Package Options Include Plastic
Small-Outline (D) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
The ’HC266 are composed of four independent
2-input exclusive-NOR gates and feature
open-drain outputs. They perform the Boolean
function Y = A
The SN54HC266 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC266 is characterized for
operation from –40°C to 85°C.
logic symbol
⊗ B or Y = AB + AB in positive logic.
FUNCTION TABLE
INPUTS
AB
LLH
LHL
HLL
HHH
OUTPUT
Y
†
SN54HC266 ...J OR W PACKAGE
SN74HC266 . . . D OR N PACKAGE
SN54HC266 . . . FK PACKAGE
1Y
NC
2Y
NC
2A
NC – No internal connection
(TOP VIEW)
1A
1
1B
2
1Y
3
2Y
4
2A
5
6
2B
GND
7
(TOP VIEW)
1B1ANC
3212019
4
5
6
7
8
910111213
2B
GND
NC
14
13
12
11
10
9
8
V
3A
CC
V
4B
4A
4Y
3Y
3B
3A
4B
18
17
16
15
14
3B
CC
4A
NC
4Y
NC
3Y
1
1A
2
1B
5
2A
6
2B
8
3A
9
3B
12
4A
13
4B
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, and W packages.
=1
logic diagram, each gate (positive logic)
A
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
3
1Y
4
2Y
10
3Y
11
4Y
Y
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN54HC266, SN74HC266
UNIT
PARAMETER
TEST CONDITIONS
V
UNIT
QUADRUPLE 2-INPUT EXCLUSIVE-NOR GATES
WITH OPEN-DRAIN OUTPUTS
SCLS135C – DECEMBER 1982 – REVISED MA Y 1997
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
VCC = 4.5 V
VCC = 6 V4.24.2
VCC = 2 V00.500.5
VCC = 4.5 V
VCC = 6 V01.801.8
VCC = 2 V0100001000
VCC = 4.5 V
VCC = 6 V04000400
3.153.15
01.3501.35
CC
CC
05000500
0V
0V
CC
CC
V
V
V
V
ns
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
2
I
OH
V
I
I
I
CC
C
OL
i
CC
VI = VIH or VIL,VO = V
VI = VIH or V
VI = VCC or 06 V±0.1±100±1000±1000nA
VI = VCC or 0,IO = 06 V24020µA
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
t
PLH
t
PHL
t
t
A or BY
A or BY
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per gateNo load35pF
pd
CC
2 V60125190155
4.5 V13253831
6 V10233226
2 V60100150125
4.5 V13203025
6 V10172521
2 V287511095
Y
4.5 V8152219
6 V6131916
TA = 25°CSN54HC266SN74HC266
MINTYPMAXMINMAXMINMAX
ns
ns
ns
PARAMETER MEASUREMENT INFORMATION
V
CC
RL = 1 kΩ
From Output
Under Test
LOAD CIRCUIT
Input
NOTES: A. CL includes probe and test-fixture capacitance.
B. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
C. The outputs are measured one at a time with one input transition per measurement.
90%90%
t
r
VOLTAGE WAVEFORM
INPUT RISE AND FALL TIMES
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
Test
Point
CL = 50 pF
(see Note A)
V
50%50%
CC
10%10%
0 V
t
f
Figure 1. Load Circuit and Voltage Waveforms
Input
In-Phase
Output
Out-of-Phase
Output
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
50%
t
PLH
t
PHL
90%
50%
10%10%
VOLTAGE WAVEFORMS
V
50%
t
PHL
90%
t
PLH
t
f
50%
CC
0 V
V
OH
10%10%
V
OL
t
f
V
OH
V
OL
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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