ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Support Mixed-Mode Signal Operation on
All Ports (5-V Input/Output Voltage With
3.3-V V
D
Bus Hold on Data Inputs Eliminates the
CC
)
Need for External Pullup/Pulldown
Resistors
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), and Thin Shrink Small-Outline (PW)
Packages, Ceramic Flat (W) Package,
Ceramic Chip Carriers (FK), and DIPs (J)
SN54LVCH245A...J OR W PACKAGE
SN74LVCH245A. . . DB, DW, OR PW PACKAGE
SN54LVCH245A. . . FK PACKAGE
A3
A4
A5
A6
A7
(TOP VIEW)
1
DIR
2
A1
3
A2
4
A3
5
A4
6
A5
7
A6
8
A7
9
A8
GND
10
(TOP VIEW)
A2A1DIR
3212019
4
5
6
7
8
10 11 12 13
9
20
19
18
17
16
15
14
13
12
11
V
CC
V
OE
B1
B2
B3
B4
B5
B6
B7
B8
18
17
16
15
14
CC
B1
B2
B3
B4
B5
B7
description
A8
GND
B8
B6OE
The SN54LVCH245A octal bus transceiver is designed for 2.7-V to 3.6-V VCC operation and the
SN74LVCH245A octal bus transceiver is designed for 1.65-V to 3.6-V V
operation.
CC
These devices are designed for asynchronous communication between data buses. These devices transmit
data from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the
direction-control (DIR) input. The output-enable (OE
) input can be used to disable the device so the buses are
effectively isolated.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
T o ensure the high-impedance state during power up or power down, OE
should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN54L VCH245A is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74LVCH245A is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
SN54LVCH245A, SN74LVCH245A
OPERATION
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCES008F – JULY 1995 - REVISED JUNE 1998
FUNCTION TABLE
INPUTS
OEDIR
LLB data to A bus
LHA data to B bus
HXIsolation
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
OE
DIR
A1
A2
A3
A4
A5
A6
A7
A8
19
1
2
3
4
5
6
7
8
9
G3
3 EN1 [BA]
3 EN2 [AB]
1
2
logic diagram (positive logic)
1
DIR
18
17
16
15
14
13
12
11
B1
B2
B3
B4
B5
B6
B7
B8
A1
19
OE
2
18
B1
To Seven Other Channels
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
UNIT
VCCSuppl
oltage
V
VOOutput voltage
V
IOHHigh-level output current
mA
IOLLow-level output current
mA
SN54LVCH245A, SN74LVCH245A
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCES008F – JULY 1995 - REVISED JUNE 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high-impedance or power-off state, V
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The value of VCC is provided in the recommended operating conditions table.
3. The package thermal impedance is calculated in accordance with JESD 51.
∆t/∆vInput transition rise or fall rate010010ns/V
T
NOTE 4: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
High-level input voltage
IH
Low-level input voltage
IL
Input voltage05.505.5V
I
p
p
p
Operating free-air temperature–55125–4085°C
A
Implications of Slow or Floating CMOS Inputs
Operating23.61.653.6
Data retention only1.51.5
VCC = 1.65 V to 1.95 V0.65 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V22
VCC = 1.65 V to 1.95 V0.35 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V0.80.8
VI or VO = 5.5 V0±10µA
VI = 0.58 V
VI = 1.07 V
VI = 0.7 V
VI = 1.7 V
VI = 0.8 V
VI = 2 V
VI = 0 to 3.6 V
VO = 0 to 5.5 V3.6 V±15±10µA
VI = VCC or GND
3.6 V ≤ VI ≤ 5.5 V
One input at VCC – 0.6 V,
Other inputs at
VCC or GND
§
#
1.65 V to 3.6 VVCC–0.2
2.7 V to 3.6 V VCC–0.2
2.7 V2.22.2
3 V2.42.4
1.65 V to 3.6 V0.2
2.7 V to 3.6 V0.2
3..6 V±500±500
=
O
2.7 V to 3.6 V500500µA
SN54LVCH245ASN74LVCH245A
MINTYP†MAXMINTYP†MAX
‡
‡
45
–45
7575
–75–75
1010
1010
V
µA
µ
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
CONDITIONS
C
d
f
pF
SN54LVCH245A, SN74LVCH245A
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCES008F – JULY 1995 - REVISED JUNE 1998
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figure 3)
SN54LVCH245A
PARAMETER
t
pd
t
en
t
dis
FROM
(INPUT)
A or BB or A817ns
OE
OE
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
PARAMETER
t
pd
t
en
t
dis
‡
t
sk(o)
†
This information was not available at the time of publication.
‡
Skew between any two outputs of the same package switching in the same direction
FROM
(INPUT)
A or BB or A††††7.31.56.3ns
OE
OE
TO
(OUTPUT)
A or B††††9.51.58.5ns
A or B††††8.51.77.5ns
VCC = 1.8 V
± 0.15 V
MINMAXMINMAXMINMAXMINMAX
TO
(OUTPUT)
A or B9.518.5ns
A or B8.517.5ns
SN74LVCH245A
VCC = 2.5 V
± 0.2 V
VCC = 2.7 V
MINMAXMINMAX
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
VCC = 3.3 V
± 0.3 V
1ns
UNIT
UNIT
operating characteristics, T
PARAMETER
Power dissipation capacitance
p
per transceiver
†
This information was not available at the time of publication.
= 25°C
A
Outputs enabled
Outputs disabled
TEST
= 10 MHz
VCC = 1.8 V
± 0.15 V
TYPTYPTYP
††47
††2
VCC = 2.5 V
± 0.2 V
VCC = 3.3 V
± 0.3 V
UNIT
p
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54LVCH245A, SN74LVCH245A
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCES008F – JULY 1995 - REVISED JUNE 1998
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 30 pF
(see Note A)
1k Ω
1k Ω
S1
= 1.8 V ± 0.15 V
V
CC
2 × V
CC
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
Open
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 30 pF
(see Note A)
SN54LVCH245A, SN74LVCH245A
OCTAL BUS TRANSCEIVERS
SCES008F – JULY 1995 - REVISED JUNE 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.5 V ± 0.2 V
CC
2 × V
500 Ω
500 Ω
S1
Open
GND
CC
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
WITH 3-STATE OUTPUTS
Open
2 × V
CC
GND
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54LVCH245A, SN74LVCH245A
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCES008F – JULY 1995 - REVISED JUNE 1998
PARAMETER MEASUREMENT INFORMATION
= 2.7 V AND 3.3 V ± 0.3 V
V
CC
From Output
Under Test
CL = 50 pF
(see Note A)
Timing
Input
Data
Input
Input
t
PLH
Output
500 Ω
500 Ω
LOAD CIRCUIT
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
h
S1
t
PHL
6 V
GND
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
V
Open
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
w
t
PLZ
1.5 V
t
PHZ
1.5 V
Open
6 V
GND
1.5 V1.5 V
VOL + 0.3 V
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2.5 ns, tf≤2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
Figure 3. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
.
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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