SN74LVC2G241 Dual Buffer and Driver With 3-State Outputs
1Features3Description
1
•Available in the Texas Instruments
NanoFree™ Package
•Supports 5-V VCCOperation
•Inputs Accept Voltages to 5.5 V
•Max tpdof 4.1 ns at 3.3 V
•Low Power Consumption, 10-µA Maximum I
CC
•±24-mA Output Drive at 3.3 V
•Typical V
(Output Ground Bounce)
OLP
<0.8 V at VCC= 3.3 V, TA= 25°C
•Typical V
(Output VOHUndershoot)
OHV
>2 V at VCC= 3.3 V, TA= 25°C
•I
Supports Live Insertion, Partial-Power-Down
off
Mode, and Back-Drive Protection
•Can Be Used as a Down Translator to Translate
Inputs From a Max of 5.5 V Down
to the VCCLevel
•Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
•ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
2Applications
•AV Receivers
•Blu-ray Players and Home Theaters
•DVD Recorders and Players
•Desktop or Notebook PCs
•Digital Radio or Internet Radio Players
•Digital Video Cameras (DVC)
•Embedded PCs
•GPS: Personal Navigation Devices
•Mobile Internet Devices
•Network Projector Front-Ends
•Portable Media Players
•Pro Audio Mixers
This dual buffer and line driver is designed for 1.65-V
to 5.5-V VCCoperation.
The SN74LVC2G241 device is designed specifically
to improve both the performance and density of 3state memory-address drivers, clock drivers, and busoriented receivers and transmitters.
NanoFreepackagetechnologyisamajor
breakthrough in IC packaging concepts, using the die
as the package.
The SN74LVC2G241 device is organized as two 1-bit
line drivers with separate output-enable (1OE, 2OE)
inputs. When 1OE is low and 2OE is high, the device
passes data from the A inputs to the Y outputs. When
1OE is high and 2OE is low, the outputs are in the
high-impedance state.
To ensure the high-impedance state during power up
or power down, OE should be tied to VCCthrough a
pullup resistor, and OE should be tied to GND
through a pulldown resistor; the minimum value of the
resistor is determined by the current-sinking or the
current-sourcing capability of the driver.
This device is fully specified for partial-power-down
applications using I
outputs,preventingdamagingcurrentbackflow
through the device when it is powered down.
Device Information
PART NUMBERPACKAGEBODY SIZE (NOM)
SN74LVC2G241DCT SM8 (8)2.95 mm × 2.80 mm
SN74LVC2G241DCU VSOOP (8)2.30 mm × 2.00 mm
SN74LVC2G241YZP DSBGA (8)1.91 mm × 0.91 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Logic Diagram (Positive Logic)
. The I
off
SN74LVC2G241
circuitry disables the
off
(1)
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision N (November 2013) to Revision OPage
•Added Applications section, Device Information table, ESD Ratings table, Thermal Information table, Typical
Characteristics, Feature Description section, Device Functional Modes, Application and Implementation section,
Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1
Changes from Revision M (February 2007) to Revision NPage
•Updated document to new TI data sheet format.................................................................................................................... 1
•Removed Ordering Information table. .................................................................................................................................... 1
over operating free-air temperature range (unless otherwise noted)
V
V
V
V
I
IK
I
OK
I
O
T
T
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of VCCis provided in the Recommended Operating Conditions table.
Supply voltage–0.56.5V
CC
Input voltage
I
Voltage applied to any output in the high-impedance or power-off state
O
Voltage applied to any output in the high or low state
O
(2)
(2)(3)
Input clamp currentVI< 0–50mA
Output clamp currentVO< 0–50mA
Continuous output current±50mA
Continuous current through VCCor GND±100mA
Maximum junction temperature150°C
J
Storage temperature–65150°C
stg
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(1)
MINMAXUNIT
–0.56.5V
(2)
–0.56.5V
–0.5VCC+ 0.5V
6.2 ESD Ratings
VALUEUNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins
Charged-device model (CDM), per JEDEC specification JESD22-C101, all
(2)
pins
V
(ESD)
Electrostatic
discharge
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
V
Supply voltageV
CC
Operating1.655.5
Data retention only1.5
(1)
VCC= 1.65 V to 1.95 V0.65 × V
V
High-level input voltageV
IH
VCC= 2.3 V to 2.7 V1.7
VCC= 3 V to 3.6 V2
VCC= 4.5 V to 5.5 V0.7 × V
VCC= 1.65 V to 1.95 V0.35 × V
V
Low-level input voltageV
IL
VCC= 2.3 V to 2.7 V0.7
VCC= 3 V to 3.6 V0.8
VCC= 4.5 V to 5.5 V0.3 × V
V
Input voltage05.5V
I
V
Output voltageV
O
High or low state0V
3-state05.5
VCC= 1.65 V–4
VCC= 2.3 V–8
I
High-level output current–16mA
OH
VCC= 3 V
VCC= 4.5 V–32
(1)
±2000
±1000
MINMAXUNIT
CC
CC
V
CC
CC
CC
–24
(1) All unused inputs of the device must be held at VCCor GND to ensure proper device operation. Refer to the TI application report
Implications of Slow or Floating CMOS Inputs, SCBA004.
