•Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
•ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
2Applications
•AV Receiver
•Audio Dock: Portable
•Blu-ray Player and Home Theater
•MP3 Player/Recorder
•Personal Digital Assistant (PDA)
•Power: Telecom/Server AC/DC Supply: Single
Controller: Analog and Digital
•Solid State Drive (SSD): Client and Enterprise
•TV: LCD/Digital and High-Definition (HDTV)
•Tablet: Enterprise
•Video Analytics: Server
•Wireless Headset, Keyboard, and Mouse
This single Schmitt-trigger buffer is designed for
1.65-V to 5.5-V VCCoperation.
The SN74LVC1G17 device contains one buffer and
performs the Boolean function Y = A.
The CMOS device has high output drive while
maintaining low static power dissipation over a broad
Vcc operating range.
The SN74LVC1G17 is available in a variety of
packages, including the ultra-small DPW package
with a body size of 0.8 mm × 0.8mm.
Device Information
DEVICE NAMEPACKAGEBODY SIZE
SN74LVC1G17X2SON (4)0.8mm × 0.8mm
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
SN74LVC1G17
SCES351V –JULY 2001–REVISED APRIL 2014
(1)
SOT-23 (5)2.9mm × 1.6mm
SC70 (5)2.0mm × 1.25mm
SON (6)1.45mm × 1.0mm
SON (6)1.0mm × 1.0mm
4Simplified Schematic
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
•Changed MAX operating free-air temperature from 85°C to 125°C....................................................................................... 5
•Added –40°C to 125°C to Electrical Characteristics table...................................................................................................... 6
•Added Switching Characteristics table for –40°C to 125°C temperature range..................................................................... 7
Changes from Revision S (June 2011) to Revision TPage
to Handling Ratings table..................................................................................................................................... 4
stg
•Removed Ordering Information table. .................................................................................................................................... 3
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
V
V
V
V
I
IK
I
OK
I
O
Supply voltage range–0.56.5V
CC
Input voltage range
I
Voltage range applied to any output in the high-impedance or power-off state
O
Voltage range applied to any output in the high or low state
O
(2)
(2)
(2)(3)
–0.56.5V
–0.56.5V
–0.5VCC+ 0.5V
Input clamp currentVI< 0–50mA
Output clamp currentVO< 0–50mA
Continuous output current±50mA
Continuous current through VCCor GND±100mA
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions tables is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The value of VCCis provided in the Recommended Operating Conditions table.
7.2 Handling Ratings
MINMAXUNIT
T
stg
(1)
V
ESD
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in
to the device.
(2) Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows
safe manufacturing with a standard ESD control process.
(3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows safe
manufacturing with a standard ESD control process.
Storage temperature range–65150°C
Human-Body Model (HBM)
Charged-Device Model (CDM)
B. Waveform1isforanoutputwithinternalconditionssuchthattheoutputislow,exceptwhendisabledbytheoutputcontrol.
Waveform2isforanoutputwithinternalconditionssuchthattheoutputishigh,exceptwhendisabledbytheoutputcontrol.
C. Allinputpulsesaresuppliedbygeneratorshavingthefollowingcharacteristics:PRR 10MHz,Z =50 .
D. Theoutputsaremeasuredoneatatime,withonetransitionpermeasurement.
E. t andtarethesameast .
F. t andtarethesameast .
G. tandtarethesameast .
H. Allparametersandwaveformsarenotapplicabletoalldevices.
B. Waveform1isforanoutputwithinternalconditionssuchthattheoutputislow,exceptwhendisabledbytheoutputcontrol.
Waveform2isforanoutputwithinternalconditionssuchthattheoutputishigh,exceptwhendisabledbytheoutputcontrol.
C. Allinputpulsesaresuppliedbygeneratorshavingthefollowingcharacteristics:PRR 10MHz,Z =50 .
D. Theoutputsaremeasuredoneatatime,withonetransitionpermeasurement.
E. t andtarethesameast .
F. t andtarethesameast .
G. tandtarethesameast .
H. Allparametersandwaveformsarenotapplicabletoalldevices.
The SN74LVC1G17 device contains one Schmitt trigger buffer and performs the Boolean function Y = A. The
device functions as an independent buffer, but because of Schmitt action, it will have different input threshold
levels for a positive-going (VT+) and negative-going signals.
The DPW package technology is a major breakthrough in IC packaging. Its tiny 0.64 mm square footprint saves
significant board space over other package options while still retaining the traditional manufacturing friendly lead
pitch of 0.5 mm.
This device is fully specified for partial-power-down applications using I
preventing damaging current backflow through the device when it is powered down.
