8-Bit Parallel-Out Storage Register
Performs Serial-to-Parallel Conversion With
Storage
D
Asynchronous Parallel Clear
D
Active-High Decoder
D
Enable Input Simplifies Expansion
D
Expandable for n-Bit Applications
D
Four Distinct Functional Modes
D
Package Options Include Plastic
Small-Outline (D), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These 8-bit addressable latches are designed for
general-purpose storage applications in digital
systems. Specific uses include working registers,
serial-holding registers, and active-high decoders
or demultiplexers. They are multifunctional
devices capable of storing single-line data in eight
addressable latches, and being a 1-of-8 decoder
or demultiplexer with active-high outputs.
Four distinct modes of operation are selectable by
controlling the clear (CLR
In the addressable-latch mode, data at the data-in
terminal is written into the addressed latch. The
addressed latch follows the data input with all
unaddressed latches remaining in their previous
states. In the memory mode, all latches remain in
their previous states and are unaffected by the
data or address inputs. T o eliminate the possibility
of entering erroneous data in the latches, G
should be held high (inactive) while the address
lines are changing. In the 1-of-8 decoding or
demultiplexing mode, the addressed output
follows the level of the D input with all other
outputs low. In the clear mode, all outputs are low
and unaffected by the address and data inputs.
) and enable (G) inputs.
SN54HC259 ...J OR W PACKAGE
SN74HC259 . . . D, N, OR PW PACKAGE
SN54HC259 . . . FK PACKAGE
S2
Q0
NC
Q1
Q2
NC – No internal connection
(TOP VIEW)
S0
1
S1
2
S2
3
Q0
4
Q1
5
Q2
6
Q3
7
GND
8
(TOP VIEW)
S1S0NC
3212019
4
5
6
7
8
910111213
Q3
GND
NC
16
15
14
13
12
11
10
9
CC
V
Q4
V
CC
CLR
G
D
Q7
Q6
Q5
Q4
CLR
18
17
16
15
14
Q5
G
D
NC
Q7
Q6
The SN54HC259 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HC259 is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN54HC259, SN74HC259
ADDRESSED
OTHER
FUNCTION
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MA Y 1997
INPUTS
Function Tables
FUNCTION
OUTPUT OF
EACH
CLRG
HLDQ
HHQiOQ
LLD L8-line demultiplexer
LHLLClear
LATCH
LATCH SELECTION
SELECT INPUTS
S2S1S0
LLL0
LLH1
LHL2
LHH3
HLL4
HLH5
HHL6
HHH7
OUTPUT
iO
iO
ADDRESSED
Addressable latch
Memory
LATCH
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54HC259, SN74HC259
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MA Y 1997
logic symbol
†
S0
S1
S2
CLR
1
2
3
14
G
13
D
15
0
2
G8
Z9
Z10
9, 0D
10, 0R
9, 1D
10, 1R
9, 2D
10, 2R
9, 3D
10, 3R
9, 4D
10, 4R
9, 5D
10, 5R
9, 6D
10, 6R
9, 7D
10, 7R
8M
0
7
4
Q0
5
Q1
6
Q2
7
Q3
9
Q4
10
Q5
11
Q6
12
Q7
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, PW, and W packages.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54HC259, SN74HC259
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MA Y 1997
logic diagram (positive logic)
S0
S1
S2
CLR
1
2
3
14
G
13
D
15
1D
C1
1
1D
C1
1
1D
C1
1
1D
C1
1
1D
C1
1
1D
C1
1
1D
C1
1
1D
C1
1
R
R
R
R
R
R
R
R
10
11
12
4
Q
0
5
Q
1
6
Q
2
7
Q
3
9
Q
4
Q
5
Q
6
Q
7
Pin numbers shown are for the D, J, N, PW, and W packages.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic symbol, each internal latch
SN54HC259, SN74HC259
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MA Y 1997
D
C
R
1D
C1
1R
Q
logic diagram, each internal latch (positive logic)
C
D
C
R
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
timing requirements over recommended operating free-air temperature range (unless otherwise
noted)
TA = 25°CSN54HC259SN74HC259
CC
MINMAXMINMAXMINMAX
2 V80120100
CLR low
G low
t
su
t
h
Setup time, data or address before G
Hold time, data or address after G
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
t
PHL
t
pd
t
t
CLRAny Q
DataAny Q
AddressAny Q
GAny Q
Any
4.5 V18304538
4.5 V17263933
4.5 V21406050
4.5 V20345143
4.5 V8152219
4.5 V162420
6 V142017
2 V80120100
4.5 V162420
6 V142017
2 V7511595
4.5 V152319
6 V132016
2 V555
4.5 V555
6 V555
CC
2 V60150225190
6 V14263832
2 V56130195165
6 V13223328
2 V74200300250
6 V17345143
2 V66170255215
6 V16294337
2 V287511095
6 V6131916
TA = 25°CSN54HC259SN74HC259
MINTYPMAXMINMAXMINMAX
ns
ns
ns
ns
ns
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per latchNo load33pF
pd
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54HC259, SN74HC259
8-BIT ADDRESSABLE LATCHES
SCLS134B – DECEMBER 1982 – REVISED MA Y 1997
PARAMETER MEASUREMENT INFORMATION
50%
Test
Point
CL = 50 pF
(see Note A)
t
h
50%50%
From Output
Under Test
LOAD CIRCUIT
Reference
Input
t
su
Data
Input
SETUP AND HOLD AND INPUT RISE AND FALL TIMES
90%90%
t
r
VOLTAGE WAVEFORMS
V
0 V
V
0 V
CC
CC
V
CC
0 V
V
50%50%
OH
10%10%
V
OL
t
f
V
OH
90%90%
V
OL
t
r
High-Level
Pulse
Low-Level
Pulse
Input
V
CC
0 V
V
CC
10%10%
0 V
t
f
In-Phase
Output
Out-of-Phase
Output
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
50%
t
t
PLH
PHL
50%
t
w
50%
VOLTAGE WAVEFORMS
PULSE DURATIONS
90%90%
t
r
50%50%
10%10%
t
f
VOLTAGE WAVEFORMS
50%
50%
50%
t
PHL
t
PLH
NOTES: A. CL includes probe and test-fixture capacitance.
B. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
C. The outputs are measured one at a time with one input transition per measurement.
D. t
PLH
and t
are the same as tpd.
PHL
Figure 1. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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