B. Waveform1isforanoutputwithinternalconditionssuchthattheoutputislow,exceptwhendisabledbytheoutputcontrol.
Waveform2isforanoutputwithinternalconditionssuchthattheoutputishigh,exceptwhendisabledbytheoutputcontrol.
C. Allinputpulsesaresuppliedbygeneratorshavingthefollowingcharacteristics:PRR 10MHz,Z =50 .
D. Theoutputsaremeasuredoneatatime,withonetransitionpermeasurement.
E. t andtarethesameast .
F. t andtarethesameast .
G. tandtarethesameast .
H. Allparametersandwaveformsarenotapplicabletoalldevices.
The SN74LVC2G241 device is designed specifically to improve both the performance and density of 3-state
memory-address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74LVC2G241 device
is organized as two 1-bit line drivers with separate output-enable (1OE, 2OE) inputs. When 1OE is low and 2OE
is high, the device passes data from the A inputs to the Y outputs. When 1OE is high and 2OE is low, the
outputs are in the high-impedance state.
The SN74LVC2G241 is also an effective redriver, with a maximum output current drive of 32 mA.
8.2 Functional Block Diagram
Figure 3. Logic Diagram (Positive Logic)
8.3 Feature Description
To ensure the high-impedance state during power up or power down, OE should be tied to VCCthrough a pullup
resistor, and OE should be tied to GND through a pulldown resistor; the minimum value of the resistor is
determined by the current-sinking or the current-sourcing capability of the driver.
This device is fully specified for partial-power-down applications using I
. The I
off
circuitry disables the outputs,
off
preventing damaging current backflow through the device when it is powered down.
8.4 Device Functional Modes
Table 1 and Table 2 list the functional modes of the SN74LVC2G241.
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
Typical Application shows a simple application where a physical push button is connected to the
SN74LVC2G241. The push button is in a physical location far enough away from the processor that the input
signal is weak and needs to be redriven. The SN74LVC2G241 acts as a redriver, providing a strong input signal
to the processor with as little as 1 ns of propagation delay.
9.2 Typical Application
Figure 4. SN74LVC2G241 Application
9.2.1 Design Requirements
This device uses CMOS technology and has balanced output drive. Take care to avoid bus contention because it
can drive currents that would exceed maximum limits. The high drive also creates fast edges into light loads, so
routing and load conditions must be considered to prevent ringing.
9.2.2 Detailed Design Procedure
1. Recommended Input Conditions
– Rise time and fall time specs. See (Δt/ΔV) in Recommended Operating Conditions.
– Specified high and low levels. See (VIHand VIL) in Recommended Operating Conditions.
– Inputs are overvoltage tolerant allowing them to go as high as (VImax) in Recommended Operating
Conditions at any valid VCC.
2. Recommend Output Conditions
– Load currents must not exceed (IOmax) per output and must not exceed (Continuous current through V
CC
or GND) total current for the part. These limits are located in Absolute Maximum Ratings.
– Outputs must not be pulled above VCCduring normal operation or 5.5 V in high-z state.
The power supply can be any voltage between the minimum and maximum supply voltage rating located in
Recommended Operating Conditions.