9.2 Functional Block Diagram
9.3 Feature Description
•Wide operating voltage range.
– Operates From 1.65 V to 5.5 V.
•Allows Down voltage translation.
•Inputs accept voltages to 5.5 V.
•I
feature allows voltages on the inputs and outputs, when VCCis 0 V.
The SN74LVC1G14 is a high drive CMOS device that can be used for a multitude of buffer type functions where
the input is slow or noisy. It can produce 24 mA of drive current at 3.3 V making it Ideal for driving multiple
outputs and good for high speed applications up to 100 MHz. The inputs are 5.5 V tolerant allowing it to translate
down to VCC.
10.2 Typical Application
10.2.1 Design Requirements
This device uses CMOS technology and has balanced output drive. Care should be taken to avoid bus
contention because it can drive currents that would exceed maximum limits. The high drive will also create fast
edges into light loads so routing and load conditions should be considered to prevent ringing.
10.2.2 Detailed Design Procedure
1. Recommended Input Conditions
– Rise time and fall time specs. See (Δt/ΔV) in the Recommended Operating Conditions table.
– Specified high and low levels. See (VIHand VIL) in the Recommended Operating Conditions table.
– Inputs are overvoltage tolerant allowing them to go as high as (VImax) in the Recommended Operating
Conditions table at any valid VCC.
2. Recommend Output Conditions
– Load currents should not exceed (IOmax) per output and should not exceed (continuous current through
VCCor GND) total current for the part. These limits are located in the Absolute Max Ratings table.
The power supply can be any voltage between the min and max supply voltage rating located in the
Recommended Operating Conditions table.
Each Vcc pin should have a good bypass capacitor to prevent power disturbance. For devices with a single
supply a 0.1-μF capacitor is recommended and if there are multiple Vcc pins then a 0.01-μF or 0.022-μF
capacitor is recommended for each power pin. It is ok to parallel multiple bypass caps to reject different
frequencies of noise. 0.1-μF and 1-μF capacitors are commonly used in parallel. The bypass capacitor should be
installed as close to the power pin as possible for best results.
12Layout
12.1 Layout Guidelines
When using multiple bit logic devices inputs should not ever float. In many cases, functions or parts of functions
of digital logic devices are unused, for example, when only two inputs of a triple-input AND gate are used or only
3 of the 4 buffer gates are used. Such input terminals should not be left unconnected because the undefined
voltages at the outside connections result in undefined operational states. Specified below are the rules that must
be observed under all circumstances. All unused inputs of digital logic devices must be connected to a high or
low bias to prevent them from floating. The logic level that should be applied to any particular unused input
depends on the function of the device. Generally they will be tied to Gnd or Vcc whichever make more sense or
is more convenient.
All trademarks are the property of their respective owners.
13.2 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
13.3 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms and definitions.
14Mechanical, Packaging, and Orderable Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
SN74LVC1GXX and SN74AUP1GXXSN74LVC1GXX and SN74AUP1GXX
PACKAGE OUTLINE
PIN 1 INDEX AREA
0.4 MAX
SCALE 12.000
B
0.85
0.75
A
0.85
0.75
C
X2SON - 0.4 mm max heightDPW0005A-C01
PLASTIC SMALL OUTLINE - NO LEAD
SEATING PLANE
NOTE 4
(0.1)
0.05
0.00
NOTE 4
4221849/A 12/2014
THERMAL PAD
2X
0.48
0.27
0.17
2
1
(0.06)
0.25 0.1
0.32
3X
0.23
4
3
5
0.27
4X
0.17
0.1 C AB
0.05 C
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
4. The size and shape of this feature may vary.
www.ti.com
SN74LVC1GXX and SN74AUP1GXX
4X (0.42)
1
(0.78)
SYMM
EXAMPLE BOARD LAYOUT
X2SON - 0.4 mm max heightDPW0005A-C01
PLASTIC SMALL OUTLINE - NO LEAD
()
0.1
VIA
0.05 MIN
ALL AROUND
TYP
(R) TYP0.05
4X (0.22)
SYMM
2
( 0.25)
3
4X (0.06)
LAND PATTERN EXAMPLE
SOLDER MASK DEFINED
SCALE:60X
5
4X (0.26)
(0.48)
4
SOLDER MASK
OPENING, TYP
METAL UNDER
SOLDER MASK
TYP
4221849/A 12/2014
NOTES: (continued)
5. This package is designed to be soldered to a thermal pad on the board. For more information, refer to QFN/SON PCB application note
in literature No. SLUA271 (www.ti.com/lit/slua271).
