Package Options Include Plastic
Small-Outline (D) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK),
and Standard Plastic (N) and Ceramic
(J) 300-mil DIPs
description
In these devices, each circuit functions as a
quadruple NOR gate. They perform the Boolean
function Y = A • B or Y = A + B in positive logic.
However, because of the Schmitt action, the
inputs have different input threshold levels for
positive- and negative-going signals.
These circuits are temperature compensated and
can be triggered from the slowest of input ramps
and still give clean jitter-free output signals.
The SN54HC7002 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC7002 is characterized for
operation from –40°C to 85°C.
SN54HC7002 . . . J OR W PACKAGE
SN74HC7002 ...D OR N PACKAGE
SN54HC7002 . . . FK PACKAGE
1Y
NC
2A
NC
2B
NC – No internal connection
(TOP VIEW)
1A
1
1B
2
1Y
3
2A
4
2B
5
6
2Y
GND
7
(TOP VIEW)
1B1ANC
3212019
4
5
6
7
8
910111213
2Y
GND
NC
14
13
12
11
10
9
8
CC
V
3Y
V
4B
4A
4Y
3B
3A
3Y
4B
18
17
16
15
14
3A
CC
4A
NC
4Y
NC
3B
FUNCTION TABLE
(each gate)
INPUTS
AB
HXL
XHL
LLH
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
OUTPUT
Y
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN54HC7002, SN74HC7002
QUADRUPLE POSITIVE-NOR GATES
WITH SCHMITT-TRIGGER INPUTS
SCLS033C – MARCH 1984 – REVISED MA Y 1997
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, and W packages.
†
1
1A
1B
2A
2B
3A
3B
4A
4B
2
4
5
9
10
12
13
≥1
3
1Y
6
2Y
8
3Y
11
4Y
logic diagram (positive logic)
A
Y
B
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54HC7002, SN74HC7002
PARAMETER
V
UNIT
QUADRUPLE POSITIVE-NOR GATES
WITH SCHMITT-TRIGGER INPUTS
SCLS033C – MARCH 1984 – REVISED MA Y 1997
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
t
pd
t
t
A or BY
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per gateNo load20pF
pd
PARAMETER MEASUREMENT INFORMATION
Any
CC
2 V60130195163
4.5 V18263933
6 V14223328
2 V287511095
4.5 V8152219
6 V6131916
TA = 25°CSN54HC7002SN74HC7002
MINTYPMAXMINMAXMINMAX
ns
ns
From Output
Under Test
LOAD CIRCUIT
Input
NOTES: A. CL includes probe and test-fixture capacitance.
90%90%
t
r
VOLTAGE WAVEFORM
INPUT RISE AND FALL TIMES
B. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
C. The outputs are measured one at a time with one input transition per measurement.
D. t
PLH
and t
PHL
Test
Point
CL = 50 pF
(see Note A)
50%50%
are the same as tpd.
V
CC
10%10%
0 V
t
f
Figure 1. Load Circuit and Voltage Waveforms
Input
In-Phase
Output
Out-of-Phase
Output
V
50%
t
PLH
90%90%
t
PHL
50%50%
10%10%
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
VOLTAGE WAVEFORMS
50%
t
PHL
50%50%
t
r
t
PLH
t
f
CC
0 V
V
OH
10%10%
V
OL
t
f
V
OH
90%90%
V
OL
t
r
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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