Each VCCpin should have a good bypass capacitor to prevent power disturbance. For devices with a single
supply, a 0.1-μF capacitor is recommended and if there are multiple VCCpins then a 0.01-μF or 0.022-μF
capacitor is recommended for each power pin. It is ok to parallel multiple bypass capacitors to reject different
frequencies of noise. 0.1-μF and 1-μF capacitors are commonly used in parallel. The bypass capacitor should be
installed as close to the power pin as possible for best results.
11Layout
11.1 Layout Guidelines
When using multiple bit logic devices inputs must not ever float. In many cases, functions or parts of functions of
digital logic devices are unused; for example, when only two inputs of a triple-input AND gate are used or only 3
of the 4 buffer gates are used. Such input pins must not be left unconnected because the undefined voltages at
the outside connections result in undefined operational states. Specified below are the rules that must be
observed under all circumstances. All unused inputs of digital logic devices must be connected to a high or low
bias to prevent them from floating. The logic level that should be applied to any particular unused input depends
on the function of the device. Generally they will be tied to GND or VCC, whichever make more sense or is more
convenient.
Implications of Slow or Floating CMOS Inputs, SCBA004
12.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
NanoFree, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
12.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser based versions of this data sheet, refer to the left hand navigation.
74LVC2G241DCUTE4ACTIVEVSSOPDCU8TBDCall TICall TI-40 to 125
74LVC2G241DCUTG4ACTIVEVSSOPDCU8250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-1-260C-UNLIM-40 to 125C41R
SN74LVC2G241DCTRACTIVESM8DCT83000 Green (RoHS
& no Sb/Br)
CU NIPDAULevel-1-260C-UNLIM-40 to 125C41
Z
SN74LVC2G241DCURACTIVEVSSOPDCU83000Green (RoHS
& no Sb/Br)
CU NIPDAU | CU SN Level-1-260C-UNLIM-40 to 125(C41Q ~ C41R)
SN74LVC2G241DCUTACTIVEVSSOPDCU8250Green (RoHS
& no Sb/Br)
CU NIPDAU | CU SN Level-1-260C-UNLIM-40 to 125(C41Q ~ C41R)
SN74LVC2G241YZPRACTIVEDSBGAYZP83000Green (RoHS
& no Sb/Br)
SNAGCULevel-1-260C-UNLIM-40 to 125(C2 ~ C27)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
PACKAGE OPTION ADDENDUM
www.ti.com
17-Aug-2015
Addendum-Page 2
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion
D. Falls within JEDEC MO-187 variation DA.
0,10
4188781/C 09/02
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PACKAGE OUTLINE
BALL A1
CORNER
0.5 MAX
0.19
0.15
BE
SCALE 8.000
BALL TYP
DSBGA - 0.5 mm max heightYZP0008
DIE SIZE BALL GRID ARRAY
A
D
C
SEATING PLANE
0.05 C
0.5 TYP
D
C
1.5
TYP
0.5
TYP
0.25
8X
0.21
0.015C A B
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
B
A
12
SYMM
SYMM
D: Max =
E: Max =
1.918 mm, Min =
0.918 mm, Min =
4223082/A 07/2016
1.858 mm
0.858 mm
www.ti.com
EXAMPLE BOARD LAYOUT
DSBGA - 0.5 mm max heightYZP0008
DIE SIZE BALL GRID ARRAY
8X ( 0.23)
(0.5) TYP
(0.5) TYP
1
A
B
C
D
SYMM
2
SYMM
LAND PATTERN EXAMPLE
SCALE:40X
SOLDER MASK
OPENING
NON-SOLDER MASK
DEFINED
(PREFERRED)
0.05 MAX
( 0.23)
METAL
0.05 MIN
SOLDER MASK
DEFINED
( 0.23)
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NOT TO SCALE
NOTES: (continued)
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For more information, see Texas Instruments literature number SNVA009 (www.ti.com/lit/snva009).
METAL UNDER
SOLDER MASK
4223082/A 07/2016
www.ti.com
(0.5) TYP
EXAMPLE STENCIL DESIGN
DSBGA - 0.5 mm max heightYZP0008
DIE SIZE BALL GRID ARRAY
8X ( 0.25)
(0.5)
TYP
METAL
TYP
1
A
B
C
D
SYMM
2
SYMM
SOLDER PASTE EXAMPLE
BASED ON 0.1 mm THICK STENCIL
SCALE:40X
(R0.05) TYP
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
4223082/A 07/2016
www.ti.com
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