www.ti.com
SN74LVC1GXX and SN74AUP1GXX
EXAMPLE STENCIL DESIGN
X2SON - 0.4 mm max heightDPW0005A-C01
PLASTIC SMALL OUTLINE - NO LEAD
4X (0.22)
(R) TYP0.05
SYMM
4X (0.42)
1
4X (0.26)
SOLDER MASK
EDGE
2
4X (0.06)
3
SYMM
(0.78)
( 0.24)
(0.21)
TYP
5
(0.48)
4
SOLDER PASTE EXAMPLE
BASED ON 0.1 mm THICK STENCIL
92% PRINTED SOLDER COVERAGE BY AREA
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
EXPOSED PAD
SCALE:100X
4221849/A 12/2014
www.ti.com
PACKAGE OPTION ADDENDUM
www.ti.com
PACKAGING INFORMATION
Orderable DeviceStatus
SN74LVC1G17DBVRACTIVESOT-23DBV53000Green (RoHS
SN74LVC1G17DBVRE4ACTIVESOT-23DBV53000Green (RoHS
SN74LVC1G17DBVRG4ACTIVESOT-23DBV53000Green (RoHS
SN74LVC1G17DBVTACTIVESOT-23DBV5250Green (RoHS
SN74LVC1G17DBVTE4ACTIVESOT-23DBV5250Green (RoHS
SN74LVC1G17DBVTG4ACTIVESOT-23DBV5250Green (RoHS
SN74LVC1G17DCKRACTIVESC70DCK53000Green (RoHS
SN74LVC1G17DCKRE4ACTIVESC70DCK53000Green (RoHS
SN74LVC1G17DCKRG4ACTIVESC70DCK53000Green (RoHS
SN74LVC1G17DCKTACTIVESC70DCK5250Green (RoHS
SN74LVC1G17DCKTE4ACTIVESC70DCK5250Green (RoHS
SN74LVC1G17DCKTG4ACTIVESC70DCK5250Green (RoHS
SN74LVC1G17DPWRACTIVEX2SONDPW43000Green (RoHS
Package Type Package
(1)
Drawing
Pins Package
Qty
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C)Device Marking
(4/5)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C175 ~ C17F ~
C17K ~ C17R)
(C17H ~ C17P ~
C17S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125C17F
CU NIPDAULevel-1-260C-UNLIM-40 to 125C17F
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C175 ~ C17F ~
C17K ~ C17R)
(C17H ~ C17P ~
C17S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125C17F
CU NIPDAULevel-1-260C-UNLIM-40 to 125C17F
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C75 ~ C7F ~ C7K ~
C7R ~ C7T)
(C7H ~ C7P ~ C7S)
CU NIPDAULevel-1-260C-UNLIM-40 to 125S4
3-Nov-2015
Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
Orderable DeviceStatus
SN74LVC1G17DRLRACTIVESOTDRL54000Green (RoHS
SN74LVC1G17DRLRG4ACTIVESOTDRL54000Green (RoHS
SN74LVC1G17DRY2PREVIEWSONDRY65000Green (RoHS
SN74LVC1G17DRYRACTIVESONDRY65000Green (RoHS
SN74LVC1G17DSF2PREVIEWSONDSF65000Green (RoHS
SN74LVC1G17DSFRACTIVESONDSF65000Green (RoHS
SN74LVC1G17YZPRACTIVEDSBGAYZP53000Green (RoHS
SN74LVC1G17YZVRACTIVEDSBGAYZV43000Green (RoHS
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
Package Type Package
(1)
Drawing
Pins Package
Qty
Eco Plan
(2)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
Lead/Ball Finish
(6)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C77 ~ C7R)
CU NIPDAULevel-1-260C-UNLIM-40 to 125(C77 ~ C7R)
CU NIPDAULevel-1-260C-UNLIM-40 to 125C7
CU NIPDAULevel-1-260C-UNLIM-40 to 125C7
CU NIPDAU |
CU NIPDAUAG
CU NIPDAU |
CU NIPDAUAG
SNAGCULevel-1-260C-UNLIM-40 to 85(C77 ~ C7N)
SNAGCULevel-1-260C-UNLIM-40 to 85C7
MSL Peak Temp
(3)
Level-1-260C-UNLIM-40 to 125C7
Level-1-260C-UNLIM-40 to 125C7
Op Temp (°C)Device Marking
(7 ~ N)
(4/5)
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
3-Nov-2015
Samples
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF SN74LVC1G17 :
Automotive: SN74LVC1G17-Q1
•
Enhanced Product: SN74LVC1G17-EP
•
NOTE: Qualified Version Definitions:
Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
•
3-Nov-2015
Enhanced Product - Supports Defense, Aerospace and Medical Applications
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