A1
2A2
GND
2A3
2A4
3A1
3A2
GND
3A3
3A4
V
CC
4A1
4A2
GND
4A3
4A4
3OE
description
These 16-bit buffers/drivers are designed specifically for low-voltage (3.3-V) VCC operation, but with the
capability to provide a TTL interface to a 5-V system environment.
The ’LVTH16240 devices are designed specifically to improve both the performance and density of 3-state
memory address drivers, clock drivers, and bus-oriented receivers and transmitters.
The devices can be used as four 4-bit buffers, two 8-bit buffers, or one 16-bit buffer. The devices provide
inverting outputs and symmetrical active-low output-enable (OE
When V
is between 0 and 1.5 V , the devices are in the high-impedance state during power up or power down.
CC
However, to ensure the high-impedance state above 1.5 V, OE
the minimum value of the resistor is determined by the current-sinking capability of the driver.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
) inputs.
should be tied to VCC through a pullup resistor;
Copyright 1999, Texas Instruments Incorporated
1
SN54LVTH16240, SN74LVTH16240
3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
description (continued)
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
These devices are fully specified for hot-insertion applications using I
and power-up 3-state. The I
off
disables the outputs, preventing damaging current backflow through the devices when they are powered down.
The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down,
which prevents driver conflict.
The SN54L VTH16240 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74LVTH16240 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each 4-bit buffer)
logic symbol
INPUTS
OEA
LHL
LLH
HXZ
†
1
1OE
2OE
3OE
4OE
48
25
24
EN1
EN2
EN3
EN4
OUTPUT
Y
circuitry
off
47
1A1
46
1A2
44
1A3
43
1A4
41
2A1
40
2A2
38
2A3
37
2A4
36
3A1
35
3A2
33
3A3
32
3A4
30
4A1
29
4A2
27
4A3
26
4A4
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
11
12
13
14
11
12
13
14
16
17
19
20
22
23
2
1Y1
3
1Y2
5
1Y3
6
1Y4
8
2Y1
9
2Y2
2Y3
2Y4
3Y1
3Y2
3Y3
3Y4
4Y1
4Y2
4Y3
4Y4
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
SN54LVTH16240, SN74LVTH16240
3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
1OE
1A1
1A2
1A3
1A4
2OE
2A1
2A2
2A3
2A4
1
47
46
44
43
48
41
40
38
37
11
12
25
3OE
2
1Y1
3
1Y2
5
1Y3
6
1Y4
8
2Y1
9
2Y2
2Y3
2Y4
3A1
3A2
3A3
3A4
4OE
4A1
4A2
4A3
4A4
36
35
33
32
24
30
29
27
26
13
14
16
17
19
20
22
23
3Y1
3Y2
3Y3
3Y4
4Y1
4Y2
4Y3
4Y4
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high-impedance
or power-off state, V
Voltage range applied to any output in the high state, V
Current into any output in the low state, I
Current into any output in the high state, I
Input clamp current, I
Output clamp current, I
Package thermal impedance, θ
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. This current flows only when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
3 V
V
V
V
V
V
V
I
A
D
V
V
V
V
I
I(hold)
Data in uts
µA
V
CC
SN54LVTH16240, SN74LVTH16240
3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54LVTH16240SN74LVTH16240
MIN TYP†MAXMIN TYP†MAX
V
IK
OH
OL
I
I
off
I
OZH
I
OZL
I
OZPU
I
OZPD
I
CC
∆I
CC
C
i
C
o
∗ On products compliant to MIL-PRF-38535, this parameter is not production tested.
†
All typical values are at VCC = 3.3 V, TA = 25°C.
‡
This is the bus-hold maximum dynamic current. It is the minimum overdrive current required to switch the input from one state to another.
§
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54LVTH16240, SN74LVTH16240
A
Y
ns
OE
Y
ns
OE
Y
ns
3.3-V ABT 16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
SN54LVTH16240SN74LVTH16240
PARAMETER
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
†
All typical values are at VCC = 3.3 V, TA = 25°C.
FROM
(INPUT)
TO
(OUTPUT)
VCC = 3.3 V
± 0.3 V
MINMAXMINMAXMIN TYP†MAXMINMAX
13.64.112.23.54
13.64.112.73.54
14.25.112.644.9
1.14.64.81.22.64.44.6
1.94.75.223.44.55
1.94.44.523.24.24.2
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
0.50.5ns
UNIT
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
SN54LVTH16240, SN74LVTH16240
3.3-V ABT 16-BIT BUFFERS/DRIVERS
SCBS684C – MARCH 1997 – REVISED APRIL 1999
PARAMETER MEASUREMENT INFORMATION
6 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
PHL/tPLH
t
PLZ/tPZL
t
PHZ/tPZH
WITH 3-STATE OUTPUTS
Open
6 V
GND
LOAD CIRCUIT
t
w
Input
Input
Output
Output
INVERTING AND NONINVERTING OUTPUTS
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PLH
1.5 V1.5 V
t
PHL
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
t
PHL
t
PLH
2.7 V
0 V
V
OH
V
OL
V
OH
V
OL
2.7 V
0 V
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
t
h
1.5 V
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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