This triple 3-input positive-NAND gate is designed for 1.65-V to 3.6-V VCC operation.
The SN74LVC10A performs the Boolean function Y = A
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
• B • C or Y = A + B + C in positive logic.
The SN74LVC10A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
ABC
HHHL
LXX H
XLX H
XXL H
OUTPUT
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
SN74LVC10A
TRIPLE 3-INPUT POSITIVE-NAND GATE
SCAS284G – JANUARY 1993 – REVISED OCTOBER 1998
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
1A
1B
1C
2A
2B
2C
3A
3B
3C
1
2
13
3
4
5
9
10
11
&
12
1Y
6
2Y
8
3Y
logic diagram, each gate (positive logic)
A
B
C
Y
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
‡
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The value of VCC is provided in the recommended operating conditions table.
3. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
High-level input voltage
IH
Low-level input voltage
IL
Input voltage05.5V
I
Output voltage0V
O
p
p
Operating free-air temperature–4085°C
A
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
Operating1.653.6
Data retention only1.5
VCC = 1.65 V to 1.95 V0.65 × V
VCC = 2.3 V to 2.7 V
VCC = 2.7 V to 3.6 V2
VCC = 1.65 V to 1.95 V0.35 × V
VCC = 2.3 V to 2.7 V0.7
VCC = 2.7 V to 3.6 V0.8
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONS
IOH = –100 µA1.65 V to 3.6 V VCC–0.2
IOH = –4 mA1.65 V1.2
OH
V
OL
I
I
I
CC
∆I
CC
C
†
All typical values are at VCC = 3.3 V, TA = 25°C.
i
IOH = –8 mA2.3 V1.7
= –12
OH
IOH = –24 mA3 V2.2
IOL = 100 µA1.65 V to 3.6 V0.2
IOL = 4 mA1.65 V0.45
IOL = 8 mA2.3 V0.7
IOL = 12 mA2.7 V0.4
IOL = 24 mA3 V0.55
VI = 5.5 V or GND3.6 V±5µA
VI = VCC or GND,IO = 03.6 V10µA
One input at VCC – 0.6 V,Other inputs at VCC or GND2.7 V to 3.6 V500µA
VI = VCC or GND3.3 V5pF
V
CC
2.7 V2.2
3 V2.4
MIN TYP†MAXUNIT
V
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN74LVC10A
(INPUT)
(OUTPUT)
PARAMETER
UNIT
TRIPLE 3-INPUT POSITIVE-NAND GATE
SCAS284G – JANUARY 1993 – REVISED OCTOBER 1998
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
PARAMETER
t
pd
†
t
sk(o)
†
Skew between any two outputs of the same package switching in the same direction
FROM
AY13.817.85.814.9ns
TO
VCC = 1.8 V
TYPMINMAXMINMAXMINMAX
VCC = 2.5 V
± 0.2 V
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
UNIT
1ns
operating characteristics, T
C
Power dissipation capacitance per gatef = 10 MHz91011pF
pd
= 25°C
A
TEST
CONDITIONS
VCC = 1.8 V VCC = 2.5 V VCC = 3.3 V
TYPTYPTYP
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 30 pF
(see Note A)
TRIPLE 3-INPUT POSITIVE-NAND GATE
SCAS284G – JANUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
V
= 1.8 V ± 0.15 V
CC
2 × V
Open
GND
CC
TESTS1
t
t
PLZ/tPZL
t
PHZ/tPZH
1 kΩ
1 kΩ
S1
pd
SN74LVC10A
Open
2 × V
CC
Open
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN74LVC10A
TRIPLE 3-INPUT POSITIVE-NAND GATE
SCAS284G – JANUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
V
From Output
Under Test
CL = 30 pF
(see Note A)
500 Ω
500 Ω
S1
= 2.5 V ± 0.2 V
CC
2 × V
CC
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
TRIPLE 3-INPUT POSITIVE-NAND GATE
SCAS284G – JANUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.7 V AND 3.3 V ± 0.3 V
CC
6 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
SN74LVC10A
Open
6 V
GND
Timing
Input
Input
Input
Output
Data
t
PLH
LOAD CIRCUIT
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
h
t
PHL
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
OH
V
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
1.5 V
t
PHZ
1.5 V
PLZ
VOL + 0.3 V
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤2.5 ns, tf ≤2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
.
Figure 3. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
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In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
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party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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