Texas Instruments SN74HC74DBR, SN74HC74DR, SN74HC74N, SN74HC74N3, SN74HC74NSR Datasheet

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SN54HC74, SN74HC74
DUAL D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCLS094B – DECEMBER 1982 – REVISED MA Y 1997
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
description
The ’HC74 contain two independent D-type positive-edge-triggered flip-flops. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements are transferred to the outputs on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of CLK. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
The SN54HC74 is characterized for operation over the full military temperature range –55°C to 125°C. The SN74HC74 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OUTPUTS
PRE CLR CLK D Q Q
L H X X H L H LXXLH L LXXH†H
H H HHL H H LLH H H L X Q
0
Q
0
This configuration is unstable; that is, it does not persist when PRE
or CLR returns to its inactive
(high) level.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1 2 3 4 5 6 7
14 13 12 11 10
9 8
1CLR
1D
1CLK
1PRE
1Q 1Q
GND
V
CC
2CLR 2D 2CLK 2PRE 2Q 2Q
SN54HC74 . . . J OR W PACKAGE
SN74HC74 . . . D, DB, N, OR PW PACKAGE
(TOP VIEW)
3212019
910111213
4 5 6 7 8
18 17 16 15 14
2D NC 2CLK NC 2PRE
1CLK
NC
1PRE
NC
1Q
1D
1CLR
NC
2Q
2Q
V
2CLR
1Q
GND
NC
SN54HC74 . . . FK PACKAGE
(TOP VIEW)
CC
NC – No internal connection
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
SN54HC74, SN74HC74 DUAL D-TYPE POSITIVE-EDGE-TRIGGERED FLIP-FLOPS WITH CLEAR AND PRESET
SCLS094B – DECEMBER 1982 – REVISED MA Y 1997
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
logic symbol
S
4 3
5
1D
2
R
1
9
10 11 12 13
6
8
1PRE 1CLK
1D
2PRE
1CLR
2CLK
2D
2CLR
1Q
1Q
2Q
2Q
C1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, DB, J, N, PW, and W packages.
logic diagram (positive logic)
PRE
CLK
D
CLR
Q
Q
C
C
C
C
C
C
C
C
C
C
TG
TG
TG
TG
absolute maximum ratings over operating free-air temperature range
Supply voltage range, VCC –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1) ±20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
(VO = 0 to VCC) ±25 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND ±50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance, θ
JA
(see Note 2): D package 127°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DB package 158°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
N package 78°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package 170°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace length of zero.
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